TWI456232B - 磁場檢測裝置 - Google Patents

磁場檢測裝置 Download PDF

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Publication number
TWI456232B
TWI456232B TW101119021A TW101119021A TWI456232B TW I456232 B TWI456232 B TW I456232B TW 101119021 A TW101119021 A TW 101119021A TW 101119021 A TW101119021 A TW 101119021A TW I456232 B TWI456232 B TW I456232B
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TW
Taiwan
Prior art keywords
magnetic field
housing
detecting device
field detecting
light
Prior art date
Application number
TW101119021A
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English (en)
Other versions
TW201348727A (zh
Inventor
Yung Chuan Chen
Yao Nan Wang
Li Wen Chen
dong feng Wu
Original Assignee
Univ Nat Pingtung Sci & Tech
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Publication date
Application filed by Univ Nat Pingtung Sci & Tech filed Critical Univ Nat Pingtung Sci & Tech
Priority to TW101119021A priority Critical patent/TWI456232B/zh
Publication of TW201348727A publication Critical patent/TW201348727A/zh
Application granted granted Critical
Publication of TWI456232B publication Critical patent/TWI456232B/zh

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  • Measuring Magnetic Variables (AREA)

Claims (5)

  1. 一種磁場檢測裝置，包含：一殼體，由無法遮蔽磁場之材質所製成，該殼體之內部具有一容室，該容室內容裝有數個磁性微粒；一光發射器，一端為發光端，該光發射器結合於該殼體，該發光端對應至該容室；及一光接收器，一端為收光端，該光接收器結合於該殼體，該收光端對應至該容室並與該發光端相對；其中，該殼體呈中空管狀，該殼體之兩端分別形成相對之一第一端及一第二端，該光發射器結合並封閉該殼體之第一端。
  2. 如申請專利範圍第1項所述之磁場檢測裝置，其中，該光接收器之另一端依序電連結一轉換單元、一處理單元及一顯示單元。
  3. 如申請專利範圍第1項所述之磁場檢測裝置，其中，該光發射器緊配塞合於該殼體之第一端。
  4. 如申請專利範圍第1項所述之磁場檢測裝置，其中，該光接收器結合並封閉該殼體之第二端。
  5. 如申請專利範圍第4項所述之磁場檢測裝置，其中，該光接收器緊配塞合於該殼體之第二端。
TW101119021A 2012-05-28 2012-05-28 磁場檢測裝置 TWI456232B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW101119021A TWI456232B (zh) 2012-05-28 2012-05-28 磁場檢測裝置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW101119021A TWI456232B (zh) 2012-05-28 2012-05-28 磁場檢測裝置

Publications (2)

Publication Number Publication Date
TW201348727A TW201348727A (zh) 2013-12-01
TWI456232B true TWI456232B (zh) 2014-10-11

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ID=50157352

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TW101119021A TWI456232B (zh) 2012-05-28 2012-05-28 磁場檢測裝置

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TW (1) TWI456232B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109061530B (zh) * 2018-06-13 2023-10-03 杭州永磁集团有限公司 磁体永久磁化检测装置及其测量控制方法
US11940502B2 (en) 2021-09-24 2024-03-26 Analog Devices International Unlimited Company Magnetic field sensing based on particle position within container
EP4381305A1 (en) * 2021-09-24 2024-06-12 Analog Devices International Unlimited Company Magnetic field sensing based on particle position within container

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200533906A (en) * 2004-04-01 2005-10-16 Asia Optical Co Inc Environment measurement device
US7741840B1 (en) * 2009-05-21 2010-06-22 Empire Technology Development Llc Magnetic probe
CN101828261A (zh) * 2007-10-18 2010-09-08 Nxp股份有限公司 背侧层的磁检测

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200533906A (en) * 2004-04-01 2005-10-16 Asia Optical Co Inc Environment measurement device
CN101828261A (zh) * 2007-10-18 2010-09-08 Nxp股份有限公司 背侧层的磁检测
US7741840B1 (en) * 2009-05-21 2010-06-22 Empire Technology Development Llc Magnetic probe

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