TWI530856B - Capacitive sensor device and capacitive sensor method - Google Patents

Capacitive sensor device and capacitive sensor method Download PDF

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TWI530856B
TWI530856B TW103144611A TW103144611A TWI530856B TW I530856 B TWI530856 B TW I530856B TW 103144611 A TW103144611 A TW 103144611A TW 103144611 A TW103144611 A TW 103144611A TW I530856 B TWI530856 B TW I530856B
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electrodes
sensing
current
points
matrix
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TW103144611A
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TW201624242A (en
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李尚禮
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創為精密材料股份有限公司
意象無限股份有限公司
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Priority to TW103144611A priority Critical patent/TWI530856B/en
Priority to US14/702,894 priority patent/US10048813B2/en
Priority to US14/702,909 priority patent/US9626054B2/en
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電容式感測裝置及其方法 Capacitive sensing device and method thereof

本發明是關於一種電容式感測技術,特別是關於能減少瞬變環境影響之電容式感測裝置及其背景雜訊更新方法。 The present invention relates to a capacitive sensing technology, and more particularly to a capacitive sensing device capable of reducing the effects of transient environments and a background noise updating method thereof.

為了提升使用上的便利性,越來越多電子裝置使用觸控螢幕(touch screen)作為操作介面,以讓使用者直接在觸控螢幕上點選畫面來進行操作,藉此提供更為便捷且人性化的操作模式。觸控螢幕主要由提供顯示功能之顯示器以及提供觸控功能之感測裝置所組成。 In order to improve the convenience of use, more and more electronic devices use a touch screen as an operation interface, so that the user can directly operate the screen on the touch screen to provide more convenient operation. User-friendly mode of operation. The touch screen is mainly composed of a display providing a display function and a sensing device providing a touch function.

感測裝置依照構造和感測形式的不同可區分為:電阻式感測裝置、電容式感測裝置、音波式感測裝置、光學式(紅外線)感測裝置、電磁式感測裝置。其中,電容式感測裝置不需要應力應變的材料變形、較不受外界環境光線影響,且製程也較簡單,因此近期的觸控螢幕多是採用電容式感測裝置。 The sensing device can be distinguished according to different configurations and sensing forms: a resistive sensing device, a capacitive sensing device, an acoustic wave sensing device, an optical (infrared) sensing device, and an electromagnetic sensing device. Among them, the capacitive sensing device does not require stress-strained material deformation, is less affected by ambient light, and the process is relatively simple. Therefore, most recent touch screens use capacitive sensing devices.

電容式感測裝置具有由X電極與Y電極所定義的矩陣式感測節點。當使用者操作電容式感測裝置時,對應的感測節點的電容量會隨使用者操作而發生變化,以供電容式感測裝置判定觸碰動作的發生。然而,當電容式感測裝置的使用環境大幅變化(如,溫度大幅變化)時, 電容式感測裝置的電容值會隨著溫度而上升或下降,以致會電容式感測裝置誤判為觸控動作。因此,如何有效地偵測電容量變化,以提升電容式感測裝置之性能乃為業界不斷致力研發的方向之一。 The capacitive sensing device has a matrix sensing node defined by an X electrode and a Y electrode. When the user operates the capacitive sensing device, the capacitance of the corresponding sensing node changes according to the user's operation, so that the capacitive sensing device determines the occurrence of the touch action. However, when the environment in which the capacitive sensing device is used varies greatly (for example, when the temperature changes greatly), The capacitance value of the capacitive sensing device rises or falls with temperature, so that the capacitive sensing device is mistakenly determined as a touch action. Therefore, how to effectively detect changes in capacitance to improve the performance of capacitive sensing devices is one of the directions that the industry is constantly striving for.

在一實施例中,一種電容式感測裝置的背景雜訊更新方法包括:偵測複數感測點中之複數參考點的當前量測值、根據此些參考點的當前量測值與當前使用的參考量測值產生一當前差異值、比較該當前差異值與一變化閥值、偵測複數感測點的當前量測值、根據此些感測點的當前量測值以及當前使用的參考量測值產生此些感測點的複數位置信號、以及根據參考信號控制位置信號的輸出。其中,當當前差異值大於變化閥值時,根據當前差異值執行一背景雜訊更新程序以更新設定為當前使用的參考量測值。感測點是由相互交錯之複數電極所界定且配置成一矩陣,以及參考點位於矩陣的邊緣。此些感測點分別對應設定為當前使用的多個參考量測值。 In an embodiment, a background noise update method of a capacitive sensing device includes: detecting a current measurement value of a plurality of reference points in a plurality of sensing points, and determining a current measurement value and current usage according to the reference points. The reference measurement value generates a current difference value, compares the current difference value with a change threshold value, detects a current measurement value of the complex sense point, and according to the current measurement value of the sensing points and the currently used reference The measured values produce a complex position signal for the sense points and an output of the position signal based on the reference signal. Wherein, when the current difference value is greater than the change threshold, a background noise update procedure is performed according to the current difference value to update the reference measurement value set to be currently used. The sensing points are defined by a plurality of interdigitated electrodes and configured as a matrix, and the reference points are located at the edges of the matrix. The sensing points are respectively set to the plurality of reference measurement values currently used.

在一實施例中,一種電容式感測裝置包括:一儲存單元、一訊號感測器、一驅動/偵測單元、一位置偵測單元以及一控制單元。儲存單元儲存對應不同當前差異值之複數組參考量測值以及一參考信號,並且此些組參考量測值中之一組設定為當前使用。訊號感測器包括:複數第一電極以及複數第二電極。第一電極與第二電極交錯,並且第一電極與第二電極界定以一矩陣配置之複數感測點。每一組參考量測值中之複數參考量測值分別對應於此些感測點。驅動/偵測單元連接第一電極與第二電極,並且用以偵測感測點的當前量測值。位置偵測單元連 接驅動/偵測單元與儲存單元,並且用以根據複數參考點的當前量測值與當前使用的參考量測值產生一當前差異值、根據此些感測點的當前量測值與當前使用的一組參考量測值產生複數位置信號、以及根據參考信號控制位置信號的輸出。其中,參考點位於矩陣的邊緣。控制單元連接儲存單元、驅動/偵測單元與位置偵測單元,並且用以比較當前差異值與一變化閥值。其中,當當前差異值大於變化閥值時,控制單元根據當前差異值執行一背景雜訊更新程序,以更新設定為當前使用的參考量測值。 In one embodiment, a capacitive sensing device includes: a storage unit, a signal sensor, a driving/detecting unit, a position detecting unit, and a control unit. The storage unit stores a complex array reference value corresponding to different current difference values and a reference signal, and one of the group reference measurement values is set to be currently used. The signal sensor includes: a plurality of first electrodes and a plurality of second electrodes. The first electrode is interleaved with the second electrode, and the first electrode and the second electrode define a plurality of sensing points arranged in a matrix. The complex reference measurements in each set of reference measurements correspond to the sense points, respectively. The driving/detecting unit is connected to the first electrode and the second electrode, and is configured to detect a current measurement value of the sensing point. Position detection unit And driving the detecting/detecting unit and the storing unit, and generating a current difference value according to the current measured value of the plurality of reference points and the currently used reference measuring value, according to the current measured value of the sensing point and the current use A set of reference measurements produces a complex position signal and controls the output of the position signal based on the reference signal. Among them, the reference point is located at the edge of the matrix. The control unit is connected to the storage unit, the driving/detecting unit and the position detecting unit, and is used for comparing the current difference value with a change threshold. Wherein, when the current difference value is greater than the change threshold, the control unit performs a background noise update procedure according to the current difference value to update the reference measurement value set to be currently used.

綜上,根據本發明之電容式感測裝置及其背景雜訊更新方法藉由選定之參考點的周期巡察判定更新背景雜訊(即,參考量測值)的時機,藉以快速獲取溫度變化的影響程度並對應調整位置信號的感測基準,以保證信號讀取的正確性且增強對溫度變化的反應速度。 In summary, the capacitive sensing device and the background noise updating method thereof according to the present invention determine the timing of updating the background noise (ie, the reference measurement value) by the periodic inspection of the selected reference point, thereby quickly obtaining the temperature change. The degree of influence corresponds to the sensing reference of the position signal to ensure the correctness of the signal reading and enhance the reaction speed to the temperature change.

20‧‧‧顯示器 20‧‧‧ display

30‧‧‧主機 30‧‧‧Host

12‧‧‧控制器 12‧‧‧ Controller

122‧‧‧驅動/偵測單元 122‧‧‧Drive/Detection Unit

124‧‧‧一位置偵測單元 124‧‧‧A position detection unit

126‧‧‧儲存單元 126‧‧‧ storage unit

128‧‧‧控制單元 128‧‧‧Control unit

14‧‧‧訊號感測器 14‧‧‧Signal Sensor

142‧‧‧第一感測層 142‧‧‧First sensing layer

144‧‧‧第二感測層 144‧‧‧Second sensing layer

A1‧‧‧感測區 A1‧‧‧Sensing area

A2‧‧‧無效區 A2‧‧‧ Invalid area

X1‧‧‧第一電極 X1‧‧‧ first electrode

X2‧‧‧第一電極 X2‧‧‧ first electrode

X3‧‧‧第一電極 X3‧‧‧first electrode

Xn-2‧‧‧第一電極 Xn-2‧‧‧ first electrode

Xn-1‧‧‧第一電極 Xn-1‧‧‧first electrode

Xn‧‧‧第一電極 Xn‧‧‧first electrode

Y1‧‧‧第二電極 Y1‧‧‧second electrode

Y2‧‧‧第二電極 Y2‧‧‧ second electrode

Y3‧‧‧第二電極 Y3‧‧‧ second electrode

Ym-2‧‧‧第二電極 Ym-2‧‧‧second electrode

Ym-1‧‧‧第二電極 Ym-1‧‧‧second electrode

Ym‧‧‧第二電極 Ym‧‧‧second electrode

P(1,1)‧‧‧感測點 P(1,1)‧‧‧ Sensing point

P(1,m)‧‧‧感測點 P(1,m)‧‧‧ Sensing point

P(n,1)‧‧‧感測點 P(n,1)‧‧‧ Sensing points

P(n,m)‧‧‧感測點 P(n,m)‧‧‧ Sensing points

S11‧‧‧偵測多個參考點的當前量測值 S11‧‧‧Detecting current measurements of multiple reference points

S13‧‧‧根據此些參考點的當前量測值與至少一參考量測值產生一當前差異值 S13‧‧‧ generates a current difference value based on the current measured value of the reference points and the at least one reference measured value

S15‧‧‧依據一關係設定與產生的當前差異值取得一受選調整因子 S15‧‧‧Actain a selected adjustment factor based on a relationship setting and the current difference value generated

S17‧‧‧偵測多個感測點的當前量測值 S17‧‧‧Detecting current measurements of multiple sensing points

S19‧‧‧根據此些感測點的當前量測值產生此些感測點的位置信號 S19‧‧‧ generates the position signals of the sensing points based on the current measured values of the sensing points

S21‧‧‧根據受選調整因子調整此些位置信號 S21‧‧‧ Adjust these position signals according to the selected adjustment factor

S23‧‧‧根據參考信號控制調整後之位置信號的輸出 S23‧‧‧Control the output of the adjusted position signal according to the reference signal

S31‧‧‧比較產生的當前差異值與第一變化閥值 The current difference value and the first change threshold generated by S31‧‧‧ comparison

S33‧‧‧當前差異值是否大於第一變化閥值? S33‧‧ Is the current difference value greater than the first change threshold?

S35‧‧‧增加參考點的當前量測值的偵測頻率 S35‧‧‧ Increase the detection frequency of the current measurement value of the reference point

S37‧‧‧計數值加1 S37‧‧‧ count value plus 1

S39‧‧‧計數值是否達既定值? Does the S39‧‧‧ count value reach the established value?

S41‧‧‧減少參考點的當前量測值的偵測頻率 S41‧‧‧Reducing the detection frequency of the current measured value of the reference point

S43‧‧‧計數值歸零 S43‧‧‧ count value is zero

S45‧‧‧不調整參考點的當前量測值的偵測頻率 S45‧‧‧Do not adjust the detection frequency of the current measurement value of the reference point

S51‧‧‧取同時製造之相同規格的多個電容式感測裝置 S51‧‧‧ Take multiple capacitive sensing devices of the same specification manufactured at the same time

S53‧‧‧在無干擾源的第一溫度下,以相同感測技術量測每個電容式感測裝置在無觸控狀態下之相同參考點的第一量測值以及各參考點的第一位置信號 S53‧‧‧Measure the first measurement value of the same reference point and the reference point of each reference point of each capacitive sensing device in the non-touch state with the same sensing technology at the first temperature without interference source One position signal

S55‧‧‧利用統計方法以量測得之第一量測值計算參考量測值 S55‧‧‧Using statistical methods to calculate reference measurements from the first measured values

S57‧‧‧在無干擾源的第二溫度下,以相同感測技術相同次數量測每個電容式感測裝置在無觸控狀態下之相同參考點的第二量測值以及各參考點的第二位置信號 S57‧‧‧measing the second measurement value of each reference point of each capacitive sensing device in the non-touch state and each reference point by the same sensing technology at the second temperature without interference source Second position signal

S59‧‧‧利用量測結果進行統計分析以得到信號差異值與調整因子之間的對應關係 S59‧‧‧ Statistical analysis using measurement results to obtain the correspondence between signal difference values and adjustment factors

S61‧‧‧將得到的參考量測值與其所對應之關係設定儲存在相同規格的各電容式感測裝置的儲存單元中 S61‧‧‧ The reference measurement values obtained and their corresponding relationship settings are stored in the storage unit of each capacitive sensing device of the same specification.

S71‧‧‧驅動位在矩陣的第一側邊的至少一電極以及位在矩陣的第二側邊的至少一電極 S71‧‧‧ driving at least one electrode on the first side of the matrix and at least one electrode on the second side of the matrix

S73‧‧‧量測位在矩陣的第三側邊的至少一電極以及位在矩陣的第四側邊的至少一電極以得到各參考點的當前量測值 S73‧‧‧ Measure at least one electrode on the third side of the matrix and at least one electrode on the fourth side of the matrix to obtain the current measurement value of each reference point

S75‧‧‧驅動位在矩陣的至少一側邊的至少一電極 S75‧‧‧ drive at least one electrode on at least one side of the matrix

S77‧‧‧量測位在矩陣的至少一側邊的至少一電極,以得到多個參考點的當前量測值 S77‧‧‧ Measure at least one electrode on at least one side of the matrix to obtain current measurements of multiple reference points

S79‧‧‧驅動位在矩陣的第一側邊(及第二側邊)的至少一第一電極 S79‧‧‧ drive at least one first electrode on the first side (and the second side) of the matrix

S81‧‧‧量測多條第二電極,以得到多個參考點的當前量測值 S81‧‧‧Measure multiple second electrodes to get the current measurement of multiple reference points

S83‧‧‧驅動位在矩陣的第三側邊(及第四側邊)的至少一第二電極 S83‧‧‧ drive at least one second electrode on the third side (and fourth side) of the matrix

S85‧‧‧量測多條第一電極,以得到多個參考點的當前量測值 S85‧‧‧Measure multiple first electrodes to obtain current measurements of multiple reference points

S91‧‧‧比較產生的當前差異值與第二變化閥值 The current difference value and the second change threshold generated by S91‧‧‧ comparison

S93‧‧‧當前差異值是否大於第二變化閥值? S93‧‧ Is the current difference value greater than the second change threshold?

S95‧‧‧根據當前差異值執行背景雜訊更新程序 S95‧‧‧Perform background noise update procedure based on current difference values

S951‧‧‧從儲存單元讀出當前差異值所對應的一組參考量測值及其對應之關係設定 S951‧‧‧Reading a set of reference measurement values corresponding to the current difference value from the storage unit and their corresponding relationship settings

S953‧‧‧以讀出之一組參考量測值更新當前使用之參考量測值,以及以讀出之關係設定更新當前使用之關係設定 S953‧‧‧Renewing the currently used reference measurement value by reading one of the group reference measurement values, and updating the current usage relationship setting by reading the relationship setting

[第1圖]為根據本發明一實施例之電容式感測裝置的方塊示意圖。 [Fig. 1] is a block diagram showing a capacitive sensing device according to an embodiment of the present invention.

[第2圖]為訊號感測器之俯視示意圖。 [Fig. 2] is a schematic plan view of the signal sensor.

[第3圖]為根據本發明一實施例之電容式感測裝置的背景雜訊更新方法的流程圖。 [Fig. 3] is a flowchart of a background noise updating method of a capacitive sensing device according to an embodiment of the present invention.

[第4圖]為根據本發明另一實施例之電容式感測裝置的背景雜訊更新方法的流程圖。 [Fig. 4] is a flowchart of a background noise updating method of a capacitive sensing device according to another embodiment of the present invention.

[第5圖]為根據本發明一實施例之關係設定的建立方法的流程圖。 [Fig. 5] is a flowchart of a method of establishing a relationship setting according to an embodiment of the present invention.

[第6圖]為一實施例之參考點的量測值的量測步驟的流程圖。 [Fig. 6] is a flow chart showing the measuring step of the measured value of the reference point of an embodiment.

[第7圖]為另一實施例之參考點的量測值的量測步驟的流程圖。 [Fig. 7] is a flow chart showing the measurement step of the measurement value of the reference point of another embodiment.

[第8圖]為又一實施例之參考點的量測值的量測步驟的流程圖。 [Fig. 8] is a flow chart showing the measurement step of the measurement value of the reference point of still another embodiment.

[第9圖]為根據本發明又一實施例之電容式感測裝置的背景雜訊更新方法的流程圖。 [Fig. 9] is a flowchart of a background noise updating method of a capacitive sensing device according to still another embodiment of the present invention.

[第10圖]為步驟S95的一實施例的細部流程圖。 [Fig. 10] is a detailed flowchart of an embodiment of the step S95.

第1圖為根據本發明一實施例之電容式感測裝置的方塊示意圖。請參考第1圖,觸控螢幕包含電容式感測裝置、顯示器20以及主機30。電容式感測裝置包含控制器12以及一訊號感測器14。訊號感測器14連接控制器12,並且訊號感測器14位在顯示器20的顯示面上。訊號感測器14包括交錯配置的多個電極(例如,第一電極X1、X2~Xn-1、Xn以及第二電極Y1、Y2~Ym-1、Ym)。其中,n及m為正整數。n可等於m,亦可不等於m。 1 is a block diagram of a capacitive sensing device in accordance with an embodiment of the present invention. Referring to FIG. 1 , the touch screen includes a capacitive sensing device, a display 20 , and a host 30 . The capacitive sensing device includes a controller 12 and a signal sensor 14. The signal sensor 14 is connected to the controller 12, and the signal sensor 14 is located on the display surface of the display 20. The signal sensor 14 includes a plurality of electrodes (for example, first electrodes X1, X2 to Xn-1, Xn and second electrodes Y1, Y2 to Ym-1, Ym) arranged in a staggered manner. Where n and m are positive integers. n can be equal to m or not equal to m.

在一些實施例中,第一電極X1、X2~Xn-1、Xn以及第二電極Y1、Y2~Ym-1、Ym可以位於不同平面。換言之,訊號感測器14包括第一感測層142以及第二感測層144。第二感測層144位於第一感測層142上,並且第一感測層142位於顯示器20的顯示面上。第一感測層142與第二感測層144之間可以但不限於夾置有絕緣層(圖中未示)。 In some embodiments, the first electrodes X1, X2~Xn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym may be located in different planes. In other words, the signal sensor 14 includes a first sensing layer 142 and a second sensing layer 144. The second sensing layer 144 is located on the first sensing layer 142 and the first sensing layer 142 is located on the display surface of the display 20. The first sensing layer 142 and the second sensing layer 144 may be, but are not limited to, sandwiched with an insulating layer (not shown).

第一感測層142具有以圖案化所形成之多個電極(即,第一電極X1、X2~Xn-1、Xn)。第一電極X1、X2~Xn-1、Xn彼此平行列置。同樣地,第二感測層144亦具有以圖案化所形成之多個電極(即,第二電極Y1、Y2~Ym-1、Ym)。從頂視視角來看,第一電極X1、X2~Xn-1、Xn與第二電極Y1、Y2~Ym-1、Ym相互交錯,並且界定以 一矩陣配置之複數感測點P(1,1)~P(n,m),如第2圖所示。換言之,第一電極X1、X2~Xn-1、Xn與第二電極Y1、Y2~Ym-1、Ym是構成一個平面座標系統。以此實施而為例,第一電極X1、X2~Xn-1、Xn與第二電極Y1、Y2~Ym-1、Ym係構成一個直角座標糸統(笛卡爾座標系統,Cartesian Coordinate System),但本發明並不以此為限,亦可以是極座標系統、非直角座標系統、或是其他平面座標系統。在一些實施例中,交疊後之第一電極X1、X2~Xn-1、Xn與第二電極Y1、Y2~Ym-1、Ym的頂視圖呈菱形蜂巢狀、網格狀或柵狀。 The first sensing layer 142 has a plurality of electrodes (ie, first electrodes X1, X2 to Xn-1, Xn) formed by patterning. The first electrodes X1, X2 to Xn-1, and Xn are arranged in parallel with each other. Similarly, the second sensing layer 144 also has a plurality of electrodes (ie, second electrodes Y1, Y2 to Ym-1, Ym) formed by patterning. From a top view, the first electrodes X1, X2~Xn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym are interdigitated and defined The complex sensing points P(1,1)~P(n,m) of a matrix configuration are as shown in Fig. 2. In other words, the first electrodes X1, X2 to Xn-1, Xn and the second electrodes Y1, Y2 to Ym-1, Ym constitute a planar coordinate system. Taking this implementation as an example, the first electrodes X1, X2~Xn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym form a right angle coordinate system (Cartesian Coordinate System). However, the invention is not limited thereto, and may be a polar coordinate system, a non-orthogonal coordinate system, or other planar coordinate system. In some embodiments, the top views of the overlapped first electrodes X1, X2~Xn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym have a diamond-shaped honeycomb shape, a grid shape or a grid shape.

此外,在一些實施例中,第一電極X1、X2~Xn-1、Xn與第二電極Y1、Y2~Ym-1、Ym可以位於同一平面,也就是僅位於單一感測層上。 In addition, in some embodiments, the first electrodes X1, X2~Xn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym may be located in the same plane, that is, only on a single sensing layer.

於此,感測層(如,第一感測層142與第二感測層144)可以採用透明或半透明的設計,因此當顯示器20顯示資訊時,使用者能穿透所有感測層而看到顯示器20所顯示的內容。換句話說,顯示器20發出的光線可以穿過所有感測層而到達使用者的眼睛。在一些實施例中,感測層可為圖案化導電薄膜,例如:但不限於氧化銦(ITO)錫薄膜。 Herein, the sensing layer (eg, the first sensing layer 142 and the second sensing layer 144) may adopt a transparent or translucent design, so that when the display 20 displays information, the user can penetrate all the sensing layers. The content displayed on the display 20 is seen. In other words, light from display 20 can pass through all of the sensing layers to the user's eyes. In some embodiments, the sensing layer can be a patterned conductive film such as, but not limited to, an indium oxide (ITO) tin film.

一般來說,顯示器20用來顯示資訊的區域稱作主動區,而訊號感測器14與主動區重疊的區域可稱為感測區A1。訊號感測器14能夠偵測在感測區A1上發生的觸碰事件。於此,術語「觸碰事件」意指一實際觸控(即,手指或物件直接接觸訊號感測器14)或一幾乎觸控(即,手指或物件緊密接近但不直接接觸訊號感測器14)。在一些實施例中,訊號感測器14的所有感測點P(1,1)~P(n,m)均位在主動區上,即不具有 無效區A2。在一些實施例中,訊號感測器14的部分感測點P(1,1)~P(1,m)、P(n,1)~P(n,m)不位在主動區上。換言之,訊號感測器14具有無效區A2,並且無效區A2位在感測區A1的邊緣。訊號感測器14不會偵測在無效區A2上發生的觸碰事件。 In general, the area in which the display 20 is used to display information is referred to as an active area, and the area in which the signal sensor 14 overlaps the active area may be referred to as a sensing area A1. The signal sensor 14 is capable of detecting a touch event occurring on the sensing area A1. Herein, the term "touch event" means an actual touch (ie, a finger or object directly contacts the signal sensor 14) or an almost touch (ie, a finger or object is in close proximity but does not directly contact the signal sensor) 14). In some embodiments, all of the sensing points P(1,1)~P(n,m) of the signal sensor 14 are all on the active area, ie, do not have Invalid area A2. In some embodiments, the partial sensing points P(1,1)~P(1,m), P(n,1)~P(n,m) of the signal sensor 14 are not located on the active area. In other words, the signal sensor 14 has an inactive area A2, and the inactive area A2 is located at the edge of the sensing area A1. The signal sensor 14 does not detect a touch event occurring on the invalid area A2.

當觸控螢幕運作時,主機30將欲顯示的資訊傳送給觸控螢幕的顯示器20,並且由顯示器20顯示出具有欲顯示的資訊的畫面。當使用者根據顯示器20所顯示的畫面觸控與顯示器20重疊之電容式感測裝置的特定位置時,電容式感測裝置響應觸控事件輸出對應之位置信號給主機30,以由主機30做進一步處理。於此,「進一步處理」的內容視指定於顯示器20受觸控的位置的執行指令而定,例如但不限於主機3響應位置信號而啟動某一應用程式、或在顯示器20受觸控的位置顯示筆觸等等。換言之,主機30為可自電容式感測裝置接收位置信號,並且經組態以基於位置信號起始某一行動。 When the touch screen operates, the host computer 30 transmits the information to be displayed to the display 20 of the touch screen, and the display 20 displays a screen having information to be displayed. When the user touches the specific position of the capacitive sensing device that overlaps the display 20 according to the screen displayed on the display 20, the capacitive sensing device outputs a corresponding position signal to the host 30 in response to the touch event to be performed by the host 30. Further processing. Herein, the content of the "further processing" depends on the execution instruction assigned to the position where the display 20 is touched, for example, but not limited to, the host 3 activates an application in response to the position signal, or is in the position where the display 20 is touched. Show strokes and more. In other words, host 30 receives a position signal from a self-capacitive sensing device and is configured to initiate an action based on the position signal.

其次,控制器12包含一驅動/偵測單元122、一位置偵測單元124、一儲存單元126以及一控制單元128。驅動/偵測單元122包含驅動元件及偵測元件。驅動元件及偵測元件可以整合成單一元件,也可以採用二個元件來實現,端視設計時之現況來決定。驅動/偵測單元122耦接第一電極X1、X2~Xn-1、Xn以及第二電極Y1、Y2~Ym-1、Ym。位置偵測單元124耦接驅動/偵測單元122、儲存單元126以及主機30。控制單元128耦接驅動/偵測單元122以及位置偵測單元124。於此,控制單元128用以控制驅動/偵測單元122的運作。 The controller 12 includes a driving/detecting unit 122, a position detecting unit 124, a storage unit 126, and a control unit 128. The driving/detecting unit 122 includes a driving component and a detecting component. The driving component and the detecting component can be integrated into a single component or two components, which are determined by the current state of the design. The driving/detecting unit 122 is coupled to the first electrodes X1, X2 XXn-1, Xn and the second electrodes Y1, Y2~Ym-1, Ym. The position detecting unit 124 is coupled to the driving/detecting unit 122, the storage unit 126, and the host 30. The control unit 128 is coupled to the driving/detecting unit 122 and the position detecting unit 124. Here, the control unit 128 is used to control the operation of the driving/detecting unit 122.

控制器12在感測使用者之觸碰情形時,驅動/偵測單元122 可以採用自電容(self-capacitance)感測技術,亦也可採用互電容(self-capacitance)感測技術來偵測各感測點的量測值。於此,量測值可為電壓、電流、充/放電時間等信號。換言之,驅動/偵測單元122偵測各感測點的當前量測值,並且位置偵測單元124根據偵測到的當前量測值與各自對應的參考量測值得知各感測點的電容量或電容量變化(即,位置信號)。 The controller 12 drives/detects the unit 122 when sensing the touch situation of the user. Self-capacitance sensing technology can also be used, and self-capacitance sensing technology can also be used to detect the measured values of the sensing points. Here, the measured value may be a signal such as voltage, current, charge/discharge time, and the like. In other words, the driving/detecting unit 122 detects the current measurement value of each sensing point, and the position detecting unit 124 knows the electrical power of each sensing point according to the detected current measurement value and the corresponding reference quantity measurement value. Capacity or capacitance change (ie, position signal).

於此,將特定位置的感測點設定為參考點,特別是位在無效區A2內的感測點或者位在感測區A1內較少機會發生觸控事件的感測點。換言之,將感測點P(1,1)~P(n,m)中位於矩陣的邊緣的感測點設定為參考點。 Here, the sensing point of the specific position is set as the reference point, in particular, the sensing point located in the invalid area A2 or the sensing point where the bit is less likely to occur in the sensing area A1. In other words, the sensing points located at the edges of the matrix among the sensing points P(1, 1) to P(n, m) are set as reference points.

在通常工作循環中,控制單元128控制驅動/偵測單元122,致使驅動/偵測單元122以一特定偵測頻率進行參考點的信號偵測動作。於此,特定偵測頻率可為例如但不限於每隔2~5秒執行一次。 In the normal working cycle, the control unit 128 controls the driving/detecting unit 122 to cause the driving/detecting unit 122 to perform the signal detecting action of the reference point at a specific detection frequency. Here, the specific detection frequency may be performed, for example, but not limited to, every 2 to 5 seconds.

搭配參照第3圖,控制單元128控制驅動/偵測單元122,致使驅動/偵測單元122偵測參考點的當前量測值(步驟S11)。位置偵測單元124根據參考點的當前量測值與至少一參考量測值產生一當前差異值(步驟S13)。接著,位置偵測單元124依據一關係設定與產生的當前差異值取得一受選調整因子(步驟S15)。於此,關係設定為相應不同溫度之信號差異值與調整因子之間的對應關係。 Referring to FIG. 3, the control unit 128 controls the driving/detecting unit 122 to cause the driving/detecting unit 122 to detect the current measurement value of the reference point (step S11). The position detecting unit 124 generates a current difference value according to the current measured value of the reference point and the at least one reference measured value (step S13). Next, the position detecting unit 124 obtains an selected adjustment factor according to a relationship setting and the generated current difference value (step S15). Here, the relationship is set to the correspondence between the signal difference value and the adjustment factor of the respective different temperatures.

然後,控制單元128控制驅動/偵測單元122,致使驅動/偵測單元122偵測位在感測區A1內的所有感測點的當前量測值(步驟S17)。位置偵測單元124根據此些感測點的當前量測值產生此些感測點 的多個位置信號(步驟S19)。換言之,驅動/偵測單元122根據各感測點的當前量測值與各自對應的參考量測值計算各感測點的當前差異值(電容量或電容量變化),以作為各感測點的位置信號。接著,位置偵測單元124根據受選調整因子調整產生的位置信號(步驟S21),並且根據參考信號控制調整後之位置信號的輸出(步驟S23)。 Then, the control unit 128 controls the driving/detecting unit 122 to cause the driving/detecting unit 122 to detect the current measurement values of all the sensing points located in the sensing area A1 (step S17). The position detecting unit 124 generates the sensing points according to the current measured values of the sensing points. A plurality of position signals (step S19). In other words, the driving/detecting unit 122 calculates the current difference value (capacity or capacitance change) of each sensing point according to the current measured value of each sensing point and the corresponding reference quantity measured value, as the sensing points. Position signal. Next, the position detecting unit 124 adjusts the generated position signal according to the selected adjustment factor (step S21), and controls the output of the adjusted position signal based on the reference signal (step S23).

在一些實施例中,參照第4圖,在每次得到當前差異值(步驟S13)之後,控制單元128比較產生的當前差異值與一變化閥值(以下稱第一變化閥值)(步驟S31)。當產生的當前差異值大於第一變化閥值(步驟S33)時,控制單元128則增加驅動/偵測單元122進行參考點的信號偵測動作的偵測頻率(步驟S35)。 In some embodiments, referring to FIG. 4, after each time the current difference value is obtained (step S13), the control unit 128 compares the generated current difference value with a change threshold (hereinafter referred to as a first change threshold) (step S31). ). When the generated current difference value is greater than the first change threshold (step S33), the control unit 128 increases the detection frequency of the signal detecting action of the reference point by the driving/detecting unit 122 (step S35).

在一些實施例中,當產生的當前差異值不大於第一變化閥值(步驟S33)時,控制單元128會控制計數器將計數值加1(步驟S37),並且判斷計數值是否達既定值(步驟S39)。於計數值達既定值時,控制單元128則減少驅動/偵測單元122進行參考點的信號偵測動作的偵測頻率(步驟S41)。 In some embodiments, when the generated current difference value is not greater than the first change threshold (step S33), the control unit 128 controls the counter to increment the count value by 1 (step S37), and determines whether the count value reaches a predetermined value ( Step S39). When the count value reaches a predetermined value, the control unit 128 reduces the detection frequency of the signal detecting action of the reference point by the driving/detecting unit 122 (step S41).

並且,於確定要調整偵測頻率(步驟S41或步驟S35)時或之後,控制單元128會重置計數器,以將計數值歸零(步驟S43)。 And, upon or after determining that the detection frequency is to be adjusted (step S41 or step S35), the control unit 128 resets the counter to zero the count value (step S43).

反之,當計數值未達既定值時,控制單元128則不調整偵測頻率(步驟S45)。 On the other hand, when the count value does not reach the predetermined value, the control unit 128 does not adjust the detection frequency (step S45).

在一些實施例中,關係設定能藉由下述方式來建立。 In some embodiments, relationship settings can be established in the following manner.

參照第5圖,取同時製造之相同規格(如,尺寸相同且玻璃厚度亦相同)的多個電容式感測裝置(如,10個、20個、30個或更多 個)(步驟S51)。 Referring to Figure 5, a plurality of capacitive sensing devices (eg, 10, 20, 30 or more) of the same specifications (eg, the same size and the same glass thickness) are simultaneously manufactured. (Step S51).

在工作溫度的範圍內無干擾源的一第一溫度(例如:控溫在26℃、27℃或28℃下)下,以相同感測技術一次或多次量測每個電容式感測裝置在無觸控狀態下之相同參考點的量測值(稱之為第一量測值)以及各感測點的位置信號(稱之為第一位置信號)(步驟S53)。 Measuring one or more of each capacitive sensing device with the same sensing technique at a first temperature without interference source (eg, temperature control at 26 ° C, 27 ° C or 28 ° C) The measured values of the same reference point in the no-touch state (referred to as the first measured value) and the position signals of the respective sensing points (referred to as the first position signal) (step S53).

利用統計方法以量測得之第一量測值計算參考量測值(步驟S55)。 The reference measurement value is calculated by using the statistical method to measure the first measurement value (step S55).

在一實施例中,將各電容式感測裝置同一位置的參考點的第一量測值取平均得到各參考點所對應的參考量測值。於此,可先將各電容式感測裝置同一位置的參考點中的第一量測值偏差較大者刪除,然後再取平均。此時,在步驟13中,各參考點的當前量測值以對應的參考量測值計算個別差異值,再進行所有個別差異值的統計分析以得到當前差異值。 In one embodiment, the first measurement values of the reference points of the same position of each capacitive sensing device are averaged to obtain reference measurement values corresponding to the reference points. In this case, the first measurement value deviation of the reference point of the same position of each capacitive sensing device may be deleted first, and then averaged. At this time, in step 13, the current measurement value of each reference point is used to calculate the individual difference value by the corresponding reference quantity measurement, and then the statistical analysis of all the individual difference values is performed to obtain the current difference value.

在另一實施例中,將各電容式感測裝置所有參考點的第一量測值取平均得到各參考點共用之參考量測值。於此,亦可先將所有參考點的第一量測值中偏差較大者刪除,然後再取平均。此時,在步驟13中,各參考點的當前量測值均以同一參考量測值計算個別差異值,再進行所有個別差異值的統計分析以得到當前差異值。 In another embodiment, the first measurement values of all reference points of each capacitive sensing device are averaged to obtain a reference measurement value shared by each reference point. In this case, the first deviation of the first measurement values of all the reference points may be deleted first, and then averaged. At this time, in step 13, the current measured values of each reference point are calculated by the same reference quantity, and then the statistical analysis of all the individual difference values is performed to obtain the current difference value.

在另一實施例中,將各電容式感測裝置位在同一相對位置的電極上之所有參考點的第一量測值取平均得到在此相對位置的電極上之各參考點共用之參考量測值。於此,亦可先將位在同一相對位置的電極上之所有參考點的第一量測值中偏差較大者刪除,然後再取平均。 此時,在步驟13中,各參考點的當前量測值以對應的參考量測值計算個別差異值,再進行所有個別差異值的統計分析以得到當前差異值。 In another embodiment, the first measurements of all reference points of the capacitive sensing devices located on the electrodes at the same relative position are averaged to obtain a reference amount shared by the reference points on the electrodes at the relative positions. Measured value. In this case, the first deviation of all the reference points of the reference points on the electrodes at the same relative position may be deleted first, and then averaged. At this time, in step 13, the current measurement value of each reference point is used to calculate the individual difference value by the corresponding reference quantity measurement, and then the statistical analysis of all the individual difference values is performed to obtain the current difference value.

其中,刪除偏差較大者的方式例如:但不限於此,刪除其中最大一筆、或最小一筆、或最大一筆與最小一筆、或與中間值差距超過一既定值者等。所有個別差異值的統計分析亦包括先進行所有個別差異值中偏差較大者的刪除。 The method for deleting the larger deviation is, for example, but not limited to, deleting the largest one, or the smallest one, or the largest one and the smallest one, or the difference from the intermediate value exceeding a predetermined value. The statistical analysis of all individual difference values also includes the deletion of the larger of all individual difference values.

在工作溫度的範圍內無干擾源的多個第二溫度(例如:大於或小於第一溫度)下,以相同感測技術相同次數量測每個電容式感測裝置在無觸控狀態下之相同參考點的量測值(稱之為第二量測值)以及各感測點的位置信號(稱之為第二位置信號)(步驟S57)。 Measuring, under the same number of times of the same sensing technology, each capacitive sensing device is in a non-touch state under a plurality of second temperatures (eg, greater than or less than the first temperature) of the interference source within a range of operating temperatures The measured values of the same reference point (referred to as second measured values) and the position signals of the respective sensing points (referred to as second position signals) (step S57).

利用量測結果(第一溫度下的第一量測值與其對應之第一位置信號以及各種第二溫度下的第二量測值與其對應之第二位置信號)進行統計分析以得到具有相應不同溫度之信號差異值(代表由第一溫度與第二溫度之間的溫度變化)與調整因子(代表各溫度變化所對應之第一位置信號與第二位置信號之間的信號變化)之間的對應關係的關係設定(步驟S59)。於此,關係設定可為相應不同溫度之信號差異值與調整因子的對應表、或為相應不同溫度之信號差異值相對於調整因子的變化曲線、或者為相應不同溫度之信號差異值與調整因子的轉換關係式。在步驟S15的一實施例中,位置偵測單元124於關係設定中找到符合當前差異值之信號差異值,再取得符合當前差異值之信號差異值所對應的調整因子(即為受選調整因子)。在步驟S15的另一實施例中,位置偵測單元124是將當前差異值帶入關係設定以換算成對應之調整因子(即為 受選調整因子)。 Performing statistical analysis using the measurement result (the first measurement value at the first temperature and the corresponding first position signal and the second measurement value at the second temperature and the corresponding second position signal) to obtain a corresponding difference The signal difference value of the temperature (representing the temperature change between the first temperature and the second temperature) and the adjustment factor (representing the signal change between the first position signal and the second position signal corresponding to each temperature change) The relationship of the correspondence relationship is set (step S59). Here, the relationship setting may be a correspondence table of signal difference values and adjustment factors of different temperatures, or a variation curve of signal difference values with respect to adjustment factors of corresponding different temperatures, or signal difference values and adjustment factors of corresponding different temperatures. Conversion relationship. In an embodiment of step S15, the position detecting unit 124 finds a signal difference value that matches the current difference value in the relationship setting, and obtains an adjustment factor corresponding to the signal difference value that matches the current difference value (ie, the selected adjustment factor). ). In another embodiment of step S15, the position detecting unit 124 takes the current difference value into the relationship setting to be converted into a corresponding adjustment factor (ie, Selected adjustment factor).

於此,第一溫度與多個第二溫度中任意相鄰二溫度之間相差至少1個刻度(例如:1℃、2℃、5℃或10℃)。當相差的刻度較少時,多個溫度所對應之信號差異值可能為相同數值,再者多個不同之信號差異值亦可能會對應於相同數值之調整因子。 Here, the first temperature differs from any adjacent two temperatures of the plurality of second temperatures by at least one scale (for example, 1 ° C, 2 ° C, 5 ° C or 10 ° C). When the scale of the phase difference is small, the signal difference values corresponding to the plurality of temperatures may be the same value, and a plurality of different signal difference values may also correspond to the adjustment factors of the same value.

將得到的參考量測值與其所對應之關係設定儲存在相同規格的各電容式感測裝置的儲存單元128中(步驟S61),以供執行步驟S13及步驟S15使用。 The relationship between the obtained reference measurement value and the corresponding relationship is stored in the storage unit 128 of each capacitive sensing device of the same specification (step S61) for use in performing step S13 and step S15.

在一些實施例中,參考點可位在矩陣的各個邊緣的k條電極X1~Xk、Xn-k-1~Xn、Y1~Yk、Ym-k-1~Ym(以下稱參考電極)上。其中,k為小於n及m的正整數。較佳地,k為小於n/10及m/10的正整數。更佳地,k為1或2。於此,參考點可為每一條參考電極上的一個、多個或全部的感測點。 In some embodiments, the reference points may be located on k electrodes X1~Xk, Xn-k-1~Xn, Y1~Yk, Ym-k-1~Ym (hereinafter referred to as reference electrodes) at respective edges of the matrix. Where k is a positive integer less than n and m. Preferably, k is a positive integer less than n/10 and m/10. More preferably, k is 1 or 2. Here, the reference point may be one, more or all of the sensing points on each of the reference electrodes.

此外,在同一條參考電極上的任二參考點之間間隔一個或多個非參考點之感測點。再者,在同一條電極上的任二參考點之間有相同數量之非參考點之感測點。 In addition, one or more sensing points of non-reference points are spaced between any two reference points on the same reference electrode. Furthermore, there are the same number of non-reference point sensing points between any two reference points on the same electrode.

在一些實施例中,參考點為位在矩陣的四個角落的感測點,即,參考點為於矩陣的各角落的a*b個感測點。於此,a為小於n的正整數;較佳地,a為小於n/10的正整數;更佳地,a為1或2。再者,b為小於m的正整數;較佳地,b為小於m/10的正整數;更佳地,b為1或2。 In some embodiments, the reference point is a sensing point that is located at four corners of the matrix, ie, the reference point is a*b sensing points at each corner of the matrix. Here, a is a positive integer smaller than n; preferably, a is a positive integer smaller than n/10; more preferably, a is 1 or 2. Further, b is a positive integer smaller than m; preferably, b is a positive integer smaller than m/10; more preferably, b is 1 or 2.

在一些實施例中,參考點為位在無效區的感測點,例如:感測點P(1,1)~P(1,m)、P(n,1)~P(n,m)中之一個或多個。 In some embodiments, the reference point is a sensing point located in the inactive area, for example: sensing point P(1,1)~P(1,m), P(n,1)~P(n,m) One or more of them.

在一些實施例中,當觸控螢幕與其他裝置(如,主機30)組裝成單一電子裝置時,參考點可避開其他裝置的熱源。換言之,在其他裝置的熱源元件的上方一既定區域內的感測點不作為參考點。 In some embodiments, when the touch screen is assembled with other devices (eg, host 30) into a single electronic device, the reference point can avoid the heat source of other devices. In other words, the sensing points in a given area above the heat source elements of other devices are not used as reference points.

於此,在步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟中所使用的參考點均相同。 Here, the reference points used in the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57 are the same.

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,參照第1、2及6圖,在第一實施例中,以參考點為位在各角落的2*1個感測點(P(1,1)、P(2,1)、P(1,m)、P(2,m)、P(n,1)、P(n-1,1)、P(n,m)及P(n-1,m))為例,驅動/偵測單元122驅動位在矩陣的第一側邊的二第一電極X1、X2以及位在矩陣的第二側邊的二第一電極Xn-1、Xn(步驟S71)。其中,第一側邊相對於第二側邊。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, refer to the first, second and sixth figures. In the first embodiment, the reference point is 2*1 sensing points located in each corner (P(1,1), P(2,1), P(1,m), P(2,m), P(n,1),P( For example, n-1, 1), P(n, m), and P(n-1, m)), the driving/detecting unit 122 drives the two first electrodes X1 and X2 located on the first side of the matrix and The two first electrodes Xn-1, Xn are located on the second side of the matrix (step S71). Wherein the first side is opposite to the second side.

並且,驅動/偵測單元122量測位在矩陣的第三側邊的一第二電極Y1以及位在矩陣的第四側邊的一第二電極Ym,藉以得到各參考點的當前量測值(步驟S73)。其中,第三側邊相對於第四側邊。第三側邊連接在第一側邊的一端與第二側邊的一端之間,並且第四側邊連接在第一側邊的另一端與第二側邊的另一端之間。 And the driving/detecting unit 122 measures a second electrode Y1 located on the third side of the matrix and a second electrode Ym located on the fourth side of the matrix, thereby obtaining the current measurement value of each reference point. (Step S73). Wherein the third side is opposite to the fourth side. The third side is connected between one end of the first side and one end of the second side, and the fourth side is connected between the other end of the first side and the other end of the second side.

換言之,就第2圖而言,驅動/偵測單元122驅動從訊號感測器14的最左邊數來的二第一電極X1、X2以及從訊號感測器14的最右邊數來的二第一電極Xn-1、Xn。並且,驅動/偵測單元122量測位在訊號感測器14的最上側的一第二電極Ym以及位在訊號感測器14的最下側的一第二電極Y1。 In other words, in the second diagram, the driving/detecting unit 122 drives the two first electrodes X1 and X2 from the leftmost number of the signal sensor 14 and the second from the rightmost number of the signal sensor 14. One electrode Xn-1, Xn. The driving/detecting unit 122 measures a second electrode Ym located at the uppermost side of the signal sensor 14 and a second electrode Y1 located at the lowermost side of the signal sensor 14.

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟 S57中第二量測值的量測步驟,在第二實施例中,若以參考點為位在各角落的1個感測點(P(1,1)、P(1,m)、P(n,1)及P(n,m))為例,驅動/偵測單元122則驅動位在矩陣的第一側邊(最左邊)的一第一電極X1及位在矩陣的第二側邊(最右邊)的一第一電極Xn(步驟S71)。並且,驅動/偵測單元122量測位在矩陣的第三側邊(最下側)的一第二電極Y1以及位在矩陣的第四側邊(最上側)的一第二電極Ym,藉以得到各參考點的當前量測值(步驟S73)。 Steps and steps for measuring the first measurement value in step S11 and step S53 The measuring step of the second measured value in S57, in the second embodiment, if one reference point is used as a sensing point in each corner (P(1,1), P(1,m), P For example, (n, 1) and P(n, m)), the driving/detecting unit 122 drives a first electrode X1 located on the first side (leftmost) of the matrix and on the second side of the matrix. A first electrode Xn of the side (rightmost side) (step S71). Moreover, the driving/detecting unit 122 measures a second electrode Y1 located on the third side (lowermost side) of the matrix and a second electrode Ym located on the fourth side (uppermost side) of the matrix, thereby The current measurement value of each reference point is obtained (step S73).

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,在第三實施例中,若以參考點為位在各角落的1*2個感測點(P(1,1)、P(1,2)、P(1,m-1)、P(1,m)、P(n,1)、P(n,2)、P(n,m-1)及P(n,m))為例,驅動/偵測單元122則驅動位在矩陣的第一側邊的一第一電極X1及位在矩陣的第二側邊的一第一電極Xn(步驟S71)。並且,驅動/偵測單元122量測位在矩陣的第三側邊的二第二電極Y1、Y2以及位在矩陣的第四側邊的二第二電極Ym-1、Ym,藉以得到各參考點的當前量測值(步驟S73)。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, in the third embodiment, if the reference point is in the 1*2 of each corner Sensing points (P(1,1), P(1,2), P(1,m-1), P(1,m), P(n,1),P(n,2),P For example, (n, m-1) and P(n, m)), the driving/detecting unit 122 drives a first electrode X1 located on the first side of the matrix and a second side of the matrix. A first electrode Xn (step S71). And the driving/detecting unit 122 measures the second electrodes Y1 and Y2 located on the third side of the matrix and the second electrodes Ym-1 and Ym located on the fourth side of the matrix, thereby obtaining each reference. The current measured value of the point (step S73).

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,參照第1、2及7圖,在第四實施例中,以參考點為位在矩陣的第一側邊的一電極上的感應點且驅動/偵測單元122採用自電容感測技術為例,驅動/偵測單元122則驅動位在矩陣的第一側邊的一第一電極X1(步驟S75),並且量測位在矩陣的第一側邊的一第一電極X1,以得到多個參考點(即,感測點P(1,1)~P(1,m))的當前量測值(步驟S77)。於此實施例中,參考點(即,感測點P(1,1)~P(1,m)) 亦位在無效區A2內。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, refer to the first, second and seventh figures. In the fourth embodiment, the reference point is Taking the sensing point on an electrode on the first side of the matrix and the driving/detecting unit 122 taking the self-capacitance sensing technology as an example, the driving/detecting unit 122 drives the first bit on the first side of the matrix. An electrode X1 (step S75), and measuring a first electrode X1 located on the first side of the matrix to obtain a plurality of reference points (ie, sensing points P(1,1)~P(1,m) The current measured value of ))) (step S77). In this embodiment, the reference point (ie, the sensing point P(1,1)~P(1,m)) Also located in the invalid area A2.

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,在第五實施例中,以參考點為位在矩陣的第一側邊的二電極上的感應點且驅動/偵測單元122採用自電容感測技術為例,驅動/偵測單元122則驅動位在矩陣的第一側邊的二第一電極X1、X2(步驟S75),並且量測位在矩陣的第一側邊的二第一電極X1、X2,以得到多個參考點(即,感測點P(1,1)~P(1,m)、P(2,1)~P(2,m))的當前量測值(步驟S77)。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, in the fifth embodiment, the reference point is located on the first side of the matrix. The sensing point on the two electrodes and the driving/detecting unit 122 adopts a self-capacitance sensing technology as an example. The driving/detecting unit 122 drives the two first electrodes X1 and X2 located on the first side of the matrix (step S75). And measuring the two first electrodes X1, X2 located on the first side of the matrix to obtain a plurality of reference points (ie, sensing points P (1, 1) ~ P (1, m), P (2 The current measured value of 1) to P(2, m)) (step S77).

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,在第六實施例中,以參考點為位在矩陣的各側邊的一電極上的感應點且驅動/偵測單元122採用自電容感測技術為例,驅動/偵測單元122驅動並量測位在矩陣的第一側邊的一第一電極X1,以得到多個參考點(即,感測點P(1,1)~P(1,m))的當前量測值。驅動/偵測單元122驅動並量測位在矩陣的第二側邊的一第一電極Xn,以得到多個參考點(即,感測點P(n,1)~P(n,m))的當前量測值。驅動/偵測單元122驅動並量測位在矩陣的第三側邊的一第二電極Y1,以得到多個參考點(即,感測點P(1,1)~P(n,1))的當前量測值。並且,驅動/偵測單元122驅動並量測位在矩陣的第四側邊的一第二電極Ym,以得到多個參考點(即,感測點P(1,m)~P(n,m))的當前量測值。於此實施例中,一部分的參考點(即,感測點P(1,1)~P(1,m)及P(n,1)~P(n,m))亦位在無效區A2內。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, in the sixth embodiment, one of the sides of the matrix is referenced by the reference point. For example, the driving/detecting unit 122 drives and measures a first electrode X1 located on the first side of the matrix to obtain multiple The current measurement of the reference point (ie, the sensing point P(1,1)~P(1,m)). The driving/detecting unit 122 drives and measures a first electrode Xn located on the second side of the matrix to obtain a plurality of reference points (ie, sensing points P(n, 1)~P(n, m) The current measurement value. The driving/detecting unit 122 drives and measures a second electrode Y1 located on the third side of the matrix to obtain a plurality of reference points (ie, sensing points P(1, 1)~P(n, 1) The current measurement value. Moreover, the driving/detecting unit 122 drives and measures a second electrode Ym located on the fourth side of the matrix to obtain a plurality of reference points (ie, sensing points P(1, m)~P(n, Current measurement of m)). In this embodiment, a part of the reference points (ie, the sensing points P(1,1)~P(1,m) and P(n,1)~P(n,m)) are also located in the invalid area A2. Inside.

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟 S57中第二量測值的量測步驟,參照第1、2及8圖,在第七實施例中,以參考點為位在矩陣的第一側邊的一第一電極X1上的i個感應點且驅動/偵測單元122採用互電容感測技術為例,i為1~m之任意整數。較佳地,i小於m。更佳地,i小於m/2。驅動/偵測單元122則驅動位在矩陣的第一側邊的一第一電極X1(步驟S79),並且量測i條第二電極,以得到多個參考點的當前量測值(步驟S81)。於此,受量測的i條第二電極彼此間隔有未受量測之一條或多條第二電極。再者,i條第二電極能以間隔相同數量的未受量測之第二電極或不同數量之未受量測之第二電極。以等差為例,若第二電極總共為16條,步驟S77可量測第1、5、9及13條第二電極Y1、Y5、Y9、Y13,以得到多個參考點(即,感測點P(1,1)、P(1,5)、P(1,9)、P(1,13))的當前量測值。於此,雖以驅動一條第一電極為例,但本發明不限於此,可同理應用在驅動同一側邊的多條第一電極或驅動不同側邊的多條第一電極。 Steps and steps for measuring the first measurement value in step S11 and step S53 For the measurement step of the second measurement value in S57, referring to the first, second and eighth diagrams, in the seventh embodiment, the i reference bits are located on a first electrode X1 of the first side of the matrix. The sensing point and the driving/detecting unit 122 take the mutual capacitance sensing technology as an example, and i is an arbitrary integer of 1 to m. Preferably, i is less than m. More preferably, i is less than m/2. The driving/detecting unit 122 drives a first electrode X1 located on the first side of the matrix (step S79), and measures the i second electrodes to obtain current measurement values of the plurality of reference points (step S81). ). Here, the measured second electrodes are spaced apart from each other by one or a plurality of second electrodes. Furthermore, the i second electrodes can be spaced apart by the same number of unmeasured second electrodes or a different number of unmeasured second electrodes. Taking the difference as an example, if there are a total of 16 second electrodes, step S77 can measure the second electrodes Y1, Y5, Y9, and Y13 of the first, fifth, ninth, and thirteenth portions to obtain a plurality of reference points (ie, senses). The current measured values of the measuring points P(1,1), P(1,5), P(1,9), P(1,13)). Here, although a single electrode is driven as an example, the present invention is not limited thereto, and may be applied to a plurality of first electrodes driving the same side or a plurality of first electrodes driving different sides.

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,在第八實施例中,驅動/偵測單元122可更驅動位在矩陣的第二側邊的一第一電極Xn(步驟S79),並且透過量測i條第二電極得到多個參考點的當前量測值(步驟S81)。接續前述例子,若第二電極總共為16條,驅動/偵測單元122即可得到多個參考點(即,感測點P(1,1)、P(1,5)、P(1,9)、P(1,13)、P(n,1)、P(n,5)、P(n,9)、P(n,13))的當前量測值。 For the measurement step of the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, in the eighth embodiment, the drive/detection unit 122 can drive the bit in the matrix. A first electrode Xn of the second side (step S79), and measuring the i second electrodes to obtain current measurement values of the plurality of reference points (step S81). Following the foregoing example, if the total number of the second electrodes is 16, the driving/detecting unit 122 can obtain a plurality of reference points (ie, sensing points P(1, 1), P(1, 5), P(1, 9), current measurement of P(1,13), P(n,1), P(n,5), P(n,9), P(n,13)).

針對步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟,在第九實施例中,在步驟S81中,驅動/ 偵測單元122先得到一部分參考點的當前量測值。接著,驅動/偵測單元122驅動位在矩陣的第三側邊的一第二電極Y1(步驟S83),並且量測j條第一電極,以得到另一部分參考點的當前量測值(步驟S85)。於此,j為1~n之任意整數。較佳地,j小於n。更佳地,j小於n/2。並且,受量測的j條第一電極彼此間隔有未受量測之一條或多條第一電極。再者,j條第一電極能以間隔相同數量的未受量測之第一電極或不同數量之未受量測之第一電極。接續前述例子,若第一電極總共為16條,步驟S85可以等差方式量測第1、5、9及13條第一電極X1、X5、X9、X13,以得到多個參考點(即,感測點P(1,1)、P(5,1)、P(9,1)、P(13,1))的當前量測值。於此,雖以驅動一條第二電極為例,但本發明不限於此,可同理應用在驅動同一側邊的多條第二電極或驅動不同側邊(即,第三側邊與第四側邊)的多條第二電極。 For the step of measuring the first measurement value in step S11 and step S53 and the measurement step of the second measurement value in step S57, in the ninth embodiment, in step S81, driving / The detecting unit 122 first obtains the current measured value of a part of the reference point. Next, the driving/detecting unit 122 drives a second electrode Y1 located on the third side of the matrix (step S83), and measures the j first electrodes to obtain the current measurement value of the other partial reference point (step S85). Here, j is an arbitrary integer from 1 to n. Preferably, j is less than n. More preferably, j is less than n/2. And, the measured j first electrodes are spaced apart from each other by one or a plurality of first electrodes that are not subjected to measurement. Furthermore, the j first electrodes can be spaced apart by the same number of unmeasured first electrodes or a different number of unmeasured first electrodes. Following the foregoing example, if there are a total of 16 first electrodes, step S85 can measure the first, second, ninth, and thirteenth first electrodes X1, X5, X9, and X13 in an equal manner to obtain a plurality of reference points (ie, The current measured values of the sensing points P(1,1), P(5,1), P(9,1), P(13,1)). Herein, although driving a second electrode as an example, the present invention is not limited thereto, and can be similarly applied to driving a plurality of second electrodes on the same side or driving different sides (ie, the third side and the fourth side) a plurality of second electrodes on the side).

在第十實施例中,全部的參考點均位在無效區內。因此,在步驟S11、步驟S53中第一量測值的量測步驟以及步驟S57中第二量測值的量測步驟中,驅動/偵測單元122才會驅動或/及量測第一電極X1、Xn。而在步驟S17中,驅動/偵測單元122則不會驅動或/及量測第一電極X1、Xn。 In the tenth embodiment, all of the reference points are located in the invalid area. Therefore, in the step of measuring the first measured value in steps S11 and S53 and the measuring step of the second measured value in step S57, the driving/detecting unit 122 drives or/and measures the first electrode. X1, Xn. In step S17, the driving/detecting unit 122 does not drive or/and measure the first electrodes X1, Xn.

於此,驅動/偵測單元122逐一地依序驅動電極且逐一地依序量測電極。再者,驅動/偵測單元122亦可以多工技術同時驅動同一方向的多個電極並且同時量測同一方向的多個電極。 Here, the driving/detecting unit 122 sequentially drives the electrodes one by one and sequentially measures the electrodes one by one. Furthermore, the driving/detecting unit 122 can simultaneously drive a plurality of electrodes in the same direction and simultaneously measure a plurality of electrodes in the same direction.

在一些實施例中,儲存單元126儲存有複數組參考量測值與各組參考量測值所對應之關係設定。於此,每一組參考量測值對應於 一種溫度(即,對應於一個或多個信號差異值)。換言之,此些組參考量測值對應於不同的溫度。 In some embodiments, the storage unit 126 stores a relationship setting between the complex array reference measurement value and each set of reference measurement values. Here, each set of reference measurements corresponds to A temperature (ie, corresponding to one or more signal difference values). In other words, these sets of reference measurements correspond to different temperatures.

參照第9圖,在每次得到當前差異值(步驟S13)之後,控制單元128會先比較產生的當前差異值與一變化閥值(以下稱第二變化閥值)(步驟S91)。當產生的當前差異值大於第二變化閥值(步驟S93)時,控制單元128根據當前差異值執行背景雜訊更新程序(步驟S95),以將當前使用的參考量測值更新為符合使用環境(如,環境溫度)之一組參考量測值以及其對應之關係設定。然後,接續執行步驟S17、步驟S19及步驟S23(不執行步驟S21)。當產生的當前差異值不大於第二變化閥值(步驟S93)時,才接續執行步驟S15。 Referring to Fig. 9, after each time the current difference value is obtained (step S13), the control unit 128 first compares the generated current difference value with a change threshold value (hereinafter referred to as a second change threshold value) (step S91). When the generated current difference value is greater than the second change threshold (step S93), the control unit 128 performs a background noise update procedure according to the current difference value (step S95) to update the currently used reference measurement value to the use environment. (eg, ambient temperature) one of the set of reference measurements and their corresponding relationship settings. Then, step S17, step S19, and step S23 are successively performed (step S21 is not performed). When the generated current difference value is not greater than the second change threshold (step S93), step S15 is continuously performed.

在步驟S95的一實施例中,參照第10圖,控制單元128從儲存單元126讀出當前差異值所對應的一組參考量測值及其對應之關係設定(步驟S951)。然後,控制單元128以讀出之一組參考量測值更新當前設定為於執行步驟S13及步驟S19時所使用的參考量測值(步驟S953)。並且,控制單元128以讀出之關係設定更新當前設定為於執行步驟S15時所使用的關係設定(步驟S953)。 In an embodiment of step S95, referring to FIG. 10, the control unit 128 reads out, from the storage unit 126, a set of reference measurement values corresponding to the current difference value and their corresponding relationship settings (step S951). Then, the control unit 128 updates the reference measurement value currently used to perform the steps S13 and S19 by reading out one of the group reference measurement values (step S953). Then, the control unit 128 sets the update current setting to the relationship setting used when the step S15 is executed in the read relationship relationship (step S953).

在一些實施例中,參考點的信號偵測動作能直接應用於判定更新背景雜訊(即,參考量測值)的時機。換言之,當產生的當前差異值不大於第二變化閥值(步驟S93)時,不執行步驟S15,而是接續執行步驟S17。在步驟S951中,所讀出之一組參考量測值分別對應於複數感測點P(1,1)~P(n,m)。其中,不同當前差異值所對應的一組參考量測值能預先建立並儲存在儲存單元126。換言之,儲存單元126儲存有對 應不同當前差異值之複數組參考量測值,並且每一組參考量測值中的多個參考量測值分別對應於複數感測點P(1,1)~P(n,m)。此些組參考量測值中之一組設定為當前使用,以作為執行步驟S13及步驟S19時所使用。不同當前差異值所對應的一組參考量測值的建立方法為本領域所熟知,故不再贅述。 In some embodiments, the signal detection action of the reference point can be directly applied to determine the timing of updating the background noise (ie, the reference measurement). In other words, when the generated current difference value is not greater than the second change threshold (step S93), step S15 is not performed, but step S17 is successively performed. In step S951, the read one set of reference measurement values respectively correspond to the complex sense points P(1, 1) to P(n, m). The set of reference measurements corresponding to different current difference values can be pre-established and stored in the storage unit 126. In other words, the storage unit 126 stores the pair The complex array reference value of the current difference value should be different, and the plurality of reference measurement values in each set of reference measurement values respectively correspond to the complex sensing points P(1, 1)~P(n, m). One of the group reference measurement values is set to be currently used as used when performing steps S13 and S19. The method for establishing a set of reference measurement values corresponding to different current difference values is well known in the art, and therefore will not be described again.

應當可理解的是,各步驟的執行順序並不限於前述描述順序,可依據步驟的執行內容適當地調配執行順序。於此,儲存單元126能由一個或多個儲存元件所實現。前述之各儲存元件是用以儲存或暫存相關之軟體/韌體程式、資料、信號、數值、檔案或其組合等。其中,儲存元件可以是例如揮發性記憶體或非揮發性記憶體等,但在此並不對其限制。 It should be understood that the order of execution of the steps is not limited to the foregoing described order, and the order of execution may be appropriately adapted depending on the execution content of the steps. Here, the storage unit 126 can be implemented by one or more storage elements. Each of the foregoing storage elements is used to store or temporarily store related software/firmware programs, data, signals, values, files, or a combination thereof. The storage element may be, for example, a volatile memory or a non-volatile memory, but is not limited thereto.

綜上,根據本發明之電容式感測裝置及其背景雜訊更新方法藉由選定之參考點的周期巡察判定更新背景雜訊(即,參考量測值)的時機,藉以快速獲取溫度變化的影響程度並對應調整位置信號的感測基準,以保證信號讀取的正確性且增強對溫度變化的反應速度。 In summary, the capacitive sensing device and the background noise updating method thereof according to the present invention determine the timing of updating the background noise (ie, the reference measurement value) by the periodic inspection of the selected reference point, thereby quickly obtaining the temperature change. The degree of influence corresponds to the sensing reference of the position signal to ensure the correctness of the signal reading and enhance the reaction speed to the temperature change.

雖然本發明以前述之實施例揭露如上,然其並非用以限定本發明,任何熟習相像技術者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。 While the present invention has been described above in the foregoing embodiments, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope of patent protection shall be subject to the definition of the scope of the patent application attached to this specification.

S13‧‧‧根據此些參考點的當前量測值與至少一參考量測值產生一當前差異值 S13‧‧‧ generates a current difference value based on the current measured value of the reference points and the at least one reference measured value

S15‧‧‧依據一關係設定與產生的當前差異值取得一受選調整因子 S15‧‧‧Actain a selected adjustment factor based on a relationship setting and the current difference value generated

S17‧‧‧偵測多個感測點的當前量測值 S17‧‧‧Detecting current measurements of multiple sensing points

S19‧‧‧根據此些感測點的當前量測值產生此些感測點的位置信號 S19‧‧‧ generates the position signals of the sensing points based on the current measured values of the sensing points

S23‧‧‧根據參考信號控制調整後之位置信號的輸出 S23‧‧‧Control the output of the adjusted position signal according to the reference signal

S91‧‧‧比較產生的當前差異值與第二變化閥值 The current difference value and the second change threshold generated by S91‧‧‧ comparison

S93‧‧‧當前差異值是否大於第二變化閥值? S93‧‧ Is the current difference value greater than the second change threshold?

S95‧‧‧根據當前差異值執行背景雜訊更新程序 S95‧‧‧Perform background noise update procedure based on current difference values

Claims (16)

一種電容式感測裝置的感測方法,包括:偵測複數感測點中之複數參考點的當前量測值,其中該些感測點是由相互交錯之複數電極所界定且配置成一矩陣、該些感測點分別對應設定為當前使用的複數參考量測值,以及該些參考點位於該矩陣的邊緣;根據該些參考點的該些當前量測值與當前使用的該些參考量測值產生一當前差異值;比較該當前差異值與一變化閥值;當該當前差異值大於該變化閥值時,根據該當前差異值執行一背景雜訊更新程序,以更新設定為當前使用的該些參考量測值;偵測該些感測點的複數當前量測值;根據該些感測點的該些當前量測值以及當前使用的該些參考量測值產生該些感測點的的複數位置信號;以及根據一參考信號控制該些位置信號的輸出。 A sensing method of a capacitive sensing device, comprising: detecting a current measurement value of a plurality of reference points in a plurality of sensing points, wherein the sensing points are defined by a plurality of interdigitated electrodes and configured as a matrix, The sensing points are respectively set to the currently used complex reference measurement values, and the reference points are located at the edge of the matrix; the current measurement values according to the reference points and the reference measurements currently used The value generates a current difference value; compares the current difference value with a change threshold; when the current difference value is greater than the change threshold, performing a background noise update procedure according to the current difference value to update the setting to be currently used The reference measurement values; detecting the plurality of current measurement values of the sensing points; generating the sensing points according to the current measurement values of the sensing points and the reference measurement values currently used a plurality of position signals; and controlling the output of the position signals based on a reference signal. 如請求項1所述之感測方法,其中該根據該當前差異值執行一背景雜訊更新程序的步驟包括:從一儲存單元讀出該當前差異值所對應的一組參考量測值;以及以讀出之該組參考量測值更新當前使用之該些參考量測值。 The sensing method of claim 1, wherein the step of performing a background noise update procedure according to the current difference value comprises: reading a set of reference measurement values corresponding to the current difference value from a storage unit; The reference measurement values currently used are updated with the set of reference measurement values read out. 如請求項1所述之感測方法,其中該偵測複數感測點中之複數參考點的當前量測值之步驟包括: 驅動該些電極中位在該矩陣的第一側邊的至少一電極以及位在該矩陣的第二側邊的至少一電極,其中該第一側邊相對於該第二側邊;以及量測該些電極中位在該矩陣的第三側邊的至少一電極以及位在該矩陣的第四側邊的至少一電極以得到該些參考點的該些當前量測值,其中該第三側邊相對於該第四側邊。 The sensing method of claim 1, wherein the step of detecting a current measurement value of the plurality of reference points in the plurality of sensing points comprises: Driving at least one electrode of the electrodes at a first side of the matrix and at least one electrode positioned at a second side of the matrix, wherein the first side is opposite the second side; and measuring Having at least one electrode on the third side of the matrix and at least one electrode on the fourth side of the matrix to obtain the current measurements of the reference points, wherein the third side The side is opposite to the fourth side. 如請求項1所述之感測方法,其中該偵測複數感測點中之複數參考點的當前量測值之步驟包括:驅動並量測該些電極中位在該矩陣的至少一側邊的至少一電極,以得到該些參考點的該些當前量測值。 The sensing method of claim 1, wherein the detecting the current measurement value of the plurality of reference points in the plurality of sensing points comprises: driving and measuring the middle of the electrodes on at least one side of the matrix At least one electrode to obtain the current measured values of the reference points. 如請求項1所述之感測方法,其中該些電極包括複數第一電極以及與該些第一電極交錯的複數第二電極,以及該偵測複數感測點中之複數參考點的當前量測值之步驟包括:驅動該些第一電極中位在該矩陣的第一側邊的至少一者以及位在該矩陣的第二側邊的至少一者,其中該第一側邊相對於該第二側邊;以及量測該些第二電極中的複數者以得到該些參考點的該些當前量測值。 The sensing method of claim 1, wherein the electrodes comprise a plurality of first electrodes and a plurality of second electrodes interleaved with the first electrodes, and a current amount of the plurality of reference points in the detected complex sensing points The step of measuring includes driving at least one of the first electrodes in the first side of the matrix and at least one of the second sides of the matrix, wherein the first side is opposite to the first side a second side; and measuring a plurality of the second electrodes to obtain the current measurements of the reference points. 如請求項5所述之感測方法,其中被量測之該些第二電極中之任二者之間間隔有未被量測之至少一第二電極。 The sensing method of claim 5, wherein at least one of the second electrodes that are measured is separated by at least one second electrode that is not measured. 如請求項1所述之感測方法,其中該些電極包括複數第一電極以及與該些第一電極交錯的複數第二電極,以及該偵測複數感測點中之複數參考點的當前量測值之步驟包括:驅動該些第一電極中位在該矩陣的第一側邊的至少一者以及位在該矩陣的第二側邊的至少一者,其中該第一側邊相對於該第二側邊;量測該些第二電極中的至少一者以得到該些參考點中之複數者的該些當前量測值;驅動該些第二電極中位在該矩陣的第三側邊的至少一者以及位在該矩陣的第四側邊的至少一者,其中該第三側邊相對於該第四側邊;以及量測該些第一電極中的至少一者以得到該些參考點中之剩餘者的該些當前量測值。 The sensing method of claim 1, wherein the electrodes comprise a plurality of first electrodes and a plurality of second electrodes interleaved with the first electrodes, and a current amount of the plurality of reference points in the detected complex sensing points The step of measuring includes driving at least one of the first electrodes in the first side of the matrix and at least one of the second sides of the matrix, wherein the first side is opposite to the first side a second side; measuring at least one of the second electrodes to obtain the current measured values of the plurality of the reference points; driving the second electrodes to be at a third side of the matrix At least one of the sides and at least one of the fourth sides of the matrix, wherein the third side is opposite the fourth side; and measuring at least one of the first electrodes to obtain the The current measurements of the remaining of the reference points. 如請求項7所述之感測方法,其中被量測之該些第一電極中之任二者之間間隔有未被量測之至少一第一電極,並且被量測之該些第二電極中之任二者之間間隔有未被量測之至少一第二電極。 The sensing method of claim 7, wherein at least one of the first electrodes that are measured is separated by at least one first electrode and the second ones are measured At least one second electrode that is not measured is spaced between any of the electrodes. 如請求項1所述之感測方法,其中該矩陣區分為一感測區以及位在該感測區邊緣的一無效區,以及該些參考點是位在該無效區內。 The sensing method of claim 1, wherein the matrix is divided into a sensing area and an invalid area located at an edge of the sensing area, and the reference points are located in the invalid area. 如請求項1至9中之任一項所述之感測方法,更包括:比較該當前差異值與另一變化閥值;當該當前差異值大於該另一變化閥值時,增加該些參考點的該些當前量測值的偵測頻率。 The sensing method according to any one of claims 1 to 9, further comprising: comparing the current difference value with another change threshold; increasing the current difference value when the current difference value is greater than the another change threshold The detection frequency of the current measured values of the reference point. 如請求項1至9中之任一項所述之感測方法,更包括: 比較該當前差異值與一變化閥值;當該當前差異值大於該變化閥值時,增加該些參考點的該些當前量測值的偵測頻率並重置一計數值;當該當前差異值不大於該變化閥值時,累計該計數值;當該計數值達一既定值時,減少該些參考點的該些當前量測值的偵測頻率並重置該計數值;以及當該計數值未達該既定值時,不調整該些參考點的該些當前量測值的偵測頻率。 The sensing method according to any one of claims 1 to 9, further comprising: Comparing the current difference value with a change threshold; when the current difference value is greater than the change threshold, increasing the detection frequency of the current measurement values of the reference points and resetting a count value; when the current difference When the value is not greater than the change threshold, the count value is accumulated; when the count value reaches a predetermined value, the detection frequency of the current measurement values of the reference points is decreased and the count value is reset; When the count value does not reach the predetermined value, the detection frequency of the current measurement values of the reference points is not adjusted. 一種電容式感測裝置,包括:一儲存單元,儲存對應不同當前差異值之複數組參考量測值以及一參考信號,其中該些組參考量測值中之一組設定為當前使用;一訊號感測器,包括:複數第一電極以及複數第二電極,其中該些第一電極與該些第二電極交錯,並且該些第一電極與該些第二電極界定以一矩陣配置之複數感測點,其中每一該組參考量測值中之複數參考量測值分別對應於該些感測點;一驅動/偵測單元,連接該些第一電極與該些第二電極,用以偵測該些感測點的當前量測值;一位置偵測單元,連接該驅動/偵測單元與該儲存單元,用以根據該些感測點中之複數參考點的該些當前量測值與當前使用的該些參考量測值產生一當前差異值、根據該些感測點的該些當前量測值與當前使用的該組參考量測值產生複數位置信號以及根據該參考信號控制該些位置信號的輸出,其中該些參考點位於該矩陣的邊緣;以及 一控制單元,連接該儲存單元、該驅動/偵測單元與該位置偵測單元,用以比較該當前差異值與一變化閥值,其中當該當前差異值大於該變化閥值時,該控制單元根據該當前差異值執行一背景雜訊更新程序,以更新設定為當前使用的該組參考量測值。 A capacitive sensing device includes: a storage unit that stores a complex array reference value corresponding to different current difference values and a reference signal, wherein one of the group reference measurement values is set to be currently used; The sensor includes: a plurality of first electrodes and a plurality of second electrodes, wherein the first electrodes are interlaced with the second electrodes, and the first electrodes and the second electrodes define a complex sense in a matrix configuration a plurality of reference measurement values in each of the set of reference measurement values respectively corresponding to the sensing points; a driving/detecting unit connecting the first electrodes and the second electrodes for Detecting current measurement values of the sensing points; a position detecting unit connecting the driving/detecting unit and the storage unit for determining the current measurement according to the plurality of reference points in the sensing points And generating a current difference value from the currently used reference measurement values, generating a complex position signal according to the current measurement values of the sensing points and the currently used set of reference measurement values, and controlling according to the reference signal Some of these Counter output signal, wherein the plurality of reference point located on the edge of the matrix; and a control unit, the storage unit, the driving/detecting unit and the position detecting unit for comparing the current difference value with a change threshold, wherein when the current difference value is greater than the change threshold, the control The unit performs a background noise update procedure based on the current difference value to update the set of reference measurement values set to be currently used. 如請求項12所述之電容式感測裝置,其中在該背景雜訊更新程序中,該控制單元從該儲存單元讀出該當前差異值所對應的該組參考量測值,並且以讀出之該組參考量測值更新當前使用之該些參考量測值。 The capacitive sensing device of claim 12, wherein in the background noise update program, the control unit reads the set of reference measurement values corresponding to the current difference value from the storage unit, and reads The set of reference measurements updates the reference measurements currently in use. 如請求項12所述之電容式感測裝置,其中該些參考點位在該矩陣的角落。 The capacitive sensing device of claim 12, wherein the reference points are located at a corner of the matrix. 如請求項12所述之電容式感測裝置,其中該矩陣區分為一感測區以及位在該感測區邊緣的一無效區,以及該些參考點是位在該無效區內。 The capacitive sensing device of claim 12, wherein the matrix is divided into a sensing region and an inactive region located at an edge of the sensing region, and the reference points are located in the inactive region. 如請求項12至15中之任一項所述之電容式感測裝置,其中該控制單元更用以根據當前差異值與另一變化閥值調整該驅動/偵測單元對該些參考點的該些當前量測值的偵測頻率。 The capacitive sensing device according to any one of claims 12 to 15, wherein the control unit is further configured to adjust the driving/detecting unit to the reference points according to the current difference value and another change threshold. The detection frequency of the current measured values.
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