TWI442402B - Control driver for non-volatile memory - Google Patents
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Description
本發明係有關於一種用以記憶體的列解碼器,尤指一種可降低記憶體程式化困難及其佈局面積的列解碼器和其方法。The present invention relates to a column decoder for a memory, and more particularly to a column decoder and a method thereof for reducing memory stylization difficulty and layout area thereof.
快閃記憶體是一種非揮發性記憶體,通常用在記憶卡,快閃裝置,以及用以資料的儲存和傳送之手持式電子裝置。快閃記憶體可用通電的方式寫入和刪除資料。快閃記憶體的優點包括快速的存取時間以及抗震。此外,快閃記憶體也非常抗壓力和抗溫度變化。Flash memory is a non-volatile memory commonly used in memory cards, flash devices, and handheld electronic devices for the storage and transfer of data. Flash memory can be written and deleted by power-on. The advantages of flash memory include fast access times and shock resistance. In addition, flash memory is also very resistant to stress and temperature changes.
請參照第1圖,第1圖係為先前列驅動電路10之示意圖。為了程式化快閃記憶體單元,則記憶體單元的位置須經由解碼器選擇包括記憶體單元的區塊而解碼,且記憶體單元的位置被解碼後,另可決定記憶體單元的字元線。列驅動電路10用來驅動記憶體區塊中的記憶體單元以讀出、寫入和抹去記憶體單元的資料。列驅動電路10,包括八個反或閘100用以接收記憶體區塊選擇訊號XPA、XPB、XPC,八個準位向上移轉電路121,八個準位向下移轉電路122,八個上拉電晶體MP,八個下拉電晶體MN,和八個重設電晶體M_RESET。列驅動電路10輸出八位元字元線選擇訊號ZWL<7:0>用以選擇要存取的記憶體單元的字元線,而重設訊號ZXWV<7:0>係用來控制重設電晶體M_RESET。Please refer to FIG. 1 , which is a schematic diagram of the previous column driving circuit 10 . In order to program the flash memory unit, the location of the memory unit must be decoded by the decoder selecting the block including the memory unit, and after the position of the memory unit is decoded, the word line of the memory unit can be determined. . The column driver circuit 10 is used to drive the memory cells in the memory block to read, write, and erase the data of the memory cells. The column driving circuit 10 includes eight inverse gates 100 for receiving the memory block selection signals XPA, XPB, XPC, eight level up shift circuits 121, eight level down shift circuits 122, and eight Pull-up transistor MP, eight pull-down transistors MN, and eight reset transistors M_RESET. The column driving circuit 10 outputs an octet word line selection signal ZWL<7:0> for selecting a word line of the memory unit to be accessed, and the reset signal ZXWV<7:0> is used to control resetting. Transistor M_RESET.
請參照第2圖,第2圖係為一個準位向上移轉電路121之示意圖。每個準位向上移轉電路121包括第一N型金氧半電晶體MN1,第一P型金氧半電晶體MP1,第二N型金氧半電晶體MN2,第二P型金氧半電晶體MP2,和反向器200。第一N型金氧半電晶體MN1的閘極端接收輸入準位向上移轉電路121的輸入電壓。同時輸入電壓也被反向器200反向,且將反向後的輸入電壓輸出至第二N型金氧半電晶體MN2的閘極端。第一N型金氧半電晶體MN1和第一P型金氧半電晶體MP1動作類似反向器,並且輸出第一反向訊號至第二P型金氧半電晶體MP2的閘極端。同樣地,第二N型金氧半電晶體MN2和第二P型金氧半電晶體MP2動作也類似反向器,並且輸出第二反向訊號至第一P型金氧半電晶體MP1的閘極端。因此,如果輸入訊號是邏輯高電位,則準位向上移轉電路121在第二N型金氧半電晶體MN2和第二P型金氧半電晶體MP2的汲極端的輸出電壓將是高電壓VPP。反之,如果輸入訊號是邏輯低電位,則輸出電壓將是低電壓,例如接地電壓。Please refer to FIG. 2, which is a schematic diagram of a level up shift circuit 121. Each of the level up shift circuits 121 includes a first N-type MOS transistor MN1, a first P-type MOS transistor MP1, a second N-type MOS transistor MN2, and a second P-type MOS half. The transistor MP2, and the inverter 200. The gate terminal of the first N-type MOS transistor MN1 receives the input voltage of the input level up shift circuit 121. At the same time, the input voltage is also reversed by the inverter 200, and the inverted input voltage is output to the gate terminal of the second N-type MOS transistor MN2. The first N-type MOS transistor MN1 and the first P-type MOS transistor M1 operate like an inverter and output a first reverse signal to the gate terminal of the second P-type MOS transistor MP2. Similarly, the second N-type MOS transistor MN2 and the second P-type MOS transistor MP2 operate similarly to the inverter, and output a second reverse signal to the first P-type MOS transistor MP1. The gate is extreme. Therefore, if the input signal is a logic high potential, the output voltage of the terminal up-shift circuit 121 at the 汲 terminal of the second N-type MOS transistor MN2 and the second P-type MOS transistor M2 will be a high voltage. VPP. Conversely, if the input signal is logic low, the output voltage will be a low voltage, such as a ground voltage.
請參照第3圖,第3圖係為一個準位向下移轉電路122之示意圖。每個準位向下移轉電路122包括第一N型金氧半電晶體MN1,第一P型金氧半電晶體MP1,第二N型金氧半電晶體MN2,第二P型金氧半電晶體MP2,和反向器200。第一P型金氧半電晶體MP1的閘極端接收輸入準位向下移轉電路122的輸入電壓。同時輸入電壓也被反向器200反向,且將反向後的輸入電壓輸出至第二P型金氧半電晶體MP2的閘極端。第一N型金氧半電晶體MN1和第一P型金氧半電晶體MP1動作類似反向器,並且輸出第一反向訊號至第二N型金氧半電晶體MN2的閘極端。同樣地,第二N型金氧半電晶體MN2和第二P型金氧半電晶體MP2動作也類似反向器,並且輸出第二反向訊號至第一N型金氧半電晶體MN1的閘極端。因此,如果輸入訊號是邏輯低電位,則準位向下移轉電路122在第二N型金氧半電晶體MN2和第二P型金氧半電晶體MP2的汲極端的輸出電壓將是低電壓VBB。如果輸入訊號是邏輯高電位,則輸出電壓將是高電壓VDD。高電壓VDD可等於或是低於高電壓VPP。Please refer to FIG. 3, which is a schematic diagram of a level shifting circuit 122. Each of the level downward transfer circuits 122 includes a first N-type MOS transistor MN1, a first P-type MOS transistor M1, a second N-type MOS transistor MN2, and a second P-type gold oxide. Semi-transistor MP2, and inverter 200. The gate terminal of the first P-type MOS transistor MP1 receives the input voltage of the input level down-transfer circuit 122. At the same time, the input voltage is also reversed by the inverter 200, and the inverted input voltage is output to the gate terminal of the second P-type MOS transistor MP2. The first N-type MOS transistor MN1 and the first P-type MOS transistor M1 operate like an inverter and output a first reverse signal to the gate terminal of the second N-type MOS transistor MN2. Similarly, the second N-type MOS transistor MN2 and the second P-type MOS transistor MP2 operate similarly to the inverter, and output a second reverse signal to the first N-type MOS transistor MN1. The gate is extreme. Therefore, if the input signal is logic low, the output voltage of the level-down shift circuit 122 at the 汲 terminal of the second N-type MOS transistor MN2 and the second P-type MOS transistor M2 will be low. Voltage VBB. If the input signal is logic high, the output voltage will be high voltage VDD. The high voltage VDD can be equal to or lower than the high voltage VPP.
準位向上移轉電路121和準位向下移轉電路122的輸入電壓有兩種狀況。如果輸入電壓是高電位,則準位向上移轉電路121將輸出高電壓VPP至上拉電晶體MP,以及準位向下移轉電路122將輸出高電壓VDD至下拉電晶體MN。如果輸入電壓是低電位,則準位向上移轉電路121將輸出低電壓,例如接地電壓,以及準位向下移轉電路122將輸出低電壓VBB。因此,字元線選擇訊號ZWL<7:0>將有7個VPP輸出和一個XWV輸出。例如,字元線選擇訊號ZWL<1>具有訊號XWV<1>的電壓,和字元線選擇訊號ZWL<7:2>,ZWL<0>具有高電壓VPP。另請參照第4圖,第4圖係為由第1圖列驅動電路驅動的快閃記憶體單元陣列的示意圖。如第4圖所示,字元線選擇訊號ZWL可用來致能快閃記憶體單元陣列中的快閃記憶體單元,以控制快閃記憶體單元進行讀寫之工作。There are two conditions for the input voltage of the level up shift circuit 121 and the level down shift circuit 122. If the input voltage is high, the level up shift circuit 121 will output a high voltage VPP to the pull up transistor MP, and the level down shift circuit 122 will output a high voltage VDD to the pull down transistor MN. If the input voltage is low, the level up shift circuit 121 will output a low voltage, such as a ground voltage, and the level down shift circuit 122 will output a low voltage VBB. Therefore, the word line select signal ZWL<7:0> will have 7 VPP outputs and one XWV output. For example, the word line select signal ZWL<1> has a voltage of the signal XWV<1>, and the word line select signal ZWL<7:2>, and the ZWL<0> has a high voltage VPP. Please refer to FIG. 4, which is a schematic diagram of a flash memory cell array driven by the driving circuit of the first row. As shown in FIG. 4, the word line selection signal ZWL can be used to enable the flash memory unit in the flash memory cell array to control the flash memory unit for reading and writing.
列驅動電路10包括準位向上移轉電路121、準位向下移轉電路122、上拉電晶體MP、下拉電晶體MN和重設電晶體M_RESET。因此,列驅動電路10的架構是複雜的而且會佔用許多晶片面積。The column drive circuit 10 includes a level up shift circuit 121, a level down shift circuit 122, a pull up transistor MP, a pull down transistor MN, and a reset transistor M_RESET. Therefore, the architecture of the column driver circuit 10 is complex and can take up a lot of wafer area.
本發明的一實施例揭露一種用以非揮發性記憶體的控制驅動器,該非揮發性記憶體的控制驅動器包括一第一驅動電路,一第一準位向上移轉電路,以及一第一選擇電路。該第一驅動電路包括一第一上拉電晶體,以及一第一下拉電晶體。該第一上拉電晶體用以根據一第一上拉訊號,上拉一第一控制線選擇訊號,該第一下拉電晶體用以根據該第一上拉訊號,下拉該第一控制線選擇訊號。該第一上拉電晶體包括一第一端,一第二端,以及一控制端。該第一端用以上拉該第一控制線選擇訊號至大約一第一控制線電壓,該第二端用以接收該第一控制線電壓,以及該控制端用以接收該第一上拉訊號,且當該第一上拉訊號的電壓小於該第一控制線電壓時,該控制端用以開啟該第一上拉電晶體。該第一下拉電晶體包括一第一端,一第二端,以及一控制端。該第一端耦接該第一上拉電晶體的該第一端,用以下拉該第一控制線選擇訊號至大約一低電源供應電壓,該第二端用以接收該低電源供應電壓,以及該控制端用以接收該第一上拉訊號,且當該第一上拉訊號的電壓大於該低電源供應電壓時,開啟該第一下拉電晶體。該第一準位向上移轉電路具有一輸出端,該輸出端耦接於該第一上拉電晶體的該控制端和該第一下拉電晶體的該控制端,用以輸出該第一上拉訊號。該第一準位向上移轉電路接收一第一選擇訊號,當該第一選擇訊號被致能時,將該第一上拉訊號以一第一電壓輸出,然而當該第一選擇訊號非致能時,將該第一上拉訊號以一第二電壓輸出。該第一選擇電路耦接於該第一準位向上移轉電路,用以輸出該第一選擇訊號。該第一選擇電路接收複數個第一解碼訊號,當該複數個第一解碼訊號被致能時,致能該第一選擇訊號,但是當該複數個第一解碼訊號中有第一解碼訊號沒有被致能時,則不致能該第一選擇訊號。An embodiment of the present invention discloses a control driver for a non-volatile memory. The non-volatile memory control driver includes a first driving circuit, a first level up shift circuit, and a first selection circuit. . The first driving circuit includes a first pull-up transistor and a first pull-down transistor. The first pull-up transistor is configured to pull up a first control line selection signal according to a first pull-up signal, and the first pull-down transistor is configured to pull down the first control line according to the first pull-up signal Select the signal. The first pull-up transistor includes a first end, a second end, and a control end. The first end pulls the first control line to select a signal to the first control line voltage, the second end is configured to receive the first control line voltage, and the control end is configured to receive the first pull-up signal And when the voltage of the first pull-up signal is less than the voltage of the first control line, the control terminal is configured to turn on the first pull-up transistor. The first pull-down transistor includes a first end, a second end, and a control end. The first end is coupled to the first end of the first pull-up transistor for pulling down the first control line select signal to approximately a low power supply voltage, and the second end is configured to receive the low power supply voltage, And the control terminal is configured to receive the first pull-up signal, and when the voltage of the first pull-up signal is greater than the low power supply voltage, turn on the first pull-down transistor. The first level up shifting circuit has an output end coupled to the control end of the first pull-up transistor and the control end of the first pull-down transistor for outputting the first Pull up the signal. The first level up shifting circuit receives a first selection signal, and when the first selection signal is enabled, the first pull signal is outputted as a first voltage, but when the first selection signal is not When possible, the first pull-up signal is outputted as a second voltage. The first selection circuit is coupled to the first level up shift circuit for outputting the first selection signal. The first selection circuit receives a plurality of first decoded signals, and when the plurality of first decoded signals are enabled, enabling the first selected signal, but when the first decoded signals of the plurality of first decoded signals are not present, When enabled, the first selection signal is not enabled.
請參照第5圖,第5圖係為本發明實施例的控制線架構之示意圖。該控制線架構包括複數個記憶體陣列區段500a,...,500g。在每一記憶體陣列區段中,可藉由解碼訊號PA<14:8>來選擇記憶體陣列中的每一區塊。解碼訊號PA<14:8>可分為控制線解碼訊號PA<11:8>和區段解碼訊號PA<14:12>。控制線解碼訊號PA<11:8>可用來產生控制線電壓ZCLV<15:0>。Please refer to FIG. 5, which is a schematic diagram of a control line architecture according to an embodiment of the present invention. The control line architecture includes a plurality of memory array segments 500a, ..., 500g. In each memory array segment, each block in the memory array can be selected by decoding signals PA<14:8>. The decoding signals PA<14:8> can be divided into control line decoding signals PA<11:8> and sector decoding signals PA<14:12>. The control line decode signal PA<11:8> can be used to generate the control line voltage ZCLV<15:0>.
請參照第6圖,第6圖係為本發明實施例用以進行閘極驅動選擇之方塊圖。記憶體陣列620包括複數個記憶體陣列區段621[0],621[1],621[2],621[3],這些記憶體陣列區段的區塊可分別透過複數個控制線選擇訊號ZCL<127:0>,ZCL<128:255>,ZCL<256:383>,ZCL<384:511>來選擇。控制線選擇訊號ZCL<0:511>可透過前解碼器600產生,前解碼器600接收解碼訊號A<8:16>後,產生記憶體區塊選擇訊號XPA<3:0>,XPB<3:0>,XPC<3:0>,以及基於解碼訊號A<8:16>產生控制訊號XCT<7:0>。控制訊號XCT<7:0>可被準位移轉以產生準位移轉控制訊號XT<7:0>和反向準位移轉控制訊號XTB<7:0>。然後,基於記憶體區塊選擇訊號XPA<3:0>,XPB<3:0>,XPC<3:0>,準位移轉控制訊號XT<7:0>,以及反向準位移轉控制訊號XTB<7:0>來產生控制線選擇訊號ZCL<0:511>。Please refer to FIG. 6. FIG. 6 is a block diagram of a gate drive selection for an embodiment of the present invention. The memory array 620 includes a plurality of memory array segments 621[0], 621[1], 621[2], 621[3], and the blocks of the memory array segments can select signals through a plurality of control lines respectively. ZCL<127:0>, ZCL<128:255>, ZCL<256:383>, ZCL<384:511> to select. The control line selection signal ZCL<0:511> can be generated by the pre-decoder 600, and the pre-decoder 600 receives the decoded signal A<8:16>, and generates a memory block selection signal XPA<3:0>, XPB<3. :0>, XPC<3:0>, and generate control signals XCT<7:0> based on the decoded signals A<8:16>. The control signals XCT<7:0> can be rotated to generate a quasi-displacement control signal XT<7:0> and a reverse quasi-displacement control signal XTB<7:0>. Then, based on the memory block selection signals XPA<3:0>, XPB<3:0>, XPC<3:0>, the quasi-displacement control signal XT<7:0>, and the reverse quasi-displacement control signal XTB<7:0> to generate the control line selection signal ZCL<0:511>.
請參照第7圖,第7圖係為本發明實施例在程式化模式下的複數個列驅動電路之示意圖。第一列驅動電路中的“列”包括第一驅動電路A,第二驅動電路B,第一準位向上移轉電路721,以及第一選擇電路711。第一準位向上移轉電路721耦接第一和第二驅動電路A、B,用以輸出第一上拉訊號PU1,第一選擇電路711耦接第一準位向上移轉電路721,用以輸出第一選擇訊號。第一選擇電路711係可為及閘或是反及閘。第二列驅動電路中的“列”包括第三驅動電路C,第四驅動電路D,第二準位向上移轉電路722,以及第二選擇電路712。第二準位向上移轉電路722耦接第三和第四驅動電路C、D,用以輸出第二上拉訊號PU2,第二選擇電路712耦接第二準位向上移轉電路722,用以輸出第二選擇訊號。第二選擇電路係可為及閘或是反及閘。第一驅動電路A包括第一上拉電晶體MP_A,用以根據第一上拉訊號PU1,上拉第一控制線選擇訊號ZCL<0>。第一上拉電晶體MP_A是P型金氧半電晶體,其包括第一端,第二端,以及控制端。第一上拉電晶體MP_A的第一端,例如汲極端,用以輸出第一控制線選擇訊號ZCL<0>大約至第一控制線電壓ZCLV<0>;第二端,例如源極端,用以接收第一控制線電壓ZCLV<0>;控制端,例如閘極端,用以接收第一上拉訊號PU1和當第一上拉訊號PU1的電壓小於第一控制線電壓ZCLV<0>時,開啟第一上拉電晶體MP_A。第一驅動電路A另包括第一下拉電晶體MN_A,用以根據第一上拉訊號PU1,下拉第一控制線選擇訊號ZCL<0>。第一下拉電晶體MN_A是N型金氧半電晶體,包括第一端,第二端以及控制端。第一下拉電晶體MN_A的第一端,例如汲極端,耦接第一上拉電晶體MP_A的第一端,用以輸出第一控制線選擇訊號ZCL<0>大約至低電源供應電壓VBC;第二端,例如源極端,用以接收低電源供應電壓;控制端,例如閘極端,用以接收第一上拉訊號PU1和當第一上拉訊號的電壓PU1大於低電源供應電壓VBC時,開啟第一下拉電晶體MN_A。第一準位向上移轉電路721的輸出端直接耦接第一驅動電路A的第一上拉電晶體MP_A的閘極和第一下拉電晶體MN_A的閘極,用以輸出第一上拉訊號PU1。第一準位向上移轉電路721的輸出端也直接耦接第二驅動電路B的第二上拉電晶體MP_B的閘極和第二下拉電晶體MN_B的閘極。第一準位向上移轉電路721接收第一選擇訊號,當第一選擇訊號致能時,第一準位向上移轉電路721輸出第一上拉訊號PU1在第一電壓GND,例如0V。當第一選擇訊號沒致能時,第一準位向上移轉電路721輸出第一上拉訊號PU1在第二電壓VP5,例如5.5V。第一選擇電路711耦接第一準位向上移轉電路721,用以輸出第一選擇訊號。第一選擇電路711接收複數個第一解碼訊號XPA,XPB,和XPC。當所有第一解碼訊號XPA,XPB,和XPC致能時,第一選擇電路711將致能第一選擇訊號,當第一解碼訊號XPA,XPB,和XPC中有一個第一解碼訊號XPA,XPB,和XPC沒有被致能時,第一選擇電路711將不致能第一選擇訊號。有關於第一選擇訊號的“致能”,如果第一選擇電路711是及閘,“致能”代表輸出邏輯高準位訊號,但是如果第一選擇電路711是反及閘的話,“致能”代表輸出邏輯低準位訊號。同樣地情況也適用於第二選擇電路721和第二選擇訊號。Please refer to FIG. 7. FIG. 7 is a schematic diagram of a plurality of column driving circuits in a stylized mode according to an embodiment of the present invention. The "column" in the first column of driving circuits includes a first driving circuit A, a second driving circuit B, a first level up shift circuit 721, and a first selection circuit 711. The first level up shift circuit 721 is coupled to the first and second drive circuits A and B for outputting the first pull-up signal PU1, and the first selection circuit 711 is coupled to the first level up shift circuit 721. To output the first selection signal. The first selection circuit 711 can be a gate or a reverse gate. The "column" in the second column of driving circuits includes a third driving circuit C, a fourth driving circuit D, a second level up shift circuit 722, and a second selection circuit 712. The second level up shift circuit 722 is coupled to the third and fourth drive circuits C and D for outputting the second pull-up signal PU2, and the second selection circuit 712 is coupled to the second level up shift circuit 722. To output a second selection signal. The second selection circuit can be a gate or a reverse gate. The first driving circuit A includes a first pull-up transistor MP_A for pulling up the first control line selection signal ZCL<0> according to the first pull-up signal PU1. The first pull-up transistor MP_A is a P-type MOS transistor, which includes a first end, a second end, and a control end. a first end of the first pull-up transistor MP_A, such as a 汲 terminal, for outputting a first control line select signal ZCL<0> to a first control line voltage ZCLV<0>; a second end, such as a source terminal, Receiving a first control line voltage ZCLV<0>; a control terminal, such as a gate terminal, for receiving the first pull-up signal PU1 and when the voltage of the first pull-up signal PU1 is less than the first control line voltage ZCLV<0>, The first pull-up transistor MP_A is turned on. The first driving circuit A further includes a first pull-down transistor MN_A for pulling down the first control line selection signal ZCL<0> according to the first pull-up signal PU1. The first pull-down transistor MN_A is an N-type MOS transistor, including a first end, a second end, and a control end. The first end of the first pull-down transistor MN_A, for example, the 汲 terminal, is coupled to the first end of the first pull-up transistor MP_A for outputting the first control line selection signal ZCL<0> to a low power supply voltage VBC a second end, such as a source terminal, for receiving a low power supply voltage; a control terminal, such as a gate terminal, for receiving the first pull-up signal PU1 and when the voltage PU1 of the first pull-up signal is greater than the low power supply voltage VBC , the first pull-down transistor MN_A is turned on. The output of the first level up-shift circuit 721 is directly coupled to the gate of the first pull-up transistor MP_A of the first driving circuit A and the gate of the first pull-down transistor MN_A for outputting the first pull-up Signal PU1. The output of the first level up shift circuit 721 is also directly coupled to the gate of the second pull-up transistor MP_B of the second driver circuit B and the gate of the second pull-down transistor MN_B. The first level up shift circuit 721 receives the first select signal. When the first select signal is enabled, the first level up shift circuit 721 outputs the first pull up signal PU1 at the first voltage GND, for example, 0V. When the first selection signal is not enabled, the first level up shift circuit 721 outputs the first pull-up signal PU1 at the second voltage VP5, for example, 5.5V. The first selection circuit 711 is coupled to the first level up shift circuit 721 for outputting the first selection signal. The first selection circuit 711 receives a plurality of first decoded signals XPA, XPB, and XPC. When all of the first decoded signals XPA, XPB, and XPC are enabled, the first selection circuit 711 will enable the first selection signal, and when the first decoded signals XPA, XPB, and XPC have a first decoded signal XPA, XPB When the XPC is not enabled, the first selection circuit 711 will not enable the first selection signal. Regarding the "enable" of the first selection signal, if the first selection circuit 711 is a gate, "enable" represents the output logic high level signal, but if the first selection circuit 711 is a reverse gate, "enable" "Represents the output logic low level signal. The same applies to the second selection circuit 721 and the second selection signal.
請參照第7圖,有128個控制線選擇訊號ZCL<0:127>用於此架構上,16個控制線電壓ZCLV<0:15>和8個驅動電路“列”可用來在一陣列中產生控制線選擇訊號ZCL<0:127>。例如,第二驅動電路B可用來產生第二控制線選擇訊號ZCL<15>,第三驅動電路C可用來產生第三控制線選擇訊號ZCL<112>,以及第四驅動電路D可用來產生第四控制線選擇訊號ZCL<127>。第一上拉訊號PU1可用來控制控制線選擇訊號ZCL<0:15>,和第二上拉訊號PU2可用來控制控制線選擇訊號ZCL<112:127>。然後,用於每一驅動電路“列”的上拉訊號可藉由解碼訊號XPA,XPB,和XPC來選擇。解碼訊號XPA,XPB,和XPC的每種組合是二進位的訊號,可對應到驅動電路“列”中的每一列。因此,第7圖在程式化模式下,透過驅動電路“列”和控制線電壓ZCLV<0:15>的致能,其中一個驅動電路可產生控制線選擇訊號至控制線電壓,以及其他驅動電路可產生控制線選擇訊號至低電源供應電壓VBC。例如在第7圖中,透過解碼訊號XPA,XPB,XPC和第一控制線電壓ZCLV<0>可選擇第一驅動電路,如此第一控制線選擇訊號ZCL<0>將輸出第一控制線電壓ZCLV<0>,例如5.5V。第二驅動電路B,第三驅動電路C,和第四驅動電路D全部輸出低電源供應電壓,例如3.3V。所以,雖然第二驅動電路B接收已致能的第一上拉訊號PU1,但因為第二控制線電壓ZCLV<15>沒有致能,例如是3.3V,所以第二驅動電路B輸出第二控制線電壓ZCLV<15>,例如3.3V。第三驅動電路C接收已致能第一控制線電壓ZCLV<0>,例如是5.5V。然而,因為第二上拉訊號PU2沒有致能,所以第三驅動電路C的上拉電晶體MP_C關閉,第三驅動電路C的下拉電晶體MN_C開啟,使得第三控制線選擇訊號ZCL<112>輸出低電源供應電壓VBC,例如3.3V。在上述實施例中,低電源供應電壓VBC和非致能控制線電壓ZCLV可以相同,例如3.3V,然而低電源供應電壓VBC和非致能控制線電壓ZCLV也可以不同。Please refer to Figure 7, there are 128 control line selection signals ZCL<0:127> for this architecture, 16 control line voltages ZCLV<0:15> and 8 drive circuit "columns" can be used in an array The control line selection signal ZCL<0:127> is generated. For example, the second driving circuit B can be used to generate the second control line selection signal ZCL<15>, the third driving circuit C can be used to generate the third control line selection signal ZCL<112>, and the fourth driving circuit D can be used to generate the first The four control lines select the signal ZCL<127>. The first pull-up signal PU1 can be used to control the control line selection signal ZCL<0:15>, and the second pull-up signal PU2 can be used to control the control line selection signal ZCL<112:127>. Then, the pull-up signal for each driver circuit "column" can be selected by decoding signals XPA, XPB, and XPC. Each combination of the decoded signals XPA, XPB, and XPC is a binary signal that corresponds to each column in the "column" of the driver circuit. Therefore, in the stylized mode, Figure 7 is enabled by the drive circuit "column" and the control line voltage ZCLV<0:15>, one of which can generate the control line select signal to the control line voltage, and other drive circuits. A control line selection signal can be generated to the low power supply voltage VBC. For example, in FIG. 7, the first driving circuit can be selected by the decoding signals XPA, XPB, XPC and the first control line voltage ZCLV<0>, such that the first control line selection signal ZCL<0> will output the first control line voltage. ZCLV<0>, for example 5.5V. The second drive circuit B, the third drive circuit C, and the fourth drive circuit D all output a low power supply voltage, for example, 3.3V. Therefore, although the second driving circuit B receives the enabled first pull-up signal PU1, since the second control line voltage ZCLV<15> is not enabled, for example, 3.3V, the second driving circuit B outputs the second control. The line voltage ZCLV<15>, for example 3.3V. The third drive circuit C receives the enabled first control line voltage ZCLV<0>, for example 5.5V. However, since the second pull-up signal PU2 is not enabled, the pull-up transistor MP_C of the third driving circuit C is turned off, and the pull-down transistor MN_C of the third driving circuit C is turned on, so that the third control line selection signal ZCL<112> The low supply voltage VBC is output, for example 3.3V. In the above embodiment, the low power supply voltage VBC and the non-enable control line voltage ZCLV may be the same, for example, 3.3V, however, the low power supply voltage VBC and the non-enabled control line voltage ZCLV may also be different.
第8圖在讀取模式下,低電源供應電壓VBC可以低至0V,以及列驅動電路的操作可如下進行。當從記憶體讀取資料時,控制線選擇訊號ZCL<0:127>保持在讀取電壓,例如3.3V。如此,驅動電路A、B、C、D的上拉電晶體MP_A、MP_B、MP_C、MP_D必須被開啟且上拉控制線選擇訊號ZCL<0:127>至讀取電壓。因此,上拉訊號PU1,PU2保持在第一電壓GND,例如0V,用以開啟上拉電晶體MP_A、MP_B、MP_C、MP_D和關閉下拉電晶體MN_A、MN_B、MN_C、MN_D。Figure 8 In the read mode, the low power supply voltage VBC can be as low as 0V, and the operation of the column drive circuit can be performed as follows. When reading data from the memory, the control line select signal ZCL<0:127> remains at the read voltage, for example 3.3V. Thus, the pull-up transistors MP_A, MP_B, MP_C, MP_D of the drive circuits A, B, C, D must be turned on and pull up the control line selection signal ZCL<0:127> to the read voltage. Therefore, the pull-up signals PU1, PU2 are maintained at the first voltage GND, for example 0V, for turning on the pull-up transistors MP_A, MP_B, MP_C, MP_D and turning off the pull-down transistors MN_A, MN_B, MN_C, MN_D.
第9圖在抹去模式下,低電源供應電壓VBC可以低至-6V,以及列驅動電路的操作可如下進行。當從記憶體抹去資料時,控制線選擇訊號ZCL<0:127>保持在抹去電壓,例如-6V。如此,下拉電晶體MN_A、MN_B、MN_C、MN_D必須被開啟且下拉控制線選擇訊號ZCL<0:127>至低電源供應電壓VBC。為了使上拉電晶體MP_A、MP_B、MP_C、MP_D關閉,上拉訊號PU1,PU2必須保持在第一電壓GND,例如0V,以及控制線電壓ZCLV<0:15>要保持在第二電壓,例如0V。因為上拉電晶體MP_A、MP_B、MP_C、MP_D的源極電壓不會比閘極電壓高,所以上拉電晶體MP_A、MP_B、MP_C、MP_D仍舊維持關閉。Figure 9 In the erase mode, the low power supply voltage VBC can be as low as -6V, and the operation of the column drive circuit can be performed as follows. When the data is erased from the memory, the control line selection signal ZCL<0:127> is held at the erase voltage, for example -6V. Thus, the pull-down transistors MN_A, MN_B, MN_C, MN_D must be turned on and the pull-down control line selection signal ZCL<0:127> to the low power supply voltage VBC. In order to turn off the pull-up transistors MP_A, MP_B, MP_C, MP_D, the pull-up signals PU1, PU2 must be maintained at the first voltage GND, such as 0V, and the control line voltage ZCLV<0:15> is to be maintained at the second voltage, for example 0V. Since the source voltages of the pull-up transistors MP_A, MP_B, MP_C, and MP_D are not higher than the gate voltage, the pull-up transistors MP_A, MP_B, MP_C, and MP_D remain off.
總結說來,上述控制驅動器的實施例,利用單一的準位移轉電路,例如準位向上移轉電路,上拉電晶體,以及下拉電晶體,使得控制驅動器更簡單且減少晶片面積。In summary, the above embodiment of the control driver utilizes a single quasi-displacement circuit, such as a level up shift circuit, a pull up transistor, and a pull down transistor, to make the control driver simpler and reduce the wafer area.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
10...列驅動電路10. . . Column drive circuit
100...反或閘100. . . Reverse or gate
121...準位向上移轉電路121. . . Level up shift circuit
122...準位向下移轉電路122. . . Level shifting circuit
200...反向器200. . . Inverter
500a~500g、621[0]~621[3]...記憶體陣列區段500a~500g, 621[0]~621[3]. . . Memory array section
600...前解碼器600. . . Predecoder
620...記憶體陣列620. . . Memory array
711...第一選擇電路711. . . First selection circuit
712...第二選擇電路712. . . Second selection circuit
721...第一準位向上移轉電路721. . . First level up shift circuit
722...第二準位向上移轉電路722. . . Second level up shift circuit
A...第一驅動電路A. . . First drive circuit
B...第二驅動電路B. . . Second drive circuit
C...第三驅動電路C. . . Third drive circuit
D...第四驅動電路D. . . Fourth drive circuit
MP、MP1、MP2、MP_A、MP_B、MP_C、MP_D...上拉電晶體MP, MP1, MP2, MP_A, MP_B, MP_C, MP_D. . . Pull-up transistor
MN、MN1、MN2、MN_A、MN_B、MN_C、MN_D...下拉電晶體MN, MN1, MN2, MN_A, MN_B, MN_C, MN_D. . . Pull down transistor
M_RESET...重設電晶體M_RESET. . . Reset transistor
PA、A<8:16>...解碼訊號PA, A<8:16>. . . Decoding signal
PU1...第一上拉訊號PU1. . . First pull signal
PU2...第二上拉訊號PU2. . . Second pull signal
VBB...低電壓VBB. . . low voltage
VBC...低電源供應電壓VBC. . . Low power supply voltage
VPP、VDD...高電壓VPP, VDD. . . high voltage
XPA<3:0>、XPB<3:0>、XPC<3:0>...記憶體區塊選擇訊號XPA<3:0>, XPB<3:0>, XPC<3:0>. . . Memory block selection signal
XPA、XPB、XPC...第一解碼訊號XPA, XPB, XPC. . . First decoding signal
XCT...控制訊號XCT. . . Control signal
XT...準位移轉控制訊號XT. . . Quasi-displacement control signal
XTB...反向準位移轉控制訊號XTB. . . Reverse quasi-displacement control signal
ZCLV...控制線電壓ZCLV. . . Control line voltage
ZCL...控制線選擇訊號ZCL. . . Control line selection signal
ZWL...字元線選擇訊號ZWL. . . Word line selection signal
ZXWL、ZXWV...重設訊號ZXWL, ZXWV. . . Reset signal
第1圖係為先前列驅動電路之示意圖。Figure 1 is a schematic diagram of a prior column drive circuit.
第2圖係為第1圖中列驅動電路之準位向上移轉電路之示意圖。Fig. 2 is a schematic diagram showing the level shifting circuit of the column driving circuit in Fig. 1.
第3圖係為第1圖中列驅動電路之準位向下移轉電路之示意圖。Figure 3 is a schematic diagram of the level shifting circuit of the column driver circuit in Figure 1.
第4圖係為由第1圖列驅動電路驅動的快閃記憶體單元陣列之示意圖。Figure 4 is a schematic diagram of a flash memory cell array driven by the driver circuit of Figure 1.
第5圖係為本發明實施例的控制線架構之示意圖。Figure 5 is a schematic diagram of a control line architecture in accordance with an embodiment of the present invention.
第6圖係為本發明實施例用以進行閘極驅動選擇之方塊圖。Figure 6 is a block diagram of a gate drive selection for an embodiment of the present invention.
第7圖係本發明實施例複數個控制驅動器在程式化模式下之示意圖。Figure 7 is a schematic diagram of a plurality of control drivers in a stylized mode in accordance with an embodiment of the present invention.
第8圖係第7圖複數個控制驅動器在讀取模式下之示意圖。Figure 8 is a schematic diagram of the plurality of control drivers in the read mode of Figure 7.
第9圖係第7圖複數個控制驅動器在抹去模式下之示意圖。Figure 9 is a schematic diagram of a plurality of control drivers in the erase mode in Figure 7.
500a~500g‧‧‧記憶體陣列區段500a~500g‧‧‧ memory array segment
PA<11:8>‧‧‧控制線解碼訊號PA<11:8>‧‧‧Control line decoding signal
ZCLV‧‧‧控制線電壓ZCLV‧‧‧ control line voltage
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