TWI513386B - Method for forming conductive via on glass substrate - Google Patents
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- TWI513386B TWI513386B TW103107061A TW103107061A TWI513386B TW I513386 B TWI513386 B TW I513386B TW 103107061 A TW103107061 A TW 103107061A TW 103107061 A TW103107061 A TW 103107061A TW I513386 B TWI513386 B TW I513386B
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Description
本發明是有關於一種基板結構以及在基板上形成導通孔的方法,且特別是有關於一種玻璃基板結構以及在玻璃基板上形成導通孔的方法。The present invention relates to a substrate structure and a method of forming via holes on a substrate, and more particularly to a glass substrate structure and a method of forming via holes on a glass substrate.
由於消費者對電子產品的要求除了功能強大外,更要求要輕、薄、短、小,因此市面上的電子產品的積集度(integration)越來越高,功能越來越強。為了使電子產品內晶片的封裝結構的體積減小,用以裝設晶片的基板的層數也由單層而變為多層。而為使多層基板間的線路可以在基板厚度方向上彼此連接,可在各基板中採用鍍通孔(plated through hole,PTH)技術。In addition to the powerful requirements of consumers, the requirements for electronic products are lighter, thinner, shorter, and smaller. Therefore, the integration of electronic products on the market is getting higher and higher, and the functions are getting stronger and stronger. In order to reduce the volume of the package structure of the wafer in the electronic product, the number of layers of the substrate on which the wafer is mounted is also changed from a single layer to a plurality of layers. In order to connect the lines between the multilayer substrates to each other in the thickness direction of the substrate, a plated through hole (PTH) technique may be employed in each of the substrates.
鍍通孔,指的是在一個基板上先形成數個貫穿基板的通孔,然後再利用電鍍的方式來將導電材料鍍於通孔中。完成電鍍步驟後的基板,可利用通孔中的導電材料與其他層的線路做電性連接。就目前的應用技術來說,透過電鍍所形成的鍍通孔可為空 心鍍通孔或是實心鍍通孔。The plated through hole refers to a plurality of through holes penetrating through the substrate on one substrate, and then electroplating is used to plate the conductive material into the through holes. After the plating step is completed, the conductive material in the through holes can be electrically connected to the lines of other layers. In the current application technology, the plated through holes formed by electroplating can be empty. Heart plated through holes or solid plated through holes.
由於玻璃具有低成本以及技術成熟等優點,因此是常用的基板材質。習知技術中,在玻璃基板使用鍍通孔技術時,通常會將玻璃基板上欲形成通孔的部份進行選擇性蝕刻,然而,在蝕刻的過程中,蝕刻液多少也會對玻璃基板的其他部分造成侵蝕,因而使形成導通孔後的玻璃基板,其表面粗糙度較大,進而影響後續製程的良率。Because of its low cost and mature technology, glass is a commonly used substrate material. In the prior art, when a plated through hole technique is used for a glass substrate, a portion of the glass substrate on which a through hole is to be formed is usually selectively etched. However, during the etching process, the etchant is somewhat on the glass substrate. The other parts cause erosion, so that the surface of the glass substrate after the formation of the via hole has a large surface roughness, thereby affecting the yield of the subsequent process.
本發明提供一種玻璃基板結構,其製程良率較佳。The invention provides a glass substrate structure, which has better process yield.
本發明提供一種在玻璃基板上形成導通孔的方法,其所製造出的具有導通孔的玻璃基板結構的良率較佳。The present invention provides a method of forming via holes on a glass substrate, which has a better yield of a glass substrate structure having via holes.
本發明提供的在玻璃基板形成導通孔的方法包括下列步驟。首先,提供一玻璃基板,包括一第一表面以及相對第一表面的一第二表面。接著,形成一第一金屬層於第一表面。接著,形成一圖案化光阻層於第一金屬層上。圖案化光阻層具有多個開口,以暴露部份第一金屬層。接著,移除開口所暴露的部份第一金屬層,以形成一第一圖案化金屬層。之後,移除圖案化光阻層。接著,形成一第二金屬層於第二表面。接著,以第一圖案化金屬層為屏障對第一表面照射一紫外線。對玻璃基板進行一烘烤製程,再對玻璃基板進行一蝕刻製程,以移除被第一圖案化金屬層所暴露的部份而於第一表面上形成多個盲孔。移除第一圖案化金 屬層以及第二金屬層。接著,形成一導電層於第一表面上,以分別填充於盲孔內。之後,由第二表面往第一表面的方向研磨玻璃基板至暴露盲孔的底面,以使玻璃基板具有多個導通孔。The method for forming a via hole in a glass substrate provided by the present invention includes the following steps. First, a glass substrate is provided, including a first surface and a second surface opposite the first surface. Next, a first metal layer is formed on the first surface. Next, a patterned photoresist layer is formed on the first metal layer. The patterned photoresist layer has a plurality of openings to expose a portion of the first metal layer. Next, a portion of the first metal layer exposed by the opening is removed to form a first patterned metal layer. Thereafter, the patterned photoresist layer is removed. Next, a second metal layer is formed on the second surface. Next, the first surface is irradiated with an ultraviolet ray by using the first patterned metal layer as a barrier. A baking process is performed on the glass substrate, and then an etching process is performed on the glass substrate to remove portions exposed by the first patterned metal layer to form a plurality of blind holes on the first surface. Remove the first patterned gold a genus layer and a second metal layer. Next, a conductive layer is formed on the first surface to be filled in the blind holes, respectively. Thereafter, the glass substrate is ground from the second surface toward the first surface to expose the bottom surface of the blind via so that the glass substrate has a plurality of via holes.
本發明提供的在玻璃基板形成導通孔的方法包括下列步驟。提供一玻璃基板,包括一第一表面以及相對第一表面的一第二表面。形成一第一金屬層於第一表面。形成一第一圖案化光阻層於第一金屬層上,第一圖案化光阻層具有多個第一開口,以暴露部份第一金屬層。移除第一開口所暴露的部份第一金屬層,以形成一第一圖案化金屬層。移除第一圖案化光阻層。以第一圖案化金屬層為屏障對第一表面照射一紫外線。形成一第二金屬層於第二表面。形成一第二圖案化光阻層於第二金屬層上,第二圖案化光阻層具有多個第二開口,其中第二開口分別對應第一開口,以暴露對應的部份第二金屬層。移除第二開口所暴露的部份第二金屬層,以形成一第二圖案化金屬層。以第二圖案化金屬層為屏障對第二表面照射一紫外線。對玻璃基板進行一烘烤製程。對玻璃基板進行一蝕刻製程,以移除被第一圖案化金屬層以及第二圖案化金屬層所暴露的部份而形成貫穿玻璃基板的多個通孔。移除第一圖案化金屬層以及第二圖案化金屬層。形成一導電層,其分別填充於通孔內,以形成多個導通孔。The method for forming a via hole in a glass substrate provided by the present invention includes the following steps. A glass substrate is provided, including a first surface and a second surface opposite the first surface. Forming a first metal layer on the first surface. Forming a first patterned photoresist layer on the first metal layer, the first patterned photoresist layer having a plurality of first openings to expose a portion of the first metal layer. A portion of the first metal layer exposed by the first opening is removed to form a first patterned metal layer. The first patterned photoresist layer is removed. The first surface is irradiated with an ultraviolet ray by using the first patterned metal layer as a barrier. A second metal layer is formed on the second surface. Forming a second patterned photoresist layer on the second metal layer, the second patterned photoresist layer having a plurality of second openings, wherein the second openings respectively correspond to the first openings to expose corresponding portions of the second metal layer . A portion of the second metal layer exposed by the second opening is removed to form a second patterned metal layer. The second surface is irradiated with ultraviolet rays by using the second patterned metal layer as a barrier. A baking process is performed on the glass substrate. An etching process is performed on the glass substrate to remove portions exposed by the first patterned metal layer and the second patterned metal layer to form a plurality of via holes penetrating the glass substrate. The first patterned metal layer and the second patterned metal layer are removed. A conductive layer is formed, which are respectively filled in the through holes to form a plurality of via holes.
本發明提供的在玻璃基板形成導通孔的方法包括下列步驟。提供一玻璃基板,包括一第一表面以及相對第一表面的一第二表面。形成一第一圖案化光阻層於第一表面上,第一圖案化光 阻層具有多個第一開口,以暴露部份第一表面。以第一圖案化光阻層為屏障對第一表面照射一紫外線。形成一第二圖案化光阻層於第二表面上,第二圖案化光阻層具有多個第二開口,其中以第二開口分別對應第一開口,以暴露對應的部份第二表面。以第二圖案化光阻層為屏障對第二表面照射一紫外線。移除第一圖案化光阻層以及第二圖案化光阻層。對玻璃基板進行一烘烤製程。對玻璃基板進行一蝕刻製程,以移除被紫外線所照射到的部份而形成貫穿玻璃基板的多個通孔。形成一導電層,其分別填充於通孔內,以形成多個導通孔。The method for forming a via hole in a glass substrate provided by the present invention includes the following steps. A glass substrate is provided, including a first surface and a second surface opposite the first surface. Forming a first patterned photoresist layer on the first surface, the first patterned light The resist layer has a plurality of first openings to expose a portion of the first surface. The first surface is irradiated with an ultraviolet ray by using the first patterned photoresist layer as a barrier. Forming a second patterned photoresist layer on the second surface, the second patterned photoresist layer having a plurality of second openings, wherein the second openings respectively correspond to the first openings to expose the corresponding portion of the second surface. The second surface is irradiated with ultraviolet rays by using the second patterned photoresist layer as a barrier. The first patterned photoresist layer and the second patterned photoresist layer are removed. A baking process is performed on the glass substrate. An etching process is performed on the glass substrate to remove portions irradiated by the ultraviolet rays to form a plurality of through holes penetrating the glass substrate. A conductive layer is formed, which are respectively filled in the through holes to form a plurality of via holes.
本發明的玻璃基板結構,其包括一玻璃基板以及多個導電層。玻璃基板包括多個通孔、一第一表面以及相對第一表面的一第二表面。通孔貫穿玻璃基板而連通第一表面以及第二表面,其中玻璃基板的第一表面以及第二表面的粗糙度小於各通孔的一內壁的粗糙度。導電層分別填充於通孔內,以電性導通第一表面以及第二表面。The glass substrate structure of the present invention comprises a glass substrate and a plurality of conductive layers. The glass substrate includes a plurality of through holes, a first surface, and a second surface opposite the first surface. The through hole penetrates the glass substrate to communicate the first surface and the second surface, wherein the roughness of the first surface and the second surface of the glass substrate is smaller than the roughness of an inner wall of each of the through holes. The conductive layers are respectively filled in the through holes to electrically conduct the first surface and the second surface.
在本發明的一實施例中,上述的對玻璃基板進行蝕刻製程的步驟更包括:將玻璃基板浸入一蝕刻液中並施加一超音波震動。In an embodiment of the invention, the step of performing an etching process on the glass substrate further comprises: dipping the glass substrate into an etching solution and applying an ultrasonic vibration.
在本發明的一實施例中,上述的形成導電層於第一表面上的步驟更包括:形成一導電層於第一表面上,導電層覆蓋第一表面並分別填充於盲孔內。接著,移除覆蓋於第一表面上的部份導電層,以形成填充於盲孔內的導電層。In an embodiment of the invention, the step of forming the conductive layer on the first surface further comprises: forming a conductive layer on the first surface, the conductive layer covering the first surface and filling the blind holes respectively. Next, a portion of the conductive layer overlying the first surface is removed to form a conductive layer that fills the blind via.
在本發明的一實施例中,上述的各通孔為一沙漏狀通孔,其中各通孔於第一表面以及第二表面上的外徑大於各通孔於其他部分的一截面外徑。In an embodiment of the invention, each of the through holes is an hourglass-shaped through hole, wherein an outer diameter of each of the through holes on the first surface and the second surface is larger than an outer diameter of a cross section of each of the through holes in the other portion.
基於上述,本發明利用設置於玻璃基板表面的圖案化金屬層作屏障對玻璃基板照射紫外線,並進行烘烤以及蝕刻的製程,以於玻璃基板上形成通孔。如此,在利用蝕刻形成通孔時,由於玻璃基板的表面有圖案化金屬層的保護,因此玻璃基板的表面的粗糙度實質上小於各通孔的內壁的粗糙度,進而增加玻璃基板於後續製程中與其他元件結合的可靠度。並且,由於圖案化金屬層的厚度較薄且直接與玻璃基板接觸,因而可使紫外線在玻璃基板中呈彼此平行的直線傳遞,而使後續形成的通孔可彼此平行,進而可提高通孔的密集度。此外,本發明亦可以圖案化光阻層作屏障分別對玻璃基板的雙面照射紫外線,並進行烘烤以及蝕刻的製程,以在玻璃基板上形成沙漏狀的通孔。Based on the above, the present invention uses a patterned metal layer provided on the surface of a glass substrate as a barrier to irradiate the glass substrate with ultraviolet rays, and performs a baking and etching process to form via holes on the glass substrate. Thus, when the via hole is formed by etching, since the surface of the glass substrate is protected by the patterned metal layer, the roughness of the surface of the glass substrate is substantially smaller than the roughness of the inner wall of each of the via holes, thereby increasing the glass substrate in the subsequent step. Reliability in combination with other components in the process. Moreover, since the thickness of the patterned metal layer is thin and directly in contact with the glass substrate, ultraviolet rays can be transmitted in parallel with each other in the glass substrate, so that the subsequently formed through holes can be parallel to each other, thereby improving the through hole. Concentration. In addition, the present invention can also pattern the photoresist layer as a barrier to respectively irradiate ultraviolet light on both sides of the glass substrate, and perform a baking and etching process to form an hourglass-shaped through hole on the glass substrate.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.
100、100a、100b‧‧‧玻璃基板結構100, 100a, 100b‧‧‧ glass substrate structure
110‧‧‧玻璃基板110‧‧‧ glass substrate
112‧‧‧第一表面112‧‧‧ first surface
114‧‧‧第二表面114‧‧‧ second surface
116‧‧‧第一照射區116‧‧‧First exposure area
118‧‧‧第二照射區118‧‧‧Second irradiation area
119‧‧‧表面119‧‧‧ surface
120‧‧‧第一金屬層120‧‧‧First metal layer
122‧‧‧第一圖案化金屬層122‧‧‧First patterned metal layer
130‧‧‧圖案化光阻層、第一圖案化光阻層130‧‧‧ patterned photoresist layer, first patterned photoresist layer
132‧‧‧開口、第一開口132‧‧‧ openings, first opening
140‧‧‧第二金屬層140‧‧‧Second metal layer
142‧‧‧第二圖案化金屬層142‧‧‧Second patterned metal layer
150‧‧‧盲孔、通孔150‧‧‧Blind holes, through holes
152‧‧‧底面152‧‧‧ bottom
160‧‧‧導電層、初始導電層160‧‧‧ Conductive layer, initial conductive layer
170‧‧‧第二圖案化光阻層170‧‧‧Second patterned photoresist layer
172‧‧‧第二開口172‧‧‧ second opening
180‧‧‧種子層180‧‧‧ seed layer
UV‧‧‧紫外線UV‧‧‧UV
圖1A至圖1M是依照本發明的一實施例的一種在玻璃基板形成導通孔的方法的流程剖面示意圖。1A through 1M are schematic cross-sectional views showing a flow of a method of forming via holes in a glass substrate according to an embodiment of the invention.
圖2A至圖2N是依照本發明的一實施例的一種在玻璃基板形 成導通孔的方法的流程剖面示意圖。2A to 2N are diagrams of a glass substrate in accordance with an embodiment of the present invention. A schematic cross-sectional view of a method of forming a via.
圖3A至圖3J是依照本發明的一實施例的一種在玻璃基板形成導通孔的方法的流程剖面示意圖。3A-3J are schematic cross-sectional views showing a method of forming via holes in a glass substrate according to an embodiment of the invention.
圖1A至圖1M是依照本發明的一實施例的一種在玻璃基板形成導通孔的方法的流程剖面示意圖。本實施例中,在玻璃基板形成導通孔的方法包括下列步驟:首先,請參照圖1A,提供一玻璃基板110。玻璃基板110包括一第一表面112以及相對第一表面112的一第二表面114。在本實施例中,玻璃基板110可例如為一感光性(photo-sensitive)玻璃基板,其厚度實質上約為500微米(μm)。接著,形成如圖1B所示的一第一金屬層120於第一表面112,其中,第一金屬層120可全面性覆蓋第一表面112,且第一金屬層120例如是透過濺鍍而形成於第一表面112上。接著,請參照圖1C,形成一圖案化光阻層130於第一金屬層120上。圖案化光阻層130如圖1C所示具有多個開口132,以暴露部份第一金屬層120。1A through 1M are schematic cross-sectional views showing a flow of a method of forming via holes in a glass substrate according to an embodiment of the invention. In this embodiment, the method of forming the via holes in the glass substrate includes the following steps: First, referring to FIG. 1A, a glass substrate 110 is provided. The glass substrate 110 includes a first surface 112 and a second surface 114 opposite the first surface 112. In the present embodiment, the glass substrate 110 can be, for example, a photo-sensitive glass substrate having a thickness of substantially 500 micrometers (μm). Next, a first metal layer 120 is formed on the first surface 112 as shown in FIG. 1B, wherein the first metal layer 120 can cover the first surface 112 in a comprehensive manner, and the first metal layer 120 is formed by sputtering, for example. On the first surface 112. Next, referring to FIG. 1C, a patterned photoresist layer 130 is formed on the first metal layer 120. The patterned photoresist layer 130 has a plurality of openings 132 as shown in FIG. 1C to expose portions of the first metal layer 120.
請接續參照圖1D,透過例如蝕刻等方式移除開口132所暴露出的部份第一金屬層120,再移除圖案化光阻層130,以形成如圖1D所示的第一圖案化金屬層122。接著,請參照圖1E,形成一第二金屬層140於第二表面114,其中,第二金屬層140可全面性覆蓋第二表面114,且第二金屬層140例如是透過濺鍍而形成於 第二表面114上。Referring to FIG. 1D, a portion of the first metal layer 120 exposed by the opening 132 is removed by, for example, etching or the like, and the patterned photoresist layer 130 is removed to form a first patterned metal as shown in FIG. 1D. Layer 122. Next, referring to FIG. 1E, a second metal layer 140 is formed on the second surface 114, wherein the second metal layer 140 can cover the second surface 114 in a comprehensive manner, and the second metal layer 140 is formed, for example, by sputtering. On the second surface 114.
承上述,請參照圖1F,以第一圖案化金屬層122為屏障對第一表面112照射紫外線UV,並接著對玻璃基板110進行烘烤製程,以使被紫外線照射到的部份玻璃基板(如圖1F所示的虛線區域)產生化學變化而轉為如圖1G所示的陶瓷(圖1G中的網點區域)。本實施例的烘烤製程,一開始例如是以6℃/min的加熱速率加熱至500℃,接著將烘烤溫度維持在500℃約75分鐘,再以3℃/min的加熱速率將烘烤溫度提高至570℃,並將烘烤溫度維持在570℃約75分鐘,即可完成上述的烘烤製程。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對烘烤的溫度、加熱速率以及烘烤時間自行做調整。In the above, referring to FIG. 1F, the first surface 112 is irradiated with ultraviolet UV with the first patterned metal layer 122 as a barrier, and then the glass substrate 110 is subjected to a baking process to partially irradiate the glass substrate with ultraviolet rays ( The dotted line region shown in Fig. 1F is chemically changed to be turned into a ceramic as shown in Fig. 1G (the dot area in Fig. 1G). The baking process of this embodiment is initially heated to 500 ° C, for example, at a heating rate of 6 ° C / min, then the baking temperature is maintained at 500 ° C for about 75 minutes, and then baked at a heating rate of 3 ° C / min. The above baking process can be completed by raising the temperature to 570 ° C and maintaining the baking temperature at 570 ° C for about 75 minutes. Of course, this embodiment is only for exemplification, and the user can adjust the baking temperature, the heating rate, and the baking time according to actual product requirements.
之後,再對玻璃基板110進行一蝕刻製程,以移除被第一圖案化金屬層122所暴露的部份基板110,也就是被紫外線照射到的部份基板110,而於第一表面112上形成多個盲孔150。在本實施例中,蝕刻製程例如是將玻璃基板110浸入濃度約為5%的氫氟酸(hydrogen fluoride,HF)中長達約5-15分鐘,以進行蝕刻。在此,由於本實施例已透過前述製程並以第一圖案化金屬層122為屏障,將部份的玻璃基板110轉為陶瓷,而陶瓷與玻璃在氫氟酸中的蝕刻速率約為20:1,因此,玻璃基板110被第一圖案化金屬層122所暴露的部份會被移除而於第一表面112上形成如圖1H所示的多個盲孔150。此外,本實施例更可在將玻璃基板110浸入蝕刻液中的同時施加一超音波震動,使蝕刻殘渣於蝕刻液中溶 解,並藉由超音波所引起的微細振動來促進上述效果。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對蝕刻製程的蝕刻液種類、濃度、浸泡時間等製程條件自行做調整。Thereafter, an etching process is performed on the glass substrate 110 to remove a portion of the substrate 110 exposed by the first patterned metal layer 122, that is, a portion of the substrate 110 irradiated by the ultraviolet rays, and on the first surface 112. A plurality of blind holes 150 are formed. In the present embodiment, the etching process is performed, for example, by immersing the glass substrate 110 in hydrogen fluoride (HF) having a concentration of about 5% for about 5-15 minutes for etching. Here, since the present embodiment has passed through the foregoing process and the first patterned metal layer 122 is used as a barrier, part of the glass substrate 110 is converted into ceramic, and the etching rate of the ceramic and glass in hydrofluoric acid is about 20: 1. Therefore, the portion of the glass substrate 110 exposed by the first patterned metal layer 122 is removed to form a plurality of blind vias 150 as shown in FIG. 1H on the first surface 112. In addition, in this embodiment, an ultrasonic vibration is applied while the glass substrate 110 is immersed in the etching liquid, so that the etching residue is dissolved in the etching solution. Solution, and the above effects are promoted by the fine vibration caused by the ultrasonic waves. Of course, this embodiment is only for exemplification, and the user can adjust the process conditions such as the etching liquid type, concentration, and soaking time of the etching process according to actual product requirements.
接著,移除圖1H所示的第一圖案化金屬層122以及第二金屬層140,以形成如圖1I中所示的具有盲孔150的玻璃基板110。本實施例可例如將圖1H所示的玻璃基板110浸入雙氧水(H2 O2 )中約5至15分鐘來移除第一圖案化金屬層122以及第二金屬層140。如此,由於利用氫氟酸蝕刻形成盲孔150時,第一表面112以及第二表面114有第一圖案化金屬層122以及第二金屬層140的保護,因此在移除第一圖案化金屬層122以及第二金屬層140後的玻璃基板110,其第一表面112以及第二表面114的粗糙度實質上小於各盲孔150的一內壁的粗糙度。Next, the first patterned metal layer 122 and the second metal layer 140 shown in FIG. 1H are removed to form a glass substrate 110 having a blind via 150 as shown in FIG. This embodiment may remove the first patterned metal layer 122 and the second metal layer 140, for example, by immersing the glass substrate 110 shown in FIG. 1H in hydrogen peroxide (H 2 O 2 ) for about 5 to 15 minutes. As such, since the blind vias 150 are formed by the hydrofluoric acid etching, the first surface 112 and the second surface 114 are protected by the first patterned metal layer 122 and the second metal layer 140, thereby removing the first patterned metal layer. The roughness of the first surface 112 and the second surface 114 of the glass substrate 110 behind the second metal layer 140 is substantially smaller than the roughness of an inner wall of each blind hole 150.
接著,再形成導電層160於盲孔150內。詳細來說,形成導電層160於盲孔150內的步驟包括先形成如圖1J所示的一種子層180於第一表面112以及盲孔150內,接著,再以種子層180做為電鍍路徑進行一電鍍製程,以形成如圖1K所示的初始導電層160於第一表面112上,其中,初始導電層160覆蓋第一表面112並分別填充於盲孔150內。之後再移除覆蓋於第一表面112上的部份初始導電層160,以形成如圖1L所示的填充於盲孔150內的導電層160。Next, a conductive layer 160 is formed in the blind via 150. In detail, the step of forming the conductive layer 160 in the blind via 150 includes first forming a sub-layer 180 as shown in FIG. 1J in the first surface 112 and the blind via 150, and then using the seed layer 180 as a plating path. An electroplating process is performed to form an initial conductive layer 160 on the first surface 112 as shown in FIG. 1K, wherein the initial conductive layer 160 covers the first surface 112 and is filled in the blind vias 150, respectively. A portion of the initial conductive layer 160 overlying the first surface 112 is then removed to form a conductive layer 160 that is filled in the blind via 150 as shown in FIG. 1L.
之後,再例如透過化學機械研磨(chemical mechanical polishing,CMP)等方法由第二表面114往第一表面112的方向研 磨玻璃基板110至暴露盲孔150的底面152,以形成如圖1M所示的具有導通孔的玻璃基板結構100。在此需說明的是,本實施例的研磨製程實際上可由第二表面往第一表面的方向均厚地研磨玻璃基板至暴露盲孔的底面。當然,本發明並不以此為限。Thereafter, the second surface 114 is further directed to the first surface 112 by a method such as chemical mechanical polishing (CMP). The glass substrate 110 is ground to expose the bottom surface 152 of the blind via 150 to form a glass substrate structure 100 having vias as shown in FIG. 1M. It should be noted that the polishing process of the present embodiment can actually grind the glass substrate from the second surface toward the first surface to the bottom surface of the blind hole. Of course, the invention is not limited thereto.
依上述的製造方法所形成的玻璃基板結構100,其如圖1M所示包括一玻璃基板110以及多個導電層160。玻璃基板110包括多個通孔150以及相對的兩表面112以及119。通孔150貫穿玻璃基板110以連通兩表面112以及119,其中玻璃基板110的相對兩表面112以及119的粗糙度小於各通孔150的一內壁的粗糙度。導電層160分別填充於通孔150內,以電性導通表面112以及119。在本實施例中,玻璃基板110的厚度實質上約為100微米,而導通孔150的直徑實質上約介於5至100微米之間。當然,本實施例僅用以舉例說明,本發明並不侷限於此,使用者可自行依實際產品需求對玻璃基板110的厚度或是導通孔150的直徑做調整。The glass substrate structure 100 formed by the above manufacturing method includes a glass substrate 110 and a plurality of conductive layers 160 as shown in FIG. 1M. The glass substrate 110 includes a plurality of through holes 150 and opposing surfaces 112 and 119. The through hole 150 penetrates the glass substrate 110 to communicate the two surfaces 112 and 119 , wherein the roughness of the opposite surfaces 112 and 119 of the glass substrate 110 is smaller than the roughness of an inner wall of each of the through holes 150 . The conductive layers 160 are respectively filled in the via holes 150 to electrically conduct the surfaces 112 and 119. In the present embodiment, the thickness of the glass substrate 110 is substantially about 100 microns, and the diameter of the via holes 150 is substantially between about 5 and 100 microns. Of course, the present embodiment is only for exemplification, and the present invention is not limited thereto. The user can adjust the thickness of the glass substrate 110 or the diameter of the via hole 150 according to actual product requirements.
圖2A至圖2N是依照本發明的一實施例的一種在玻璃基板形成導通孔的方法的流程剖面示意圖。在此必須說明的是,本實施例之在玻璃基板形成導通孔的方法與前述實施例的製作方法相似,因此,本實施例沿用前述實施例的元件標號與部分內容,其中採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,本實施例不再重複贅述。2A through 2N are schematic cross-sectional views showing a flow of a method of forming via holes in a glass substrate according to an embodiment of the invention. It should be noted that the method for forming the via holes in the glass substrate in this embodiment is similar to the method for fabricating the foregoing embodiments. Therefore, the present embodiment uses the component numbers and parts of the foregoing embodiments, wherein the same reference numerals are used. The same or similar elements are denoted, and the description of the same technical contents is omitted. For the description of the omitted part, reference may be made to the foregoing embodiment, and the description is not repeated herein.
請先參照圖2A,提供一玻璃基板110。玻璃基板110包括一第一表面112以及相對第一表面112的一第二表面114。在本實施例中,玻璃基板110可例如為一感光性(photo-sensitive)玻璃基板,其厚度實質上約為100微米(μm)。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對玻璃基板110的厚度做調整。接著,形成如圖2B所示的一第一金屬層120於第一表面112,其中,第一金屬層120可全面性覆蓋第一表面112,且第一金屬層120例如是透過濺鍍而形成於第一表面112上。接著,請參照圖2C,形成一第一圖案化光阻層130於第一金屬層120上。第一圖案化光阻層130如圖2C所示具有多個第一開口132,以暴露部份第一金屬層120。Referring first to FIG. 2A, a glass substrate 110 is provided. The glass substrate 110 includes a first surface 112 and a second surface 114 opposite the first surface 112. In the present embodiment, the glass substrate 110 can be, for example, a photo-sensitive glass substrate having a thickness of substantially 100 micrometers (μm). Of course, this embodiment is only for exemplification, and the user can adjust the thickness of the glass substrate 110 according to actual product requirements. Next, a first metal layer 120 is formed on the first surface 112 as shown in FIG. 2B, wherein the first metal layer 120 can cover the first surface 112 in a comprehensive manner, and the first metal layer 120 is formed by sputtering, for example. On the first surface 112. Next, referring to FIG. 2C, a first patterned photoresist layer 130 is formed on the first metal layer 120. The first patterned photoresist layer 130 has a plurality of first openings 132 as shown in FIG. 2C to expose a portion of the first metal layer 120.
請接續參照圖2D,透過例如蝕刻等方式移除第一開口132所暴露出的部份第一金屬層120,再移除第一圖案化光阻層130,以形成如圖2D所示的第一圖案化金屬層122。接著,再如圖2E所示,以第一圖案化金屬層122為屏障對第一表面112照射紫外線UV。Referring to FIG. 2D, a portion of the first metal layer 120 exposed by the first opening 132 is removed by, for example, etching, and then the first patterned photoresist layer 130 is removed to form a first layer as shown in FIG. 2D. A patterned metal layer 122. Next, as shown in FIG. 2E, the first surface 112 is irradiated with ultraviolet rays UV with the first patterned metal layer 122 as a barrier.
接著,再如圖2F所示,將玻璃基板110翻轉,也就是將原本朝向上方的第一表面112轉至朝向下方,而以第二表面114朝向上方,並於第二表面114上形成一第二金屬層140,其中,第二金屬層140可全面性覆蓋第二表面114,且第二金屬層140例如是透過濺鍍而形成於第二表面114上。接著,請參照圖2G,形成一第二圖案化光阻層170於第二金屬層140上。第二圖案化光阻 層170如圖2G所示具有多個第二開口172,以暴露部份第二金屬層140。Next, as shown in FIG. 2F, the glass substrate 110 is turned over, that is, the first surface 112 facing upward is turned downward, and the second surface 114 is directed upward, and a second surface 114 is formed. The second metal layer 140, wherein the second metal layer 140 can cover the second surface 114 in a comprehensive manner, and the second metal layer 140 is formed on the second surface 114 by sputtering, for example. Next, referring to FIG. 2G, a second patterned photoresist layer 170 is formed on the second metal layer 140. Second patterned photoresist Layer 170 has a plurality of second openings 172 as shown in FIG. 2G to expose portions of second metal layer 140.
請接續參照圖2H,透過例如蝕刻等方式移除第二開口172所暴露出的部份第二金屬層140,再移除第二圖案化光阻層170,以形成如圖2H所示的第二圖案化金屬層142。接著,再如圖2I所示,以第二圖案化金屬層142為屏障對第二表面114照射紫外線UV,並接著對玻璃基板110進行烘烤製程,以使被紫外線照射到的部份玻璃基板(如圖2H所示的虛線區域)產生化學變化而轉為如圖2J所示的陶瓷(圖2J中的網點區域)。本實施例的烘烤製程,一開始例如是以6℃/min的加熱速率加熱至500℃,接著將烘烤溫度維持在500℃約75分鐘,再以3℃/min的加熱速率將烘烤溫度提高至570℃,並將烘烤溫度維持在570℃約75分鐘,即可完成上述的烘烤製程。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對烘烤的溫度、加熱速率以及烘烤時間自行做調整。Referring to FIG. 2H, a portion of the second metal layer 140 exposed by the second opening 172 is removed by, for example, etching, and then the second patterned photoresist layer 170 is removed to form a second layer as shown in FIG. 2H. The second patterned metal layer 142. Next, as shown in FIG. 2I, the second surface 114 is irradiated with ultraviolet UV by using the second patterned metal layer 142 as a barrier, and then the glass substrate 110 is subjected to a baking process to partially irradiate the glass substrate with ultraviolet rays. (The dotted line area shown in Fig. 2H) produces a chemical change and turns into a ceramic as shown in Fig. 2J (the dot area in Fig. 2J). The baking process of this embodiment is initially heated to 500 ° C, for example, at a heating rate of 6 ° C / min, then the baking temperature is maintained at 500 ° C for about 75 minutes, and then baked at a heating rate of 3 ° C / min. The above baking process can be completed by raising the temperature to 570 ° C and maintaining the baking temperature at 570 ° C for about 75 minutes. Of course, this embodiment is only for exemplification, and the user can adjust the baking temperature, the heating rate, and the baking time according to actual product requirements.
之後,再對玻璃基板110進行一蝕刻製程,以移除被第一圖案化金屬層122以及第二圖案化金屬層142所暴露的部份基板110,也就是被紫外線照射到的部份基板110,而形成貫穿玻璃基板110的多個通孔150。在本實施例中,蝕刻製程例如是將玻璃基板110浸入濃度約為5%的氫氟酸(hydrogen fluoride,HF)中長達約5-15分鐘,以進行蝕刻。在此,由於本實施例已透過前述製程並以第一圖案化金屬層122以及第二圖案化金屬層142為屏 障,將部份的玻璃基板110轉為陶瓷,而陶瓷與玻璃在氫氟酸中的蝕刻速率約為20:1,因此,玻璃基板110被第一圖案化金屬層122以及第二圖案化金屬層142所暴露的部份會被移除而形成如圖2K所示的貫穿玻璃基板110的多個通孔150。此外,本實施例更可在將玻璃基板110浸入蝕刻液中的同時施加一超音波震動,使蝕刻殘渣於蝕刻液中溶解,並藉由超音波所引起的微細振動來促進上述效果。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對蝕刻製程的蝕刻液種類、濃度、浸泡時間等製程條件自行做調整。Then, an etching process is performed on the glass substrate 110 to remove a portion of the substrate 110 exposed by the first patterned metal layer 122 and the second patterned metal layer 142, that is, a portion of the substrate 110 irradiated by ultraviolet rays. A plurality of through holes 150 penetrating through the glass substrate 110 are formed. In the present embodiment, the etching process is performed, for example, by immersing the glass substrate 110 in hydrogen fluoride (HF) having a concentration of about 5% for about 5-15 minutes for etching. Here, since the embodiment has passed through the foregoing process and the first patterned metal layer 122 and the second patterned metal layer 142 are used as the screen The glass substrate 110 is converted into a ceramic, and the etching rate of the ceramic and the glass in the hydrofluoric acid is about 20:1. Therefore, the glass substrate 110 is patterned by the first patterned metal layer 122 and the second patterned metal. The exposed portions of layer 142 are removed to form a plurality of vias 150 through glass substrate 110 as shown in FIG. 2K. Further, in the present embodiment, an ultrasonic vibration is applied while the glass substrate 110 is immersed in the etching liquid, so that the etching residue is dissolved in the etching liquid, and the above effect is promoted by the fine vibration caused by the ultrasonic wave. Of course, this embodiment is only for exemplification, and the user can adjust the process conditions such as the etching liquid type, concentration, and soaking time of the etching process according to actual product requirements.
接著,移除第一圖案化金屬層122以及第二圖案化金屬層142,以形成如圖2L中所示的具有通孔150的玻璃基板110。本實施例可例如將圖2K所示的玻璃基板110浸入雙氧水(H2 O2 )中約5至15分鐘來移除第一圖案化金屬層122以及第二圖案化金屬層142。如此,由於利用氫氟酸蝕刻形成通孔150時,第一表面112以及第二表面114有第一圖案化金屬層122以及第二圖案化金屬層142的保護,因此在移除第一圖案化金屬層122以及第二圖案化金屬層142後的玻璃基板110,其第一表面112以及第二表面114的粗糙度實質上小於各通孔150的一內壁的粗糙度。Next, the first patterned metal layer 122 and the second patterned metal layer 142 are removed to form a glass substrate 110 having a via 150 as shown in FIG. 2L. This embodiment may remove the first patterned metal layer 122 and the second patterned metal layer 142, for example, by immersing the glass substrate 110 shown in FIG. 2K in hydrogen peroxide (H 2 O 2 ) for about 5 to 15 minutes. As such, since the via 150 is formed by the hydrofluoric acid etching, the first surface 112 and the second surface 114 have the protection of the first patterned metal layer 122 and the second patterned metal layer 142, and thus the first pattern is removed. The roughness of the first surface 112 and the second surface 114 of the glass substrate 110 behind the metal layer 122 and the second patterned metal layer 142 is substantially smaller than the roughness of an inner wall of each of the through holes 150.
接著,再形成導電層160於通孔150內。詳細來說,形成導電層160於通孔150內的步驟包括先利用種子層180做為電鍍路徑進行電鍍而形成如圖2M所示的初始導電層160,其中,初始導電層160覆蓋第一表面112以及第二表面114,並分別填充於 通孔150內。之後再移除覆蓋於第一表面112以及第二表面114上的部份初始導電層160,以形成如圖2N所示的填充於通孔150內的導電層160。如此,即大致完成如圖2N所示的具有多個導通孔的玻璃基板結構100a。Next, a conductive layer 160 is formed in the via 150. In detail, the step of forming the conductive layer 160 in the via 150 includes first forming the initial conductive layer 160 as shown in FIG. 2M by using the seed layer 180 as a plating path, wherein the initial conductive layer 160 covers the first surface. 112 and the second surface 114 are respectively filled in Inside the through hole 150. A portion of the initial conductive layer 160 overlying the first surface 112 and the second surface 114 is then removed to form a conductive layer 160 filled in the via 150 as shown in FIG. 2N. Thus, the glass substrate structure 100a having a plurality of via holes as shown in FIG. 2N is substantially completed.
依上述的製造方法所形成的玻璃基板結構100a,其如圖2N所示包括一玻璃基板110以及多個導電層160。玻璃基板110包括多個通孔150以及相對的第一表面112以及第二表面114。通孔150貫穿玻璃基板110以連通第一表面112以及第二表面114,其中第一表面112以及第二表面114的粗糙度小於各通孔150的一內壁的粗糙度。導電層160分別填充於通孔150內,以電性導通第一表面112以及第二表面114。在本實施例中,玻璃基板110的厚度實質上約為100微米,而導通孔150的直徑實質上約介於50至100微米之間。當然,本實施例僅用以舉例說明,使用者可自行依實際產品需求對玻璃基板110的厚度以及導通孔150的直徑做調整。The glass substrate structure 100a formed according to the above manufacturing method includes a glass substrate 110 and a plurality of conductive layers 160 as shown in FIG. 2N. The glass substrate 110 includes a plurality of through holes 150 and opposing first and second surfaces 112, 114. The through hole 150 penetrates the glass substrate 110 to communicate the first surface 112 and the second surface 114 , wherein the roughness of the first surface 112 and the second surface 114 is smaller than the roughness of an inner wall of each of the through holes 150 . The conductive layers 160 are respectively filled in the through holes 150 to electrically conduct the first surface 112 and the second surface 114. In the present embodiment, the thickness of the glass substrate 110 is substantially about 100 microns, and the diameter of the via 150 is substantially between about 50 and 100 microns. Of course, this embodiment is only for exemplification, and the user can adjust the thickness of the glass substrate 110 and the diameter of the via hole 150 according to actual product requirements.
圖3A至圖3J是依照本發明的一實施例的一種在玻璃基板形成導通孔的方法的流程剖面示意圖。在此必須說明的是,本實施例之在玻璃基板形成導通孔的方法與前述實施例的製作方法相似,因此,本實施例沿用前述實施例的元件標號與部分內容,其中採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,本實施例不再重複贅述。3A-3J are schematic cross-sectional views showing a method of forming via holes in a glass substrate according to an embodiment of the invention. It should be noted that the method for forming the via holes in the glass substrate in this embodiment is similar to the method for fabricating the foregoing embodiments. Therefore, the present embodiment uses the component numbers and parts of the foregoing embodiments, wherein the same reference numerals are used. The same or similar elements are denoted, and the description of the same technical contents is omitted. For the description of the omitted part, reference may be made to the foregoing embodiment, and the description is not repeated herein.
首先,請參照圖3A,提供一玻璃基板110。玻璃基板110包括一第一表面112以及相對第一表面112的一第二表面114。在本實施例中,玻璃基板110可例如為一感光性(photo-sensitive)玻璃基板,其厚度實質上約為100微米(μm)。當然,本實施例僅用以舉例說明,使用者可自行依實際產品需求對玻璃基板110的厚度做調整。接著,形成如圖3B所示的一第一圖案化光阻層130於第一表面112上,其中,第一圖案化光阻層130具有多個第一開口132,以暴露部份第一表面112。之後,再參照圖3C,以第一圖案化光阻層130為屏障對第一表面112照射紫外線UV,以於玻璃基板上形成多個第一照射區116。接著,再移除第一圖案化光阻層130以形成如圖3D所示的結構。First, referring to FIG. 3A, a glass substrate 110 is provided. The glass substrate 110 includes a first surface 112 and a second surface 114 opposite the first surface 112. In the present embodiment, the glass substrate 110 can be, for example, a photo-sensitive glass substrate having a thickness of substantially 100 micrometers (μm). Of course, this embodiment is only for exemplification, and the user can adjust the thickness of the glass substrate 110 according to actual product requirements. Next, a first patterned photoresist layer 130 is formed on the first surface 112 as shown in FIG. 3B, wherein the first patterned photoresist layer 130 has a plurality of first openings 132 to expose a portion of the first surface. 112. Thereafter, referring to FIG. 3C, the first surface 112 is irradiated with ultraviolet rays UV with the first patterned photoresist layer 130 as a barrier to form a plurality of first illumination regions 116 on the glass substrate. Next, the first patterned photoresist layer 130 is removed to form a structure as shown in FIG. 3D.
接著,再如圖3E所示,將前述的玻璃基板110翻轉,也就是將原本朝向上方的第一表面112轉至朝向下方,而以第二表面114朝向上方,並形成一第二圖案化光阻層170於第二表面114上。第二圖案化光阻層170具有多個第二開口172,第二開口172的位置分別對應第一開口132,以暴露對應的部份第二表面114。Next, as shown in FIG. 3E, the glass substrate 110 is turned over, that is, the first surface 112 facing upward is turned downward, and the second surface 114 is directed upward, and a second patterned light is formed. The resist layer 170 is on the second surface 114. The second patterned photoresist layer 170 has a plurality of second openings 172 corresponding to the first openings 132 to expose the corresponding partial second surfaces 114.
請接續參照圖3F,以第二圖案化光阻層170為屏障對第二表面114照射紫外線UV,以於玻璃基板上形成多個第二照射區118,其中,第二照射區118如圖3F所示之與第一照射區116部分重疊,之後,再移除第二圖案化光阻層170。在此需注意的是,由於圖2A至圖2N的實施例是以圖案化金屬層122以及142作為紫外線照射的屏障,而圖案化金屬層122以及142的厚度較薄且 直接與玻璃基板110接觸,因而可使紫外線在玻璃基板110中較趨近於直線傳遞,而可形成如圖2E所示的彼此平行的照射區。而本實施例是以圖案化光阻層130以及170作為紫外線照射的屏障,其厚度較厚,因而使紫外線在玻璃基板110中的傳遞路徑略微發散,而形成類似錐狀的照射區,加上本實施例於玻璃基板110的雙面皆以圖案化光阻層作為紫外線照射的屏障,因而形成如圖3F所示的沙漏狀的照射區,且此照射區於第一表面112以及第二表面114上的外徑大於各通孔於其他部分的截面外徑。Referring to FIG. 3F, the second surface 114 is irradiated with ultraviolet light UV by using the second patterned photoresist layer 170 as a barrier to form a plurality of second illumination regions 118 on the glass substrate, wherein the second illumination region 118 is as shown in FIG. 3F. The portion is shown partially overlapping the first illumination region 116, after which the second patterned photoresist layer 170 is removed. It should be noted here that since the embodiment of FIGS. 2A to 2N is a patterned metal layer 122 and 142 as a barrier for ultraviolet irradiation, the patterned metal layers 122 and 142 are thin and Direct contact with the glass substrate 110 allows the ultraviolet rays to be transmitted closer to the straight line in the glass substrate 110, and the irradiation regions parallel to each other as shown in Fig. 2E can be formed. In this embodiment, the patterned photoresist layers 130 and 170 are used as a barrier for ultraviolet irradiation, and the thickness thereof is relatively thick, so that the transmission path of the ultraviolet rays in the glass substrate 110 is slightly diverged to form a cone-like irradiation area, plus In this embodiment, the patterned photoresist layer is used as a barrier for ultraviolet irradiation on both sides of the glass substrate 110, thereby forming an hourglass-shaped irradiation region as shown in FIG. 3F, and the irradiation region is on the first surface 112 and the second surface. The outer diameter on the 114 is larger than the outer diameter of each of the through holes in the other portions.
請接續參照圖3G,對玻璃基板110進行一烘烤製程,以使被紫外線照射到的第一照射區116與第二照射區118的聯集區域(如圖3G所示的網點區域)產生化學變化而轉為陶瓷。本實施例的烘烤製程,一開始例如是以6℃/min的加熱速率加熱至500℃,接著將烘烤溫度維持在500℃約75分鐘,再以3℃/min的加熱速率將烘烤溫度提高至570℃,並將烘烤溫度維持在570℃約75分鐘,即可完成上述的烘烤製程。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對烘烤的溫度、加熱速率以及烘烤時間自行做調整。Referring to FIG. 3G, a baking process is performed on the glass substrate 110 to generate a chemical in the combination region of the first irradiation region 116 and the second irradiation region 118 irradiated with ultraviolet rays (such as the dot region shown in FIG. 3G). Change and turn into ceramics. The baking process of this embodiment is initially heated to 500 ° C, for example, at a heating rate of 6 ° C / min, then the baking temperature is maintained at 500 ° C for about 75 minutes, and then baked at a heating rate of 3 ° C / min. The above baking process can be completed by raising the temperature to 570 ° C and maintaining the baking temperature at 570 ° C for about 75 minutes. Of course, this embodiment is only for exemplification, and the user can adjust the baking temperature, the heating rate, and the baking time according to actual product requirements.
之後,再對玻璃基板110進行一蝕刻製程,以移除被紫外線照射到的第一照射區116與第二照射區118的聯集區域(如圖3G所示的網點區域),而形成如圖3H所示的貫穿玻璃基板110的多個通孔150。在本實施例中,蝕刻製程例如是將玻璃基板110浸入濃度約為5%的氫氟酸(hydrogen fluoride,HF)中長達約5-15 分鐘,以進行蝕刻。在此,由於本實施例已透過前述製程將第一照射區116與第二照射區118的聯集區域轉為陶瓷,而陶瓷與玻璃在氫氟酸中的蝕刻速率約為20:1,因此,第一照射區116與第二照射區118的聯集區域會被移除而形成如圖3H所示的貫穿玻璃基板110的多個通孔150。此外,本實施例更可在將玻璃基板110浸入蝕刻液中的同時施加一超音波震動,使蝕刻殘渣於蝕刻液中溶解,並藉由超音波所引起的微細振動來促進上述效果。當然,本實施例僅用以舉例說明,使用者可依實際產品需求對蝕刻製程的蝕刻液種類、濃度、浸泡時間等製程條件自行做調整。Then, an etching process is performed on the glass substrate 110 to remove the joint region (the dot area shown in FIG. 3G) of the first irradiation region 116 and the second irradiation region 118 irradiated by the ultraviolet rays, and form an image as shown in FIG. A plurality of through holes 150 penetrating the glass substrate 110 shown in 3H. In this embodiment, the etching process is, for example, immersing the glass substrate 110 in hydrogen fluoride (HF) having a concentration of about 5% for about 5-15. Minutes to etch. Here, since the embodiment has converted the combination region of the first irradiation region 116 and the second irradiation region 118 into ceramic through the foregoing process, the etching rate of ceramic and glass in hydrofluoric acid is about 20:1, The combination region of the first irradiation region 116 and the second irradiation region 118 is removed to form a plurality of through holes 150 penetrating the glass substrate 110 as shown in FIG. 3H. Further, in the present embodiment, an ultrasonic vibration is applied while the glass substrate 110 is immersed in the etching liquid, so that the etching residue is dissolved in the etching liquid, and the above effect is promoted by the fine vibration caused by the ultrasonic wave. Of course, this embodiment is only for exemplification, and the user can adjust the process conditions such as the etching liquid type, concentration, and soaking time of the etching process according to actual product requirements.
接著,再形成導電層160於通孔150內。詳細來說,形成導電層160於通孔150內的步驟包括先利用電鍍形成如圖3I所示的初始導電層160,其中,初始導電層160覆蓋第一表面112以及第二表面114,並分別填充於通孔150內。之後再移除覆蓋於第一表面112以及第二表面114上的部份初始導電層160,以形成如圖3J所示的填充於通孔150內的導電層160。如此,即大致完成如圖3J所示的具有多個導通孔的玻璃基板結構100b。Next, a conductive layer 160 is formed in the via 150. In detail, the step of forming the conductive layer 160 in the via 150 includes first forming an initial conductive layer 160 as shown in FIG. 3I by electroplating, wherein the initial conductive layer 160 covers the first surface 112 and the second surface 114, respectively. Filled in the through hole 150. A portion of the initial conductive layer 160 overlying the first surface 112 and the second surface 114 is then removed to form a conductive layer 160 that is filled in the via 150 as shown in FIG. 3J. Thus, the glass substrate structure 100b having a plurality of via holes as shown in FIG. 3J is substantially completed.
依上述的製造方法所形成的玻璃基板結構100a,其如圖3J所示包括一玻璃基板110以及多個導電層160。玻璃基板110包括多個通孔150以及相對的第一表面112以及第二表面114。通孔150貫穿玻璃基板110以連通第一表面112以及第二表面114,其中第一表面112以及第二表面114的粗糙度小於各通孔150的一內壁的粗糙度。在本實施例中,各通孔150為一沙漏狀通孔, 其中各通孔150於第一表面112以及第二表面112上的外徑大於各通孔150於其他部分的截面外徑。導電層160分別填充於通孔150內,以電性導通第一表面112以及第二表面114。在本實施例中,玻璃基板110的厚度實質上約為100微米,而導通孔150的直徑實質上約介於5至100微米之間。當然,本實施例僅用以舉例說明,使用者可自行依實際產品需求對玻璃基板110的厚度以及導通孔150的直徑做調整。The glass substrate structure 100a formed by the above manufacturing method includes a glass substrate 110 and a plurality of conductive layers 160 as shown in FIG. 3J. The glass substrate 110 includes a plurality of through holes 150 and opposing first and second surfaces 112, 114. The through hole 150 penetrates the glass substrate 110 to communicate the first surface 112 and the second surface 114 , wherein the roughness of the first surface 112 and the second surface 114 is smaller than the roughness of an inner wall of each of the through holes 150 . In this embodiment, each of the through holes 150 is an hourglass-shaped through hole. The outer diameter of each of the through holes 150 on the first surface 112 and the second surface 112 is larger than the outer diameter of the cross section of each of the through holes 150 in other portions. The conductive layers 160 are respectively filled in the through holes 150 to electrically conduct the first surface 112 and the second surface 114. In the present embodiment, the thickness of the glass substrate 110 is substantially about 100 microns, and the diameter of the via holes 150 is substantially between about 5 and 100 microns. Of course, this embodiment is only for exemplification, and the user can adjust the thickness of the glass substrate 110 and the diameter of the via hole 150 according to actual product requirements.
綜上所述,本發明利用設置於玻璃基板表面的圖案化金屬層作屏障對玻璃基板照射紫外線,並進行烘烤以及蝕刻的製程,以於玻璃基板上形成通孔。如此,在利用蝕刻形成通孔時,由於玻璃基板的表面有圖案化金屬層的保護,因此玻璃基板的表面的粗糙度實質上小於各通孔的內壁的粗糙度,進而增加玻璃基板於後續製程中與其他元件結合的可靠度。並且,由於圖案化金屬層的厚度較薄且直接與玻璃基板接觸,因而可使紫外線在玻璃基板中呈彼此平行的直線傳遞,而使後續形成的通孔可彼此平行,進而可提高通孔的密集度。此外,本發明亦可以圖案化光阻層作屏障分別對玻璃基板的雙面照射紫外線,並進行烘烤以及蝕刻的製程,以在玻璃基板上形成沙漏狀的通孔。In summary, the present invention uses a patterned metal layer provided on the surface of a glass substrate as a barrier to irradiate the glass substrate with ultraviolet rays, and performs a baking and etching process to form via holes on the glass substrate. Thus, when the via hole is formed by etching, since the surface of the glass substrate is protected by the patterned metal layer, the roughness of the surface of the glass substrate is substantially smaller than the roughness of the inner wall of each of the via holes, thereby increasing the glass substrate in the subsequent step. Reliability in combination with other components in the process. Moreover, since the thickness of the patterned metal layer is thin and directly in contact with the glass substrate, ultraviolet rays can be transmitted in parallel with each other in the glass substrate, so that the subsequently formed through holes can be parallel to each other, thereby improving the through hole. Concentration. In addition, the present invention can also pattern the photoresist layer as a barrier to respectively irradiate ultraviolet light on both sides of the glass substrate, and perform a baking and etching process to form an hourglass-shaped through hole on the glass substrate.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
100‧‧‧玻璃基板結構100‧‧‧ glass substrate structure
110‧‧‧玻璃基板110‧‧‧ glass substrate
112‧‧‧第一表面112‧‧‧ first surface
119‧‧‧表面119‧‧‧ surface
150‧‧‧通孔150‧‧‧through hole
160‧‧‧導電層160‧‧‧ Conductive layer
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