TWI426255B - Thick film tension testing device - Google Patents
Thick film tension testing device Download PDFInfo
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- TWI426255B TWI426255B TW98136764A TW98136764A TWI426255B TW I426255 B TWI426255 B TW I426255B TW 98136764 A TW98136764 A TW 98136764A TW 98136764 A TW98136764 A TW 98136764A TW I426255 B TWI426255 B TW I426255B
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Description
本發明係有關於一種拉力測試裝置,特別係有關於一種厚膜拉力測試裝置。The present invention relates to a tensile testing device, and more particularly to a thick film tensile testing device.
如我國公開專利第M329769號所揭示之「拉力試驗機」,其係由底座、動力裝置、柱體、聯板、上夾具總成、下夾具總成、訊號處理器及微電腦試算機所組成,用以測試材料之拉力,然而,上述之拉力試驗機不僅結構複雜,其結構設計上亦無法對厚膜材料進行拉力測試。The "tension testing machine" disclosed in Japanese Patent Laid-Open No. M329769 is composed of a base, a power unit, a cylinder, a joint plate, an upper clamp assembly, a lower clamp assembly, a signal processor and a microcomputer computer. It is used to test the tensile force of materials. However, the above-mentioned tensile testing machine is not only complicated in structure, but also structurally unable to perform tensile testing on thick film materials.
本發明之主要目的係在於提供一種厚膜拉力測試裝置,其係包含一裝置本體、一設置於該裝置本體內之控制單元以及一設置於該裝置本體上之測試單元,該測試單元係電性連接該控制單元,且該測試單元係至少包含有一固定於該裝置本體之上承座、一固定於該上承座之拉力偵測器、一裝設於該拉力偵測器之膜固定座以及一與該膜固定座呈相對設置之升降底座,該膜固定座係設置於該拉力偵測器與該升降底座之間,本發明係可用於測試積層陶瓷電容器之介電膜拉力強度,且其具有低成本、操作簡單及準確度高等優點。The main object of the present invention is to provide a thick film tensile testing device, which comprises a device body, a control unit disposed in the device body, and a test unit disposed on the device body, the test unit being electrically Connecting the control unit, and the test unit includes at least a bearing fixed to the upper portion of the device body, a tension detecting device fixed to the upper bearing seat, and a film fixing seat mounted on the tensile force detecting device. a lifting base disposed opposite to the film fixing seat, the film fixing seat is disposed between the tension detecting device and the lifting base, and the invention can be used for testing the tensile strength of the dielectric film of the laminated ceramic capacitor, and It has the advantages of low cost, simple operation and high accuracy.
請參閱第1及2圖,其係本發明之一較佳實施例,一種厚膜拉力測試裝置係包含一裝置本體10、一設置於該裝置本體10內之控制單元20以及一設置於該裝置本體10上之測試單元30,在本實施例中,該測試單元30係電性連接該控制單元20,而該控制單元20係可控制該測試單元30之動作,且該測試單元30係至少包含有一固定於該裝置本體10之上承座31、一固定於該上承座31之拉力偵測器32、一裝設於該拉力偵測器32之膜固定座33以及一與該膜固定座33呈相對設置之升降底座34,在本實施例中,該拉力偵測器32係具有一掛勾32a,該膜固定座33係可掛設於該拉力偵測器32之該掛勾32a,以利更換不同尺寸之該膜固定座33,此外,該膜固定座33係設置於該拉力偵測器32與該升降底座34之間,且該膜固定座33係具有一第一貼合面33a,該第一貼合面33a係可供一待測試厚膜之一端貼合(圖未繪出),請參閱第1及3圖,該升降底座34係具有一第二貼合面34a,該第二貼合面34a係可供該待測試厚膜之另一端貼合(圖未繪出),在本實施例中,該膜固定座33之該第一貼合面33a係與該升降底座34之該第二貼合面34a平齊,以使施力方向位於同一平面上,進而提高測試準確度。1 and 2 are a preferred embodiment of the present invention. A thick film tensile testing device includes a device body 10, a control unit 20 disposed in the device body 10, and a device disposed on the device. In the present embodiment, the test unit 30 is electrically connected to the control unit 20, and the control unit 20 controls the action of the test unit 30, and the test unit 30 includes at least There is a bearing 31 fixed to the upper portion of the device body 10, a tension detecting device 32 fixed to the upper bearing seat 31, a film fixing seat 33 mounted on the tensile force detecting device 32, and a film fixing seat. In the embodiment, the tension detector 32 has a hook 32a, and the film holder 33 can be hung on the hook 32a of the tension detector 32. The membrane holder 33 is replaced by a different size, and the membrane holder 33 is disposed between the tension detector 32 and the lifting base 34, and the membrane holder 33 has a first bonding surface. 33a, the first bonding surface 33a is for one end of a thick film to be tested (Fig. Drawings 1 and 3, the lifting base 34 has a second bonding surface 34a, and the second bonding surface 34a is suitable for the other end of the thick film to be tested. In this embodiment, the first bonding surface 33a of the film holder 33 is flush with the second bonding surface 34a of the lifting base 34 such that the direction of the force application is on the same plane. Improve test accuracy.
請再參閱第1及2圖,在本實施例中,該測試單元30另包含有一對導桿35及一恆溫加熱機構36,各該導桿35係貫穿該升降底座34,以導引該升降底座34進行垂直升降,此外,各該導桿35係具有一擋止部35a,在本實施例中,各該檔止部35a係可限位該升降底座34,以防止該升降底座34撞擊該膜固定座33,此外,該恆溫加熱機構36係具有一腔體361及一恆溫加熱器362,該腔體361係固定於該裝置本體10上,該恆溫加熱器362係設置於該腔體361內,用以維持該腔體361內之溫度於一特定測試溫度值,在本實施例中,該膜固定座33及該升降底座34係位於該恆溫加熱機構36之該腔體361內,以使該待測試厚膜可在特定溫度環境下進行拉力測試。本發明之該厚膜拉力測試裝置係可用於測試積層陶瓷電容器之介電膜拉力強度,且其具有低成本、操作簡單及準確度高等優點。Referring to FIGS. 1 and 2 again, in the embodiment, the test unit 30 further includes a pair of guiding rods 35 and a constant temperature heating mechanism 36. Each of the guiding rods 35 extends through the lifting base 34 to guide the lifting and lowering. The base 34 is vertically lifted. In addition, each of the guide rods 35 has a stop portion 35a. In the embodiment, each of the stop portions 35a can limit the lift base 34 to prevent the lift base 34 from colliding with the lift base 34. The thermostat heating mechanism 36 has a cavity 361 and a thermostat heater 362. The cavity 361 is fixed to the device body 10. The thermostat heater 362 is disposed in the cavity 361. In the present embodiment, the film holder 33 and the lifting base 34 are located in the cavity 361 of the constant temperature heating mechanism 36 to maintain the temperature in the cavity 361 at a specific test temperature. The thick film to be tested can be subjected to a tensile test under a specific temperature environment. The thick film tensile testing device of the invention can be used for testing the tensile strength of a dielectric film of a laminated ceramic capacitor, and has the advantages of low cost, simple operation and high accuracy.
本發明之保護範圍當視後附之申請專利範圍所界定者為準,任何熟知此項技藝者,在不脫離本發明之精神和範圍內所作之任何變化與修改,均屬於本發明之保護範圍。The scope of the present invention is defined by the scope of the appended claims, and any changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention are within the scope of the present invention. .
10‧‧‧裝置本體10‧‧‧ device body
20‧‧‧控制單元20‧‧‧Control unit
30‧‧‧測試單元30‧‧‧Test unit
31‧‧‧上承座31‧‧‧上上座
32‧‧‧拉力偵測器32‧‧‧ Pull force detector
32a‧‧‧掛勾32a‧‧‧hook
33‧‧‧膜固定座33‧‧‧Film holder
33a‧‧‧第一貼合面33a‧‧‧First mating surface
34‧‧‧升降底座34‧‧‧ Lifting base
34a‧‧‧第二貼合面34a‧‧‧Second mating surface
35‧‧‧導桿35‧‧‧guides
35a‧‧‧擋止部35a‧‧‧stops
36‧‧‧恆溫加熱機構36‧‧‧Constant heating mechanism
361‧‧‧腔體361‧‧‧ cavity
362‧‧‧恆溫加熱器362‧‧‧Constant temperature heater
第1圖:依據本發明之一較佳實施例,一種厚膜拉力測試裝置之立體視圖。Figure 1 is a perspective view of a thick film tensile testing device in accordance with a preferred embodiment of the present invention.
第2圖:該厚膜拉力測試裝置之正視圖。Figure 2: Front view of the thick film tensile test device.
第3圖:該厚膜拉力測試裝置之側視圖。Figure 3: Side view of the thick film tensile test device.
10...裝置本體10. . . Device body
20...控制單元20. . . control unit
30...測試單元30. . . Test unit
31...上承座31. . . Upper seat
32...拉力偵測器32. . . Pull detector
32a...掛勾32a. . . Hook
33...膜固定座33. . . Membrane mount
33a...第一貼合面33a. . . First fit surface
34...升降底座34. . . Lifting base
34a...第二貼合面34a. . . Second fit surface
35...導桿35. . . Guide rod
35a...擋止部35a. . . Stop
36...恆溫加熱機構36. . . Constant temperature heating mechanism
361...腔體361. . . Cavity
362...恆溫加熱器362. . . Thermostatic heater
Claims (6)
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TW98136764A TWI426255B (en) | 2009-10-29 | 2009-10-29 | Thick film tension testing device |
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TW98136764A TWI426255B (en) | 2009-10-29 | 2009-10-29 | Thick film tension testing device |
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TW201115132A TW201115132A (en) | 2011-05-01 |
TWI426255B true TWI426255B (en) | 2014-02-11 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5648834A (en) * | 1996-02-09 | 1997-07-15 | Kitchen; Dean J. | Film tension sensing device |
TWI287631B (en) * | 2004-02-03 | 2007-10-01 | Yamamoto Ms Co Ltd | Electrode cartridge and a system for measuring an internal stress for a film of plating |
TWM329769U (en) * | 2007-02-06 | 2008-04-01 | Rung-Tsuen Gau | Tensile testing machine |
CN101387563A (en) * | 2008-10-29 | 2009-03-18 | 重庆大学 | Construction film structure pre-tension measurement method and apparatus thereof |
-
2009
- 2009-10-29 TW TW98136764A patent/TWI426255B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5648834A (en) * | 1996-02-09 | 1997-07-15 | Kitchen; Dean J. | Film tension sensing device |
TWI287631B (en) * | 2004-02-03 | 2007-10-01 | Yamamoto Ms Co Ltd | Electrode cartridge and a system for measuring an internal stress for a film of plating |
TWM329769U (en) * | 2007-02-06 | 2008-04-01 | Rung-Tsuen Gau | Tensile testing machine |
CN101387563A (en) * | 2008-10-29 | 2009-03-18 | 重庆大学 | Construction film structure pre-tension measurement method and apparatus thereof |
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TW201115132A (en) | 2011-05-01 |
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