TWI441057B - Touch input apparatus and operating method thereof - Google Patents

Touch input apparatus and operating method thereof Download PDF

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TWI441057B
TWI441057B TW100142082A TW100142082A TWI441057B TW I441057 B TWI441057 B TW I441057B TW 100142082 A TW100142082 A TW 100142082A TW 100142082 A TW100142082 A TW 100142082A TW I441057 B TWI441057 B TW I441057B
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voltage
force
carbon nanotube
contact pad
voltage value
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TW100142082A
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TW201322067A (en
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Shu Sian Yang
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Pixart Imaging Inc
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觸控輸入裝置及其操作方法Touch input device and operation method thereof

本發明是有關於觸控領域之技術,且特別是有關於採用奈米碳管的觸控輸入裝置及其操作方法。The present invention relates to the field of touch technology, and in particular to a touch input device using a carbon nanotube and a method of operating the same.

受到先天結構上的限制,多數的電阻式觸控面板僅能感測到單一觸碰點的移動軌跡以及單一觸碰點的觸碰力道。儘管有少部份的廠商會將許多小型的單點觸控型電阻式觸控面板集合成一個大尺寸的多點觸控面板,然而這種作法會受到良率不足的限制,因此並未獲得廣泛採用。Due to the inherent structural limitations, most resistive touch panels can only sense the movement trajectory of a single touch point and the touch force of a single touch point. Although a small number of manufacturers will combine many small single-touch resistive touch panels into one large multi-touch panel, this practice will be limited by the lack of yield, so it is not obtained. broadly used.

此外,投射式的電容式觸控面板雖然在先天結構上就能支援多點觸控,然而由於其感測方法為偵測各個觸碰點的微小電容值,因此常因為感測到的訊號太微弱而容易受到外界干擾。而投射式的電容式觸控面板還有一種缺點,就是這種觸控面板無法搭配一般的筆或類似物來進行操作。In addition, the projected capacitive touch panel can support multi-touch in the innate structure. However, since the sensing method is to detect the small capacitance value of each touch point, it is often because the sensed signal is too Weak and vulnerable to outside interference. A disadvantage of the projected capacitive touch panel is that the touch panel cannot be operated with a general pen or the like.

本發明提供多種觸控輸入裝置,這些觸控輸入裝置皆採用奈米碳管來達成多點觸控。The invention provides a plurality of touch input devices, all of which adopt nano carbon tubes to achieve multi-touch.

本發明另提供多種對應於上述之觸控輸入裝置的操作方法。The present invention further provides various methods of operation corresponding to the touch input device described above.

本發明提出一種觸控輸入裝置,其包括有一第一奈米碳管層、一第二奈米碳管層、多個第一接觸墊、多個第二接觸墊與一處理電路。所述第一奈米碳管層中的每一奈米碳管係大致平行於第一方向。所述之第二奈米碳管層中的每一奈米碳管係大致平行於第二方向,且第二奈米碳管層與第一奈米碳管層相隔一預定距離。上述之第一接觸墊皆電性連接第一奈米碳管層的邊緣,並以垂直於第一方向的方式排成一列。而上述之第二接觸墊皆電性連接第二奈米碳管層的邊緣,並以垂直於第二方向的方式排成一列。至於上述之處理電路,其係電性連接上述之第一接觸墊與上述之第二接觸墊。此處理電路用以在第一時段內提供第一比較電壓至上述之第二接觸墊,並依據第一預設順序使上述之第一接觸墊浮接,同時將未浮接的第一接觸墊電性連接至第一參考電壓,以依序讀取浮接之第一接觸墊上的電壓值。此處理電路還用以在第二時段內提供第二比較電壓至上述之第一接觸墊,並依據第二預設順序使上述之第二接觸墊浮接,同時將未浮接之第二接觸墊電性連接至第二參考電壓,以依序讀取浮接之第二接觸墊上的電壓值。當第一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸第二奈米碳管層時,處理電路便依據讀取的電壓值來計算上述外力之力道。The invention provides a touch input device comprising a first carbon nanotube layer, a second carbon nanotube layer, a plurality of first contact pads, a plurality of second contact pads and a processing circuit. Each of the first carbon nanotube layers in the first carbon nanotube layer is substantially parallel to the first direction. Each of the carbon nanotube layers in the second carbon nanotube layer is substantially parallel to the second direction, and the second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance. The first contact pads are electrically connected to the edges of the first carbon nanotube layer and arranged in a row perpendicular to the first direction. The second contact pads are electrically connected to the edges of the second carbon nanotube layer and arranged in a row perpendicular to the second direction. As for the processing circuit described above, the first contact pad and the second contact pad are electrically connected. The processing circuit is configured to provide a first comparison voltage to the second contact pad in the first time period, and float the first contact pad according to the first preset sequence, and simultaneously unfloat the first contact pad Electrically connected to the first reference voltage to sequentially read the voltage value on the floating first contact pad. The processing circuit is further configured to provide a second comparison voltage to the first contact pad in the second time period, and float the second contact pad according to the second predetermined sequence, and simultaneously connect the second contact that is not floating The pad is electrically connected to the second reference voltage to sequentially read the voltage value on the floating second contact pad. When the first carbon nanotube layer is subjected to an external force to electrically contact the second carbon nanotube layer corresponding to one of the external forces, the processing circuit calculates the force of the external force according to the read voltage value. .

在上述觸控輸入裝置的一實施例中,當第一奈米碳管層受多個外力而使其對應於這些外力之多個受力點電性接觸第二奈米碳管層時,處理電路便依據讀取的電壓值來計算這些外力之力道。In an embodiment of the touch input device, when the first carbon nanotube layer is subjected to a plurality of external forces to electrically contact the second carbon nanotube layer corresponding to the plurality of force points of the external force, the treatment is performed. The circuit calculates the force of these external forces based on the read voltage value.

本發明另提出一種對應於上述之觸控輸入裝置的操作方法。所述之觸控輸入裝置包括有一第一奈米碳管層、一第二奈米碳管層、多個第一接觸墊與多個第二接觸墊。所述第一奈米碳管層中之每一奈米碳管係大致平行於第一方向,而所述第二奈米碳管層中之每一奈米碳管係大致平行於第二方向,且第二奈米碳管層與第一奈米碳管層相隔一預定距離。所述之第一接觸墊皆電性連接第一奈米碳管層的邊緣,並以垂直於第一方向的方式排成一列。而所述之第二接觸墊皆電性連接第二奈米碳管層的邊緣,並以垂直於第二方向的方式排成一列。所述之操作方法包括有下列步驟:在第一時段內提供第一比較電壓至上述之第二接觸墊,並依據第一預設順序使上述之第一接觸墊浮接,同時將未浮接的第一接觸墊電性連接至第一參考電壓,以依序讀取浮接之第一接觸墊上的電壓值;在第二時段內提供第二比較電壓至上述之第一接觸墊,並依據第二預設順序使上述之第二接觸墊浮接,同時將未浮接之第二接觸墊電性連接至第二參考電壓,以依序讀取浮接之第二接觸墊上的電壓值;以及當第一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸第二奈米碳管層時,便依據讀取的電壓值來計算上述外力之力道。The present invention further provides an operation method corresponding to the touch input device described above. The touch input device includes a first carbon nanotube layer, a second carbon nanotube layer, a plurality of first contact pads and a plurality of second contact pads. Each of the first carbon nanotube layers is substantially parallel to the first direction, and each of the second carbon nanotube layers is substantially parallel to the second direction And the second carbon nanotube layer is separated from the first carbon nanotube layer by a predetermined distance. The first contact pads are electrically connected to the edges of the first carbon nanotube layer and arranged in a line perpendicular to the first direction. The second contact pads are electrically connected to the edges of the second carbon nanotube layer and arranged in a row perpendicular to the second direction. The operating method includes the steps of: providing a first comparison voltage to the second contact pad in a first time period, and floating the first contact pad according to the first predetermined sequence, while not floating The first contact pad is electrically connected to the first reference voltage to sequentially read the voltage value on the floating first contact pad; the second comparison voltage is supplied to the first contact pad in the second time period, and The second predetermined sequence suspends the second contact pad, and electrically connects the unfloating second contact pad to the second reference voltage to sequentially read the voltage value on the floating second contact pad; And when the first carbon nanotube layer is subjected to an external force to electrically contact the second carbon nanotube layer corresponding to one of the external forces, the force of the external force is calculated according to the read voltage value.

在上述操作方法的一實施例中,當第一奈米碳管層受多個外力而使其對應於這些外力之多個受力點電性接觸第二奈米碳管層時,便依據讀取的電壓值來計算這些外力之力道。In an embodiment of the above operation method, when the first carbon nanotube layer is subjected to a plurality of external forces to electrically contact the second carbon nanotube layer corresponding to the plurality of force points of the external force, the first carbon nanotube layer is read according to the reading. Take the voltage value to calculate the force of these external forces.

本發明又另提出一種觸控輸入裝置,其包括有一第一奈米碳管層、一第二奈米碳管層、多個第一接觸墊、多個第二接觸墊與一處理電路。所述第一奈米碳管層中之每一奈米碳管係大致平行於第一方向。所述第二奈米碳管層中之每一奈米碳管係大致平行於第二方向,且第二奈米碳管層與第一奈米碳管層相隔一預定距離。所述之第一接觸墊皆電性連接第一奈米碳管層的邊緣,並以垂直於第一方向的方式排成一列。而所述之第二接觸墊皆電性連接第二奈米碳管層的邊緣,並以垂直於第二方向的方式排成一列。至於所述之處理電路,其係電性連接上述之第一接觸墊與上述之第二接觸墊。此處理電路用以在第一時段內提供第一比較電壓至上述之第二接觸墊,並讀取上述之第一接觸墊上的電壓值。而此處理電路還用以在第二時段內提供第二比較電壓至上述之第一接觸墊,並讀取上述之第二接觸墊上的電壓值。當第一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸第二奈米碳管層時,處理電路便依據讀取的電壓值來計算上述外力之力道。The invention further provides a touch input device comprising a first carbon nanotube layer, a second carbon nanotube layer, a plurality of first contact pads, a plurality of second contact pads and a processing circuit. Each of the first carbon nanotube layers is substantially parallel to the first direction. Each of the carbon nanotube layers in the second layer of carbon nanotubes is substantially parallel to the second direction, and the second layer of carbon nanotubes is spaced apart from the first layer of carbon nanotubes by a predetermined distance. The first contact pads are electrically connected to the edges of the first carbon nanotube layer and arranged in a line perpendicular to the first direction. The second contact pads are electrically connected to the edges of the second carbon nanotube layer and arranged in a row perpendicular to the second direction. The processing circuit is electrically connected to the first contact pad and the second contact pad. The processing circuit is configured to provide a first comparison voltage to the second contact pad in the first time period and read the voltage value on the first contact pad. The processing circuit is further configured to provide a second comparison voltage to the first contact pad in the second period of time and read the voltage value on the second contact pad. When the first carbon nanotube layer is subjected to an external force to electrically contact the second carbon nanotube layer corresponding to one of the external forces, the processing circuit calculates the force of the external force according to the read voltage value. .

在上述又另一種觸控輸入裝置的一實施例中,當第一奈米碳管層受多個外力而使其對應於這些外力之多個受力點電性接觸第二奈米碳管層時,處理電路便依據讀取的電壓值來計算這些外力之力道。In an embodiment of the above other touch input device, when the first carbon nanotube layer is subjected to a plurality of external forces, the plurality of force points corresponding to the external forces are electrically contacted with the second carbon nanotube layer. When the processing circuit calculates the force of these external forces based on the read voltage value.

本發明再提出一種觸控輸入裝置,其包括有一奈米碳管層、一導電層、多個接觸墊與一處理電路。所述奈米碳管層中之每一奈米碳管係大致平行於一預設方向。所述之導電層係配置於奈米碳管層的上方或下方,並相隔一預定距離。而所述之接觸墊皆電性連接奈米碳管層的邊緣,並以垂直於上述預設方向的方式排成一列。至於所述之處理電路,其係電性連接上述接觸墊與上述導電層。此處理電路用以提供比較電壓至導電層,並用以讀取上述接觸墊上的電壓值。當上述奈米碳管層或上述導電層受一外力而使其對應於上述外力之一受力點電性接觸對方時,處理電路便依據讀取的電壓值來計算上述外力之力道。The invention further provides a touch input device comprising a carbon nanotube layer, a conductive layer, a plurality of contact pads and a processing circuit. Each of the carbon nanotube layers in the carbon nanotube layer is substantially parallel to a predetermined direction. The conductive layer is disposed above or below the carbon nanotube layer and separated by a predetermined distance. The contact pads are electrically connected to the edges of the carbon nanotube layer and arranged in a row perpendicular to the predetermined direction. The processing circuit is electrically connected to the contact pad and the conductive layer. The processing circuit is configured to provide a comparison voltage to the conductive layer and to read the voltage value on the contact pad. When the carbon nanotube layer or the conductive layer is subjected to an external force to electrically contact the other side corresponding to one of the external forces, the processing circuit calculates the force of the external force according to the read voltage value.

在上述再一種觸控輸入裝置的一實施例中,當奈米碳管層受多個外力而使其對應於這些外力之多個受力點電性接觸導電層時,處理電路便依據讀取的電壓值來計算這些外力之力道。In an embodiment of the above-mentioned other touch input device, when the carbon nanotube layer is subjected to a plurality of external forces to electrically contact the conductive layers corresponding to the plurality of force points of the external force, the processing circuit is read according to the reading. The voltage value is used to calculate the force of these external forces.

本發明解決習知問題的方式,乃是採用二個奈米碳管層來建構出一觸控輸入裝置(其適合偵測多個觸碰點的二維位置),或是採用一個奈米碳管層與一個導電層來建構出一觸控輸入裝置(其適合偵測多個觸碰點的一維位置)。因此,在採用二個奈米碳管層,且這二個奈米碳管層中之奈米碳管的排列方向互不相同的硬體架構下,只要再提供比較電壓(例如是電源電壓)至其中一奈米碳管層的其中一邊緣,並從另一奈米碳管層的其中一邊緣讀取複數個電壓值,那麼當其中一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸另一奈米碳管層時,就能依據奈米碳管的電阻異向特性與所讀取到之電壓值的大小來找出觸碰點,並進而依據所讀取到之電壓值的大小來計算、換算或估算出施加於觸碰點的力道。而由於奈米碳管具電阻異向特性,因此多個觸碰點所對應的感測訊號之間的干擾極小,使得本發明極適合進行多點觸控,並能偵測這些觸碰點的二維位置。The method for solving the conventional problem of the present invention is to construct a touch input device (which is suitable for detecting two-dimensional positions of a plurality of touch points) by using two carbon nanotube layers, or adopt a nano carbon. The tube layer and a conductive layer construct a touch input device (which is suitable for detecting one-dimensional positions of a plurality of touch points). Therefore, in the case of a hardware structure in which two carbon nanotube layers are used and the arrangement of the carbon nanotubes in the two carbon nanotube layers are different from each other, a comparison voltage (for example, a power supply voltage) is provided. To one of the edges of one of the carbon nanotube layers, and reading a plurality of voltage values from one of the edges of the other carbon nanotube layer, then when one of the carbon nanotube layers is subjected to an external force, it corresponds to When one of the external forces is electrically contacted with another carbon nanotube layer, the touch point can be found according to the resistance anisotropy characteristic of the carbon nanotube and the read voltage value, and further The force applied to the touch point is calculated, scaled, or estimated based on the magnitude of the read voltage value. Since the carbon nanotube has a resistance anisotropy characteristic, the interference between the sensing signals corresponding to the plurality of touch points is extremely small, so that the present invention is very suitable for multi-touch and can detect the touch points. Two-dimensional position.

而在採用一個奈米碳管層與一個導電層的硬體架構下,只要再提供比較電壓至導電層,並從奈米碳管層的其中一邊緣讀取複數個電壓值,那麼當奈米碳管層或導電層受一外力而使其對應於上述外力之一受力點電性接觸另一方時,就能依據奈米碳管的電阻異向特性與所讀取到之電壓值的大小來找出觸碰點,並進而依據所讀取到之電壓值的大小來計算、換算或估算出施加於觸碰點的力道。而由於奈米碳管具電阻異向特性,因此多個觸碰點所對應的感測訊號之間的干擾極小,使得本發明極適合進行多點觸控,並能偵測這些觸碰點的一維位置。In the hardware architecture using a carbon nanotube layer and a conductive layer, as long as a comparison voltage is applied to the conductive layer and a plurality of voltage values are read from one edge of the carbon nanotube layer, then when the nanometer is used, When the carbon tube layer or the conductive layer is subjected to an external force such that one of the external forces is electrically contacted with the other side, the resistance anisotropy characteristic of the carbon nanotube and the read voltage value can be determined. To find the touch point, and then calculate, convert or estimate the force applied to the touch point according to the magnitude of the read voltage value. Since the carbon nanotube has a resistance anisotropy characteristic, the interference between the sensing signals corresponding to the plurality of touch points is extremely small, so that the present invention is very suitable for multi-touch and can detect the touch points. One-dimensional position.

為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。The above and other objects, features and advantages of the present invention will become more <RTIgt;

第一實施例:First embodiment:

圖1為依照本發明一實施例之觸控輸入裝置的示意圖。請參照圖1,此觸控輸入裝置100包括有奈米碳管層110、接觸墊120~128、奈米碳管層130、接觸墊140~148、以及處理電路150。奈米碳管層110中的每一奈米碳管(如標示112所示)係大致平行於第一方向,而奈米碳管層130中的每一奈米碳管(如標示132所示)係大致平行於第二方向。在此例中,第一方向為沿著Y軸的方向,而第二方向為沿著X軸的方向。此外,奈米碳管層110與130這二者係相隔一預定距離T。接觸墊120~128皆電性連接奈米碳管層110的邊緣,並以垂直於第一方向的方式排成一列,也就是以沿著X軸的方式來排成一列。而接觸墊140~148皆電性連接奈米碳管層130的邊緣,並以垂直於第二方向的方式排成一列,也就是以沿著Y軸的方式來排成一列。FIG. 1 is a schematic diagram of a touch input device according to an embodiment of the invention. Referring to FIG. 1 , the touch input device 100 includes a carbon nanotube layer 110 , contact pads 120 - 128 , a carbon nanotube layer 130 , contact pads 140 - 148 , and a processing circuit 150 . Each of the carbon nanotubes in the carbon nanotube layer 110 (shown as indicated at 112) is generally parallel to the first direction, and each carbon nanotube in the carbon nanotube layer 130 (shown by numeral 132) ) is generally parallel to the second direction. In this example, the first direction is a direction along the Y axis, and the second direction is a direction along the X axis. Further, the carbon nanotube layers 110 and 130 are separated by a predetermined distance T. The contact pads 120-128 are electrically connected to the edges of the carbon nanotube layer 110, and are arranged in a line perpendicular to the first direction, that is, arranged in a row along the X-axis. The contact pads 140-148 are electrically connected to the edges of the carbon nanotube layer 130, and are arranged in a line perpendicular to the second direction, that is, arranged in a row along the Y-axis.

至於處理電路150,其係電性連接接觸墊120~128與接觸墊140~148。此處理電路150的操作方式將以圖2來舉例說明之。請參照圖2,其係用以說明圖1之觸控輸入裝置的觸碰感測方式。如圖2所示,在第一時段內,處理電路150會提供第一比較電壓(例如是電源電壓VDD)至接觸墊140~148,並依據第一預設順序(例如是由左至右)來使接觸墊120~128浮接(floating),同時將未浮接的接觸墊電性連接至第一參考電壓(參考電壓例如是接地電壓GND),以依序讀取浮接之接觸墊上的電壓值。因此,當奈米碳管層110受一外力(以箭頭202來表示)而使其對應於此外力之一受力點電性接觸奈米碳管層130時,處理電路150便可從依序浮接的接觸墊120~128來讀取到五個電壓值,以依據所讀取的電壓值來計算上述受力點相對於奈米碳管層110之平面的X軸方向上的位置,詳細說明如下。As for the processing circuit 150, the contact pads 120-128 and the contact pads 140-148 are electrically connected. The manner of operation of this processing circuit 150 will be illustrated by way of FIG. Please refer to FIG. 2 , which is used to illustrate the touch sensing mode of the touch input device of FIG. 1 . As shown in FIG. 2, during the first time period, the processing circuit 150 provides a first comparison voltage (eg, the power supply voltage VDD) to the contact pads 140-148, and according to the first preset sequence (eg, from left to right) To float the contact pads 120-128 while electrically connecting the unfloating contact pads to the first reference voltage (the reference voltage is, for example, the ground voltage GND), to sequentially read the floating contact pads. Voltage value. Therefore, when the carbon nanotube layer 110 is subjected to an external force (indicated by an arrow 202) so as to correspond to one of the external forces, the treatment circuit 150 can be sequentially contacted. The floating contact pads 120-128 read five voltage values to calculate the position of the force point relative to the plane of the carbon nanotube layer 110 in the X-axis direction according to the read voltage value. described as follows.

由於奈米碳管層110中的每一奈米碳管112係大致平行於Y軸的方向,而基於奈米碳管的電阻異向特性,奈米碳管層110於X軸方向上的阻值係遠大於Y軸方向上的阻值,因此在讀取到的五個電壓值中,對應於接觸墊124的電壓值為最大。如此一來,處理電路150便可依據接觸墊124於奈米碳管層110之平面的X軸方向上的位置,來計算出上述之受力點相對於奈米碳管層110之平面的X軸方向上的座標。也就是說,處理電路150可以從對應於接觸墊120~128的這些電壓值中找出值最大者,以依據所找出之電壓值所對應之接觸墊相對於奈米碳管層110之平面的位置來計算受力點於X軸方向(即第二方向)上的座標。而由於奈米碳管具有電阻異向特性,因此即使奈米碳管層110同時感測到多個觸碰點,接觸墊120~128的各電壓值之間也不會互相干涉。是以,本發明之觸控輸入裝置適於偵測多點觸碰。Since each of the carbon nanotubes 112 in the carbon nanotube layer 110 is substantially parallel to the direction of the Y-axis, and based on the anisotropy of the resistance of the carbon nanotubes, the resistance of the carbon nanotube layer 110 in the X-axis direction The value is much larger than the resistance in the Y-axis direction, so among the five voltage values read, the voltage value corresponding to the contact pad 124 is the largest. In this way, the processing circuit 150 can calculate the X of the force point relative to the plane of the carbon nanotube layer 110 according to the position of the contact pad 124 in the X-axis direction of the plane of the carbon nanotube layer 110. Coordinates in the direction of the axis. That is, the processing circuit 150 can find the largest value among the voltage values corresponding to the contact pads 120-128 to depend on the plane of the contact pad corresponding to the found voltage value relative to the plane of the carbon nanotube layer 110. The position is used to calculate the coordinates of the force point in the X-axis direction (ie, the second direction). Since the carbon nanotubes have resistance anisotropy characteristics, even if the carbon nanotube layer 110 senses a plurality of touch points at the same time, the voltage values of the contact pads 120 to 128 do not interfere with each other. Therefore, the touch input device of the present invention is suitable for detecting multi-touch.

類似地,處理電路150還用以在第二時段內提供第二比較電壓(在此例也是電源電壓VDD)至接觸墊120~128,並依據第二預設順序(例如由上至下)來使接觸墊140~148浮接,同時將未浮接之接觸墊電性連接至第二參考電壓(在此例也是接地電壓GND),以依序讀取浮接之接觸墊上的電壓值。因此,當奈米碳管層110受上述外力而使其對應於此外力之受力點電性接觸奈米碳管層130時,處理電路150便可從依序浮接的接觸墊140~188來讀取到另外五個電壓值,以依據所讀取的電壓值來計算上述受力點相對於奈米碳管層110之平面的Y軸方向上的位置。Similarly, the processing circuit 150 is further configured to provide a second comparison voltage (in this case, the power supply voltage VDD) to the contact pads 120-128 in the second time period, and according to the second preset sequence (eg, from top to bottom). The contact pads 140~148 are floated, and the unfloating contact pads are electrically connected to the second reference voltage (in this case also the ground voltage GND) to sequentially read the voltage values on the floating contact pads. Therefore, when the carbon nanotube layer 110 is subjected to the external force to electrically contact the carbon nanotube layer 130 corresponding to the force of the external force, the processing circuit 150 can float from the contact pads 140 to 188 in sequence. The other five voltage values are read to calculate the position of the above-mentioned force point in the Y-axis direction with respect to the plane of the carbon nanotube layer 110 in accordance with the read voltage value.

另外,奈米碳管層110與130較佳可以是一直維持極性相反。舉例來說,在第二時段內,可以使接觸墊120~128電性連接至第二比較電壓(例如是接地電壓GND),並依第二預設順序使接觸墊140~148浮接,而未浮接之接觸墊則電性連接至第二參考電壓(例如是電源電壓VDD),以便處理電路150在接觸墊140~148中找出電壓值最小者,從而計算受力點在Y軸方向上的位置。如此一來,便可固定奈米碳管層110與130的極性,而不需在每次的電壓讀取掃描時顛倒奈米碳管層110與130的極性,達到省電之功效。也就是說,在一實施方式中,第一比較電壓與第二比較電壓皆可以電源電壓VDD來實現,而第一參考電壓與第二參考電壓皆可以接地電壓GND來實現。而在另一實施方式中,第一比較電壓與第二參考電壓皆可以電源電壓VDD來實現,而第二比較電壓與第一參考電壓皆可以接地電壓GND來實現。In addition, the carbon nanotube layers 110 and 130 preferably have the opposite polarity. For example, in the second time period, the contact pads 120-128 can be electrically connected to the second comparison voltage (for example, the ground voltage GND), and the contact pads 140-148 are floated according to the second preset sequence. The unfloating contact pad is electrically connected to the second reference voltage (for example, the power supply voltage VDD), so that the processing circuit 150 finds the minimum voltage value among the contact pads 140-148, thereby calculating the stress point in the Y-axis direction. The location on the top. In this way, the polarity of the carbon nanotube layers 110 and 130 can be fixed without reversing the polarity of the carbon nanotube layers 110 and 130 at each voltage reading scan to achieve power saving effect. That is, in an embodiment, the first comparison voltage and the second comparison voltage can be implemented by the power supply voltage VDD, and the first reference voltage and the second reference voltage can be implemented by the ground voltage GND. In another embodiment, the first comparison voltage and the second reference voltage can be implemented by the power supply voltage VDD, and the second comparison voltage and the first reference voltage can be implemented by the ground voltage GND.

由於奈米碳管層130中的每一奈米碳管132係大致平行於X軸的方向,而基於奈米碳管的電阻異向特性,奈米碳管層130於Y軸方向上的阻值係遠大於X軸方向上的阻值,因此在讀取到的五個電壓值中,對應於接觸墊144的電壓值為最大(或最小)。如此一來,處理電路150便可依據接觸墊144於奈米碳管層110之平面的Y軸方向上的位置,來計算出上述之受力點相對於奈米碳管層110之平面的Y軸方向上的座標。也就是說,處理電路150可以從對應於接觸墊140~148的這些電壓值中找出值最大者(或最小者),以依據所找出之電壓值所對應之接觸墊相對於奈米碳管層110之平面的位置來計算受力點於Y軸方向(即第一方向)上的座標。Since each of the carbon nanotubes 132 in the carbon nanotube layer 130 is substantially parallel to the direction of the X-axis, and based on the resistance anisotropy of the carbon nanotubes, the resistance of the carbon nanotube layer 130 in the Y-axis direction The value is much larger than the resistance in the X-axis direction, so among the five voltage values read, the voltage value corresponding to the contact pad 144 is the largest (or smallest). In this way, the processing circuit 150 can calculate the Y of the force point relative to the plane of the carbon nanotube layer 110 according to the position of the contact pad 144 in the Y-axis direction of the plane of the carbon nanotube layer 110. Coordinates in the direction of the axis. That is, the processing circuit 150 can find the largest (or least) of the voltage values corresponding to the contact pads 140-148 to correspond to the contact pad corresponding to the nanocarbon according to the found voltage value. The position of the plane of the tube layer 110 is used to calculate the coordinates of the force point in the Y-axis direction (i.e., the first direction).

此外,處理電路150還可依據讀取的電壓值來計算上述外力之力道,以下將舉出數種計算方式。In addition, the processing circuit 150 can also calculate the force of the external force according to the read voltage value, and several calculation methods will be described below.

在第一種方式中,處理電路150可以是從對應於接觸墊120~128的五個電壓值中找出對應於上述受力點之接觸墊的電壓值、所找出之接觸墊的左方至少一接觸墊的電壓值以及所找出之接觸墊的右方至少一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據此電壓代表值來計算上述外力之力道。以圖2為例,處理電路150至少需以對應於接觸墊122~126的三個電壓值來進行加總或加權平均而得到一電壓代表值,而其中接觸墊124係為對應於上述受力點之接觸墊。In the first mode, the processing circuit 150 may be a voltage value corresponding to the contact pad of the force receiving point from the five voltage values corresponding to the contact pads 120-128, and the left side of the contact pad found. And a voltage representative value of the at least one contact pad and the voltage value of the at least one contact pad on the right side of the contact pad, and summing or summing the obtained voltage values to obtain a voltage representative value, according to the voltage representative The value is used to calculate the force of the above external force. For example, in FIG. 2, the processing circuit 150 needs to perform a total or weighted average of three voltage values corresponding to the contact pads 122-126 to obtain a voltage representative value, wherein the contact pads 124 are corresponding to the above force. Point contact pad.

類似地,在第二種方式中,處理電路150可以是從對應於接觸墊140~148的五個電壓值中找出對應於上述受力點之接觸墊的電壓值、所找出之接觸墊的左方至少一接觸墊的電壓值以及所找出之接觸墊的右方至少一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據此電壓代表值來計算上述外力之力道。以圖2為例,處理電路150至少需以對應於接觸墊142~146的三個電壓值來進行加總或加權平均而得到一電壓代表值,而其中接觸墊144係為對應於上述受力點之接觸墊。Similarly, in the second mode, the processing circuit 150 may be a voltage value from the five voltage values corresponding to the contact pads 140-148 to find the contact pad corresponding to the force receiving point, and the contact pad found. The voltage value of at least one of the contact pads on the left side and the voltage value of at least one contact pad on the right side of the contact pad are found, and the voltage values found are summed or weighted averaged to obtain a voltage representative value. This voltage represents the value to calculate the force of the above external force. For example, in FIG. 2, the processing circuit 150 needs to perform a total or weighted average of three voltage values corresponding to the contact pads 142-146 to obtain a voltage representative value, wherein the contact pads 144 are corresponding to the above force. Point contact pad.

在第三種方式中,處理電路150可以是從對應於接觸墊120~128的五個電壓值中找出對應於上述受力點之接觸墊的電壓值,以及所找出之接觸墊的左方或右方至少一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據上述斜率或上述形狀來估算出上述外力之力道。以圖2為例,處理電路150至少需以對應於接觸墊124與122的二個電壓值,或者是至少需以對應於接觸墊124與126的二個電壓值,來取得所找出電壓值之電壓分佈的一斜率或一形狀,而其中接觸墊124係為對應於上述受力點之接觸墊。In the third mode, the processing circuit 150 may be a voltage value from the five voltage values corresponding to the contact pads 120-128 to find a contact pad corresponding to the force receiving point, and the left side of the contact pad found. At least one of the square or the right side contacts the voltage value of the pad, and obtains a slope or a shape of the voltage distribution of the found voltage value to estimate the force of the external force according to the slope or the shape. For example, in FIG. 2, the processing circuit 150 needs to obtain at least two voltage values corresponding to the contact pads 124 and 122, or at least two voltage values corresponding to the contact pads 124 and 126 to obtain the found voltage value. A slope or a shape of the voltage distribution, wherein the contact pads 124 are contact pads corresponding to the points of force mentioned above.

類似地,在第四種方式中,處理電路150可以是從對應於接觸墊140~148的五個電壓值中找出對應於上述受力點之接觸墊的電壓值,以及所找出之接觸墊的左方或右方至少一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據上述斜率或上述形狀來估算出上述外力之力道。以圖2為例,處理電路150至少需以對應於接觸墊144與142的二個電壓值,或者是至少需以對應於接觸墊144與146的二個電壓值,來取得所找出電壓值之電壓分佈的一斜率或一形狀,而其中接觸墊144係為對應於上述受力點之接觸墊。Similarly, in the fourth mode, the processing circuit 150 may be a voltage value from the five voltage values corresponding to the contact pads 140-148 to find a contact pad corresponding to the force receiving point, and the contact found. The left or right side of the pad contacts at least the voltage value of the pad, and obtains a slope or a shape of the voltage distribution of the found voltage value to estimate the force of the external force according to the slope or the shape. Taking FIG. 2 as an example, the processing circuit 150 needs to obtain at least two voltage values corresponding to the contact pads 144 and 142, or at least two voltage values corresponding to the contact pads 144 and 146 to obtain the found voltage value. A slope or a shape of the voltage distribution, wherein the contact pads 144 are contact pads corresponding to the force points described above.

在第五種方式中,處理電路150可以是從對應於接觸墊120~128的五個電壓值中找出對應於上述受力點之接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作上述外力之力道。以圖2為例,處理電路150係會找出接觸墊124的電壓值,因為此接觸墊124係為對應於上述受力點之接觸墊。In the fifth mode, the processing circuit 150 may be a voltage value corresponding to the contact pad corresponding to the force receiving point from the five voltage values corresponding to the contact pads 120-128, and according to a voltage-force relationship curve. The force corresponding to the voltage value found is converted to use the converted force as the force of the external force. Taking FIG. 2 as an example, the processing circuit 150 will find the voltage value of the contact pad 124 because the contact pad 124 is a contact pad corresponding to the above-mentioned force receiving point.

類似地,在第六種方式中,處理電路150可以是從對應於接觸墊140~148的五個電壓值中找出對應於上述受力點之接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作上述外力之力道。以圖2為例,處理電路150係會找出接觸墊144的電壓值,因為此接觸墊144係為對應於上述受力點之接觸墊。Similarly, in the sixth mode, the processing circuit 150 may be a voltage value corresponding to the contact pad corresponding to the force receiving point from the five voltage values corresponding to the contact pads 140-148, and according to a voltage-force channel The relationship curve is used to convert the force channel corresponding to the found voltage value, so that the converted force channel is regarded as the force of the external force. Taking FIG. 2 as an example, the processing circuit 150 will find the voltage value of the contact pad 144 because the contact pad 144 is a contact pad corresponding to the above-mentioned force receiving point.

藉由上述之教示,本領域具有通常知識者應知道當奈米碳管層110受到多個外力而使其對應於這些外力之多個受力點電性接觸奈米碳管層130時,處理電路150便可依據讀取的電壓值來計算這些外力之力道。With the above teachings, those skilled in the art should know that when the carbon nanotube layer 110 is subjected to a plurality of external forces to electrically contact the plurality of force points of the external force to the carbon nanotube layer 130, the treatment is performed. The circuit 150 can calculate the force of these external forces based on the read voltage values.

值得一提的是,圖1之觸控輸入裝置還可進一步包括一間隙物層,以圖3來說明之。圖3係用以說明間隙物層之配置方式。請參照圖3,間隙物層310係可配置於奈米碳管層110與130之間。此外,間隙物層310的厚度為前述之預定距離T,且此間隙物層310具有多個間隙物(如標示312所示)。此外,僅管在上述實施例中,每一奈米碳管層係電性連接五個接觸墊,然此並非用以限定本發明,設計者當可依照觸碰辨識之解析度的實際需要而增減每一奈米碳管層所電性連接的接觸墊個數。而本領域具有通常知識者亦應知道,即使將奈米碳管層110與130二者所處位置互相對調,亦可實施本發明。It should be noted that the touch input device of FIG. 1 may further include a spacer layer, which is illustrated in FIG. 3. Figure 3 is a diagram for explaining the arrangement of the spacer layer. Referring to FIG. 3, the spacer layer 310 can be disposed between the carbon nanotube layers 110 and 130. In addition, the thickness of the spacer layer 310 is a predetermined distance T as described above, and the spacer layer 310 has a plurality of spacers (as indicated by the numeral 312). In addition, in the above embodiment, each of the carbon nanotube layers is electrically connected to the five contact pads, which is not intended to limit the present invention, and the designer can follow the actual needs of the resolution of the touch recognition. Increase or decrease the number of contact pads electrically connected to each carbon nanotube layer. Those skilled in the art will also appreciate that the present invention can be practiced even if the positions of both carbon nanotube layers 110 and 130 are mutually adjusted.

基於上述實施例之教示,本領域具有通常知識者當可歸納出上述之觸控輸入裝置的一些基本操作步驟,如圖4所示。圖4為依照本發明一實施例之觸控輸入裝置的操作方法的流程圖。所述之觸控輸入裝置包括有一第一奈米碳管層、一第二奈米碳管層、多個第一接觸墊與多個第二接觸墊。所述第一奈米碳管層中之每一奈米碳管係大致平行於第一方向。所述之第二奈米碳管層中之每一奈米碳管係大致平行於第二方向,且第二奈米碳管層與第一奈米碳管層相隔一預定距離。所述之第一接觸墊皆電性連接第一奈米碳管層的邊緣,並以垂直於第一方向的方式排成一列。而所述之第二接觸墊皆電性連接第二奈米碳管層的邊緣,並以垂直於第二方向的方式排成一列。請參照圖4,所述之操作方法包括有下列步驟:在第一時段內提供第一比較電壓至上述之第二接觸墊,並依據第一預設順序使上述之第一接觸墊浮接,同時將未浮接的第一接觸墊電性連接至第一參考電壓,以依序讀取浮接之第一接觸墊上的電壓值(如步驟S402所示);在第二時段內提供第二比較電壓至上述之第一接觸墊,並依據第二預設順序使上述之第二接觸墊浮接,同時將未浮接之第二接觸墊電性連接至第二參考電壓,以依序讀取浮接之第二接觸墊上的電壓值(如步驟S404所示);以及當第一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸第二奈米碳管層時,便依據讀取的電壓值來計算上述外力之力道(如步驟S406所示)。Based on the teachings of the above embodiments, those skilled in the art can summarize some of the basic operational steps of the touch input device described above, as shown in FIG. 4 is a flow chart of a method of operating a touch input device in accordance with an embodiment of the invention. The touch input device includes a first carbon nanotube layer, a second carbon nanotube layer, a plurality of first contact pads and a plurality of second contact pads. Each of the first carbon nanotube layers is substantially parallel to the first direction. Each of the carbon nanotube layers in the second carbon nanotube layer is substantially parallel to the second direction, and the second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance. The first contact pads are electrically connected to the edges of the first carbon nanotube layer and arranged in a line perpendicular to the first direction. The second contact pads are electrically connected to the edges of the second carbon nanotube layer and arranged in a row perpendicular to the second direction. Referring to FIG. 4, the operation method includes the steps of: providing a first comparison voltage to the second contact pad in a first time period, and floating the first contact pad according to a first preset sequence, Simultaneously connecting the unfloating first contact pad to the first reference voltage to sequentially read the voltage value on the floating first contact pad (as shown in step S402); providing the second in the second time period Comparing the voltage to the first contact pad, and floating the second contact pad according to the second predetermined sequence, and electrically connecting the unfloating second contact pad to the second reference voltage to read sequentially Taking the voltage value on the floating second contact pad (as shown in step S404); and when the first carbon nanotube layer is subjected to an external force to electrically contact the second nanometer corresponding to one of the external forces In the case of the carbon tube layer, the force of the external force is calculated based on the read voltage value (as shown in step S406).

當然,在上述的操作方法中,還可進一步包括以下步驟:依據所讀取的電壓值來計算上述受力點相對於第一奈米碳管層之平面的位置。此外,當第一奈米碳管層受多個外力而使其對應於這些外力之多個受力點電性接觸第二奈米碳管層時,步驟S406便可改為依據讀取的電壓值來計算這些外力之力道。Of course, in the above operation method, the method may further include the step of calculating the position of the force receiving point relative to the plane of the first carbon nanotube layer according to the read voltage value. In addition, when the first carbon nanotube layer is subjected to a plurality of external forces to electrically contact the second carbon nanotube layer corresponding to the plurality of force points of the external forces, the step S406 can be changed according to the read voltage. Value to calculate the strength of these external forces.

第二實施例:Second embodiment:

此實施例之觸控輸入裝置係採用與第一實施例之觸控輸入裝置相同的硬體架構,然二者的不同之處,在於此實施例之觸控輸入裝置中的處理電路乃是採用不同的操作方式。因此,以下將沿用圖1來說明本實施例。The touch input device of this embodiment adopts the same hardware structure as the touch input device of the first embodiment. However, the difference between the two is that the processing circuit in the touch input device of the embodiment is adopted. Different ways of operation. Therefore, the present embodiment will be described below using FIG.

請再參照圖1,在此實施例中,處理電路150係用以在第一時段內提供第一比較電壓(例如是電源電壓VDD)至接觸墊140~148,並讀取接觸墊120~128上的電壓值。此外,處理電路150還用以在第二時段內提供第二比較電壓(在此例亦為電源電壓VDD)至接觸墊120~128,並讀取接觸墊140~148上的電壓值。因此,當奈米碳管層110受一外力(以箭頭202來表示)而使其對應於此外力之一受力點電性接觸奈米碳管層130時,處理電路150便可依據讀取的電壓值來計算上述外力之力道。也就是說,此實施例之處理電路150並不做將接觸墊依序浮接的操作,也不做將未浮接的接觸墊電性連接至參考電壓(例如是接地電壓GND)的操作,而是直接讀取接觸墊上的電壓值。Referring to FIG. 1 again, in this embodiment, the processing circuit 150 is configured to provide a first comparison voltage (eg, a power supply voltage VDD) to the contact pads 140-148 in a first time period, and read the contact pads 120-128. The voltage value on it. In addition, the processing circuit 150 is further configured to provide a second comparison voltage (also in this case, the power supply voltage VDD) to the contact pads 120-128 during the second time period, and read the voltage values on the contact pads 140-148. Therefore, when the carbon nanotube layer 110 is subjected to an external force (indicated by an arrow 202) so as to correspond to one of the external forces, the processing circuit 150 can be read according to the electrical contact point. The voltage value is used to calculate the force of the above external force. That is to say, the processing circuit 150 of this embodiment does not perform the operation of sequentially floating the contact pads, nor does it electrically connect the unfloating contact pads to the reference voltage (for example, the ground voltage GND). Instead, the voltage value on the contact pad is read directly.

此外,在此實施例中,處理電路150計算上述外力之力道的計算方式以及計算受力點相對於奈米碳管層110之平面的位置的計算方式,皆可與第一實施例所述的計算方式相同,在此便不再贅述。另外,本領域具有通常知識者應知道在此實施例中,當奈米碳管層110受多個外力而使其對應於這些外力之多個受力點電性接觸奈米碳管層130時,處理電路150便可依據讀取的電壓值來計算這些外力之力道。In addition, in this embodiment, the calculation circuit 150 calculates the calculation manner of the force force of the external force and calculates the calculation manner of the position of the force point relative to the plane of the carbon nanotube layer 110, which can be compared with the first embodiment. The calculation is the same and will not be repeated here. In addition, those skilled in the art should know that in this embodiment, when the carbon nanotube layer 110 is subjected to a plurality of external forces such that a plurality of force points corresponding to the external forces are electrically contacted with the carbon nanotube layer 130, The processing circuit 150 can calculate the force of these external forces according to the read voltage value.

第三實施例:Third embodiment:

此實施例之觸控輸入裝置與前述實施例的不同之處,在於此實施例之觸控輸入裝置係將其中一奈米碳管層以一導電層代替,一如圖5所示。The touch input device of this embodiment is different from the previous embodiment. In the touch input device of this embodiment, one of the carbon nanotube layers is replaced by a conductive layer, as shown in FIG.

圖5為依照本發明一實施例之觸控輸入裝置的示意圖。請參照圖5,此觸控輸入裝置500包括有奈米碳管層510、接觸墊520~528、導電層530與處理電路550。FIG. 5 is a schematic diagram of a touch input device according to an embodiment of the invention. Referring to FIG. 5 , the touch input device 500 includes a carbon nanotube layer 510 , contact pads 520 528 528 , a conductive layer 530 , and a processing circuit 550 .

奈米碳管層510中的每一奈米碳管(如標示512所示)係大致平行於第一方向。在此例中,第一方向為沿著Y軸的方向。此外,奈米碳管層510與導電層530這二者係相隔一預定距離T。所述之導電層530例如可以採用銦錫氧化物(Indium Tin Oxide,ITO)來實施。而上述之接觸墊520~528皆電性連接奈米碳管層510的邊緣,並以垂直於第一方向的方式排成一列,也就是以沿著X軸(即沿著第二方向)的方式來排成一列。Each of the carbon nanotubes in the carbon nanotube layer 510 (shown as indicated by numeral 512) is generally parallel to the first direction. In this example, the first direction is the direction along the Y axis. In addition, the carbon nanotube layer 510 and the conductive layer 530 are separated by a predetermined distance T. The conductive layer 530 can be implemented, for example, by using Indium Tin Oxide (ITO). The contact pads 520-528 are electrically connected to the edges of the carbon nanotube layer 510, and are arranged in a row perpendicular to the first direction, that is, along the X axis (ie, along the second direction). Ways to line up.

至於處理電路550,其係電性連接接觸墊520~528與導電層530。此處理電路550用以提供比較電壓(例如是電源電壓VDD)至導電層530,並讀取接觸墊520~528上的電壓值。當奈米碳管層510受一外力(以箭頭602來表示)而使其對應於此外力之一受力點電性接觸導電層530時,處理電路550便依據讀取的電壓值來計算上述外力之力道。當然,此處理電路550亦可依據所讀取的電壓值來計算上述受力點相對於奈米碳管層510之平面的位置。As for the processing circuit 550, the contact pads 520-528 and the conductive layer 530 are electrically connected. The processing circuit 550 is configured to provide a comparison voltage (eg, a power supply voltage VDD) to the conductive layer 530 and read voltage values on the contact pads 520-528. When the carbon nanotube layer 510 is subjected to an external force (indicated by an arrow 602) to electrically contact the conductive layer 530 corresponding to one of the additional forces, the processing circuit 550 calculates the above based on the read voltage value. The force of external force. Of course, the processing circuit 550 can also calculate the position of the force receiving point relative to the plane of the carbon nanotube layer 510 according to the read voltage value.

此外,在此實施例中,處理電路550計算上述外力之力道的計算方式以及計算受力點相對於奈米碳管層510之平面的位置的計算方式,皆可與第一實施例所述的計算方式相同,在此便不再贅述。另外,本領域具有通常知識者應知道在此實施例中,當奈米碳管層510受多個外力而使其對應於這些外力之多個受力點電性接觸導電層530時,處理電路550便可依據讀取的電壓值來計算這些外力之力道。In addition, in this embodiment, the processing circuit 550 calculates the calculation manner of the force force of the external force and calculates the calculation manner of the position of the force point relative to the plane of the carbon nanotube layer 510, which can be compared with the first embodiment. The calculation is the same and will not be repeated here. In addition, those skilled in the art should know that in this embodiment, when the carbon nanotube layer 510 is subjected to a plurality of external forces to electrically contact the conductive layers 530 corresponding to the plurality of external force points, the processing circuit The 550 can calculate the force of these external forces based on the read voltage value.

值得一提的是,僅管在此實施例中,導電層530係配置於奈米碳管層510的下方,然此並非用以限制本發明,設計者亦可將導電層530改為配置在奈米碳管層510的上方。此外,本領域具有通常知識者亦當知道,即使將奈米碳管層510中的每一奈米碳管512皆改為大致平行於第二方向(即沿著X軸的方向),亦可實施本發明。It is to be noted that, in this embodiment, the conductive layer 530 is disposed under the carbon nanotube layer 510. However, the present invention is not intended to limit the present invention, and the designer may also configure the conductive layer 530 to be Above the carbon nanotube layer 510. In addition, it is also known to those skilled in the art that even if each of the carbon nanotubes 512 in the carbon nanotube layer 510 is changed substantially parallel to the second direction (ie, along the X-axis), The invention is implemented.

綜上所述,本發明解決習知問題的方式,乃是採用二個奈米碳管層來建構出一觸控輸入裝置(其適合偵測多個觸碰點的二維位置),或是採用一個奈米碳管層與一個導電層來建構出一觸控輸入裝置(其適合偵測多個觸碰點的一維位置)。因此,在採用二個奈米碳管層,且這二個奈米碳管層中之奈米碳管的排列方向互不相同的硬體架構下,只要再提供比較電壓(例如是電源電壓)至其中一奈米碳管層的其中一邊緣,並從另一奈米碳管層的其中一邊緣讀取複數個電壓值,那麼當其中一奈米碳管層受一外力而使其對應於上述外力之一受力點電性接觸另一奈米碳管層時,就能依據奈米碳管的電阻異向特性與所讀取到之電壓值的大小來找出觸碰點,並進而依據所讀取到之電壓值的大小來計算、換算或估算出施加於觸碰點的力道。而由於奈米碳管具電阻異向特性,因此多個觸碰點所對應的感測訊號之間的干擾極小,使得本發明極適合進行多點觸控,並能偵測這些觸碰點的二維位置。In summary, the method for solving the conventional problem of the present invention is to construct a touch input device (which is suitable for detecting a two-dimensional position of a plurality of touch points) by using two carbon nanotube layers, or A carbon nanotube layer and a conductive layer are used to construct a touch input device (which is suitable for detecting one-dimensional positions of a plurality of touch points). Therefore, in the case of a hardware structure in which two carbon nanotube layers are used and the arrangement of the carbon nanotubes in the two carbon nanotube layers are different from each other, a comparison voltage (for example, a power supply voltage) is provided. To one of the edges of one of the carbon nanotube layers, and reading a plurality of voltage values from one of the edges of the other carbon nanotube layer, then when one of the carbon nanotube layers is subjected to an external force, it corresponds to When one of the external forces is electrically contacted with another carbon nanotube layer, the touch point can be found according to the resistance anisotropy characteristic of the carbon nanotube and the read voltage value, and further The force applied to the touch point is calculated, scaled, or estimated based on the magnitude of the read voltage value. Since the carbon nanotube has a resistance anisotropy characteristic, the interference between the sensing signals corresponding to the plurality of touch points is extremely small, so that the present invention is very suitable for multi-touch and can detect the touch points. Two-dimensional position.

而在採用一個奈米碳管層與一個導電層的硬體架構下,只要再提供比較電壓至導電層,並從奈米碳管層的其中一邊緣讀取複數個電壓值,那麼當奈米碳管層或導電層受一外力而使其對應於上述外力之一受力點電性接觸另一方時,就能依據奈米碳管的電阻異向特性與所讀取到之電壓值的大小來找出觸碰點,並進而依據所讀取到之電壓值的大小來計算、換算或估算出施加於觸碰點的力道。而由於奈米碳管具電阻異向特性,因此多個觸碰點所對應的感測訊號之間的干擾極小,使得本發明極適合進行多點觸控,並能偵測這些觸碰點的一維位置。In the hardware architecture using a carbon nanotube layer and a conductive layer, as long as a comparison voltage is applied to the conductive layer and a plurality of voltage values are read from one edge of the carbon nanotube layer, then when the nanometer is used, When the carbon tube layer or the conductive layer is subjected to an external force such that one of the external forces is electrically contacted with the other side, the resistance anisotropy characteristic of the carbon nanotube and the read voltage value can be determined. To find the touch point, and then calculate, convert or estimate the force applied to the touch point according to the magnitude of the read voltage value. Since the carbon nanotube has a resistance anisotropy characteristic, the interference between the sensing signals corresponding to the plurality of touch points is extremely small, so that the present invention is very suitable for multi-touch and can detect the touch points. One-dimensional position.

雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the present invention has been described above in terms of the preferred embodiments, it is not intended to limit the invention, and those of ordinary skill in the art can make a few changes and modifications without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.

100、500‧‧‧觸控輸入裝置100, 500‧‧‧ touch input device

110、130、510‧‧‧奈米碳管層110, 130, 510‧ ‧ nm carbon tube layer

120~128、140~148、520~528‧‧‧接觸墊120~128, 140~148, 520~528‧‧‧ contact pads

112、132、512‧‧‧奈米碳管112, 132, 512‧‧‧ carbon nanotubes

150、550‧‧‧處理電路150, 550‧‧‧ processing circuit

202、602‧‧‧以箭頭表示之外力202, 602‧‧‧ indicates the external force by the arrow

310‧‧‧間隙物層310‧‧‧Interstitial layer

312‧‧‧間隙物312‧‧ ‧ spacers

530‧‧‧導電層530‧‧‧ Conductive layer

GND‧‧‧接地電壓GND‧‧‧ Grounding voltage

T‧‧‧預定距離T‧‧‧Predetermined distance

VDD‧‧‧電源電壓VDD‧‧‧Power supply voltage

S402~S406、S602~S604‧‧‧步驟S402~S406, S602~S604‧‧‧ steps

圖1為依照本發明一實施例之觸控輸入裝置的示意圖。FIG. 1 is a schematic diagram of a touch input device according to an embodiment of the invention.

圖2係用以說明圖1之觸控輸入裝置的觸碰感測方式。FIG. 2 is a diagram for explaining a touch sensing manner of the touch input device of FIG. 1.

圖3係用以說明間隙物層之配置方式。Figure 3 is a diagram for explaining the arrangement of the spacer layer.

圖4為依照本發明一實施例之觸控輸入裝置的操作方法的流程圖。4 is a flow chart of a method of operating a touch input device in accordance with an embodiment of the invention.

圖5為依照本發明一實施例之觸控輸入裝置的示意圖。FIG. 5 is a schematic diagram of a touch input device according to an embodiment of the invention.

100...觸控輸入裝置100. . . Touch input device

110、130...奈米碳管層110, 130. . . Carbon nanotube layer

120~128、140~148...接觸墊120~128, 140~148. . . Contact pad

112、132...奈米碳管112, 132. . . Carbon nanotube

150...處理電路150. . . Processing circuit

T...預定距離T. . . Predetermined distance

Claims (39)

一種觸控輸入裝置,包括:一第一奈米碳管層,其每一奈米碳管係大致平行於一第一方向;一第二奈米碳管層,其每一奈米碳管係大致平行於一第二方向,且該第二奈米碳管層與該第一奈米碳管層相隔一預定距離;多個第一接觸墊,電性連接該第一奈米碳管層的邊緣,並以垂直於該第一方向的方式排成一列;多個第二接觸墊,電性連接該第二奈米碳管層的邊緣,並以垂直於該第二方向的方式排成一列;以及一處理電路,電性連接該些第一接觸墊與該些第二接觸墊,用以在一第一時段內提供一第一比較電壓至該些第二接觸墊,並依據一第一預設順序使該些第一接觸墊浮接,同時將未浮接的第一接觸墊電性連接至一第一參考電壓,以依序讀取浮接之第一接觸墊上的電壓值,該處理電路還用以在一第二時段內提供一第二比較電壓至該些第一接觸墊,並依據一第二預設順序使該些第二接觸墊浮接,同時將未浮接之第二接觸墊電性連接至一第二參考電壓,以依序讀取浮接之第二接觸墊上的電壓值,當該第一奈米碳管層受一外力而使其對應於該外力之一受力點電性接觸該第二奈米碳管層時,該處理電路便依據讀取的電壓值來計算該外力之力道,其中該處理電路更依據所讀取的電壓值來計算該受力點相對於該第一奈米碳管層之平面的位置,其中該處理電路係從對應於該些第一接觸墊的該些電壓 值中找出值最大者,以依據所找出之電壓值所對應之第一接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第二方向上的座標,而該處理電路亦從對應於該些第二接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第二接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第一方向上的座標。 A touch input device includes: a first carbon nanotube layer, each of which is substantially parallel to a first direction; a second carbon nanotube layer, each of which has a carbon nanotube system Substantially parallel to a second direction, and the second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance; a plurality of first contact pads electrically connected to the first carbon nanotube layer An edge is arranged in a row perpendicular to the first direction; a plurality of second contact pads electrically connecting the edges of the second carbon nanotube layer and arranged in a column perpendicular to the second direction And a processing circuit electrically connecting the first contact pads and the second contact pads for providing a first comparison voltage to the second contact pads in a first time period, and according to a first The first contact pads are floated, and the unfloating first contact pads are electrically connected to a first reference voltage to sequentially read the voltage values on the floating first contact pads. The processing circuit is further configured to provide a second comparison voltage to the first contact pads in a second time period, and a second predetermined sequence suspending the second contact pads, and electrically connecting the unfloating second contact pads to a second reference voltage to sequentially read the voltage on the floating second contact pads a value, when the first carbon nanotube layer is subjected to an external force to electrically contact the second carbon nanotube layer corresponding to one of the external forces, the processing circuit is based on the read voltage value. Calculating the force of the external force, wherein the processing circuit further calculates a position of the force point relative to a plane of the first carbon nanotube layer according to the read voltage value, wherein the processing circuit corresponds to the The voltage of a contact pad The value is found to be the largest value, and the force point is calculated in the second direction according to the position of the first contact pad corresponding to the found voltage value relative to the plane of the first carbon nanotube layer. a coordinate, and the processing circuit also finds the largest value among the voltage values corresponding to the second contact pads, so that the second contact pad corresponding to the found voltage value is relative to the first nanometer The position of the plane of the carbon tube layer is used to calculate the coordinates of the force point in the first direction. 如申請專利範圍第1項所述之觸控輸入裝置,其中該第一比較電壓與該第二比較電壓皆為一電源電壓,而該第一參考電壓與該第二參考電壓皆為一接地電壓。 The touch input device of claim 1, wherein the first comparison voltage and the second comparison voltage are both a power supply voltage, and the first reference voltage and the second reference voltage are both a ground voltage. . 如申請專利範圍第1項所述之觸控輸入裝置,其中該第一比較電壓與該第二參考電壓皆為一電源電壓,而該第二比較電壓與該第一參考電壓皆為一接地電壓。 The touch input device of claim 1, wherein the first comparison voltage and the second reference voltage are both a power supply voltage, and the second comparison voltage and the first reference voltage are both a ground voltage. . 如申請專利範圍第1項所述之觸控輸入裝置,其中當該第一奈米碳管層受多個外力而使其對應於該些外力之多個受力點電性接觸該第二奈米碳管層時,該處理電路便依據讀取的電壓值來計算該些外力之力道。 The touch input device of claim 1, wherein the first carbon nanotube layer is subjected to a plurality of external forces such that the plurality of force points corresponding to the external forces electrically contact the second nanometer When the carbon nanotube layer is used, the processing circuit calculates the force of the external force according to the read voltage value. 如申請專利範圍第1項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值、所找出之第一接觸墊的左方至少一第一接觸墊的電壓值以及所找出之第一接觸墊的右方至少一第一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The touch input device of claim 1, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and finds the first contact The voltage value of at least one first contact pad on the left side of the pad and the voltage value of at least one first contact pad on the right side of the first contact pad found, and the found voltage values are summed or weighted averaged to obtain A voltage represents a value to calculate the force of the external force based on the representative value of the voltage. 如申請專利範圍第1項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值、所找出之第二接觸墊的左方至少一第二接觸墊的電壓值以及所找出之第二接觸墊的右方至少一第二接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The touch input device of claim 1, wherein the processing circuit finds, from the voltage values, a voltage value corresponding to the second contact pad of the force receiving point, and the found second contact The voltage value of at least one second contact pad on the left side of the pad and the voltage value of at least one second contact pad on the right side of the second contact pad found, and the summed voltage values are summed or weighted averaged to obtain A voltage represents a value to calculate the force of the external force based on the representative value of the voltage. 如申請專利範圍第1項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,以及所找出之第一接觸墊的左方或右方至少一第一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The touch input device of claim 1, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and the first found The voltage value of at least one first contact pad on the left or right side of the contact pad, and a slope or a shape of the voltage distribution of the found voltage value is obtained to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第1項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,以及所找出之第二接觸墊的左方或右方至少一第二接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The touch input device of claim 1, wherein the processing circuit finds a voltage value corresponding to the second contact pad of the force receiving point from the voltage values, and the second found A voltage value of at least one second contact pad on the left or right side of the contact pad, and a slope or a shape of the voltage distribution of the found voltage value is obtained to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第1項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The touch input device of claim 1, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and according to a voltage-force relationship The curve is used to convert the force channel corresponding to the found voltage value, so that the converted force channel is regarded as the force of the external force. 如申請專利範圍第1項所述之觸控輸入裝置,其中該 處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The touch input device of claim 1, wherein the The processing circuit finds a voltage value corresponding to the second contact pad of the force receiving point from the voltage values, and converts the force channel corresponding to the found voltage value according to a voltage-force relationship curve to convert the voltage The strength of the force is used as the force of the external force. 如申請專利範圍第1項所述之觸控輸入裝置,其更包括:一間隙物層,配置於該第一奈米碳管層與該第二奈米碳管層之間,且該間隙物層的厚度為該預定距離。 The touch input device of claim 1, further comprising: a spacer layer disposed between the first carbon nanotube layer and the second carbon nanotube layer, and the spacer The thickness of the layer is the predetermined distance. 一種觸控輸入裝置的操作方法,所述之觸控輸入裝置包括有一第一奈米碳管層、一第二奈米碳管層、多個第一接觸墊與多個第二接觸墊,該第一奈米碳管層中之每一奈米碳管係大致平行於一第一方向,該第二奈米碳管層中之每一奈米碳管係大致平行於一第二方向,且該第二奈米碳管層與該第一奈米碳管層相隔一預定距離,該些第一接觸墊係電性連接該第一奈米碳管層的邊緣,並以垂直於該第一方向的方式排成一列,而該些第二接觸墊係電性連接該第二奈米碳管層的邊緣,並以垂直於該第二方向的方式排成一列,該操作方法包括:在一第一時段內提供一第一比較電壓至該些第二接觸墊,並依據一第一預設順序使該些第一接觸墊浮接,同時將未浮接的第一接觸墊電性連接至一第一參考電壓,以依序讀取浮接之第一接觸墊上的電壓值;在一第二時段內提供一第二比較電壓至該些第一接觸墊,並依據一第二預設順序使該些第二接觸墊浮接,同時將未浮接之第二接觸墊電性連接至一第二參考電壓,以依序讀取浮接之第二接觸墊上的電壓值;以及 當該第一奈米碳管層受一外力而使其對應於該外力之一受力點電性接觸該第二奈米碳管層時,便依據讀取的電壓值來計算該外力之力道,其中更依據所讀取的電壓值來計算該受力點相對於該第一奈米碳管層之平面的位置,其中係從對應於該些第一接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第一接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第二方向上的座標,並從對應於該些第二接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第二接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第一方向上的座標。 A touch input device includes a first carbon nanotube layer, a second carbon nanotube layer, a plurality of first contact pads and a plurality of second contact pads, Each of the first carbon nanotube layers in the first carbon nanotube layer is substantially parallel to a first direction, and each of the second carbon nanotube layers is substantially parallel to a second direction, and The second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance, and the first contact pads are electrically connected to the edge of the first carbon nanotube layer and perpendicular to the first Directional manners are arranged in a row, and the second contact pads are electrically connected to the edges of the second carbon nanotube layer and arranged in a row perpendicular to the second direction, the operation method comprising: Providing a first comparison voltage to the second contact pads in a first period of time, and floating the first contact pads according to a first predetermined sequence, and electrically connecting the unfloating first contact pads to a first reference voltage for sequentially reading the voltage value on the floating first contact pad; a second comparison voltage is applied to the first contact pads, and the second contact pads are floated according to a second predetermined sequence, and the unfloating second contact pads are electrically connected to a second reference voltage Reading the voltage value on the floating second contact pad in sequence; When the first carbon nanotube layer is subjected to an external force to electrically contact the second carbon nanotube layer corresponding to one of the external forces, the force of the external force is calculated according to the read voltage value. The position of the force point relative to the plane of the first carbon nanotube layer is further calculated according to the read voltage value, wherein the voltage values corresponding to the first contact pads are found out The value is the largest, and the coordinates of the force point in the second direction are calculated according to the position of the first contact pad corresponding to the determined voltage value relative to the plane of the first carbon nanotube layer, and Corresponding to the highest value among the voltage values corresponding to the second contact pads, according to the position of the second contact pad corresponding to the found voltage value relative to the plane of the first carbon nanotube layer Calculating the coordinates of the force point in the first direction. 如申請專利範圍第12項所述之操作方法,其中該第一比較電壓與該第二比較電壓皆為一電源電壓,而該第一參考電壓與該第二參考電壓皆為一接地電壓。 The operating method of claim 12, wherein the first comparison voltage and the second comparison voltage are both a power supply voltage, and the first reference voltage and the second reference voltage are both a ground voltage. 如申請專利範圍第12項所述之操作方法,其中該第一比較電壓與該第二參考電壓皆為一電源電壓,而該第二比較電壓與該第一參考電壓皆為一接地電壓。 The operating method of claim 12, wherein the first comparison voltage and the second reference voltage are both a power supply voltage, and the second comparison voltage and the first reference voltage are both a ground voltage. 如申請專利範圍第12項所述之操作方法,其中當該第一奈米碳管層受多個外力而使其對應於該些外力之多個受力點電性接觸該第二奈米碳管層時,便依據讀取的電壓值來計算該些外力之力道。 The method of claim 12, wherein the first carbon nanotube layer is subjected to a plurality of external forces such that the plurality of force points corresponding to the external forces electrically contact the second nanocarbon When the tube layer is used, the force of the external force is calculated according to the read voltage value. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值、所找出之第一接觸墊的左方至少一第一接觸墊的電壓值以及所找出之第一接觸墊的右方至少一第一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the first contact pad of the force point is found from the voltage values, and the left side of the first contact pad found is at least a voltage value of a first contact pad and a voltage value of at least one first contact pad on the right side of the first contact pad found, and summing or weighting the found voltage values to obtain a voltage representative value, The force of the external force is calculated based on the representative value of the voltage. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值、所找出之第二接觸墊的左方至少一第二接觸墊的電壓值以及所找出之第二接觸墊的右方至少一第二接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the second contact pad of the force point is found from the voltage values, and the left side of the second contact pad found is at least a voltage value of a second contact pad and a voltage value of at least one second contact pad on the right side of the second contact pad found, and summing or weighting the found voltage values to obtain a voltage representative value, The force of the external force is calculated based on the representative value of the voltage. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,以及所找出之第一接觸墊的左方或右方至少一第一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the first contact pad of the force point is found from the voltage values, and the left side of the first contact pad found Or a voltage value of at least one first contact pad on the right side, and obtaining a slope or a shape of the voltage distribution of the found voltage value to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,以及所找出之第二接觸墊的左方或右方至少一第二接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the second contact pad of the force point is found from the voltage values, and the left side of the second contact pad is found. Or a voltage value of at least one second contact pad on the right side, and obtaining a slope or a shape of the voltage distribution of the found voltage value to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the first contact pad of the force point is found out from the voltage values, and is converted according to a voltage-force relationship curve. The force corresponding to the voltage value is used to take the converted force as the force of the external force. 如申請專利範圍第12項所述之操作方法,其中係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The method of claim 12, wherein the voltage value corresponding to the second contact pad of the force point is found out from the voltage values, and is converted according to a voltage-force relationship curve. The force corresponding to the voltage value is used to take the converted force as the force of the external force. 一種觸控輸入裝置,包括:一第一奈米碳管層,其每一奈米碳管係大致平行於一第一方向;一第二奈米碳管層,其每一奈米碳管係大致平行於一第二方向,且該第二奈米碳管層與該第一奈米碳管層相隔一預定距離;多個第一接觸墊,電性連接該第一奈米碳管層的邊緣,並以垂直於該第一方向的方式排成一列;多個第二接觸墊,電性連接該第二奈米碳管層的邊緣,並以垂直於該第二方向的方式排成一列;以及一處理電路,電性連接該些第一接觸墊與該些第二接觸墊,用以在一第一時段內提供一第一比較電壓至該些第二接觸墊,並讀取該些第一接觸墊上的電壓值,該處理電路還用以在一第二時段內提供一第二比較電壓至該些第一接觸墊,並讀取該些第二接觸墊上的電壓值,當該第一奈米碳管層受一外力而使其對應於該外力之一受力點電性接觸該第二奈米碳管層 時,該處理電路便依據讀取的電壓值來計該外力之力道,其中該第一比較電壓與該第二比較電壓皆為一電源電壓。 A touch input device includes: a first carbon nanotube layer, each of which is substantially parallel to a first direction; a second carbon nanotube layer, each of which has a carbon nanotube system Substantially parallel to a second direction, and the second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance; a plurality of first contact pads electrically connected to the first carbon nanotube layer An edge is arranged in a row perpendicular to the first direction; a plurality of second contact pads electrically connecting the edges of the second carbon nanotube layer and arranged in a column perpendicular to the second direction And a processing circuit electrically connecting the first contact pads and the second contact pads for providing a first comparison voltage to the second contact pads in a first time period, and reading the a voltage value on the first contact pad, the processing circuit is further configured to provide a second comparison voltage to the first contact pads in a second time period, and read voltage values on the second contact pads, when the first The carbon nanotube layer is subjected to an external force such that it corresponds to one of the external forces, and the second point is electrically contacted Carbon nanotube layer The processing circuit calculates the force of the external force according to the read voltage value, wherein the first comparison voltage and the second comparison voltage are both a power supply voltage. 如申請專利範圍第22項所述之觸控輸入裝置,其中當該第一奈米碳管層受多個外力而使其對應於該些外力之多個受力點電性接觸該第二奈米碳管層時,該處理電路便依據讀取的電壓值來計算該些外力之力道。 The touch input device of claim 22, wherein the first carbon nanotube layer is subjected to a plurality of external forces to electrically contact the plurality of force points corresponding to the external forces When the carbon nanotube layer is used, the processing circuit calculates the force of the external force according to the read voltage value. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值、所找出之第一接觸墊的左方至少一第一接觸墊的電壓值以及所找出之第一接觸墊的右方至少一第一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and finds the first contact The voltage value of at least one first contact pad on the left side of the pad and the voltage value of at least one first contact pad on the right side of the first contact pad found, and the found voltage values are summed or weighted averaged to obtain A voltage represents a value to calculate the force of the external force based on the representative value of the voltage. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值、所找出之第二接觸墊的左方至少一第二接觸墊的電壓值以及所找出之第二接觸墊的右方至少一第二接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds, from the voltage values, a voltage value corresponding to the second contact pad of the force receiving point, and the found second contact The voltage value of at least one second contact pad on the left side of the pad and the voltage value of at least one second contact pad on the right side of the second contact pad found, and the summed voltage values are summed or weighted averaged to obtain A voltage represents a value to calculate the force of the external force based on the representative value of the voltage. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,以及所找出之第一接觸墊的左方或右方至少一第一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率 或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and the first found a voltage value of at least one first contact pad on the left or right side of the contact pad, and a slope of a voltage distribution of the found voltage value Or a shape to estimate the force of the external force based on the slope or the shape. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,以及所找出之第二接觸墊的左方或右方至少一第二接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds a voltage value corresponding to the second contact pad of the force receiving point from the voltage values, and the second found A voltage value of at least one second contact pad on the left or right side of the contact pad, and a slope or a shape of the voltage distribution of the found voltage value is obtained to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第一接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds a voltage value corresponding to the first contact pad of the force receiving point from the voltage values, and according to a voltage-force relationship The curve is used to convert the force channel corresponding to the found voltage value, so that the converted force channel is regarded as the force of the external force. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之第二接觸墊的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。 The touch input device of claim 22, wherein the processing circuit finds a voltage value corresponding to the second contact pad of the force receiving point from the voltage values, and according to a voltage-force relationship The curve is used to convert the force channel corresponding to the found voltage value, so that the converted force channel is regarded as the force of the external force. 如申請專利範圍第22項所述之觸控輸入裝置,其中該處理電路更依據所讀取的電壓值來計算該受力點相對於該第一奈米碳管層之平面的位置。 The touch input device of claim 22, wherein the processing circuit further calculates a position of the force point relative to a plane of the first carbon nanotube layer according to the read voltage value. 如申請專利範圍第30項所述之觸控輸入裝置,其中該處理電路係從對應於該些第一接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第一接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第二方 向上的座標,而該處理電路亦從對應於該些第二接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第二接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第一方向上的座標。 The touch input device of claim 30, wherein the processing circuit finds the largest value among the voltage values corresponding to the first contact pads, according to the found voltage value. Calculating the force point on the second side of the corresponding first contact pad relative to the plane of the first carbon nanotube layer An upward coordinate, and the processing circuit also finds the largest value among the voltage values corresponding to the second contact pads, so that the second contact pad corresponding to the found voltage value is relative to the first The position of the plane of the carbon nanotube layer is used to calculate the coordinates of the force point in the first direction. 如申請專利範圍第22項所述之觸控輸入裝置,其更包括:一間隙物層,配置於該第一奈米碳管層與該第二奈米碳管層之間,且該間隙物層的厚度為該預定距離。 The touch input device of claim 22, further comprising: a spacer layer disposed between the first carbon nanotube layer and the second carbon nanotube layer, and the spacer The thickness of the layer is the predetermined distance. 一種觸控輸入裝置,包括:一第一奈米碳管層,其每一奈米碳管係大致平行於一第一方向;一第二奈米碳管層,其每一奈米碳管係大致平行於一第二方向,且該第二奈米碳管層與該第一奈米碳管層相隔一預定距離;多個第一接觸墊,電性連接該第一奈米碳管層的邊緣,並以垂直於該第一方向的方式排成一列;多個第二接觸墊,電性連接該第二奈米碳管層的邊緣,並以垂直於該第二方向的方式排成一列;以及一處理電路,電性連接該些第一接觸墊與該些第二接觸墊,用以在一第一時段內提供一第一比較電壓至該些第二接觸墊,並讀取該些第一接觸墊上的電壓值,該處理電路還用以在一第二時段內提供一第二比較電壓至該些第一接觸墊,並讀取該些第二接觸墊上的電壓值,當該第一奈米碳管層受一外力而使其對應於該外力之一受力點電性接觸該第二奈米碳管層 時,該處理電路便依據讀取的電壓值來計算該外力之力道,其中該處理電路更依據所讀取的電壓值來計算該受力點相對於該第一奈米碳管層之平面的位置,其中該處理電路係從對應於該些第一接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第一接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第二方向上的座標,而該處理電路亦從對應於該些第二接觸墊的該些電壓值中找出值最大者,以依據所找出之電壓值所對應之第二接觸墊相對於該第一奈米碳管層之平面的位置來計算該受力點於該第一方向上的座標。 A touch input device includes: a first carbon nanotube layer, each of which is substantially parallel to a first direction; a second carbon nanotube layer, each of which has a carbon nanotube system Substantially parallel to a second direction, and the second carbon nanotube layer is spaced apart from the first carbon nanotube layer by a predetermined distance; a plurality of first contact pads electrically connected to the first carbon nanotube layer An edge is arranged in a row perpendicular to the first direction; a plurality of second contact pads electrically connecting the edges of the second carbon nanotube layer and arranged in a column perpendicular to the second direction And a processing circuit electrically connecting the first contact pads and the second contact pads for providing a first comparison voltage to the second contact pads in a first time period, and reading the a voltage value on the first contact pad, the processing circuit is further configured to provide a second comparison voltage to the first contact pads in a second time period, and read voltage values on the second contact pads, when the first The carbon nanotube layer is subjected to an external force such that it corresponds to one of the external forces, and the second point is electrically contacted Carbon nanotube layer The processing circuit calculates the force of the external force according to the read voltage value, wherein the processing circuit further calculates the force point relative to the plane of the first carbon nanotube layer according to the read voltage value. a position, wherein the processing circuit finds the largest value among the voltage values corresponding to the first contact pads, so that the first contact pad corresponding to the found voltage value is relative to the first nanometer a position of a plane of the carbon tube layer to calculate a coordinate of the force point in the second direction, and the processing circuit also finds the largest value among the voltage values corresponding to the second contact pads, to The position of the force point in the first direction is calculated by the position of the second contact pad corresponding to the determined voltage value relative to the plane of the first carbon nanotube layer. 一種觸控輸入裝置,包括:一奈米碳管層,其每一奈米碳管係大致平行於一預設方向;一導電層,配置於該奈米碳管層的上方或下方,並相隔一預定距離;多個接觸墊,電性連接該奈米碳管層的邊緣,並以垂直於該預設方向的方式排成一列;以及一處理電路,電性連接該些接觸墊與該導電層,用以提供一比較電壓至該導電層,並讀取該些接觸墊上的電壓值,當該奈米碳管層或該導電層受一外力而使其對應於該外力之一受力點電性接觸對方時,該處理電路便依據讀取的電壓值來計算該外力之力道,其中該處理電路更依據所讀取的電壓值來計算該受力點相對於該奈米碳管層之平面的位置,其中該處理電路係從該些電壓值中找出值最大者,以依據 所找出之電壓值所對應之接觸墊相對於該奈米碳管層之平面的位置來計算該受力點於垂直於該預設方向之方向上的座標。 A touch input device comprising: a carbon nanotube layer, each of which is substantially parallel to a predetermined direction; a conductive layer disposed above or below the carbon nanotube layer and spaced apart a predetermined distance; a plurality of contact pads electrically connected to the edges of the carbon nanotube layer and arranged in a row perpendicular to the predetermined direction; and a processing circuit electrically connecting the contact pads and the conductive a layer for providing a comparison voltage to the conductive layer, and reading voltage values on the contact pads, when the carbon nanotube layer or the conductive layer is subjected to an external force to correspond to one of the external force points When electrically contacting the other party, the processing circuit calculates the force of the external force according to the read voltage value, wherein the processing circuit further calculates the force point relative to the carbon nanotube layer according to the read voltage value. a position of the plane, wherein the processing circuit finds the largest value among the voltage values to The position of the contact point relative to the plane of the carbon nanotube layer corresponding to the found voltage value is used to calculate the coordinate of the force point in a direction perpendicular to the predetermined direction. 如申請專利範圍第34項所述之觸控輸入裝置,其中該比較電壓為一電源電壓。 The touch input device of claim 34, wherein the comparison voltage is a power supply voltage. 如申請專利範圍第34項所述之觸控輸入裝置,其中當該奈米碳管層受多個外力而使其對應於該些外力之多個受力點電性接觸該導電層時,該處理電路便依據讀取的電壓值來計算該些外力之力道。 The touch input device of claim 34, wherein when the carbon nanotube layer is subjected to a plurality of external forces to electrically contact the conductive layer corresponding to the plurality of force points of the external forces, The processing circuit calculates the force of the external forces based on the read voltage values. 如申請專利範圍第34項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之接觸墊的電壓值、所找出之接觸墊的左方至少一接觸墊的電壓值以及所找出之接觸墊的右方至少一接觸墊的電壓值,並將所找出之電壓值加總或加權平均而得到一電壓代表值,以依據該電壓代表值來計算該外力之力道。 The touch input device of claim 34, wherein the processing circuit finds a voltage value corresponding to the contact pad of the force receiving point from the voltage values, and the left side of the contact pad found And a voltage representative value of at least one contact pad and a voltage value of the at least one contact pad on the right side of the contact pad, and summing or summing the obtained voltage values to obtain a voltage representative value according to the voltage representative The value is used to calculate the force of the external force. 如申請專利範圍第34項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之接觸墊的電壓值,以及所找出之接觸墊的左方或右方至少一接觸墊的電壓值,並取得所找出電壓值之電壓分佈的一斜率或一形狀,以依據該斜率或該形狀來估算出該外力之力道。 The touch input device of claim 34, wherein the processing circuit finds a voltage value corresponding to the contact pad of the force receiving point from the voltage values, and the left side of the contact pad found At least one of the square or the right side contacts the voltage value of the pad, and obtains a slope or a shape of the voltage distribution of the found voltage value to estimate the force of the external force according to the slope or the shape. 如申請專利範圍第34項所述之觸控輸入裝置,其中該處理電路係從該些電壓值中找出對應於該受力點之接觸墊 的電壓值,並依據一電壓-力道關係曲線來換算所找出之電壓值所對應的力道,以將換算出的力道當作該外力之力道。The touch input device of claim 34, wherein the processing circuit finds a contact pad corresponding to the force point from the voltage values. The voltage value is converted according to a voltage-force relationship curve to the force channel corresponding to the found voltage value, so that the converted force channel is regarded as the force of the external force.
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