TWI487877B - - Google Patents

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Publication number
TWI487877B
TWI487877B TW103136416A TW103136416A TWI487877B TW I487877 B TWI487877 B TW I487877B TW 103136416 A TW103136416 A TW 103136416A TW 103136416 A TW103136416 A TW 103136416A TW I487877 B TWI487877 B TW I487877B
Authority
TW
Taiwan
Application number
TW103136416A
Other languages
Chinese (zh)
Other versions
TW201616092A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW103136416A priority Critical patent/TW201616092A/en
Application granted granted Critical
Publication of TWI487877B publication Critical patent/TWI487877B/zh
Publication of TW201616092A publication Critical patent/TW201616092A/en

Links

TW103136416A 2014-10-22 2014-10-22 Method for measuring three-dimensional shape of object TW201616092A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW103136416A TW201616092A (en) 2014-10-22 2014-10-22 Method for measuring three-dimensional shape of object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW103136416A TW201616092A (en) 2014-10-22 2014-10-22 Method for measuring three-dimensional shape of object

Publications (2)

Publication Number Publication Date
TWI487877B true TWI487877B (en) 2015-06-11
TW201616092A TW201616092A (en) 2016-05-01

Family

ID=53937859

Family Applications (1)

Application Number Title Priority Date Filing Date
TW103136416A TW201616092A (en) 2014-10-22 2014-10-22 Method for measuring three-dimensional shape of object

Country Status (1)

Country Link
TW (1) TW201616092A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI630367B (en) * 2016-09-28 2018-07-21 日商Ｃｋｄ股份有限公司 Three-dimensional measuring device
TWI633277B (en) * 2016-05-26 2018-08-21 日商Ｃｋｄ股份有限公司 Three-dimensional measuring device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6559931B2 (en) * 2001-02-08 2003-05-06 Nkk Corporation Three-dimensional (3-D) coordinate measuring method, 3-D coordinate measuring apparatus, and large-structure building method
TWI267037B (en) * 2004-10-14 2006-11-21 Univ Nat Taipei Technology Method of three-dimensional surface shape measurement by using encoded datum points
US7724379B2 (en) * 2005-05-12 2010-05-25 Technodream21, Inc. 3-Dimensional shape measuring method and device thereof
TW201120400A (en) * 2009-12-11 2011-06-16 Ming-Hsiang Shih Device and method for non-contact measurement of space coordinates for objects

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6559931B2 (en) * 2001-02-08 2003-05-06 Nkk Corporation Three-dimensional (3-D) coordinate measuring method, 3-D coordinate measuring apparatus, and large-structure building method
TWI267037B (en) * 2004-10-14 2006-11-21 Univ Nat Taipei Technology Method of three-dimensional surface shape measurement by using encoded datum points
US7724379B2 (en) * 2005-05-12 2010-05-25 Technodream21, Inc. 3-Dimensional shape measuring method and device thereof
TW201120400A (en) * 2009-12-11 2011-06-16 Ming-Hsiang Shih Device and method for non-contact measurement of space coordinates for objects

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI633277B (en) * 2016-05-26 2018-08-21 日商Ｃｋｄ股份有限公司 Three-dimensional measuring device
TWI630367B (en) * 2016-09-28 2018-07-21 日商Ｃｋｄ股份有限公司 Three-dimensional measuring device

Also Published As

Publication number Publication date
TW201616092A (en) 2016-05-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees