TWI464408B - Conductivity testing rod - Google Patents
Conductivity testing rod Download PDFInfo
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- TWI464408B TWI464408B TW098120548A TW98120548A TWI464408B TW I464408 B TWI464408 B TW I464408B TW 098120548 A TW098120548 A TW 098120548A TW 98120548 A TW98120548 A TW 98120548A TW I464408 B TWI464408 B TW I464408B
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- probe
- housing
- sleeve
- conductive test
- test rod
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Description
本發明涉及一種導電性測試棒。 The invention relates to a conductivity test bar.
隨著科技的進步,產品的外殼及零件表面廣泛採用鎂鋁合金材料,以達到輕、薄、能電磁遮罩且能較好散熱之目的。然,鎂鋁合金材料易氧化分解,故在產品的外殼表面常會覆蓋一層能導電且能使鎂鋁合金材料與空氣隔絕以防止鎂鋁合金材料氧化分解的保護膜。由於該保護膜非常薄,在測試該保護膜的導電性時,很容易被測試棒的探針刮傷。 With the advancement of technology, magnesium alloy materials are widely used on the outer shell and parts of the product to achieve light, thin, electromagnetic shielding and better heat dissipation. However, the magnesium-aluminum alloy material is easily oxidized and decomposed, so the surface of the outer shell of the product is often covered with a protective film which can conduct electricity and can isolate the magnesium-aluminum alloy material from the air to prevent oxidative decomposition of the magnesium-aluminum alloy material. Since the protective film is very thin, it is easily scratched by the probe of the test bar when the conductivity of the protective film is tested.
鑒於以上內容,有必要提供一種能有效測試保護膜的導電性且不會刮傷保護膜的導電性測試棒。 In view of the above, it is necessary to provide a conductive test rod which can effectively test the conductivity of the protective film without scratching the protective film.
一種導電性測試棒,包括一外殼、一接頭、一探棒及一軟性探頭,該外殼套設在該探棒上,該探棒的尾端及前端均伸出該外殼,該接頭安裝在該探棒的尾端,該軟性探頭安裝在該探棒的前端。 A conductive test rod comprising a casing, a joint, a probe and a soft probe, the outer casing is sleeved on the probe, the tail end and the front end of the probe are extended from the outer casing, and the joint is mounted on the At the end of the probe, the soft probe is mounted on the front end of the probe.
本發明導電性測試棒安裝了軟性探頭,使得該軟性探頭與該待測保護膜彈性接觸,準確地測試該待測保護膜的導電性且不會刮傷該待測保護膜。 The conductive test rod of the present invention is provided with a soft probe, so that the soft probe is in elastic contact with the protective film to be tested, and the conductivity of the protective film to be tested is accurately tested without scratching the protective film to be tested.
100‧‧‧第一殼體 100‧‧‧ first housing
120‧‧‧後蓋 120‧‧‧Back cover
112‧‧‧視窗 112‧‧‧Window
121‧‧‧第二通孔 121‧‧‧Second through hole
300‧‧‧探棒 300‧‧‧ Probe
320‧‧‧卡固裝置 320‧‧‧Keeping device
500‧‧‧軟性探頭 500‧‧‧Soft probe
110‧‧‧套筒 110‧‧‧ sleeve
111‧‧‧第一通孔 111‧‧‧First through hole
113‧‧‧中心標示 113‧‧‧ center marking
200‧‧‧第二殼體 200‧‧‧ second housing
310‧‧‧標示 310‧‧‧Marking
400‧‧‧接頭 400‧‧‧ connector
600‧‧‧彈簧 600‧‧ ‧ spring
圖1係本發明導電性測試棒的較佳實施方式的剖視圖。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a cross-sectional view showing a preferred embodiment of the conductive test bar of the present invention.
圖2係本發明導電性測試棒進行測試前的狀態圖。 2 is a state diagram of the conductive test bar of the present invention before being tested.
圖3係使用本發明導電性測試棒進行測試時的狀態圖。 Fig. 3 is a state diagram when tested using the conductivity tester of the present invention.
請一併參閱圖1及圖2,本發明導電性測試棒的較佳實施方式包括一外殼、一探棒300、一接頭400、一軟性探頭500及一彈簧600。該外殼包括一第一殼體100及一第二殼體200。 Referring to FIG. 1 and FIG. 2 together, a preferred embodiment of the conductive test bar of the present invention includes a housing, a probe 300, a connector 400, a soft probe 500, and a spring 600. The housing includes a first housing 100 and a second housing 200.
該第一殼體100包括一一端開口的圓柱形的套筒110及一後蓋120。該套筒110在靠近該開口的外側壁上設置有外螺紋,該套筒110的另一端開設一第一通孔111。該後蓋120的蓋面上設置有一第二通孔121,該後蓋120遠離蓋面的一端的內壁上設置有內螺紋,該套筒110與該後蓋120藉由該外螺紋及內螺紋固定相連。該第一殼體100的外側壁上還開設有一透明的視窗112,在該第一殼體100的外側壁上沿該視窗112的長邊的中分線設置有一中心標示113。本實施方式中,該第一殼體100的高度為14cm,半徑為0.7cm。 The first housing 100 includes a cylindrical sleeve 110 that is open at one end and a rear cover 120. The sleeve 110 is provided with an external thread on an outer side wall of the opening, and the other end of the sleeve 110 defines a first through hole 111. A second through hole 121 is disposed on the cover surface of the rear cover 120. The inner wall of the rear cover 120 away from the end surface of the cover surface is provided with an internal thread, and the sleeve 110 and the rear cover 120 are supported by the external thread and the inner cover. The threads are fixedly connected. A transparent window 112 is further defined on the outer side wall of the first housing 100. A center mark 113 is disposed on the outer side wall of the first housing 100 along the center line of the long side of the window 112. In the present embodiment, the first housing 100 has a height of 14 cm and a radius of 0.7 cm.
該第二殼體200為一中空的圓臺,其兩端均為開口。該第二殼體200的一端與該第一殼體100開設有該第一通孔111的一端固定相連。本實施方式中,該第二殼體200的高度為1cm,與該第一殼體100相連的一端的半徑為0.5cm,另一端的半徑為0.7cm。 The second housing 200 is a hollow circular table, and both ends thereof are open. One end of the second housing 200 is fixedly connected to one end of the first housing 100 on which the first through hole 111 is opened. In this embodiment, the height of the second casing 200 is 1 cm, and the radius of one end connected to the first casing 100 is 0.5 cm, and the radius of the other end is 0.7 cm.
該探棒300為一金屬圓棒,其半徑比該第一通孔111、第二通孔121均略小或者與該第一通孔111、第二通孔121的半徑相當。該探棒300上還設置有一標示310,該探棒300在靠近其一端的1/4處沿圓周面形成一突出的卡固裝置320,該探棒300遠離該卡固裝置 320的一端為一夾頭(圖未示)。 The probe 300 is a metal round bar having a radius slightly smaller than the first through hole 111 and the second through hole 121 or equivalent to the radius of the first through hole 111 and the second through hole 121. The probe 300 is further provided with an indicator 310. The probe 300 forms a protruding fastening device 320 along the circumferential surface at a quarter of the end of the probe 300. The probe 300 is away from the fastening device. One end of 320 is a collet (not shown).
該接頭400藉由一導線與一電阻測試儀(圖未示)連接,該軟性探頭500用於與一待測保護膜(圖未示)相接觸。本實施方式中,該軟性探頭500為一圓柱體狀的導電泡棉,其半徑為0.5cm,高度為0.5cm。其他實施方式中,該軟性探頭500亦可為其他形狀及材質,只要其具有較好的導電性且其與該待測保護膜接觸的一端柔軟即可。 The connector 400 is connected to a resistance tester (not shown) by a wire for contacting a protective film (not shown) to be tested. In the present embodiment, the flexible probe 500 is a cylindrical conductive foam having a radius of 0.5 cm and a height of 0.5 cm. In other embodiments, the soft probe 500 may have other shapes and materials as long as it has good electrical conductivity and is soft at the end that is in contact with the protective film to be tested.
裝配時,將該探棒300靠近該卡固裝置320的一端依次穿過該彈簧600、該後蓋120的第二通孔121之後與該接頭400相連。然後將該探棒300的另一端依次穿過該第一通孔111、第二殼體200後與該軟性探頭500相連,並將該後蓋120與該套筒110鎖固。此時,該彈簧600的一端抵於該後蓋120上、另一端抵於該卡固裝置320上。其中該探棒300靠近該卡固裝置320的一端設置有外螺紋,該接頭400上設置有一螺孔以與該探棒300的螺紋配合將接頭400安裝在探棒300上。該探棒300藉由該夾頭夾住該軟性探頭500。 In the assembly, the end of the probe 300 adjacent to the fastening device 320 passes through the spring 600 and the second through hole 121 of the rear cover 120 to be connected to the joint 400. Then, the other end of the probe 300 is sequentially connected to the soft probe 500 through the first through hole 111 and the second housing 200, and the rear cover 120 is locked with the sleeve 110. At this time, one end of the spring 600 abuts against the rear cover 120 and the other end abuts against the fastening device 320. An end of the probe 300 adjacent to the securing device 320 is provided with an external thread. The joint 400 is provided with a screw hole to cooperate with the thread of the probe 300 to mount the joint 400 on the probe 300. The probe 300 clamps the soft probe 500 by the collet.
其他實施方式中,該卡固裝置320亦可根據該彈簧600的大小設置於該探棒300的其他位置,只要使得彈簧600的一端抵於該後蓋120上、另一端抵於該卡固裝置320上即可。 In other embodiments, the securing device 320 can also be disposed at other positions of the probe 300 according to the size of the spring 600, so that one end of the spring 600 abuts against the rear cover 120 and the other end abuts the securing device. 320 can be.
本發明導電性測試棒使用過程如下:請參閱圖2,進行測試前該導電性測試棒的探棒300的標示310位於該窗口112遠離該後蓋120的下邊緣處。 The conductive test rod of the present invention is used as follows: Referring to FIG. 2, the indicator 310 of the probe 300 of the conductive test rod before the test is located at the lower edge of the window 112 away from the rear cover 120.
請參閱圖3,其為使用該導電性測試棒進行導電性測試時的狀態圖。使用者將該軟性探頭500與該待測保護膜相接觸,輕壓該第 一殼體100,該探棒300受到壓力作用向該第一殼體100內收縮,進而該軟性探頭500向該第二殼體200內收縮。當該探棒300的標示310正好與中心標示113處於同一水平線時,該軟性探頭500即可與該待測保護膜充分接觸,此時即可測試該待測保護膜的導電性。當測試完成之後,該軟性探頭500不再與該待測保護膜接觸,由於彈簧600的作用,該探棒300隨即向遠離該第二殼體200的方向行進直至該導電性測試棒的探棒300的標示310重新處於該窗口112遠離該後蓋120的下邊緣處。 Please refer to FIG. 3 , which is a state diagram when the conductivity test is performed using the conductivity test bar. The user touches the soft probe 500 with the protective film to be tested, and gently presses the first A housing 100 is pressurized by the probe 300 into the first housing 100, and the flexible probe 500 is contracted into the second housing 200. When the indicator 310 of the probe 300 is at the same horizontal line as the center mark 113, the soft probe 500 can be in sufficient contact with the protective film to be tested, and the conductivity of the protective film to be tested can be tested. After the test is completed, the soft probe 500 is no longer in contact with the protective film to be tested. Due to the action of the spring 600, the probe 300 then travels away from the second housing 200 until the probe of the conductive test rod The indication 310 of 300 is again at the lower edge of the window 112 away from the rear cover 120.
本發明導電性測試棒使用軟性探頭500與該待測保護膜彈性接觸,可準確地測試該待測保護膜的導電性且不會刮傷該待測保護膜。 The conductive test rod of the present invention is elastically contacted with the protective film to be tested by using the soft probe 500, and can accurately test the conductivity of the protective film to be tested without scratching the protective film to be tested.
綜上所述,本發明符合發明專利要件,爰依法提出專利申請。惟,以上所述者僅為本發明之較佳實施例,舉凡熟悉本案技藝之人士,在爰依本發明精神所作之等效修飾或變化,皆應涵蓋於以下之申請專利範圍內。 In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art will be included in the following claims.
100‧‧‧第一殼體 100‧‧‧ first housing
120‧‧‧後蓋 120‧‧‧Back cover
121‧‧‧第二通孔 121‧‧‧Second through hole
300‧‧‧探棒 300‧‧‧ Probe
400‧‧‧接頭 400‧‧‧ connector
600‧‧‧彈簧 600‧‧ ‧ spring
110‧‧‧套筒 110‧‧‧ sleeve
111‧‧‧第一通孔 111‧‧‧First through hole
200‧‧‧第二殼體 200‧‧‧ second housing
320‧‧‧卡固裝置 320‧‧‧Keeping device
500‧‧‧軟性探頭 500‧‧‧Soft probe
Claims (9)
Priority Applications (1)
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TW098120548A TWI464408B (en) | 2009-06-19 | 2009-06-19 | Conductivity testing rod |
Applications Claiming Priority (1)
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TW098120548A TWI464408B (en) | 2009-06-19 | 2009-06-19 | Conductivity testing rod |
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Publication Number | Publication Date |
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TW201100808A TW201100808A (en) | 2011-01-01 |
TWI464408B true TWI464408B (en) | 2014-12-11 |
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TW098120548A TWI464408B (en) | 2009-06-19 | 2009-06-19 | Conductivity testing rod |
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TW (1) | TWI464408B (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
US5416405A (en) * | 1993-08-02 | 1995-05-16 | Dill; David M. | Test probe with improved capture assembly and threaded needle point probe adjustment |
US5457392A (en) * | 1990-12-20 | 1995-10-10 | Filipescu; Radu | Testing clip and circuit board contacting method |
US20020171433A1 (en) * | 2001-05-16 | 2002-11-21 | Masahiro Watanabe | Voltage measuring apparatus for sheathed power cable |
CN200953412Y (en) * | 2006-10-11 | 2007-09-26 | 英业达股份有限公司 | Electric conduction mechanism |
CN101242715A (en) * | 2007-02-05 | 2008-08-13 | 亚旭电脑股份有限公司 | Portable electronic device with shell separation detection function |
-
2009
- 2009-06-19 TW TW098120548A patent/TWI464408B/en not_active IP Right Cessation
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4716365A (en) * | 1985-10-11 | 1987-12-29 | Lisle Corporation | Circuit tester |
US5457392A (en) * | 1990-12-20 | 1995-10-10 | Filipescu; Radu | Testing clip and circuit board contacting method |
US5416405A (en) * | 1993-08-02 | 1995-05-16 | Dill; David M. | Test probe with improved capture assembly and threaded needle point probe adjustment |
US20020171433A1 (en) * | 2001-05-16 | 2002-11-21 | Masahiro Watanabe | Voltage measuring apparatus for sheathed power cable |
CN200953412Y (en) * | 2006-10-11 | 2007-09-26 | 英业达股份有限公司 | Electric conduction mechanism |
CN101242715A (en) * | 2007-02-05 | 2008-08-13 | 亚旭电脑股份有限公司 | Portable electronic device with shell separation detection function |
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TW201100808A (en) | 2011-01-01 |
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