TWI478198B - Ion guns and the grid used - Google Patents

Ion guns and the grid used Download PDF

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TWI478198B
TWI478198B TW099130657A TW99130657A TWI478198B TW I478198 B TWI478198 B TW I478198B TW 099130657 A TW099130657 A TW 099130657A TW 99130657 A TW99130657 A TW 99130657A TW I478198 B TWI478198 B TW I478198B
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grid
ion gun
ion
accelerating electrode
curved surface
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TW201137916A (en
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Tadahisa Shiono
Makoto Ito
Yusuke Osada
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Showa Shinku Kk
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Description

離子槍及其所使用的柵網Ion gun and the grid used

本發明係關於離子槍,尤其關於從電漿引出離子束之加速柵網及使用其之離子槍。The present invention relates to ion guns, and more particularly to an accelerating grid for extracting an ion beam from a plasma and an ion gun using the same.

第11圖係顯示以往的離子槍100的構成。離子槍100,係具備:於內部產生電漿之本體110、設置有多數個柵網孔之遮蔽柵網121及加速柵網122(將此等統稱為柵網120)、安裝在本體110之支撐座112、以及將加速柵網122固定在支撐座112之螺絲140。從電源(圖中未顯示)被施加電壓之加速柵網122,係從本體110內部的電漿引出離子,藉此使離子束(箭頭)射出。該離子束被照射在壓電元件(圖中未顯示)等,而使用於該壓電元件的頻率調整等(例如參照專利文獻1)。Fig. 11 shows the configuration of a conventional ion gun 100. The ion gun 100 includes a body 110 for generating plasma therein, a shield grid 121 provided with a plurality of grid holes, and an acceleration grid 122 (referred to collectively as the grid 120), and is mounted on the support of the body 110. The seat 112 and the screw 140 that fixes the acceleration grid 122 to the support base 112. The accelerating grid 122 to which a voltage is applied from a power source (not shown) extracts ions from the plasma inside the body 110, thereby emitting an ion beam (arrow). The ion beam is applied to a piezoelectric element (not shown) or the like, and is used for frequency adjustment of the piezoelectric element (for example, see Patent Document 1).

第11圖所示之柵網120為平面狀,但以提高離子束的收斂性者為目的而將柵網120彎曲之構成,乃為人所知。例如在專利文獻2中,係揭示一種以朝本體(離子源5)側凹陷之方式彎曲之柵網(電極8),專利文獻3中,亦揭示一種以朝本體(符號5)側凹陷之方式彎曲之柵網(複數個板7)。將此等柵網稱為半管型柵網。Although the grid 120 shown in Fig. 11 has a planar shape, it is known that the grid 120 is bent for the purpose of improving the convergence of the ion beam. For example, in Patent Document 2, a grid (electrode 8) which is curved so as to be recessed toward the body (ion source 5) side is disclosed, and Patent Document 3 also discloses a method of recessing toward the side of the body (symbol 5). Curved grid (plurality of plates 7). These grids are referred to as half-tube grids.

[先前技術文獻][Previous Technical Literature]

[專利文獻1]日本特許第4048254號公報[Patent Document 1] Japanese Patent No. 4048254

[專利文獻2]日本特開平4-6272號公報[Patent Document 2] Japanese Patent Laid-Open No. 4-6272

[專利文獻3]日本實開昭63-18746號公報[Patent Document 3] Japanese Unexamined Gazette No. 63-18746

然而,使用以往的半管型柵網之離子槍,乃具有下列問題點。However, the ion gun using the conventional half-tube type grid has the following problems.

第1,專利文獻2及3,均是在柵網製造時將平面柵網板朝單一方向進行彎曲加工,然後再安裝在本體,但如此難以確保彎曲加工的精度,於該彎曲度中容易產生加工不均。離子槍中,柵網為消耗品且相對頻繁地被更換,但由於該彎曲加工不均,而具有每次柵網更換時,該射出離子束的特性會產生變化之問題。因此,以往的半管型柵網中,由於該彎曲加工不均,而具有射出離子束的重現性差之問題。First, in Patent Documents 2 and 3, in the manufacture of the grid, the planar grid plate is bent in a single direction and then mounted on the body, but it is difficult to ensure the accuracy of the bending process, and it is easy to generate in the curvature. Uneven processing. In the ion gun, the grid is consumables and is replaced relatively frequently. However, due to the uneven bending process, there is a problem that the characteristics of the emitted ion beam change each time the grid is replaced. Therefore, in the conventional half pipe type grid, since the bending process is uneven, there is a problem that the reproducibility of the emitted ion beam is poor.

第2,以往的離子槍的構成中(不論是專利文獻2及3的半管型或專利文獻1的平板型),加速柵網的形狀安定性差,並且從開始射出離子束後至輸出特性達到安定為止花費較多時間。亦即,在開始射出離子束後,當加速柵網的溫度上升時,由於熱膨脹所造成之變形,使柵網孔相對於其他構件之位置產生變化,因而必須等待至該變化達到安定為止(例如在專利文獻1中約15分鐘)才能開始使用離子槍(例如開始進行壓電元件的頻率調整之作業)。因此,由於形狀安定性差,而具有從射出離子束後至達到安定為止之間會浪費電力和等待時間之問題。Second, in the configuration of the conventional ion gun (the half tube type of Patent Documents 2 and 3 or the flat type of Patent Document 1), the shape stability of the acceleration grid is poor, and the output characteristics are obtained from the start of the ion beam emission. It takes a lot of time to settle down. That is, after the ion beam is started to be emitted, when the temperature of the acceleration grid rises, the deformation caused by the thermal expansion causes the position of the grid mesh to change with respect to other members, and thus it is necessary to wait until the change reaches the stability (for example, In the case of Patent Document 1, it takes about 15 minutes to start using the ion gun (for example, the operation of starting the frequency adjustment of the piezoelectric element). Therefore, since the shape stability is poor, there is a problem that power and waiting time are wasted from when the ion beam is emitted to when the stability is reached.

第3,如上述般,由於柵網為消耗品,所以離子槍的使用者必須預先保管多數片柵網。然而,如專利文獻2及3般之彎曲的柵網,該佔有體積較大,且在保管時為了不損及該彎曲狀態而須避免一次積載多數片柵網,故需準備寬廣的保管收納場所。因此,以往的半管型柵網亦具保管性差之問題。Third, as described above, since the grid is a consumable item, the user of the ion gun must store a plurality of grids in advance. However, in the grid which is curved as in Patent Documents 2 and 3, the occupied volume is large, and in order to prevent the bending state from being damaged during storage, it is necessary to avoid stacking a plurality of meshes at a time, so that it is necessary to prepare a wide storage and storage place. . Therefore, the conventional half pipe type grid also has a problem of poor storage.

因此,本發明之課題在於提供一種柵網更換時之輸出特性的重現性、伴隨著溫度變化之形狀安定性、以及保管性佳之半管型柵網,以及具備其之離子槍。Accordingly, an object of the present invention is to provide a half-tube type grid having reproducibility of output characteristics at the time of grid replacement, shape stability with temperature change, and good storage stability, and an ion gun including the same.

本發明之第1型態為一種離子槍,亦即具備有:於內部產生電漿之本體、用以從本體內部引出電漿之柵網、及將柵網夾持在與本體之間之框狀的加速電極;本體之與柵網相對向的端面,具有山谷狀的彎曲面;柵網,為以在本體與柵網之密接面上形成為與彎曲面一致之曲面之方式所裝著的平板柵網之離子槍。The first aspect of the present invention is an ion gun, that is, a body that generates plasma inside, a grid for extracting plasma from the inside of the body, and a grid between the body and the body. a frame-shaped accelerating electrode; an end surface of the body opposite to the grid has a valley-shaped curved surface; and the grid is mounted by a curved surface formed on the close surface of the body and the grid to conform to the curved surface The ion gun of the flat grid.

本發明之第2型態為一種離子槍,亦即具備有:於內部產生電漿之本體、用以從本體內部引出電漿之柵網、及將柵網夾持在與本體之間之框狀的加速電極;加速電極之與柵網相對向的端面,具有山峰狀的彎曲面;柵網,為以在加速電極與柵網之密接面上形成為與彎曲面一致之曲面之方式所裝著的平板柵網之離子槍。The second aspect of the present invention is an ion gun, that is, a body that generates plasma inside, a grid for extracting plasma from the inside of the body, and a grid between the body and the body. a frame-shaped accelerating electrode; an end surface of the accelerating electrode facing the grid has a mountain-like curved surface; and the grid is formed by a curved surface conforming to the curved surface on the adhesion surface between the accelerating electrode and the grid Ion gun with a flat grid.

本發明之第3型態為一種離子槍,亦即具備有:於內部產生電漿之本體、用以從本體內部引出電漿之柵網、及將柵網固定在本體之固定具;本體之與柵網相對向的端面,具有山谷狀的彎曲面;柵網,為以在本體與柵網之密接面上形成為與彎曲面一致之曲面之方式所裝著的平板柵網之離子槍。The third aspect of the present invention is an ion gun, that is, a body having a plasma generated therein, a grid for extracting plasma from the inside of the body, and a fixture for fixing the grid to the body; The end face opposite to the grid has a valley-shaped curved surface; the grid is an ion gun of a flat grid mounted on a surface of the body and the mesh which is formed to conform to the curved surface .

本發明之第4型態為一種離子槍,其係將柵網孔從柵網的一端連續地形成至相對向的另一端為止,將柵網在垂直於前述連續地形成之柵網孔之方向上彎曲。此外,第4型態之離子槍柵網,較佳是與僅於離子束有效區域呈開口之遮蔽板組合使用。柵網可在列方向上被彎曲。A fourth aspect of the present invention is an ion gun in which a grid mesh is continuously formed from one end of the grid to the opposite end, and the grid is oriented perpendicular to the continuously formed grid mesh. Bend up. Further, the ion gun grid of the fourth type is preferably used in combination with a shielding plate which is open only in the effective area of the ion beam. The grid can be bent in the column direction.

上述第1型態至第4型態之離子槍,可將柵網的柵網孔平行地配置在排列配置成矩陣狀之壓電元件的行方向上,以行單位將離子束照射在列方向上所搬運之壓電元件,並以壓電元件的共振頻率進行離子蝕刻。In the ion gun of the first type to the fourth type, the grid holes of the grid may be arranged in parallel in the row direction of the piezoelectric elements arranged in a matrix, and the ion beam may be irradiated in the column direction in units of rows. The transferred piezoelectric element is ion-etched at the resonant frequency of the piezoelectric element.

上述第1型態至第4型態中所使用之柵網,該材質由鉬所構成,厚度較佳為200μm~20μm,尤佳為150μm~50μm。The grid used in the first to fourth modes described above is made of molybdenum and has a thickness of preferably 200 μm to 20 μm, particularly preferably 150 μm to 50 μm.

實施例1.Example 1.

第1圖以及第2圖A及第2圖B係顯示本發明的第1實施例之離子槍1。第1圖為離子槍1的分解立體圖,第2圖A為側視圖,第2圖B為上方圖。各圖面及以下實施例所示之圖面並非如比例尺所描繪,而是以加強說明之型態來顯示。Fig. 1 and Fig. 2A and Fig. 2B show an ion gun 1 according to a first embodiment of the present invention. Fig. 1 is an exploded perspective view of the ion gun 1. Fig. 2A is a side view, and Fig. 2B is an upper view. The drawings and the drawings shown in the following embodiments are not depicted as scales, but are shown in an enhanced description.

離子槍1,具備有:於內部產生電漿之本體10、用以從本體10的內部引出電漿之柵網20、以及將柵網20夾持在與本體10之間之框狀(環狀)的加速電極30,本體10之與柵網20相對向的端面,具有山谷狀的彎曲面。加速柵網22經由加速電極30從電源50被施加電壓,並藉由該多數個柵網孔從電漿引出離子。藉此使離子束(箭頭)射出。該離子束被照射在壓電元件(圖中未顯示)等,而使用於該壓電元件的頻率調整等,但其用途並不限定於此。The ion gun 1 is provided with a body 10 that internally generates plasma, a grid 20 for drawing plasma from the inside of the body 10, and a frame-like shape (ring-shaped) between the grid 20 and the body 10. The accelerating electrode 30, the end surface of the body 10 facing the grid 20, has a valley-shaped curved surface. The accelerating grid 22 is applied with a voltage from the power source 50 via the accelerating electrode 30, and ions are extracted from the plasma by the plurality of grid holes. Thereby, the ion beam (arrow) is emitted. The ion beam is applied to a piezoelectric element (not shown) or the like, and is used for frequency adjustment or the like of the piezoelectric element. However, the use thereof is not limited thereto.

如第2圖A所示,本體10之柵網20側的端面11,係朝單一方向彎曲成山谷狀,加速電極30之柵網20側的端面31,以與端面11相同之曲率朝單一方向彎曲成山谷狀。亦即,端面11與端面31夾持柵網20並朝同一之單一方向彎曲。圖中,就說明上的簡便,係在端面11與遮蔽柵網21、及加速柵網22與端面31之間隔開間隙來顯示,但實際上此等係密著地配置。遮蔽柵網21及本體10被維持在遮蔽電位,加速柵網22及加速電極30被維持在加速電位,遮蔽柵網21與加速柵網22隔著既定間隔而配置。As shown in Fig. 2A, the end face 11 of the body 10 on the grid 20 side is curved in a valley shape in a single direction, and the end face 31 of the accelerating electrode 30 on the grid 20 side has the same curvature as the end face 11 in a single direction. Bend into a valley. That is, the end surface 11 and the end surface 31 sandwich the grid 20 and are bent in the same single direction. In the drawings, the above description is simple, and the gap between the end surface 11 and the shield grid 21, and the accelerating grid 22 and the end surface 31 is displayed with a gap therebetween, but these are actually arranged in close contact with each other. The shielding grid 21 and the body 10 are maintained at the shielding potential, the acceleration grid 22 and the acceleration electrode 30 are maintained at the acceleration potential, and the shielding grid 21 and the acceleration grid 22 are disposed at predetermined intervals.

如第2圖B所示,加速電極30在加速柵網22的中央部(柵網孔22a)上暴露出,並具有在該周緣部上固定柵網20之框狀(環狀)的形狀。As shown in FIG. 2B, the accelerating electrode 30 is exposed at the central portion (grid hole 22a) of the accelerating grid 22, and has a frame-like (annular) shape in which the grid 20 is fixed to the peripheral portion.

此外,由於加速電極30具有包圍離子束之構成,所以加速電極30可作用為靜電透鏡而提高離子束的收斂性。Further, since the accelerating electrode 30 has a configuration in which the ion beam is surrounded, the accelerating electrode 30 can function as an electrostatic lens to improve the convergence of the ion beam.

柵網20是由複數片柵網所構成,將本體10側者稱為遮蔽柵網21,將加速電極30側者稱為加速柵網22。在此,為了說明上的簡化,係顯示2片柵網21及22,但亦可重疊更多片的柵網。不論為何種情形,均將此等柵網統稱為柵網20。The grid 20 is composed of a plurality of grids, and the side of the body 10 is referred to as a shield grid 21, and the side of the accelerating electrode 30 is referred to as an acceleration grid 22. Here, for simplification of the description, two grids 21 and 22 are shown, but a plurality of grids may be overlapped. In any case, these grids are collectively referred to as grid 20.

第3圖係顯示柵網20中的1片柵網(裝著前)。第2圖A中,柵網20朝單一方向彎曲,相對於此,如第3圖所示,裝著前的柵網20呈平面。亦即,柵網20於製造時為平面,但在裝著於本體10時,係隨著端面11朝單一方向折彎,並藉由加速電極30所按壓。因此,即使柵網20與各專利文獻所示之柵網為相同材質(例如鉬),亦為較此等更薄之平板,例如該厚度較佳為200μm~20μm,尤佳為150μm~50μm。所謂裝著前的平面柵網,係意味著實質上為平坦的柵網,亦包含柵網的極少部分為不平坦,或是全體僅有極小程度的彎曲者。Fig. 3 shows a grid (in front of the mounting) in the grid 20. In Fig. 2A, the grid 20 is bent in a single direction. On the other hand, as shown in Fig. 3, the grid 20 before being mounted is flat. That is, the grid 20 is flat at the time of manufacture, but is attached to the body 10 as the end face 11 is bent in a single direction and pressed by the accelerating electrode 30. Therefore, even if the grid 20 is made of the same material (for example, molybdenum) as the grid shown in each patent document, it is a thinner plate, for example, the thickness is preferably 200 μm to 20 μm, and particularly preferably 150 μm to 50 μm. The so-called planar grid before installation means a grid that is substantially flat, and also contains a very small portion of the grid that is not flat, or that has only a minimal degree of curvature.

上述構成中,預先將柵網20製造成平板柵網,並且在裝著於本體10時(例如更換時),配合本體10的端面11將柵網20彎曲,藉此可排除柵網20的彎曲加工不均之重現性降低因素。因此,即使更換作為消耗品之柵網,亦可確保更換前後之射出離子束的重現性。In the above configuration, the grid 20 is previously manufactured as a flat grid, and when mounted on the body 10 (for example, at the time of replacement), the grid 20 is bent by fitting the end surface 11 of the body 10, whereby the bending of the grid 20 can be eliminated. Reduced reproducibility of processing unevenness. Therefore, even if the grid as a consumable is replaced, the reproducibility of the emitted ion beam before and after the replacement can be ensured.

此外,上述構成中,由於加速柵網22抵接於加速電極30,所以在開始射出離子束後,因熱膨脹所導致之柵網20的變形,僅成為沿著加速電極30的端面31之方向上的變形。同樣的,由於遮蔽柵網21抵接於本體10,故開始射出離子束後之熱膨脹所導致之柵網21的變形,僅會成為沿著本體10的端面11之方向上的變形。因此,相對於溫度上昇之形狀安定性佳,並且從開始射出離子束後至輸出達到安定為止所需時間較以往更為縮短。具體而言,即使在同一輸出功率,輸出安定所需時間在專利文獻1的例子中約15分鐘,相對於此,可確認到在本發明中約為3分鐘。Further, in the above configuration, since the acceleration grid 22 is in contact with the accelerating electrode 30, the deformation of the grid 20 due to thermal expansion after the ion beam is started to be emitted only in the direction along the end surface 31 of the accelerating electrode 30. The deformation. Similarly, since the shield grid 21 abuts against the body 10, the deformation of the grid 21 caused by the thermal expansion after the ion beam is emitted is only deformed in the direction along the end surface 11 of the body 10. Therefore, the shape stability with respect to the temperature rise is good, and the time required from the start of the ion beam emission until the output reaches the stability is shortened more than ever. Specifically, even at the same output power, the time required for output stabilization is about 15 minutes in the example of Patent Document 1, whereas it can be confirmed that it is about 3 minutes in the present invention.

再者,本發明之柵網20並非彎曲板,而是作為平板來製造並保管,因此在裝著前容易進行柵網20的處理。尤其平板的柵網20在保管時可進行積載,故可達到保管場所的省空間化,其保管性佳。Further, since the grid 20 of the present invention is not a curved plate but is manufactured and stored as a flat plate, the treatment of the mesh 20 is facilitated before being mounted. In particular, the grid 20 of the flat plate can be stowed during storage, so that the storage space can be saved, and the storage property is good.

實施例2.Example 2.

第4圖A及第4圖B係依循製造工序來顯示本發明的第2實施例之離子槍2。本實施例中,與實施例1相同,所使用之柵網20均為平板柵網20,但用以讓各固定具等通過之孔的位置有所不同。4A and 4B show the ion gun 2 of the second embodiment of the present invention in accordance with the manufacturing process. In the present embodiment, as in the first embodiment, the grids 20 used are all the flat grids 20, but the positions of the holes through which the fixtures and the like pass are different.

第4圖A中,遮蔽柵網21藉由固定具(例如螺絲)41被固定在本體10的端面11,加速柵網22藉由固定具(例如螺絲)42被固定在加速電極30的端面31。在此,本體10的構成基本上與實施例1相同,但就電極支撐座12設置在本體10的一部分之點,以及螺孔的構成有所不同。此外,加速電極30的構成基本上亦與實施例1相同,但就設置有用於電極支撐座12之凹部32之點,以及螺孔的構成有所不同。電極支撐座12與本體10形成電絕緣,並從電源50被施加電壓。同圖中雖然省略,但電極支撐座12在本體10的周緣上配置有複數根,並已上端來支撐加速電極30。藉由電極支撐座12,使遮蔽柵網21及加速柵網22一邊保持柵網間距離並具有電位差來配置。柵網間距離可藉由電極支撐座12的高度及凹部32的形狀來調整。In FIG. 4A, the shield grid 21 is fixed to the end surface 11 of the body 10 by a fixture (for example, a screw) 41, and the acceleration grid 22 is fixed to the end surface 31 of the accelerating electrode 30 by a fixture (for example, a screw) 42. . Here, the configuration of the body 10 is basically the same as that of the first embodiment, but the electrode support base 12 is provided at a point of a part of the body 10, and the configuration of the screw holes is different. Further, the configuration of the accelerating electrode 30 is basically the same as that of the first embodiment, but the point for the concave portion 32 of the electrode supporting base 12 is provided, and the configuration of the screw hole is different. The electrode support 12 is electrically insulated from the body 10 and is applied with a voltage from the power source 50. Although omitted in the same figure, the electrode holder 12 is provided with a plurality of roots on the periphery of the body 10, and has an upper end to support the accelerating electrode 30. The shield grid 21 and the accelerating grid 22 are disposed by the electrode holder 12 while maintaining the distance between the grids and having a potential difference. The grid distance can be adjusted by the height of the electrode support 12 and the shape of the recess 32.

第4圖B中,本體10及遮蔽柵網21與加速電極30及加速柵網22,係以使電極支撐座12收斂於凹部32內之方式來安裝,並藉由固定具(例如螺絲)43來固定此等。同圖中,為了圖面的明瞭化,係省略固定具41及42。如第4圖C所示,亦可使用固定具42將柵網20直接固定在加速電極30,並藉由固定具43來固定加速電極30與本體10。於遮蔽柵網21與加速柵網22之間,配置有由絕緣材料所構成之間隔材。In FIG. 4B, the body 10 and the shielding grid 21, the acceleration electrode 30 and the acceleration grid 22 are mounted such that the electrode holder 12 converges in the recess 32, and are fixed by a fixture (for example, a screw) 43. To fix this. In the same figure, the fixing members 41 and 42 are omitted for the sake of clarity of the drawing. As shown in FIG. 4C, the grid 20 can also be directly fixed to the accelerating electrode 30 using the fixture 42, and the accelerating electrode 30 and the body 10 can be fixed by the fixture 43. A spacer made of an insulating material is disposed between the shielding grid 21 and the acceleration grid 22.

實施例3.Example 3.

實施例3中,係顯示未使用加速電極30之構成作為實施例1的變形例。In the third embodiment, a configuration in which the accelerating electrode 30 is not used is shown as a modification of the first embodiment.

第5圖係顯示本實施例的離子槍3之側視圖。如圖示般,柵網20係使用固定具44被直接固定在本體10。藉由適切地配置固定具44,即使不使用加速電極30,亦可配合本體10的彎曲來固定柵網20。Fig. 5 is a side view showing the ion gun 3 of the present embodiment. As shown, the grid 20 is directly secured to the body 10 using fixtures 44. By arranging the fixture 44 appropriately, the grid 20 can be fixed in accordance with the bending of the body 10 even without using the accelerating electrode 30.

此時,係成為從電源50將電壓直接施加於加速柵網22之構成。At this time, the voltage is directly applied from the power source 50 to the acceleration grid 22.

上述構成中,雖然不易獲得加速柵網所帶來之效果(亦即優秀的形狀安定性、靜電透鏡作用等),但與實施例1及2相同,即使更換作為消耗品之柵網,亦可確保更換前後之射出離子束的重現性,柵網的保管性亦佳。In the above configuration, although it is difficult to obtain the effect of the acceleration grid (that is, excellent shape stability, electrostatic lens action, etc.), as in the first and second embodiments, even if the grid as a consumable is replaced, Ensure the reproducibility of the outgoing ion beam before and after replacement, and the storage of the grid is also good.

實施例4.Example 4.

第6圖至第9圖係顯示本發明的第4實施例之離子槍4。第6圖A為側視圖,第6圖B為前視圖,第6圖C為上方圖。6 to 9 show an ion gun 4 of a fourth embodiment of the present invention. Fig. 6A is a side view, Fig. 6B is a front view, and Fig. 6C is an upper view.

離子槍4為第1實施例所示之離子槍,其特徵為本體60、柵網70、以及框狀的加速電極80為矩形。除了形狀及柵網70之外,其他構成與第1實施例相同,故省略該說明。此外,離子槍4可使用第2實施例所示之柵網的固定手段,亦可如第3實施例所示般地省略加速電極80。矩形的離子槍,當同時對直線狀地排列配置之複數個壓電元件進行頻率調整時為有效,但用途並不限於此。The ion gun 4 is an ion gun shown in the first embodiment, and is characterized in that the main body 60, the grid 70, and the frame-shaped accelerating electrode 80 have a rectangular shape. The configuration other than the shape and the grid 70 is the same as that of the first embodiment, and thus the description thereof is omitted. Further, the ion gun 4 can use the fixing means of the grid shown in the second embodiment, and the acceleration electrode 80 can be omitted as shown in the third embodiment. The rectangular ion gun is effective when frequency adjustment is performed on a plurality of piezoelectric elements arranged in a line, but the use is not limited thereto.

如第6圖A所示,本體60之柵網70側的端面61,係朝單一方向(同圖中為矩形的短邊方向)彎曲成山谷狀,加速電極80之柵網70側的端面81,以與端面61相同之曲率朝與端面61相同之方向彎曲成山谷狀。此外,於遮蔽柵網71及加速柵網72,沿著矩形的一邊形成有複數個柵網孔71a、72a。同圖中,柵網孔71a、72a係在矩形的短邊方向中央部分上,沿著長邊形成有複數個,而獲得平行於長邊之帶狀的離子束照射區。實施例中,由於並非在柵網全體,而是僅在短邊方向中央部上形成有孔,所以可使強度大的短邊方向兩端部密著於本體及加速電極,而容易將柵網板配合於本體及加速電極的曲率。此外,由於面積較大的短邊方向兩端部密著於本體及加速電極,所以熱傳遞較大,不易產生因熱膨脹所造成之變形。As shown in Fig. 6A, the end face 61 of the body 70 on the grid 70 side is curved in a valley shape in a single direction (the short side direction of the rectangle in the figure), and the end face 81 of the accelerating electrode 80 on the grid 70 side. The same curvature as the end surface 61 is curved in a valley shape in the same direction as the end surface 61. Further, in the shield grid 71 and the accelerating grid 72, a plurality of grid holes 71a, 72a are formed along one side of the rectangle. In the same figure, the grid holes 71a, 72a are formed in the central portion of the short side direction of the rectangle, and a plurality of strips are formed along the long sides to obtain a strip-shaped ion beam irradiation region parallel to the long sides. In the embodiment, since the hole is formed not only in the entire grid but also in the central portion in the short-side direction, both ends in the short-side direction with high strength can be adhered to the body and the accelerating electrode, and the grid can be easily formed. The plate is fitted to the curvature of the body and the accelerating electrode. Further, since both ends in the short-side direction having a large area are adhered to the body and the accelerating electrode, heat transfer is large, and deformation due to thermal expansion is less likely to occur.

第7圖係顯示加速電極80與加速柵網72之分解立體圖。由於藉由彎曲地形成之本體60及加速電極80的周緣部來固定柵網70,所以其重現性及形狀安定性佳、以及包圍離子束之加速電極80可作用為靜電透鏡而提高離子束的收斂性之效果,係與第1實施例相同。Fig. 7 is an exploded perspective view showing the accelerating electrode 80 and the accelerating grid 72. Since the grid 70 is fixed by the curved body portion 60 and the peripheral portion of the accelerating electrode 80, the reproducibility and shape stability are excellent, and the accelerating electrode 80 surrounding the ion beam acts as an electrostatic lens to increase the ion beam. The effect of the convergence is the same as that of the first embodiment.

第8圖係顯示柵網70的其他實施例之分解立體圖。加速柵網73的特徵,在於使柵網孔從柵網的一端連續地形成至相對向的另一端,並且在平行於柵網的一端及另一端之方向上將柵網彎曲。第7圖中,由於板的強度在有柵網孔之處與無柵網孔之處有所不同,故有時無法成為均一曲率,但在第8圖中,藉由設置柵網孔至柵網板的邊緣為止並以遮蔽板75來覆蓋,可使板的強度一致而容易獲得均一曲率。離子束的有效區域是由遮蔽板75的開口形狀所決定,所以開口可形成為僅使期望的區域暴露出。遮蔽板75的開口較加速電極80的開口更小,因此離子僅會從由遮蔽板75的開口所暴露出之柵網孔被引出。藉由成組地使用在外緣形成有孔之柵網板與遮蔽板,可一邊獲得均一曲率並抑制離子束從有效區域外被引出。Figure 8 is an exploded perspective view showing another embodiment of the grid 70. The accelerating grid 73 is characterized in that the grid mesh is continuously formed from one end of the grid to the opposite end, and the grid is bent in a direction parallel to one end and the other end of the grid. In Fig. 7, since the strength of the plate differs from the place where there is no mesh in the mesh hole, it may not be uniform curvature, but in Fig. 8, by providing the mesh hole to the gate The edge of the stencil is covered with a shielding plate 75, so that the strength of the slab can be made uniform and a uniform curvature can be easily obtained. The effective area of the ion beam is determined by the shape of the opening of the shielding plate 75, so the opening can be formed to expose only the desired area. The opening of the shielding plate 75 is smaller than the opening of the accelerating electrode 80, so ions are only taken out from the mesh holes exposed by the opening of the shielding plate 75. By using a grid plate and a shielding plate having a hole formed in the outer edge in groups, it is possible to obtain a uniform curvature while suppressing the ion beam from being taken out from the effective area.

遮蔽板75係安裝在加速柵網73的本體60側,但亦可在加速柵網73的加速電極80側密著於加速柵網來安裝。此外,遮蔽板75亦可非其他構件,而是與離子槍本體60構成為一體構造。不論在柵網上的任意位置上,均於柵網彎曲方向中央部形成有開口,故可將柵網的曲率整合在垂直於彎曲方向之方向上的各位置。藉此,與第7圖所示之加速柵網72相比,乃具有可增加加速柵網73的板厚之優點。柵網的板厚較厚時,可達到柵網的長壽命化。此外,實施例中係使用方形的柵網,但將孔形成至柵網板的外緣為止者,對於圓形、橢圓形之其他形狀的柵網亦為有效。尤其是圓形或橢圓形的柵網板且僅在中央部形成有孔時,雖然端部的彎曲加工需使用較強力道,但可藉由在端部上形成孔來消除端部與中央部的差,而獲得均一曲率。不論是何種形狀,只需使柵網孔從柵網的一端連續地形成至相對向的另一端,並且在垂直於連續形成的柵網孔之方向上將柵網彎曲即可。The shielding plate 75 is attached to the main body 60 side of the accelerating grid 73, but may be attached to the accelerating grid on the side of the accelerating electrode 80 of the accelerating grid 73. Further, the shielding plate 75 may be formed integrally with the ion gun body 60 instead of other members. An opening is formed in the center portion of the grid bending direction at any position on the grid, so that the curvature of the grid can be integrated at each position in the direction perpendicular to the bending direction. Thereby, compared with the accelerating grid 72 shown in FIG. 7, there is an advantage that the thickness of the accelerating grid 73 can be increased. When the thickness of the grid is thick, the life of the grid can be extended. Further, in the embodiment, a square grid is used, but the hole is formed to the outer edge of the grid plate, and is also effective for a grid of other shapes of a circular shape or an elliptical shape. In particular, when a circular or elliptical grid plate is formed with a hole only in the central portion, although the end portion is bent to use a stronger force, the end portion and the central portion can be eliminated by forming a hole in the end portion. The difference is obtained while obtaining a uniform curvature. Regardless of the shape, it is only necessary to form the mesh holes continuously from one end of the grid to the opposite end, and to bend the grid in a direction perpendicular to the continuously formed grid holes.

第9圖係顯示柵網70的其他實施例之分解立體圖。加速柵網74,係將藉由遮蔽板75所遮蔽之部分形成為狹縫狀。可獲得均一曲率之效果與第8圖者為相同,但可藉由分開離子引出孔與狹縫,可使離子束有效區域與遮蔽區域之交界變得明顯而更易區分。Figure 9 is an exploded perspective view showing another embodiment of the grid 70. The accelerating grid 74 is formed in a slit shape by a portion shielded by the shielding plate 75. The effect of obtaining a uniform curvature is the same as that of Fig. 8, but by separating the ion extraction holes and the slits, the boundary between the effective area of the ion beam and the shielding area can be made clear and more easily distinguished.

當使用第6圖所示之矩形的離子槍4時,能夠以行單位依序對例如第10圖所示之排列配置成矩陣狀之列方向(同圖箭頭方向)上所搬運的壓電元件200進行頻率調整。第10圖A為俯視圖,第10圖B為剖面圖。離子槍4,相對於矩陣狀的壓電元件200,係以使長邊與行方向平行之方式來配置。離子槍4的柵網70朝短邊方向彎曲。柵網孔群之長邊方向的寬度及短邊方向的寬度(當使用第8圖及第9圖所示之柵網時,為遮蔽板75開口之縱向的寬度及橫向的寬度),只需配合同時進行調整之壓電元件200的行列數來調整。第10圖中,係將均一的離子束照射在1列壓電元件的全部。When the rectangular ion gun 4 shown in Fig. 6 is used, the piezoelectric elements carried in the matrix direction (the direction of the arrow in the same figure) in the order shown in Fig. 10 can be sequentially arranged in units of rows. 200 for frequency adjustment. Fig. 10A is a plan view, and Fig. 10B is a cross-sectional view. The ion gun 4 is disposed such that the long sides are parallel to the row direction with respect to the matrix piezoelectric element 200. The grid 70 of the ion gun 4 is bent in the short side direction. The width in the longitudinal direction of the grid hole group and the width in the short side direction (when the grid shown in Figs. 8 and 9 is used, the width of the opening of the shielding plate 75 and the width of the lateral direction) are only required. The number of rows and columns of the piezoelectric element 200 that is simultaneously adjusted is adjusted. In Fig. 10, a uniform ion beam is irradiated onto all of the piezoelectric elements of one column.

如第10圖C所示,當離子槍的柵網為平面時,照射對象之工件(壓電元件200)與離子槍之間的距離d1愈大,離子束愈發散而使蝕刻速率降低,為了確保蝕刻速率,必須縮小壓電元件200與離子槍100之間的距離d1。然而,當距離變小時,遮罩202和快門201的濺鍍物會堆積於離子槍及其周邊並剝離,而產生由濺鍍物所造成之柵網間的短路等問題。As shown in FIG. 10C, when the grid of the ion gun is a flat surface, the larger the distance d1 between the workpiece to be irradiated (piezoelectric element 200) and the ion gun, the more the ion beam is scattered and the etching rate is lowered. In order to secure the etching rate, the distance d1 between the piezoelectric element 200 and the ion gun 100 must be reduced. However, as the distance becomes smaller, the spatter of the mask 202 and the shutter 201 may accumulate on the ion gun and its periphery and peel off, causing problems such as short circuit between the grids caused by the sputter.

相對於此,本發明之離子槍,是將柵網彎曲以使離子束收斂,故可增加壓電元件200與離子槍4之間的距離d2並獲得同等的蝕刻速率。由於距離d2愈大,濺鍍物對離子槍本體之堆積率愈可減少,所以可延長裝置的平均故障間隔時間(MTBF:Mean Time Between Failures)。藉由將離子槍4裝載於第10圖A、第10圖B所示之頻率調整裝置,可進行重現性佳之頻率調整。再者,藉由使用第8圖及第9圖所示之柵網70,更可提升頻率調整精度。On the other hand, in the ion gun of the present invention, the grid is bent to converge the ion beam, so that the distance d2 between the piezoelectric element 200 and the ion gun 4 can be increased and an equivalent etching rate can be obtained. As the distance d2 is larger, the deposition rate of the sputter to the ion gun body can be reduced, so that the mean time between failures (MTBF: Mean Time Between Failures) can be extended. By charging the ion gun 4 to the frequency adjustment device shown in Figs. 10A and 10B, it is possible to perform frequency adjustment with good reproducibility. Furthermore, by using the grid 70 shown in Figs. 8 and 9, the frequency adjustment accuracy can be improved.

上述各實施例係顯示本發明之最佳形態,但上述亦可變更如下。Each of the above embodiments shows the best mode of the present invention, but the above may be changed as follows.

(1)上述各實施例中,係將柵網20構成為圓板或矩形板,但只要能夠以沿著本體10的端面11或加速電極30的端面31之方式朝單一方向彎曲並予以固定者即可,亦可為例如橢圓形、正方形等。(1) In the above embodiments, the grid 20 is configured as a circular plate or a rectangular plate, but it can be bent and fixed in a single direction along the end surface 11 of the body 10 or the end surface 31 of the acceleration electrode 30. It may be, for example, an ellipse, a square, or the like.

(2)此外,本發明中,表現出加速電極的形態之所謂的「框狀」,亦包含至少具有外緣與內緣,且該外緣或內緣為圓形、橢圓、矩形、其他多角形等之形狀。(2) Further, in the present invention, the so-called "frame shape" which exhibits the form of the accelerating electrode also includes at least an outer edge and an inner edge, and the outer or inner edge is circular, elliptical, rectangular, and the like. The shape of the angle and the like.

(3)實施例1及4中,係使用固定具40、90作為將加速電極30、80及柵網20、70固定在本體10、60之手段,但(如各圖所示之於上下方向上使用時)亦可增加加速電極30、80本身的重量或是在該上部放置砝碼等,來省略固定具40。(3) In the first and fourth embodiments, the fixing tools 40 and 90 are used as means for fixing the accelerating electrodes 30 and 80 and the grids 20 and 70 to the main bodies 10 and 60, but (as shown in the respective figures in the up and down direction) When it is used, the weight of the accelerating electrodes 30 and 80 itself may be increased or a weight or the like may be placed on the upper portion to omit the fixture 40.

(4)上述實施例1、2及4中,係顯示加速電極30、80作為用以將柵網20夾持在與本體10之間之構件,但該構件只要是與加速電極30、80為相同形狀者,則亦可不為電極。此時,與第5圖的情況相同,必須是將電壓直接施加於加速柵網22之構成。(4) In the above-described first, second, and fourth embodiments, the accelerating electrodes 30 and 80 are shown as members for sandwiching the grid 20 between the body 10, but the members are only the accelerating electrodes 30 and 80. If the shape is the same, it may not be an electrode. At this time, as in the case of Fig. 5, it is necessary to directly apply a voltage to the acceleration grid 22.

(5)上述實施例2中,係使用電極支撐座來保持柵網間距離,但亦可將由絕緣材料所構成之間隔材等插入於電極間並予以固定。(5) In the second embodiment, the electrode support is used to maintain the distance between the grids. However, a spacer made of an insulating material or the like may be inserted between the electrodes and fixed.

1、2、3、4...離子槍1, 2, 3, 4. . . Ion gun

10、60...本體10, 60. . . Ontology

11、61...端面11, 61. . . End face

12...電極支撐座12. . . Electrode support

20、70...柵網20, 70. . . Grid

21、71...遮蔽柵網21, 71. . . Shielding grid

22、72~74...加速柵網22, 72~74. . . Acceleration grid

75...遮蔽板75. . . Masking board

30、80...加速電極30, 80. . . Acceleration electrode

31、81‧‧‧端面31, 81‧‧‧ end face

32、82‧‧‧凹部32, 82‧‧‧ recess

40~44、90‧‧‧固定具40~44, 90‧‧‧ Fixtures

第1圖係顯示本發明的第1實施例之分解立體圖。Fig. 1 is an exploded perspective view showing a first embodiment of the present invention.

第2圖A係顯示本發明的第1實施例之側視圖。Fig. 2A is a side view showing a first embodiment of the present invention.

第2圖B係顯示本發明的第1實施例之上方圖。Fig. 2B is a top view showing the first embodiment of the present invention.

第3圖係顯示本發明的第1實施例中所使用之柵網之圖。Fig. 3 is a view showing a grid used in the first embodiment of the present invention.

第4圖A係顯示本發明的第2實施例之側視圖。Fig. 4A is a side view showing a second embodiment of the present invention.

第4圖B係顯示本發明的第2實施例之側視圖。Fig. 4B is a side view showing a second embodiment of the present invention.

第4圖C係顯示本發明的第2實施例之側視圖。Fig. 4C is a side view showing a second embodiment of the present invention.

第5圖係顯示本發明的第3實施例之圖。Fig. 5 is a view showing a third embodiment of the present invention.

第6圖A係顯示本發明的第4實施例之側視圖。Fig. 6A is a side view showing a fourth embodiment of the present invention.

第6圖B係顯示本發明的第4實施例之前視圖。Fig. 6B is a front view showing a fourth embodiment of the present invention.

第6圖C係顯示本發明的第4實施例之上方圖。Fig. 6C is a top view showing a fourth embodiment of the present invention.

第7圖係顯示本發明的第4實施例之分解立體圖。Fig. 7 is an exploded perspective view showing a fourth embodiment of the present invention.

第8圖係顯示本發明的第4實施例之分解立體圖。Fig. 8 is an exploded perspective view showing a fourth embodiment of the present invention.

第9圖係顯示本發明的第4實施例之分解立體圖。Fig. 9 is an exploded perspective view showing a fourth embodiment of the present invention.

第10圖A係顯示本發明的第4實施例之俯視圖。Fig. 10A is a plan view showing a fourth embodiment of the present invention.

第10圖B係顯示本發明的第4實施例之剖面圖。Fig. 10B is a cross-sectional view showing a fourth embodiment of the present invention.

第10圖C係顯示以往的離子槍之剖面圖。Fig. 10C is a cross-sectional view showing a conventional ion gun.

第11圖係顯示以往的離子槍的構成之圖。Fig. 11 is a view showing the configuration of a conventional ion gun.

1...離子槍1. . . Ion gun

10...本體10. . . Ontology

20...柵網20. . . Grid

21...遮蔽柵網twenty one. . . Shielding grid

22...加速柵網twenty two. . . Acceleration grid

30...加速電極30. . . Acceleration electrode

Claims (10)

一種離子槍,為具備有:於內部產生電漿之本體、及用以從該本體內部引出電漿之柵網之離子槍,其特徵為:具備有將該柵網夾持在與該本體之間之框狀的加速電極;該本體之與該柵網相對向的端面,具有山谷狀的彎曲面;該柵網,為以在該本體與該柵網之密接面上形成為與該彎曲面一致之曲面之方式所裝著的平板柵網;該柵網,於製造時為平面,但在裝著於該本體時,隨著該本體的該端面朝單一方向折彎。 An ion gun is provided with an ion gun which generates a plasma inside and a grid for extracting plasma from the inside of the body, and is characterized in that: the grid is clamped on the body a frame-shaped accelerating electrode; the end surface of the body opposite to the grid has a valley-shaped curved surface; the grid is formed to be curved with the surface of the body and the grid A flat grid mounted in a manner that conforms to a curved surface; the grid is planar when manufactured, but when mounted on the body, the end surface of the body is bent in a single direction. 如申請專利範圍第1項所述之離子槍,其中,離子引出孔係從該柵網的一端連續地形成至相對向的另一端為止;該柵網在垂直於前述連續地形成之離子引出孔之方向上被彎曲。 The ion gun of claim 1, wherein the ion extraction hole is continuously formed from one end of the grid to the opposite end; the grid is perpendicular to the continuous formed ion extraction hole It is bent in the direction. 如申請專利範圍第2項所述之離子槍,其中,在該柵網上安裝有僅於離子束有效區域呈開口之遮蔽板。 The ion gun of claim 2, wherein a shielding plate having an opening only in an effective area of the ion beam is mounted on the grid. 如申請專利範圍第1項所述之離子槍,其中,該柵網形成為方形。 The ion gun of claim 1, wherein the grid is formed in a square shape. 如申請專利範圍第1項所述之離子槍,其中,在排列配置成矩陣狀之壓電元件的行方向上平行地配置有該柵網的離子引出孔; 以行單位將離子束照射在列方向上所搬運之該壓電元件,並以該壓電元件的共振頻率進行離子蝕刻而構成。 The ion gun according to claim 1, wherein the ion extraction holes of the grid are arranged in parallel in a row direction of the piezoelectric elements arranged in a matrix; The piezoelectric element is irradiated with the ion beam in the column direction in a row unit, and is ion-etched at the resonance frequency of the piezoelectric element. 如申請專利範圍第5項所述之離子槍,其中,該柵網在前述列方向上被彎曲。 The ion gun of claim 5, wherein the grid is curved in the column direction. 一種離子槍,為具備有:於內部產生電漿之本體、及用以從該本體內部引出電漿之柵網之離子槍,其特徵為:具備有將該柵網夾持在與該本體之間之框狀的加速電極;該加速電極之與該柵網相對向的端面,具有山峰狀的彎曲面;該柵網,為以在該加速電極與該柵網之密接面上形成為與該彎曲面一致之曲面之方式所裝著的平板柵網;該柵網,於製造時為平面,但在裝著於該加速電極時,隨著該加速電極的該端面朝單一方向折彎。 An ion gun is provided with an ion gun which generates a plasma inside and a grid for extracting plasma from the inside of the body, and is characterized in that: the grid is clamped on the body a frame-shaped accelerating electrode; the end surface of the accelerating electrode facing the grid has a mountain-like curved surface; the grid is formed to be formed on the adhesion surface between the accelerating electrode and the grid a flat grid supported by the curved surface of the curved surface; the grid is planar when manufactured, but when mounted on the accelerating electrode, the end surface of the accelerating electrode is bent in a single direction . 一種離子槍,為具備有:於內部產生電漿之本體、及用以從該本體內部引出電漿之柵網之離子槍,其特徵為:具備有將該柵網固定在該本體之固定具;該本體之與該柵網相對向的端面,具有山谷狀的彎曲面;該柵網,為以在該本體與該柵網之密接面上形成為與該彎曲面一致之曲面之方式所裝著的平板柵網;該柵網,於製造時為平面,但在裝著於該本體時,隨 著該本體的該端面朝單一方向折彎。 An ion gun is provided with an ion gun which generates a plasma inside and a grid for extracting plasma from the inside of the body, and is characterized in that: the fixed gun is fixed to the body. The end surface of the body opposite to the grid has a valley-shaped curved surface; the grid is formed by a curved surface formed on the adhesion surface of the body and the grid to conform to the curved surface a mounted grid; the grid is flat during manufacture, but when mounted on the body, The end face of the body is bent in a single direction. 一種柵網,為申請專利範圍第1、7或8項中任一項所述之離子槍中所使用的柵網,其係由鉬(材質)所構成,且厚度為200μm~20μm。 A grid used in an ion gun according to any one of claims 1 to 7 or 8 which is composed of molybdenum (material) and has a thickness of 200 μm to 20 μm. 如申請專利範圍第9項所述之柵網,其中,厚度為150μm~50μm。The grid as described in claim 9 wherein the thickness is from 150 μm to 50 μm.
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