TWI454707B - - Google Patents

Info

Publication number
TWI454707B
TWI454707B TW098132830A TW98132830A TWI454707B TW I454707 B TWI454707 B TW I454707B TW 098132830 A TW098132830 A TW 098132830A TW 98132830 A TW98132830 A TW 98132830A TW I454707 B TWI454707 B TW I454707B
Authority
TW
Taiwan
Application number
TW098132830A
Other languages
Chinese (zh)
Other versions
TW201111798A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98132830A priority Critical patent/TW201111798A/zh
Publication of TW201111798A publication Critical patent/TW201111798A/zh
Application granted granted Critical
Publication of TWI454707B publication Critical patent/TWI454707B/zh

Links

TW98132830A 2009-09-29 2009-09-29 Structure for test probe card of integrated circuits TW201111798A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98132830A TW201111798A (en) 2009-09-29 2009-09-29 Structure for test probe card of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98132830A TW201111798A (en) 2009-09-29 2009-09-29 Structure for test probe card of integrated circuits

Publications (2)

Publication Number Publication Date
TW201111798A TW201111798A (en) 2011-04-01
TWI454707B true TWI454707B (ja) 2014-10-01

Family

ID=44909016

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98132830A TW201111798A (en) 2009-09-29 2009-09-29 Structure for test probe card of integrated circuits

Country Status (1)

Country Link
TW (1) TW201111798A (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5525911A (en) * 1993-08-04 1996-06-11 Tokyo Electron Limited Vertical probe tester card with coaxial probes
TW200738841A (en) * 2006-01-23 2007-10-16 Hitachi Chemical Co Ltd Adhesive composition, film-like adhesive, adhesive sheet and semiconductor device using the same
TW200745568A (en) * 2006-04-21 2007-12-16 Formfactor Inc Probe structures with electronic components
TWM348950U (en) * 2008-09-05 2009-01-11 Gan-Yao Hong Improved integrated circuit test probe card structure
TWM348952U (en) * 2008-09-05 2009-01-11 Gan-Yao Hong Improved circuit board structure of a circuit test device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5525911A (en) * 1993-08-04 1996-06-11 Tokyo Electron Limited Vertical probe tester card with coaxial probes
TW200738841A (en) * 2006-01-23 2007-10-16 Hitachi Chemical Co Ltd Adhesive composition, film-like adhesive, adhesive sheet and semiconductor device using the same
TW200745568A (en) * 2006-04-21 2007-12-16 Formfactor Inc Probe structures with electronic components
TWM348950U (en) * 2008-09-05 2009-01-11 Gan-Yao Hong Improved integrated circuit test probe card structure
TWM348952U (en) * 2008-09-05 2009-01-11 Gan-Yao Hong Improved circuit board structure of a circuit test device

Also Published As

Publication number Publication date
TW201111798A (en) 2011-04-01

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TWI454707B (ja)