TWI456575B - Method for programming memory array - Google Patents

Method for programming memory array Download PDF

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TWI456575B
TWI456575B TW100149794A TW100149794A TWI456575B TW I456575 B TWI456575 B TW I456575B TW 100149794 A TW100149794 A TW 100149794A TW 100149794 A TW100149794 A TW 100149794A TW I456575 B TWI456575 B TW I456575B
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Taiwan
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voltage
memory cell
transistor
memory
switching
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TW100149794A
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Chinese (zh)
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TW201327565A (en
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Wen Jer Tsai
Ping Hung Tsai
Jyun Siang Huang
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Macronix Int Co Ltd
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Claims (11)

一種記憶體陣列的程式化方法,其中該記憶體陣列包括由一第一電晶體、多個記憶胞與一第二電晶體串接而成的一記憶胞串,且該記憶體陣列的程式化方法包括:在ㄧ設定階段內,關閉該些記憶胞中的一切換記憶胞,並施加一第一電壓與一第二電壓至該切換記憶胞的一第一源極/汲極區與一第二源極/汲極區;以及在一程式化階段內,浮接與該記憶胞串相連的一位元線,並提供一斜波訊號至與該切換記憶胞電性相連的一字元線。A method for staging a memory array, wherein the memory array comprises a memory cell serially connected by a first transistor, a plurality of memory cells and a second transistor, and the memory array is stylized The method includes: turning off a switching memory cell in the memory cells during a setting phase, and applying a first voltage and a second voltage to a first source/drain region of the switching memory cell and a first a two source/drain region; and in a stylized phase, floating a bit line connected to the memory string and providing a ramp signal to a word line electrically connected to the switching memory . 如申請專利範圍第1項所述之記憶體陣列的程式化方法,其中該記憶體陣列更包括一第三電晶體,該第三電晶體的源極端電性連接至該位元線,且施加該第一電壓與該第二電壓至該切換記憶胞的該第一源極/汲極區與該第二源極/汲極區的步驟包括:開啟該些記憶胞中除該切換記憶胞以外的記憶胞;導通該第一電晶體、該第二電晶體與該第三電晶體;提供該第一電壓至該第三電晶體的汲極端;以及提供該第二電壓至與該第二電晶體電性相連的一共源極線。The method for staging a memory array according to claim 1, wherein the memory array further comprises a third transistor, the source terminal of the third transistor being electrically connected to the bit line, and being applied The step of the first voltage and the second voltage to the first source/drain region and the second source/drain region of the switching memory cell includes: turning on the memory cells except the switching memory cell a memory cell; conducting the first transistor, the second transistor and the third transistor; providing the first voltage to a drain terminal of the third transistor; and providing the second voltage to the second transistor A common source line electrically connected to the crystal. 如申請專利範圍第2項所述之記憶體陣列的程式化方法,更包括:在該程式化階段內,關閉該第三電晶體,以浮接與該記憶胞串相連的該位元線。The method for programming a memory array according to claim 2, further comprising: in the stylizing phase, turning off the third transistor to float the bit line connected to the memory cell string. 如申請專利範圍第1項所述之記憶體陣列的程式化方法,其中提供該斜波訊號至與該切換記憶胞電性相連的該字元線的步驟包括:在該程式化階段中的一第一子期間,提供電壓準位逐漸上升的一第一子斜波訊號至該字元線;以及在該程式化階段中的一第二子期間,提供電壓準位逐漸下降的一第二子斜波訊號至該字元線,其中該斜波訊號由該第一子斜波訊號與該第二子斜波訊號所構成。The method for staging a memory array according to claim 1, wherein the step of providing the ramp signal to the word line electrically connected to the switching memory comprises: one in the stylization phase a first sub-period providing a first sub-slope wave signal whose voltage level gradually rises to the word line; and during a second sub-segment of the stylized phase, providing a second sub-level of the voltage level gradually decreasing The ramp signal is connected to the word line, wherein the ramp signal is composed of the first sub-slope signal and the second sub-slope signal. 如申請專利範圍第1項所述之記憶體陣列的程式化方法,其中當該第一電壓與該第二電壓之間的電壓差大於一預設電壓時,於該程式化階段內程式化該些記憶胞中與該切換記憶胞相鄰的一選定記憶胞,當該第一電壓與第二電壓之間的電壓差不大於該預設電壓時,於該程式化階段內禁止該選定記憶胞的程式化。The method for staging a memory array according to claim 1, wherein when the voltage difference between the first voltage and the second voltage is greater than a predetermined voltage, the program is programmed in the stylization phase. a selected memory cell adjacent to the switching memory cell in the memory cell, when the voltage difference between the first voltage and the second voltage is not greater than the predetermined voltage, prohibiting the selected memory cell in the stylized phase Stylized. 一種記憶體陣列的程式化方法,其中該記憶體陣列包括由一第一電晶體、多個記憶胞與一第二電晶體串接而成的一記憶胞串,且該記憶體陣列的程式化方法包括:在ㄧ設定階段內,關閉該些記憶胞中的一切換記憶胞,並施加一第一電壓至該切換記憶胞的一第一源極/汲極區,且關閉該第二電晶體;以及在一程式化階段內,浮接與該記憶胞串相連的一位元線,並施加一第二電壓至該切換記憶胞的一第二源極/汲極區,且提供一斜波訊號至與該切換記憶胞電性相連的一字元線。A method for staging a memory array, wherein the memory array comprises a memory cell serially connected by a first transistor, a plurality of memory cells and a second transistor, and the memory array is stylized The method includes: turning off a switching memory cell of the memory cells during a setting phase, applying a first voltage to a first source/drain region of the switching memory cell, and turning off the second transistor And in a stylized phase, floating a bit line connected to the memory cell string, and applying a second voltage to a second source/drain region of the switching memory cell, and providing a ramp wave The signal is to a word line connected to the switching memory cell. 如申請專利範圍第6項所述之記憶體陣列的程式化方法,其中該記憶體陣列更包括一第三電晶體,該第三電晶體的源極端電性連接至該位元線,且施加該第一電壓至該切換記憶胞的該第一源極/汲極區的步驟包括:開啟該些記憶胞中除該切換記憶胞以外的記憶胞;導通該第一電晶體與該第三電晶體;以及提供該第一電壓至該第三電晶體的汲極端。The method for staging a memory array according to claim 6, wherein the memory array further comprises a third transistor, the source terminal of the third transistor being electrically connected to the bit line, and being applied The step of switching the first voltage to the first source/drain region of the switching memory cell includes: turning on a memory cell of the memory cells other than the switching memory cell; and turning on the first transistor and the third battery a crystal; and providing the first voltage to a drain terminal of the third transistor. 如申請專利範圍第7項所述之記憶體陣列的程式化方法,更包括:在該程式化階段內,關閉該第三電晶體,以浮接與該記憶胞串相連的該位元線。The stylized method of the memory array of claim 7, further comprising: in the stylizing phase, turning off the third transistor to float the bit line connected to the memory cell string. 如申請專利範圍第6項所述之記憶體陣列的程式化方法,其中施加該第二電壓至該切換記憶胞的該第二源極/汲極區的步驟包括:導通該第二電晶體;以及提供該第二電壓至與該第二電晶體電性相連的一共源極線。The method for staging a memory array according to claim 6, wherein the applying the second voltage to the second source/drain region of the switching memory cell comprises: turning on the second transistor; And providing the second voltage to a common source line electrically connected to the second transistor. 如申請專利範圍第6項所述之記憶體陣列的程式化方法,其中提供該斜波訊號至與該切換記憶胞電性相連的該字元線的步驟包括:在該程式化階段中的一第一子期間,提供電壓準位逐漸上升的一第一子斜波訊號至該字元線;以及在該程式化階段中的一第二子期間,提供電壓準位逐漸下降的一第二子斜波訊號至該字元線,其中該斜波訊號由該第一子斜波訊號與該第二子斜波訊號所構成。The method for staging a memory array according to claim 6, wherein the step of providing the ramp signal to the word line electrically connected to the switching memory comprises: one in the stylization phase a first sub-period providing a first sub-slope wave signal whose voltage level gradually rises to the word line; and during a second sub-segment of the stylized phase, providing a second sub-level of the voltage level gradually decreasing The ramp signal is connected to the word line, wherein the ramp signal is composed of the first sub-slope signal and the second sub-slope signal. 如申請專利範圍第6項所述之記憶體陣列的程式化方法,其中當該第一電壓與該第二電壓之間的電壓差大於一預設電壓時,於該程式化階段內程式化該些記憶胞中與該切換記憶胞相鄰的一選定記憶胞,當該第一電壓與第二電壓之間的電壓差不大於該預設電壓時,於該程式化階段內禁止該選定記憶胞的程式化。The method for staging a memory array according to claim 6, wherein when the voltage difference between the first voltage and the second voltage is greater than a predetermined voltage, the program is programmed in the stylization phase. a selected memory cell adjacent to the switching memory cell in the memory cell, when the voltage difference between the first voltage and the second voltage is not greater than the predetermined voltage, prohibiting the selected memory cell in the stylized phase Stylized.
TW100149794A 2011-12-30 2011-12-30 Method for programming memory array TWI456575B (en)

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US20110122695A1 (en) * 2009-11-24 2011-05-26 Yan Li Programming memory with bit line floating to reduce channel-to-floating gate coupling
US7974130B2 (en) * 2006-11-28 2011-07-05 Kabushiki Kaisha Toshiba Semiconductor memory device and method for erasing the same
US20110305088A1 (en) * 2010-06-10 2011-12-15 Macronix International Co., Ltd. Hot carrier programming in nand flash

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7463533B2 (en) * 2001-01-12 2008-12-09 Renesas Technology Corp. Nonvolatile semiconductor storage device
US7974130B2 (en) * 2006-11-28 2011-07-05 Kabushiki Kaisha Toshiba Semiconductor memory device and method for erasing the same
US7848150B2 (en) * 2007-09-10 2010-12-07 Hynix Semiconductor Inc. Flash memory device and method of operating the same
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