TWI460567B - Method for error compensating and method for measuring workpiece using the same - Google Patents

Method for error compensating and method for measuring workpiece using the same Download PDF

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TWI460567B
TWI460567B TW098113729A TW98113729A TWI460567B TW I460567 B TWI460567 B TW I460567B TW 098113729 A TW098113729 A TW 098113729A TW 98113729 A TW98113729 A TW 98113729A TW I460567 B TWI460567 B TW I460567B
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standard
error
guide rail
measuring
probe
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TW098113729A
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TW201039085A (en
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Wei Huang
Yang Miao-An Ou
Jun-Qi Li
Qing Liu
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Hon Hai Prec Ind Co Ltd
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Description

誤差補正方法及採用該誤差補正方法之工件測量方法 Error correction method and workpiece measurement method using the error correction method

本發明涉及一種誤差補正方法及採用該誤差補正方法之工件測量方法,尤其涉及一種採用軟體處理之誤差補正方法及工件測量方法。 The invention relates to an error correction method and a workpiece measurement method using the error correction method, in particular to an error correction method and a workpiece measurement method using software processing.

於超精密測量領域,提高測量精度方法普遍為從硬體設計上著手,如採用測量精度較高之接觸式測量裝置等。為了保證測量精度,接觸式測量裝置中通常會採用價格較高之精密零部件,如高精度導軌、測頭及干涉儀等。另,為了獲得精確之測量結果,對測量裝置之機械傳動及裝配精度同樣有較高之要求,如此進一步增加了測量裝置之製造成本。故,現有超精密測量裝置之整體價格普遍非常高,限制了超精密測量裝置之廣泛應用。 In the field of ultra-precision measurement, methods for improving measurement accuracy generally start with hardware design, such as contact measurement devices with high measurement accuracy. In order to ensure the measurement accuracy, high-precision precision parts such as high-precision guide rails, probes and interferometers are usually used in contact measuring devices. In addition, in order to obtain accurate measurement results, the mechanical transmission and assembly accuracy of the measuring device are also highly demanded, which further increases the manufacturing cost of the measuring device. Therefore, the overall price of the existing ultra-precision measuring devices is generally very high, which limits the wide application of ultra-precision measuring devices.

鑒於上述狀況,有必要提供一種可降低測量裝置成本且可保證測量精度之誤差補正方法及採用該誤差補正方法之工件測量方法。 In view of the above situation, it is necessary to provide an error correction method which can reduce the cost of the measuring device and can ensure the measurement accuracy, and a workpiece measuring method using the error correction method.

一種誤差補正方法,包括如下步驟:提供一測量裝置,該測量裝置包括二測頭及導軌;對導軌之真直度誤差進行測量並補正,對導軌之真直度誤差進行 測量之過程中,提供一標準球及標準平面,使該標準球及標準平面分別位於測量裝置之二側,將其中一測頭與標準球之表面接觸以對標準球進行測量,將另一測頭與標準平面接觸以對標準平面進行測量,藉由對標準球及標準平面進行之測量及標準平面之安裝傾斜誤差,得出該導軌之真直度誤差;擬合測頭之安裝傾斜角;計算測頭之形狀誤差;及生成系統誤差補正文件。 An error correction method includes the following steps: providing a measuring device, the measuring device comprising two probes and a guide rail; measuring and correcting the true straightness error of the guide rail, and performing true straightness error on the guide rail During the measurement process, a standard ball and a standard plane are provided, so that the standard ball and the standard plane are respectively located on two sides of the measuring device, and one of the probes is in contact with the surface of the standard ball to measure the standard ball, and another test is performed. The head is in contact with the standard plane to measure the standard plane. The measurement of the standard sphere and the standard plane and the installation tilt error of the standard plane are used to obtain the true straightness error of the guide rail; fitting the installation tilt angle of the probe; The shape error of the probe; and the system error correction file is generated.

一種工件測量方法,包括如下步驟:提供一測量裝置,該測量裝置包括二測頭及導軌;對導軌之真直度誤差進行測量並補正,對導軌之真直度誤差進行測量之過程中,提供一標準球及標準平面,使該標準球及標準平面分別位於測量裝置之二側,將其中一測頭與標準球之表面接觸以對標準球進行測量,將另一測頭與標準平面接觸以對標準平面進行測量,藉由對標準球及標準平面進行之測量及標準平面之安裝傾斜誤差,得出該導軌之真直度誤差;擬合測頭之安裝傾斜角;計算測頭之形狀誤差;生成系統誤差補正文件;提供一工件,該工件具有曲面或者曲線;採用測量裝置對工件之曲面或者曲線進行測量; 對導軌之真直度誤差進行測量並補正;對測頭之安裝傾斜角誤差進行補正;對測頭之形狀誤差進行補正;及系統生成測量誤差。 A workpiece measuring method includes the following steps: providing a measuring device comprising two measuring heads and a guide rail; measuring and correcting the true straightness error of the guide rail, and providing a standard in the process of measuring the true straightness error of the guide rail The ball and the standard plane are such that the standard ball and the standard plane are respectively located on two sides of the measuring device, one of the probes is in contact with the surface of the standard ball to measure the standard ball, and the other probe is in contact with the standard plane to the standard The plane is measured, and the true straightness error of the guide rail is obtained by measuring the standard sphere and the standard plane and the installation tilt error of the standard plane; fitting the tilt angle of the probe; calculating the shape error of the probe; generating system Error correction file; providing a workpiece having a curved surface or a curved line; measuring the curved surface or curve of the workpiece by using a measuring device; The true straightness error of the guide rail is measured and corrected; the tilt angle error of the probe is corrected; the shape error of the probe is corrected; and the system generates measurement error.

上述誤差補正方法及採用該誤差補正方法之工件測量方法中,藉由對測量裝置因各種因素而產之誤差之補正,可得到較高之測量精度。由於採用軟體補正之方式來減少各種誤差對測量精度之影響,故採用該誤差補正方法之測量裝置之製造、裝配及傳動等精度要求可適當降低,以減少價格較高之精密零部件之使用數量,進而大大降低了測量裝置之製造成本。 In the above error correction method and the workpiece measurement method using the error correction method, high measurement accuracy can be obtained by correcting the error of the measurement device due to various factors. Since the effect of various errors on the measurement accuracy is reduced by the method of software correction, the accuracy requirements for manufacturing, assembly, and transmission of the measuring device using the error correction method can be appropriately reduced to reduce the number of precision parts used at higher prices. Thereby, the manufacturing cost of the measuring device is greatly reduced.

100‧‧‧誤差補正方法 100‧‧‧Error correction method

20‧‧‧測量裝置 20‧‧‧Measurement device

21‧‧‧測頭 21‧‧‧ probe

23‧‧‧導軌 23‧‧‧ rails

40‧‧‧標準球 40‧‧‧Standard ball

50‧‧‧標準平面 50‧‧‧ standard plane

200‧‧‧工件測量方法 200‧‧‧Workpiece measurement method

60‧‧‧工件 60‧‧‧Workpiece

圖1係本發明實施方式之誤差補正方法之流程圖。 1 is a flow chart of an error correction method according to an embodiment of the present invention.

圖2係圖1所示誤差補正方法中測量標準球之示意圖。 FIG. 2 is a schematic diagram of measuring a standard sphere in the error correction method shown in FIG. 1. FIG.

圖3係本發明實施方式之工件測量方法之流程圖。 3 is a flow chart of a workpiece measuring method according to an embodiment of the present invention.

圖4係圖3所示工件測量方法中測量工件之示意圖。 Fig. 4 is a schematic view showing the measurement of the workpiece in the workpiece measuring method shown in Fig. 3.

下面結合附圖及實施方式對本發明提供之誤差補正方法及採用該誤差補正方法之工件測量方法作進一步詳細說明。 The error correction method provided by the present invention and the workpiece measurement method using the error correction method will be further described in detail below with reference to the accompanying drawings and embodiments.

請參閱圖1及圖2,本發明提供之誤差補正方法100包括如下步驟:S102,提供一測量裝置20,該測量裝置20為接觸式測量裝置,包括測頭21及導軌23,測量裝置20中測頭21之數量為二; S104,對導軌23之真直度誤差e1進行測量並補正;導軌23之真直度誤差e1可藉由以下方法進行測量與補正。首先,提供一標準球40及標準平面50,使該標準球40及標準平面50分別位於測量裝置20之二側。接著,將測量裝置20之其中一測頭21與標準球40之表面接觸以對標準球40進行測量。另一測頭21與標準平面50接觸以對標準平面50進行測量。 Referring to FIG. 1 and FIG. 2, the error correction method 100 provided by the present invention includes the following steps: S102, providing a measuring device 20, which is a contact measuring device, including a measuring head 21 and a guide rail 23, in the measuring device 20 The number of the probes 21 is two; S104, the true straightness error e 1 of the guide rail 23 is measured and corrected; the true straightness error e 1 of the guide rail 23 can be measured and corrected by the following method. First, a standard ball 40 and a standard plane 50 are provided such that the standard ball 40 and the standard plane 50 are respectively located on two sides of the measuring device 20. Next, one of the probes 21 of the measuring device 20 is brought into contact with the surface of the standard ball 40 to measure the standard ball 40. Another probe 21 is in contact with the standard plane 50 to measure the standard plane 50.

然後,一測頭21對標準球40之表面進行掃描,得到標準球40一系列之掃描數據(Xn,dz1n)(n=1,2,3……)。另一測頭21對標準平面50進行測量,可採集到導軌23之偏移數據(Xn,dz2n)(n=1,2,3……)。 Then, a probe 21 scans the surface of the standard ball 40 to obtain a series of scan data (Xn, dz1 n ) of the standard sphere 40 (n = 1, 2, 3, ...). The other probe 21 measures the standard plane 50, and the offset data (Xn, dz2 n ) of the guide rail 23 (n = 1, 2, 3, ...) can be acquired.

根據偏移數據(Xn,dz2n)進行直線擬合,得到擬合值k以及附加值b。 A straight line fit is performed based on the offset data (Xn, dz2 n ) to obtain a fitted value k and an additional value b.

標準平面50存於安裝傾斜誤差,假設標準平面50之傾斜角為θ,那麼傾斜角便可根據如下公式得到:k=tan θ (1) The standard plane 50 is stored in the tilt error. Assuming that the tilt angle of the standard plane 50 is θ, the tilt angle can be obtained according to the following formula: k=tan θ (1)

導軌23之真直度誤差e1則為:e1=dz2n-(k*Xn+b) (2) The true straightness error e1 of the guide rail 23 is: e1=dz2 n -(k*Xn+b) (2)

經過對導軌23之真直度誤差e1補正之後之補正值L1則為:L1=dz1n+e1 (3) After the correction of the true straightness error e1 of the guide rail 23, the correction value L1 is: L1=dz1 n +e1 (3)

S106,擬合測頭21之安裝傾斜角α;測頭21與標準球40之接觸點之切線角度為β,因為存於安裝傾斜 角α,故假設經過導軌23之真直度誤差e1補正後之測量值為L2,則:L2=L1*(cos(α)+sin(α)*tan(β)) (4) S106, fitting the mounting tilt angle α of the probe 21; the tangent angle of the contact point between the probe 21 and the standard ball 40 is β, and since it is stored at the installation tilt angle α, it is assumed that the true straightness error e 1 of the guide rail 23 is corrected. The measured value is L 2 , then: L 2 = L 1 *(cos(α)+sin(α)*tan(β)) (4)

假設測頭21不存於安裝傾斜角α時之理論值為L’,採用非線性最小二乘法可擬合出測頭之安裝傾斜角度α。 Assuming that the probe 21 does not have a theoretical value L' when the tilt angle α is installed, the mounting tilt angle α of the probe can be fitted by a nonlinear least squares method.

S108,計算對測頭21之形狀誤差e2;藉由前述步驟得到導軌23之之真直度誤差e1以及測頭21之安裝傾斜角度α,根據如下公式:e2=L1-L’ (5) S108, calculating the shape error e 2 of the probe 21; obtaining the true straightness error e 1 of the guide rail 23 and the mounting tilt angle α of the probe 21 by the foregoing steps, according to the following formula: e 2 =L 1 -L' ( 5)

可得到測頭之形狀誤差e2The shape error e 2 of the probe can be obtained.

S110,生成系統誤差補正文件。 S110, generating a system error correction file.

根據得到之形狀誤差e2,將其與測頭21與標準球40之各接觸點之切線角度β一一對應,可生成系統誤差補正文件。 According to the obtained shape error e 2 , it is associated with the tangent angle β of each contact point of the probe 21 and the standard ball 40, and a systematic error correction file can be generated.

請同時參閱圖1、圖3及圖4,本發明提供之工件測量方法200包括如下步驟: Referring to FIG. 1 , FIG. 3 and FIG. 4 simultaneously, the workpiece measuring method 200 provided by the present invention includes the following steps:

S202,藉由上述誤差補正方法100生成系統誤差補正數據; S202, generating system error correction data by using the error correction method 100;

S204,提供一工件60,該工件60具有曲面或者曲線; S204, providing a workpiece 60 having a curved surface or a curved line;

S206,採用測量裝置20對工件之曲面或者曲線進行測量;假設該工件之理論值為A,未進行補正時之測量值為A1S206, using the measuring device 20 or a curved surface of the workpiece is measured; hypothesis of the workpiece is A, the measurement is not performed when the correction value A 1.

S208,對導軌23之真直度誤差e進行測量並補正; 因為導軌23之真直度誤差e於每次測量之時候都可能發生變化,故可藉由與步驟S104相同之方式對導軌23之真直度誤差e進行測量並補正。 S208, measuring and correcting the true straightness error e of the guide rail 23; Since the true straightness error e of the guide rail 23 may vary at each measurement, the true straightness error e of the guide rail 23 can be measured and corrected in the same manner as in the step S104.

S210,對測頭21之安裝傾斜角α誤差進行補正;因為測頭21之安裝傾斜角α為一固定值,故於步驟S208測出導軌之真直度誤差e後,電腦可對測頭21之安裝傾斜角α誤差自動進行補正。 S210, the installation tilt angle α error of the probe 21 is corrected; because the installation tilt angle α of the probe 21 is a fixed value, after the true straightness error e of the guide rail is measured in step S208, the computer can measure the probe 21 The installation tilt angle α error is automatically corrected.

S212,對測頭21之形狀誤差e2進行補正;因為測頭21之形狀誤差e2也為一固定值,故電腦可對其自動補正。 S212, the shape error e 2 of the probe 21 is corrected; since the shape error e 2 of the probe 21 is also a fixed value, the computer can automatically correct it.

S214,系統生成測量誤差Err。 S214, the system generates a measurement error Err.

藉由前述步驟可計算出對各種誤差補正後之測量值A2:A2=(A1+e)*(cos(α)+sin(α)*tan(β))-e2 (6) By the foregoing steps, the measured value A 2 after correction of various errors can be calculated: A 2 = (A 1 + e) * (cos (α) + sin (α) * tan (β)) - e 2 (6)

故得到測量誤差Err:Err=A2-A=(A1+e)*(cos(α)+sin(α)*tan(β))-e2-A (7) Therefore, the measurement error Err is obtained: Err=A 2 -A=(A 1 +e)*(cos(α)+sin(α)*tan(β))-e 2 -A (7)

本發明實施方式中,採用於電腦中建立數學模型之軟體補正方法來對測量中之各種誤差進行補正,可得到較高之測量精準度,同時降低了對測量裝置20之製造、安裝及傳動之精度要求,故降低了成本。 In the embodiment of the present invention, the software correction method for establishing a mathematical model in the computer is used to correct various errors in the measurement, thereby obtaining higher measurement accuracy and reducing the manufacturing, installation and transmission of the measuring device 20. The accuracy is required, so the cost is reduced.

綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限 制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and cannot be limited thereto. The scope of the patent application for this case. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

Claims (8)

一種誤差補正方法,包括以下步驟:提供一測量裝置,所述之測量裝置包括二測頭及導軌;對導軌之真直度誤差進行測量並補正,對導軌之真直度誤差進行測量之過程中,提供一標準球及標準平面,使該標準球及標準平面分別位於測量裝置之二側,將其中一測頭與標準球之表面接觸以對標準球進行測量,將另一測頭與標準平面接觸以對標準平面進行測量,藉由對標準球及標準平面進行之測量及標準平面之安裝傾斜誤差,得出該導軌之真直度誤差;擬合測頭之安裝傾斜角;計算測頭之形狀誤差;及生成系統誤差補正文件。 An error correction method includes the following steps: providing a measuring device, the measuring device comprising two probes and a guide rail; measuring and correcting the true straightness error of the guide rail, and measuring the true straightness error of the guide rail a standard ball and a standard plane, the standard ball and the standard plane are respectively located on two sides of the measuring device, one of the probes is in contact with the surface of the standard ball to measure the standard ball, and the other probe is in contact with the standard plane The standard plane is measured, and the true straightness error of the guide rail is obtained by measuring the standard sphere and the standard plane and the installation tilt error of the standard plane; fitting the installation tilt angle of the probe; calculating the shape error of the probe; And generate system error correction files. 如申請專利範圍第1項所述之誤差補正方法,其中於對導軌之真直度誤差進行測量之過程中,二側頭之一測頭對標準球之表面進行掃描,得到標準球一系列之掃描數據,二側頭之另一測頭對標準平面進行測量,可採集到導軌之偏移數據,根據偏移數據進行直線擬合,得到擬合值以及附加值,擬合值等於標準平面之傾斜角之正切,根據偏移數據、擬合值以及附加值,得出對該導軌之真直度誤差補正之後之補正值。 For example, in the error correction method described in claim 1, wherein one of the two side heads scans the surface of the standard ball during the measurement of the true straightness error of the guide rail, and obtains a series of scanning of the standard ball. Data, another probe on the two side heads measures the standard plane, can collect the offset data of the guide rail, and perform straight line fitting according to the offset data to obtain the fitted value and the added value, and the fitting value is equal to the inclination of the standard plane. The tangent of the angle, based on the offset data, the fitted value, and the added value, the correction value after the correction of the true straightness error of the guide rail is obtained. 如申請專利範圍第2項所述之誤差補正方法,其中該測頭之安裝傾斜角採用最小二乘法擬合。 The error correction method described in claim 2, wherein the installation tilt angle of the probe is fitted by a least squares method. 如申請專利範圍第1項所述之誤差補正方法,其中該測量裝置為接觸式測量裝置。 The error correction method according to claim 1, wherein the measuring device is a contact measuring device. 一種工件測量方法,包括以下步驟: 提供一測量裝置,該測量裝置包括二測頭及導軌;對導軌之真直度誤差進行測量並補正,對導軌之真直度誤差進行測量之過程中,提供一標準球及標準平面,使該標準球及標準平面分別位於測量裝置之兩側,將其中一測頭與標準球之表面接觸以對標準球進行測量,將另一測頭與標準平面接觸以對標準平面進行測量,藉由對標準球及標準平面進行之測量及標準平面之安裝傾斜誤差,得出該導軌之真直度誤差;擬合測頭之安裝傾斜角;計算測頭之形狀誤差;生成系統誤差補正文件;提供一工件,該工件具有曲面或者曲線;採用測量裝置對該工件之曲面或者曲線進行測量;對導軌之真直度誤差進行測量並補正;對測頭之安裝傾斜角誤差進行補正;對測頭之形狀誤差進行補正;及系統生成測量誤差。 A method of measuring a workpiece, comprising the following steps: Providing a measuring device comprising two probes and a guide rail; measuring and correcting the true straightness error of the guide rail, and providing a standard ball and a standard plane during the measurement of the true straightness error of the guide rail, so that the standard ball is provided And the standard planes are respectively located on both sides of the measuring device, one of the probes is in contact with the surface of the standard ball to measure the standard ball, and the other probe is in contact with the standard plane to measure the standard plane, by using the standard ball And the standard plane measurement and the standard plane installation tilt error, the true straightness error of the guide rail is obtained; the installation tilt angle of the probe is fitted; the shape error of the probe is calculated; the system error correction file is generated; and a workpiece is provided. The workpiece has a curved surface or a curved line; the surface or curve of the workpiece is measured by a measuring device; the true straightness error of the guide rail is measured and corrected; the tilt angle error of the mounting head is corrected; and the shape error of the measuring head is corrected; And the system generates measurement errors. 如申請專利範圍第5項所述之工件測量方法,其中於對導軌之真直度誤差進行測量並補正之步驟中,二側頭之一測頭對標準球之表面進行掃描,得到標準球一系列之掃描數據,二側頭之另一測頭對標準平面進行測量,可採集到導軌之偏移數據,根據偏移數據進行直線擬合,得到擬合值以及附加值,擬合值等於標準平面之傾斜角之正切,根據偏移數據、擬合值以及附加值,得出對該導軌之真直度誤差補正之後之補正值。 The workpiece measuring method according to claim 5, wherein in the step of measuring and correcting the true straightness error of the guide rail, one of the two side heads scans the surface of the standard ball to obtain a series of standard balls. Scanning data, the other side of the two heads measure the standard plane, the offset data of the guide rail can be collected, and the straight line fitting is performed according to the offset data to obtain the fitted value and the added value, and the fitting value is equal to the standard plane. The tangent of the tilt angle is based on the offset data, the fitted value, and the added value to obtain a correction value after the true straightness error of the guide rail is corrected. 如申請專利範圍第6項所述之工件測量方法,其中該測頭之安裝傾斜角採用最小二乘法擬合。 The workpiece measuring method according to claim 6, wherein the mounting tilt angle of the probe is fitted by a least squares method. 如申請專利範圍第5項所述之工件測量方法,其中該測量裝置為接觸式測 量裝置。 The workpiece measuring method according to claim 5, wherein the measuring device is a contact type measuring method Measuring device.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0587557A (en) * 1991-09-27 1993-04-06 Toyoda Mach Works Ltd Three dimensional measurement device
US6539642B1 (en) * 1999-03-03 2003-04-01 Riken Probe type shape measuring sensor, and NC processing equipment and shape measuring method using the sensor
EP1431706A2 (en) * 2002-12-20 2004-06-23 Fanuc Ltd Reducing measurement error in an optical sensor for measuring an object in three dimensions
TW200912242A (en) * 2007-06-28 2009-03-16 Hexagon Metrology Spa Co-ordinate measuring machine, and corresponding compensation method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0587557A (en) * 1991-09-27 1993-04-06 Toyoda Mach Works Ltd Three dimensional measurement device
US6539642B1 (en) * 1999-03-03 2003-04-01 Riken Probe type shape measuring sensor, and NC processing equipment and shape measuring method using the sensor
EP1431706A2 (en) * 2002-12-20 2004-06-23 Fanuc Ltd Reducing measurement error in an optical sensor for measuring an object in three dimensions
TW200912242A (en) * 2007-06-28 2009-03-16 Hexagon Metrology Spa Co-ordinate measuring machine, and corresponding compensation method

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