TWI515805B - Semiconductor packaging method - Google Patents

Semiconductor packaging method Download PDF

Info

Publication number
TWI515805B
TWI515805B TW101122255A TW101122255A TWI515805B TW I515805 B TWI515805 B TW I515805B TW 101122255 A TW101122255 A TW 101122255A TW 101122255 A TW101122255 A TW 101122255A TW I515805 B TWI515805 B TW I515805B
Authority
TW
Taiwan
Prior art keywords
mold
package
semiconductor
packaging
semiconductor according
Prior art date
Application number
TW101122255A
Other languages
Chinese (zh)
Other versions
TW201401386A (en
Original Assignee
Gld Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gld Technology Co Ltd filed Critical Gld Technology Co Ltd
Priority to TW101122255A priority Critical patent/TWI515805B/en
Publication of TW201401386A publication Critical patent/TW201401386A/en
Application granted granted Critical
Publication of TWI515805B publication Critical patent/TWI515805B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • H01L2924/1815Shape

Description

半導體之封裝方法 Semiconductor packaging method

本發明係有關一種半導體之封裝方法,特別是指一種可提升半導體較佳光學感測效果,更可提高整體半導體封裝結構之強度及穩定性的封裝方法。 The invention relates to a semiconductor packaging method, in particular to a packaging method which can improve the optical sensing effect of the semiconductor and improve the strength and stability of the overall semiconductor package structure.

按,光感測晶片受到廣泛地應用,為了提高性能以及其穩定性,光感測晶片於封裝時,必須考量到環境因素(如:光線)、機械支持以及電性連接的問題,以確保光感測晶片於測量數值的可靠度。 According to the photo-sensing wafer, it is widely used. In order to improve the performance and stability of the photo-sensing wafer, environmental factors (such as light), mechanical support and electrical connection must be considered to ensure light. Sensing the reliability of the wafer to the measured values.

如台灣公告編號第420865號專利案揭露有一種「用於光感測晶片封裝之塑膠封裝架構及方法」,其係運用一透光蓋體封裝的方式蓋合於該光感測晶片,光線可穿過該透明蓋體後,再投射於該光感測晶片,以達到感測光線的目的;惟,此案之構件繁多以及加工步序複雜,容易造成生產成本以及工時提高的問題。 For example, the Taiwan Patent Publication No. 420865 discloses a "plastic packaging structure and method for optical sensing chip packaging", which is covered by the light sensing package by a transparent cover package, and the light can be used. After passing through the transparent cover body, it is projected onto the light sensing wafer to achieve the purpose of sensing light. However, the complicated components of the case and the complicated processing steps are likely to cause problems in production cost and work time.

為解決上述問題,台灣公告編號第M308500號專利案揭露有一種「光感測晶片用之模壓封裝結構」,其係包含有一導線架、一光感測晶片、若干導線以及一封裝層;其中光感測晶片設於導線架,且具有至少一作用區以及一非作用區,非作用區位於作用區周圍;該等導線係連接光感測晶片與導線架;封裝層係不可透光地設於非作用區以及導線架之間且包覆非作用區、該等導線以及導線架局部,並形成至少一開放區係對應於作用區;其係運用模壓成型(molding)製程取代習 用以封蓋製程(cap package)的方式。 In order to solve the above problem, the Taiwan Patent Publication No. M308500 discloses a "molded package structure for a light sensing wafer", which comprises a lead frame, a light sensing chip, a plurality of wires, and an encapsulation layer; The sensing chip is disposed on the lead frame and has at least one active area and a non-active area, the non-active area is located around the active area; the conductive lines are connected to the light sensing wafer and the lead frame; and the packaging layer is opaquely disposed on the The non-active area and the lead frame and the non-active area, the wires and the lead frame are partially formed, and at least one open area is formed corresponding to the active area; the system is replaced by a molding process. The way to cap the package.

惟,該光感測晶片之作用區係為開放式,並無其他光學結構(例如凸透鏡)之覆蓋,其感測效果較差,且容易堆積污染物而影響感測精度,而該開放式之作用區使該光感測晶片,無法具有保護之功效;而進行模壓封裝時,係利用一凸部直接抵於該光感測晶片之作用區,用以使該封裝層形成該開放區,該凸部並無對位結構供其對位用,需較精確之對位才得以正對於光感測晶片之作用區,增加加工之困難,若對位不精確,則會影響其感測效果,增加產品之不良率;故該種習有封裝方法,且除了對位及合模的精準度皆難以控制外,該凸部難以加工,且無法應用於小尺寸的晶片,難以符合市場輕薄短小的發展需求。 However, the active area of the light sensing chip is open, and there is no covering of other optical structures (such as convex lenses), the sensing effect is poor, and the pollutants are easily accumulated to affect the sensing precision, and the open function The region enables the photo-sensing wafer to have a protective effect; and in the molding package, a convex portion directly abuts against an active region of the photo-sensing wafer, so that the encapsulating layer forms the open region, and the convex portion There is no alignment structure for its alignment. It is necessary to have a more precise alignment to increase the processing difficulty of the photo-sensing wafer. If the alignment is inaccurate, it will affect its sensing effect and increase. The defect rate of the product; therefore, there is a packaging method, and the convexity is difficult to control except for the accuracy of alignment and clamping. The convex portion is difficult to process and cannot be applied to a small-sized wafer, which is difficult to meet the market's light and short development. demand.

有鑑於此,本發明即在提供一種可提升半導體較佳光學感測效果,更可提高整體半導體封裝結構之強度及穩定性的封裝方法,為其主要目的者。 In view of the above, the present invention provides a packaging method capable of improving the optical sensing effect of a semiconductor and improving the strength and stability of the overall semiconductor package structure.

為達上揭目的,本發明中半導體之一次封裝體表面利用二次封裝模具成型二次封裝體,該二次封裝模具係形成有讓位空間,該讓位空間之形狀係與該一次封裝體外露形狀相對應,使該一次封裝體表面覆蓋有二次封裝體時,該二次封裝體相對於該讓位空間處形成有讓位結構,可相對使該一次封裝體部分區域外露。 In order to achieve the above object, in the surface of the primary package of the semiconductor of the present invention, the secondary package is formed by using a secondary package mold, and the secondary package mold is formed with a yield space, and the shape of the yield space is associated with the primary package. The exposed shape corresponds to such that when the surface of the primary package is covered with the secondary package, the secondary package is formed with a yielding structure with respect to the yield space, and the partial region of the primary package can be exposed relatively.

其中,該二次模具之壓模成型可省去增加外蓋之時間及成本,並可提高整體封裝結構強度及穩定性,並可確保該半 導體之良率,並藉由該讓位結構可使一次封裝體部分區域外露,可確保內部半導體之工作效能而不會被外部環境干擾,以達到較佳光、電遮蔽性及光導向性,並利用一次封裝體調整該半導體之光學效果例如可具有聚光效果,可提高該半導體較佳光學感測效果。 Wherein, the press molding of the secondary mold can save the time and cost of adding the outer cover, and can improve the strength and stability of the overall package structure, and can ensure the half The yield of the conductor, and the partial structure of the primary package can be exposed by the yield structure, thereby ensuring the working performance of the internal semiconductor without being disturbed by the external environment, thereby achieving better light, electric shielding and light guiding. The optical effect of adjusting the semiconductor by using the primary package can have a concentrating effect, for example, and the optical sensing effect of the semiconductor can be improved.

依據上述主要結構特徵,所述二次封裝模具設有第一模具及第二模具,該第一模具蓋合於該基板後形成有一模穴,該第二模具係設於該第一模具內,而該讓位空間則位於該第二模具末端,並相對靠近於該一次封裝體部分區域之表面。 According to the above main structural features, the second package mold is provided with a first mold and a second mold, and the first mold is formed on the substrate to form a cavity, and the second mold is disposed in the first mold. The yield space is located at the end of the second mold and is relatively close to the surface of the portion of the primary package.

上述每一半導體上係分別覆蓋一次封裝體,而各一次封裝體間係具有間距,且該二次封裝體並成型有相對伸入各間距之隔間部。 Each of the above-mentioned semiconductors covers the package once, and each of the packages has a pitch, and the secondary package is formed with a compartment portion extending relatively into the respective intervals.

依據上述主要結構特徵,所述一次封裝體之封裝材料可以為透光材料;上述之二次封裝體之封裝材料可以為濾光、濾色光或者濾電磁波之材料。 According to the above main structural features, the encapsulation material of the primary package may be a light transmissive material; the encapsulation material of the secondary package may be a material for filtering, filtering or filtering electromagnetic waves.

依據上述主要結構特徵,所述該一次封裝體外露形狀可以為弧凸部,而該讓位空間則相對應形成凹陷形狀,且該第二模具可相對位於該第一模具靠近上方處或側邊。 According to the above main structural features, the primary package outer shape may be an arc convex portion, and the yield space correspondingly forms a concave shape, and the second mold may be located at an upper side or a side of the first mold. .

依據上述主要結構特徵,所述一次封裝體外露形狀可以為凹陷部,而該讓位空間則相對應形成弧凸形狀,且第二模具可相對位於該第一模具靠近上方處或側邊。 According to the above main structural features, the outer shape of the primary package may be a depressed portion, and the yield space is correspondingly formed into an arcuate shape, and the second mold may be located at an upper portion or a side of the first mold.

具體而言,本發明之封裝方法係可以產生下列功效: In particular, the encapsulation method of the present invention can produce the following effects:

1.利用一次封裝體調整該半導體之光學效果例如可具有聚光效果,可提高該半導體較佳光學感測效果。 1. Adjusting the optical effect of the semiconductor by using a single package, for example, can have a light collecting effect, and the optical sensing effect of the semiconductor can be improved.

2.二次模具進行壓模時,該讓位空間可與該一次封裝體 部分區域外露相互對位,達到快速對位之效果,以確保該半導體之良率。 2. When the secondary mold is pressed, the letting space can be combined with the primary package Some areas are exposed to each other to achieve a fast alignment effect to ensure the yield of the semiconductor.

3.藉由該讓位結構可使一次封裝體部分區域外露,而其他區域則被二次封裝體覆蓋,可確保內部半導體之工作效能而不會被外部環境干擾,以達到較佳光、電遮蔽性及光導向性。 3. By using the yield structure, a portion of the package body can be exposed, and other regions are covered by the secondary package, thereby ensuring the working performance of the internal semiconductor without being disturbed by the external environment, so as to achieve better light and electricity. Covering and light guiding.

本發明之特點,可參閱本案圖式及實施例之詳細說明而獲得清楚地瞭解。 The features of the present invention can be clearly understood by referring to the drawings and the detailed description of the embodiments.

如第一圖至第四圖本發明之封裝方法結構示意圖所示,本發明中半導體之封裝方法,其至少包含有:提供一基板10,如第一圖所示,並固定至少一半導體20於該基板10表面,如圖所示之實施例中,係設有二個半導體20,本發明之半導體可以為光感測晶片,其類型可以為CCD(charge-coupled device)、CMOS(Complementary metal oxide semiconductor)、LED(light emitting diode)或Photodiode、Sensor IC(Light Sensor、Hall IC)。 The semiconductor package method of the present invention includes at least one substrate 10 as shown in the first figure, and at least one semiconductor 20 is fixed, as shown in the first to fourth embodiments of the present invention. The surface of the substrate 10, as shown in the embodiment, is provided with two semiconductors 20. The semiconductor of the present invention may be a photo-sensing wafer, and the type thereof may be a CCD (charge-coupled device) or a CMOS (Complementary Metal Oxide). Semiconductor), LED (light emitting diode) or Photodiode, Sensor IC (Light Sensor, Hall IC).

進行一次封裝,如第二圖所示,提供一次封裝模具30進行壓模製程,於該半導體20表面覆蓋一次封裝體40,其中,如第三圖所示,每一半導體20上係分別覆蓋一次封裝體40,而各一次封裝體40間係具有間距41。 The package is performed once. As shown in the second figure, the package mold 30 is provided once for the stamping process, and the surface of the semiconductor 20 is covered once with the package 40, wherein, as shown in the third figure, each semiconductor 20 is covered once. The package body 40 has a spacing 41 between the primary packages 40.

進行二次封裝,提供二次封裝模具50進行壓模製程,如第四圖所示,該二次封裝模具50係設有第一模具51及第二模具52,該第一模具51蓋合於該基板後形成有一模穴53,該第 二模具52係設於該第一模具51內,而該第二模具52末端設有讓位空間521,該讓位空間521之形狀係與該一次封裝體外露形狀相對應,該讓位空間521係伸入該模穴53,並相對靠近於該一次封裝體40部分區域之表面。 The second package is provided with a second package mold 50 for performing a press molding process. As shown in the fourth figure, the second package mold 50 is provided with a first mold 51 and a second mold 52, and the first mold 51 is covered with Forming a cavity 53 behind the substrate, the first The second mold 52 is disposed in the first mold 51, and the end of the second mold 52 is provided with a seating space 521, and the shape of the yield space 521 corresponds to the outer shape of the primary package, and the yield space 521 It extends into the cavity 53 and is relatively close to the surface of a portion of the primary package 40.

如圖所示之實施例中,該一次封裝體40欲外露區域之形狀係為一弧凸部42,而該讓位空間521則相對應形成凹陷形狀,且該第二模具52可相對位於該第一模具51靠近上方處,使該讓位空間521可正對於該一次封裝體之弧凸部42上;成型後,同時參閱第五圖所示,該二次封裝體60成型有相對伸入該一次封裝體各間距41之隔間部61,且該二次封裝體60相對於該讓位空間521處形成有讓位結構62,可相對使該一次封裝體部分區域之弧凸部42外露,而完成該半導體20之封裝。 In the embodiment shown in the figure, the shape of the exposed portion of the primary package 40 is an arc convex portion 42 , and the yield space 521 is correspondingly formed into a concave shape, and the second mold 52 can be located opposite to the same. The first mold 51 is close to the upper portion, so that the yield space 521 can be aligned with the arc convex portion 42 of the primary package; after molding, as shown in the fifth figure, the secondary package 60 is formed with a relative extension. The spacer portion 61 of each of the first package bodies 41 is formed, and the secondary package body 60 is formed with a yielding structure 62 at the position of the yield space 521, so that the arc convex portion 42 of the primary package body portion can be exposed. The package of the semiconductor 20 is completed.

當然,該一次封裝體外露形狀亦可以為凹陷部,而該讓位空間則相對應形成弧凸形狀;而第二模具52亦可相對位於該第一模具51之側邊,如第六圖所示,以對應位於該半導體側邊之弧凸部42,使成型後之該二次封裝體60可相對於該讓位空間521處形成有讓位結構62,請同時參閱第七圖所示,而使該一次封裝體部分區域之弧凸部42外露。 Of course, the outer shape of the primary package may also be a depressed portion, and the yield space is correspondingly formed into an arcuate shape; and the second mold 52 may also be located opposite to the side of the first mold 51, as shown in FIG. The embossed portion 42 is disposed on the side of the semiconductor so that the secondary package 60 can be formed with a yielding structure 62 relative to the yield space 521. Please refer to the seventh figure. The arc convex portion 42 of the partial portion of the primary package is exposed.

再者,如上述實施例中,該第二模具可與該第一模具相互組裝固定;或者,該第二模具52可與該第一模具51一體製成,如第八圖所示;亦或者,該讓位空間521位於該第一模具51內,如第九圖所示,而並未伸入於該模穴53內,並相對靠近於該一次封裝體部分區域之弧凸部42表面;而該一次封裝體之封裝材料可以為透光材料,該二次封裝體之封裝材料可以為濾光、濾色光或者濾電磁波之材料,例如光學複合材料, 而具有濾光、濾波之作用,或者可為氧化鐵複合材料,以具有電性遮蔽之作用。 Furthermore, in the above embodiment, the second mold may be assembled and fixed with the first mold; or the second mold 52 may be integrally formed with the first mold 51, as shown in the eighth figure; The yield space 521 is located in the first mold 51, as shown in the ninth figure, and does not protrude into the cavity 53, and is relatively close to the surface of the arc convex portion 42 of the partial portion of the primary package; The encapsulating material of the primary package may be a light transmissive material, and the encapsulation material of the secondary package may be a material for filtering, filtering or filtering electromagnetic waves, such as an optical composite material. It has the function of filtering and filtering, or it can be an iron oxide composite material to have electrical shielding effect.

值得一提的是,本發明利用一次封裝體調整該半導體之光學效果例如可具有聚光效果,可提高該半導體較佳光學感測效果;且利用二次模具進行壓模時,該讓位空間可與該一次封裝體部分區域外露相互對位,達到快速對位之效果,以確保該半導體之良率,並藉由該讓位結構可使一次封裝體部分區域外露,而其他區域則被二次封裝體覆蓋,可確保內部半導體之工作效能而不會被外部環境干擾,以達到較佳光、電遮蔽性及光導向性。 It is worth mentioning that the optical effect of the present invention by using a primary package to adjust the semiconductor, for example, can have a concentrating effect, which can improve the optical sensing effect of the semiconductor; and when the stamper is used for the second mold, the yield space is It can be aligned with the exposed portion of the primary package to achieve a fast alignment effect to ensure the yield of the semiconductor, and the partial structure of the first package can be exposed by the yield structure, while other regions are The sub-package coverage ensures the performance of the internal semiconductor without being disturbed by the external environment for better light, electrical shielding and light guiding.

綜上所述,本發明提供半導體一較佳可行之封裝方法,爰依法提呈發明專利之申請;本發明之技術內容及技術特點巳揭示如上,然而熟悉本項技術之人士仍可能基於本發明之揭示而作各種不背離本案發明精神之替換及修飾。因此,本發明之保護範圍應不限於實施例所揭示者,而應包括各種不背離本發明之替換及修飾,並為以下之申請專利範圍所涵蓋。 In summary, the present invention provides a preferred and feasible packaging method for a semiconductor, and an application for an invention patent according to the law; the technical content and technical features of the present invention are disclosed above, but those skilled in the art may still be based on the present invention. The disclosure is made without departing from the spirit and scope of the invention. Therefore, the scope of the present invention should be construed as being limited by the scope of the appended claims

10‧‧‧基板 10‧‧‧Substrate

20‧‧‧半導體 20‧‧‧Semiconductor

30‧‧‧一次封裝模具 30‧‧‧One time package mould

40‧‧‧一次封裝體 40‧‧‧One package

41‧‧‧間距 41‧‧‧ spacing

42‧‧‧弧凸部 42‧‧‧Arc convex

50‧‧‧二次封裝模具 50‧‧‧Secondary package mould

51‧‧‧第一模具 51‧‧‧First mould

52‧‧‧第二模具 52‧‧‧Second mold

521‧‧‧讓位空間 521‧‧‧Let the space

53‧‧‧模穴 53‧‧‧ cavity

60‧‧‧二次封裝體 60‧‧‧ secondary package

61‧‧‧隔間部 61‧‧‧ Compartment

62‧‧‧讓位結構 62‧‧‧Recession structure

第一圖至第四圖係為本發明中封裝方法之結構示意圖。 The first to fourth figures are schematic structural views of the packaging method in the present invention.

第五圖係為本發明中半導體完成封裝之結構示意圖。 The fifth figure is a schematic structural view of the semiconductor completed package in the present invention.

第六圖係為本發明中封裝方法之另一結構示意圖。 The sixth figure is another schematic diagram of the packaging method of the present invention.

第七圖係為本發明中半導體完成封裝之另一結構示意圖。 The seventh figure is another schematic diagram of the semiconductor completed package in the present invention.

第八圖係為本發明中二次封裝模具之另一結構示意圖。 The eighth figure is another structural schematic diagram of the secondary packaging mold in the present invention.

第九圖係為本發明中二次封裝模具之再一結構示意圖。 The ninth drawing is a schematic view of another structure of the secondary packaging mold in the present invention.

10‧‧‧基板 10‧‧‧Substrate

20‧‧‧半導體 20‧‧‧Semiconductor

40‧‧‧一次封裝體 40‧‧‧One package

41‧‧‧間距 41‧‧‧ spacing

42‧‧‧弧凸部 42‧‧‧Arc convex

50‧‧‧二次封裝模具 50‧‧‧Secondary package mould

51‧‧‧第一模具 51‧‧‧First mould

52‧‧‧第二模具 52‧‧‧Second mold

521‧‧‧讓位空間 521‧‧‧Let the space

53‧‧‧模穴 53‧‧‧ cavity

Claims (9)

一種半導體之封裝方法,其至少包含有:提供一基板;固定至少一半導體於該基板表面;進行一次封裝,於該半導體表面覆蓋一次封裝體;進行二次封裝,提供二次封裝模具,該二次封裝模具係形成有讓位空間,該讓位空間之形狀係與該一次封裝體外露形狀相對應,使該一次封裝體表面覆蓋有二次封裝體時,該二次封裝體相對於該讓位空間處形成有讓位結構,可相對使該一次封裝體部分區域外露。 A semiconductor packaging method includes at least: providing a substrate; fixing at least one semiconductor on the surface of the substrate; performing a package once, covering the semiconductor surface with the package once; performing secondary packaging to provide a secondary package mold, the second The secondary package mold is formed with a yield space, and the shape of the yield space corresponds to the outer shape of the primary package, so that when the surface of the primary package is covered with the secondary package, the secondary package is opposite to the A bit-receiving structure is formed at the bit space to expose a portion of the primary package portion. 如申請專利範圍第1項所述半導體之封裝方法,其中,該二次封裝模具設有第一模具及第二模具,該第一模具蓋合於該基板後形成有一模穴,該第二模具係設於該第一模具內,而該讓位空間則位於該第二模具末端,並相對靠近於該一次封裝體部分區域之表面。 The method of packaging a semiconductor according to claim 1, wherein the second package mold is provided with a first mold and a second mold, and the first mold is covered with the substrate to form a cavity, the second mold The locating space is located in the first mold, and the yield space is located at the end of the second mold and relatively close to the surface of the partial portion of the primary package. 如申請專利範圍第1項所述半導體之封裝方法,其中,該第二模具可與該第一模具一體製成。 The method of packaging a semiconductor according to claim 1, wherein the second mold is integrally formed with the first mold. 如申請專利範圍第1項所述半導體之封裝方法,其中,該第二模具可與該第一模具相互組裝固定。 The method of packaging a semiconductor according to claim 1, wherein the second mold is assembled and fixed to the first mold. 如申請專利範圍第1項所述半導體之封裝方法,其中,該一次封裝體外露形狀可以為弧凸部,而該讓位空間則相對應形成凹陷形狀,且該第二模具可相對位於該第一模具靠近上方處或側邊。 The method of encapsulating a semiconductor according to the first aspect of the invention, wherein the first package outer shape may be an arc convex portion, and the yield space is correspondingly formed into a concave shape, and the second mold may be located opposite to the first A mold is near the top or side. 如申請專利範圍第1項所述半導體之封裝方法,其中,該一次封裝體外露形狀可以為凹陷部,而該讓位空間則 相對應形成弧凸形狀,且第二模具可相對位於該第一模具靠近上方處或側邊。 The method of encapsulating a semiconductor according to claim 1, wherein the outer shape of the primary package may be a depressed portion, and the yield space is Correspondingly, an arcuate shape is formed, and the second mold can be located relatively close to or at the side of the first mold. 如申請專利範圍第1項所述半導體之封裝方法,其中,每一半導體上係分別覆蓋一次封裝體,而各一次封裝體間係具有間距,且該二次封裝體並成型有相對伸入各間距之隔間部。 The method of packaging a semiconductor according to claim 1, wherein each of the semiconductors covers the package once, and each of the packages has a pitch, and the secondary package is formed with a corresponding extension. The compartment of the gap. 如申請專利範圍第1項所述半導體之封裝方法,其中,該一次封裝體之封裝材料可以為透光材料。 The method of packaging a semiconductor according to claim 1, wherein the packaging material of the primary package may be a light transmissive material. 如申請專利範圍第1項所述半導體之封裝方法,其中,該二次封裝體之封裝材料可以為濾光、濾色光或者濾電磁波之材料。 The method of encapsulating a semiconductor according to the first aspect of the invention, wherein the encapsulation material of the secondary package may be a material for filtering, filtering or filtering electromagnetic waves.
TW101122255A 2012-06-21 2012-06-21 Semiconductor packaging method TWI515805B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW101122255A TWI515805B (en) 2012-06-21 2012-06-21 Semiconductor packaging method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101122255A TWI515805B (en) 2012-06-21 2012-06-21 Semiconductor packaging method

Publications (2)

Publication Number Publication Date
TW201401386A TW201401386A (en) 2014-01-01
TWI515805B true TWI515805B (en) 2016-01-01

Family

ID=50345139

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101122255A TWI515805B (en) 2012-06-21 2012-06-21 Semiconductor packaging method

Country Status (1)

Country Link
TW (1) TWI515805B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016200263A1 (en) * 2016-01-13 2017-07-13 Robert Bosch Gmbh Micromechanical pressure sensor

Also Published As

Publication number Publication date
TW201401386A (en) 2014-01-01

Similar Documents

Publication Publication Date Title
TWI425597B (en) Image sensor package structure with black transmittance encapsulation
JP5635661B1 (en) Two-stage sealing method for image sensor
US9892302B2 (en) Fingerprint sensing device and method for producing the same
TWI425825B (en) Image sensor package structure with predetermined focus
TWM448798U (en) Optical device package module
US20100308449A1 (en) Semiconductor packages and manufacturing method thereof
KR20090017961A (en) Image sensor package and method for forming the same
JP2009302564A5 (en)
JP6062349B2 (en) Optical module and manufacturing method thereof
KR101579623B1 (en) Semiconductor package for image sensor and fabricatingmethod thereof
CN209401614U (en) Ambient light sensor packaging body
CN104995754B (en) Optoelectronic component and its manufacturing method
CN100555643C (en) Image sensing chip packaging structure and use the numerical camera mould of this structure
TW201505134A (en) Packaging structure of optical module
KR20150101571A (en) Image sensor chip package
TWI265617B (en) Lead-frame-based semiconductor package with lead frame and lead frame thereof
TWI515805B (en) Semiconductor packaging method
CN109103208B (en) Packaging method and packaging structure of image sensing chip
CN107799476B (en) Packaging substrate with stopper and sensor packaging structure
TW201312711A (en) Pre molded can package
JP2011165774A (en) Production method of solid-state image pickup device
US20080061393A1 (en) Photosensitive chip molding package
CN201298553Y (en) A package structure of an integrated circuit chip of an electronic mouse
JP2010045107A (en) Method for manufacturing optical semiconductor device
TWI440225B (en) Method for manufacturing light emitting diode

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees