TWI504868B - - Google Patents

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Publication number
TWI504868B
TWI504868B TW103123868A TW103123868A TWI504868B TW I504868 B TWI504868 B TW I504868B TW 103123868 A TW103123868 A TW 103123868A TW 103123868 A TW103123868 A TW 103123868A TW I504868 B TWI504868 B TW I504868B
Authority
TW
Taiwan
Application number
TW103123868A
Other languages
Chinese (zh)
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TW201600838A (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of TWI504868B publication Critical patent/TWI504868B/zh
Publication of TW201600838A publication Critical patent/TW201600838A/zh

Links

TW103123868A 2014-06-18 2014-07-10 修正雙波段測溫誤差的溫度測量方法及系統 TW201600838A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410272583.3A CN105333962B (zh) 2014-06-18 2014-06-18 一种修正双波段测温误差的温度测量方法及系统

Publications (2)

Publication Number Publication Date
TWI504868B true TWI504868B (enrdf_load_stackoverflow) 2015-10-21
TW201600838A TW201600838A (zh) 2016-01-01

Family

ID=54851790

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103123868A TW201600838A (zh) 2014-06-18 2014-07-10 修正雙波段測溫誤差的溫度測量方法及系統

Country Status (2)

Country Link
CN (1) CN105333962B (enrdf_load_stackoverflow)
TW (1) TW201600838A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101867715B1 (ko) * 2016-12-12 2018-06-14 주식회사 포스코 고로 출선구 온도 측정 장치
CN113375757B (zh) * 2020-03-27 2022-12-02 洛森自动化科技（上海）有限公司 一种应用曲线模拟和核辐射原理测量物位的方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW323333B (enrdf_load_stackoverflow) * 1994-05-30 1997-12-21 Nippon Kokan Kk
TW455676B (en) * 1998-03-18 2001-09-21 Applied Materials Inc Method and apparatus for measuring substrate temperatures
CN103411684A (zh) * 2013-07-17 2013-11-27 中微半导体设备(上海)有限公司 测量反应腔室内薄膜温度的方法
CN103604507A (zh) * 2013-11-25 2014-02-26 国家电网公司 一种用于在线监测gis罐体内部导体温升的方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2365659Y (zh) * 1999-04-07 2000-02-23 何民才 多色比色温度仪
CN102749141A (zh) * 2012-07-30 2012-10-24 中国科学院自动化研究所 一种测量目标真实温度的辐射测温方法和仪器
CN103439003B (zh) * 2013-09-03 2016-08-31 重庆大学 一种提高红外测温精度的方法
CN103604504B (zh) * 2013-10-15 2016-06-29 中国人民解放军海军工程大学 一种红外辐射精确测温方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW323333B (enrdf_load_stackoverflow) * 1994-05-30 1997-12-21 Nippon Kokan Kk
TW455676B (en) * 1998-03-18 2001-09-21 Applied Materials Inc Method and apparatus for measuring substrate temperatures
CN103411684A (zh) * 2013-07-17 2013-11-27 中微半导体设备(上海)有限公司 测量反应腔室内薄膜温度的方法
CN103604507A (zh) * 2013-11-25 2014-02-26 国家电网公司 一种用于在线监测gis罐体内部导体温升的方法

Also Published As

Publication number Publication date
TW201600838A (zh) 2016-01-01
CN105333962B (zh) 2018-06-22
CN105333962A (zh) 2016-02-17

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