TWI423019B - Detection device for providing resistive touch position information and detection system using the same - Google Patents
Detection device for providing resistive touch position information and detection system using the same Download PDFInfo
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Description
本發明是有關於一種檢測技術,且特別是有關於一種檢測待測電路板的裝置與應用其之檢測系統。The present invention relates to a detection technique, and more particularly to a device for detecting a circuit board to be tested and a detection system using the same.
隨著資訊技術、無線行動通訊和資訊家電的快速發展與應用,為了攜帶更便利、體積更輕巧化以及操作更人性化的目的,許多的資訊產品已由傳統之鍵盤或滑鼠等輸入裝置,加入觸控面板(Touch Panel)作為輸入裝置。With the rapid development and application of information technology, wireless mobile communication and information appliances, in order to carry more convenient, lighter and more user-friendly, many information products have been input devices such as traditional keyboards or mice. A touch panel (Touch Panel) is added as an input device.
一般具有電阻式觸控面板的產品,例如,具觸控式面板的手機、個人數位助理機(personal digital assistant,PDA),在進行測試時需經由人為觸碰或經由測試機構,來觸碰面板的特定位置,以進行此產品的功能測試。然而,人為觸碰方式有可能因人為的精神不濟而有觸碰位置不對的情況。這種藉由實體面板進行互動的測試方式相當耗時,且所需的成本較高。此外,對於觸控面板的測試位置與測試多寡也會影響測試速度及測試準確性。關於測試機構的設計也相當複雜。Generally, products with resistive touch panels, such as mobile phones with touch panels, personal digital assistants (PDAs), need to touch the panel through human touch or through a test mechanism during testing. Specific location for functional testing of this product. However, the artificial touch method may have a situation in which the touch position is not correct due to the artificial mental discomfort. This type of testing by interacting with physical panels is time consuming and costly. In addition, the test position and test of the touch panel will also affect the test speed and test accuracy. The design of the test facility is also quite complicated.
如何實現一種檢測治具而可以對電阻式觸控面板的電路板在進行測試時,不使用實體的電阻式觸控面板,以方便測試人員進行測試,這是一個有待克服的課題。How to implement a detection fixture can test the circuit board of the resistive touch panel without using a physical resistive touch panel to facilitate testing by the tester, which is a problem to be overcome.
本發明提供一種提供電阻式觸碰位置資訊之檢測裝置與應用其之檢測系統,在檢測待測單元(待測電路板)時不需安裝高成本的觸控面板,可以提高測試速度及測試準確性。The invention provides a detecting device for providing resistive touch position information and a detecting system using the same, which does not need to install a high-cost touch panel when detecting a unit to be tested (a circuit board to be tested), thereby improving test speed and accurate test. Sex.
本發明提出一種提供電阻式觸碰位資訊置之檢測裝置,適用於檢測待測單元。所述待測單元根據電阻式觸碰位置來執行功能。所述檢測裝置包括電阻式觸碰位置產生單元、切換單元以及控制單元。所述電阻式觸碰位置產生單元由多個電阻組成,用以產生觸碰位置資訊。所述切換單元耦接所述電阻式觸碰位置產生單元,用以切換所述觸碰位置資訊的座標值。所述控制單元耦接至所述切換單元與所述待測單元,所述控制單元控制所述切換單元與所述待測單元的運作,選擇性地控制所述觸碰位置資訊的所述座標值,所述待測單元執行關聯於所述座標值的功能並輸出測試結果,而所述控制單元根據所述測試結果來判別所述待測單元所執行的功能是否正常。The invention provides a detecting device for providing a resistive touch position information, which is suitable for detecting a unit to be tested. The unit to be tested performs a function according to the resistive touch position. The detecting device includes a resistive touch position generating unit, a switching unit, and a control unit. The resistive touch position generating unit is composed of a plurality of resistors for generating touch position information. The switching unit is coupled to the resistive touch position generating unit for switching a coordinate value of the touch position information. The control unit is coupled to the switching unit and the unit to be tested, and the control unit controls operation of the switching unit and the unit to be tested, and selectively controls the coordinates of the touch position information. a value, the unit to be tested performs a function associated with the coordinate value and outputs a test result, and the control unit determines whether the function performed by the unit to be tested is normal according to the test result.
本發明另提出一種提供電阻式觸碰位資訊置之檢測系統。所述檢測系統包括待測單元、電阻式觸碰位置產生單元、切換單元以及控制單元。所述待測單元根據電阻式觸碰位置來執行功能。所述電阻式觸碰位置產生單元由多個電阻組成,用以產生觸碰位置資訊。所述切換單元耦接所述電阻式觸碰位置產生單元,用以切換所述觸碰位置資訊的座標值。所述控制單元耦接至所述切換單元與所述待測單元,所述控制單元控制所述切換單元與所述待測單元的運作,選擇性地控制所述觸碰位置資訊的所述座標值,所述待測單元執行關聯於所述座標值的功能並輸出測試結果,而所述控制單元根據所述測試結果來判別所述待測單元所執行的功能是否正常。The invention further provides a detection system for providing a resistive touch position information. The detection system includes a unit to be tested, a resistive touch position generating unit, a switching unit, and a control unit. The unit to be tested performs a function according to the resistive touch position. The resistive touch position generating unit is composed of a plurality of resistors for generating touch position information. The switching unit is coupled to the resistive touch position generating unit for switching a coordinate value of the touch position information. The control unit is coupled to the switching unit and the unit to be tested, and the control unit controls operation of the switching unit and the unit to be tested, and selectively controls the coordinates of the touch position information. a value, the unit to be tested performs a function associated with the coordinate value and outputs a test result, and the control unit determines whether the function performed by the unit to be tested is normal according to the test result.
在本發明的一實施例中,所述電阻式觸碰位置產生單元包括第一串聯電阻以及第二串聯電阻。第一串聯電阻具有多個第一輸出端,用以提供所述座標值的第一軸向位置,其中這些第一輸出端的每一者位在所述第一串聯電阻上的兩個電阻的連接點上。第二串聯電阻具有多個第二輸出端,用以提供所述座標值的第二軸向位置,其中這些第二輸出端的每一者位在所述第二串聯電阻上的兩個電阻的連接點上。In an embodiment of the invention, the resistive touch position generating unit includes a first series resistor and a second series resistor. The first series resistor has a plurality of first outputs for providing a first axial position of the coordinate value, wherein each of the first outputs has a connection of two resistors on the first series resistor Point. a second series resistor having a plurality of second outputs for providing a second axial position of the coordinate value, wherein each of the second outputs is coupled to two resistors on the second series resistor Point.
在本發明的一實施例中,所述切換單元包括多個開關,每一這些關關具一控制端,這些第一輸出端與這些第二輸出端所各別對應的一線路上耦接這些關關的其中一個,而所述控制單元控制每一這些關關的所述控制端,以決定所述線路是否導通。In an embodiment of the invention, the switching unit includes a plurality of switches, each of which has a control end, and the first output ends are coupled to the respective lines corresponding to the second output ends. One of the switches, and the control unit controls the control terminals of each of the switches to determine whether the line is conducting.
在本發明的一實施例中,所述第一串聯電阻與所述第二串聯電阻中的每一電阻是藉由對觸控面板的實際觸碰位置進行等效電阻計算而獲得。In an embodiment of the invention, each of the first series resistance and the second series resistance is obtained by performing an equivalent resistance calculation on an actual touch position of the touch panel.
在本發明的一實施例中,所述控制單元更控制所述切換單元,以提供所述待測單元運作時所需的操作電壓。In an embodiment of the invention, the control unit further controls the switching unit to provide an operating voltage required for the unit to be tested to operate.
在本發明的一實施例中,所述檢測裝置更包括輸入輸出單元,所述輸入輸出單元耦接至所述控制單元與所述待測單元,其中所述控制單元通過所述輸入輸出單元傳送命令至所述待測單元,且所述控制單元與所述待測單元通過所述輸入輸出單元進行雙向資料傳送。In an embodiment of the invention, the detecting device further includes an input and output unit coupled to the control unit and the unit to be tested, wherein the control unit transmits through the input and output unit Commanding to the unit to be tested, and the control unit and the unit to be tested perform bidirectional data transmission through the input and output unit.
基於上述,本發明之檢測裝置與檢測系統主要是提供電阻式觸碰位置資訊,以供待測單元(待測電路板)進行測試。如此一來,不需經由實體觸控面板即可測試待測單元,從而提高測試速度及測試準確性。Based on the above, the detecting device and the detecting system of the present invention mainly provide resistive touch position information for testing by the unit to be tested (the circuit board to be tested). In this way, the unit to be tested can be tested without a physical touch panel, thereby improving the test speed and the test accuracy.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.
現將詳細參考本發明之實施例,並在附圖中說明所述實施例之實例。另外,凡可能之處,在圖式及實施方式中使用相同標號的元件/構件代表相同或類似部分。Reference will now be made in detail be made to the embodiments of the invention In addition, wherever possible, the same reference numerals in the drawings
圖1是依照本發明一實施例之檢測系統的方塊圖。請參照圖1。檢測系統100包括檢測裝置110以及測待測單元(unit under test)UUT。於此實施例的檢測系統100中,檢測裝置110適用於檢測待測單元UUT,其中待測單元UUT可以是用於手機或個人數位助理機(PDA)的電路板,但並不限制於此,而待測單元UUT(亦即待測電路板)根據電阻式觸碰位置來執行功能。在此,為了方便說明,先將電阻式觸控面板的觸碰位置定義為X軸向與Y軸向,而且以(X’,Y’)表示為觸碰位置資訊的座標值,其中X’表示在X軸向的位置,而Y’表示在Y軸向的位置。1 is a block diagram of a detection system in accordance with an embodiment of the present invention. Please refer to Figure 1. The detection system 100 includes a detection device 110 and a unit under test UUT. In the detection system 100 of this embodiment, the detecting device 110 is adapted to detect the unit to be tested UUT, wherein the unit to be tested UUT may be a circuit board for a mobile phone or a personal digital assistant (PDA), but is not limited thereto. The unit to be tested UUT (that is, the circuit board to be tested) performs a function according to the resistive touch position. Here, for convenience of explanation, the touch position of the resistive touch panel is first defined as the X axis and the Y axis, and (X', Y') is expressed as the coordinate value of the touch position information, where X' Indicates the position in the X-axis direction, and Y' indicates the position in the Y-axis direction.
檢測裝置110可以包括電阻式觸碰位置產生單元S_TU、切換單元130以及控制單元120。本實施例的電阻式觸碰位置產生單元S_TU不包括實體電阻式觸控面板,而是由多個電阻組成,主要是用來產生模擬電阻式觸控面板的觸碰位置資訊。關於電阻式觸碰位置產生單元S_TU的詳細架構將於後續的實施例中描述。The detecting device 110 may include a resistive touch position generating unit S_TU, a switching unit 130, and a control unit 120. The resistive touch position generating unit S_TU of the embodiment does not include a solid resistive touch panel, but is composed of a plurality of resistors, and is mainly used to generate touch position information of the analog resistive touch panel. A detailed architecture regarding the resistive touch position generating unit S_TU will be described in the subsequent embodiments.
切換單元130可以耦接至控制單元120與電阻式觸碰位置產生單元S_TU,而控制單元120可以耦接至切換單元130與待測單元UUT。其中,控制單元120可以控制切換單元130與待測單元UUT的運作,並且選擇性地控制觸碰位置資訊的座標值(X’,Y’),以使座標值(X’,Y’)輸出至待測單元UUT。如此一來,待測單元UUT即可執行關聯於座標值(X’,Y’)的功能並輸出測試結果TR,藉以致使控制單元120可以根據測試結果TR來判別待測單元UUT所執行的功能是否正常。The switching unit 130 can be coupled to the control unit 120 and the resistive touch position generating unit S_TU, and the control unit 120 can be coupled to the switching unit 130 and the unit to be tested UUT. The control unit 120 can control the operation of the switching unit 130 and the unit to be tested UUT, and selectively control the coordinate value (X', Y') of the touch position information, so that the coordinate value (X', Y') is output. To the unit to be tested UUT. In this way, the unit under test UUT can perform the function associated with the coordinate value (X', Y') and output the test result TR, so that the control unit 120 can determine the function performed by the unit UUT to be tested according to the test result TR. Is it normal?
本實施例藉由電阻式觸碰位置產生單元S_TU與切換單元130的組成架構來模擬實體的電阻式觸碰面板,因此可以產生準確的觸碰位置資訊的座標值(X’,Y’)。在檢測待測單元UUT前,不需安裝實體的電阻式觸碰面板,而測試時也不需人為進行按壓,且更不需複雜的測試機構,所以可以提高待測單元UUT的測試速度與測試準確性。In this embodiment, the resistive touch panel of the entity is simulated by the constituent structure of the resistive touch position generating unit S_TU and the switching unit 130, so that the coordinate value (X', Y') of the accurate touch position information can be generated. Before detecting the UUT to be tested, there is no need to install a physical resistive touch panel, and the test does not need to be manually pressed, and no complicated test mechanism is needed, so the test speed and test of the UUT to be tested can be improved. accuracy.
基於上述實施例所教示的內容,圖2是依照本發明另一實施例之檢測系統的方塊圖。於此,請參照圖2。此實施例的檢測系統200類似於圖1的檢測系統100。檢測裝置210可以包括電阻式觸碰位置產生單元S_TU、切換單元130A、130B以及控制單元120。電阻式觸碰位置產生單元S_TU可以包括第一串聯電阻220以及第二串聯電阻230。第一串聯電阻220具有多個第一輸出端X1~X5,用以提供座標值(X’,Y’)的X軸向位置,其中第一輸出端X1~X5的每一者位在第一串聯電阻220上的兩個電阻的連接點上。相似地,第二串聯電阻230具有多個第二輸出端Y1~Y5,用以提供座標值(X’,Y’)的Y軸向位置,其中第二輸出端Y1~Y5的每一者位在第二串聯電阻230上的兩個電阻的連接點上。Based on the teachings of the above embodiments, FIG. 2 is a block diagram of a detection system in accordance with another embodiment of the present invention. Here, please refer to Figure 2. The detection system 200 of this embodiment is similar to the detection system 100 of FIG. The detecting device 210 may include a resistive touch position generating unit S_TU, switching units 130A, 130B, and a control unit 120. The resistive touch position generating unit S_TU may include a first series resistor 220 and a second series resistor 230. The first series resistor 220 has a plurality of first output terminals X1 - X5 for providing an X-axis position of the coordinate value (X', Y'), wherein each of the first output terminals X1 - X5 is at the first position The connection point of the two resistors on the series resistor 220 is on. Similarly, the second series resistor 230 has a plurality of second output terminals Y1 Y Y5 for providing a Y-axis position of the coordinate value (X', Y'), wherein each of the second output terminals Y1 Y Y5 At the junction of the two resistors on the second series resistor 230.
切換單元130A和切換單元130B各包括多個開關(可利用繼電器來實施,但並不限制於此),且每一關關具有一控制端。第一輸出端X1~X5與第二輸出端Y1~Y5所各別對應的一線路上各耦接前述多個開關的其中一個。控制單元120可以控制位在第一串聯電阻220的第一對軸向端XL和XR的電性與電位大小,也可以控制位在第二串聯電阻230的第二對軸向端YU和YD的電性與電位大小。控制單元120還可以控制切換單元130A和切換單元130B,以控制每一關關的控制端來決定第一輸出端X1~X5和第二輸出端Y1~Y5所各別對應的線路上是否導通,從而產生座標值(X’,Y’)。因此,控制單元120可以控制切換單元130A和切換單元130B來切換不同的觸碰位置資訊,以使電阻式觸碰位置產生單元S_TU輸出座標值(X’,Y’)。The switching unit 130A and the switching unit 130B each include a plurality of switches (which may be implemented using a relay, but are not limited thereto), and each of the switches has a control terminal. One of the plurality of switches is coupled to each of the first output terminals X1 to X5 and the second output terminals Y1 to Y5. The control unit 120 can control the electrical and potential magnitudes of the first pair of axial ends XL and XR of the first series resistor 220, and can also control the second pair of axial ends YU and YD of the second series resistor 230. Electrical and potential size. The control unit 120 can also control the switching unit 130A and the switching unit 130B to control each of the closed control terminals to determine whether the first output terminals X1 to X5 and the second output terminals Y1 to Y5 are respectively connected to each other. This produces a coordinate value (X', Y'). Therefore, the control unit 120 can control the switching unit 130A and the switching unit 130B to switch the different touch position information so that the resistive touch position generating unit S_TU outputs the coordinate value (X', Y').
圖3A是根據本發明實施例,說明觸控區域310的上電極板與下電極板的示意圖。於此,請參照圖3A,電阻式觸碰面板具有觸控區域310,而觸控區域310具有上電極板320與下電極板330。為了方便說明,將上電極板320的軸向定義為X軸向,並且將下電極板330的軸向定義為Y軸向。在X軸向上具有第一對軸向端XL和XR,而在Y軸向上具有第二對軸向端YU和YD。在觸控區域310上線繪示有一觸控位置POS1,在圖3A以「+」表示。當觸控位置POS1被觸壓時,其座標值會傳送至待測單元UUT。關於觸控位置POS1的等效電阻量測,於下文詳述。FIG. 3A is a schematic diagram illustrating an upper electrode plate and a lower electrode plate of the touch region 310 according to an embodiment of the invention. As shown in FIG. 3A , the resistive touch panel has a touch area 310 , and the touch area 310 has an upper electrode plate 320 and a lower electrode plate 330 . For convenience of explanation, the axial direction of the upper electrode plate 320 is defined as the X-axis direction, and the axial direction of the lower electrode plate 330 is defined as the Y-axis direction. There is a first pair of axial ends XL and XR in the X-axis and a second pair of axial ends YU and YD in the Y-axis. A touch position POS1 is drawn on the touch area 310, and is represented by "+" in FIG. 3A. When the touch position POS1 is touched, its coordinate value is transmitted to the unit UUT to be tested. The equivalent resistance measurement of the touch position POS1 is described in detail below.
圖3B說明觸碰區域310在X軸方向的等效電阻換算示意圖。於圖3B中,當觸控位置POS1被觸壓時,上電極板320與下電極板330的觸碰點會電性連接。在軸向端XL提供工作電壓VCC,並在工作電壓VCC與軸向端XL之間讀取電流I1,而在軸向端YU讀取電壓V1。在本實施例中,由於不讀取軸向端YD的電壓而形同開路。因此,觸控位置POS1在X軸方向的等效電阻RXA等於電壓V1除以電流I1。X軸等效總電阻等於電壓VCC除以電流I1,也等於電阻RXA加上電阻RXB。FIG. 3B illustrates a schematic diagram of equivalent resistance conversion of the touch region 310 in the X-axis direction. In FIG. 3B, when the touch position POS1 is touched, the touch points of the upper electrode plate 320 and the lower electrode plate 330 are electrically connected. The operating voltage VCC is supplied at the axial end XL, and the current I1 is read between the operating voltage VCC and the axial end XL, while the voltage V1 is read at the axial end YU. In the present embodiment, since the voltage at the axial end YD is not read, the open circuit is formed. Therefore, the equivalent resistance RXA of the touch position POS1 in the X-axis direction is equal to the voltage V1 divided by the current I1. The X-axis equivalent total resistance is equal to the voltage VCC divided by the current I1, which is also equal to the resistance RXA plus the resistance RXB.
圖3C說明觸碰區域310在Y軸方向的等效電阻換算示意圖。圖3C類似圖3B的換算。在軸向端YU提供工作電壓VCC,並讀取在工作電壓VCC與軸向端YU之間的電流I2,而在軸向端XL讀取電壓V2。在本實施例中,由於不讀取軸向端XR的電壓而形同開路。因此,觸控位置POS1在Y軸方向的等效電阻RYA等於電壓V2除以電流I2。Y軸等效總電阻等於電壓VCC除以電流I2,也等於電阻RYA加上電阻RYB。FIG. 3C illustrates a schematic diagram of equivalent resistance conversion of the touch region 310 in the Y-axis direction. Figure 3C is similar to the conversion of Figure 3B. The operating voltage VCC is supplied at the axial end YU, and the current I2 between the operating voltage VCC and the axial end YU is read, and the voltage V2 is read at the axial end XL. In the present embodiment, since the voltage of the axial end XR is not read, the open circuit is formed. Therefore, the equivalent resistance RYA of the touch position POS1 in the Y-axis direction is equal to the voltage V2 divided by the current I2. The Y-axis equivalent total resistance is equal to the voltage VCC divided by the current I2, which is also equal to the resistance RYA plus the resistance RYB.
圖4是根據本發明實施例,說明實際觸控位置的座標圖。在圖4中,X軸方向有Xa、Xb、…、Xn,Y軸方向有Ya、Yb、…、Yn。以「+」表示實際觸控位置,觸控位置POS1、POS2、POS3、POS4、POS5分別對應實際座標值(Xa,Yn)、(Xa,Ya)、(Xc,Yc)、(Xn,Yn)、(Xn,Ya)。關於圖4所繪示的觸控位置僅是幾種選擇實施例,本發明並不以此為限。4 is a graph showing the actual touch position according to an embodiment of the present invention. In Fig. 4, Xa, Xb, ..., Xn are present in the X-axis direction, and Ya, Yb, ..., Yn are present in the Y-axis direction. The actual touch position is represented by "+", and the touch positions POS1, POS2, POS3, POS4, and POS5 correspond to actual coordinate values (Xa, Yn), (Xa, Ya), (Xc, Yc), (Xn, Yn), respectively. , (Xn, Ya). The touch position shown in FIG. 4 is only a few alternative embodiments, and the present invention is not limited thereto.
請合併參照圖2和圖4。關於電阻式觸碰位置產生單元S_TU的配置方式,可以事先將換算好的等效電阻依阻抗大小由高至低排序好,以完成第一串聯電阻220以及第二串聯電阻230。假設X1’、X2’、X3’、X4’、X5’可以分別對應Xa、Xb、Xc、Xd、Xn,而Y1’、Y2’、Y3’、Y4’、Y5’可以分別對應Ya、Yb、Yc、Yd、Yn。當檢測裝置210欲進行觸控位置POS1的功能測試,由於實際座標值為(Xa,Yn),因此控制單元120需要將第一串聯電阻220的輸出端X1的線路導通,且將第二串聯電阻230的輸出端Y5的線路導通,從而提供模擬的座標值(X1’,Y5’)給待測單元UUT。如此一來,待測單元UUT就會執行關聯於座標值(X1’,Y5’)的功能並輸出測試結果TR,藉以致使控制單元120可以根據測試結果TR來判別待測單元UUT所執行的功能是試正常。Please refer to FIG. 2 and FIG. 4 together. Regarding the arrangement manner of the resistive touch position generating unit S_TU, the converted equivalent resistance can be sorted from high to low in order to complete the first series resistor 220 and the second series resistor 230. It is assumed that X1', X2', X3', X4', X5' may correspond to Xa, Xb, Xc, Xd, Xn, respectively, and Y1', Y2', Y3', Y4', Y5' may correspond to Ya, Yb, respectively. Yc, Yd, Yn. When the detecting device 210 is to perform the function test of the touch position POS1, since the actual coordinate value is (Xa, Yn), the control unit 120 needs to turn on the line of the output terminal X1 of the first series resistor 220, and the second series resistor is turned on. The line of output Y5 of 230 is turned on, thereby providing an analog coordinate value (X1', Y5') to the unit under test UUT. In this way, the unit under test UUT performs the function associated with the coordinate value (X1', Y5') and outputs the test result TR, so that the control unit 120 can determine the function performed by the unit UUT to be tested according to the test result TR. It is normal to try.
相似地,當檢測裝置210欲進行觸控位置POS5的功能測試,觸控位置POS5對應實際座標值(Xn,Ya)。控制單元120需要將第一串聯電阻220的輸出端X5的線路導通,且將第二串聯電阻230的輸出端Y1的線路導通,從而提供模擬的座標值(X5’,Y1’)給待測單元UUT。Similarly, when the detecting device 210 is to perform the function test of the touch position POS5, the touch position POS5 corresponds to the actual coordinate value (Xn, Ya). The control unit 120 needs to turn on the line of the output terminal X5 of the first series resistor 220, and turn on the line of the output terminal Y1 of the second series resistor 230, thereby providing the simulated coordinate value (X5', Y1') to the unit to be tested. UUT.
除此之外,圖5是依照本發明另一實施例之檢測系統的方塊圖。請參照圖5。檢測系統500包括檢測裝置510以及測待測單元UUT。於此實施例的檢測系統500中,檢測裝置510適用於檢測待測單元UUT,其中待測單元UUT可以是用於手機或PDA的電路板,但並不限制於此,而待測單元UUT(亦即待測電路板)根據電阻式觸碰位置來執行功能。檢測裝置510可以包括電阻式觸碰位置產生單元S_TU、切換介面530以及控制單元520。相似地,本實施例的電阻式觸碰位置產生單元S_TU不包括電阻式觸控面板,而是由多個電阻組成,主要是用來產生模擬電阻式觸控面板的觸碰位置資訊。切換介面530可以耦接至控制單元520與電阻式觸碰位置產生單元S_TU。切換介面530可以包括切換單元540(類似前述實施例的切換單元103A與130B)以及輸入輸出(I/O)單元550。In addition, FIG. 5 is a block diagram of a detection system in accordance with another embodiment of the present invention. Please refer to Figure 5. The detection system 500 includes a detection device 510 and a test unit UUT. In the detection system 500 of this embodiment, the detecting device 510 is adapted to detect the unit to be tested UUT, wherein the unit to be tested UUT may be a circuit board for a mobile phone or a PDA, but is not limited thereto, and the unit to be tested UUT ( That is, the board to be tested) performs functions according to the resistive touch position. The detecting device 510 may include a resistive touch position generating unit S_TU, a switching interface 530, and a control unit 520. Similarly, the resistive touch position generating unit S_TU of the embodiment does not include a resistive touch panel, but is composed of a plurality of resistors, and is mainly used to generate touch position information of the analog resistive touch panel. The switching interface 530 can be coupled to the control unit 520 and the resistive touch position generating unit S_TU. The switching interface 530 may include a switching unit 540 (similar to the switching units 103A and 130B of the foregoing embodiment) and an input/output (I/O) unit 550.
切換單元540可以耦接至控制單元120與電阻式觸碰位置產生單元S_TU,而輸入輸出單元550則可以耦接至控制單元520與待測單元UUT。控制單元120可以控制切換單元540、輸入輸出單元550與待測單元UUT的運作,並且選擇性地通過切換單元540控制觸碰位置資訊的座標值(X’,Y’),以使座標值(X’,Y’)輸出至待測單元UUT。如此一來,待測單元UUT即可執行關聯於座標值(X’,Y’)的功能並輸出測試結果TR,藉以致使控制單元520可以根據測試結果TR來判別待測單元UUT所執行的功能是否正常。如此亦可達成與上述實施例相類似的功效。The switching unit 540 can be coupled to the control unit 120 and the resistive touch position generating unit S_TU, and the input and output unit 550 can be coupled to the control unit 520 and the unit to be tested UUT. The control unit 120 can control the operation of the switching unit 540, the input and output unit 550, and the unit to be tested UUT, and selectively control the coordinate value (X', Y') of the touch position information through the switching unit 540 to make the coordinate value ( X', Y') is output to the unit UUT to be tested. In this way, the unit under test UUT can perform the function associated with the coordinate value (X', Y') and output the test result TR, thereby causing the control unit 520 to determine the function performed by the unit UUT to be tested according to the test result TR. Is it normal? This also achieves similar effects to the above embodiments.
然而,本實施例與前述各實施例的相異之處係在於:控制單元520還可控制切換單元540中的部份開關(例如繼電器)以提供待測單元UUT運作時所需的操作電壓。另外,控制單元520還可以直接通過輸入輸出單元550傳送命令至待測單元UUT,藉以進行非關聯於觸控位置的功能測試或是其他控制運作,而且控制單元520與待測單元UUT可以通過此輸入輸出單元550進行雙向資料傳送。However, this embodiment is different from the foregoing embodiments in that the control unit 520 can also control a part of the switches (for example, relays) in the switching unit 540 to provide an operating voltage required for the operation of the unit UUT to be tested. In addition, the control unit 520 can also directly transmit a command to the unit under test UUT through the input and output unit 550, thereby performing a function test or other control operation not related to the touch position, and the control unit 520 and the unit to be tested UUT can pass the The input and output unit 550 performs bidirectional data transfer.
綜上所述,本發明的檢測裝置與檢測系統主要是提供電阻式觸碰位置資訊,以供待測單元(待測電路板)進行測試。如此一來,在測試待測單元前可以不需安裝實體的電阻式觸碰面板,而測試時也不需人為的按壓,更不需複雜的測試機構,所以可以節省測試成本,並且提高待測單元的測試速度與測試準確性。In summary, the detecting device and the detecting system of the present invention mainly provide resistive touch position information for testing by the unit to be tested (the circuit board to be tested). In this way, the physical resistive touch panel can be installed before testing the unit to be tested, and no artificial pressing is required during the test, and no complicated testing mechanism is needed, so the test cost can be saved and the test is improved. Unit test speed and test accuracy.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and those skilled in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
100...檢測系統100. . . Detection Systems
110...檢測裝置110. . . Testing device
120...控制單元120. . . control unit
130、130A、130B...切換單元130, 130A, 130B. . . Switching unit
200...檢測系統200. . . Detection Systems
210...檢測裝置210. . . Testing device
220...第一串聯電阻220. . . First series resistance
230...第二串聯電阻230. . . Second series resistance
310...觸控區域310. . . Touch area
320...上電極板320. . . Upper electrode plate
330...下電極板330. . . Lower electrode plate
500...檢測系統500. . . Detection Systems
510...檢測裝置510. . . Testing device
520...控制單元520. . . control unit
530...切換介面530. . . Switching interface
540...切換單元540. . . Switching unit
550...輸入輸出單元550. . . Input and output unit
I1、I2...電流I1, I2. . . Current
POS1~POS5...觸控位置POS1 ~ POS5. . . Touch position
RXA、RXB、RYA、RYB...電阻RXA, RXB, RYA, RYB. . . resistance
S_TU...電阻式觸碰位置產生單元S_TU. . . Resistive touch position generating unit
TR...測試結果TR. . . Test Results
UUT...待測單元UUT. . . Unit to be tested
VCC...工作電壓VCC. . . Operating Voltage
V1、V2...電壓V1, V2. . . Voltage
X、Y...軸X, Y. . . axis
XL、XR...第一對軸向端XL, XR. . . First pair of axial ends
X1~X5...第一輸出端X1~X5. . . First output
YU、YD...第二對軸向端YU, YD. . . Second pair of axial ends
Y1~Y5...第二輸出端Y1~Y5. . . Second output
(Xa,Yn)、(Xa,Ya)、(Xc,Yc)、(Xn,Yn)、(Xn,Ya)...實際座標值(Xa, Yn), (Xa, Ya), (Xc, Yc), (Xn, Yn), (Xn, Ya). . . Actual coordinate value
(X’,Y’)...座標值(X’, Y’). . . Coordinate value
圖1是依照本發明一實施例之檢測系統的方塊圖。1 is a block diagram of a detection system in accordance with an embodiment of the present invention.
圖2是依照本發明另一實施例之檢測系統的方塊圖。2 is a block diagram of a detection system in accordance with another embodiment of the present invention.
圖3A是根據本發明實施例,說明觸控區域310的上電極板與下電極板的示意圖。FIG. 3A is a schematic diagram illustrating an upper electrode plate and a lower electrode plate of the touch region 310 according to an embodiment of the invention.
圖3B說明觸碰區域310在X軸方向的等效電阻換算示意圖。FIG. 3B illustrates a schematic diagram of equivalent resistance conversion of the touch region 310 in the X-axis direction.
圖3C說明觸碰區域310在Y軸方向的等效電阻換算示意圖。FIG. 3C illustrates a schematic diagram of equivalent resistance conversion of the touch region 310 in the Y-axis direction.
圖4是根據本發明實施例,說明實際觸控位置的座標圖。4 is a graph showing the actual touch position according to an embodiment of the present invention.
圖5是依照本發明另一實施例之檢測系統的方塊圖。Figure 5 is a block diagram of a detection system in accordance with another embodiment of the present invention.
100...檢測系統100. . . Detection Systems
110...檢測裝置110. . . Testing device
120...控制單元120. . . control unit
130...切換單元130. . . Switching unit
S_TU...電阻式觸碰位置產生單元S_TU. . . Resistive touch position generating unit
TR...測試結果TR. . . Test Results
UUT...待測單元UUT. . . Unit to be tested
(X’,Y’)...座標值(X’, Y’). . . Coordinate value
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TW200504566A (en) * | 2003-01-17 | 2005-02-01 | 3M Innovative Properties Co | Touch simulation system and method |
US20070091077A1 (en) * | 2005-10-25 | 2007-04-26 | Jia-Yih Lii | Method for gesture detection on a capacitive touchpad |
US7499039B2 (en) * | 2005-01-10 | 2009-03-03 | 3M Innovative Properties Company | Iterative method for determining touch location |
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TW200504566A (en) * | 2003-01-17 | 2005-02-01 | 3M Innovative Properties Co | Touch simulation system and method |
US7499039B2 (en) * | 2005-01-10 | 2009-03-03 | 3M Innovative Properties Company | Iterative method for determining touch location |
US20070091077A1 (en) * | 2005-10-25 | 2007-04-26 | Jia-Yih Lii | Method for gesture detection on a capacitive touchpad |
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