TWI475354B - Method and apparatus for performing clock extraction - Google Patents

Method and apparatus for performing clock extraction Download PDF

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TWI475354B
TWI475354B TW102114881A TW102114881A TWI475354B TW I475354 B TWI475354 B TW I475354B TW 102114881 A TW102114881 A TW 102114881A TW 102114881 A TW102114881 A TW 102114881A TW I475354 B TWI475354 B TW I475354B
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edge
frequency
analysis results
analysis
clock
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TW102114881A
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TW201348919A (en
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ying chen Lin
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Silicon Motion Inc
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用來進行時脈抽取之方法與裝置Method and apparatus for clock extraction

本發明係有關於符合通用序列匯流排(Universal Serial Bus,USB)3.0標準之電子裝置之控制,尤指一種用來進行時脈抽取(Clock Extraction)之方法以及相關裝置。The present invention relates to the control of electronic devices conforming to the Universal Serial Bus (USB) 3.0 standard, and more particularly to a method for performing Clock Extraction and related devices.

具備通用序列匯流排埠(Universal Serial Bus Port,USB Port)之可攜式電子裝置(例如:隨身碟、外接式硬碟機、符合一種或多種標準之記憶卡讀卡機)對使用者而言非常方便;因應使用者需求,市場上有許多相關產品可供選擇。Portable electronic devices with a Universal Serial Bus Port (USB Port) (eg, a flash drive, an external hard drive, a memory card reader that conforms to one or more standards) Very convenient; in response to user needs, there are many related products on the market to choose from.

依據相關技術,在該些可攜式電子裝置中需要設置某些類型的振盪器的狀況下,該些振盪器所導致的問題會一一浮現。例如:設置多個晶體振盪器會造成該可攜式電子裝置無法具備精巧的外型/大小。又例如:當該可攜式電子裝置可採用一個高精確度的壓控振盪器,會導致相關成本居高不下。因此,需要一種新穎的方法,以在不需要設置任何會妨礙降低成本或妨礙縮小外型/大小之振盪器的狀況下實現具備通用序列匯流排埠之電子裝置(例如通用序列匯流排大量儲存設備)。According to the related art, in the case where some types of oscillators need to be set in the portable electronic devices, the problems caused by the oscillators will appear one by one. For example, setting up multiple crystal oscillators can make the portable electronic device incapable of having a compact form factor/size. For another example, when the portable electronic device can adopt a high-accuracy voltage-controlled oscillator, the related cost is high. Therefore, there is a need for a novel method for implementing an electronic device having a universal serial bus bar (such as a universal serial bus mass storage device) without setting any oscillator that would hinder cost reduction or hinder the reduction of the size/size. ).

本發明之一目的在於提供一種用來進行時脈抽取(Clock Extraction)之方法以及相關裝置,以解決上述問題。It is an object of the present invention to provide a method for performing Clock Extraction and related devices to solve the above problems.

本發明之另一目的在於提供一種用來進行時脈抽取之方法以及相關裝置,以在不需要設置任何具備高精確度的壓控振盪器的狀況下實現具備 通用序列匯流排埠(Universal Serial Bus Port,USB Port)之電子裝置(例如通用序列匯流排大量儲存設備)。Another object of the present invention is to provide a method for performing clock extraction and related devices, which can be implemented without setting any voltage-controlled oscillator with high precision. An electronic device of a Universal Serial Bus Port (USB Port) (for example, a universal serial bus mass storage device).

本發明之較佳實施例中提供一種用來進行時脈抽取之方法,該方法係應用於一電子裝置,該方法包含有:對接收自該電子裝置之一通用序列匯流排埠之一組接收訊號所載之一訓練序列等化型樣(Training Sequence Equalization Pattern,TSEQ Pattern)進行邊緣分析,以取得複數個邊緣數量估計值;依據該複數個邊緣數量估計值與一預定門檻值以產生複數個分析結果,其中該些邊緣數量估計值係取自對該訓練序列等化型樣進行分別對應於複數個時間區間之邊緣數量估計;以及依據該複數個分析結果對一振盪器之一輸出時脈的頻率進行頻率校正,以於完成該頻率校正之後利用該輸出時脈作為一參考時脈。尤其是,該振盪器可為一數值控制振盪器(Numerically Controlled Oscillator,NCO)。In a preferred embodiment of the present invention, a method for clock extraction is provided, the method being applied to an electronic device, the method comprising: receiving a group of universal serial buss received from the electronic device The training sequence equalization pattern (TSEQ Pattern) carries out an edge analysis to obtain a plurality of edge number estimates; and based on the plurality of edge number estimates and a predetermined threshold value to generate a plurality of The analysis result, wherein the edge quantity estimates are obtained by estimating an edge number corresponding to the plurality of time intervals respectively for the training sequence equalization pattern; and outputting a clock to one of the oscillators according to the plurality of analysis results The frequency is frequency corrected to utilize the output clock as a reference clock after the frequency correction is completed. In particular, the oscillator can be a Numerically Controlled Oscillator (NCO).

本發明於提供上述方法之同時,亦對應地提供一種用來進行時脈抽取之裝置,該裝置包含一電子裝置之至少一部分。該裝置包含有:一邊緣分析電路;以及一參考時脈產生器,耦接至該邊緣分析電路;其中該參考時脈產生器包含一振盪器與一頻率校正單元,而該頻率校正單元係耦接至該邊緣分析電路與該振盪器。該邊緣分析電路係用來藉由依序將複數個邊緣數量估計值與一預定門檻值進行比較,對接收自該電子裝置之一通用序列匯流排埠之一組接收訊號所載之一訓練序列等化型樣進行邊緣分析,以取得複數個邊緣數量估計值,並且依據該複數個邊緣數量估計值與一預定門檻值以產生複數個分析結果,其中該些邊緣數量估計值係取自對該訓練序列等化型樣進行分別對應於複數個時間區間之邊緣數量估計。另外,該參考時脈產生器係用來產生一參考時脈。此外,該振盪器係用來產生一輸出時脈,而該頻率校正單元係用來依據該複數個分析結果對該振盪器之該輸出時脈的頻率進行頻率校正,以於完成該頻率校正之後利用該輸出時脈作為該參考時脈。尤其是,該振盪器可為一數值控制振盪器。While providing the above method, the present invention also correspondingly provides a device for performing clock extraction, the device comprising at least a portion of an electronic device. The device includes: an edge analysis circuit; and a reference clock generator coupled to the edge analysis circuit; wherein the reference clock generator comprises an oscillator and a frequency correction unit, and the frequency correction unit is coupled Connected to the edge analysis circuit and the oscillator. The edge analysis circuit is configured to compare a plurality of edge quantity estimates with a predetermined threshold value in sequence, and receive a training sequence, such as a training sequence received by a group of received signals from a universal serial bus of the electronic device. Performing an edge analysis to obtain a plurality of edge number estimates, and generating a plurality of analysis results based on the plurality of edge number estimates and a predetermined threshold value, wherein the edge number estimates are taken from the training The sequence equalization pattern is performed to estimate the number of edges corresponding to a plurality of time intervals, respectively. Additionally, the reference clock generator is used to generate a reference clock. In addition, the oscillator is used to generate an output clock, and the frequency correcting unit is configured to perform frequency correction on the frequency of the output clock of the oscillator according to the plurality of analysis results, so as to complete the frequency correction. The output clock is used as the reference clock. In particular, the oscillator can be a numerically controlled oscillator.

本發明的好處之一是,該參考時脈產生器可依據該複數個分析結果當中該些不同類型的分析結果交替出現的頻率對該振盪器之該輸出時脈的頻率進行該頻率校正,使該裝置於完成該頻率校正之後利用該輸出時脈作為該參考時脈,藉此該電子裝置不需要設置任何具備對應於頻率偏移比率小於10%之精確度的壓控振盪器。由於不需要設置高精確度的壓控振盪器,故採用本發明之方法與裝置可節省相關成本。另外,由於不需要設置多個晶體振盪器,故採用本發明之方法與裝置可節省相關成本,並且依據本發明之方法與裝置所實現之該電子裝置可具備精巧的外型/大小。One of the advantages of the present invention is that the reference clock generator can perform the frequency correction on the frequency of the output clock of the oscillator according to the frequency at which the different types of analysis results alternate among the plurality of analysis results. The device uses the output clock as the reference clock after the frequency correction is completed, whereby the electronic device does not need to set any voltage controlled oscillator having an accuracy corresponding to a frequency offset ratio of less than 10%. Since there is no need to set a high-precision voltage-controlled oscillator, the method and apparatus of the present invention can save associated costs. In addition, since it is not necessary to provide a plurality of crystal oscillators, the method and apparatus of the present invention can save the associated cost, and the electronic device implemented in accordance with the method and apparatus of the present invention can have a compact appearance/size.

100‧‧‧用來進行時脈抽取之裝置100‧‧‧Devices for clock extraction

110‧‧‧時脈資料恢復電路110‧‧‧ Clock data recovery circuit

110PD‧‧‧相位偵測器110PD‧‧‧ phase detector

110PFD‧‧‧相位頻率偵測器110PFD‧‧‧ phase frequency detector

110SW‧‧‧切換單元110SW‧‧‧Switch unit

112‧‧‧比較器112‧‧‧ comparator

114‧‧‧解多工器114‧‧‧Solution multiplexer

116‧‧‧壓控振盪器116‧‧‧Variable Control Oscillator

118‧‧‧轉換模組118‧‧‧Transition module

120‧‧‧邊緣分析電路120‧‧‧Edge analysis circuit

122‧‧‧訓練序列等化型樣邊緣計算器122‧‧‧ Training sequence equalization edge calculator

124‧‧‧比較單元124‧‧‧Comparative unit

130‧‧‧參考時脈產生器130‧‧‧Reference clock generator

132‧‧‧頻率校正單元132‧‧‧ Frequency Correction Unit

134‧‧‧數值控制振盪器134‧‧‧Numerical Controlled Oscillator

150‧‧‧微處理器150‧‧‧Microprocessor

200‧‧‧用來進行時脈抽取之方法200‧‧‧Methods for clock extraction

210,220‧‧‧步驟210,220‧‧ steps

510-1,510-2,510-3,...510-39‧‧‧互斥或運算單元510-1, 510-2, 510-3, ... 510-39‧‧‧ Mutual or arithmetic unit

520‧‧‧加法單元520‧‧‧Addition unit

CLK,TSEQ_CLK‧‧‧時脈CLK, TSEQ_CLK‧‧‧ clock

D0,D1,D2,D3,...D38,D39‧‧‧分別對應於複數個位元之解多工訊號D0, D1, D2, D3, ... D38, D39‧‧‧ correspond to the complex multiplex signal of multiple bits

Edge_No‧‧‧邊緣數量估計值Edge_No‧‧‧Edge Estimate

Edge_Density‧‧‧對應於邊緣密度之分析結果Edge_Density‧‧‧ corresponds to the analysis of edge density

PTSEQ‧‧‧訓練序列等化型樣PTSEQ‧‧‧ training sequence equalization pattern

REF_CLK‧‧‧參考時脈REF_CLK‧‧‧ reference clock

RXP,RXN‧‧‧接收訊號RXP, RXN‧‧‧ receive signal

第1圖為依據本發明一第一實施例之一種用來進行時脈抽取(Clock Extraction)之裝置的示意圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of an apparatus for performing Clock Extraction in accordance with a first embodiment of the present invention.

第2圖為依據本發明一實施例之一種用來進行時脈抽取之方法的流程圖。2 is a flow chart of a method for performing clock extraction in accordance with an embodiment of the present invention.

第3圖繪示第2圖所示之方法於一實施例中所涉及之邊緣分析。Figure 3 illustrates the edge analysis involved in the method of Figure 2 in one embodiment.

第4圖繪示第2圖所示之方法於一實施例中所涉及之相關參數與相關訊號。FIG. 4 is a diagram showing related parameters and related signals involved in the method shown in FIG. 2 in an embodiment.

第5圖繪示第1圖所示之訓練序列等化型樣(Training Sequence Equalization Pattern,TSEQ Pattern)邊緣計算器於一實施例中所涉及之實施細節。FIG. 5 is a diagram showing the implementation details of the training sequence equalization pattern (TSEQ Pattern) edge calculator shown in FIG. 1 in one embodiment.

第6圖繪示第2圖所示之方法於一實施例中所涉及之實施細節。Figure 6 is a diagram showing the implementation details of the method shown in Figure 2 in one embodiment.

第1圖為依據本發明一第一實施例之一種用來進行時脈抽取(Clock Extraction)之裝置100的示意圖。裝置100可包含一電子裝置之至少一部分(例如:一部分或全部),其中該電子裝置的例子可包含(但不限於):隨身碟、外接式硬碟機、符合一種或多種標準之記憶卡讀卡機。例如:裝置100可包含該電子裝置之一部分,諸如該電子裝置之控制電路。又例如:裝置100可包含該電子裝置之全部,即該電子裝置之整體。依據本實施例,該電子裝置可符合通用序列匯流排(Universal Serial Bus,可簡稱為「USB」) 3.0標準或該USB 3.0標準之衍生版本。1 is a schematic diagram of an apparatus 100 for performing Clock Extraction in accordance with a first embodiment of the present invention. The device 100 can include at least a portion (eg, a portion or all) of an electronic device, wherein examples of the electronic device can include, but are not limited to, a flash drive, an external hard drive, and a memory card that conforms to one or more standards. Card machine. For example, device 100 can include a portion of the electronic device, such as control circuitry for the electronic device. For another example, the device 100 can include all of the electronic device, that is, the entirety of the electronic device. According to this embodiment, the electronic device can conform to a universal serial bus (Universal Serial Bus, which can be simply referred to as "USB"). 3.0 standard or derivative version of the USB 3.0 standard.

如第1圖所示,裝置100包含一比較器112、一解多工器(De-Multiplexer)114、一壓控振盪器(Voltage Controlled Oscillator,以下簡稱為「VCO」)116、一邊緣分析電路120、與一參考時脈產生器130,其中邊緣分析電路120包含一訓練序列等化型樣(Training Sequence Equalization Pattern,TSEQ Pattern)邊緣計算器122(以下簡稱為「TSEQ型樣邊緣計算器」;於第1圖中標示為「PTSEQ 邊緣計算器」,其中符號「PTSEQ 」代表訓練序列等化型樣)與一比較單元124(於第1圖中標示為「>30」,其中符號「>30」代表以一預定數值30為門檻值進行比較),而參考時脈產生器130包含一頻率校正單元132,且另包含一振盪器諸如一數值控制振盪器(Numerically Controlled Oscillator,以下簡稱為「NCO」)134。裝置100可利用比較器112從該電子裝置之一通用序列匯流排埠(Universal Serial Bus Port,以下簡稱為「USB埠」)接收一組接收訊號RXP與RXN,並且利用第1圖所示之架構在不需要設置任何具備高精確度的VCO的狀況下從該組接收訊號RXP與RXN所載之資訊取得一參考時脈REF_CLK。As shown in FIG. 1, the device 100 includes a comparator 112, a De-Multiplexer 114, a Voltage Controlled Oscillator (hereinafter referred to as "VCO") 116, and an edge analysis circuit. 120, and a reference clock generator 130, wherein the edge analysis circuit 120 includes a training sequence equalization pattern (TSEQ Pattern) edge calculator 122 (hereinafter referred to as "TSEQ type edge calculator"; In the first figure, it is labeled "P TSEQ edge calculator", wherein the symbol "P TSEQ " represents the training sequence equalization pattern) and a comparison unit 124 (labeled as ">30" in the first figure, wherein the symbol ">30" represents a comparison with a predetermined value of 30 as the threshold value, and the reference clock generator 130 includes a frequency correcting unit 132, and further includes an oscillator such as a numerically controlled oscillator (hereinafter referred to as a numerically controlled oscillator). "NCO") 134. The device 100 can receive a set of receiving signals RXP and RXN from the Universal Serial Bus Port (hereinafter referred to as “USB埠”) by using the comparator 112, and utilize the architecture shown in FIG. The reference clock REF_CLK is obtained from the information received by the group receiving signals RXP and RXN without setting any VCO with high precision.

依據本實施例,邊緣分析電路120係用來對接收自該電子裝置之該USB埠之該組接收訊號RXP與RXN所載之一訓練序列等化型樣PTSEQ (以下簡稱為「TSEQ型樣」)進行邊緣分析,以取得複數個邊緣數量估計值,並且依據該複數個邊緣數量估計值與一預定門檻值(例如:30)以動態地產生複數個分析結果,其中該些邊緣數量估計值係取自對該TSEQ型樣進行分別對應於複數個時間區間之邊緣數量估計。另外,參考時脈產生器130係用來產生參考時脈REF_CLK。此外,該NCO 134係用來產生一輸出時脈,而頻率校正單元132係用來依據該複數個分析結果當中不同類型的分析結果交替出現的頻率對該NCO 134之該輸出時脈的頻率進行頻率校正,以於完成該頻率校正之後利用該輸出時脈作為參考時脈REF_CLK。實作上,參考時脈REF_CLK和該NCO 134之該輸出時脈可為同一個訊號,其中在一微處理器 (未顯示於第1圖)之控制下,裝置100可於完成該頻率校正之後開始使用參考時脈REF_CLK,以避免在該頻率校正完成之前從參考時脈REF_CLK取得未完成校正之頻率。為了簡明起見,第1圖中將參考時脈REF_CLK和該NCO 134之該輸出時脈可一併標示為「REF_CLK」。According to the embodiment, the edge analysis circuit 120 is configured to receive a training sequence equalization type P TSEQ (hereinafter referred to as "TSEQ type" for the set of received signals RXP and RXN received from the USB port of the electronic device. Performing an edge analysis to obtain a plurality of edge number estimates, and dynamically generating a plurality of analysis results according to the plurality of edge number estimates and a predetermined threshold value (eg, 30), wherein the number of edge numbers is estimated The TSEQ pattern is taken from an estimate of the number of edges corresponding to a plurality of time intervals, respectively. Additionally, reference clock generator 130 is used to generate reference clock REF_CLK. In addition, the NCO 134 is used to generate an output clock, and the frequency correcting unit 132 is configured to perform the frequency of the output clock of the NCO 134 according to the frequency at which the different types of analysis results of the plurality of analysis results alternate. Frequency correction is used to use the output clock as the reference clock REF_CLK after the frequency correction is completed. In practice, the reference clock REF_CLK and the output clock of the NCO 134 can be the same signal, wherein the device 100 can complete the frequency correction after being controlled by a microprocessor (not shown in FIG. 1). Start using the reference clock REF_CLK to avoid taking the frequency of unfinished correction from the reference clock REF_CLK before the frequency correction is completed. For the sake of simplicity, the reference clock REF_CLK and the output clock of the NCO 134 may be collectively labeled as "REF_CLK" in FIG.

請注意,於該電子裝置中可不存在任何具備對應於頻率偏移比率小於10%之精確度的VCO;這表示本實施例之該電子裝置中之任何VCO的頻率偏移比率為10%以上。例如:該VCO 116的時脈CLK之頻率約為5 GHz(Gigahertz,即十億赫茲),尤其是落在區間[(5 GHz)*(1-10%),(5 GHz)*(1+10%)]的範圍,其對應的頻率偏移比率為10%。藉由利用第1圖所示之架構,裝置100能在尚未鎖定該組接收訊號RXP與RXN之相位的狀況下從該組接收訊號RXP與RXN所載之資訊諸如該TSEQ型樣PTSEQ 精確地取得15.625 MHz(Megahertz,即百萬赫茲)的頻率以產生具有15.625 MHz的頻率之參考時脈REF_CLK,以供裝置100進行針對時脈資料恢復之一系列預備運作中之至少一部分(例如:一部分或全部)之用,而不需要採用任何高精密度的VCO諸如任何具備對應於頻率偏移比率小於10%之精確度的VCO。例如:該系列預備運作可包含:裝置100進行相位頻率偵測以鎖定該組接收訊號RXP與RXN之頻率;以及於鎖定該組接收訊號RXP與RXN之頻率之後,裝置100進一步進行相位偵測以鎖定該組接收訊號RXP與RXN之相位;其中於鎖定該組接收訊號RXP與RXN之相位之後,裝置100可正確地取得該組接收訊號RXP與RXN所載之資料。關於裝置100的運作之更多細節,請參考第2圖進一步說明。Please note that there may be no VCO having an accuracy corresponding to a frequency offset ratio of less than 10% in the electronic device; this means that the frequency offset ratio of any VCO in the electronic device of the embodiment is 10% or more. For example, the clock CLK of the VCO 116 has a frequency of about 5 GHz (Gigahertz, ie, a billion Hz), especially in the interval [(5 GHz)*(1-10%), (5 GHz)*(1+) The range of 10%)] has a corresponding frequency offset ratio of 10%. By utilizing the architecture shown in FIG. 1, the device 100 can receive information from the group of received signals RXP and RXN, such as the TSEQ type P TSEQ, accurately without locking the phase of the set of received signals RXP and RXN. A frequency of 15.625 MHz (Megahertz, megahertz) is obtained to generate a reference clock REF_CLK having a frequency of 15.625 MHz for the device 100 to perform at least a portion of a series of preparatory operations for clock data recovery (eg, a portion or All), without the need to use any high-precision VCO such as any VCO with an accuracy corresponding to a frequency offset ratio of less than 10%. For example, the series of preparatory operations may include: the device 100 performs phase frequency detection to lock the frequency of the group of receiving signals RXP and RXN; and after locking the frequency of the group of receiving signals RXP and RXN, the device 100 further performs phase detection. The phase of the group receiving signals RXP and RXN is locked; wherein after the phase of the group receiving signals RXP and RXN is locked, the device 100 can correctly obtain the data carried by the group of receiving signals RXP and RXN. For further details on the operation of device 100, please refer to Figure 2 for further explanation.

第2圖為依據本發明一實施例之一種用來進行時脈抽取之方法200的流程圖。上述之方法200可應用於第1圖所示之裝置100;該方法說明如下:2 is a flow chart of a method 200 for performing clock extraction in accordance with an embodiment of the present invention. The method 200 described above can be applied to the apparatus 100 shown in Fig. 1; the method is described as follows:

於步驟210中,邊緣分析電路120對接收自該電子裝置之該USB埠之一組接收訊號所載之訓練序列等化型樣,諸如該組接收訊號RXP與RXN 所載之該TSEQ型樣PTSEQ ,進行邊緣分析,以動態地產生複數個分析結果。尤其是,邊緣分析電路120對該組接收訊號RXP與RXN所載之該TSEQ型樣PTSEQ 進行邊緣分析,以取得複數個邊緣數量估計值,並且依據該複數個邊緣數量估計值與一預定門檻值諸如上述者(例如:30;又例如:接近30之正整數)以動態地產生複數個分析結果,其中該些邊緣數量估計值係取自對該TSEQ型樣進行分別對應於複數個時間區間之邊緣數量估計。In step 210, the edge analysis circuit 120 receives the training sequence equalization pattern received by the group of the USB ports received from the electronic device, such as the TSEQ type P carried by the group of received signals RXP and RXN. TSEQ , performing edge analysis to dynamically generate a plurality of analysis results. In particular, the edge analysis circuit 120 performs edge analysis on the TSEQ type P TSEQ carried by the group of received signals RXP and RXN to obtain a plurality of edge number estimates, and based on the plurality of edge number estimates and a predetermined threshold Values such as those described above (eg, 30; again, for example, a positive integer close to 30) to dynamically generate a plurality of analysis results, wherein the estimate of the number of edges is taken from the TSEQ pattern corresponding to a plurality of time intervals, respectively. Estimated number of edges.

於步驟220中,頻率校正單元132依據該複數個分析結果當中不同類型的分析結果交替出現的頻率對該NCO 134之該輸出時脈的頻率進行上述之頻率校正,以於完成該頻率校正之後利用該輸出時脈作為參考時脈REF_CLK。In step 220, the frequency correcting unit 132 performs the above-mentioned frequency correction on the frequency of the output clock of the NCO 134 according to the frequency at which the different types of analysis results among the plurality of analysis results alternately occur, so as to be utilized after the frequency correction is completed. This output clock is used as the reference clock REF_CLK.

依據本實施例,比較器112可將該組接收訊號RXP與RXN彼此比較以產生對應於該組接收訊號RXP與RXN之一非差動接收訊號,而解多工器114可對該非差動接收訊號進行解多工運作以產生一組分別對應於複數個位元之解多工訊號,其中該複數個位元的順序對應於解多工前原始資訊在該非差動接收訊號的順序。例如:該組解多工訊號可為分別對應於四十個位元{B0,B1,...,B39}之四十個解多工訊號,其係為四十位元平行傳輸訊號。為了簡明起見,這樣的四十位元平行傳輸訊號可於第1圖中簡單地標示為「40b」。請注意,位元資訊諸如上述四十個位元{B0,B1,...,B39}原本就載於該組接收訊號RXP與RXN當中,且可藉由解多工器114之解多工運作取得解多工訊號{D0,D1,...,D39}而後可將解多工訊號{D0,D1,...,D39}平行地傳輸給該TSEQ型樣邊緣計算器122。另外,該TSEQ型樣邊緣計算器122可藉由比較該複數個位元(諸如該四十個位元{B0,B1,...,B39})中之每兩相鄰位元所對應之解多工訊號各自的電壓位準,來進行上述之邊緣分析。將接收訊號RXP與RXN進行解多工以產生解多工訊號{D0,D1,...,D39}的優點係可以降低後續電路的運作頻率,以降低後續電路的複雜度。According to this embodiment, the comparator 112 can compare the group of receiving signals RXP and RXN with each other to generate a non-differential receiving signal corresponding to one of the group of receiving signals RXP and RXN, and the demultiplexer 114 can receive the non-differential receiving. The signal performs a multiplex operation to generate a set of demultiplexed signals respectively corresponding to the plurality of bits, wherein the order of the plurality of bits corresponds to the order in which the pre-multiplexed original information is received in the non-differential signal. For example, the group of multiplexed signals may be forty multiplexed signals corresponding to forty bits {B0, B1, ..., B39}, which are forty-bit parallel transmission signals. For the sake of brevity, such a 40-bit parallel transmission signal can be simply labeled "40b" in FIG. Please note that the bit information such as the above-mentioned forty bits {B0, B1, ..., B39} is originally contained in the group of receiving signals RXP and RXN, and can be solved by the solution multiplexer 114. The operation obtains the multiplex signal {D0, D1, ..., D39} and then the multiplex signal {D0, D1, ..., D39} can be transmitted in parallel to the TSEQ pattern edge calculator 122. In addition, the TSEQ type edge calculator 122 can compare each of the two adjacent bits in the plurality of bits (such as the forty bits {B0, B1, ..., B39}). The voltage levels of the multiplexed signals are resolved to perform the edge analysis described above. The advantage of demultiplexing the received signals RXP and RXN to generate the multiplexed signals {D0, D1, ..., D39} can reduce the operating frequency of subsequent circuits to reduce the complexity of subsequent circuits.

請注意,第2圖繪示了包含步驟210與於步驟220之工作流程。 這只是為了說明的目的而已,並非對本發明之限制。依據本實施例之不同的變化例,該工作流程可予以變化。例如:步驟210之至少一部分運作及/或步驟220之至少一部分運作可重複地執行。又例如:步驟210之至少一部分運作與步驟220之至少一部分運作可同時執行。Please note that FIG. 2 depicts the workflow including step 210 and step 220. This is for illustrative purposes only and is not a limitation of the invention. This workflow can be varied in accordance with various variations of this embodiment. For example, at least a portion of the operation of step 210 and/or at least a portion of the operation of step 220 can be performed repeatedly. For another example, at least a portion of the operation of step 210 and at least a portion of the operation of step 220 can be performed simultaneously.

請參考第3圖。第3圖繪示第2圖所示之方法200於一實施例中所涉及之邊緣分析。於邊緣分析電路120進行該邊緣分析時,其內之該TSEQ型樣邊緣計算器122依據該複數個位元(諸如該四十個位元{B0,B1,...,B39})中之每兩相鄰位元所對應之解多工訊號各自的電壓位準,產生針對該TSEQ型樣PTSEQ 之分別對應於各個時間區間之邊緣數量估計值Edge_No諸如第3圖所示者,以供產生該複數個分析結果之用。例如:在理想狀況下,當該TSEQ型樣PTSEQ 之邏輯值係為第3圖所示之各列位元{{0011111010},{0101001110},{0001011011},{0110000110}}、{{0010111011},{0100111010},{0001110001},{1011010100}}、...、與{{0101010101},{0101010101},{0101010101},{0101010101}}(亦即,由左上角開始,由左至右、由上至下的各列位元),該TSEQ型樣邊緣計算器122可產生分別對應於各個時間區間之邊緣數量估計值Edge_No諸如{20,22,20,26,39,39,39,39,21,...,39},其中上述之各列位元中之任一列位元可以視為上述四十個位元{B0,B1,...,B39}之一例。於是,比較單元124依序將該些邊緣數量估計值{Edge_No}與該預定門檻值諸如上述之預定數值30進行比較,以產生載有該複數個分析結果之一比較訊號,其中該比較訊號之不同位準交替出現的頻率代表該複數個分析結果當中該些不同類型的分析結果交替出現的頻率,而根據USB 3.0標準該頻率應為一定值,故可用於產生參考時脈REF_CLK。Please refer to Figure 3. Figure 3 illustrates the edge analysis involved in the method 200 of Figure 2 in one embodiment. When the edge analysis circuit 120 performs the edge analysis, the TSEQ pattern edge calculator 122 therein is based on the plurality of bits (such as the forty bits {B0, B1, ..., B39}). The voltage level of each of the demultiplexed signals corresponding to each two adjacent bits generates an edge number estimate Edge_No corresponding to each time interval for the TSEQ type P TSEQ , such as shown in FIG. 3, for The use of the plurality of analysis results. For example, under ideal conditions, when the logical value of the TSEQ type P TSEQ is the column of each column shown in FIG. 3 {{0011111010}, {0101001110}, {0001011011}, {0110000110}}, {{0010111011 },{0100111010},{0001110001},{1011010100}},...,and{{0101010101},{0101010101},{0101010101},{0101010101}} (ie, starting from the upper left corner, from left to right The top-down row of bits, the TSEQ-type edge calculator 122 may generate edge number estimates Edge_No such as {20, 22, 20, 26, 39, 39, 39, respectively, corresponding to respective time intervals. 39, 21, ..., 39}, wherein any one of the above-mentioned columns of bits can be regarded as one of the above-mentioned forty bits {B0, B1, ..., B39}. Then, the comparing unit 124 sequentially compares the edge number estimation value {Edge_No} with the predetermined threshold value, such as the predetermined value 30, to generate a comparison signal carrying the plurality of analysis results, wherein the comparison signal The frequency at which different levels alternately represents the frequency at which the different types of analysis results alternate between the plurality of analysis results, and the frequency should be a certain value according to the USB 3.0 standard, so it can be used to generate the reference clock REF_CLK.

實作上,該比較訊號可為第1圖所示之時脈TSEQ_CLK,其可處於一高電壓位準或一低電壓位準。例如:該高電壓位準可用來指出邊緣數量估計值Edge_No大於該預定門檻值,而該低電壓位準可用來指出邊緣數量估計值Edge_No小於或等於該預定門檻值。然而,這只是為了說明的目的而已, 並非對本發明之限制。依據本實施例之一變化例,該低電壓位準可用來指出邊緣數量估計值Edge_No大於該預定門檻值,而該高電壓位準可用來指出邊緣數量估計值Edge_No小於或等於該預定門檻值。In practice, the comparison signal can be the clock TSEQ_CLK shown in FIG. 1 , which can be at a high voltage level or a low voltage level. For example, the high voltage level can be used to indicate that the edge number estimate Edge_No is greater than the predetermined threshold value, and the low voltage level can be used to indicate that the edge number estimate Edge_No is less than or equal to the predetermined threshold value. However, this is for illustrative purposes only. It is not intended to limit the invention. According to a variant of this embodiment, the low voltage level can be used to indicate that the edge number estimate Edge_No is greater than the predetermined threshold value, and the high voltage level can be used to indicate that the edge number estimate Edge_No is less than or equal to the predetermined threshold value.

如第3圖所示,基於以上揭露之比較運作,該複數個分析結果可包含兩種對應於邊緣密度之分析結果Edge_Density,諸如對應於邊緣密度50%之分析結果以及對應於邊緣密度100%之分析結果,其中前者與後者可分別利用該低電壓位準與該高電壓位準來表示。如此,在該TSEQ型樣PTSEQ 符合USB 3.0標準的狀況下,時脈TSEQ_CLK之不同位準交替出現的頻率可逼近15.625 MHz。於是,裝置100可依據時脈TSEQ_CLK之不同位準交替出現的頻率進行上述之頻率校正,以正確地產生參考時脈REF_CLK。這只是為了說明的目的而已,並非對本發明之限制。依據第3圖所示實施例之某些變化例,邊緣分析電路120可先計算分別對應於該複數個邊緣數量估計值{Edge_No}(例如:第3圖所示之邊緣數量估計值{20,22,20,26,39,39,39,39,21,...,39})之邊緣密度,諸如邊緣密度{20/40,22/40,20/40,26/40,39/40,39/40,39/40,39/40,21/40,...,39/40},亦即{50%,55%,50%,65%,97.5%,97.5%,97.5%,97.5%,52.5%,...,97.5%}。另外,邊緣分析電路120可依序將該些邊緣密度諸如{50%,55%,50%,65%,97.5%,97.5%,97.5%,97.5%,52.5%,...,97.5%}和另一預定門檻值(例如:75%;又例如:接近75%之正數)進行比較,以產生該複數個分析結果,其中該另一預定門檻值對應於第2圖所示實施例中所述之該預定門檻值。例如:在第2圖所示實施例中所述之該預定門檻值等於30的狀況下,該另一預定門檻值可為30/40,亦即75%。請注意,只要不影響本發明之實施,計算邊緣密度時所採用的分母「40」可予以變化。As shown in FIG. 3, based on the comparison operation disclosed above, the plurality of analysis results may include two analysis results Edge_Density corresponding to the edge density, such as an analysis result corresponding to 50% of the edge density and 100% corresponding to the edge density. The analysis results, wherein the former and the latter can be represented by the low voltage level and the high voltage level, respectively. Thus, in the case where the TSEQ type P TSEQ conforms to the USB 3.0 standard, the frequency at which the different levels of the clock TSEQ_CLK alternate may approach 15.625 MHz. Thus, the device 100 can perform the above-described frequency correction according to the frequency at which the different levels of the clock TSEQ_CLK alternately occur to correctly generate the reference clock REF_CLK. This is for illustrative purposes only and is not a limitation of the invention. According to some variations of the embodiment shown in FIG. 3, the edge analysis circuit 120 may first calculate an estimate of the edge number {Edge_No} corresponding to the plurality of edges (for example, the edge number estimate {20 shown in FIG. 3, 22,20,26,39,39,39,39,21,...,39}) edge density, such as edge density {20/40, 22/40, 20/40, 26/40, 39/40 , 39/40, 39/40, 39/40, 21/40, ..., 39/40}, ie {50%, 55%, 50%, 65%, 97.5%, 97.5%, 97.5%, 97.5%, 52.5%, ..., 97.5%}. In addition, the edge analysis circuit 120 can sequentially apply the edge densities such as {50%, 55%, 50%, 65%, 97.5%, 97.5%, 97.5%, 97.5%, 52.5%, ..., 97.5%}. Comparing with another predetermined threshold value (eg, 75%; for example, a positive number close to 75%) to generate the plurality of analysis results, wherein the other predetermined threshold value corresponds to the embodiment shown in FIG. The predetermined threshold value is described. For example, in the case where the predetermined threshold value described in the embodiment shown in FIG. 2 is equal to 30, the other predetermined threshold value may be 30/40, that is, 75%. Note that the denominator "40" used in calculating the edge density can be changed as long as it does not affect the implementation of the present invention.

第4圖繪示第2圖所示之方法200於一實施例中所涉及之相關參數與相關訊號。如第4圖所示,上述之相關參數包含對應於邊緣密度之分析結果Edge_Density以及邊緣數量估計值Edge_No,而上述之相關訊號包含時脈TSEQ_CLK以及載有該TSEQ型樣PTSEQ 之該組接收訊號RXP與RXN, 其中後者在此標示為「PTSEQ 」以強調該組接收訊號RXP與RXN所載之該TSEQ型樣PTSEQFIG. 4 is a diagram showing related parameters and related signals involved in the method 200 shown in FIG. 2 in an embodiment. As shown in FIG. 4, the related parameters include an edge result of Edge_Density corresponding to the edge density and an edge number estimate Edge_No, and the related signal includes the clock TSEQ_CLK and the group of received signals carrying the TSEQ type P TSEQ RXP and RXN, where the latter is designated herein as "P TSEQ " to emphasize the TSEQ type P TSEQ contained in the set of received signals RXP and RXN.

請注意,在理想狀況下,該複數個分析結果可精確地對應於該TSEQ型樣PTSEQ 之一系列邊緣密度。在實際狀況下,雖然邊緣數量估計值Edge_No可能帶有一些誤差,但若適當的挑選比較單元124的門檻值,將可降低這些誤差,使得這些誤差不足以導致時脈TSEQ_CLK異常地反向,也不會妨礙上述之頻率校正。Note that under ideal conditions, the plurality of analysis results may correspond exactly to a series of edge densities of the TSEQ type P TSEQ . Under actual conditions, although the edge number estimation value Edge_No may have some errors, if the threshold value of the comparison unit 124 is appropriately selected, the errors may be reduced, so that the errors are insufficient to cause the clock TSEQ_CLK to be abnormally reversed. It does not interfere with the above frequency correction.

第5圖繪示第1圖所示之該TSEQ型樣邊緣計算器122於一實施例中所涉及之實施細節,其中符號{D0,D1,D2,D3,...,D38,D39}代表解多工訊號。該TSEQ型樣邊緣計算器122包含耦接至解多工器114之複數個互斥或(Exclusive OR,XOR)運算單元{510-1,510-2,510-3,...,510-39}與一加法單元520。依據本實施例,解多工訊號{D0,D1,...,D39}可作為上述之四十個解多工訊號的例子。Figure 5 is a diagram showing the implementation details of the TSEQ-type edge calculator 122 shown in Figure 1 in an embodiment, wherein the symbols {D0, D1, D2, D3, ..., D38, D39} represent Solve the multiplex signal. The TSEQ-type edge calculator 122 includes a plurality of exclusive OR (XOR) operation units {510-1, 510-2, 510-3, ..., 510-39} coupled to the demultiplexer 114. Addition unit 520. According to this embodiment, the multiplexed signal {D0, D1, ..., D39} can be used as an example of the above forty multiplexed signals.

如第5圖所示,互斥或運算單元{510-1,510-2,510-3,...,510-39}可多次對解多工訊號{D0,D1,...,D39}各自的電壓位準進行互斥或運作,以產生分別對應於不同時間點之複數組互斥或運作結果。加法單元520可計算每一組互斥或運作結果的總和,並利用分別對應於該些時間點之各個總和作為針對該TSEQ型樣PTSEQ 之分別對應於不同時間區間之該些邊緣數量估計值{Edge_No},以供產生該複數個分析結果之用。例如:在解多工訊號{D0,D1,...,D39}的邏輯值分別等於第3圖所示之該TSEQ型樣PTSEQ 中之第一列的四十個位元{{0011111010},{0101001110},{0001011011},{0110000110}}的狀況下,第5圖所示架構所產生之邊緣數量估計值Edge_No等於數值20。又例如:在解多工訊號{D0,D1,...,D39}的邏輯值分別等於第3圖所示之該TSEQ型樣PTSEQ 中之最後一列的四十個位元{{0101010101},{0101010101},{0101010101},{0101010101}}的狀況下,第5圖所示架構所產生之邊緣數量估計值Edge_No等於數值39。As shown in FIG. 5, the mutually exclusive or arithmetic unit {510-1, 510-2, 510-3, ..., 510-39} can solve the multiplexed signals {D0, D1, ..., D39} multiple times. The voltage levels are mutually exclusive or operational to produce complex arrays of mutually exclusive or operational results corresponding to different points in time. The adding unit 520 may calculate the sum of the mutually exclusive or operational results of each group, and use the respective sums respectively corresponding to the time points as the estimated number of edges corresponding to the different time intervals for the TSEQ type P TSEQ respectively {Edge_No} for the purpose of generating the plurality of analysis results. For example, the logical values of the demultiplexed signals {D0, D1, ..., D39} are respectively equal to the forty bits of the first column of the TSEQ type P TSEQ shown in FIG. 3 {{0011111010} In the case of {0101001110}, {0001011011}, {0110000110}}, the edge number estimate Edge_No generated by the architecture shown in Fig. 5 is equal to the value 20. For another example, the logical values of the multiplexed signal {D0, D1, ..., D39} are respectively equal to the forty bits of the last column of the TSEQ type P TSEQ shown in FIG. 3 {{0101010101} In the case of {0101010101}, {0101010101}, {0101010101}}, the edge number estimate Edge_No generated by the architecture shown in Fig. 5 is equal to the value 39.

第6圖繪示第2圖所示之方法200於一實施例中所涉及之實施細節。如第6圖所示,裝置100包含一時脈資料恢復電路(Clock Data Recovery Circuit,以下簡稱為「CDR電路」)110與一控制邏輯電路150。除了第1圖所示之比較器112、解多工器114、與該VCO 116之外,該CDR電路110可另包含一轉換模組118、一切換單元110SW、一相位頻率偵測器110PFD、與一相位偵測器110PD。FIG. 6 illustrates implementation details of the method 200 shown in FIG. 2 in an embodiment. As shown in FIG. 6, the device 100 includes a clock data recovery circuit (hereinafter referred to as "CDR circuit") 110 and a control logic circuit 150. In addition to the comparator 112, the demultiplexer 114, and the VCO 116 shown in FIG. 1, the CDR circuit 110 may further include a conversion module 118, a switching unit 110SW, a phase frequency detector 110PFD, And a phase detector 110PD.

依據本實施例,控制邏輯電路150可控制切換單元110SW進行切換,以將相位頻率偵測器110PFD所輸出之一第一偵測訊號與相位偵測器110PD所輸出之一第二偵測訊號中之一者提供予轉換模組118。另外,轉換模組118可依據透過切換單元110SW所接收之該第一偵測訊號或該第二偵測訊號調整該VCO 116之輸入電壓位準,以控制時脈CLK的頻率。實作上,轉換模組118中可設置有電荷泵(Charge Pump;未顯示)及相關控制電路,以供產生該VCO 116之輸入電壓位準。According to the embodiment, the control logic circuit 150 can control the switching unit 110SW to switch to output one of the first detection signals output by the phase frequency detector 110PFD and the second detection signal output by the phase detector 110PD. One of them is provided to the conversion module 118. In addition, the conversion module 118 can adjust the input voltage level of the VCO 116 according to the first detection signal or the second detection signal received by the switching unit 110SW to control the frequency of the clock CLK. In practice, the conversion module 118 can be provided with a charge pump (not shown) and associated control circuitry for generating the input voltage level of the VCO 116.

首先,在切換單元110SW將該第一偵測訊號提供予轉換模組118的狀況下,相位頻率偵測器110PFD可依據參考時脈REF_CLK與時脈CLK進行相位頻率偵測以產生該第一偵測訊號。於是,藉由利用第1圖所示架構,裝置100鎖定該組接收訊號RXP與RXN之頻率。裝置100鎖定該組接收訊號RXP與RXN之頻率之後,控制邏輯電路150控制切換單元110SW進行切換以接收該第二偵測訊號。在切換單元110SW將該第二偵測訊號提供予轉換模組118的狀況下,相位偵測器110PD可依據時脈CLK以及該組接收訊號RXP與RXN進行相位偵測以產生該第二偵測訊號。於是,該CDR電路110鎖定該組接收訊號RXP與RXN之相位。此狀況下,由於時脈CLK之頻率與相位分別和該組接收訊號RXP與RXN之頻率與相位吻合,故於鎖定該組接收訊號RXP與RXN之相位之後,裝置100可利用該CDR電路110正確地取得該組接收訊號RXP與RXN所載之資料。First, in the case that the switching unit 110SW provides the first detection signal to the conversion module 118, the phase frequency detector 110PFD can perform phase frequency detection according to the reference clock REF_CLK and the clock CLK to generate the first detection. Test signal. Thus, by utilizing the architecture shown in Figure 1, device 100 locks the frequency of the set of received signals RXP and RXN. After the device 100 locks the frequency of the group receiving signals RXP and RXN, the control logic circuit 150 controls the switching unit 110SW to switch to receive the second detection signal. In the case that the switching unit 110SW provides the second detection signal to the conversion module 118, the phase detector 110PD can perform phase detection according to the clock CLK and the group of receiving signals RXP and RXN to generate the second detection. Signal. Thus, the CDR circuit 110 locks the phase of the set of received signals RXP and RXN. In this case, since the frequency and phase of the clock CLK coincide with the frequency and phase of the group of received signals RXP and RXN, the device 100 can use the CDR circuit 110 correctly after locking the phases of the group of received signals RXP and RXN. The information received by the group receiving signals RXP and RXN is obtained.

基於以上各個實施例,參考時脈產生器130可依據該複數個分析 結果當中該些不同類型的分析結果交替出現的頻率對該NCO 134之該輸出時脈的頻率進行該頻率校正,使裝置100於完成該頻率校正之後利用該輸出時脈作為參考時脈REF_CLK,藉此,於該頻率校正已完成時,該CDR電路110不需要先鎖定該組接收訊號RXP與RXN之相位。尤其是,於該頻率校正已完成時,該CDR電路110尚未鎖定該組接收訊號之相位,而不必如某些傳統的電子裝置必須先鎖定該組接收訊號之相位。因此,依據本發明之方法與裝置所實現之該電子裝置可避免使用者無謂的等待。Based on the above various embodiments, the reference clock generator 130 can perform the plurality of analyses according to the plurality of The frequency at which the different types of analysis results alternate occurs to correct the frequency of the output clock of the NCO 134, so that the device 100 uses the output clock as the reference clock REF_CLK after completing the frequency correction. Therefore, when the frequency correction is completed, the CDR circuit 110 does not need to first lock the phase of the group of received signals RXP and RXN. In particular, when the frequency correction is completed, the CDR circuit 110 has not locked the phase of the set of received signals, and it is not necessary for some conventional electronic devices to lock the phase of the set of received signals. Therefore, the electronic device implemented in accordance with the method and apparatus of the present invention can avoid unnecessary waiting by the user.

請注意,裝置100於完成該頻率校正之後利用該輸出時脈作為參考時脈REF_CLK,藉此,該CDR電路110可進行上述該系列預備運作中之至少一部分(例如:一部分或全部)。由於該系列預備運作的結果,裝置100可利用該CDR電路110鎖定該組接收訊號RXP與RXN之頻率與相位並且正確地取得該組接收訊號RXP與RXN所載之資料。Please note that the device 100 uses the output clock as the reference clock REF_CLK after the frequency correction is completed, whereby the CDR circuit 110 can perform at least a part (eg, part or all) of the series of preparatory operations described above. As a result of the preliminary operation of the series, the device 100 can use the CDR circuit 110 to lock the frequency and phase of the set of received signals RXP and RXN and correctly obtain the data contained in the set of received signals RXP and RXN.

本發明的好處之一是,參考時脈產生器130可依據該複數個分析結果當中該些不同類型的分析結果交替出現的頻率對該NCO 134之該輸出時脈的頻率進行該頻率校正,使裝置100於完成該頻率校正之後利用該輸出時脈作為參考時脈REF_CLK,藉此該電子裝置不需要設置任何具備對應於頻率偏移比率小於10%之精確度的VCO。由於不需要設置高精確度的VCO,故採用本發明之方法與裝置可節省相關成本。另外,由於不需要設置多個晶體振盪器,故採用本發明之方法與裝置可節省相關成本,並且依據本發明之方法與裝置所實現之該電子裝置可具備精巧的外型/大小。One of the advantages of the present invention is that the reference clock generator 130 can perform the frequency correction on the frequency of the output clock of the NCO 134 according to the frequency at which the different types of analysis results alternate among the plurality of analysis results. The device 100 uses the output clock as the reference clock REF_CLK after the frequency correction is completed, whereby the electronic device does not need to set any VCO having an accuracy corresponding to a frequency offset ratio of less than 10%. Since there is no need to set a high precision VCO, the associated method and apparatus can be used to save associated costs. In addition, since it is not necessary to provide a plurality of crystal oscillators, the method and apparatus of the present invention can save the associated cost, and the electronic device implemented in accordance with the method and apparatus of the present invention can have a compact appearance/size.

100‧‧‧用來進行時脈抽取之裝置100‧‧‧Devices for clock extraction

112‧‧‧比較器112‧‧‧ comparator

114‧‧‧解多工器114‧‧‧Solution multiplexer

116‧‧‧壓控振盪器116‧‧‧Variable Control Oscillator

120‧‧‧邊緣分析電路120‧‧‧Edge analysis circuit

122‧‧‧訓練序列等化型樣邊緣計算器122‧‧‧ Training sequence equalization edge calculator

124‧‧‧比較單元124‧‧‧Comparative unit

130‧‧‧參考時脈產生器130‧‧‧Reference clock generator

132‧‧‧頻率校正單元132‧‧‧ Frequency Correction Unit

134‧‧‧數值控制振盪器134‧‧‧Numerical Controlled Oscillator

CLK,TSEQ_CLK‧‧‧時脈CLK, TSEQ_CLK‧‧‧ clock

REF_CLK‧‧‧參考時脈REF_CLK‧‧‧ reference clock

RXP,RXN‧‧‧接收訊號RXP, RXN‧‧‧ receive signal

Claims (20)

一種用來進行時脈抽取(Clock Extraction)之方法,該方法係應用於一電子裝置,該方法包含有:對接收自該電子裝置之一通用序列匯流排埠(Universal Serial Bus Port,USB Port)之一組接收訊號所載之一訓練序列等化型樣(Training Sequence Equalization Pattern,TSEQ Pattern)進行邊緣分析,以取得複數個邊緣數量估計值;依據該複數個邊緣數量估計值與一預定門檻值以產生複數個分析結果,其中該些邊緣數量估計值係取自對該訓練序列等化型樣進行分別對應於複數個時間區間之邊緣數量估計;以及依據該複數個分析結果對一振盪器之一輸出時脈的頻率進行頻率校正,以於完成該頻率校正之後利用該輸出時脈作為一參考時脈。A method for performing Clock Extraction, the method being applied to an electronic device, the method comprising: receiving a Universal Serial Bus Port (USB Port) received from the electronic device A training sequence equalization pattern (TSEQ Pattern) carried out by one of the group receiving signals performs edge analysis to obtain a plurality of edge number estimates; and based on the plurality of edge number estimates and a predetermined threshold value And generating a plurality of analysis results, wherein the edge quantity estimates are obtained by estimating an edge number corresponding to the plurality of time intervals respectively for the training sequence equalization pattern; and performing an oscillator according to the plurality of analysis results The frequency of an output clock is frequency corrected to utilize the output clock as a reference clock after completion of the frequency correction. 如申請專利範圍第1項所述之方法,其另包含:將該組接收訊號彼此比較以產生對應於該組接收訊號之一非差動接收訊號;以及對該非差動接收訊號進行解多工運作以產生一組分別對應於複數個位元之解多工訊號,其中該複數個位元的順序對應於解多工前原始資訊在該非差動接收訊號的順序;其中對接收自該電子裝置之該通用序列匯流排埠之該組接收訊號所載之該訓練序列等化型樣進行該邊緣分析以取得該複數個邊緣數量估計值之步驟另包含:藉由比較該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準,來進行該邊緣分析。The method of claim 1, further comprising: comparing the set of received signals to each other to generate a non-differential receiving signal corresponding to one of the group of received signals; and demultiplexing the non-differential receiving signal Operating to generate a set of demultiplexed signals respectively corresponding to a plurality of bits, wherein the order of the plurality of bits corresponds to an order in which the pre-multiplexed original information is received in the non-differential signal; wherein the pair is received from the electronic device The step of performing the edge analysis to obtain the plurality of edge number estimates according to the training sequence equalization type carried by the group of received signals of the universal sequence bus includes: comparing the plurality of bits The edge analysis is performed for each voltage level of each of the two multiplexed signals corresponding to the multiplexed signals. 如申請專利範圍第2項所述之方法,其中對接收自該電子裝置之該通用序列匯流排埠之該組接收訊號所載之該訓練序列等化型樣進行該邊緣分析以取得該複數個邊緣數量估計值之步驟另包含:多次對該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準進行互斥或(Exclusive OR,XOR)運作,以產生分別對應於不同時間點之複數組互斥或運作結果;以及計算每一組互斥或運作結果的總和,並利用分別對應於該些時間點之總和作為針對該訓練序列等化型樣之分別對應於不同時間區間之邊緣數量估計值,以供產生該複數個分析結果之用。The method of claim 2, wherein the edge analysis is performed on the training sequence equalization type contained in the group of received signals received from the universal sequence bus of the electronic device to obtain the plurality of The step of estimating the number of edges further includes: performing multiple exclusive OR (XOR) operation on the voltage levels of the demultiplexed signals corresponding to each of the two adjacent bits of the plurality of bits, Generating a complex array of mutually exclusive or operational results corresponding to different points in time; and calculating a sum of each set of mutually exclusive or operational results, and using the sum corresponding to the respective time points as an equalization pattern for the training sequence Corresponding to the estimated number of edges of different time intervals, respectively, for generating the plurality of analysis results. 如申請專利範圍第3項所述之方法,其中依據該複數個邊緣數量估計值與該預定門檻值以產生複數個分析結果之步驟另包含:依序將該些邊緣數量估計值與該預定門檻值進行比較,以產生載有該複數個分析結果之一比較訊號,其中該比較訊號之不同位準交替出現的頻率代表該複數個分析結果當中不同類型的分析結果交替出現的頻率,而該些不同類型的分析結果交替出現的頻率係用來對該振盪器之該輸出時脈的頻率進行該頻率校正。The method of claim 3, wherein the step of generating the plurality of analysis results according to the plurality of edge number estimates and the predetermined threshold value further comprises: sequentially determining the edge quantity estimates and the predetermined threshold Comparing values to generate a comparison signal carrying the plurality of analysis results, wherein the frequency at which the different levels of the comparison signal alternately represents a frequency at which different types of analysis results alternate among the plurality of analysis results, and the frequencies The frequency at which the different types of analysis results alternate appears to be used to correct the frequency of the output clock of the oscillator. 如申請專利範圍第2項所述之方法,其中對接收自該電子裝置之該通用序列匯流排埠之該組接收訊號所載之該訓練序列等化型樣進行該邊緣分析以取得該複數個邊緣數量估計值之步驟另包含:於進行該邊緣分析時,依據該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準產生針對該訓練序列等化型樣之分別對應於不同時間區間之邊緣數量估計值,以供產生該複數個分析結果之用;其中依據該複數個邊緣數量估計值與該預定門檻值以產生複數個分析 結果之步驟另包含:依序將該些邊緣數量估計值與該預定門檻值進行比較,以產生載有該複數個分析結果之一比較訊號,其中該比較訊號之不同位準交替出現的頻率代表該複數個分析結果當中不同類型的分析結果交替出現的頻率,而該些不同類型的分析結果交替出現的頻率係用來對該振盪器之該輸出時脈的頻率進行該頻率校正。The method of claim 2, wherein the edge analysis is performed on the training sequence equalization type contained in the group of received signals received from the universal sequence bus of the electronic device to obtain the plurality of The step of estimating the edge number further includes: when performing the edge analysis, generating a uniformity for the training sequence according to respective voltage levels of the demultiplexed signals corresponding to each of the two adjacent bits of the plurality of bits The samples respectively correspond to edge quantity estimates of different time intervals for generating the plurality of analysis results; wherein the plurality of edge number estimates and the predetermined threshold value are used to generate a plurality of analyses The step of the result further comprises: sequentially comparing the edge quantity estimates with the predetermined threshold value to generate a comparison signal carrying the plurality of analysis results, wherein the frequency of the different levels of the comparison signal alternately appears The frequencies at which the different types of analysis results alternate between the plurality of analysis results, and the frequencies at which the different types of analysis results alternate appear to be used to correct the frequency of the output clock of the oscillator. 如申請專利範圍第1項所述之方法,其另包含:計算分別對應於該複數個邊緣數量估計值之邊緣密度;以及依序將該些邊緣密度和該預定門檻值進行比較,以產生該複數個分析結果。The method of claim 1, further comprising: calculating an edge density respectively corresponding to the plurality of edge number estimates; and sequentially comparing the edge densities with the predetermined threshold to generate the Multiple analysis results. 如申請專利範圍第1項所述之方法,其中於該頻率校正已完成時,該電子裝置之一時脈資料恢復電路(Clock Data Recovery Circuit,CDR Circuit)尚未鎖定該組接收訊號之相位。The method of claim 1, wherein the clock data recovery circuit (CDR Circuit) of the electronic device has not locked the phase of the group of received signals when the frequency correction is completed. 如申請專利範圍第1項所述之方法,其另包含:於完成該頻率校正之後利用該輸出時脈作為該參考時脈,藉此,於該頻率校正已完成時,該電子裝置之一時脈資料恢復電路(Clock Data Recovery Circuit,CDR Circuit)不需要先鎖定該組接收訊號之相位。The method of claim 1, further comprising: using the output clock as the reference clock after the frequency correction is completed, whereby one of the electronic devices is when the frequency correction is completed The Clock Data Recovery Circuit (CDR Circuit) does not need to lock the phase of the received signal. 如申請專利範圍第1項所述之方法,其中於該電子裝置中,不存在任何具備對應於頻率偏移比率小於10%之精確度的壓控振盪器。The method of claim 1, wherein in the electronic device, there is no voltage controlled oscillator having an accuracy corresponding to a frequency offset ratio of less than 10%. 如申請專利範圍第1項所述之方法,其另包含: 於完成該頻率校正之後利用該輸出時脈作為該參考時脈,藉此該電子裝置不需要設置任何具備對應於頻率偏移比率小於10%之精確度的壓控振盪器。The method of claim 1, wherein the method further comprises: The output clock is used as the reference clock after the frequency correction is completed, whereby the electronic device does not need to set any voltage controlled oscillator having an accuracy corresponding to a frequency offset ratio of less than 10%. 一種用來進行時脈抽取(Clock Extraction)之裝置,該裝置包含一電子裝置之至少一部分,該裝置包含有:一邊緣分析電路,用來對接收自該電子裝置之一通用序列匯流排埠(Universal Serial Bus Port,USB Port)之一組接收訊號所載之一訓練序列等化型樣(Training Sequence Equalization Pattern,TSEQ Pattern)進行邊緣分析,以取得複數個邊緣數量估計值,並且依據該複數個邊緣數量估計值與一預定門檻值以產生複數個分析結果,其中該些邊緣數量估計值係取自對該訓練序列等化型樣進行分別對應於複數個時間區間之邊緣數量估計;以及一參考時脈產生器,耦接至該邊緣分析電路,用來產生一參考時脈,其中該參考時脈產生器包含:一振盪器,用來產生一輸出時脈;以及一頻率校正單元,耦接至該邊緣分析電路與該振盪器,用來依據該複數個分析結果對該振盪器之該輸出時脈的頻率進行頻率校正,以於完成該頻率校正之後利用該輸出時脈作為該參考時脈。A device for performing Clock Extraction, the device comprising at least a portion of an electronic device, the device comprising: an edge analysis circuit for receiving a common sequence bus from the electronic device ( One of the groups of the Universal Serial Bus Port (USB Port) receives a training sequence equalization pattern (TSEQ Pattern) for edge analysis to obtain a plurality of edge number estimates, and according to the plurality of An edge number estimate and a predetermined threshold value to generate a plurality of analysis results, wherein the edge number estimates are obtained from edge quantity estimates corresponding to the plurality of time intervals respectively for the training sequence equalization pattern; and a reference a clock generator coupled to the edge analysis circuit for generating a reference clock, wherein the reference clock generator comprises: an oscillator for generating an output clock; and a frequency correction unit coupled The edge analysis circuit and the oscillator are configured to output the clock of the oscillator according to the plurality of analysis results Frequency correction rate, the clock as the reference clock time to completion after the frequency correction utilizing the output. 如申請專利範圍第11項所述之裝置,其另包含:一比較器,耦接至該通用序列匯流排埠,用來將該組接收訊號彼此比較以產生對應於該組接收訊號之一非差動接收訊號;以及一解多工器,耦接至該比較器,用來對該非差動接收訊號進行解多工運作以產生一組分別對應於複數個位元之解多工訊號,其中該複數 個位元的順序對應於解多工前原始資訊在該非差動接收訊號的順序;其中該邊緣分析電路包含:一訓練序列等化型樣邊緣計算器,耦接至該解多工器,用來藉由比較該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準,來進行該邊緣分析。The device of claim 11, further comprising: a comparator coupled to the universal sequence bus 埠 for comparing the set of received signals with each other to generate one of the received signals corresponding to the group a differential multiplexer coupled to the comparator for demultiplexing the non-differential received signal to generate a set of multiplexed signals corresponding to the plurality of bits, wherein The plural The order of the bits corresponds to the sequence of the pre-multiplexed original information in the non-differential receiving signal; wherein the edge analysis circuit comprises: a training sequence equalization type edge calculator coupled to the demultiplexer, The edge analysis is performed by comparing the respective voltage levels of the demultiplexed signals corresponding to each of the two adjacent bits of the plurality of bits. 如申請專利範圍第12項所述之裝置,其中該訓練序列等化型樣邊緣計算器包含:複數個互斥或(Exclusive OR,XOR)運算單元,耦接至該解多工器,用來多次對該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準進行互斥或運作,以產生分別對應於不同時間點之複數組互斥或運作結果;以及一加法單元,耦接至該複數個互斥或運算單元,用來計算每一組互斥或運作結果的總和,並利用分別對應於該些時間點之總和作為針對該訓練序列等化型樣之分別對應於不同時間區間之邊緣數量估計值,以供產生該複數個分析結果之用。The device of claim 12, wherein the training sequence equalization edge calculator comprises: a plurality of exclusive OR (XOR) operation units coupled to the demultiplexer for Multipleiating or operating the respective voltage levels of the demultiplexed signals corresponding to each of the two adjacent bits of the plurality of bits to generate a complex array mutual exclusion or operation result corresponding to different time points respectively And an addition unit coupled to the plurality of mutually exclusive or arithmetic units for calculating a sum of each group of mutually exclusive or operational results, and using the sum corresponding to the respective time points as equalization for the training sequence The patterns correspond to edge quantity estimates for different time intervals, respectively, for use in generating the plurality of analysis results. 如申請專利範圍第13項所述之裝置,其中該邊緣分析電路另包含:一比較單元,耦接至該訓練序列等化型樣邊緣計算器,用來依序將該些邊緣數量估計值與該預定門檻值進行比較,以產生載有該複數個分析結果之一比較訊號,其中該比較訊號之不同位準交替出現的頻率代表該複數個分析結果當中不同類型的分析結果交替出現的頻率,而該些不同類型的分析結果交替出現的頻率係用來對該振盪器之該輸出時脈的頻率進行該頻率校正。The apparatus of claim 13 , wherein the edge analysis circuit further comprises: a comparison unit coupled to the training sequence equalization edge calculator for sequentially estimating the number of edges Comparing the predetermined threshold values to generate a comparison signal carrying the plurality of analysis results, wherein the frequency at which the different levels of the comparison signal alternately represents a frequency at which different types of analysis results alternate among the plurality of analysis results, The frequencies at which the different types of analysis results alternate appear to be used to correct the frequency of the output clock of the oscillator. 如申請專利範圍第12項所述之裝置,其中於該邊緣分析電路進行該邊緣分析時,其內之該訓練序列等化型樣邊緣計算器依據該複數個位元中之每兩相鄰位元所對應之解多工訊號各自的電壓位準產生針對該訓練序列等化型樣之分別對應於不同時間區間之邊緣數量估計值,以供產生該複數個分析結果之用;以及該邊緣分析電路另包含:一比較單元,耦接至該訓練序列等化型樣邊緣計算器,用來依序將該些邊緣數量估計值與該預定門檻值進行比較,以產生載有該複數個分析結果之一比較訊號,其中該比較訊號之不同位準交替出現的頻率代表該複數個分析結果當中不同類型的分析結果交替出現的頻率,而該些不同類型的分析結果交替出現的頻率係用來對該振盪器之該輸出時脈的頻率進行該頻率校正。The device of claim 12, wherein the edge sequence analysis circuit performs the edge analysis, wherein the training sequence equalization edge calculator is based on each two adjacent bits of the plurality of bits The respective voltage levels of the multiplexed signals corresponding to the meta-response generate an estimate of the edge number corresponding to the different time intervals for the training sequence equalization type for generating the plurality of analysis results; and the edge analysis The circuit further includes: a comparison unit coupled to the training sequence equalization edge calculator for sequentially comparing the edge number estimates with the predetermined threshold to generate the plurality of analysis results a comparison signal, wherein the frequency at which the different levels of the comparison signal alternately represents a frequency at which different types of analysis results alternate among the plurality of analysis results, and the frequencies of the different types of analysis results alternately appear to be used The frequency of the output clock of the oscillator performs this frequency correction. 如申請專利範圍第11項所述之裝置,其中該邊緣分析電路計算分別對應於該複數個邊緣數量估計值之邊緣密度,並且依序將該些邊緣密度和該預定門檻值進行比較,以產生該複數個分析結果。The apparatus of claim 11, wherein the edge analysis circuit calculates edge densities respectively corresponding to the plurality of edge number estimates, and sequentially compares the edge densities with the predetermined threshold values to generate The plurality of analysis results. 如申請專利範圍第11項所述之裝置,其中於該頻率校正已完成時,該電子裝置之一時脈資料恢復電路(Clock Data Recovery Circuit,CDR Circuit)尚未鎖定該組接收訊號之相位。The device of claim 11, wherein the clock data recovery circuit (CDR Circuit) of the electronic device has not locked the phase of the group of received signals when the frequency correction is completed. 如申請專利範圍第11項所述之裝置,其中該裝置於完成該頻率校正之後利用該輸出時脈作為該參考時脈,藉此,於該頻率校正已完成時,該電子裝置之一時脈資料恢復電路(Clock Data Recovery Circuit,CDR Circuit)不需要鎖定該組接收訊號之相位。The device of claim 11, wherein the device uses the output clock as the reference clock after completing the frequency correction, thereby, when the frequency correction is completed, the clock data of the electronic device The Clock Data Recovery Circuit (CDR Circuit) does not need to lock the phase of the received signal. 如申請專利範圍第11項所述之裝置,其中於該電子裝置中,不存在任 何具備對應於頻率偏移比率小於10%之精確度的壓控振盪器。The device of claim 11, wherein the electronic device does not exist There is a voltage controlled oscillator corresponding to an accuracy of a frequency offset ratio of less than 10%. 如申請專利範圍第11項所述之裝置,其中該裝置於完成該頻率校正之後利用該輸出時脈作為該參考時脈,藉此該電子裝置不需要設置任何具備對應於頻率偏移比率小於10%之精確度的壓控振盪器。The device of claim 11, wherein the device uses the output clock as the reference clock after completing the frequency correction, whereby the electronic device does not need to be provided with any corresponding frequency offset ratio less than 10 % precision voltage controlled oscillator.
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