TWI460444B - Dummy battery apparatus - Google Patents

Dummy battery apparatus Download PDF

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Publication number
TWI460444B
TWI460444B TW098138162A TW98138162A TWI460444B TW I460444 B TWI460444 B TW I460444B TW 098138162 A TW098138162 A TW 098138162A TW 98138162 A TW98138162 A TW 98138162A TW I460444 B TWI460444 B TW I460444B
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Taiwan
Prior art keywords
power supply
supply device
resistor
output
test power
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TW098138162A
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Chinese (zh)
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TW201116843A (en
Inventor
Chun Chin Lai
Jiann Chyi Rau
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Chi Mei Comm Systems Inc
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Priority to TW098138162A priority Critical patent/TWI460444B/en
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Publication of TWI460444B publication Critical patent/TWI460444B/en

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Description

測試用電源裝置 Test power supply unit

本發明涉及一種測試用電源裝置,尤其涉及一種用以給可攜式電子裝置提供測試過程中所需電能之測試用電源裝置。 The present invention relates to a test power supply device, and more particularly to a test power supply device for providing a portable electronic device with power required during a test.

隨著通訊事業之迅速發展,行動電話、個人數位助理(personal digital assistant,PDA)等電子裝置越來越普及。該等電子裝置於組裝完成後,一般均需要對其中一些元件性能進行測試,以檢測電子裝置是否達到規定標準。 With the rapid development of the communication industry, electronic devices such as mobile phones and personal digital assistants (PDAs) are becoming more and more popular. After the assembly of the electronic devices, it is generally required to test the performance of some of the components to detect whether the electronic device meets the prescribed standards.

對電子裝置進行測試時,通常需要對其保持供電。習知之測試方法一般係使用電子裝置本身配備之電池作為測試電源。然而,電子裝置本身之電池只能提供單一供電電壓,而電子裝置中各種測試元件經常需要輸入彼此互不相同之多種測試電壓。若電子裝置中多種需要輸入不同測試電壓之元件,如RUIM(removable user identity module,可移動用戶識別模組)卡、SIM(subscriber identity module,用戶身份識別模組)卡等用戶識別卡及Car-Kit(車用免提裝置)均需要測試時,需要將該多種元件分別與不同規格之電池連接才能進行測試,顯然增加了測試成本。另外,於測試用戶識別卡之性能時,由於行動電話等很多種類之電子裝置中習知之電池裝設位置經常係將用戶識別卡遮擋於其後方,因此可能需要先取出電池才能移動用戶識別卡,操作十分不 便,且容易對電池及電子裝置之各個元件造成損壞。 When testing an electronic device, it is usually necessary to maintain power to it. The conventional test method generally uses a battery equipped with an electronic device itself as a test power source. However, the battery of the electronic device itself can only provide a single supply voltage, and various test components in the electronic device often need to input a plurality of test voltages different from each other. If the electronic device has multiple components that need to input different test voltages, such as a RUIM (removable user identity module) card, a SIM (subscriber identity module) card, and other user identification cards and Car- When Kit (vehicle hands-free device) needs to be tested, it is necessary to connect the various components to different specifications of the battery to test, which obviously increases the test cost. In addition, when testing the performance of the user identification card, since the battery installation position of many types of electronic devices, such as mobile phones, often blocks the user identification card behind it, it may be necessary to remove the battery before moving the user identification card. Very no operation It is easy to damage the various components of the battery and the electronic device.

有鑒於此,有必要提供一種可提供可變測試電壓之測試用電源裝置。 In view of the above, it is necessary to provide a test power supply device that can provide a variable test voltage.

一種測試用電源裝置,其用於為一待測電子裝置提供測試所需電能,所述測試用電源裝置內設置有一切換電路,所述切換電路包括一第一輸出端、一第二輸出端及一第三輸出端,所述第一輸出端、第二輸出端及第三輸出端分別與所述待測電子裝置之一正連接器端子、一ID連接器端子及一負連接器端子一一對應,所述第二輸出端於切換電路之控制下可分別輸出兩種不同電壓,其分別用於測試所述待測電子裝置中工作於其習知電池提供之常規電壓之元件及工作於其習知電池無法輸出之特殊電壓之元件。 A test power supply device for providing power for testing an electronic device to be tested, wherein the test power supply device is provided with a switching circuit, and the switching circuit includes a first output end and a second output end. a third output end, the first output end, the second output end and the third output end are respectively connected to one of the positive connector terminal, the ID connector terminal and the negative connector terminal of the electronic device to be tested. Correspondingly, the second output terminal can respectively output two different voltages under the control of the switching circuit, which are respectively used to test components of the electronic device to be tested that operate on a conventional battery provided by the conventional battery, and operate on the same A component of a special voltage that cannot be output by a conventional battery.

相較於習知技術,本發明之測試用電源裝置可適用於待測電子裝置中需要不同測試電壓之多種元件之測試工作,有效降低了測試成本。另外,該測試用電源裝置於測試過程中無須額外插拔及移動,操作十分簡單,且有利於保護電子裝置之元件。 Compared with the prior art, the test power supply device of the present invention can be applied to test work of various components requiring different test voltages in the electronic device to be tested, thereby effectively reducing the test cost. In addition, the test power supply device does not require extra insertion and removal during the test, and the operation is very simple, and is beneficial for protecting components of the electronic device.

100‧‧‧測試用電源裝置 100‧‧‧Test power supply unit

200‧‧‧待測電子裝置 200‧‧‧Electronic device to be tested

10‧‧‧基座 10‧‧‧ Pedestal

12‧‧‧容置面 12‧‧‧ 容面

14‧‧‧容置槽 14‧‧‧ accommodating slots

15‧‧‧介面 15‧‧‧ interface

16‧‧‧第一通孔 16‧‧‧First through hole

17‧‧‧第二通孔 17‧‧‧Second through hole

18‧‧‧連接器 18‧‧‧Connector

19‧‧‧切換電路 19‧‧‧Switching circuit

30‧‧‧調節裝置 30‧‧‧Adjustment device

31‧‧‧調節塊 31‧‧‧Adjustment block

33‧‧‧導柱 33‧‧‧ Guide column

35‧‧‧彈性件 35‧‧‧Flexible parts

37‧‧‧螺釘 37‧‧‧ screws

182‧‧‧正連接端 182‧‧‧Connecting end

184‧‧‧ID連接端 184‧‧‧ID connector

186‧‧‧負連接端 186‧‧‧negative connection

191‧‧‧第一輸入端 191‧‧‧ first input

192‧‧‧第二輸入端 192‧‧‧ second input

193‧‧‧第一輸出端 193‧‧‧ first output

194‧‧‧第二輸出端 194‧‧‧second output

195‧‧‧第三輸出端 195‧‧‧ third output

196‧‧‧指示燈 196‧‧‧ indicator light

197‧‧‧開關 197‧‧‧ switch

R1‧‧‧第一電阻 R1‧‧‧first resistance

R2‧‧‧第二電阻 R2‧‧‧second resistance

R3‧‧‧第三電阻 R3‧‧‧ third resistor

311‧‧‧側邊 311‧‧‧ side

312‧‧‧缺口 312‧‧ ‧ gap

315‧‧‧導通孔 315‧‧‧through holes

317‧‧‧連接通孔 317‧‧‧Connecting through holes

20‧‧‧本體 20‧‧‧ body

22‧‧‧容置部 22‧‧‧ 容部

23‧‧‧側壁 23‧‧‧ side wall

24‧‧‧避讓口 24‧‧‧ escaping

25‧‧‧電連接器端子 25‧‧‧Electrical connector terminals

27‧‧‧電路板 27‧‧‧ boards

252‧‧‧連接器端子 252‧‧‧Connector terminals

254‧‧‧ID連接器端子 254‧‧‧ID connector terminal

256‧‧‧負連接器端子 256‧‧‧negative connector terminals

272‧‧‧測試介面 272‧‧‧Test interface

274‧‧‧矩形槽 274‧‧‧Rectangular slot

圖1為應用本發明較佳實施例之測試用電源裝置之待測電子裝置之立體示意圖。 1 is a perspective view of an electronic device to be tested to which a test power supply device according to a preferred embodiment of the present invention is applied.

圖2為本發明較佳實施例之測試用電源裝置之立體示意圖。 2 is a perspective view of a power supply device for testing according to a preferred embodiment of the present invention.

圖3為圖2所示測試用電源裝置另一視角下之立體示意圖。 3 is a perspective view of the power supply device for testing shown in FIG. 2 from another perspective.

圖4為圖2所示測試用電源裝置之分解示意圖。 4 is an exploded perspective view of the power supply device for testing shown in FIG. 2.

圖5為圖2所示測試用電源裝置之內部電路圖。 Fig. 5 is an internal circuit diagram of the power supply unit for testing shown in Fig. 2.

圖6為圖2所示測試用電源裝置裝設於待測電子裝置上之立體示意圖。 6 is a perspective view showing the power supply device for testing shown in FIG. 2 mounted on an electronic device to be tested.

請參閱圖1及圖2,本發明較佳實施例提供一種測試用電源裝置100,其用於為一待測電子裝置200提供測試過程中所需電能。該測試用電源裝置100具有一第一工作模式及一第二工作模式,當測試用電源裝置100處於第一工作模式時,其輸出一第一電壓,如待測電子裝置200之電池電壓,用於測試待測電子裝置200獨立工作時常用電子元件之性能,如測試液晶顯示幕(liquid crystal display,LCD)、測試待測電子裝置200是否能正常讀取RUIM(removable user identity module,可移動用戶識別模組)卡或SIM(subscriber identity module,用戶身份識別模組)卡等用戶識別卡等。當測試用電源裝置100處於第二工作模式時,其輸出一第二電壓,如車用電池電壓,用於測試待測電子裝置200中car-kit(車用免提裝置)等適用於車內環境之元件性能。 Referring to FIG. 1 and FIG. 2, a preferred embodiment of the present invention provides a test power supply device 100 for providing power to be tested in an electronic device 200 to be tested. The test power supply device 100 has a first operating mode and a second operating mode. When the test power supply device 100 is in the first operating mode, it outputs a first voltage, such as the battery voltage of the electronic device 200 to be tested. The performance of the commonly used electronic components when testing the electronic device 200 to be tested independently, such as testing a liquid crystal display (LCD), testing whether the electronic device 200 to be tested can read the RUIM (removable user identity module, removable user) Identification module) card or SIM (subscriber identity module) card and other user identification cards. When the test power supply device 100 is in the second operation mode, it outputs a second voltage, such as a battery voltage for the vehicle, for testing the car-kit (car hands-free device) in the electronic device 200 to be tested, and the like. The component performance of the environment.

所述待測電子裝置200可以係行動電話等習知之電子裝置。與大多數習知電子裝置結構類似,該待測電子裝置200包括一本體20、一電連接器端子25及一電路板27。所述本體20一表面上凹設有一容置部22,該容置部22用於容置電池或所述測試用電源裝置100。所述容置部22大致呈矩形,其具有一側壁23,該側壁23上開設有一大致呈矩形之避讓口24,避讓口24貫通側壁23。所述電連接器端子25設置於與側壁23相對之另一側壁上,該電連接器端子25包括一正連接器端子252、一ID(identification或identity,標識碼)連接器端子254及一負連接器端子256。所述電路板27 裝設於容置部22內且藉由一FPC(flexible printed circuit,柔性電路板)等連接裝置與電連接器端子25電性連接。該電路板27上設置有car-kit等基本電子元件,其上還佈設有一測試介面272及一矩形槽274,該測試介面272與設置於電路板27上之car-kit電性連接,其具體位於避讓口24之下方,以使測試介面272暴露於外而不會被測試用電源裝置100擋住。該矩形槽274由所述電路板27凹設而成,其內佈設有若干電氣端子,用戶識別卡或FPC可藉由該等電氣端子而與電路板27實現電連接。 The electronic device 200 to be tested may be a conventional electronic device such as a mobile phone. Similar to most conventional electronic device structures, the electronic device 200 to be tested includes a body 20, an electrical connector terminal 25, and a circuit board 27. A receiving portion 22 is recessed on a surface of the body 20 for receiving the battery or the test power supply device 100. The accommodating portion 22 has a substantially rectangular shape and has a side wall 23. The side wall 23 defines a substantially rectangular escaping opening 24 through which the escaping opening 24 extends. The electrical connector terminal 25 is disposed on the other side wall opposite to the side wall 23. The electrical connector terminal 25 includes a positive connector terminal 252, an ID (identification or identity) connector terminal 254, and a negative Connector terminal 256. The circuit board 27 The device is electrically connected to the electrical connector terminal 25 by a connecting device such as a FPC (flexible printed circuit). The circuit board 27 is provided with a basic electronic component such as a car-kit, and a test interface 272 and a rectangular slot 274 are disposed on the circuit board 27, and the test interface 272 is electrically connected to the car-kit disposed on the circuit board 27, and the specific Located below the escaping port 24, the test interface 272 is exposed to the outside without being blocked by the test power supply unit 100. The rectangular slot 274 is recessed by the circuit board 27, and a plurality of electrical terminals are disposed therein, and the user identification card or the FPC can be electrically connected to the circuit board 27 by the electrical terminals.

請一併參閱圖3,該測試用電源裝置100包括一基座10及一調節裝置30。基座10為一矩形體,其具有一容置面12。所述容置面12上開設有一大致呈矩形之容置槽14,該容置槽14之形狀與所述矩形槽274之形狀一致,且該容置槽14與矩形槽274相對設置。基座10中與容置面12相鄰之一側開設有一介面15,所述介面15可藉由電纜等傳輸線連接至一直流電源(圖未示),以給測試用電源裝置100提供直流電源。請一併參閱圖5,基座10中與介面15相對一側開設有一第一通孔16及一第二通孔17,該第一通孔16及第二通孔17均貫通基座10,以分別容置一指示燈196及一開關197。該基座10中與介面15及第一通孔16均相鄰之一側上開設有一連接器18。該連接器18可為由導電彈性材料製成之彈片。該連接器18包括一正連接端182、一ID連接端184及一負連接端186。且所述正連接端182、ID連接端184及負連接端186分別與正連接器端子252、ID連接器端子254及負連接器端子256一一對應。當連接器18與電連接器端子25電性連接時,所述連接器18與所述電路板27對應電性連接,且所述正連接端182為電路板27提供正常工作電壓,所述負連接端186與電路板27之接地端(圖未示)電性連接,所述ID 連接端184則為與電路板27電性連接之各測試元件,如用戶識別卡及Car-Kit等提供對應之測試電壓。 Referring to FIG. 3 together, the test power supply device 100 includes a base 10 and an adjusting device 30. The base 10 is a rectangular body having a receiving surface 12. The receiving surface 12 defines a substantially rectangular receiving groove 14 . The shape of the receiving groove 14 is consistent with the shape of the rectangular groove 274 , and the receiving groove 14 is disposed opposite to the rectangular groove 274 . An interface 15 is formed on one side of the susceptor 10 adjacent to the accommodating surface 12, and the interface 15 can be connected to a DC power source (not shown) by a transmission line such as a cable to provide DC power to the test power supply device 100. . As shown in FIG. 5 , a first through hole 16 and a second through hole 17 are defined in the base 10 opposite to the interface 15 . The first through hole 16 and the second through hole 17 pass through the base 10 . An indicator light 196 and a switch 197 are respectively accommodated. A connector 18 is defined on one side of the base 10 adjacent to the interface 15 and the first through hole 16. The connector 18 can be a spring piece made of a conductive elastic material. The connector 18 includes a positive connection end 182, an ID connection end 184 and a negative connection end 186. The positive connection end 182, the ID connection end 184 and the negative connection end 186 are in one-to-one correspondence with the positive connector terminal 252, the ID connector terminal 254 and the negative connector terminal 256, respectively. When the connector 18 is electrically connected to the electrical connector terminal 25, the connector 18 is electrically connected to the circuit board 27, and the positive connection terminal 182 provides a normal operating voltage for the circuit board 27, the negative The connection end 186 is electrically connected to a ground end (not shown) of the circuit board 27, and the ID is The connection terminal 184 is a test component that is electrically connected to the circuit board 27, such as a user identification card and a Car-Kit.

調節裝置30用於調節測試用電源裝置100長度,以使測試用電源裝置100適用於不同尺寸之待測電子裝置200。請一併參閱圖4,該調節裝置30包括一調節塊31、二導柱33及一彈性件35。所述調節塊31呈矩形塊狀,其具有一側邊311,該側邊311上開設有一缺口312,所述缺口312貫通調節塊31上下表面,且與所述避讓口24相對應。與側邊311相對之另一側邊開設有二導通孔315及一連接通孔317,所述連接通孔317設置於二導通孔315之間。所述二導柱33一端分別固接於所述基座10上,另一端分別穿過二導通孔315。所述彈性件35為一柱狀螺旋彈簧,其套設於一螺釘37上,所述螺釘37穿過連接通孔317並固定於所述基座10上。當旋轉所述螺釘37,彈性件35發生形變,從而使調節塊31藉由二導通孔315與導柱33之相互配合而滑移至預定位置。這樣可以調節測試用電源裝置100長度,使測試用電源裝置100適用於多種不同尺寸之電子裝置。 The adjusting device 30 is used to adjust the length of the test power supply device 100 to make the test power supply device 100 suitable for the electronic device 200 to be tested of different sizes. Referring to FIG. 4 together, the adjusting device 30 includes an adjusting block 31, two guiding columns 33 and an elastic member 35. The adjusting block 31 has a rectangular shape and has a side 311. The side 311 defines a notch 312. The notch 312 penetrates the upper and lower surfaces of the adjusting block 31 and corresponds to the avoiding opening 24. The other side opposite to the side 311 is provided with two through holes 315 and a connecting through hole 317 , and the connecting through holes 317 are disposed between the two through holes 315 . One ends of the two guiding columns 33 are respectively fixed to the base 10, and the other ends are respectively passed through the two through holes 315. The elastic member 35 is a columnar coil spring that is sleeved on a screw 37 that passes through the connecting through hole 317 and is fixed to the base 10. When the screw 37 is rotated, the elastic member 35 is deformed, so that the adjusting block 31 is slid to a predetermined position by the mutual engagement of the two through holes 315 and the guide post 33. This makes it possible to adjust the length of the test power supply unit 100 so that the test power supply unit 100 can be applied to a plurality of electronic devices of different sizes.

所述基座10內還設置有一切換電路19,該切換電路19用於為電路板27提供兩種不同之測試電壓。請參閱圖5,所述切換電路19包括一第一輸入端191、一第二輸入端192、一第一輸出端193、一第二輸出端194、一第三輸出端195、所述指示燈196、所述開關197、一第一電阻R1、一第二電阻R2及一第三電阻R3。其中,所述指示燈196為一發光二極體,其用於顯示外接直流電源之供電狀態,該指示燈196穿過所述第一通孔16並從所述基座10表面露出。所述開關197為一單刀雙擲開關,其用於選擇測試用電源裝 置100之不同測試模式。該開關197穿過第二通孔17並從所述指示燈196所在表面露出。於切換電路19中,該第一輸入端191與第一輸出端193電性連接。該第二輸入端192連接到開關197之動觸點並同時接地。該開關197之兩個靜觸點分別連接到第一電阻R1一端及第二電阻R2一端。第一電阻R1及第二電阻R2之另一端均連接至第二輸出端194。這樣,可利用開關197選擇第一電阻R1或第二電阻R2而在第二輸入端192與第二輸出端194之間建立電性連接。第三電阻R3一端連接於第一輸入端191及第一輸出端193之間,另一端連接到指示燈196之陽極。指示燈196之陰極連接到開關197之動觸點與第二輸入端192之間,第三輸出端195接地。另外,所述第一輸入端191與所述介面15電性連接,所述第一輸出端193與正連接端182電性連接,所述第二輸出端194與所述ID連接端186電性連接,所述第三輸出端195與所述負連接端184電性連接。於本發明較佳實施例中,當第二輸出端194藉由第一電阻R1及開關197連接至第二輸入端192時,所述測試用電源裝置100處於所述第一工作模式;當第二輸出端194藉由第二電阻R2及開關197連接至第二輸入端192時,所述測試用電源裝置100處於所述第二工作模式。第一電阻R1及第二電阻R2具有不同阻值,從而使得這兩種模式可以分別從第二輸出端194輸出不同之電壓,以分別適用於需要不同測試電壓之不同類型元件之測試。 A switching circuit 19 is also disposed in the susceptor 10 for providing two different test voltages for the circuit board 27. Referring to FIG. 5, the switching circuit 19 includes a first input terminal 191, a second input terminal 192, a first output terminal 193, a second output terminal 194, a third output terminal 195, and the indicator light. 196. The switch 197, a first resistor R1, a second resistor R2, and a third resistor R3. The indicator light 196 is a light emitting diode for displaying the power supply state of the external DC power source. The indicator light 196 passes through the first through hole 16 and is exposed from the surface of the base 10 . The switch 197 is a single pole double throw switch for selecting a test power supply. Set 100 different test modes. The switch 197 passes through the second through hole 17 and is exposed from the surface where the indicator light 196 is located. In the switching circuit 19 , the first input end 191 is electrically connected to the first output end 193 . The second input 192 is connected to the moving contact of the switch 197 and is simultaneously grounded. The two static contacts of the switch 197 are respectively connected to one end of the first resistor R1 and one end of the second resistor R2. The other ends of the first resistor R1 and the second resistor R2 are both connected to the second output terminal 194. Thus, switch 197 can be used to select first resistor R1 or second resistor R2 to establish an electrical connection between second input terminal 192 and second output terminal 194. The third resistor R3 is connected at one end to the first input end 191 and the first output end 193, and the other end is connected to the anode of the indicator light 196. The cathode of the indicator light 196 is connected between the movable contact of the switch 197 and the second input terminal 192, and the third output terminal 195 is grounded. In addition, the first input end 191 is electrically connected to the interface 15 , the first output end 193 is electrically connected to the positive connection end 182 , and the second output end 194 is electrically connected to the ID connection end 186 . The third output end 195 is electrically connected to the negative connection end 184. In the preferred embodiment of the present invention, when the second output terminal 194 is connected to the second input terminal 192 by the first resistor R1 and the switch 197, the test power supply device 100 is in the first working mode; When the two output terminals 194 are connected to the second input terminal 192 by the second resistor R2 and the switch 197, the test power supply device 100 is in the second operation mode. The first resistor R1 and the second resistor R2 have different resistance values, so that the two modes can respectively output different voltages from the second output terminal 194 to respectively apply to tests of different types of components requiring different test voltages.

利用所述測試用電源裝置100測試待測電子裝置200是否能讀取用戶識別卡時,首先提供一FPC(圖未示),並將所述FPC一端放置於矩形槽274內,使其藉由所述電氣端子與所述電路板27電性連接;接著將所述連接端18分別對準相應之連接器端子25,以使連接端18與電路板27電性連接,並提供所需之供電電壓或測試電壓 ;旋轉螺釘37,以調整所述測試用電源裝置100之長度,使其容置於容置部22內,並使所述測試用電源裝置100壓住所述FPC一端,而FPC另一端暴露在外;將所述用戶識別卡固定於FPC中暴露於外之一端,以將所述用戶識別卡藉由FPC與電路板27實現電連接;將介面15與習知之外接直流電源電性連接,以啟動所述待測電子裝置200;將第二輸出端194藉由第一電阻R1電性連接至開關197,即選擇測試用電源裝置100之第一工作模式,以使第二輸出端194及ID連接端184輸出所述第一電壓;觀察所述待測電子裝置200之習知之顯示幕是否有讀取到所述用戶識別卡。 When the test power supply device 100 is used to test whether the electronic device 200 to be tested can read the user identification card, an FPC (not shown) is first provided, and one end of the FPC is placed in the rectangular slot 274, by using The electrical terminal is electrically connected to the circuit board 27; then the connecting end 18 is respectively aligned with the corresponding connector terminal 25 to electrically connect the connecting end 18 with the circuit board 27 and provide the required power supply. Voltage or test voltage Rotating the screw 37 to adjust the length of the test power supply device 100 so as to be accommodated in the accommodating portion 22, and the test power supply device 100 is pressed against one end of the FPC, and the other end of the FPC is exposed Fixing the user identification card in the FPC and exposing it to the outer end to electrically connect the user identification card to the circuit board 27 by using the FPC; electrically connecting the interface 15 with a conventional external DC power source to start The second output terminal 194 is electrically connected to the switch 197 by the first resistor R1, that is, the first working mode of the test power supply device 100 is selected, so that the second output terminal 194 and the ID are connected. The terminal 184 outputs the first voltage; and observes whether the conventional display screen of the electronic device 200 to be tested has read the user identification card.

利用所述測試用電源裝置100測試car-kit之性能時,先取下所述用戶識別卡,並放置一car-kit連接器(圖未示)於避讓口24與缺口312所形成之容置腔內,使其與所述測試介面272電性連接,並藉由測試介面272與設置於電路板27上之car-kit電性連接;接著將第二輸出端194藉由第二電阻R2電性連接至開關197,即選擇測試用電源裝置100之第二工作模式,以使第二輸出端194及ID連接端184輸出所述第二電壓;最後利用一傳輸線將所述car-kit之參數傳輸至一測試儀器上,以對所述car-kit之性能進行測試。 When the test power supply device 100 is used to test the performance of the car-kit, the user identification card is first removed, and a car-kit connector (not shown) is placed in the accommodating cavity formed by the escaping port 24 and the notch 312. The test interface 272 is electrically connected to the test interface 272 and electrically connected to the car-kit disposed on the circuit board 27 by the test interface 272; then the second output terminal 194 is electrically connected by the second resistor R2. Connected to the switch 197, that is, select the second mode of operation of the test power supply device 100, so that the second output terminal 194 and the ID connection terminal 184 output the second voltage; finally, the parameter of the car-kit is transmitted by using a transmission line. Test the performance of the car-kit on a test instrument.

顯然,本發明之測試用電源裝置100具有多種工作模式,可適用於待測電子裝置200之多種不同測試模式,有效降低了測試成本。且待測電子裝置200能夠方便地選擇各種不同測試模式,操作十分簡單。 Obviously, the test power supply device 100 of the present invention has multiple working modes, and can be applied to a plurality of different test modes of the electronic device 200 to be tested, thereby effectively reducing the test cost. Moreover, the electronic device 200 to be tested can conveniently select various test modes, and the operation is very simple.

本領域技術人員還可於本發明前述公開之範圍及精神內做其他形式及細節上之各種修改、添加及替換。當然,這些依據本發明精神所做之各種修改、添加及替換等變化,均應包含於本發明所要 求保護之範圍之內。 Various modifications, additions and substitutions in other forms and details may be made by those skilled in the art in the scope and spirit of the invention. Of course, various modifications, additions and substitutions made in accordance with the spirit of the present invention are intended to be included in the present invention. Seek protection within the scope.

100‧‧‧測試用電源裝置 100‧‧‧Test power supply unit

10‧‧‧基座 10‧‧‧ Pedestal

12‧‧‧容置面 12‧‧‧ 容面

14‧‧‧容置槽 14‧‧‧ accommodating slots

15‧‧‧介面 15‧‧‧ interface

18‧‧‧連接器 18‧‧‧Connector

30‧‧‧調節裝置 30‧‧‧Adjustment device

33‧‧‧導柱 33‧‧‧ Guide column

182‧‧‧正連接端 182‧‧‧Connecting end

184‧‧‧ID連接端 184‧‧‧ID connector

186‧‧‧負連接端 186‧‧‧negative connection

312‧‧‧缺口 312‧‧ ‧ gap

Claims (9)

一種測試用電源裝置,其用於為一待測電子裝置提供測試所需之電能,其改良在於:所述測試用電源裝置內設置有一切換電路,所述切換電路包括一第一輸出端、一第二輸出端、一第三輸出端、一第一電阻、一第二電阻及一開關,所述第一輸出端、第二輸出端及第三輸出端分別與所述待測電子裝置之一正連接器端子、一ID連接器端子及一負連接器端子一一對應,所述開關之動觸點接地;所述開關之兩個靜觸點分別連接到所述第一電阻及第二電阻一端,所述第一電阻及第二電阻之另一端均連接至第二輸出端,所述第二輸出端藉由所述開關之切換分別輸出兩種不同之電壓,其分別用於測試所述待測電子裝置中工作於其習知電池提供之常規電壓之元件及工作於其習知電池無法輸出之特殊電壓之元件。 A test power supply device for providing power for testing an electronic device to be tested, wherein the test power supply device is provided with a switching circuit, and the switching circuit includes a first output end and a a second output end, a third output end, a first resistor, a second resistor, and a switch, wherein the first output end, the second output end, and the third output end are respectively associated with one of the electronic devices to be tested a positive connector terminal, an ID connector terminal and a negative connector terminal are in one-to-one correspondence, the movable contact of the switch is grounded; two static contacts of the switch are respectively connected to the first resistor and the second resistor One end, the other end of the first resistor and the second resistor are both connected to the second output end, and the second output end respectively outputs two different voltages by switching the switches, which are respectively used for testing the The component of the electronic device to be tested that operates on the conventional voltage provided by the conventional battery and the component that operates on a special voltage that the conventional battery cannot output. 如專利申請範圍第1項所述之測試用電源裝置,其中所述測試用電源裝置包括一基座,所述基座包括一容置面,所述容置面上設置有一容置槽。 The test power supply device of claim 1, wherein the test power supply device comprises a base, the base includes a receiving surface, and the receiving surface is provided with a receiving groove. 如專利申請範圍第2項所述之測試用電源裝置,其中所述基座中與所述容置槽相鄰之一側開設有一介面,所述介面與一外接之直流電源電性連接。 The test power supply device of claim 2, wherein an interface is formed on one side of the pedestal adjacent to the accommodating slot, and the interface is electrically connected to an external DC power supply. 如專利申請範圍第3項所述之測試用電源裝置,其中所述測試用電源裝置中與所述介面相鄰之一側開設有一連接器,所述連接器包括一正連接端、一負連接端及一ID連接端。 The power supply device for testing according to the third aspect of the invention, wherein the test power supply device has a connector on a side adjacent to the interface, the connector including a positive connection end and a negative connection End and an ID connection. 如專利申請範圍第4項所述之測試用電源裝置,其中所述切換電路還包括一第一輸入端、一第二輸入端,所述第一輸入端與所述介面電性連接,所述第二輸入端接地,所述第一輸出端與正連接端電性連接,所述第二輸出端與所述ID連接端電性連接,所述第三輸出端與所述負連接端電性 連接。 The test power supply device of claim 4, wherein the switching circuit further includes a first input end and a second input end, wherein the first input end is electrically connected to the interface, The second input end is grounded, the first output end is electrically connected to the positive connection end, the second output end is electrically connected to the ID connection end, and the third output end is electrically connected to the negative connection end connection. 如專利申請範圍第5項所述之測試用電源裝置,其中所述切換電路還包括一第三電阻及一二極體,所述第三電阻一端連接於第一輸入端及第一輸出端之間,另一端連接至所述二極體之陽極,所述二極體之陰極及所述第三輸出端均連接至所述開關之動觸點。 The test power supply device of claim 5, wherein the switching circuit further includes a third resistor and a diode, and the third resistor is connected to the first input end and the first output end. The other end is connected to the anode of the diode, and the cathode of the diode and the third output are both connected to the movable contact of the switch. 如專利申請範圍第5項所述之測試用電源裝置,其中當所述第二輸出端藉由所述第一電阻及開關連接至所述第二輸入端時,所述第二輸出端、第一電阻及第二輸入端形成電路,使所述第二輸出端輸出所述常規電壓。 The test power supply device of claim 5, wherein the second output terminal is connected to the second input terminal by the first resistor and the switch A resistor and the second input form a circuit for causing the second output to output the conventional voltage. 如專利申請範圍第5項所述之測試用電源裝置,其中當所述第二輸出端藉由所述第二電阻及開關連接至所述第二輸入端時,第二輸出端、第二電阻及第二輸入端形成電路,使所述第二輸出端輸出所述特殊電壓。 The test power supply device of claim 5, wherein the second output terminal and the second resistor are connected to the second input terminal by the second resistor and the switch And forming a circuit with the second input terminal to cause the second output terminal to output the special voltage. 如專利申請範圍第1項所述之測試用電源裝置,其中所述測試用電源裝置還包括一調節裝置,所述調節裝置調節所述測試用電源裝置之整體長度。 The test power supply device of claim 1, wherein the test power supply device further comprises an adjustment device that adjusts an overall length of the test power supply device.
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