TWI435252B - Scanning method of capacitive touch panel - Google Patents

Scanning method of capacitive touch panel Download PDF

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TWI435252B
TWI435252B TW98107498A TW98107498A TWI435252B TW I435252 B TWI435252 B TW I435252B TW 98107498 A TW98107498 A TW 98107498A TW 98107498 A TW98107498 A TW 98107498A TW I435252 B TWI435252 B TW I435252B
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scan lines
scanning
lines
touch
supplied
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TW98107498A
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TW201033878A (en
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Chung Ping An
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Tangent Microelectromechanics Corp
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觸控面板陣列之感應量掃描方法Inductive quantity scanning method of touch panel array

本發明係關於一種觸控面板的掃描方法,特別是關於一種可提供準確之觸碰點資訊之觸控面板陣列之感應量掃描方法。The invention relates to a scanning method of a touch panel, in particular to a sensing quantity scanning method of a touch panel array capable of providing accurate touch point information.

目前,市面上銷售的觸控面板,最大量的有兩種:電阻式與電容式。而一般的電阻式或電容式觸控面板,大都採取二維陣列方式進行排列,如第1圖所示者,其為X,Y各有M,N個點的觸控面板陣列。At present, there are two types of touch panels available on the market: resistive and capacitive. Generally, the resistive or capacitive touch panels are mostly arranged in a two-dimensional array manner. As shown in FIG. 1 , the touch panel arrays of X and Y each have M and N points.

無論是電阻式或者電容式觸控面板,都需要進行感應量的變化偵測,亦即,偵測每條線(XM或YN)的電阻或者電容量有變化。而偵測的方法,習知技術的做法為:先針對X方向掃描,再針對Y方向掃描。如第1圖所示,一般的掃描方式,大都由從X0,X1,...XM依序逐條掃描,並得到該掃瞄線的電阻或電容的感應量E00,E10,...EM0;再由Y0,Y1,...YN依序逐條掃描,並得到該掃瞄線的電阻或電容。接著,即利用X軸的感應量以及Y軸的感應量來交叉計算出電阻或電容感應量E01,E11,...EM1;...E0N,E1N,...EMN。Whether it is a resistive or capacitive touch panel, it is necessary to detect the change in the amount of inductance, that is, to detect the change in the resistance or capacitance of each line (XM or YN). The detection method, the conventional technique is: first scan for the X direction, then scan for the Y direction. As shown in Fig. 1, the general scanning method is mostly scanned one by one from X0, X1, ... XM, and the inductance or capacitance of the scanning line is obtained E00, E10, ... EM0. Then, Y0, Y1, ... YN are sequentially scanned one by one, and the resistance or capacitance of the scan line is obtained. Then, the resistance or capacitance sensing amounts E01, E11, ... EM1; ... E0N, E1N, ... EMN are calculated by using the inductance of the X-axis and the inductance of the Y-axis.

因此,當X方向有M條訊號線,而Y方向有N條訊號線時,總共需要做M+N次掃描,方能得知X方向有哪幾條訊號線有變化,同時計算出Y方向有哪幾條訊號線有變化,進而交會定址出有變化之位址。Therefore, when there are M signal lines in the X direction and N signal lines in the Y direction, a total of M+N scans are needed to know which signal lines have changed in the X direction, and the Y direction is calculated. There are changes to the signal lines, and the address is changed to address the changed address.

如果掃描面積加大,如變為第1圖的四倍時,如第2圖所示者,其為X方向有2M條掃描線,Y方向有2N條掃描線的觸控面板陣列,共有4M×N個點,此種習知技術將需要掃描4*M+4*N次數,掃描一次即須花上相當地時間。If the scan area is increased, if it is four times as shown in Fig. 1, as shown in Fig. 2, it is a touch panel array with 2M scan lines in the X direction and 2N scan lines in the Y direction. × N points, this conventional technique will need to scan 4*M+4*N times, and it takes a considerable amount of time to scan once.

以上的掃描方式,相當簡單,不過,掃描的時間相當耗時。掃描時間長,在訊號線條數越大時越嚴重。為了解決掃描次數過多的問題,就必須提高控制電路的運算能力,進而會提升整體的技術成本,包括耗能與運算速度,都會相應地增加。The above scanning method is quite simple, but the scanning time is quite time consuming. The scan time is long, and the more the number of signal lines is, the more serious it is. In order to solve the problem of too many scans, it is necessary to improve the computing power of the control circuit, which in turn will increase the overall technical cost, including energy consumption and operation speed, and will increase accordingly.

此外,透過習知技術之掃描方式,在處理多點觸碰的時候,容易有鬼鍵(Ghost Key)的問題,如第3圖所示者,其為X軸有兩條掃描線偵測到感應量變化(分別為X2,X4),Y軸有兩條掃描線偵測到感應量變化(分別為Y2,Y4)的掃描圖。依據習知技術的掃描方式,容易形成共有四點的觸碰判斷,亦即,X2Y2,X2Y4,X4Y2,X4Y4。然而,實際上,可能只有兩個點的觸碰,亦即X2Y2,X4Y4兩個點,或者X2Y4,X4Y2兩個點,另外的兩點就形成鬼鍵(Ghost Key)。於是,在偵測到如此的情形時,就必須在後段的控制計算上著墨,更增加控制計算的複雜性。In addition, through the scanning method of the prior art, when dealing with multi-touch, it is easy to have a ghost key (Ghost Key) problem, as shown in Fig. 3, which has two scan lines detected on the X-axis. The amount of change in inductance (X2, X4, respectively), and the scan on the Y-axis with two scan lines detecting the change in inductance (Y2, Y4, respectively). According to the scanning method of the prior art, it is easy to form a total of four points of touch judgment, that is, X2Y2, X2Y4, X4Y2, and X4Y4. However, in reality, there may be only two points of touch, that is, X2Y2, X4Y4 two points, or X2Y4, X4Y2 two points, the other two points form a ghost key (Ghost Key). Therefore, when such a situation is detected, it is necessary to inject the control calculation in the latter stage, which further increases the complexity of the control calculation.

因此,提高觸碰偵測的準確度的方法,成為觸控面板控制技術的主要研究方向。Therefore, the method of improving the accuracy of touch detection has become the main research direction of touch panel control technology.

鑑於以上習知技術的問題,本發明提供一種觸控面板陣列之感應量掃描方法,其可降低掃描的總次數,以降低整體的耗電並提高運算的效率。In view of the above problems in the prior art, the present invention provides a sensing amount scanning method for a touch panel array, which can reduce the total number of scans to reduce overall power consumption and improve computational efficiency.

本發明的另一目的在於,提供一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;依序偵測該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該頻譜值,進行觸碰點判斷。Another object of the present invention is to provide a sensing amount scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying each of the plurality of a signal source of a different frequency in the first direction; sequentially detecting a capacitance value of the plurality of second direction scan lines and converting it into a detection signal; expanding the detection signal into a spectrum value; and according to the spectrum Value, make a touch point judgment.

本發明更提供一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;進行兩個時間點之掃描,依序偵測該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及運用兩個時間點之該頻譜值進行該第二方向掃描線之個別之該頻譜值比對,以進行觸碰點判斷。The invention further provides a sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method comprises the following steps: supplying each of the plurality of first direction scanning lines a signal source of different frequencies; performing scanning at two time points, sequentially detecting a capacitance value of the plurality of second direction scanning lines and converting it into a detection signal; expanding the detection signal into a spectrum value; The spectral value of the two time points is used to perform the comparison of the individual spectral values of the second direction scan line to perform the touch point determination.

本發明另提供一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;同步偵測多條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該多條複數個第二方向掃描線之該頻譜值,以對應之多個偵測電路進行觸碰點判斷,藉以增加掃描之速度。The invention further provides a sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method comprises the steps of: supplying each of the plurality of first direction scanning lines Signal sources of different frequencies; synchronously detecting a plurality of capacitance values of the plurality of second direction scan lines and converting them into a detection signal; expanding the detection signal into a spectrum value; and according to the plurality of plurality of The spectral value of the scanning line in the two directions is determined by the corresponding multiple detection circuits to increase the scanning speed.

本發明又提出一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;進行兩個時間點之掃描,同步偵測多條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該多條複數個第二方向掃描線之該頻譜值,運用兩時間點之比對,以對應之多個偵測電路進行觸碰點判斷,藉以增加掃描之速度。The invention further provides a sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method comprises the steps of: supplying each of the plurality of first direction scanning lines a signal source of different frequencies; performing scanning at two time points, synchronously detecting a capacitance value of one of the plurality of second direction scanning lines and converting it into a detection signal; expanding the detection signal into a spectrum value; And according to the spectral value of the plurality of plurality of second direction scan lines, using the comparison of the two time points, the corresponding plurality of detection circuits perform the touch point judgment, thereby increasing the scanning speed.

本發明還提出一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;同步偵測兩條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該兩條複數個第二方向掃描線之該頻譜值,以相同之第一方向掃描線之一差值進行觸碰點判斷。The invention also provides a sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method comprises the steps of: supplying each of the plurality of first direction scanning lines a signal source of different frequencies; synchronously detecting a capacitance value of one of the plurality of second direction scan lines and converting it into a detection signal; expanding the detection signal into a spectrum value; and based on the two plurality of The spectral value of the scanning line in the two directions is determined by the touch point difference of one of the scanning lines in the first direction.

本發明尚提出一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;偵測該些第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該頻譜值,進行觸碰點判斷。The invention further provides a method for inductive quantity scanning of a touch panel array, wherein the array has a plurality of first direction scan lines and a plurality of second direction scan lines, comprising the steps of: supplying each of the plurality of first direction scan lines a signal source of different frequencies; detecting a capacitance value of the second direction scan line and converting it into a detection signal; expanding the detection signal into a spectrum value; and performing a touch point determination according to the spectrum value.

其中,以上的各種方法,均可採用每條供應不同頻率之掃描線中,每條掃描線供應多個頻率的方法,且任兩條掃描線的多個頻率,至少一個不相同。In the above various methods, each of the scan lines supplying different frequencies may be used, and each of the scan lines is supplied with a plurality of frequencies, and at least one of the plurality of scan lines has at least one different frequency.

為讓本發明之上述和其他目的、特徵、和優點能更明顯易懂,下文特舉數個較佳實施例,並配合所附圖式,作詳細說明如下:The above and other objects, features and advantages of the present invention will become more apparent and understood.

本發明提出一種新的掃描方法,可以大幅提高觸碰偵測的準確度,並可進行單點或多點的偵測。本發明的方法所提及之觸控面板,可以是市面上所稱之觸控板(Touch Pad),螢幕(screen)用之觸控面板(如CRT或LCD)之類,或其他類似之矩陣型之觸控用的面板。The invention proposes a new scanning method, which can greatly improve the accuracy of the touch detection and can perform single or multi-point detection. The touch panel mentioned in the method of the present invention may be a touch pad (Touch Pad) on the market, a touch panel (such as a CRT or LCD) for a screen, or the like. Type of touch panel.

第3圖係為運用本發明掃描方法之電路圖第一例,在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,本發明提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別不同頻率的訊號源。第3圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第3圖的掃描電壓為V(f0 ),V(f1 ),V(f2 )V(f3 ),V(f4 ),V(f5 ),...V(fm-1 ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...fm-1 分別代表不同的頻率。藉由此種不同頻率的供應,本發明可使每條X軸掃描線具有不同的頻率負載,於是,不同的X軸掃描線的電容感應量變化,將會表現在不同的頻率上,亦即,掃描線上所載的頻率。如此,將可有效地區別每條掃描線上的電容感應量。Figure 3 is a first diagram of a circuit diagram using the scanning method of the present invention. In the M x N scan matrix having Y rows on the Y axis and N columns on the Y axis, the present invention provides X0, X1, X2, X3 of the X axis, X4, X5, ... Xm-1 scan lines for different frequency sources. The third picture shows the voltage source as the signal source. In practice, the current source can also be used as the signal source. The scan voltage of FIG. 3 is V(f 0 ), V(f 1 ), V(f 2 )V(f 3 ), V(f 4 ), V(f 5 ), ...V(f M-1 ), wherein f 0 , f 1 , f 2 , f 3 , f 4 , f 5 , ... f m-1 respectively represent different frequencies. With the supply of such different frequencies, the present invention can make each X-axis scan line have different frequency loads, so that the capacitance sensing changes of different X-axis scan lines will be expressed at different frequencies, that is, , the frequency carried on the scan line. In this way, the amount of capacitance sensing on each scan line can be effectively distinguished.

第3圖同時表達了偵測的方法,其偵測了Y軸第0列的掃描線,其餘的掃描線則為浮接的狀態。在此偵測階段,Y軸第0列將可偵測到(X0,Y0),(X1,Y0),(X2,Y0),(X3,Y0),(X4,Y0),(X5,Y0),...,(Xm-1,Y0)每個點的電容感應量,亦即,可準確地偵測到單點的感應量。當然,若同時有同列多點的感應量改變,同樣可準確地偵測。Figure 3 also shows the detection method, which detects the scan line of column 0 of the Y-axis, and the remaining scan lines are in a floating state. In this detection phase, the 0th column of the Y axis will detect (X0, Y0), (X1, Y0), (X2, Y0), (X3, Y0), (X4, Y0), (X5, Y0). ),...,(Xm-1,Y0) The capacitance of each point, that is, the amount of induction of a single point can be accurately detected. Of course, if there is a change in the amount of inductance in the same column at the same time, the same can be accurately detected.

在供應不同的掃描電壓頻率的技術條件下,可有許多種掃描的方式,第3圖揭示了其中的第一種實施例。在此種實施例下,尚可有多種處置的流程,請參考第4A~4D圖,其為本發明之掃描方法流程圖第一例。There are many ways of scanning under the technical conditions of supplying different scanning voltage frequencies, and Fig. 3 discloses the first embodiment. Under such an embodiment, there are a variety of processes for disposal. Please refer to Figures 4A to 4D, which are the first example of the flow chart of the scanning method of the present invention.

首先,請參考第4A圖,其為第一具體流程圖,其包含以下步驟:First, please refer to FIG. 4A, which is a first specific flowchart, which includes the following steps:

步驟102:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 102: Supply a signal source of different frequencies of each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟104:依序偵測Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行電容感應的偵測。從Y0,Y1,...Yn-1,依序取得電容的感應量變化。Step 104: sequentially detect the capacitance value of the scan line in the Y-axis direction and convert it into a detection signal. In this step, the capacitance sensing is detected sequentially in the manner as shown in FIG. From Y0, Y1, ... Yn-1, the change in the inductance of the capacitor is sequentially obtained.

步驟106:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 106: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟108:依據頻譜值,進行觸碰點判斷。最後,依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,平時的無觸碰的狀態下,依據平均的電壓均值,即可在有變化的電壓值來得知何點發生變異,亦即,有觸碰的發生。Step 108: Perform a touch point judgment according to the spectrum value. Finally, based on the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, in the normal non-touch state, according to the average voltage average value, it is possible to know where the variation occurs at a varying voltage value, that is, a touch occurs.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第4B圖,其為第二具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 4B, which is a second specific flowchart, and includes the following steps:

步驟112:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 112: Supply a signal source of different frequencies in each Y-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟114:依序偵測X軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行電容感應的偵測。從X0,X1,...Xm-1,依序取得電容的感應量變化。Step 114: sequentially detecting the capacitance value of the X-axis direction scan line and converting it into a detection signal. In this step, the capacitance sensing is detected sequentially in the manner as shown in FIG. From X0, X1, ... Xm-1, the change in the inductance of the capacitor is sequentially obtained.

步驟116:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 116: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟118:依據頻譜值,進行觸碰點判斷。最後,依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,平時的無觸碰的狀態下,依據平均的電壓均值,即可在有變化的電壓值來得知何點發生變異,亦即,有觸碰的發生。Step 118: Perform a touch point judgment according to the spectrum value. Finally, based on the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, in the normal non-touch state, according to the average voltage average value, it is possible to know where the variation occurs at a varying voltage value, that is, a touch occurs.

運用第4A圖或4B圖,本發明僅需針對一個軸進行掃描電壓之供應以及另一個軸進行掃描電壓偵測,即可達到點的觸碰偵測,不僅可大幅降低偵測的時間,同時,可達到準確偵測點觸碰的目的。當然,要採用兩個軸輪流進行不同頻率之掃描電壓供應的方式,亦可達到本發明的目的。不過,其較為耗時,且電路亦較為複雜,成本將會較高。By using FIG. 4A or FIG. 4B, the present invention only needs to supply the scan voltage for one axis and the scan voltage detection for the other axis, so that the touch detection of the point can be achieved, which not only greatly reduces the detection time, but also greatly reduces the detection time. It can achieve the purpose of accurately detecting touch points. Of course, the purpose of the present invention can also be achieved by using two axes to alternately supply scanning voltages of different frequencies. However, it is more time consuming and the circuit is more complicated and the cost will be higher.

在觸碰的判斷上,第4A~4B圖說明了最基本的判斷方式。另一種判斷方式是採取時序的判斷方法。亦即,依據不同的時序下偵測到的結果來進行觸碰的判斷。其具體的方法,說明於第4C~4D的流程。In the judgment of touch, the 4A~4B diagram illustrates the most basic judgment method. Another way to judge is to take a timing judgment method. That is, the determination of the touch is made based on the detected result at different timings. The specific method is described in the flow of 4C to 4D.

請參考第4C圖,其為第三具體流程圖,其包含以下步驟:Please refer to FIG. 4C, which is a third specific flowchart, which includes the following steps:

步驟122:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 122: Supply a signal source of different frequencies for each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟124:在單位時間內進行兩時間點之偵測,依序偵測Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行兩個時間點之電容感應偵測。從Y0,Y1,...Yn-1,依序取得兩個時間點之電容感應量變化。Step 124: Perform detection of two time points in a unit time, sequentially detecting the capacitance value of the scan line in the Y-axis direction and converting it into a detection signal. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From Y0, Y1, ... Yn-1, the capacitance inductance changes at two time points are sequentially obtained.

步驟126:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 126: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟128:依據頻譜值,運用兩時間點之比對以進行觸碰點判斷。最後,依據不同頻率的頻譜值之時間變化值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 128: According to the spectrum value, the ratio of the two time points is used to make the touch point judgment. Finally, based on the time variation value of the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第4D圖,其為第二具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 4D, which is a second specific flowchart, and includes the following steps:

步驟132:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 132: Supply a signal source of different frequencies in each Y-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟134:在單位時間內進行兩時間點之偵測,依序偵測×軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行兩個時間點之電容感應偵測。從X0,X1,...Xm-1,依序取得兩個時間點之電容感應量變化。Step 134: Perform detection of two time points in a unit time, sequentially detecting the capacitance value of the scan line in the x-axis direction and converting it into a detection signal. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From X0, X1, ... Xm-1, the capacitance inductance changes at two time points are sequentially obtained.

步驟136:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 136: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟138:依據頻譜值,運用偵與偵之比對以進行觸碰點判斷。最後,依據不同頻率的頻譜值之時間變化值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 138: According to the spectrum value, the ratio of the detection and the detection is used to make the touch point judgment. Finally, based on the time variation value of the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

在第4A~4D圖的流程中,說明了採用本發明方法的流程圖。接下來,請參考第5A~5D圖,其具體說明了第4A~4D圖方法的結果。In the flow of Figures 4A-4D, a flow chart illustrating the method of the present invention is illustrated. Next, please refer to the 5A~5D diagram, which details the results of the 4A~4D method.

第5A~5D圖係為本發明之掃描方法流程圖第一例之頻譜時序圖,其中,第5A圖為時間T=T0時偵測到的第一列之電容轉頻譜圖。第5B圖為時間T=T1時偵測到的第一列之電容轉頻譜圖。第5C圖為時間T=T2時偵測到的第一列之電容轉頻譜圖。第5D圖為時間T=T3時偵測到的第一列之電容轉頻譜圖。5A~5D is a spectrum timing diagram of the first example of the scanning method of the present invention, wherein FIG. 5A is a capacitive trans spectroscopy diagram of the first column detected at time T=T0. Figure 5B is a diagram of the capacitance demultiplexed spectrum of the first column detected at time T = T1. Figure 5C is a diagram of the capacitance derivation of the first column detected at time T = T2. Figure 5D is a diagram of the capacitance derivation of the first column detected at time T = T3.

由第5A~5D圖可以發現,在同一個時間,不同頻率所偵測到的電壓,其均值略為相當,因此,若增加一閥值(VT)進行判斷,則可單獨依據T=T0,T=T1,T=T2,T=T3等不同的時間點各別進行觸碰點的判斷。在T=T0與T=T3時,所有頻率的電壓值均接近,可判斷無觸碰的發生。在T=T1時,f3 發生了轉換電壓超越閥值的情形,因此,可判斷供應給f3 的掃描線發生了觸碰,以第3圖的例子來說,為X3行,亦即,(X3,Y1)點發生觸碰。T=T2時,f4 發生了轉換電壓超越閥值的情形,因此,可判斷供應給f4 的掃描線發生了觸碰,以第3圖的例子來說,為X4行,亦即,(X4,Y1)點發生觸碰。It can be found from Fig. 5A~5D that at the same time, the voltage detected by different frequencies has a slight average value. Therefore, if a threshold value (VT) is added for judgment, it can be based on T=T0, T alone. =T1, T=T2, T=T3, etc. The judgment of the touch point is performed at different time points. When T=T0 and T=T3, the voltage values of all frequencies are close, and it can be judged that no touch occurs. When T=T1, f 3 has a situation where the switching voltage exceeds the threshold. Therefore, it can be judged that the scanning line supplied to f 3 is touched. In the example of Fig. 3, it is X3 line, that is, The (X3, Y1) point touches. When T=T2, f 4 has a transition voltage exceeding the threshold. Therefore, it can be judged that the scan line supplied to f 4 is touched. In the example of Fig. 3, it is X4 line, that is, ( The X4, Y1) point touches.

運用不同時序的比對,可判斷觸碰的進入時間點、移動、離開以及速度等資訊。以第5A~5D圖為例,T=T0時第一列沒有變化,T=T1第一列發生變化,表示觸碰開始,觸碰點為(X3,Y1);T=T2時,觸碰由(X3,Y1)轉移到(X4,Y1)表示發生了觸碰物的移動。而T=T3時,觸碰點消失,可能是觸碰物離開,或者觸碰物移至其他列,可能是第0列或者第2列。於是,藉由觸碰點的移動以及在單位時間內的移動距離,即可計算出觸碰物移動的速度,進而獲得觸碰的點擊、雙擊、滑動...等等資訊。Using different timing comparisons, you can determine the time, movement, departure, and speed of the touch. Taking the 5A~5D diagram as an example, the first column does not change when T=T0, and the first column of T=T1 changes, indicating that the touch starts, the touch point is (X3, Y1); when T=T2, touch The transition from (X3, Y1) to (X4, Y1) indicates that the movement of the touch object has occurred. When T=T3, the touch point disappears, it may be that the touch object leaves, or the touch object moves to another column, which may be the 0th column or the 2nd column. Therefore, by the movement of the touch point and the moving distance in a unit time, the speed at which the touch object moves can be calculated, thereby obtaining information such as click, double click, slide, and the like of the touch.

此外,在供應每條掃描線不同的頻率上,亦可採用單一條掃描線供應多個頻率的方式。例如,供應二個、三個,甚至多個均可,每個頻率均不相同。供應多個頻率,可增加鑑別度,不過,後端的處理電路會相對複雜些。In addition, a single scanning line can be used to supply multiple frequencies at different frequencies for each scanning line. For example, two, three, or even more may be supplied, each frequency being different. Supplying multiple frequencies increases discrimination, but the processing circuitry at the back end is relatively complex.

接下來,請參考第6圖,運用本發明掃描方法之電路圖第二例,在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別不同頻率訊號源。第6圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第6圖的掃描電壓為V(f0 ),V(f1 ),V(f2 )V(f3 ),V(f4 ),V(f5 ),...V(fm-1 ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...fm-1 分別代表不同的頻率。第6圖同時偵測了Y軸第0列與第1列的掃描線,其餘的掃描線則為浮接的狀態。在此偵測階段,Y軸第0列將可偵測到(X0,Y0),(X1,Y0),(X2,Y0),(X3,Y0),(X4,Y0),(X5,Y0),...,(Xm-1,Y0)每個點的電容感應量,亦即,可準確地偵測到單點的感應量;同時,Y軸第1列將可偵測到(X0,Y1),(X1,Y1),(X2,Y1),(X3,Y1),(X4,Y1),(X5,Y1),...,(Xm-1,Y1)每個點的電容感應量。當然,若同時有同列多點的感應量改變,同樣可準確地偵測。Next, referring to FIG. 6, a second example of a circuit diagram using the scanning method of the present invention provides X-axis X0, X1, X2 in an M×N scan matrix having Y rows on the Y-axis and N columns on the Y-axis. X3, X4, X5, ... Xm-1 scan lines for different frequency signal sources. Figure 6 shows the voltage source as the signal source. In practice, the current source can also be used as the signal source. The scan voltage of FIG. 6 is V(f 0 ), V(f 1 ), V(f 2 )V(f 3 ), V(f 4 ), V(f 5 ), ...V(f M-1 ), wherein f 0 , f 1 , f 2 , f 3 , f 4 , f 5 , ... f m-1 respectively represent different frequencies. Figure 6 simultaneously detects the scan lines of column 0 and column 1 of the Y-axis, and the remaining scan lines are in a floating state. In this detection phase, the 0th column of the Y axis will detect (X0, Y0), (X1, Y0), (X2, Y0), (X3, Y0), (X4, Y0), (X5, Y0). ),...,(Xm-1,Y0) The capacitance of each point, that is, the amount of sensing of a single point can be accurately detected; at the same time, the first column of the Y-axis will be detectable (X0) , Y1), (X1, Y1), (X2, Y1), (X3, Y1), (X4, Y1), (X5, Y1), ..., (Xm-1, Y1) capacitance at each point Induction amount. Of course, if there is a change in the amount of inductance in the same column at the same time, the same can be accurately detected.

在供應不同的掃描電壓頻率的技術條件下,可有許多種掃描的方式,第6圖揭示了其中的第二種實施例,其為同時偵測兩列的方式,目的在於提供差動式的偵測模式。在此種差動式的偵測模式下,尚可有多種處置的流程,請參考第7A~7B圖,其為本發明之掃描方法流程圖第二例。In the technical conditions for supplying different scanning voltage frequencies, there are many ways of scanning, and FIG. 6 discloses a second embodiment thereof, which is a method of simultaneously detecting two columns, and aims to provide a differential type. Detection mode. In this differential detection mode, there are many processes for disposal. Please refer to FIGS. 7A-7B, which is a second example of the flow chart of the scanning method of the present invention.

首先,請參考第7A圖,其為第一具體流程圖,其包含以下步驟:First, please refer to FIG. 7A, which is a first specific flowchart, which includes the following steps:

步驟202:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 202: Supply a signal source of different frequencies of each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟204:同時偵測兩列Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第6圖的方式,依序以同時偵測兩列的方式進行電容感應的偵測。從Y0,Y1,...Yn-1,依序取得兩列之電容感應量變化。Step 204: Simultaneously detect the capacitance values of the scan lines of the two columns of Y-axis directions and convert them into detection signals. In this step, the capacitance sensing is detected in the manner of simultaneously detecting two columns in the manner as shown in FIG. 6 . From Y0, Y1, ... Yn-1, the capacitance change of the two columns is sequentially obtained.

步驟206:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 206: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟208:依據頻譜值,以相鄰兩行之差值進行觸碰點判斷。最後,依據不同頻率的相鄰兩行之頻譜值,即可判斷哪個點發生了電容感應量的變化。此即為差動式的電容偵測之計算方法。Step 208: According to the spectrum value, the touch point judgment is performed by the difference between the adjacent two lines. Finally, based on the spectral values of the adjacent two lines of different frequencies, it can be determined which point has a change in the capacitance sensing amount. This is the calculation method of differential capacitance detection.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第7B圖,其為第六具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 7B, which is a sixth specific flowchart, and includes the following steps:

步驟212:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 212: Supply a signal source of different frequencies in each Y-axis direction scan line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟214:依序偵測X軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第6圖的方式,依序以同時偵測兩列的方式進行電容感應的偵測。從X0,X1,...Xm-1,依序取得兩列之電容感應量變化。Step 214: sequentially detect the capacitance value of the X-axis direction scan line and convert it into a detection signal. In this step, the capacitance sensing is detected in the manner of simultaneously detecting two columns in the manner as shown in FIG. 6 . From X0, X1, ... Xm-1, the capacitance change of the two columns is sequentially obtained.

步驟216:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 216: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟218:依據頻譜值,以相鄰兩列之差值進行觸碰點判斷。最後,依據不同頻率的相鄰兩列之頻譜值,即可判斷哪個點發生了電容感應量的變化。此即為差動式的電容偵測之計算方法。Step 218: According to the spectrum value, the touch point judgment is performed by the difference between the adjacent two columns. Finally, based on the spectral values of the adjacent two columns of different frequencies, it can be determined which point has a change in the capacitance sensing amount. This is the calculation method of differential capacitance detection.

運用第7A圖或7B圖,本發明僅需針對一個軸進行掃描電壓之供應以及另一個軸進行掃描電壓偵測,即可達到點的觸碰偵測,不僅可大幅降低偵測的時間,同時,可達到準確偵測點觸碰的目的。當然,要採用兩個軸輪流進行不同頻率之掃描電壓供應的方式,亦可達到本發明的目的。不過,其較為耗時,且電路亦較為複雜,成本將會較高。By using the 7A or 7B, the present invention only needs to supply the scan voltage for one axis and the scan voltage detection for the other axis, so that the touch detection of the point can be achieved, which not only greatly reduces the detection time, but also greatly reduces the detection time. It can achieve the purpose of accurately detecting touch points. Of course, the purpose of the present invention can also be achieved by using two axes to alternately supply scanning voltages of different frequencies. However, it is more time consuming and the circuit is more complicated and the cost will be higher.

在觸碰的判斷上,第7A~7B圖說明了最基本的判斷方式。另一種判斷方式是採取時序的判斷方法。亦即,依據不同的時序下偵測到的結果來進行觸碰的判斷。其具體的方法,說明於第7C~7D的流程。In the judgment of touch, the 7A~7B diagram illustrates the most basic judgment method. Another way to judge is to take a timing judgment method. That is, the determination of the touch is made based on the detected result at different timings. The specific method is described in the flow of the seventh to seventh embodiments.

請參考第7C圖,其為第七具體流程圖,其包含以下步驟:Please refer to FIG. 7C, which is a seventh specific flowchart, which includes the following steps:

步驟222:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 222: Supply a signal source of different frequencies for each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟224:在單位時間內進行兩時間點之偵測,依序偵測Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行兩個時間點之電容感應偵測。從Y0,Y1,...Yn-1,依序取得兩個時間點之之電容感應量變化。Step 224: Perform detection of two time points in a unit time, sequentially detecting the capacitance value of the scan line in the Y-axis direction and converting it into a detection signal. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From Y0, Y1, ... Yn-1, the capacitance sensing changes at two time points are sequentially obtained.

步驟226:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 226: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟228:依據頻譜值,運用兩個時間點中以相鄰兩列之差值進行比對,以進行觸碰點判斷。最後,依據不同頻率的頻譜值之時間變化值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 228: According to the spectrum value, compare the difference between the two adjacent columns in the two time points to perform the touch point judgment. Finally, based on the time variation value of the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第7D圖,其為第八具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 7D, which is an eighth specific flowchart, and includes the following steps:

步驟232:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 232: Supply a signal source of different frequencies in each Y-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟234:在單位時間內進行兩時間點之偵測,依序偵測X軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行兩個時間點之電容感應偵測。從X0,X1,...Xm-1,依序取得兩個時間點之之電容感應量變化。Step 234: Perform detection of two time points in a unit time, sequentially detecting the capacitance value of the X-axis direction scan line and converting it into a detection signal. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From X0, X1, ... Xm-1, the capacitance inductance changes at two time points are sequentially obtained.

步驟236:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 236: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟238:依據頻譜值,運用兩個時間點中以相鄰兩列之差值進行比對,以進行觸碰點判斷。最後,依據不同頻率的頻譜值之時間變化值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 238: According to the spectrum value, compare the difference between the two adjacent columns in the two time points to perform the touch point judgment. Finally, based on the time variation value of the spectral values of different frequencies, it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

在第7A~7D圖的流程中,說明了採用本發明方法的流程圖。接下來,請參考第8A~8F圖,其具體說明了第7A~7D圖方法的結果。In the flow of Figures 7A-7D, a flow chart using the method of the present invention is illustrated. Next, please refer to Figures 8A-8F, which specifically illustrate the results of the methods of Figures 7A-7D.

第8A~8F圖係為本發明之掃描方法流程圖第一例之頻譜時序圖,其中,第8A圖為時間T=T0時偵測到的第一列之電容轉頻譜圖。第8B圖為時間T=T0時偵測到的第二列之電容轉頻譜圖。第8C圖為時間T=T0時第二列減去第一列之電容轉頻譜圖。第8D圖為時間T=T1時偵測到的第一列之電容轉頻譜圖。第8E圖為時間T=T1時偵測到的第二列之電容轉頻譜圖。第8F圖為時間T=T1時第二列減去第一列之電容轉頻譜圖。8A-8F is a spectrum timing diagram of the first example of the scanning method of the present invention, wherein FIG. 8A is a capacitive trans spectroscopy diagram of the first column detected at time T=T0. Figure 8B is a diagram of the capacitance demultiplexed spectrum of the second column detected at time T = T0. Figure 8C is a diagram of the capacitance demultiplexed spectrum of the second column minus the first column at time T = T0. Figure 8D is a diagram of the capacitance derivation of the first column detected at time T = T1. Figure 8E is a diagram of the capacitance demultiplexed spectrum of the second column detected at time T = T1. Figure 8F is a diagram of the capacitance derivation of the second column minus the first column at time T = T1.

由第8A~8C圖可以發現,在T=T0時,同時進行兩列Y軸(Y1,Y2)的偵測,並進行相減,相減的值為第8C圖。由於不同列在同一頻率下所偵測到的電壓,於未有電容感應時之均值略為相當。因此,經過相減後,其值應為0左右。若有電容感應量發生,亦即,觸碰的狀況發生,則透過一閥值(VT)進行判斷,即可偵測出觸碰的狀況。以第8A~8C圖的例子來說,明顯地,在T=T0,f3 發生了電壓差值超越閥值的情形,因此,可判斷供應給f3 的掃描線發生了觸碰。且由於其值為正值,因此,可判斷為Y2列發生了觸碰,也就是(X3,Y2)發生了觸碰。It can be found from Fig. 8A~8C that when T=T0, the detection of two columns of Y-axis (Y1, Y2) is performed simultaneously, and the subtraction is performed, and the subtraction value is the 8C picture. The average value of the voltages detected at the same frequency is slightly equivalent when there is no capacitance sensing. Therefore, after subtraction, its value should be around 0. If a capacitive sensing amount occurs, that is, if a touch condition occurs, the state of the touch can be detected by judging by a threshold value (VT). In the example of FIG. 8A ~ 8C, it is obvious, in T = T0, f 3 a case where the voltage difference occurs beyond the threshold, and therefore, it can be determined is supplied to the scanning lines 3 f touch occurs. And since the value is a positive value, it can be judged that a touch has occurred in the Y2 column, that is, (X3, Y2) has been touched.

由第8D~8F圖可以發現,在T=T1時,同時進行兩列Y軸(Y1,Y2)的偵測,並進行相減,相減的值為第8F圖。明顯地,在T=T1,f4 發生了電壓差值超越閥值的情形,因此,可判斷供應給f4 的掃描線發生了觸碰。且由於其值為負值,因此,可判斷為Y1列發生了觸碰,也就是(X4,Y1)發生了觸碰。It can be found from Fig. 8D~8F that when T=T1, the detection of two columns of Y-axis (Y1, Y2) is performed simultaneously, and subtraction is performed, and the subtraction value is the 8F image. Obviously, at T=T1, f 4 occurs when the voltage difference exceeds the threshold, and therefore, it can be judged that the scanning line supplied to f 4 is touched. And since the value is a negative value, it can be judged that a touch has occurred in the Y1 column, that is, (X4, Y1) has been touched.

運用不同時序的比對,則可判斷觸碰的進入時間點、移動、離開以及速度等資訊,此即第7C~7D圖之流程可達到者。第8A~8F圖說明了兩個時間點的兩列變化。假設其它列並無相應的變化,則此兩時間點可做基本的判斷。其判斷法則與第3~5圖者相近,不再綴述。亦即,均為藉由觸碰點的移動以及在單位時間內的移動距離,即可計算出觸碰物移動的速度,進而獲得觸碰的點擊、雙擊、滑動...等等資訊。Using the comparison of different timings, it is possible to judge the entry time, movement, departure and speed of the touch, which is the flow of the 7C~7D diagram. Figures 8A-8F illustrate two column changes at two points in time. Assuming that there are no corresponding changes in other columns, the two time points can make a basic judgment. The judgment rule is similar to that of Figures 3~5 and will not be described. That is to say, the movement speed of the touch object can be calculated by the movement of the touch point and the moving distance in the unit time, thereby obtaining the click, double click, slide, and the like of the touch.

此外,在供應每條掃描線不同的頻率上,亦可採用單一條掃描線供應多個頻率的方式。例如,供應二個、三個,甚至多個均可,每個頻率均不相同。供應多個頻率,可增加鑑別度,不過,後端的處理電路會相對複雜些。In addition, a single scanning line can be used to supply multiple frequencies at different frequencies for each scanning line. For example, two, three, or even more may be supplied, each frequency being different. Supplying multiple frequencies increases discrimination, but the processing circuitry at the back end is relatively complex.

第9圖係為運用本發明掃描方法之電路圖第三例,在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,本發明提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別不同頻率訊號源。第9圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第9圖的掃描電壓為V(f0 ),V(f1 ),V(f2 )V(f3 ),V(f4 ),V(f5 ),...V(fm-1 ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...fm-1 分別代表不同的頻率。Figure 9 is a third example of a circuit diagram using the scanning method of the present invention. In the M x N scan matrix having Y rows on the Y axis and N columns on the Y axis, the present invention provides X0, X1, X2, X3 of the X axis, X4, X5, ... Xm-1 scan lines for different frequency signal sources. In Fig. 9, the voltage source is used as the signal source. In practice, the current source can also be used as the signal source. Wherein, the scanning voltage of FIG. 9 is V(f 0 ), V(f 1 ), V(f 2 )V(f 3 ), V(f 4 ), V(f 5 ), ...V(f M-1 ), wherein f 0 , f 1 , f 2 , f 3 , f 4 , f 5 , ... f m-1 respectively represent different frequencies.

第9圖同時表達了偵測的方法,在同一時間內,其偵測了Y軸第0列、第1列、第2列、第3列共四列掃描線,其餘的掃描線則為浮接的狀態;在下一時間點,則進行第4列、第5列、第6列、第7列共四列掃描線,其餘的掃描線則為浮接的狀態;以此類推。原則是以總掃描線的一定比例為佳,如1/1,1/2,1/3,1/4...等等。在同一時間之偵測階段,Y軸第0列將可偵測到(X0,Y0),(X1,Y0),(X2,Y0),(X3,Y0),(X4,Y0),(X5,Y0),...,(Xm-1,Y0)每個點的電容感應量;Y軸第1列將可偵測到(X0,Y1),(X1,Y1),(X2,Y1),(X3,Y1),(X4,Y1),(X5,Y1),...,(Xm-1,Y1)每個點的電容感應量;Y軸第2列將可偵測到(X0,Y2),(X1,Y2),(X2,Y2),(X3,Y2),(X4,Y2),(X5,Y2),...,(Xm-1,Y2)每個點的電容感應量;Y軸第3列將可偵測到(X0,Y3),(X1,Y3),(X2,Y3),(X3,Y3),(X4,Y3),(X5,Y3),...,(Xm-1,Y3)每個點的電容感應量。亦即,每列均可準確地偵測到單點的感應量,不過,此點需要有多個偵測電路來同步運作方可達成。以本實施例來說,同時採用四個列之偵測,則需要四組偵測電路。Figure 9 also shows the detection method. At the same time, it detects the scan lines of the 0th column, the 1st column, the 2nd column, and the 3rd column of the Y axis, and the other scan lines are floating. In the next state, the fourth column, the fifth column, the sixth column, and the seventh column are all four columns of scanning lines, and the remaining scanning lines are in a floating state; and so on. The principle is preferably a certain ratio of the total scan line, such as 1/1, 1/2, 1/3, 1/4... and so on. At the same time of the detection phase, the 0th column of the Y axis will detect (X0, Y0), (X1, Y0), (X2, Y0), (X3, Y0), (X4, Y0), (X5 , Y0),...,(Xm-1,Y0) The capacitance of each point; the first column of the Y-axis will detect (X0, Y1), (X1, Y1), (X2, Y1) , (X3, Y1), (X4, Y1), (X5, Y1), ..., (Xm-1, Y1) capacitance sensing amount per point; Y axis 2 column will be detectable (X0 , Y2), (X1, Y2), (X2, Y2), (X3, Y2), (X4, Y2), (X5, Y2), ..., (Xm-1, Y2) capacitance at each point The amount of induction; the third column of the Y-axis will detect (X0, Y3), (X1, Y3), (X2, Y3), (X3, Y3), (X4, Y3), (X5, Y3),. .., (Xm-1, Y3) The capacitance of each point. That is to say, each column can accurately detect the sensing amount of a single point, but this point requires multiple detection circuits to be synchronized to achieve. In the present embodiment, four sets of detection circuits are required to simultaneously detect four columns.

當然,若同時有一列多點的感應量改變,同樣可準確地偵測。Of course, if there is a multi-point sensing change at the same time, it can also be accurately detected.

在供應不同的掃描電壓頻率的技術條件下,可有許多種掃描的方式,第9圖揭示了其中的第一種實施例。在此種實施例下,尚可有多種處置的流程,請參考第10A~10D圖,其為本發明之掃描方法流程圖第三例。There are many ways of scanning under the technical conditions of supplying different scanning voltage frequencies, and the first embodiment is disclosed in FIG. Under such an embodiment, there are many processes for disposal. Please refer to FIGS. 10A-10D, which is a third example of the flow chart of the scanning method of the present invention.

首先,請參考第10A圖,其為第九具體流程圖,其包含以下步驟:First, please refer to FIG. 10A, which is a ninth specific flowchart, which includes the following steps:

步驟302:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 302: Supply a signal source of different frequencies of each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟304:同時偵測多列Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第9圖的方式,依序進行電容感應的偵測。從Y0,Y1,...Yn-1,依序取得各列之電容感應量變化。Step 304: Simultaneously detect the capacitance values of the scan lines of the Y-axis direction of the plurality of columns and convert them into detection signals. In this step, the capacitance sensing is detected sequentially in the manner as shown in FIG. From Y0, Y1, ... Yn-1, the capacitance change of each column is sequentially obtained.

步驟306:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 306: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟308:依據頻譜值,以多個偵測電路進行各列之觸碰點判斷。最後,同時偵測的各列,均有其偵測電路依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,平時的無觸碰的狀態下,依據平均的電壓均值,即可在有變化的電壓值來得知何點發生變異,亦即,有觸碰的發生。Step 308: According to the spectrum value, the touch point judgment of each column is performed by using multiple detection circuits. Finally, each of the simultaneously detected columns has its detection circuit based on the spectral values of different frequencies, and it can be determined which point has a change in the capacitance sensing amount. That is to say, in the normal non-touch state, according to the average voltage average value, it is possible to know where the variation occurs at a varying voltage value, that is, a touch occurs.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第10B圖,其為第十具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 10B, which is a tenth specific flowchart, and includes the following steps:

步驟312:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 312: Supply a signal source of different frequencies in each Y-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟314:同時偵測多列X軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第9圖的方式,依序進行電容感應的偵測。從X0,X1,...Xm-1,依序取得電容的感應量變化。Step 314: Simultaneously detecting the capacitance values of the scan lines of the X-axis direction of the plurality of columns and converting them into detection signals. In this step, the capacitance sensing is detected sequentially in the manner as shown in FIG. From X0, X1, ... Xm-1, the change in the inductance of the capacitor is sequentially obtained.

步驟316:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 316: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟318:依據頻譜值,以多個偵測電路進行各行之觸碰點判斷。最後,同時偵測的各列,均有其偵測電路依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,平時的無觸碰的狀態下,依據平均的電壓均值,即可在有變化的電壓值來得知何點發生變異,亦即,有觸碰的發生。Step 318: Perform a touch point judgment of each row by using multiple detection circuits according to the spectrum value. Finally, each of the simultaneously detected columns has its detection circuit based on the spectral values of different frequencies, and it can be determined which point has a change in the capacitance sensing amount. That is to say, in the normal non-touch state, according to the average voltage average value, it is possible to know where the variation occurs at a varying voltage value, that is, a touch occurs.

運用第10A圖或10B圖,本發明僅需針對一個軸進行掃描電壓之供應以及另一個軸進行掃描電壓偵測,即可達到點的觸碰偵測,不僅可大幅降低偵測的時間,同時,可達到準確偵測點觸碰的目的。當然,要採用兩個軸輪流進行不同頻率之掃描電壓供應的方式,亦可達到本發明的目的。不過,其較為耗時,且電路亦較為複雜,成本將會較高。By using FIG. 10A or FIG. 10B, the present invention only needs to scan the voltage supply for one axis and scan voltage detection for the other axis to achieve point touch detection, which can not only greatly reduce the detection time, but also greatly reduce the detection time. It can achieve the purpose of accurately detecting touch points. Of course, the purpose of the present invention can also be achieved by using two axes to alternately supply scanning voltages of different frequencies. However, it is more time consuming and the circuit is more complicated and the cost will be higher.

在觸碰的判斷上,第10A~10B圖說明了最基本的判斷方式。另一種判斷方式是採取時序的判斷方法。亦即,依據不同的時序下偵測到的結果來進行觸碰的判斷。其具體的方法,說明於第10C~10D的流程。In the judgment of touch, the 10A~10B diagram illustrates the most basic judgment method. Another way to judge is to take a timing judgment method. That is, the determination of the touch is made based on the detected result at different timings. The specific method is described in the flow of 10C~10D.

請參考第10C圖,其為第十一具體流程圖,其包含以下步驟:Please refer to FIG. 10C, which is an eleventh specific flowchart, which includes the following steps:

步驟322:供應每條X軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 322: Supply a signal source of different frequencies for each X-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟324:在單位時間內進行兩時間點之偵測,同時偵測多列Y軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第3圖的方式,依序進行兩個時間點之電容感應偵測。從Y0,Y1,...Yn-1,依序取得兩個時間點之多列電容感應量變化。Step 324: Perform detection of two time points in a unit time, and simultaneously detect capacitance values of the scan lines of the plurality of columns in the Y-axis direction and convert them into detection signals. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From Y0, Y1, ... Yn-1, the change in the capacitance of the multi-column capacitance at two time points is sequentially obtained.

步驟326:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 326: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟328:依據頻譜值,運用兩時間點之比對以進行觸碰點判斷。最後,同時偵測的各列,均有其偵測電路依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 328: According to the spectrum value, the ratio of the two time points is used to make the touch point judgment. Finally, each of the simultaneously detected columns has its detection circuit based on the spectral values of different frequencies, and it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

同樣的方法,亦可用於供應Y軸不同的掃描電壓,而以X軸進行電容感應之偵測。請參考第10D圖,其為第十二具體流程圖,包含下列步驟:The same method can also be used to supply different scanning voltages of the Y-axis and to detect capacitance sensing by the X-axis. Please refer to FIG. 10D, which is a twelfth specific flowchart, and includes the following steps:

步驟332:供應每條Y軸方向掃描線不同頻率之訊號源。具體的頻率供應,可採用等級距的方式,例如,6.1MHz,6.2MHz...;12.1MHz,12.2MHz...。可依據供應電路之工作頻率來進行設計。Step 332: Supply a signal source of different frequencies in each Y-axis scanning line. The specific frequency supply can be in the form of a rank distance, for example, 6.1 MHz, 6.2 MHz...; 12.1 MHz, 12.2 MHz.... The design can be based on the operating frequency of the supply circuit.

步驟334:在單位時間內進行兩時間點之偵測,同時偵測多行X軸方向掃描線之電容值並轉換為偵測訊號。於此步驟中,則以如第9圖的方式,依序進行兩個時間點之電容感應偵測。從X0,X1,...Xm-1,依序取得兩個時間點之多行電容感應量變化。Step 334: Perform detection of two time points in a unit time, and simultaneously detect capacitance values of the plurality of X-axis direction scan lines and convert them into detection signals. In this step, capacitive sensing detection at two time points is sequentially performed in the manner as shown in FIG. From X0, X1, ... Xm-1, multiple rows of capacitance sensing changes at two time points are sequentially obtained.

步驟336:將偵測訊號展開為頻譜值。將所取得的偵測訊號依據不同的頻率加以展開,即可獲得不同頻率的電壓值。Step 336: Expand the detection signal into a spectrum value. The detected signals are expanded according to different frequencies to obtain voltage values of different frequencies.

步驟338:依據頻譜值,運用偵與偵之比對以進行觸碰點判斷。最後,同時偵測的各列,均有其偵測電路依據不同頻率的頻譜值,即可判斷哪個點發生了電容感應量的變化。亦即,不同時序下,單點的電壓值有所變化時,即可知曉其發生了電容量的變異,亦即,發生觸碰。Step 338: According to the spectrum value, the ratio of the detection and the detection is used to make the touch point judgment. Finally, each of the simultaneously detected columns has its detection circuit based on the spectral values of different frequencies, and it can be determined which point has a change in the capacitance sensing amount. That is to say, when the voltage value of a single point changes at different timings, it is known that the capacitance variation occurs, that is, the touch occurs.

在第10A~10D圖的流程中,說明了採用本發明方法的流程圖。接下來,請參考第11A~11B圖,其具體說明了第11A~11D圖方法的結果。In the flow of Figures 10A-10D, a flow chart illustrating the method of the present invention is illustrated. Next, please refer to Figures 11A-11B, which specifically illustrate the results of the methods of Figures 11A-11D.

第11A~11B圖係為本發明之掃描方法流程圖第三例之頻譜時序圖。其中,第11A圖為時間T=T0時偵測到的第一列至第四列之電容轉頻譜圖。第11B圖為時間T=T1時偵測到的第一列至第四列之電容轉頻譜圖。11A-11B are spectrum timing diagrams of the third example of the flow chart of the scanning method of the present invention. Among them, the 11A is a capacitive transspectrum of the first to fourth columns detected at time T=T0. Figure 11B is a diagram of the capacitance trans spectroscopy of the first to fourth columns detected at time T = T1.

由第11A~11B圖可以發現,在同一個時間,不同頻率所偵測到的電壓,其均值略為相當,因此,若增加一閥值(VT)進行判斷,則可對不同時間點之各列進行觸碰點的判斷。在T=T0時,各列,包括Y0,Y1,Y2,Y3,所有頻率的電壓值均接近,可判斷無觸碰的發生。在T=T1時,Y2之f3 與Y3之f4 發生了轉換電壓超越閥值的情形,因此,可判斷供應給Y2的f3 的掃描線發生了觸碰且Y3的f4 的掃描線發生了觸碰,以第9圖的例子來說,為Y2的X3行以及Y3的X4行,亦即,(X3,Y2),(X4,Y3)兩點發生觸碰。From the 11A-11B chart, it can be found that at the same time, the voltages detected by different frequencies have a slight average value. Therefore, if a threshold value (VT) is added for judgment, the columns at different time points can be Make a judgment of the touch point. When T=T0, each column, including Y0, Y1, Y2, Y3, the voltage values of all frequencies are close, and it can be judged that no touch occurs. When at T = T1, Y2 and Y3 of the f 3 f. 4 occurs beyond the threshold voltage of the converter case, therefore, it can be determined is supplied to the scanning line Y2 and f 3 occurs and a touch scanning line Y3. 4 is f A touch has occurred. In the example of Fig. 9, the X3 line of Y2 and the X4 line of Y3, that is, (X3, Y2), (X4, Y3) are touched.

採用第9~10圖的實施例,可以達到掃描速度加倍的效果。亦即,同一時間,若同時採用兩組之偵測電路,則可達到2倍之偵測速度,採用三組可達三倍,採用四組可達四倍,以此類推。With the embodiment of Figures 9-10, the effect of doubling the scanning speed can be achieved. That is to say, at the same time, if two sets of detection circuits are used at the same time, the detection speed of 2 times can be achieved, three sets can be up to three times, four groups can be up to four times, and so on.

同樣地,運用不同時序的比對,同樣可判斷觸碰的進入時間點、移動、離開以及速度等資訊。並且,藉由觸碰點的移動以及在單位時間內的移動距離,即可計算出觸碰物移動的速度,進而獲得觸碰的點擊、雙擊、滑動...等等資訊。Similarly, using different timing comparisons, it is also possible to determine the entry time, movement, departure, and speed of the touch. Moreover, by the movement of the touch point and the moving distance in a unit time, the speed at which the touch object moves can be calculated, thereby obtaining information such as click, double click, slide, and the like of the touch.

頻譜值的轉換技術,係為習知技術的一環,熟習相關技藝者當可充分了解並據以實施,例如,離散傅立葉轉換(Discrete Fourier Transform,DFT)、快速傅立葉轉換(Fast Fourier Transform,FFT)等等技術。The conversion of spectral values is a part of the prior art, which can be fully understood and implemented by those skilled in the art, for example, Discrete Fourier Transform (DFT), Fast Fourier Transform (FFT). And so on.

此外,在供應每條掃描線不同的頻率上,亦可採用單一條掃描線供應多個頻率的方式。例如,供應二個、三個,甚至多個均可,載於兩個掃描線上的多個頻率至少一個不相同。供應多個頻率,可達到以較少的頻率達到觸碰判斷的目的,同時,亦可增加抗干擾的能力,不過,後端的處理電路會相對複雜些。In addition, a single scanning line can be used to supply multiple frequencies at different frequencies for each scanning line. For example, two, three, or even more may be supplied, and at least one of the plurality of frequencies carried on the two scanning lines is different. Supplying multiple frequencies can achieve the purpose of reaching the touch judgment with less frequency. At the same time, it can also increase the anti-interference ability. However, the processing circuit at the back end is relatively complicated.

具體的實施例,請參考第12圖,本發明之單一掃描線供應2個頻率的示意圖。在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,本發明提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別2個不同頻率訊號源。第12圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第12圖的掃描電壓為V(f0 ,f1 ),V(f2 ,f3 ),V(f4 ,f5 ),V(f6 ,f7 ),V(f8 ,f9 ),V(f10 ,f11 ),...V(f2m ,f2m+1 ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...f2m+1 分別代表不同的頻率。每條掃描線上均有兩個不同的頻率,並且任兩條掃描線的兩個不同頻率皆不相同。此外,第12圖係以依序單條的掃描方式進行掃描。For a specific embodiment, please refer to FIG. 12, which is a schematic diagram of a single scan line of the present invention supplying two frequencies. In the M×N scan matrix having M rows on the Y axis and N columns on the Y axis, the present invention provides X-axis X0, X1, X2, X3, X4, X5, ... Xm-1 scan lines individually 2 different Frequency signal source. In Fig. 12, the voltage source is used as the signal source. In practice, the current source can also be used as the signal source. The scan voltage of FIG. 12 is V(f 0 , f 1 ), V(f 2 , f 3 ), V(f 4 , f 5 ), V(f 6 , f 7 ), V(f 8 , f 9 ), V(f 10 , f 11 ), ...V(f 2m , f 2m+1 ), where f 0 , f 1 , f 2 , f 3 , f 4 , f 5 ,... f 2m+1 represents different frequencies, respectively. There are two different frequencies on each scan line, and the two different frequencies of any two scan lines are different. In addition, Fig. 12 is scanned in a sequential scanning manner.

第12圖的實施例,採取每條掃描線上供應兩個不同的頻率,以作觸碰的鑑別。由於每條掃描線上所供應的頻率均不相同,因此,相對應的頻譜值亦有相當大的差異性。如第13圖所示者,其為第12圖的頻譜值範例圖,其分別為T=T0,T=T1,T=T2,T=T3時Y1掃描線的頻譜值。由圖中可發現,T=T0時,並無任何的狀況發生,而T=T1時,在f2 與f3 頻率偵測到超過閥值VT的狀況。而T=T2時,f4 與f5 頻率偵測到超過閥值VT的狀況。T=T3時,則無狀況發生。由第13圖可判斷,在T=T1時,於X1處發生了觸碰,亦即,(X1,Y1)點發生觸碰;在T=T2時,於X2處發生了觸碰,亦即,(X2,Y1)點發生觸碰。In the embodiment of Fig. 12, two different frequencies are supplied on each scan line for identification of touch. Since the frequencies supplied on each scan line are different, the corresponding spectral values are also quite different. As shown in Fig. 13, it is an example of the spectrum value of Fig. 12, which is the spectral value of the Y1 scan line when T = T0, T = T1, T = T2, and T = T3, respectively. It can be seen from the figure that when T=T0, no condition occurs, and when T=T1, the condition exceeding the threshold VT is detected at the frequencies f 2 and f 3 . When T=T2, the f 4 and f 5 frequencies detect a condition exceeding the threshold VT. When T=T3, no condition occurs. It can be judged from Fig. 13 that when T=T1, a touch occurs at X1, that is, a touch occurs at (X1, Y1); when T=T2, a touch occurs at X2, that is, , (X2, Y1) point touch.

接著,請參考第14圖,本發明之單一掃描線供應2個頻率的第二個實施例示意圖。在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,本發明提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別2個不同頻率訊號源。第14圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第14圖的掃描電壓為V(f0 ,f1 ),V(f0 ,f2 ),V(f0 ,f3 ),V(f0 ,f4 ),V(f1 ,f2 ),V(f1 ,f3 ),...V(fa ,fb ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...fa ,fb 分別代表不同的頻率,且每條掃描線上所供應的兩個頻率,兩條掃描線間比較至少一個頻率不相同。此外,第14圖係以依序單條的掃描方式進行掃描。Next, please refer to FIG. 14, a schematic diagram of a second embodiment in which a single scan line of the present invention supplies two frequencies. In the M×N scan matrix having M rows on the Y axis and N columns on the Y axis, the present invention provides X-axis X0, X1, X2, X3, X4, X5, ... Xm-1 scan lines individually 2 different Frequency signal source. The 14th figure uses the voltage source as the signal source. In practice, the current source can also be used as the signal source. Wherein, the scanning voltage of FIG. 14 is V(f 0 , f 1 ), V(f 0 , f 2 ), V(f 0 , f 3 ), V(f 0 , f 4 ), V(f 1 , f 2 ), V(f 1 , f 3 ), ...V(f a , f b ), where f 0 , f 1 , f 2 , f 3 , f 4 , f 5 , ... f a , f b respectively represents different frequencies, and the two frequencies supplied on each scan line, the two scan lines are compared with at least one frequency. In addition, Figure 14 scans in a single scan mode.

第14圖的實施例,採取每條掃描線上供應兩個不同的頻率,以作觸碰的鑑別。由於每條掃描線上均供應兩個不同的頻率,而每兩條掃描線之間的兩個頻率,至少有一個不相同。因此,當發生單點觸碰時,仍會有如第13圖的狀況發生,亦即,會有兩個頻率發生超過閥值的狀況,因此,可判斷觸碰的發生。當發生連續兩點觸碰時,例如,(X1,Y1),(X2,Y1)發生觸碰,則會有f0 ,f2 ,f3 三個頻率的值大於閥值,且由於f0 為共同的頻率,因此,其值會大於另外兩個頻率。其餘的觸碰點判斷皆相同,不再贅述。In the embodiment of Fig. 14, two different frequencies are supplied on each scan line for identification of touch. Since two different frequencies are supplied on each scan line, at least one of the two frequencies between each two scan lines is different. Therefore, when a single touch occurs, there is still a situation as shown in Fig. 13, that is, there are cases where two frequencies exceed a threshold value, and therefore, the occurrence of a touch can be judged. When two consecutive touches occur, for example, (X1, Y1), (X2, Y1), there will be f 0 , f 2 , f 3 The values of the three frequencies are greater than the threshold, and due to f 0 It is a common frequency, so its value will be greater than the other two frequencies. The rest of the touch points are judged the same and will not be described again.

以第14圖的實施例而言,其所需供應的頻率數目,少於第12圖者,因此,其電路上的設計會較為精簡。而以同樣的概念可設計每條掃描線上供應2個以上的頻率,第15圖即為採用3個頻率供應到每條掃描線上的實施例。在Y軸具有M行,Y軸具有N列的M×N掃描矩陣中,本發明提供X軸之X0,X1,X2,X3,X4,X5,...Xm-1掃描線個別3個不同頻率訊號源。第15圖係以電壓源為訊號源,實務上,亦可採用電流源作為訊號源。其中,第15圖的掃描電壓為V(f0 ,f1 ,f2 ),V(f0 ,f1 ,f3 ),V(f0 ,f1 ,f4 ),V(f0 ,f2 ,f3 ),V(f0 ,f2 ,f4 ),V(f0 ,f3 ,f4 ),...V(fa ,fb ,fc ),其中,f0 ,f1 ,f2 ,f3 ,f4 ,f5 ,...fa ,fb ,fc 分別代表不同的頻率,且每條掃描線上所供應的三個頻率,兩條掃描線間比較至少一個頻率不相同。此外,第15圖係以依序單條的掃描方式進行掃描。In the embodiment of Fig. 14, the number of frequencies required to be supplied is less than that of Fig. 12, and therefore, the design on the circuit is relatively simple. With the same concept, more than two frequencies can be designed on each scan line. Figure 15 shows an embodiment in which three frequencies are supplied to each scan line. In the M×N scan matrix having M rows on the Y axis and N columns on the Y axis, the present invention provides XX X1, X1, X2, X3, X4, X5, ... Xm-1 scan lines individually 3 different Frequency signal source. In Figure 15, the voltage source is used as the signal source. In practice, the current source can also be used as the signal source. Wherein, the scanning voltage of Fig. 15 is V(f 0 , f 1 , f 2 ), V(f 0 , f 1 , f 3 ), V(f 0 , f 1 , f 4 ), V(f 0 , f 2 , f 3 ), V(f 0 , f 2 , f 4 ), V(f 0 , f 3 , f 4 ), ...V(f a , f b , f c ), where f 0 , f 1 , f 2 , f 3 , f 4 , f 5 ,...f a , f b , f c respectively represent different frequencies, and three frequencies supplied on each scanning line, between two scanning lines Compare at least one frequency is not the same. In addition, the 15th image is scanned in a sequential scanning manner.

其採取每條掃描線上供應三個不同的頻率,以作觸碰的鑑別。由於每條掃描線上均供應三個不同的頻率,而每兩條掃描線之間的兩個頻率,至少有一個不相同。因此,當發生單點觸碰時,仍會有如第13B~C圖的狀況發生,亦即,會有三個頻率發生超過閥值的狀況,因此,可判斷觸碰的發生。當發生連續兩點觸碰時,例如,(X1,Y1),(X2,Y1)發生觸碰,則會有f0 ,f1 ,f2 ,f3 四個頻率的值大於閥值,且由於f0 ,f3 ,為共同的頻率,因此,其值會大於另外兩個頻率。其餘的觸碰點判斷皆相同,不再贅述。It takes three different frequencies on each scan line for identification of touches. Since three different frequencies are supplied on each scan line, at least one of the two frequencies between each two scan lines is different. Therefore, when a single touch occurs, there is still a situation as shown in Figs. 13B to C, that is, there are three frequencies that exceed the threshold value, and therefore, the occurrence of the touch can be judged. When two consecutive touches occur, for example, (X1, Y1), (X2, Y1), there will be f 0 , f 1 , f 2 , f 3 The values of the four frequencies are greater than the threshold, and Since f 0 , f 3 , are common frequencies, their values will be greater than the other two frequencies. The rest of the touch points are judged the same and will not be described again.

第12,14,15圖僅描述部分的多頻率供應的情形,實際上的應用,可採取多各頻率完全不同,或者,每條掃描線上的多個頻率,兩兩掃描線比較至少一個不同的情形。而最少的需求頻率的計算,以每條掃描線取兩個頻率為例,可為掃描線數m的值等於組合數a取2的方式;以每條掃描線取三個頻率為例,可為掃描線數m的值等於組合數a取3的方式。以此類推。而最大的數值,則為每條掃描線所供應的的多個頻率,完全不同,則每條掃描線供應The 12th, 14th, and 15th figures only describe the partial multi-frequency supply. In practice, the multiple frequencies can be completely different, or multiple frequencies on each scan line, and the two scan lines are compared with at least one different one. situation. For the calculation of the minimum required frequency, taking two frequencies for each scanning line as an example, the value of the scanning line number m is equal to the combination number a is taken as 2; taking three frequencies for each scanning line as an example, The value of the number of scanning lines m is equal to the manner in which the combination number a is taken as 3. And so on. The maximum value is the multiple frequencies supplied for each scan line, which is completely different, and each scan line is supplied.

雖然本發明之較佳實施例揭露如上所述,然其並非用以限定本發明,任何熟習相關技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。While the preferred embodiment of the invention has been described above, it is not intended to limit the invention, and it is obvious to those skilled in the art that the invention may be modified and modified without departing from the spirit and scope of the invention. The patent protection scope of the invention is subject to the definition of the scope of the patent application attached to the specification.

DV1‧‧‧電壓DV1‧‧‧ voltage

f0,f1,f2,f3,f4,f5,...fm-1‧‧‧頻率F0,f1,f2,f3,f4,f5,...fm-1‧‧‧frequency

VT‧‧‧閥值VT‧‧‧ threshold

X0,X1,X2,X3,X4,X5,...Xm-1 ‧‧‧掃描線X0, X1, X2, X3, X4, X5, ... X m-1 ‧‧‧ scan lines

X10,X11,X12,X13, X14,X15,...X1M‧‧‧掃描線X10, X11, X12, X13, X14, X15,...X1M‧‧‧ scan line

Y0,Y1,Y2,Y3,Y4,Y5,...Ym-1 ‧‧‧掃描線Y0, Y1, Y2, Y3, Y4, Y5, ... Y m-1 ‧‧‧ scan line

V(f0 ),V(f1 ),V(f2 ),V(f3 ),V(f4 ),V(f5 ),...V(fm-1 )‧‧‧掃描電壓V(f 0 ), V(f 1 ), V(f 2 ), V(f 3 ), V(f 4 ), V(f 5 ),...V(f m-1 )‧‧‧ scan Voltage

E00,E10.E20,E30,E40,E50...EM0‧‧‧感應量E00, E10.E20, E30, E40, E50...EM0‧‧‧Induction

E01,E11,E21,E31,E41,E51...EM1‧‧‧感應量E01, E11, E21, E31, E41, E51...EM1‧‧‧Induction

E02,E12,E22,E32,E42,E52...EM2‧‧‧感應量E02, E12, E22, E32, E42, E52...EM2‧‧‧Induction

E03,E13,E23,E33,E43,E53...EM3‧‧‧感應量E03, E13, E23, E33, E43, E53...EM3‧‧‧Induction

E04,E14,E24,E34,E44,E54...EM4‧‧‧感應量E04, E14, E24, E34, E44, E54...EM4‧‧‧Induction

E05,E15,E25,E35,E45,E55...EM5‧‧‧感應量E05, E15, E25, E35, E45, E55...EM5‧‧‧Induction

E0N,E1N,E2N,E3N,E4N,E5N...EMN‧‧‧感應量E0N, E1N, E2N, E3N, E4N, E5N...EMN‧‧‧Induction

第1圖係其為X,Y各有M,N個點的觸控面板陣列;第2圖係其為X方向有2M條掃描線,Y方向有2N條掃描線的觸控面板陣列;第3圖係為運用本發明掃描方法之電路圖第一例;第4A~4D圖係為本發明之掃描方法流程圖第一例;第5A~5D圖係為本發明之掃描方法流程圖第一例之頻譜時序圖;第6圖係為運用本發明掃描方法之電路圖第二例;第7A~7B圖係為本發明之掃描方法流程圖第二例;第8A~8F圖係為本發明之掃描方法流程圖第二例之頻譜時序圖;第9圖係為運用本發明掃描方法之電路圖第三例;第10A~10D圖係為本發明之掃描方法流程圖第三例;第11A~11B圖係為本發明之掃描方法流程圖第三例之頻譜時序圖;第12圖,本發明之單一掃描線供應2個頻率的示意圖;第13圖,本發明之單一掃描線供應2個頻率的頻譜圖;第14圖,本發明之單一掃描線供應2個頻率的第二具體實施例;及第15圖,本發明之單一掃描線供應3個頻率的示意圖。Figure 1 is a touch panel array with X and N points for each of X and Y; and 2 is a touch panel array with 2M scan lines in the X direction and 2N scan lines in the Y direction; 3 is a first example of a circuit diagram using the scanning method of the present invention; 4A to 4D are the first example of the scanning method of the present invention; and 5A to 5D are the first example of the scanning method of the present invention. FIG. 6 is a second example of a circuit diagram using the scanning method of the present invention; FIGS. 7A-7B are a second example of a scanning method of the present invention; and FIGS. 8A-8F are scanning of the present invention. Method sequence diagram of the second example of the flow chart; Figure 9 is a third example of the circuit diagram using the scanning method of the present invention; 10A-10D is the third example of the scanning method of the present invention; 11A-11B The spectrum timing chart of the third example of the scanning method flow chart of the present invention; FIG. 12 is a schematic diagram of the two scanning lines of the present invention supplying two frequencies; and FIG. 13 , the single scanning line of the present invention supplies two frequency spectrums. Figure 14 is a second embodiment of a single scan line of the present invention supplying two frequencies; and a fifteenth A single scan line of the present invention serves three frequencies FIG.

X0,X1,X2,X3,X4,X5,...Xm-1 ‧‧‧掃描線X0, X1, X2, X3, X4, X5, ... X m-1 ‧‧‧ scan lines

Y0,Y1,Y2,Y3,Y4, Y5,...Ym-1 ‧‧‧掃描線Y0, Y1, Y2, Y3, Y4, Y5, ... Y m-1 ‧‧‧ scan line

V(f0 ),V(f1 ),V(f2 ),V(f3 ),V(f4 ),V(f5 ),...V(fm-1 )‧‧‧掃描電壓V(f 0 ), V(f 1 ), V(f 2 ), V(f 3 ), V(f 4 ), V(f 5 ),...V(f m-1 )‧‧‧ scan Voltage

Claims (36)

一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;依序偵測該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該頻譜值,進行觸碰點判斷。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines a source; detecting a capacitance value of the plurality of second direction scan lines and converting it into a detection signal; expanding the detection signal into a spectrum value; and performing a touch point determination according to the spectrum value. 如申請專利範圍第1項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method according to claim 1, wherein the touch point determination is determined according to a threshold value, and when at least one of the spectral values exceeds the threshold, determining that at least one occurs. Tap and touch. 如申請專利範圍第1項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method according to claim 1, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第1項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且每兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method of claim 2, wherein the signal source of each of the plurality of first direction scan lines is supplied with a plurality of signal sources of the plurality of first direction scan lines, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by each of the plurality of first direction scan lines is different. 如申請專利範圍第1項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method according to claim 1, wherein the signal source is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;在一單位時間內進行一第一時間與一第二時間之掃描,依序偵測該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及進行該第二方向掃描線個別之該第一時間與該第二時間之該頻譜值比對,以進行觸碰點判斷。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines Detecting a first time and a second time in a unit time, sequentially detecting a capacitance value of the plurality of second direction scan lines and converting the signal into a detection signal; expanding the detection signal And comparing the spectral values of the first time and the second time of the scan line of the second direction to perform the touch point determination. 如申請專利範圍第6項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The sensing quantity scanning method of the touch panel array according to claim 6 , wherein the touch point determination is determined according to a threshold value, and when at least one of the spectral values exceeds the threshold, determining that at least one occurs Tap and touch. 如申請專利範圍第6項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method of claim 2, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第6項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且每兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method of claim 2, wherein the signal source of each of the plurality of first direction scan lines is supplied with a frequency source of each of the plurality of first direction scan lines, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by each of the plurality of first direction scan lines is different. 如申請專利範圍第6項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method of claim 2, wherein the source of the signal is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;同步偵測多條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該多條複數個第二方向掃描線之該頻譜值,以對應之多個偵測電路進行觸碰點判斷,藉以增加掃描之速度。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines Detecting a plurality of capacitance values of the plurality of second direction scan lines and converting them into a detection signal; expanding the detection signal into a spectrum value; and according to the plurality of plurality of second direction scan lines The spectrum value is judged by a corresponding plurality of detecting circuits to increase the scanning speed. 如申請專利範圍第11項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method according to claim 11, wherein the touch point determination is determined according to a threshold value, and when at least one of the spectral values exceeds the threshold, determining that at least one occurs. Tap and touch. 如申請專利範圍第11項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method of claim 1, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第11項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且每兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method of claim 1, wherein the signal source of each of the plurality of first direction scan lines is supplied with a frequency source of each of the plurality of first direction scan lines, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by each of the plurality of first direction scan lines is different. 如申請專利範圍第11項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method for inductive scanning of a touch panel array according to claim 11, wherein the signal source is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;在一單位時間內進行一第一時間與一第二時間之掃描,同步偵測多條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該多條複數個第二方向掃描線之該頻譜值,運用該第一時間與該第二時間之該頻譜值比對,以對應之多個偵測電路進行觸碰點判斷,藉以增加掃描之速度。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines a first time and a second time scan in a unit time, synchronously detecting a capacitance value of the plurality of the plurality of second direction scan lines and converting into a detection signal; and detecting the detection signal Expanding to a spectral value; and comparing the spectral values of the plurality of second-direction scan lines according to the spectral values of the first time and the second time, and corresponding to the plurality of detecting circuits Touch to judge, in order to increase the speed of scanning. 如申請專利範圍第16項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method for inductive quantity scanning of a touch panel array according to claim 16 , wherein the touch point determination is determined according to a threshold value, and when at least one of the spectral values exceeds the threshold, determining that at least one occurs Tap and touch. 如申請專利範圍第16項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method of claim 1, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第16項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且任兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method of claim 1, wherein the signal source of each of the plurality of first direction scan lines is supplied with a frequency source of each of the plurality of first direction scan lines, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by the plurality of the plurality of first direction scan lines is different. 如申請專利範圍第16項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method for inductive quantity scanning of a touch panel array according to claim 16 , wherein the signal source is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;同步偵測兩條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該兩條第二方向掃描線之該頻譜值,以相同之第一方向掃描線之一差值進行觸碰點判斷。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines Detecting a capacitance value of one of the plurality of second direction scan lines and converting it into a detection signal; expanding the detection signal into a spectrum value; and according to the two second direction scan lines The spectral value is judged by the touch point difference of one of the scan lines in the same first direction. 如申請專利範圍第21項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該差值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method for inductive quantity scanning of a touch panel array according to claim 21, wherein the touch point judgment is determined according to a threshold value, and when at least one of the difference values exceeds the threshold value, determining that at least one occurs Tap and touch. 如申請專利範圍第21項之觸控面板陣列之感應量掃描方法,其中該兩條該複數個第二方向掃描線係為相鄰。The method according to claim 21, wherein the two of the plurality of second direction scanning lines are adjacent. 如申請專利範圍第21項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method of claim 2, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第21項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且任兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method for inductive quantity scanning of a touch panel array according to claim 21, wherein a source of signals of different frequencies of each of the plurality of first direction scan lines is supplied, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by the plurality of the plurality of first direction scan lines is different. 如申請專利範圍第21項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method for inductive scanning of a touch panel array according to claim 21, wherein the signal source is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;在一單位時間內進行一第一時間與一第二時間之掃描,同步偵測兩條該複數個第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該兩條第二方向掃描線之該頻譜值,運用該第一時間與該第二時間之該頻譜值比對,以相同之第一方向掃描線之一差值進行觸碰點判斷。。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines Detecting a first time and a second time in a unit time, synchronously detecting a capacitance value of one of the plurality of second direction scan lines and converting the value into a detection signal; Expanding to a spectral value; and comparing the spectral values of the two second direction scan lines, using the first time and the second time of the spectral value to compare one of the scan lines in the same first direction Make a touch point judgment. . 如申請專利範圍第27項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method for sensing the amount of touch of the touch panel array according to claim 27, wherein the touch point judgment is determined according to a threshold value, and when at least one of the spectrum values exceeds the threshold, determining that at least one occurs Tap and touch. 如申請專利範圍第27項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method of claim 2, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第27項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且任兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method for inductive quantity scanning of a touch panel array according to claim 27, wherein a source of signals of different frequencies of each of the plurality of first direction scan lines is supplied, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by the plurality of the plurality of first direction scan lines is different. 如申請專利範圍第27項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method for inductive scanning of a touch panel array according to claim 27, wherein the signal source is selected from the group consisting of a voltage source and a current source. 一種觸控面板陣列之感應量掃描方法,其中該陣列具有複數個第一方向掃描線與複數個第二方向掃描線,包含下列步驟:供應每條該複數個第一方向掃描線不同頻率之訊號源;偵測該些第二方向掃描線之一電容值並轉換為一偵測訊號;將該偵測訊號展開為一頻譜值;及依據該頻譜值,進行觸碰點判斷。A sensing quantity scanning method for a touch panel array, wherein the array has a plurality of first direction scanning lines and a plurality of second direction scanning lines, and the method includes the following steps: supplying signals of different frequencies of each of the plurality of first direction scanning lines Detecting a capacitance value of the second direction scan line and converting it into a detection signal; expanding the detection signal into a spectrum value; and performing a touch point determination according to the spectrum value. 如申請專利範圍第32項之觸控面板陣列之感應量掃描方法,其中該觸碰點判斷係依據一閥值進行判斷,當該頻譜值有至少一個超過該閥值時,即判斷發生至少一個點觸碰。The method for inductive quantity scanning of a touch panel array according to claim 32, wherein the touch point judgment is determined according to a threshold value, and when at least one of the spectrum values exceeds the threshold, determining that at least one occurs. Tap and touch. 如申請專利範圍第32項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條掃描線供應單一頻率者。The method according to claim 32, wherein the signal source of each of the plurality of first direction scan lines is supplied with a single frequency for each scan line. 如申請專利範圍第32項之觸控面板陣列之感應量掃描方法,其中供應每條該複數個第一方向掃描線不同頻率之訊號源,係以每條該複數個第一方向掃描線供應複數個頻率,且任兩條該複數個第一方向掃描線所供應之該複數個頻率至少一個不相同。The method for inductive quantity scanning of a touch panel array according to claim 32, wherein a source of signals of different frequencies of each of the plurality of first direction scan lines is supplied, and the plurality of first direction scan lines are supplied for each of the plurality of first direction scan lines. And a frequency of at least one of the plurality of frequencies supplied by the plurality of the plurality of first direction scan lines is different. 如申請專利範圍第32項之觸控面板陣列之感應量掃描方法,其中該訊號源係選自電壓源、電流源所組成之群組。The method for inductive quantity scanning of a touch panel array according to claim 32, wherein the signal source is selected from the group consisting of a voltage source and a current source.
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