TWI504887B - X - ray tomography - Google Patents

X - ray tomography Download PDF

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TWI504887B
TWI504887B TW101146297A TW101146297A TWI504887B TW I504887 B TWI504887 B TW I504887B TW 101146297 A TW101146297 A TW 101146297A TW 101146297 A TW101146297 A TW 101146297A TW I504887 B TWI504887 B TW I504887B
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unit
tested
storage unit
ray tomography
tomography apparatus
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TW101146297A
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TW201423094A (en
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Jin Shan Lu
Shao Guang Lin
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Nat Inst Chung Shan Science & Technology
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Description

X光斷層掃描裝置X-ray tomography device

本發明係屬於一種X光斷層掃描裝置,特別是關於一種進行放射線檢測使被測物可活動之裝置,達到傳統放射線檢測裝置具有斷層掃描效果。The present invention relates to an X-ray tomography apparatus, and more particularly to a device for performing radiation detection to make a measured object movable, and the conventional radiation detecting apparatus has a tomographic scanning effect.

習知,非破壞性檢查技術來執行結構件之缺陷廣泛應用於航太業、汽車業、發電廠、石化業、鑄造廠等產業內部瑕疵檢查、金屬銲接檢查、塑膠部品內部檢查,此技術包含放射線檢測技術,X光機檢測亦為其一。一般而言,高品質之X光照片有助於判斷結構件缺陷,相反的,品質較差的X光照片除了無法由肉眼判讀,更有可能導致誤判,衍生出後續製程或應用上風險。Conventional, non-destructive inspection techniques to implement structural defects are widely used in the industry, inspection, metal welding inspection, and internal inspection of plastic parts in the aerospace industry, automobile industry, power plants, petrochemical industry, foundry, etc. Radiation detection technology, X-ray machine detection is also one. In general, high-quality X-ray photos help to determine structural defects. Conversely, poor quality X-rays are more likely to be misinterpreted by the naked eye, leading to subsequent processes or application risks.

按,X光成像方式係利用穿透過被測物之X光,經映像裝置形成影像。傳統X光照射法即靜態照射法,映像裝置由化學物質構成之感光底片為主,當X光穿過被測物後,該X光打在感光底片上,將能量轉換給化學物質,造成底片曝光而成像,故X光機、被測物與底片須固定置放於同一直線上。然,能夠越詳實重建被測物結構之X光照片,其成像品質越高,由於X光影像無法精確的測量,X光影像的品質不易明確定義。According to the X-ray imaging method, X-rays that have passed through the object to be tested are used to form an image by the imaging device. The conventional X-ray irradiation method is a static irradiation method, and the image forming device is mainly composed of a chemical film composed of a chemical substance. When the X-ray passes through the object to be tested, the X-ray is hit on the photosensitive film to convert energy to the chemical substance, resulting in a negative film. The image is exposed and exposed, so the X-ray machine, the object to be tested and the film must be fixed on the same line. However, the more detailed the X-ray photograph of the structure of the object to be measured, the higher the image quality, and the X-ray image cannot be accurately determined because the X-ray image cannot be accurately determined.

另,X光進入被測物後,有以下情形發生,X光被吸收、產生散射或穿透,此物理現象均會影響底片成像之結果,因此當被測物之厚度不一或有刻痕之金屬材質時,所獲得之影像成像品質較差、雜訊多,而降低X光照片雜訊以提高X光影像品質係本發明主要欲解決之問題。In addition, after the X-ray enters the measured object, the following occurs, the X-ray is absorbed, scattered or penetrated, and the physical phenomenon affects the result of the film imaging, so when the thickness of the measured object is different or has a nick In the case of the metal material, the image quality obtained is poor and the noise is large, and the reduction of the X-ray photo noise to improve the X-ray image quality is the main problem to be solved by the present invention.

X光照片中之雜訊係指影像中存在非被測物結構之成像,且通常被測物於照片上成像有失真與模糊等現 象。所有的被測物在X光影像中比實物大,甚至是同一物體卻產生不同形狀,此種現象稱之為失真,一般而言,造成失真因素有被測物的厚度與位置。被測物厚度越厚,吸收X光之能力越強,厚物體較薄物體易失真,除此之外被測物與成像平面是否平行、被測物本身形狀不規則亦或是成像區域是否位於X光源中心軸上,都會造成失真。另,由於X光管所輻射出之X光為一錐狀射束,在成像時會有邊緣較模糊之現象。The noise in the X-ray photograph refers to the imaging of the structure of the undetected object in the image, and usually the image of the object is imaged with distortion and blur. Elephant. All the objects in the X-ray image are larger than the real object, and even the same object has different shapes. This phenomenon is called distortion. Generally speaking, the distortion factor has the thickness and position of the object to be tested. The thicker the measured object, the stronger the ability to absorb X-rays, and the thicker objects are more likely to be distorted. In addition, the object to be measured is parallel to the imaging plane, the shape of the object itself is irregular, or the imaging area is located. Distortion occurs on the center axis of the X-ray source. In addition, since the X-ray emitted by the X-ray tube is a cone beam, there is a phenomenon that the edge is blurred when imaging.

鑒於上述習知技術之缺點,本發明應用一種以活動單元,將放置被測物之置物單元與被測物經放射線照射後產生影像之成像單元產生連動,讓被測物於放射光源中進行動態照射成像,達到降低雜訊之目的。In view of the above-mentioned shortcomings of the prior art, the present invention uses an activity unit to link the object unit on which the object to be tested is placed and the image forming unit that generates the image after being irradiated by the object to be irradiated, so that the object to be measured is dynamic in the radiation source. Illumination imaging achieves the goal of reducing noise.

為達到X光斷層掃描之效果,放射機構於被測物移動時持續進行照射,放射線、置物單元之被測物橫斷面上某處及成像單元對應位置須保持在同一直線,本發明提供一種X光斷層掃描裝置,藉由活動單元使成像單元與置物單元而產生連動,成像單元之底片上成像位置不變,利用被測物往復移動進行放射線掃描時,只有放射線聚焦處斷面之影像清晰、其餘位置模糊之特性,研判待測物是否有缺陷。In order to achieve the effect of the X-ray tomography, the radiation mechanism continuously illuminates when the object to be tested moves, and the radiation, the position of the object to be measured on a cross section of the object and the corresponding position of the imaging unit must be kept in the same straight line, and the present invention provides a The X-ray tomography apparatus is configured to make the imaging unit and the storage unit interlock by the movable unit, and the imaging position on the film of the imaging unit is unchanged. When the object is reciprocated to perform the radiation scanning, only the image of the section of the radiation focus is clear. The characteristics of the remaining positions are blurred, and it is judged whether the object to be tested is defective.

為了達到上述目的,本發明提供一種X光斷層掃描裝置,該裝置係包含:一基座;一待測機構,容置於基座之一側,係包括成像單元、置物單元與活動單元,其中該成像單元活動設置於置物單元之一側,該活動單元活動設置於該置物單元之同一側,使置物單元與成像單元同時往復作動;以及一放射機構,用以發射放射線,照射該待測機構之置物單元另一側。In order to achieve the above object, the present invention provides an X-ray tomography apparatus, which comprises: a susceptor; a device to be tested, which is placed on one side of the pedestal, and includes an imaging unit, a storage unit and an active unit, wherein The imaging unit is movably disposed on one side of the storage unit, the movable unit is movably disposed on the same side of the storage unit to reciprocate the storage unit and the imaging unit, and a radiation mechanism for emitting radiation to illuminate the mechanism to be tested The other side of the storage unit.

其中,上述X光斷層掃描裝置實施方式之一,該待測機構之活動單元係包括至少一個以上之連桿與動力元件。該連桿係用以連結該待測機構之成像單元與置物單元。更可將該連桿與該放射機構樞接,使該待測機構於該放射機構之放 射線照射範圍內。In one embodiment of the X-ray tomography apparatus, the active unit of the mechanism to be tested includes at least one of a connecting rod and a power element. The connecting rod is used to connect the imaging unit and the storage unit of the mechanism to be tested. Further connecting the connecting rod with the radiation mechanism, so that the mechanism to be tested is placed on the radiation mechanism Within the range of radiation.

上述X光斷層掃描裝置另一實施方式,該待測機構之成像單元與置物單元更可設置滑動元件,可於該基座上進行滑動,該滑動元件係可為滾輪、凹槽、滑軌或其組合,其中該活動單元可增設一鏈條,用以帶動該待測機構之成像單元與置物單元。該基座更可進一步設置軌道,供該待測機構之成像單元與置物單元於其上滑動,使該待測機構於動態照射過程中,往復移動時更加順暢。In another embodiment of the X-ray tomography apparatus, the imaging unit and the storage unit of the device to be tested are further provided with a sliding element, which can be slid on the base, and the sliding element can be a roller, a groove, a slide rail or The combination unit, wherein the movable unit can be provided with a chain for driving the imaging unit and the storage unit of the mechanism to be tested. The base can further be provided with a track for the imaging unit and the storage unit of the mechanism to be tested to slide thereon, so that the mechanism to be tested is more smoothly reciprocated during the dynamic illumination process.

本發明之另一目的,提供一種X光斷層掃描裝置,可用於各式金屬外殼,內有填充料之工件進行放射線斷層掃描檢測裝置。Another object of the present invention is to provide an X-ray tomography apparatus which can be used in various metal casings, in which a workpiece having a filler is subjected to a radiation tomography detecting apparatus.

以上之概述與接下來的詳細說明及附圖,皆是為了能進一步說明本發明達到預定目的所採取的方式、手段及功效。而有關本發明的其它目的及優點,將在後續的說明及圖示中加以闡述。The above summary, the following detailed description and the accompanying drawings are intended to further illustrate the manner, the Other objects and advantages of the present invention will be described in the following description and drawings.

以下係藉由特定的具體實例說明本發明之實施方式,熟悉此技藝之人士可由本說明書所揭示之內容輕易地瞭解本發明之其它優點與功效。The embodiments of the present invention are described below by way of specific examples, and those skilled in the art can readily appreciate the other advantages and advantages of the present invention.

請參閱圖二所示,本發明一種X光斷層掃描裝置實施例一局部之正視示意圖,該裝置係包含:一基座(200);一待測機構(300),係包括成像單元(310)、置物單元(320)與活動單元(330),該活動單元(330)包含至少一個以上之連桿(331)及動力元件(332),連結該待測機構(300)之該成像單元(310)與該置物單元(320),使該成像單元(310)與該置物單元(320)產生連動;以及一放射機構(400),用以發射放射線,照射該待測機構(300)之置物單元(320)另一側。其中成像單元(310)及置物單元(320)之滑動元件(311、321)可於該基座(200)上進行滑動,該滑動元件(311、321),係可為滾輪、凹槽、滑軌或其組合。Referring to FIG. 2, a partial front view of an embodiment of an X-ray tomography apparatus according to the present invention includes: a base (200); and a mechanism to be tested (300) including an imaging unit (310). a storage unit (320) and an activity unit (330), the activity unit (330) comprising at least one link (331) and a power component (332), the imaging unit (310) connecting the mechanism (300) to be tested And the storage unit (320) to cause the imaging unit (310) to be linked with the storage unit (320); and a radiation mechanism (400) for emitting radiation to illuminate the storage unit of the device (300) to be tested (320) The other side. The sliding elements (311, 321) of the imaging unit (310) and the storage unit (320) are slidable on the base (200), and the sliding elements (311, 321) are rollers, grooves, and slides. Track or a combination thereof.

請參閱圖三本發明一種X光斷層掃描裝置實施例一局部之側視示意圖所示,該活動單元之連桿(331)更進一步可與放射機構(400)樞接,使該待測機構(300)於該放射機構(400)之放射線照射範圍內。Referring to FIG. 3, a side view of a portion of an X-ray tomography apparatus according to the present invention is shown. The connecting rod (331) of the movable unit is further pivotally connected to the radiation mechanism (400) to make the mechanism to be tested ( 300) Within the radiation exposure range of the radiation mechanism (400).

實施例一:Embodiment 1:

如圖四所示,本發明一種X光斷層掃描裝置實施例一之側視示意圖,該裝置係包含:一基座(200)係設置至少一個以上之軌道,可供成像單元(310)與置物單元(320)於其上滑動;一待測機構(300),係包括成像單元(310)、置物單元(320)與活動單元(330);該活動單元(330)係包含至少一個以上之連桿(331),連結該待測機構(300)之該成像單元(310)與該置物單元(320),使該成像單元(310)與該置物單元(320)產生連動,該活動單元(330)更設有一動力元件(332),用以前後往復帶動該待測機構(300),該活動單元(330);以及一放射機構(400)發射放射線於該置物單元(320)之一側。其中該成像單元(310)及該置物單元(320)之滑動元件(311、321)可於該基座(200)上進行滑動。動力元件(332)係可為馬達、液壓、氣壓或其組合之裝置。As shown in FIG. 4, a schematic side view of a first embodiment of an X-ray tomography apparatus according to the present invention includes: a pedestal (200) is provided with at least one or more tracks for the imaging unit (310) and the storage device. The unit (320) slides thereon; a mechanism to be tested (300) includes an imaging unit (310), a storage unit (320) and an active unit (330); the active unit (330) includes at least one of a rod (331) coupled to the imaging unit (310) of the device (300) to be tested and the storage unit (320) to cause the imaging unit (310) to be linked with the storage unit (320), the active unit (330) Further, a power component (332) is provided for reciprocatingly driving the mechanism (300) to be tested, the movable unit (330), and a radiation mechanism (400) emitting radiation on one side of the storage unit (320). The sliding unit (311, 321) of the imaging unit (310) and the storage unit (320) can slide on the base (200). The power element (332) can be a motor, hydraulic, pneumatic or a combination thereof.

實施例二:Embodiment 2:

一種X光斷層掃描裝置,其組成包含:放射機構(400),其下方具一固定向下的放射頭放射X光;連桿(331),其頂端以迴轉對與放射機構(400)樞接,底部開一滑槽作為限位槽;一成像單元(310),為底片之放置座,其兩側具限位元件,藉限位槽對與連桿(331)鄰接;一組成像單元(310)之滑動元件,提供成像單元(310)於基座(200)上軌道滑動;一鏈條(333),其固定於成像單元(310)之前後兩端,與成像單元(310)形成一封閉迴路,當動力元件(332)驅動鏈條(333)時,該鏈條(333)可帶動成像單元(310)於基座(200)上做向前或往後的滑移;一置物單元(320),其上有一個凹槽提供待測物放置,兩側具有限位 元件,藉限位槽對與連桿(331)鄰接;一組鏈輪,其安裝於基座(200)用以改變鏈條(333)拉線配置方向。操作過程係以X光持續照射待測物,照射過程中動力元件(332)帶動鏈條(333),該鏈條(333)拉動成像單元(310)的滑動,當成像單元(320)滑動時,其兩側的限位元件與該連桿(331)以限位槽對鄰接,帶動連桿(331)的擺動;連桿(331)擺動時其限位槽與置物單元(320)同樣以限位槽對鄰接,置物單元(320)會隨連桿(331)移動。An X-ray tomography apparatus comprising: a radiation mechanism (400) having a fixed downward radiation head emitting X-rays; and a connecting rod (331) having a top end pivotally coupled to the radiation mechanism (400) a sliding slot is defined as a limiting slot at the bottom; an imaging unit (310) is a placement seat of the negative film, and has a limiting component on both sides thereof, and the pair of limiting slots are adjacent to the connecting rod (331); a group of imaging units ( 310) the sliding element, providing the imaging unit (310) to slide on the base (200); a chain (333) fixed to the front and rear ends of the imaging unit (310) to form a closed loop with the imaging unit (310) When the power component (332) drives the chain (333), the chain (333) can drive the imaging unit (310) to slide forward or backward on the base (200); a storage unit (320), There is a groove on it to provide the object to be tested, and there are limits on both sides. The component is adjacent to the connecting rod (331) by a pair of limiting slots; a set of sprocket mounted on the base (200) for changing the direction in which the chain (333) is disposed. The operation process continuously irradiates the object to be tested by X-ray. During the illumination, the power element (332) drives the chain (333), and the chain (333) pulls the sliding of the imaging unit (310), when the imaging unit (320) slides, The limiting member on both sides and the connecting rod (331) are adjacent to the pair of limiting slots to drive the swing of the connecting rod (331); when the connecting rod (331) is swung, the limiting slot and the storage unit (320) are also limited. The pair of slots abut, and the storage unit (320) moves with the link (331).

上述之實施例僅為例示性說明本發明之特點及其功效,而非用於限制本發明之實質技術內容的範圍。任何熟悉此技藝之人士均可在不違背本發明之精神及範疇下,對上述實施例進行修飾與變化。因此,本發明之權利保護範圍,應如後述之申請專利範圍所列。The above-described embodiments are merely illustrative of the features and functions of the present invention and are not intended to limit the scope of the technical scope of the present invention. Modifications and variations of the above-described embodiments can be made by those skilled in the art without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention should be as set forth in the scope of the claims described below.

110‧‧‧X光機110‧‧‧X-ray machine

120‧‧‧置物單元120‧‧‧Store unit

130‧‧‧成像單元130‧‧‧ imaging unit

140‧‧‧待測物140‧‧‧Test object

200‧‧‧基座200‧‧‧Base

300‧‧‧待測機構300‧‧‧ institutions to be tested

310‧‧‧成像單元310‧‧‧ imaging unit

311‧‧‧滑動元件311‧‧‧Sliding components

320‧‧‧置物單元320‧‧‧Store unit

321‧‧‧滑動元件321‧‧‧Sliding components

330‧‧‧活動單元330‧‧‧ activity unit

331‧‧‧連桿331‧‧‧ Connecting rod

332‧‧‧動力元件332‧‧‧Power components

333‧‧‧鏈條333‧‧‧Chain

400‧‧‧放射機構400‧‧‧radiation agencies

圖一係為習知X光照射示意圖Figure 1 is a schematic diagram of conventional X-ray illumination

圖二係為本發明實施例一局部之正視示意圖Figure 2 is a front elevational view of a portion of the embodiment of the present invention

圖三係為本發明實施例一局部之側視示意圖Figure 3 is a side elevational view of a portion of the embodiment of the present invention

圖四係為本發明實施例一之側視示意圖Figure 4 is a side view of the first embodiment of the present invention

200‧‧‧基座200‧‧‧Base

300‧‧‧待測機構300‧‧‧ institutions to be tested

310‧‧‧成像單元310‧‧‧ imaging unit

320‧‧‧置物單元320‧‧‧Store unit

330‧‧‧活動單元330‧‧‧ activity unit

331‧‧‧連桿331‧‧‧ Connecting rod

332‧‧‧動力元件332‧‧‧Power components

333‧‧‧鏈條333‧‧‧Chain

400‧‧‧放射機構400‧‧‧radiation agencies

Claims (10)

一種X光斷層掃描裝置,使傳統放射線檢測裝置具有斷層掃描效果,該裝置係包含:一基座;一待測機構,容置於基座之一側,係包括成像單元、置物單元與活動單元,其中該成像單元活動設置於置物單元之一側,該活動單元活動設置於該置物單元之同一側,使置物單元與成像單元同時往復作動;以及一放射機構,其下方具一固定向下的放射頭放射X光,照射該待測機構置物單元之另一側;其中該X光斷層掃描裝置係藉由活動單元使成像單元與置物單元產生連動,成像單元之底片上成像位置不變,利用被測物往復移動進行放射線掃瞄時,只有放射線聚焦處斷面之影像清晰、其餘位置模糊之特性,使該成像單元之底片形成一斷層掃描影像,以研判待測物是否有缺陷。 An X-ray tomography apparatus, which has a tomographic effect on a conventional radiation detecting device, the device comprising: a pedestal; a device to be tested, which is placed on one side of the pedestal, and includes an imaging unit, a storage unit and an active unit The imaging unit is movably disposed on one side of the storage unit, the movable unit is movably disposed on the same side of the storage unit, so that the storage unit and the imaging unit reciprocate simultaneously; and a radiation mechanism having a fixed downward direction The X-ray emits X-rays to illuminate the other side of the object storage unit of the device to be tested; wherein the X-ray tomography device causes the imaging unit to be linked with the storage unit by the movable unit, and the imaging position on the film of the imaging unit is unchanged. When the object to be tested reciprocates and performs radiation scanning, only the image of the section of the radiation focus is clear, and the remaining positions are blurred, so that the film of the imaging unit forms a tomographic image to determine whether the object to be tested is defective. 如申請專利範圍第1項所述之X光斷層掃描裝置,其中,該待測機構之活動單元係包括至少一個以上之連桿與動力元件。 The X-ray tomography apparatus of claim 1, wherein the movable unit of the mechanism to be tested comprises at least one of a connecting rod and a power element. 如申請專利範圍第1項所述之X光斷層掃描裝置,其中,該活動單元之連桿係用以連結該待測機構之成像單元與置物單元。 The X-ray tomography apparatus of claim 1, wherein the linkage of the movable unit is used to connect the imaging unit and the storage unit of the mechanism to be tested. 如申請專利範圍第1或3項所述之X光斷層掃描裝置,其中,該待測機構之成像單元與置物單元更包括至少一個以上之滑動元件,可依附該基座進行滑動。 The X-ray tomography apparatus of claim 1 or 3, wherein the imaging unit and the storage unit of the mechanism to be tested further comprise at least one or more sliding elements that are slidable by the base. 如申請專利範圍第4項所述之X光斷層掃描裝置,其中,該待測機構之成像單元與置物單元之滑動元件,係可為滾輪、凹槽、滑軌或其組合。 The X-ray tomography apparatus of claim 4, wherein the imaging unit of the mechanism to be tested and the sliding element of the storage unit are rollers, grooves, slide rails or a combination thereof. 如申請專利範圍第2項所述之X光斷層掃描裝置,其中,該活動單元之動力元件係包含馬達、液壓、氣壓或其組合之動力件。 The X-ray tomography apparatus of claim 2, wherein the power element of the movable unit comprises a power unit of a motor, a hydraulic pressure, a pneumatic pressure or a combination thereof. 如申請專利範圍第1、2或3項所述之X光斷層掃描裝置,其中,該活動單元係可增設一鏈條,用以帶動該待測機構之成像單元與置物單元。 The X-ray tomography apparatus of claim 1, wherein the movable unit is further provided with a chain for driving the imaging unit and the storage unit of the mechanism to be tested. 如申請專利範圍第5項所述之X光斷層掃描裝置,其中,該基座更包括至少一個以上之軌道,可供該待測機構之成像單元與置物單元於其上滑動。 The X-ray tomography apparatus of claim 5, wherein the base further comprises at least one track on which the imaging unit and the storage unit of the mechanism to be tested slide. 如申請專利範圍第3項所述之X光斷層掃描裝置,其中,該連桿進一步可與該放射機構樞接,使該待測機構於該放射機構之放射線照射範圍內。 The X-ray tomography apparatus of claim 3, wherein the link is further pivotally coupled to the radiation mechanism such that the mechanism to be tested is within a radiation exposure range of the radiation mechanism. 如申請專利範圍第1項所述之X光斷層掃描裝置,其中,該待測機構之置物單元包含凹槽、定位件或其組合。The X-ray tomography apparatus of claim 1, wherein the storage unit of the mechanism to be tested comprises a groove, a positioning member or a combination thereof.
TW101146297A 2012-12-10 2012-12-10 X - ray tomography TWI504887B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000183516A (en) * 1998-12-15 2000-06-30 Matsushita Electric Ind Co Ltd X-ray mounting inspecting device and its method
JP2002071587A (en) * 2000-08-31 2002-03-08 Matsushita Electric Ind Co Ltd X-ray inspecting device
TW200528709A (en) * 2001-10-31 2005-09-01 Vrex Inc 3D stereoscopic x-ray system
TWI247890B (en) * 2002-11-01 2006-01-21 Shimadzu Corp X-ray fluoroscopic apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000183516A (en) * 1998-12-15 2000-06-30 Matsushita Electric Ind Co Ltd X-ray mounting inspecting device and its method
JP2002071587A (en) * 2000-08-31 2002-03-08 Matsushita Electric Ind Co Ltd X-ray inspecting device
TW200528709A (en) * 2001-10-31 2005-09-01 Vrex Inc 3D stereoscopic x-ray system
TWI247890B (en) * 2002-11-01 2006-01-21 Shimadzu Corp X-ray fluoroscopic apparatus

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