TWI440824B - Height gauge and height measuring method - Google Patents

Description

Height gauge and height measurement method

The present invention relates to height measurement techniques, and more particularly to a height gauge for measuring height and a method for measuring height using the height gauge.

As an important aspect of measurement technology, height measurement has attracted much attention for its convenience and accuracy. A height measurement method is disclosed in A Novel Optical Method of Dimension Measurement of Objects with Circular Cross-section by Tomas Fischer et al., 2006 Instrumentation and Measurement Technology Conference. .

Height measurement is mainly divided into two categories: non-contact measurement and contact measurement. In contact measurement, height gauges are generally used as the main measurement tool. Referring to FIG. 6 , at present, the height gauge 300 is mainly composed of a base 310 , a guide post 320 , an extension rod 330 , a measuring rod 340 and a height gauge 350 . When the component to be measured 200 is measured using the existing height gauge 300, the measuring rods 340 are generally in vertical contact with the surface to be measured for measurement. When the annular surface 230 of the element to be measured 200 is used as the measurement reference surface, and the distance between the upper surface 220 and the annular surface 230 is measured, the measuring rod 340 is first brought into vertical contact with the annular surface 230 and zeroed to make the annular surface 230 serve as a measurement reference. Face (reference zero). However, the annular surface 230 is too narrow, so that the measuring rod 340 is difficult to be in close contact with the annular surface 230, and even if it is barely contacted, the element to be measured 200 is tilted, so that it cannot be accurate. The height gauge 300 is zeroed according to the measurement reference such that the measurement fails or the measurement error is excessive when measuring the height distance between the upper surface 220 and the annular surface 230.

In view of this, it is necessary to provide a high degree of regulation that can effectively reduce measurement errors in such situations.

A height gauge which can effectively reduce the measurement error in the above case will be described below by way of a specific embodiment.

A height gauge includes a base, a guide post, an extension rod, and a measuring portion, the guide post is fixed to the base, and the extension rod includes a sliding portion slidably sleeved on the guide post for moving along the axial direction of the guide post, The measuring portion is disposed at an end of the extension rod away from the guide post, the measuring portion includes a reference rod, a height measuring meter, a measuring rod, a fixing frame, a first probe and a second probe, and the reference rod is fixed to the extension rod, and the height is The measuring meter is fixed on the reference rod, the measuring rod is slidably sleeved on the reference rod, and the fixing bracket is connected to one end of the measuring rod away from the measuring rod, and the first probe and the second probe are rotatably connected to the fixing bracket and can be relatively open A predetermined angle is formed, and when the measurement is made, the first probe and the second probe are simultaneously in close contact with the strip side of the component to be measured.

A height measuring method comprising the steps of: providing a component to be measured and a height gauge as described above, the component to be measured having a reference surface and a surface to be measured; rotating the first probe and the second probe to a predetermined angle, and a probe and the second probe are in close contact with the reference surface of the component to be measured; the first probe and the second probe are in close contact with the surface to be measured of the component to be measured and keep the predetermined angle unchanged; according to the height measurement The table obtains the height distance between the surface to be measured and the reference surface.

Compared with the prior art, the height gauge and height measurement method of the technical solution have the following Advantages: First, it uses a first probe that can be rotated around the holder to form a predetermined angle with the second probe to measure the surface to be measured, thereby avoiding the problem that the probe is vertically disposed and cannot contact the narrow surface to be measured. The measurement difficulty is reduced. Secondly, the first probe and the second probe are closely contacted with the opposite sides of the surface to be measured to measure, prevent the component to be tested from tilting, improve the measurement error, and improve the measurement accuracy.

300, 100‧‧‧ height gauge

310, 10‧‧‧ base

320, 20‧‧ ‧ guide column

330, 30‧‧‧ Extension rods

40‧‧‧Measurement Department

340, 44‧‧‧ Measuring rod

350, 43‧‧‧ Height gauge

200‧‧‧ components to be measured

230‧‧‧ring face

220‧‧‧ upper surface

12‧‧‧ first surface

14‧‧‧ second surface

31‧‧‧Sliding section

32‧‧‧Extension

33‧‧‧ fixing screws

322‧‧‧ surface

324‧‧‧ side

326‧‧‧Fixed holes

328‧‧‧through hole

42‧‧‧ benchmark

446‧‧‧ Fixing frame

442‧‧‧First probe

444‧‧‧Second probe

34‧‧‧Adjustment screws

4462‧‧‧ Cavity

4464‧‧‧about fixed axis

4468‧‧‧one side wall

4466‧‧‧Fixed spring

440‧‧‧Measurement probe

210‧‧‧ bottom

202‧‧‧ round hole

FIG. 1 is a schematic diagram of a height gauge provided by an embodiment of the present technical solution.

Figure 2 is a cross-sectional view showing the attachment of the height gauge holder to the probe of the present technical solution.

FIG. 3 is a schematic diagram of components to be measured according to the technical solution.

FIG. 4 is a schematic diagram of the height gauge of the technical solution determining the reference plane and zeroing.

FIG. 5 is a schematic diagram of the height gauge measurement to be measured surface of the technical solution.

Figure 6 is a schematic illustration of a prior art height gauge.

The height gauge of the technical solution will be further described in detail below with reference to the accompanying drawings.

Referring to FIG. 1 , a height gauge 100 provided by an embodiment of the present technical solution includes a base 10 , a guide post 20 , an extension rod 30 , and a measuring portion 40 .

The base 10 has a first surface 12 and a second surface 14. The first surface 12 is parallel to the second surface 14. The first surface 12 is a flat surface for carrying the component to be measured.

The guide post 20 is fixed to the base 10 and perpendicular to the base 10, that is, perpendicular to the first surface 12. The guide post 20 is approximately cylindrical.

The extension rod 30 includes a sliding portion 31 and an extension portion 32. The sliding portion 31 is fixed to the guide post 20 by a fixing screw 33.

The sliding portion 31 has a circular through hole having an inner diameter slightly larger than the outer diameter of the guide post 20 to be engageable with the guide post 20. The sliding portion 31 is slidably sleeved on the guide post 20 for moving the extension rod 30 along the axial direction of the guide post 20 to adjust the distance of the extension rod 30 from the first surface 12 of the base 10. One end of the sliding portion 31 is connected to the fixing screw 33. The fixing screw 33 is used to lock the sliding portion 31 so that the sliding portion 31 is fixed relative to the guide post 20, so that the extension rod 30 fixed to the sliding portion 31 is fixed to the guide post 20.

The extension 32 has a surface 322 and a side 324 that is perpendicularly coupled to the surface 322. One end of the extension 32 is fixed to the sliding portion 31, and the extension 32 is parallel to the first surface 12 of the base 10. The other end of the extension portion 32 has a fixing hole 326 and a through hole 328. The fixing hole 326 is opened from the surface 322 to the extending portion 32, which is perpendicular to the surface 322 for fitting the measuring portion 40. The through hole 328 opens from the side 324 toward the extension 32, which is perpendicular to the side 324. The through hole 328 communicates with the fixing hole 326, and the central axis of the through hole 328 is perpendicular to the central axis of the fixing hole 326.

The measuring unit 40 includes a reference rod 42 , a height measuring table 43 , a measuring rod 44 , a fixing bracket 446 , a first probe 442 and a second probe 444 . The reference rod 42 is fixed to the extension rod 30, the height gauge 43 is fixed to the reference rod 42, and the measuring rod 44 is slidably sleeved on the reference rod 42. The holder 446 is coupled to the measuring rod 44 away from one end of the reference rod 42. The first probe 442 and the second probe 444 are rotatably coupled to the holder 446.

The diameter of the reference rod 42 is slightly larger than the diameter of the fixing hole 326, so that the reference rod 42 can pass through the fixing hole 326 and is fixed to the extension portion 32 away from the one end of the guide post 20 by an interference fit between the reference rod 42 and the fixing hole 326. . One end of the reference rod 42 and the measuring rod 44 is provided with a sliding hole. The diameter of the sliding hole is equivalent to the diameter of the measuring rod 44 near the end of the reference rod 42 so that the measuring rod 44 can be slidably received in the sliding hole of the reference rod 42. .

The measuring rod 44 is located in the sliding hole and can have a rack structure, the adjusting screw 34 and the measuring The fitting portion of the measuring rod 44 has a gear structure. The adjusting screw 34 can pass through the through hole 328 and enter the sliding hole. By adjusting the screw 34 to the gear rack of the measuring rod 44, the adjusting screw 34 can be rotated to adjust the height position of the measuring rod 44 relative to the reference rod 42.

Referring to FIG. 2, the measuring rod 44 is provided with a fixing bracket 446 away from one end of the reference rod 42. The holder 446 has a cavity 4462. The cavity 4462 extends across a fixed shaft 4464. The fixed shaft 4464 is fixed in the cavity 4462 of the holder 446. The first probe 442 and the second probe 444 are rotatably coupled to the fixed shaft 4464. The cavity 4462 has two opposite inner walls 4468 perpendicular to the fixed axis 4464. The fixed axis 4464 is disposed between the first probe 442 and one side inner wall 4468 and the second probe 444 and the other side inner wall 4468 thereof. A fixed spring 4466 in a compressed state. The first probe 442 is equal in length to the second probe 444. Therefore, the first probe 442 and the second probe 444 can be rotated around the fixed shaft 4464 to form a predetermined angle and fixed by the fixed springs 4466 on both sides to match the two relative measurement positions on the surface to be measured, so that the first The probe 442 and the second probe 444 can be in close contact with the opposite measurement positions of the to-be-measured surface.

The other end of the first probe 442 and the second probe 444 each have a measurement probe 440. The measuring probe 440 is used to contact the surface to be measured to obtain the height value of the surface to be measured. The measuring probe 440 can be either conical or cylindrical. In the present embodiment, the measuring probe 440 has a conical shape.

The high gauge 43 is placed on the reference rod 42 of the measuring unit 40. The measuring rod 44 extends through the sliding hole of the reference rod 42 to the inside of the height measuring table 43, and the height measuring table 43 senses the change in the height of the measuring rod 44 by mechanical, capacitive inductance or photoelectric change. For example, in the mechanical height gauge 43, the portion of the measuring rod 44 located in the height measuring table 43 has a rack structure, and the height measuring table 43 can change the minute displacement of the height of the measuring rod 44 by its internal gear combination structure. Zoom in and display on the dial. Capacitive inductive height gauge In the 43th, the measuring rod 44 is made of metal, and the measuring rod 44 can be used as the iron core in the internal capacitance or inductive circuit structure. When the height of the measuring rod 44 is changed, the capacitance or inductance in the circuit structure will change, and then the capacitance or the inductance will be The change is converted to the display value of the display dial, which is the value of the height change of the measuring rod 44. Thus, various height gauges 43 can be used to acquire and display the height values measured by the measurement probe 440.

The height gauge 100 of the technical solution utilizes the first probe 442 of the measuring rod 44 and the second probe 444 to rotate to a predetermined angle to be in close contact with the surface to be measured for measurement, which can effectively prevent the component to be tested from tilting and improve measurement accuracy. .

The embodiment of the present technical solution further provides a method for measuring the height of a component to be measured by using the height gauge 100 described above, which comprises the following steps:

In the first step, the component to be measured 200 and the height gauge 100 as described above are provided.

Referring to FIG. 3, the component to be tested 200 has an opposite bottom surface 210 and an upper surface 220. The element to be tested 200 is provided with a stepped circular hole 202 along its axial direction. The stepped joint of the stepped circular hole 202 has an annular surface 230. In this embodiment, the height distance between the upper surface 220 and the annular surface 230 is measured by using the annular surface 230 as a reference surface.

In the second step, the first probe 442 and the second probe 444 are rotated to a predetermined angle, and the first probe 442 and the second probe 444 are in close contact with the reference surface of the component to be measured 200.

Referring to FIG. 4, the first probe 442 and the second probe 444 are rotated about the fixed axis 4464 to a predetermined angle according to the distance of the annular surface 230, so that the first probe 442 and the second probe 444 and the annular surface 230 are respectively The opposite sides are in contact and closely fit. Since both the first probe 442 and the second probe 444 are at an acute angle to the central axis of the stepped circular hole 202, the first probe 442 and the second probe 444 can be effectively in close contact with the annular surface 230. Moreover, since the first probe 442 and the second probe 444 are respectively opposite to opposite sides of the annular surface 230 Contact, so does not cause the to-be-measured element 200 to tilt and produce excessive measurement errors.

In the third step, the height gauge 43 is zeroed.

After the first probe 442 and the second probe 444 of the measuring rod 44 are in close contact with the opposite sides of the annular surface 230, respectively, the display value of the height measuring table 43 is zeroed, and the annular surface 230 is used as a reference surface for subsequent measurement. That is, reference zero point.

Of course, the zeroing step can also be omitted, and the value of the height measuring table 43 when the probe is in contact with the reference surface can be directly read, and then the reading of the surface to be measured can be subtracted from the reading.

In the fourth step, the first probe 442 and the second probe 444 are brought into close contact with the upper surface 220 of the component to be measured 200.

Referring to FIG. 5, the angle between the first probe 442 and the second probe 444 is kept unchanged, and the height position of the measuring rod 44 relative to the reference rod 42 is adjusted by the adjusting screw 34 to make the first probe 442 and the second probe 444. Both are in close contact with the upper surface 220 of the component to be measured 200.

In the fifth step, the height distance between the upper surface 220 and the annular surface 230 is read according to the height gauge 43.

The high gauge 43 determines its height change based on the position of the measuring rod 44 at the height gauge 43 to display the height change value of the measuring rod 44. The user can read the height distance between the upper surface 220 and the annular surface 230 from the height gauge 43.

Compared with the prior art, the height gauge and height measurement method of the present technical solution has the following advantages: First, it uses a first probe that can be rotated around the fixture to form a predetermined angle with the second probe to measure the surface to be measured. To avoid vertical setting of the probe The problem of contact with the narrow surface to be measured reduces the measurement difficulty; secondly, it uses the first probe and the second probe to make close contact with the opposite sides of the surface to be measured to prevent the component to be tested from tilting and improve the measurement error. Improve measurement accuracy.

In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

100‧‧‧ height gauge

10‧‧‧Base

20‧‧‧ Guide column

30‧‧‧Extension rod

40‧‧‧Measurement Department

43‧‧‧ Height gauge

44‧‧‧Measurement rod

12‧‧‧ first surface

14‧‧‧ second surface

31‧‧‧Sliding section

32‧‧‧Extension

33‧‧‧ fixing screws

322‧‧‧ surface

324‧‧‧ side

326‧‧‧Fixed holes

328‧‧‧through hole

42‧‧‧ benchmark

446‧‧‧ Fixing frame

442‧‧‧First probe

444‧‧‧Second probe

34‧‧‧Adjustment screws

440‧‧‧Measurement probe

Claims (8)

A height gauge includes a base, a guide post, an extension rod, and a measuring portion, the guide post is fixed to the base, and the extension rod includes a sliding portion slidably sleeved on the guide post for moving along the axial direction of the guide post, The measuring portion is disposed at an end of the extension rod away from the guide post, wherein the measuring portion comprises a reference rod, a height measuring meter, a measuring rod, a fixing frame, a first probe and a second probe, and the measuring rod is fixed In the extension rod, the height gauge is fixed to the reference rod, the measuring rod is slidably disposed relative to the reference rod, and the fixing bracket is connected to the measuring rod away from one end of the reference rod, the first probe and the first probe The two probes are rotatably coupled to the holder and can form a predetermined angle with respect to the opening, and the first probe and the second probe are simultaneously in close contact with the surface to be measured of the component to be measured when the measurement is performed. The height gauge of claim 1, wherein the fixing frame has a cavity and a fixed shaft that is fixed to the cavity and fixed to the fixing frame, and the first probe and the second probe are rotatably connected to Fixed shaft for the holder. The height gauge of claim 2, wherein the cavity has two opposite inner walls perpendicular to the fixed axis, the fixed axis is located on the first probe and one side inner wall thereof, and the second probe and the other A fixed spring in a compressed state is disposed between the side inner walls. The height gauge according to claim 1, wherein a fixing screw is disposed between the guide post and the sliding portion, and the fixing screw can be tightened from the sliding portion of the sliding portion to fix the sliding portion relative to the guiding post. The height gauge of claim 1, wherein the first probe and the second probe are equal in length. The height gauge according to claim 1, wherein the first probe and the second probe have a measuring probe near the base end, and the measuring probe is used to contact the surface to be tested to obtain the height position thereof. Set. A height measuring method comprising the steps of: providing a component to be measured and a height gauge as described in claim 1, wherein the component to be measured has a reference surface and a surface to be measured; rotating the first probe and the second probe Up to a predetermined angle, and bringing the first probe and the second probe into close contact with the reference surface of the component to be measured; bringing the first probe and the second probe into close contact with the surface to be measured of the component to be measured and maintaining the predetermined angle Constant; the height distance between the surface to be measured and the reference surface is obtained according to the height measurement table. The height measuring method according to claim 7, wherein the height gauge is zeroed after the first probe and the second probe are brought into close contact with the reference surface of the component to be measured.