TWI511318B - Silicon substrate for solar cell and manufacturing method thereof - Google Patents

Silicon substrate for solar cell and manufacturing method thereof Download PDF

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TWI511318B
TWI511318B TW102148876A TW102148876A TWI511318B TW I511318 B TWI511318 B TW I511318B TW 102148876 A TW102148876 A TW 102148876A TW 102148876 A TW102148876 A TW 102148876A TW I511318 B TWI511318 B TW I511318B
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substrate
solar cell
tantalum
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Nat Univ Chung Hsing
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Description

太陽能電池之矽基板及其製造方法Solar cell substrate and method of manufacturing same

本發明有關於太陽能電池,特別是指一種製造太陽能電池之矽基板的方法,以及由該方法製得之太陽能電池。The present invention relates to a solar cell, and more particularly to a method of manufacturing a germanium substrate for a solar cell, and a solar cell produced by the method.

依據材料的不同,目前的矽太陽能電池主要分為三類:單晶矽太陽能電池、多晶矽薄膜太陽能電池以及非晶矽薄膜太陽能,其中又以效率較佳的矽晶太陽能電池為主流。According to different materials, the current tantalum solar cells are mainly divided into three categories: single crystal germanium solar cells, polycrystalline germanium thin film solar cells, and amorphous germanium thin film solar cells, among which the more efficient twinned solar cells are the mainstream.

由於太陽能電池的發電原理,主要是利用光電效應將太陽的光能直接轉換為電能,因此如何有效提昇太陽能電池的抗反射率,進而減少光損耗以提高光電轉換效率,實為增進太陽能電池效率的重要課題。Due to the principle of solar cell power generation, the photoelectric energy is directly converted into electrical energy by using the photoelectric effect. Therefore, how to effectively improve the anti-reflection rate of the solar cell, thereby reducing the optical loss to improve the photoelectric conversion efficiency, is actually improving the efficiency of the solar cell. important topic.

目前常用來提昇太陽能電池之抗反射率的方法主要有兩種,一種是在矽基板的表面被覆抗反射層(antireflection coating),另一種是在矽基板表面製作粗糙化結構(texturization)。At present, there are two main methods for improving the antireflection rate of a solar cell. One is to coat the surface of the ruthenium substrate with an antireflection coating, and the other is to form a texturization on the surface of the ruthenium substrate.

就在矽基板的表面被覆抗反射層而論,參考文獻1揭露使用電漿輔助化學氣相沉積(plasma enhanced chemical vapor deposition,PECVD)法將氮化矽膜(SiNx:H)沉積於矽基板表面,使得在特定波長範圍內能夠有較佳的抗反射效果。但是,被覆抗反射層只能針對特定波長範圍具有較佳的抗反射效果,因此若欲使矽晶太陽能 電池同時在紫外光、可見光以及紅外光等不同波長範圍都具有抗反射效果,則需要被覆多層抗反射層才能獲得抗反射率提高的效果,導致前述方法存有成本增加、製程繁雜、以及不易大面積生產等問題。In the case where the surface of the ruthenium substrate is coated with an antireflection layer, Reference 1 discloses deposition of a tantalum nitride film (SiNx:H) on the surface of a ruthenium substrate by plasma enhanced chemical vapor deposition (PECVD). In order to have a better anti-reflection effect in a specific wavelength range. However, the coated anti-reflective layer can only have a better anti-reflection effect for a specific wavelength range, so if you want to make a crystalline solar energy The battery has an anti-reflection effect in different wavelength ranges such as ultraviolet light, visible light, and infrared light, and the multilayer anti-reflection layer needs to be coated to obtain an anti-reflection effect, resulting in an increase in cost, complicated process, and difficulty in the above method. Area production and other issues.

就在矽基板表面製作粗糙化結構而論,參考文獻2揭露利用反應離子蝕刻技術(reactive ion etch)的物理方法在矽基板表面製作粗糙化的結構,使其在可見光波長範圍內的反射率降至20%以下;參考文獻3則揭露使用氫氧化鉀(KOH)進行鹼性蝕刻的化學方法在矽基板表面形成金字塔結構(pyramid structure),使其在可見光波長範圍內的反射率降至17%。不過,相較於物理蝕刻,雖然化學蝕刻的方法具有成本較低、製程較快且可大面積生產等優點,但是反射率只能降至17%,仍然無法完整地吸收可見光範圍的波長,若欲提高其抗反射的能力,則需要在前述金字塔結構的表面再被覆一層氮化矽,導致成本提高且製程時間增加。In the case of making a roughened structure on the surface of the tantalum substrate, reference 2 discloses that a roughened structure is formed on the surface of the tantalum substrate by a physical method using a reactive ion etch technique to reduce the reflectance in the visible wavelength range. Up to 20% or less; Reference 3 discloses a chemical method of alkaline etching using potassium hydroxide (KOH) to form a pyramid structure on the surface of the ruthenium substrate to reduce the reflectance in the visible wavelength range to 17%. . However, compared to physical etching, although the chemical etching method has the advantages of lower cost, faster process, and large-area production, the reflectance can only be reduced to 17%, and the wavelength in the visible range cannot be completely absorbed. In order to improve its anti-reflection ability, it is necessary to coat a layer of tantalum nitride on the surface of the aforementioned pyramid structure, resulting in an increase in cost and an increase in process time.

[參考文獻1]鐘允昇,矽晶太陽能電池用抗反射層鍍膜技術與設備探討vol. 290:機械工業雜誌,2007。[Reference 1] Zhong Yunsheng, Discussion on Anti-reflective Coating Technology and Equipment for Silicon Crystal Solar Cells vol. 290: Journal of Machinery Industry, 2007.

[參考文獻2]S. Winderbaum, O. Reinhold, and F. Yun, “Reactive ion etching (RIE) as a method for texturing polycrystalline silicon solar cells,” Solar Energy Material and Solar Cells, vol. 46, pp. 239-248, 1997。[Reference 2] S. Winderbaum, O. Reinhold, and F. Yun, "Reactive ion etching (RIE) as a method for texturing polycrystalline silicon solar cells," Solar Energy Material and Solar Cells, vol. 46, pp. 239 -248, 1997.

[參考文獻3]P. Panek, M. Lipiski, and J. Dutkiewicz, “Texturization of multicrystalline silicon by wet chemical etching for silicon solar cells,” Journal of Materials Science, vol. 40, pp. 1459-1463, 2005/03/01 2005。[Reference 3] P. Panek, M. Lipi Ski, and J. Dutkiewicz, "Texturization of multicrystalline silicon by wet chemical etching for silicon solar cells," Journal of Materials Science, vol. 40, pp. 1459-1463, 2005/03/01 2005.

有鑑於此,本發明之一目的在於提供一種太陽能電池之矽基板的製造方法,其可製得能夠有效抑制紫外光、可見光以及紅外光波長範圍之光反射的矽基板,換言之,由本發明之方法製得之矽基板對紫外光、可見光以及紅外光皆具有良好的光吸收特性。In view of the above, an object of the present invention is to provide a method for manufacturing a tantalum substrate for a solar cell, which can produce a tantalum substrate capable of effectively suppressing light reflection in the ultraviolet, visible, and infrared wavelength ranges, in other words, by the method of the present invention. The prepared substrate has good light absorption properties for ultraviolet light, visible light, and infrared light.

為達成上述目的,本發明所提供之一種太陽能電池之矽基板的製造方法,主要包括有以下步驟:首先,準備一表面具有一凹凸微結構的矽基材;其次,將該矽基材浸於一第一酸性蝕刻液中,直至該矽基材之凹凸微結構表面沉積有金屬粒子,該第一酸性蝕刻液含有一第一濃度之金屬離子以及一酸性溶液;接著,將該矽基材浸於一第二酸性蝕刻液中,以於該矽基材之凹凸微結構形成複數奈米槽孔(nanogroove),該第二酸性蝕刻液含有一低於該第一濃度之第二濃度的該金屬離子以及該酸性溶液;最後,移除沉積於該矽基材之凹凸微結構表面與各該奈米槽孔內之金屬粒子。In order to achieve the above object, a method for manufacturing a tantalum substrate for a solar cell according to the present invention mainly comprises the following steps: first, preparing a tantalum substrate having a concave-convex microstructure on a surface; and secondly, immersing the tantalum substrate in the a first acidic etching solution, wherein metal particles are deposited on the surface of the uneven microstructure of the germanium substrate, the first acidic etching solution contains a first concentration of metal ions and an acidic solution; and then, the germanium substrate is dipped Forming, in a second acidic etching solution, a plurality of nanogrooves for the concave and convex microstructure of the germanium substrate, the second acidic etching solution containing the metal having a second concentration lower than the first concentration The ions and the acidic solution; finally, the metal particles deposited on the surface of the textured microstructure of the tantalum substrate and each of the nanoholes are removed.

在本發明所提供之製造方法中,該凹凸微結構最好由複數一體相連之錐形體所構成。此外,於本發明之一實施例中,該具有凹凸微結構之矽基材係透過將一矽晶圓浸於氫氧化鉀(potassium hydroxide,KOH)水溶液中進行鹼性蝕刻而製得。In the manufacturing method provided by the present invention, the uneven microstructure is preferably composed of a plurality of conical bodies integrally connected. In addition, in an embodiment of the present invention, the ruthenium substrate having the uneven microstructure is obtained by immersing a ruthenium wafer in an aqueous solution of potassium hydroxide (KOH) for alkaline etching.

在本發明所提供之製造方法中,該矽基材浸於該第一酸性蝕刻液中的時間較佳為20秒至45秒,藉以使金屬粒子均勻地沉積 於該矽基材之凹凸微結構表面,使各金屬粒子與矽基板之間的氧化還原反應速率較平均。另外,該矽基材浸於該第二酸性蝕刻液中的時間較佳為1分鐘至5分鐘,藉以形成具有預定深度的奈米槽孔。In the manufacturing method provided by the present invention, the ruthenium substrate is immersed in the first acidic etchant for preferably from 20 seconds to 45 seconds, thereby uniformly depositing the metal particles. On the surface of the uneven microstructure of the base material, the rate of redox reaction between each metal particle and the tantalum substrate is relatively average. Further, the time during which the ruthenium substrate is immersed in the second acidic etchant is preferably from 1 minute to 5 minutes, thereby forming a nanopore having a predetermined depth.

在本發明所提供之製造方法中,該金屬離子較佳為銀離子(silver ion),而該酸性溶液較佳為氫氟酸(hydrofluoric acid,HF)。並且,該銀離子之第一濃度最好為0.34M(mole/L),第二濃度最好為0.03M(mole/L)。另外,依據本發明一實施例所為之製造方法,該第一與第二酸性蝕刻液係透過將硝酸銀(silver nitrate,AgNO3 )溶解於氫氟酸所製得。In the manufacturing method provided by the present invention, the metal ion is preferably silver ion, and the acidic solution is preferably hydrofluoric acid (HF). Further, the first concentration of the silver ions is preferably 0.34 M (mole/L), and the second concentration is preferably 0.03 M (mole/L). Further, according to a manufacturing method of an embodiment of the present invention, the first and second acidic etching liquids are obtained by dissolving silver nitrate (AgNO 3 ) in hydrofluoric acid.

在本發明所提供之製造方法中,更可包括有移除形成於該矽基材之凹凸微結構表面之一矽氧化物的步驟。In the manufacturing method provided by the present invention, the step of removing one of the tantalum oxides formed on the surface of the textured microstructure of the tantalum substrate may be further included.

本發明之另一目的在於提供一種由前述製造方法製得之太陽能電池之矽基板。Another object of the present invention is to provide a tantalum substrate for a solar cell obtained by the above-described manufacturing method.

本發明所提供之太陽能電池之矽基板,包括有一矽基層,以及一體形成於該矽基層之一表面的凹凸微結構,該凹凸微結構具有複數奈米槽孔。The tantalum substrate of the solar cell provided by the present invention comprises a base layer and a concave-convex microstructure integrally formed on one surface of the base layer, the concave and convex microstructure having a plurality of nano-holes.

在本發明所提供之太陽能電池之矽基板中,該矽基層以及該凹凸微結構最好為輕摻雜之n型矽材料,以降低其導電性。In the germanium substrate of the solar cell provided by the present invention, the germanium base layer and the uneven microstructure are preferably lightly doped n-type germanium materials to reduce the electrical conductivity.

在本發明所提供之太陽能電池之矽基板中,該凹凸微結構最好由複數一體相連之錐形體所構成。此外,各該錐形體的尺寸範圍最好為高度3~5μm,面積3×3~8×8μm2In the crucible substrate of the solar cell provided by the present invention, the concavo-convex microstructure is preferably composed of a plurality of conical bodies integrally connected. Further, each of the tapered bodies preferably has a size range of 3 to 5 μm and an area of 3 × 3 to 8 × 8 μm 2 .

在本發明所提供之太陽能電池之矽基板中,各該奈米槽孔的深度最好介於1μm至5μm,此外,各該奈米槽孔最好係垂直於該矽基層,藉以進一步地降低該矽基板的光反射率。In the substrate of the solar cell provided by the present invention, the depth of each of the nanoholes is preferably between 1 μm and 5 μm, and further, each of the nanoholes is preferably perpendicular to the base layer, thereby further reducing The light reflectance of the germanium substrate.

有關本發明所提供之太陽能電池之矽基板的詳細構造及其製造方法,以下將列舉實施例並配合圖式,在可使本發明領域中具有通常知識者能夠簡單實施本發明實施例的範圍內進行說明。The detailed construction of the crucible substrate of the solar cell provided by the present invention and the manufacturing method thereof will be exemplified in the following examples, and the drawings can be made within the scope of the embodiments of the present invention which can be easily implemented by those skilled in the art. Be explained.

10‧‧‧矽基材10‧‧‧矽 substrate

11‧‧‧矽基層11‧‧‧矽 grassroots

20‧‧‧凹凸微結構20‧‧‧ concave microstructure

21‧‧‧奈米槽孔21‧‧‧Nami Slots

23‧‧‧奈米線23‧‧‧Nami Line

30‧‧‧矽基板30‧‧‧矽 substrate

S1~S5‧‧‧步驟S1~S5‧‧‧Steps

第1圖為本發明一實施例所提供之太陽能電池之矽基板之製造方法的流程圖。FIG. 1 is a flow chart showing a method of manufacturing a germanium substrate for a solar cell according to an embodiment of the present invention.

第2圖為本發明之矽基板的立體示意圖。Fig. 2 is a perspective view showing the substrate of the present invention.

第3圖為實施例11至14之矽基板的掃描式電子顯微鏡(SEM)照片。Fig. 3 is a scanning electron microscope (SEM) photograph of the substrate of Examples 11 to 14.

第4圖為實施例5、10、15、20、25以及30之矽基板的掃描式電子顯微鏡(SEM)照片。Figure 4 is a scanning electron microscope (SEM) photograph of the substrate of Examples 5, 10, 15, 20, 25 and 30.

第5圖為實施例5、10、15、20、25以及30之矽基板的反射率光波長分析圖。Fig. 5 is a graph showing the reflectance wavelength of the substrate of Examples 5, 10, 15, 20, 25 and 30.

第6圖為實施例1至30之矽基板的平均反射率圖表。Fig. 6 is a graph showing the average reflectance of the substrates of Examples 1 to 30.

請先參閱第1圖,本發明所提供之太陽能電池之矽基板的製造方法主要包括有下列步驟:於步驟S1中,請同時參閱第2圖,準備一矽基材10,該矽基材10具有一矽基層11以及一體形成於該矽基層11之一表面的 一凹凸微結構20。該矽基材10可為例如晶格方向為(100)、(110)或(111)的單晶矽(mono-crystalline silicon),或者是多晶矽(polysilicon)。該具有凹凸微結構20之矽基材10可使用市售之具有微米金字塔陣列結構(micro-pyramid array structure)的矽晶片,或者是利用將矽晶圓(silicon wafer)浸於氫氧化鉀(KOH)水溶液中進行鹼性蝕刻,使矽晶圓具有複數一體相連之錐形體的凹凸微結構。另外,在本發明一範例中,係使用輕摻雜的n型矽晶圓,藉以降低矽基板的導電性,使其可應用於太陽能電池。Please refer to FIG. 1 . The method for manufacturing a tantalum substrate for a solar cell according to the present invention mainly includes the following steps: In step S1, please refer to FIG. 2 simultaneously to prepare a substrate 10 for the substrate 10 . Having a base layer 11 and integrally formed on one surface of the base layer 11 A concave-convex microstructure 20. The tantalum substrate 10 may be, for example, a mono-crystalline silicon having a lattice direction of (100), (110) or (111), or a polysilicon. The tantalum substrate 10 having the uneven microstructure 20 may use a commercially available tantalum wafer having a micro-pyramid array structure, or may be obtained by immersing a silicon wafer in potassium hydroxide (KOH). The alkaline etching is performed in the aqueous solution so that the tantalum wafer has a concave-convex microstructure of a plurality of integrally connected cones. In addition, in an example of the present invention, a lightly doped n-type germanium wafer is used to reduce the conductivity of the germanium substrate, making it applicable to solar cells.

於步驟S2以及S3中,係先將該矽基材10浸於一第一酸性蝕刻液中,直至該矽基材10之凹凸微結構20表面沉積有金屬粒子,之後,再將該矽基材10浸於一第二酸性蝕刻液中,以於該矽基材10之凹凸微結構20形成複數奈米槽孔21。In steps S2 and S3, the tantalum substrate 10 is first immersed in a first acidic etching solution until the surface of the uneven microstructure 20 of the tantalum substrate 10 is deposited with metal particles, and then the tantalum substrate is further deposited. 10 is immersed in a second acidic etching solution to form a plurality of nanopore holes 21 in the uneven microstructure 20 of the tantalum substrate 10.

其中,該第一酸性蝕刻液包含有一第一濃度的金屬離子以及一酸性溶液,該第二酸性蝕刻液包含有一第二濃度之該金屬離子以及該酸性溶液,該第二濃度低於該第一濃度,並且,該金屬離子較佳為銀離子,而該酸性溶液較佳為氫氟酸。在本發明一範例中,該第一與第二酸性蝕刻液係透過將硝酸銀(AgNO3 )溶解於氫氟酸而製得。Wherein, the first acidic etching solution comprises a first concentration of metal ions and an acidic solution, the second acidic etching solution comprises a second concentration of the metal ions and the acidic solution, and the second concentration is lower than the first The concentration, and the metal ion is preferably silver ion, and the acidic solution is preferably hydrofluoric acid. In an embodiment of the invention, the first and second acidic etching solutions are obtained by dissolving silver nitrate (AgNO 3 ) in hydrofluoric acid.

如此,當該矽基材10浸於該第一酸性蝕刻液時,散布於該酸性蝕刻液中之該銀離子會先自矽基材10表面的矽原子取得電子,而於矽基材10之凹凸微結構20表面還原成銀粒子(silver particle),繼而沉積於該凹凸微結構20表面,該矽基材10之凹凸微結構20則會因失去電子而氧化成為二氧化矽(SiO2 ),再被氫氟酸蝕 刻,而出現奈米孔洞。接著,當該矽基材10浸於該第二酸性蝕刻液時,第二酸性蝕刻液中之較低濃度的銀離子就能夠以比較緩慢的速度繼續進行前述的氧化還原反應,來輔助沉積於該凹凸微結構20表面的銀粒子繼續蝕刻,最後,如第2圖所示,於該矽基材10之凹凸微結構20形成複數均勻分布的奈米槽孔21,亦即產生複數均勻分布的奈米線23。Thus, when the ruthenium substrate 10 is immersed in the first acidic etchant, the silver ions dispersed in the acidic etchant will first acquire electrons from the ruthenium atoms on the surface of the substrate 10, and the ruthenium substrate 10 The surface of the uneven microstructure 20 is reduced to silver particles, and then deposited on the surface of the uneven microstructure 20, and the uneven microstructure 20 of the tantalum substrate 10 is oxidized to cerium oxide (SiO 2 ) due to loss of electrons. It is etched by hydrofluoric acid and a nanopore appears. Then, when the ruthenium substrate 10 is immersed in the second acidic etchant, the lower concentration of silver ions in the second acidic etchant can continue the aforementioned redox reaction at a relatively slow rate to assist deposition. The silver particles on the surface of the concave-convex microstructure 20 continue to be etched. Finally, as shown in FIG. 2, a plurality of uniformly distributed nano-slots 21 are formed in the concave-convex microstructure 20 of the base material 10, that is, a plurality of uniformly distributed Nano line 23.

在步驟S2中,該矽基材10浸於該第一酸性蝕刻液中的時間較佳為20秒至45秒。若浸漬時間超過45秒,該凹凸微結構20表面會沉積過多的銀粒子,導致凹凸微結構20快速氧化而完全被氫氟酸蝕刻;若浸漬時間低於20秒,凹凸微結構20與銀離子的氧化還原反應速率不均,導致銀粒子無法均勻沉積於該凹凸微結構20的表面,影響步驟S3的第二階段蝕刻。In step S2, the time during which the tantalum substrate 10 is immersed in the first acidic etching solution is preferably from 20 seconds to 45 seconds. If the immersion time exceeds 45 seconds, excessive silver particles are deposited on the surface of the embossed microstructure 20, causing the embossed microstructure 20 to be rapidly oxidized and completely etched by hydrofluoric acid; if the immersion time is less than 20 seconds, the embossed microstructure 20 and silver ions The redox reaction rate is uneven, resulting in the inability of the silver particles to uniformly deposit on the surface of the uneven microstructure 20, affecting the second-stage etching of step S3.

在步驟S3中,該矽基材10浸於該第二酸性蝕刻液中的時間較佳為1分鐘至5分鐘。若浸漬時間超過5分鐘或是低於1分鐘,則無法蝕刻出奈米槽孔21(亦即無法產生奈米線23),僅有奈米孔洞結構。In step S3, the time during which the tantalum substrate 10 is immersed in the second acidic etching solution is preferably from 1 minute to 5 minutes. If the immersion time exceeds 5 minutes or less than 1 minute, the nanopore hole 21 cannot be etched (that is, the nanowire 23 cannot be produced), and only the nanopore structure is formed.

另外,在步驟S2以及S3中,該銀離子的第一濃度最好為0.34M(mole/L),第二濃度最好為0.03M(mole/L)。若該第一濃度高於0.34M,該凹凸微結構20表面會沉積過多的銀粒子,導致凹凸微結構20快速氧化而完全被氫氟酸蝕刻。若該第二濃度高於0.03M,該凹凸微結構20與銀離子的氧化還原反應不均,蝕刻出的奈米槽孔21結構不穩,容易倒塌。Further, in steps S2 and S3, the first concentration of the silver ions is preferably 0.34 M (mole/L), and the second concentration is preferably 0.03 M (mole/L). If the first concentration is higher than 0.34 M, excessive silver particles are deposited on the surface of the textured microstructure 20, causing the textured microstructure 20 to be rapidly oxidized and completely etched by hydrofluoric acid. If the second concentration is higher than 0.03 M, the redox reaction of the uneven microstructure 20 and the silver ions is not uniform, and the etched nanopore 21 is unstable in structure and easily collapses.

於步驟S4中,移除沉積於該矽基材10之凹凸微結構20表面與各該奈米槽孔21內之金屬粒子。移除金屬粒子的方式並無特定限制,但若該第一與第二酸性蝕刻液之金屬離子係來自於硝酸銀,則最好使用硝酸(nitric acid,HNO3 )來移除該凹凸微結構20表面與各該奈米槽孔21內的金屬粒子(銀粒子),例如將該矽基材10浸泡於硝酸溶液中,藉以盡可能地移除沉積的銀粒子。In step S4, the metal particles deposited on the surface of the uneven microstructure 20 of the tantalum substrate 10 and each of the nanopore holes 21 are removed. The manner of removing the metal particles is not particularly limited, but if the metal ions of the first and second acidic etching solutions are derived from silver nitrate, it is preferable to remove the uneven microstructure 20 using nitric acid (HNO 3 ). The surface and the metal particles (silver particles) in each of the nanopore holes 21, for example, the ruthenium substrate 10 are immersed in a nitric acid solution, whereby the deposited silver particles are removed as much as possible.

另外,若上述步驟S4係透過將矽基材10浸漬於硝酸溶液中來移除銀粒子,則該凹凸微結構20表面可能會產生氧化層,亦即出現矽氧化物(SiO2 ),此時,本發明之製造方法最好還包括有移除該凹凸微結構20表面之矽氧化物的步驟S5。當然,移除矽氧化物的方式並無特定限制,例如可以使用稀釋的氫氟酸。In addition, if the step S4 is performed by immersing the ruthenium substrate 10 in a nitric acid solution to remove silver particles, an oxide layer may be formed on the surface of the embossed microstructure 20, that is, cerium oxide (SiO 2 ) may be present. Preferably, the manufacturing method of the present invention further comprises a step S5 of removing the cerium oxide on the surface of the textured microstructure 20. Of course, there is no particular limitation on the manner in which the cerium oxide is removed, and for example, diluted hydrofluoric acid can be used.

由前述製造方法製得之矽基板30,如第2圖所示,具有該矽基層11以及一體形成於該矽基層11之一表面的凹凸微結構20,並且,該凹凸為結構20還具有複數奈米槽孔21。The ruthenium substrate 30 obtained by the above-described manufacturing method has the ruthenium base layer 11 and the uneven microstructure 20 integrally formed on one surface of the ruthenium base layer 11 as shown in FIG. 2, and the unevenness is such that the structure 20 has a plurality of Nano slot 21.

為更加理解本發明,以下參照實施例進一步詳細說明本發明之太陽能電池之矽基板的製備方法。然而,本發明的多個實施例不應用來解釋為本發明之範圍,該等實施例僅為了向本技術領域中具有通常知識者更完整地說明本發明。In order to further understand the present invention, a method of preparing a tantalum substrate for a solar cell of the present invention will be described in further detail below with reference to examples. However, the various embodiments of the present invention are not to be construed as being limited to the scope of the present invention. The embodiments are only more fully described by those of ordinary skill in the art.

[實施例矽基板之製備][Examples of Preparation of Substrate]

將6吋n-type矽晶圓(1~3Ω-cm,厚度200μm,合晶科技股份有限公司供售)依序利用丙酮溶液、酒精溶液、以及去離子水進行清洗,清洗時係於超音波震盪器中進行,之後將矽晶圓浸 泡於稀釋的氫氟酸約2至3分鐘以去除矽晶圓表面的氧化層,再以去離子水進行最後清洗。6吋n-type矽 wafer (1~3Ω-cm, thickness 200μm, supplied by Hejing Technology Co., Ltd.) is sequentially cleaned with acetone solution, alcohol solution, and deionized water. The cleaning is performed on ultrasonic waves. Performed in the oscillator, after which the wafer is dipped Soak the diluted hydrofluoric acid for about 2 to 3 minutes to remove the oxide layer on the surface of the tantalum wafer, and then perform final cleaning with deionized water.

接著,利用氫氧化鉀水溶液蝕刻該矽晶圓,使該矽晶圓成為表面具有凹凸微結構者。前述氫氧化鉀水溶液係由70:2:5之比例的去離子水、40wt%氫氧化鉀以及異丙醇(isopropyl alcohol,IPA)配製而成。再次將矽晶圓浸泡於稀釋的氫氟酸約2至3分鐘以去除矽晶圓表面的氧化層。Next, the tantalum wafer is etched with a potassium hydroxide aqueous solution to make the tantalum wafer have a concave-convex microstructure on its surface. The aqueous potassium hydroxide solution is prepared by deionized water in a ratio of 70:2:5, 40% by weight of potassium hydroxide, and isopropyl alcohol (IPA). The germanium wafer is again immersed in the diluted hydrofluoric acid for about 2 to 3 minutes to remove the oxide layer on the surface of the germanium wafer.

將前述該矽晶圓先浸入由硝酸銀與氫氟酸配製而得之第一酸性蝕刻液中進行第一次蝕刻,之後再將該矽晶圓浸入同樣由硝酸銀與氫氟酸配製而得之第二酸性蝕刻液中進行第二次蝕刻。前述第一與第二酸性蝕刻液係將硝酸銀固體(99.8%,聯工化學試藥供售)溶解於4.6M的氫氟酸(55%,CHONEYE PURE CHEMICALS供售)中,分別配製成含有0.34M之銀離子的第一酸性蝕刻液,以及含有0.03M之銀離子的第二酸性蝕刻液。The ruthenium wafer is first immersed in a first acid etchant prepared by using silver nitrate and hydrofluoric acid for the first etching, and then the ruthenium wafer is immersed in the same silver nitrate and hydrofluoric acid. A second etching is performed in the diacid etchant. The first and second acidic etching solutions are prepared by dissolving a silver nitrate solid (99.8%, a joint chemical reagent for sale) in 4.6 M hydrofluoric acid (55%, supplied by CHONEYE PURE CHEMICALS). A first acidic etchant of 0.34M silver ions and a second acidic etchant containing 0.03M silver ions.

蝕刻完成後,將矽晶圓浸於硝酸中,移除沉積於凹凸微結構表面與各奈米槽孔內的銀粒子。After the etching is completed, the germanium wafer is immersed in nitric acid to remove silver particles deposited on the surface of the concave-convex microstructure and each nanopore.

最後,以稀釋的氫氟酸去除矽晶圓表面的矽氧化物,再以去離子水沖洗。以氮氣(nitrogen,N2)及加熱器(hot plate)移除矽晶圓表面殘留的濕氣,製得本發明之矽基板。Finally, the cerium oxide on the surface of the ruthenium wafer is removed with diluted hydrofluoric acid and rinsed with deionized water. The ruthenium substrate of the present invention was obtained by removing moisture remaining on the surface of the ruthenium wafer with nitrogen (nitrogen, N2) and a hot plate.

利用上述方式製備實施例1至30之矽基板,各實施例第1次蝕刻時間與第2次蝕刻時間分別顯示於下表1。The tantalum substrates of Examples 1 to 30 were prepared in the above manner, and the first etching time and the second etching time of each of the examples are shown in Table 1 below.

[表1] [Table 1]

利用掃描式電子顯微鏡(Scanning Electron Microscope,SEM,日本JEOL之JSM-6700F冷陰極(Cold cathode)場發射掃描式電子顯微鏡)拍攝各實施例之矽基板的結構,並量測各實施例於波長200nm(紫外光)至波長1000nm(紅外光)範圍的光反射率。The structure of the tantalum substrate of each example was taken by a scanning electron microscope (SEM, JSM-6700F cold cathode field emission scanning electron microscope of Japan JEOL), and each example was measured at a wavelength of 200 nm. Light reflectance in the range of (ultraviolet light) to wavelength 1000 nm (infrared light).

請參閱第3圖與第4圖,其中第3圖(a)~(d)分別為實施例11~14之矽基板的SEM照片,而第4圖(a)~(f)分別為實施例5、10、15、20、25以及30之矽基板的SEM照片。由第3圖與第4圖可以明顯看出,本發明之製造方法製得之矽基板具有約1至5μm深度的奈米槽孔,且各奈米槽孔具有極佳的垂直性,另外,由第3圖(a) ~(d)右下角的小圖也可證實,本發明之製造方法能夠製得表面同時具有錐形體結構(金字塔結構)與奈米槽孔結構的矽基板。如此,當本發明之矽基板應用於太陽能電池時,入射於矽基板表面的光線不僅可透過該錐形體結構,還能藉由各奈米槽孔結構而使矽基板的光反射率降低至5%以下,亦即提高光吸收特性。Please refer to FIG. 3 and FIG. 4 , wherein FIG. 3 ( a ) to ( d ) are SEM photographs of the substrates of Examples 11 to 14, respectively, and FIGS. 4 ( a ) to ( f ) are respectively examples. SEM photographs of the substrates of 5, 10, 15, 20, 25, and 30. As is apparent from FIGS. 3 and 4, the tantalum substrate produced by the manufacturing method of the present invention has a nanopore having a depth of about 1 to 5 μm, and each nanopore has excellent verticality. Figure 3 (a) ~(d) A small image in the lower right corner can also confirm that the manufacturing method of the present invention can produce a tantalum substrate having a tapered structure (pyramid structure) and a nanopore structure on the surface. Thus, when the germanium substrate of the present invention is applied to a solar cell, light incident on the surface of the germanium substrate can pass not only through the tapered body structure, but also the light reflectance of the germanium substrate can be reduced to 5 by the respective nanopore structure. Below %, that is, improving light absorption characteristics.

請參閱第5圖,其為實施例15、20以及25之反射率與入射光波長的分析結果,由此圖可以看出實施例15、20以及25在200nm~1000nm範圍內的反射率皆低於2%以下。接著請參閱第6圖,第1次蝕刻時間為30、35以及40秒的實施例11~25,在200nm~1000nm範圍內的平均反射率皆低於6%,其中實施例15的平均反射率更可降至1.2%。以上結果足證本發明之矽基板確實具有較高的光吸收特性。Please refer to FIG. 5 , which is the analysis results of the reflectance and the wavelength of the incident light of Examples 15, 20 and 25, and it can be seen that the reflectances of Examples 15, 20 and 25 are in the range of 200 nm to 1000 nm. Below 2%. Referring to FIG. 6 , the first etching time is 30, 35, and 40 seconds, and the average reflectance in the range of 200 nm to 1000 nm is less than 6%, and the average reflectance of Example 15 is as follows. Can be reduced to 1.2%. The above results prove that the substrate of the present invention does have high light absorption characteristics.

另外,雖然第1次蝕刻時間為20、25以及45秒,且第2次蝕刻時間為1至3分鐘的實施例(亦即實施例1~3,實施例6~8以及實施例26~28)在200nm~1000nm範圍內的平均反射率較高(約為6%~18%),但其亦展現出與表面僅具有金字塔結構之習用矽基板近似甚至更佳的光反射率,更且,當第2次蝕刻時間增加至5分鐘時(亦即實施例5、10以及30),其平均反射率還可降至3%~6%。In addition, although the first etching time is 20, 25, and 45 seconds, and the second etching time is 1 to 3 minutes (that is, Examples 1 to 3, Examples 6 to 8, and Examples 26 to 28) The average reflectance in the range of 200 nm to 1000 nm is relatively high (about 6% to 18%), but it also exhibits an approximation or even better light reflectance with a conventional germanium substrate having a pyramid structure on the surface, and more When the second etching time is increased to 5 minutes (i.e., Examples 5, 10, and 30), the average reflectance can also be reduced to 3% to 6%.

再者,下表2所示者為實施例11~15在不同波長範圍內的平均反射率,由表2可知,本發明之矽基板對紫外光(200~400nm)以及可見光(401~800nm)皆具有低於6%的平均反射率,對於近紅外光(801~1000nm)也有等於或低於8.16%的平均反射率,顯見由本發 明之方法製得之矽基板對紫外光、可見光以及紅外光皆具有良好的光吸收特性。Furthermore, the average reflectances of the examples 11 to 15 in the different wavelength ranges are shown in Table 2 below. It can be seen from Table 2 that the germanium substrate of the present invention has ultraviolet light (200 to 400 nm) and visible light (401 to 800 nm). Both have an average reflectance of less than 6%, and for near-infrared light (801-1000 nm), there is also an average reflectance equal to or lower than 8.16%, which is apparent from the present invention. The substrate prepared by the method has good light absorption characteristics for ultraviolet light, visible light and infrared light.

綜上所陳,由於本發明之製造方法能夠製得具有均勻分布之奈米孔槽的矽基板,因此本發明之矽基板能夠有效抑制紫外光、可見光以及紅外光波長範圍之光反射,換言之,本發明之矽基板對紫外光、可見光以及紅外光皆具有良好的光吸收特性。此外,相較於習知技術,本發明之製造方法具有製程時間縮短以及製造成本降低的優勢,且製得之矽基板具有更佳的光反射率。In summary, since the manufacturing method of the present invention can produce a tantalum substrate having uniformly distributed nanopore grooves, the tantalum substrate of the present invention can effectively suppress light reflection in the ultraviolet, visible, and infrared wavelength ranges, in other words, The germanium substrate of the present invention has good light absorption properties for ultraviolet light, visible light, and infrared light. In addition, the manufacturing method of the present invention has the advantages of shortened process time and reduced manufacturing cost compared to the prior art, and the resulting substrate has better light reflectance.

S1~S5‧‧‧步驟S1~S5‧‧‧Steps

Claims (10)

一種太陽能電池之矽基板之製造方法,包含有下列步驟:(a)準備一表面具有一凹凸微結構的矽基材;(b)將該矽基材浸於一第一酸性蝕刻液中,直至該矽基材之凹凸微結構表面沉積有金屬粒子,該第一酸性蝕刻液包含有一第一濃度之金屬離子以及一酸性溶液;(c)將該矽基材浸於一第二酸性蝕刻液中,以於該矽基材之凹凸微結構形成複數奈米槽孔,該第二酸性蝕刻液包含有一第二濃度之該金屬離子以及該酸性溶液,該第二濃度低於該第一濃度;以及(d)移除沉積於該矽基材之凹凸微結構表面與各該奈米槽孔內之金屬粒子。A method for manufacturing a tantalum substrate for a solar cell, comprising the steps of: (a) preparing a tantalum substrate having a concave and convex microstructure on the surface; and (b) immersing the tantalum substrate in a first acidic etching solution until The surface of the uneven microstructure of the germanium substrate is deposited with metal particles, the first acidic etching solution comprises a metal ion of a first concentration and an acidic solution; (c) the germanium substrate is immersed in a second acidic etching solution. Forming a plurality of nano-slots in the concave-convex microstructure of the ruthenium substrate, the second acidic etchant comprising a second concentration of the metal ions and the acidic solution, the second concentration being lower than the first concentration; (d) removing metal particles deposited on the surface of the textured microstructure of the tantalum substrate and each of the nanoholes. 如請求項1所述之太陽能電池之矽基板之製造方法,於步驟(a)中,該凹凸微結構係由複數一體相連之錐形體所構成。The method for manufacturing a tantalum substrate for a solar cell according to claim 1, wherein in the step (a), the concavo-convex microstructure is composed of a plurality of conical bodies integrally connected. 如請求項1所述之太陽能電池之矽基板之製造方法,於步驟(a)中,該具有凹凸微結構之矽基材係透過將一矽晶圓浸於氫氧化鉀水溶液中進行鹼性蝕刻而製得。The method for manufacturing a substrate for a solar cell according to claim 1, wherein in the step (a), the substrate having the uneven microstructure is subjected to alkaline etching by immersing a wafer in an aqueous potassium hydroxide solution. And made. 如請求項1所述之太陽能電池之矽基板之製造方法,其中該金屬離子為銀離子,該酸性溶液為氫氟酸。The method for producing a tantalum substrate for a solar cell according to claim 1, wherein the metal ion is silver ion and the acidic solution is hydrofluoric acid. 如請求項4所述之太陽能電池之矽基板之製造方法,於步驟(b)中,該矽基材浸於該第一酸性蝕刻液中的時間為20秒至45秒。The method for manufacturing a substrate for a solar cell according to claim 4, wherein in the step (b), the ruthenium substrate is immersed in the first acidic etchant for a time of 20 seconds to 45 seconds. 如請求項4所述之太陽能電池之矽基板之製造方法,於步驟(c)中,該矽基材浸於該第二酸性蝕刻液中的時間為1分鐘至5分鐘。 The method of manufacturing a substrate for a solar cell according to claim 4, wherein in the step (c), the ruthenium substrate is immersed in the second acidic etchant for a period of from 1 minute to 5 minutes. 如請求項4所述之太陽能電池之矽基板之製造方法,該銀離子之第一濃度為0.34M。 The method for producing a tantalum substrate for a solar cell according to claim 4, wherein the first concentration of the silver ions is 0.34 M. 如請求項4所述之太陽能電池之矽基板之製造方法,該銀離子之第二濃度為0.03M。 The method for producing a tantalum substrate for a solar cell according to claim 4, wherein the second concentration of the silver ions is 0.03 M. 如請求項4所述之太陽能電池之矽基板之製造方法,其中該第一與第二酸性蝕刻液係將硝酸銀溶解於氫氟酸而得。 The method for producing a tantalum substrate for a solar cell according to claim 4, wherein the first and second acidic etching solutions are obtained by dissolving silver nitrate in hydrofluoric acid. 如請求項1所述之太陽能電池之矽基板之製造方法,更包含有步驟(e)移除形成於該矽基材之凹凸微結構表面之一矽氧化物。 The method for manufacturing a tantalum substrate for a solar cell according to claim 1, further comprising the step (e) of removing a tantalum oxide formed on the surface of the uneven microstructure of the tantalum substrate.
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TW201222653A (en) * 2010-11-26 2012-06-01 Wakom Semiconductor Corp Method of forming micro-pore structure or recess structure on silicon chip substrate surface
JP2012216347A (en) * 2011-03-31 2012-11-08 Daiso Co Ltd Nonaqueous electrolyte secondary battery

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201222653A (en) * 2010-11-26 2012-06-01 Wakom Semiconductor Corp Method of forming micro-pore structure or recess structure on silicon chip substrate surface
JP2012216347A (en) * 2011-03-31 2012-11-08 Daiso Co Ltd Nonaqueous electrolyte secondary battery

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