TWI461578B - Crucible - Google Patents

Crucible Download PDF

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Publication number
TWI461578B
TWI461578B TW101112237A TW101112237A TWI461578B TW I461578 B TWI461578 B TW I461578B TW 101112237 A TW101112237 A TW 101112237A TW 101112237 A TW101112237 A TW 101112237A TW I461578 B TWI461578 B TW I461578B
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Taiwan
Prior art keywords
gas guiding
guiding devices
reflecting device
crucible
growth chamber
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TW101112237A
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Chinese (zh)
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TW201341601A (en
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Chih Yung Hsiung
Dai Liang Ma
Chao Chun Peng
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Nat Inst Chung Shan Science & Technology
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Description

坩堝 crucible

本發明係關於一種坩堝,特別是一種可使長晶之熱輻射溫度梯度間隙緻密之坩堝。 The present invention relates to a crucible, particularly a crucible that densifies the thermal radiation temperature gradient gap of the crystal growth.

物理氣相傳輸法(Physical Vapor Transport,PVT)和物理氣相沉積法(Physical Vapor Deposition,PVD)係用做為碳化矽長晶的技術,其亦被用做為量產晶片之技術。例如美國專利號第US5,746,827號揭露之碳化矽長晶之方法,其係使用物理氣相傳輸法(PVT)以成長大尺寸之晶體。然而,其缺點為熱梯度間隙過大,保護氣體氣壓過低及晶種溫度和昇華氣體壓力調控不穩定,製程穩定度不足,造成生成晶體良率不佳,產生微管(熱分解孔)或多晶而失效。 Physical Vapor Transport (PVT) and Physical Vapor Deposition (PVD) are used as the technology for growing strontium carbide, which is also used as a technology for mass production of wafers. For example, a method of growing ruthenium carbide crystals disclosed in U.S. Patent No. 5,746,827 uses a physical vapor phase transfer (PVT) method to grow large-sized crystals. However, the disadvantages are that the thermal gradient gap is too large, the shielding gas pressure is too low, the seed crystal temperature and the sublimation gas pressure are unstable, the process stability is insufficient, and the crystal yield is poor, resulting in micro tubes (thermal decomposition pores) or more. Crystals fail.

又如美國專利號第US7,316,747號揭露之透過熱輻射以成長高品質碳化矽晶體之方法。然而此方法具有熱場不均勻之缺點,其會使得粉體源的分解速度不同而使得生長室內之氣體濃度不穩定,進而改變成長室分壓,使得單一多型的控制更加困難。 A method of growing high quality tantalum carbide crystals by thermal radiation as disclosed in U.S. Patent No. 7,316,747. However, this method has the disadvantage of uneven thermal field, which causes the decomposition rate of the powder source to be different, which makes the gas concentration in the growth chamber unstable, thereby changing the partial pressure of the growth chamber, making the control of a single multi-type more difficult.

又如美國專利號第US6,824,611號揭露之控制和增強高品質碳化矽單晶長晶之方法。然而,在此方法中,碳化矽增長最困難的方面是矽在高溫下的反應的性質,會在昇華過程中與石墨製成的容 器壁產生反應,這種反應難以控制,將生成過多的碳或矽進而改變昇華過程中的氣體組成成分。另外矽原子攻擊石墨製成的容器壁會產生碳屑而成為晶體內之雜質,影響晶體純度。 A method of controlling and enhancing the growth of high quality tantalum crystal single crystals disclosed in U.S. Patent No. 6,824,611. However, in this method, the most difficult aspect of the growth of niobium carbide is the nature of the reaction of niobium at high temperatures, which is made with graphite during the sublimation process. The wall reacts, which is difficult to control and will generate too much carbon or helium to change the gas composition during the sublimation process. In addition, helium atoms attack the walls of the container made of graphite to produce carbon dust and become impurities in the crystal, which affects the purity of the crystal.

因此,有必要提供一種新的長晶之設備,其可使得長晶之熱輻射溫度梯度間隙緻密、生長室內之氣體氣流穩定,以製造高品質碳化矽晶體。 Therefore, it is necessary to provide a new apparatus for crystal growth which can stabilize the thermal radiation temperature gradient gap of the crystal growth and stabilize the gas flow in the growth chamber to produce high quality silicon carbide crystals.

本發明之主要目的係在提供一種可使長晶之熱輻射溫度梯度間隙緻密之坩堝。 SUMMARY OF THE INVENTION The primary object of the present invention is to provide a crucible for densifying the thermal radiation temperature gradient of the crystal growth.

為達成上述之目的,本發明之坩堝係用於使一晶種藉由一材料源以長晶,該坩堝包括一成長室、一固持器、一反射裝置以及複數氣體導向裝置。固持器位於成長室之上方,用以固定晶種。反射裝置位於固持器之周圍。複數氣體導向裝置位於成長室之下方,用以容納材料源並引導氣化之材料源。 To achieve the above objects, the present invention is used to grow a seed crystal by a source of material comprising a growth chamber, a holder, a reflecting means, and a plurality of gas guiding means. The holder is located above the growth chamber to hold the seed crystal. The reflecting device is located around the holder. A plurality of gas guides are located below the growth chamber to accommodate the source of material and direct the source of vaporized material.

在本發明之第一實施例中,該複數氣體導向裝置的形狀係為針狀。 In the first embodiment of the invention, the plurality of gas guiding means are in the shape of a needle.

在本發明之第二實施例中,該複數氣體導向裝置的形狀係為棒狀。 In a second embodiment of the invention, the plurality of gas guiding means are in the shape of a rod.

在本發明之第三實施例中,該複數氣體導向裝置的形狀係為片狀,其排列方式為同心圓。 In a third embodiment of the invention, the plurality of gas guiding means are in the form of a sheet which is arranged in a concentric circle.

在本發明之第四實施例中,該複數氣體導向裝置的形狀係為片狀,其排列方式為螺旋狀。 In the fourth embodiment of the present invention, the plurality of gas guiding means are in the form of a sheet which is arranged in a spiral shape.

1,1a,1b,1c‧‧‧坩堝 1,1a,1b,1c‧‧‧坩埚

10‧‧‧成長室 10‧‧‧ Growth room

20‧‧‧固持器 20‧‧‧Retainer

30‧‧‧反射裝置 30‧‧‧Reflecting device

40,40a,40b,40c‧‧‧氣體導向裝置 40, 40a, 40b, 40c‧‧‧ gas guiding device

90‧‧‧晶種 90‧‧‧ seed crystal

91‧‧‧材料源 91‧‧‧Material source

A‧‧‧設置角度 A‧‧‧Set angle

L‧‧‧熱輻射 L‧‧‧thermal radiation

圖1係依據本發明之第一實施例之坩堝之示意圖。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a schematic illustration of a first embodiment of the present invention.

圖2係依據本發明之第一實施例之坩堝之示意圖。 Figure 2 is a schematic illustration of a first embodiment of the present invention.

圖3係依據本發明之第一實施例之已調整一設置角度之反射裝置之坩堝之示意圖。 Figure 3 is a schematic illustration of a top view of a reflective device having an angle set adjusted in accordance with a first embodiment of the present invention.

圖4係依據本發明之第一實施例之已調整一設置角度之反射裝置之坩堝之部分示意圖。 Figure 4 is a partial schematic view of a side of a reflecting device having an adjusted angle according to a first embodiment of the present invention.

圖5係依據本發明之第一實施例之坩堝之俯視圖。 Figure 5 is a plan view of a crucible in accordance with a first embodiment of the present invention.

圖6係依據本發明之第二實施例之坩堝之俯視圖。 Figure 6 is a plan view of a crucible in accordance with a second embodiment of the present invention.

圖7係依據本發明之第三實施例之坩堝之俯視圖。 Figure 7 is a plan view of a crucible in accordance with a third embodiment of the present invention.

圖8係依據本發明之第四實施例之坩堝之俯視圖。 Figure 8 is a plan view of a crucible in accordance with a fourth embodiment of the present invention.

為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉出本發明之具體實施例,並配合所附圖式,作詳細說明如下。 The above and other objects, features and advantages of the present invention will become more <

以下請一併參考圖1至圖4關於依據本發明之第一實施例之坩堝。圖1係依據本發明之第一實施例之坩堝之示意圖;圖2係依據本發明之第一實施例之坩堝之示意圖;圖3係依據本發明之第一實施例之已調整一設置角度之反射裝置之坩堝之示意圖;圖4係依據本發明之第一實施例之已調整一設置角度之反射裝置之坩堝之部分示意圖。 Hereinafter, please refer to FIG. 1 to FIG. 4 together with respect to the first embodiment according to the present invention. 1 is a schematic view of a first embodiment of the present invention; FIG. 2 is a schematic view of a first embodiment of the present invention; and FIG. 3 is an adjusted angle of arrangement according to the first embodiment of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 4 is a partial schematic view showing a state in which a set angle of reflection means has been adjusted in accordance with a first embodiment of the present invention.

如圖1至圖4所示,在本發明之第一實施例中,坩堝1用於使一晶 種90藉由一材料源91,以物理氣相傳輸法(Physical Vapor Transport,PVT)或物理氣相沉積法(Physical Vapor Deposition,PVD)長晶,然而長晶法並不以上述為限。坩堝1包括一成長室10、一固持器20、一反射裝置30以及複數氣體導向裝置40。 As shown in FIGS. 1 to 4, in the first embodiment of the present invention, 坩埚1 is used to make a crystal The seed crystal 90 is grown by a physical Vapor Transport (PVT) or a Physical Vapor Deposition (PVD) by a material source 91. However, the crystal growth method is not limited to the above. The crucible 1 includes a growth chamber 10, a holder 20, a reflecting device 30, and a plurality of gas guiding devices 40.

成長室10係用以容納材料源91以及使晶種90長晶。成長室10耐高溫並能將外部熱能傳遞至成長室10內部,使內部可藉由高溫以進行長晶。固持器20位於成長室10之上方,用以固定晶種90。反射裝置30位於固持器20之周圍,反射裝置30的一設置角度A係可調節為0度至30度之範圍內的任一角度(如圖4所示)。反射裝置30係由一高溫金屬碳化物,或者與成長室10或材料源91同質之一材料所製成,反射裝置30可承受1500℃至3000℃的溫度。反射裝置30係用以將內部之熱輻射L(如圖2所示)反射至複數氣體導向裝置40。透過不同的設置角度A,反射裝置30可以調整熱輻射L的反射角度,以調變熱場,並縮小溫度梯度影響區域的溫度分佈降低微管的發生。然而,設置角度A之角度範圍並不以0度至30度為限,其亦可為更大的角度範圍,反射裝置30可承受之溫度亦不以上述為限。 The growth chamber 10 is for accommodating the material source 91 and for crystallizing the seed crystal 90. The growth chamber 10 is resistant to high temperatures and can transfer external heat energy to the inside of the growth chamber 10 so that the interior can be grown by high temperature. The holder 20 is located above the growth chamber 10 for holding the seed crystal 90. The reflecting device 30 is located around the holder 20, and a set angle A of the reflecting device 30 can be adjusted to any angle within a range of 0 to 30 degrees (as shown in FIG. 4). The reflecting means 30 is made of a high temperature metal carbide or a material homogenous to the growth chamber 10 or the material source 91, and the reflecting means 30 can withstand a temperature of 1500 ° C to 3000 ° C. The reflecting means 30 is for reflecting the internal thermal radiation L (shown in Figure 2) to the plurality of gas guiding means 40. Through different setting angles A, the reflecting device 30 can adjust the reflection angle of the thermal radiation L to modulate the thermal field and reduce the temperature distribution of the temperature gradient influencing region to reduce the occurrence of microtubules. However, the angle range in which the angle A is set is not limited to 0 to 30 degrees, and may be a larger angle range, and the temperature that the reflecting device 30 can withstand is not limited to the above.

請參考圖5,圖5係依據本發明之第一實施例之坩堝之俯視圖。 Please refer to FIG. 5. FIG. 5 is a plan view of a crucible according to a first embodiment of the present invention.

如圖5所示,複數氣體導向裝置40位於成長室10之下方,複數氣體導向裝置40係自該複數氣體導向裝置40的中心向外等距排列;其中靠近中心之氣體導向裝置40的高度,高於靠近外圍之氣體導向裝置40的高度。複數氣體導向裝置40係由高溫金屬碳化物,或者與成長室10或材料源91同質之材料所製成。複數氣體導向裝置40的高度高於成長室10所容納的材料源91之高度。當成長室10所 容納的材料源91受熱而成為氣態時,複數氣體導向裝置40會引導氣化之材料源91上升,使氣化之材料源91接觸晶種90以長晶,而在氣化之材料源91上升之後,尚未氣化之材料源91即可成為氣態以遞補上升後的氣化之材料源91之空間,使得成長室10下方之材料源91可持續形成氣態並上升。在第一實施例中,複數氣體導向裝置40的形狀係為針狀,其直徑實質為2毫米以下。然而,複數氣體導向裝置40的形狀和直徑並不以此為限。 As shown in FIG. 5, the plurality of gas guiding devices 40 are located below the growth chamber 10, and the plurality of gas guiding devices 40 are arranged equidistantly outward from the center of the plurality of gas guiding devices 40; wherein the height of the gas guiding device 40 near the center is Higher than the height of the gas guide 40 near the periphery. The plurality of gas guiding devices 40 are made of a high temperature metal carbide or a material homogenous to the growth chamber 10 or the material source 91. The height of the plurality of gas guiding devices 40 is higher than the height of the material source 91 accommodated in the growth chamber 10. When growing room 10 When the contained material source 91 is heated to be in a gaseous state, the plurality of gas guiding devices 40 will direct the vaporized material source 91 to rise, causing the vaporized material source 91 to contact the seed crystal 90 to grow crystals, and rise in the vaporized material source 91. Thereafter, the material source 91 that has not been vaporized can be in a gaseous state to replenish the space of the ascending vaporized material source 91, so that the material source 91 below the growth chamber 10 can continue to form a gaseous state and rise. In the first embodiment, the plurality of gas guiding means 40 has a needle shape and a diameter of substantially 2 mm or less. However, the shape and diameter of the plurality of gas guiding devices 40 are not limited thereto.

在本發明中,製成反射裝置30和複數氣體導向裝置40之高溫金屬碳化物,或與成長室10或材料源91同質之材料的成分包括氧化物、碳化物、氮化物或氟化物,然而本發明並不以此為限。 In the present invention, the high temperature metal carbide of the reflecting means 30 and the plurality of gas guiding means 40, or the composition of the material homogenous to the growth chamber 10 or the material source 91, includes oxides, carbides, nitrides or fluorides. The invention is not limited thereto.

請參考圖6,圖6係依據本發明之第二實施例之坩堝之俯視圖。 Please refer to FIG. 6. FIG. 6 is a plan view of a crucible according to a second embodiment of the present invention.

如圖6所示,本發明之第二實施例與第一實施例之差別在於,在第二實施例中,坩堝1a的複數氣體導向裝置40a的形狀係為棒狀,其直徑實質為2毫米以上。然而,複數氣體導向裝置40a的形狀和直徑並不以此為限。 As shown in Fig. 6, the second embodiment of the present invention differs from the first embodiment in that, in the second embodiment, the plurality of gas guiding devices 40a of the crucible 1a are rod-shaped and have a diameter of substantially 2 mm. the above. However, the shape and diameter of the plurality of gas guiding devices 40a are not limited thereto.

請參考圖7,圖7係依據本發明之第三實施例之坩堝之俯視圖。 Please refer to FIG. 7. FIG. 7 is a plan view of a crucible according to a third embodiment of the present invention.

如圖7所示,本發明之第三實施例與上述實施例之差別在於,在第三實施例中,坩堝1b的複數氣體導向裝置40b的形狀係為片狀,其係以同心圓環的方式排列。然而,複數氣體導向裝置40b的形狀和排列方式並不以此為限。 As shown in Fig. 7, the third embodiment of the present invention differs from the above embodiment in that, in the third embodiment, the plurality of gas guiding devices 40b of the crucible 1b are in the form of a sheet which is concentrically shaped. Arranged in a way. However, the shape and arrangement of the plurality of gas guiding devices 40b are not limited thereto.

請參考圖8,圖8係依據本發明之第四實施例之坩堝之俯視圖。 Please refer to FIG. 8. FIG. 8 is a plan view of a crucible according to a fourth embodiment of the present invention.

如圖8所示,本發明之第四實施例與上述實施例之差別在於,在第四實施例中,坩堝1c的複數氣體導向裝置40c的形狀係為片狀,其係以螺旋狀的方式排列。然而,複數氣體導向裝置40c的形狀和排列方式並不以此為限。 As shown in Fig. 8, the fourth embodiment of the present invention differs from the above embodiment in that, in the fourth embodiment, the shape of the plurality of gas guiding devices 40c of the crucible 1c is in the form of a sheet which is in a spiral manner. arrangement. However, the shape and arrangement of the plurality of gas guiding devices 40c are not limited thereto.

綜上所陳,本發明無論就目的、手段及功效,在在均顯示其迴異於習知技術之特徵,懇請貴審查委員明察,早日賜准專利,俾嘉惠社會,實感德便。惟應注意的是,上述諸多實施例僅係為了便於說明而舉例而已,本發明所主張之權利範圍自應以申請專利範圍所述為準,而非僅限於上述實施例。 To sum up, the present invention, regardless of its purpose, means and efficacy, shows its distinctiveness in the characteristics of the prior art. You are requested to review the examination and express the patent as soon as possible. It should be noted that the various embodiments described above are merely illustrative for ease of explanation, and the scope of the invention is intended to be limited by the scope of the claims.

1‧‧‧坩堝 1‧‧‧坩埚

10‧‧‧成長室 10‧‧‧ Growth room

20‧‧‧固持器 20‧‧‧Retainer

30‧‧‧反射裝置 30‧‧‧Reflecting device

40‧‧‧氣體導向裝置 40‧‧‧ gas guiding device

90‧‧‧晶種 90‧‧‧ seed crystal

91‧‧‧材料源 91‧‧‧Material source

Claims (13)

一種坩堝,用於使一晶種藉由一材料源以長晶,該坩堝包括:一成長室,用以容納該材料源;一固持器,位於該成長室之上方,用以固定該晶種;一反射裝置,位於該固持器之周圍,該反射裝置係由一高溫金屬碳化物,或者與該成長室或該材料源同質之一材料所製成,該高溫金屬碳化物或該材料之成分包括氧化物、碳化物、氮化物或氟化物;以及複數氣體導向裝置,位於該成長室之下方,用以引導氣化之該材料源。 a crucible for causing a seed crystal to be grown by a material source, the crucible comprising: a growth chamber for containing the material source; and a holder located above the growth chamber for fixing the seed crystal a reflecting device located around the holder, the reflecting device being made of a high temperature metal carbide or a material homogenous to the growth chamber or the material source, the high temperature metal carbide or the composition of the material Including oxides, carbides, nitrides or fluorides; and a plurality of gas guiding means located below the growth chamber for directing the source of gasification. 如申請專利範圍第1項所述之坩堝,其中該反射裝置的一設置角度係可調節為0度至30度之範圍內的角度。 As described in claim 1, the setting angle of the reflecting device can be adjusted to an angle in the range of 0 to 30 degrees. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置的排列方式,係自該複數氣體導向裝置的中心向外等距排列。 As described in claim 1, the plurality of gas guiding devices are arranged in an equidistant manner from the center of the plurality of gas guiding devices. 如申請專利範圍第3項所述之坩堝,其中靠近該複數氣體導向裝置的中心之該氣體導向裝置的高度,高於靠近該複數氣體導向裝置的外圍之該氣體導向裝置的高度。 As described in claim 3, wherein the height of the gas guiding device near the center of the plurality of gas guiding devices is higher than the height of the gas guiding device near the periphery of the plurality of gas guiding devices. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置的高度高於該材料源。 The invention of claim 1, wherein the plurality of gas guiding devices have a height higher than the material source. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置的形狀係為針狀,該複數氣體導向裝置的直徑實質為2毫米以下。 The enthalpy of the first aspect of the invention, wherein the plurality of gas guiding devices are in the shape of a needle, and the plurality of gas guiding devices have a diameter of substantially 2 mm or less. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置的 形狀係為棒狀,該複數氣體導向裝置的直徑實質為2毫米以上。 As claimed in claim 1, wherein the plurality of gas guiding devices The shape is a rod shape, and the diameter of the plurality of gas guiding devices is substantially 2 mm or more. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置的形狀係為片狀。 The enthalpy of claim 1, wherein the plurality of gas guiding devices are in the form of a sheet. 如申請專利範圍第8項所述之坩堝,其中該複數氣體導向裝置係以同心圓環或螺旋狀的方式排列。 As described in claim 8, wherein the plurality of gas guiding devices are arranged in a concentric ring or a spiral. 如申請專利範圍第1項所述之坩堝,其中該複數氣體導向裝置係由該高溫金屬碳化物,或者與該成長室或該材料源同質之一材料所製成,該高溫金屬碳化物或該材料之成分包括氧化物、碳化物、氮化物或氟化物。 The invention as claimed in claim 1, wherein the plurality of gas guiding devices are made of the high temperature metal carbide or a material homogenous to the growth chamber or the material source, the high temperature metal carbide or the The composition of the material includes oxides, carbides, nitrides or fluorides. 如申請專利範圍第1項所述之坩堝,其中該反射裝置和該複數氣體導向裝置可承受1500℃至3000℃的溫度。 The invention described in claim 1, wherein the reflecting device and the plurality of gas guiding devices can withstand a temperature of 1500 ° C to 3000 ° C. 一種反射裝置,係用以反射一坩堝之內部之複數熱輻射,該坩堝包括一固持器,該反射裝置位於該固持器之周圍,其中該反射裝置係由一高溫金屬碳化物所製成,該高溫金屬碳化物或該材料之成分包括氧化物、碳化物、氮化物或氟化物,該反射裝置可承受1500℃至3000℃的溫度。 A reflecting device for reflecting a plurality of internal heat radiation of a crucible, the crucible comprising a holder, the reflecting device being located around the holder, wherein the reflecting device is made of a high temperature metal carbide, The high temperature metal carbide or a component of the material includes an oxide, a carbide, a nitride or a fluoride, and the reflecting device can withstand a temperature of 1500 ° C to 3000 ° C. 如申請專利範圍第12項所述之反射裝置,該反射裝置的一設置角度係可調節為0度至30度之範圍內的角度。 A reflecting device according to claim 12, wherein a setting angle of the reflecting device is adjustable to an angle in the range of 0 to 30 degrees.
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US7387680B2 (en) * 2005-05-13 2008-06-17 Cree, Inc. Method and apparatus for the production of silicon carbide crystals

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US7387680B2 (en) * 2005-05-13 2008-06-17 Cree, Inc. Method and apparatus for the production of silicon carbide crystals

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