TWI516782B - Working machine automatic testing system and its implementing method - Google Patents

Description

Machine automatic test system and implementation method thereof

The machine automatic test system and the implementation method thereof, the invention especially relates to a machine automatic test system which is used for testing the number of successful actuations of a test machine under certain test parameters, automatically recording the number of successful actuations, and shortening the test time. And its implementation method.

The existing machine tester uses a parameter generator to be placed behind its board, and generates data to be written into the object to be tested via the parameter generator. As the board increases, the parameter generator also needs to be increased. This kind of testing method makes the hardware cost increase greatly, and in practical operation, it can not bring the test environment that the manufacturer can trust. The final quality needs to pass the parameter test in the normal temperature environment to avoid the previous Unnecessary high temperature error occurs; for example, the "High Temperature Test System" of the Republic of China Invention Patent No. I389128, which is mainly tested through a heating chassis area 200 having a heat insulation layer 210 package. Covering the surrounding area to form an area that can be heated and maintained at a constant temperature, and the heat source is designed from a heating blower 220, which has a heating duct and a fan arrangement, and the rotation of the fan drives the hot air flow, and the hot air flow passes through The partition The heat flow conduit inside the thermal layer 210 is injected into the heating enclosure area 200 via the diversion port 230 at A; as can be seen from the above, the conventional test method is to design an independent heating device to perform an ambient temperature test on the object to be tested, however, to be tested After passing the temperature test of the heating chassis area 200, the object is further tested in the next station for reading and writing, and most of the process is performed manually, so that the test is repeated, if the number of test objects is large, It is not possible to effectively shorten the test time, so it is necessary to improve it.

In view of the above problems, the present inventors have conducted research and analysis on machine testing based on years of experience in related industries and product design, and can design a solution to the above problems; thus, the main purpose of the present invention is to An automatic test system capable of automatically performing machine test and adjusting test time and an implementation method thereof are provided.

In order to achieve the above purpose, the automatic test system of the machine of the present invention is set in a machine under test, and a test parameter is input after connecting the test machine through an external input device (for example, the number of test starts), and the ambient temperature reaches one. When the temperature is preset, the first processing module of the automatic test system of the machine drives the second processing module, so that the second processing module drives the machine to operate (ie, power on), and the first processing module can simultaneously record and Monitor the time when the machine is turned on at a specific temperature, and effectively integrate the recorded time, transfer the recorded minimum boot time to a drive module, and re-drive the first processing module to the shortest recorded by the drive module. The boot time is tested against the benchmark. Effectively achieve automatic testing and shorten test time.

In order for your review board to have a clear understanding of the purpose, technical features and effects of the present invention, the following description will be used in conjunction with the illustrations, please refer to it.

10‧‧‧ machine automatic test system

101‧‧‧Information receiving module

102‧‧‧First Processing Module

103‧‧‧Second processing module

104‧‧‧Power Module

105‧‧‧System State Sensing Module

106‧‧‧Environmental temperature sensing module

11‧‧‧Tested machine

12‧‧‧External input device

21‧‧‧Enter test parameter steps

22‧‧‧Detecting ambient temperature steps

23‧‧‧System test steps

24‧‧‧Automatic recording and correction steps

25‧‧‧Return test record step

Figure 1 is a schematic diagram of the operation of the system of the present invention.

Fig. 2 is a schematic view showing the structure of the system of the present invention.

Figure 3 is a schematic diagram showing the steps of implementing the system of the present invention.

Figure 4 is a schematic view showing the implementation of the present invention.

Please refer to "FIG. 1", which is a schematic diagram of the operation of the system of the present invention. As shown in the figure, a machine under test 11 can be, for example, a notebook computer or Other electronic devices for loading the system, etc., as shown in the figure, the automatic test system 10 of the machine of the present invention is normally installed in the machine under test 11, and the automatic test system 10 of the machine can be combined with an external input. The device 12 forms an information link. The external input device 12 can be a computer host or a device that can input test parameters. When testing, the tester can input test parameters through the external input device 12, for example, testing the tested machine in a certain period of time. 11 the number of power-on and power-off, or the test of power-on and power-off under the condition of reaching a test parameter, and the automatic test system of the machine After receiving the test parameters input by the external input device 12, the test machine 11 is tested with the received test parameters, and after the test is completed, the test result information generated by the test process is further analyzed (for example, The test parameters can be successfully turned on several times under the test parameters, and returned to the external input device 12 for the test personnel to perform test recording.

Please refer to "FIG. 2", which is a schematic structural diagram of the system of the present invention. The automatic test system 10 of the machine shown in the figure mainly has an information receiving module 101 for receiving external input. The test parameter information (including the test environment temperature to be tested or the number of power-on times at a specific time and temperature) transmitted by the device 12, and the information receiving module 101 forms an information link with a first processing module 102. The first processing module 102 can be, for example, an MCU (Machine Control Unit), and the information receiving module 101 can transmit the received test parameter information to the first processing module 102 for storage. The first processing module 102 is connected to a second processing module 103. The second processing module 103 can be, for example, a CPU (Central Processing Unit). The module 102 can transmit the test parameter information to the second processing module 103, so that the second processing module 103 can drive the device under test 11 to operate through the connected power module 104, and the power module 104 is respectively a processing module 10 2, a system state sensing module 105 forms an information link, the system state sensing module 105 can mainly sense an operating state information of the device under test 11; an ambient temperature sensing module 106 and a first processing module The group 102 forms an information link, and the ambient temperature sensing module 106 can detect the ambient temperature around the machine under test 11 The detected temperature data is further transmitted to the first processing module 102.

Please refer to "Figure 3", which shows the steps of the system implementation of the present invention. Please refer to "Figure 2". The system implementation steps of the present invention are as follows: (1) Input test parameters Step 21: Use external input After the device 12 inputs a test parameter information, the external input device 12 further transmits the test parameter information to the information receiving module 101 of the machine automatic test system 10, and the information receiving module 101 transmits the test parameter information to the first The processing module 102 is configured to be stored by the first processing module 102, and the test parameter information may be, for example, under a specific ambient temperature, and the test machine 11 is within a specific time range after the booting is completed ( For example, after 15 seconds of power-on, the system is turned off and then turned on; (2) detecting the ambient temperature. Step 22: According to step 21 of inputting the test parameters, the ambient temperature sensing module 106 can sense the machine under test. The ambient temperature is detected by the ambient temperature sensing module 106. (3) The system performs the test step 23: the ambient temperature sensing module 106 continuously detects the ambient or internal temperature of the tested machine 11 as described in step 22 of detecting the ambient temperature, when the ambient temperature reaches the predetermined temperature. When the temperature of the test (ie, the ambient temperature to be tested), the first processing module 102 drives the second processing module 103 to actuate the power module 104 to operate the device under test 11 (4) Automatic recording and correction step 24: The system performs the test step 23, and please refer to the "4th figure", and the system state sensing module 105 normally forms a information link with the power module 104. The device status detection module 105 detects that the power module 104 of the device under test 11 is successfully driven. The test machine 11 transmits a success information to the first processing module 102. If the system state sensing module 105 does not detect that the power module 104 successfully drives the device under test 11, the device 11 is tested. If the booting fails, the system status sensing module 105 sends a startup failure information to the first processing module 102, and the first processing module 102 can perform a complete test record by the startup success information or the startup failure information transmission. In addition, the system state sensing module 105 can detect the time when the machine under test 11 is turned on, and send a startup time information to the first processing module 102 to correct the boot time of the device under test 11, such as As shown in Figure 4, the machine under test 11 is The power-on test is performed at 60 degrees C (for example, the power-on test is 10 times), and the device under test 11 completes the boot process 5 seconds after being driven by the power module 104, but the initial test parameter information is set to 15 after the boot is completed. The shutdown operation is performed in seconds. Therefore, the first test of the test machine 11 will perform the second on-off test after 15 seconds, and the system state sensing module 105 further senses the tested machine 11 The booting has been completed within 5 seconds, and a system status message (which has a message to complete 5 seconds of booting) is transmitted to the first processing module 102, whereby the first processing module 102 The parameter setting time in the test parameter information input in advance may be further compared. For example, the test parameter information is set to be turned off and then turned on 15 seconds after the test machine 11 is turned on, and the first processing module 102 receives. The system status message is completed within 5 seconds, and the first processing module 102 sets the test parameter information to 15 seconds to perform the test parameter after the power is turned off and then turned on, and automatically corrects the test parameter to be turned off and then turned on after 5 seconds, and In the second on-off test, the test parameters of 5 seconds are immediately implemented, and the test time of the machine under test 11 is effectively shortened; (5) the return test record is recorded in step 25: the automatic recording and correction step 24, the first processing mode After the group 102 completes the complete test according to the test parameter information, a test result information is generated, and the test result information is transmitted to the external input device 12 connected to the device under test 11 through the information receiving module 101 for the operator. Record and browse.

It can be seen from the above that the machine automatic test system and the implementation method thereof are mainly used to transmit a test parameter information to the first processing module of the machine automatic test system by using an external input device, and through the environment. The temperature sensing module drives the first processing module to actuate the second processing module to drive the power module to operate, so that a device under test is activated, and further monitors by using the system state sensing module to further The current condition of the tested machine is transmitted to the first processing module for test recording, and the first processing module can automatically modify the time of the switch test according to the system state sensing module; accordingly, the present invention is implemented according to the present invention After that, it is indeed possible to provide an automatic test system for the machine that can automatically perform machine test and adjust test time. The purpose of the method.

The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention; any changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention All should be covered by the patent of the present invention.

In summary, the effects of the present invention are patents such as "industry availability", "novelty" and "progress" of the invention; the applicant applies for an invention patent to the bureau in accordance with the provisions of the Patent Law. .

10‧‧‧ machine automatic test system

101‧‧‧Information receiving module

102‧‧‧First Processing Module

103‧‧‧Second processing module

104‧‧‧Power Module

105‧‧‧System State Sensing Module

106‧‧‧Environmental temperature sensing module

Claims (5)

An automatic test system for a machine is mainly disposed in a machine under test for testing the machine under test, and includes: an information receiving module for receiving a test parameter transmitted by an external input device a first processing module that forms an information link with the information receiving module to receive the test parameter information; a second processing module that forms an information link with the first processing module and a power module, respectively The first processing module can transmit the test parameter information to the second processing module, so that the second processing module drives the device under test electrically connected to the power module to generate an action; The test module is respectively connected with the first processing module and the power module, and the system state sensing module can detect an operational status information of the tested machine; and an ambient temperature sensing module Forming an information link with the first processing module, the ambient temperature sensing module detects a temperature of the environment surrounding the tested machine, generates a temperature sensing information, and further transmits the temperature sensing information to the first Processing module. The automatic test system of the machine of claim 1, wherein the system state sensing module detects that the device under test is driven by the power module, and the system state sensing module sends a Start success information to the first processing module. For example, the automatic test system of the machine mentioned in claim 1 is not detected by the system state sensing module, and the system state sensing module sends a startup failure. Information to the first processing module. An implementation method of a machine automatic test system, comprising: An input test parameter step: inputting a test parameter information to an information receiving module of a machine automatic test system through an external input device, and the information receiving module further transmits the test parameter information to a first process In the module, a step of detecting the ambient temperature: the step of inputting the test parameter, the first processing module performs an environment temperature detection module to detect the ambient or internal ambient temperature of the device under test; The first processing module drives a second processing module to drive when the first processing module detects the ambient temperature to be tested through the ambient temperature sensing module. a power module operates to operate the device under test electrically connected to the power module; and an automatic recording and correcting step: a system state sensing module detects the measured through the power module a startup status message of the machine, and the system status sensing module can transmit the startup status message of the tested machine to the first processing module for recording, and the tested machine After the power module is driven, the system state sensing module can detect the time when the tested machine is turned on, and send a startup time information to the first processing module to make the first processing module. The startup time information can be compared with the test parameter information to correct the boot time of the tested machine. The method for implementing the automatic test system of the machine as described in claim 4, wherein after the automatic recording and correcting step is completed, performing a back test recording step, so that the first processing module is based on the test parameter Information about a test result generated after the information is completed can be transmitted to the external input device connected to the device under test for recording and browsing.