TWI422836B - Lighting source detection machine and detection method - Google Patents

Description

Illumination source detection machine and detection method

The invention relates to a detection of stroboscopic and stroboscopic effects for an illumination source, in particular to an illumination source detection machine and detection method

With the evolution of science and technology, the use of LED as a lighting device continues to evolve, and the performance of the product is continuously improved. However, due to the instability of the power supply, the luminous intensity of the light source changes with time, the circuit design and the lighting device design are unreasonable factors, making the LED The emitted light produces a periodic and non-periodic flashing of the intensity of the illumination; and such flicker, once in the range of frequencies perceptible to human vision, causes discomfort, fatigue, and even the flickering of the source, such as a rotating object. The speed of rotation causes misjudgment, which leads to accidents and injuries. Therefore, when the fluctuation of the light source intensity is greater, the strobo is stronger, and the frequency of the flicker falls within the visual sensitivity range, the stroboscopic effect generated in the field of human vision is more serious.

By statistical method, the sensory characteristics of the human eye to the stroboscopic light source are measured as shown in Fig. 1. The human sensitivity is defined as 1 in the case of the highest light scintillation frequency, and the frequency is changed with frequency. The relative sensitivity is marked one by one in the figure to obtain a visual sensitivity coefficient curve. It can be seen from Fig. 1. When the flicker frequency is 0.5 Hz, the human eye has gradually reacted to the flicker of the light source. When the flicker frequency is 10 Hz, it is the most sensitive frequency of the human eye to the flicker response of the light source. However, when the flicker frequency is at At 40 Hz or more, the sensitivity of the sensation gradually decreases. Usually, the flicker is more than one hundred times per second, which is harder for humans to detect. As for the frequency change of thousands of times per second, the range of feelings beyond the human eye is very large. Therefore, there is almost no impact on human vision. In the current manufacturing process of LED lighting source, in order to avoid the user's discomfort in the future, stroboscopic detection is necessary.

The conventional detection method is to first enable the LED to be tested to emit light, and to provide an optical detecting gyro having a plurality of black and white phase auras in the LED light emitting direction, and to rotate the optical detecting gyro to view the surface pattern change. During the rotation process, the light emitted by the LED to be tested is a stable halo pattern and color phenomenon as shown in FIG. 2, which indicates that the current LED to be tested is in the human visual sensitivity range, and there is no obvious stroboscopic problem, nor is it caused. A strong stroboscopic effect is formed; conversely, if a plurality of patterns of different colors as shown in FIG. 3 are observed from the surface of the gyro, and each of the auras exhibits a rotation direction and a rotation speed as the rotation speed of the gyro is changed And the rich change of color means that the LED to be tested has a stroboscopic problem in the visual sensitivity range visible to human beings, and should be judged as a defective product and not suitable as an illumination source.

However, such a detection method requires a human eye to judge the pattern change of the optical detection gyro, and cannot achieve an automatic detection operation, and can not effectively improve the detection efficiency, and is less likely to perform batch detection operations; and it is judged by the human eye. It is easy to make mistakes and is not accurate, which leads to a relatively high chance of omissions during detection. Therefore, how to convert the LED stroboscopic detection into an automatic method, and convert the light emitted by each LED to be tested into data data, which is automatically judged and detected by the computer, so that the detection operation is more precise, avoiding the omission of detection; even further Batch operations and increased output efficiency during testing will be the focus of this case.

It is an object of the present invention to provide an illumination source detection apparatus for a wide-area dynamic light detecting device such as a solar cell, thereby performing an automated stroboscopic detection operation of an illumination source.

Another object of the present invention is to provide an optical signal generated by receiving a light source by a wide-area dynamic light detecting device, and converted into an electrical signal operation to obtain a main blinking frequency of the light source, thereby detecting the stroboscopic effect of the illumination source. Machine.

Still another object of the present invention is to provide an illumination source detecting method for automatically detecting a stroboscopic situation of an illumination source.

Another object of the present invention is to provide an illumination source detecting method capable of detecting a stroboscopic situation of an illumination source and determining a stroboscopic effect according to a stroboscopic condition.

An illumination light source detecting method according to the present invention is configured to detect, by a detecting machine, a lighting condition of at least one light source to be tested, the detecting machine comprising a base for placing and enabling the light source to be tested; a domain dynamic light detecting device; and a processing device; the method comprising the following steps:

a) enabling the illumination of at least one of the illumination sources to be tested;

b) detecting, by the wide-area dynamic light detecting device, the illuminating condition of the at least one illumination source to be tested, and converting the signal to the electrical signal timing output to the processing device;

c) extracting the frequency data in the foregoing timing signal, and filtering out a component of the frequency data that meets the predetermined deletion range to obtain a valid signal after filtering out the deletion range component;

d) determining whether the illumination condition of the at least one illumination source to be tested is qualified according to the valid signal.

An illumination light source detecting machine according to the present invention is configured to detect a lighting condition of an illumination source to be tested, comprising: a base for placing and enabling the illumination source to be tested; and detecting a lighting condition of the illumination source to be tested, And a wide-area dynamic light detecting device that is instantaneously converted into an electrical signal and output according to the time series; and a receiving one of the frequency signals from the wide-area dynamic light detecting device, extracting the frequency information in the timing according to the timing, and one of the frequency data The processing device that filters out the component that meets the predetermined deletion range and obtains the effective signal after the signal measured by the wide-area dynamic light detecting device filters out the deletion range component.

The illumination source detecting machine and the detecting method disclosed in the present invention receive the optical signal generated by the illumination source after being received by the solar cell disposed in the wide-area dynamic light detecting device, and then convert the optical signal into an electrical signal, thereby The illumination of the illumination source to be tested can be automatically detected and transmitted to the processing device to perform Fourier transform on the electrical signal data, and then the inverse Fourier transform is performed after the noise is eliminated, thereby obtaining the range of the effective signal, thereby calculating, for example, the maximum effective signal. The ratio of the luminous intensity to the minimum luminous intensity, and/or the ratio of the average luminous intensity of the effective signal to the total luminous intensity. Thereby, the stroboscopic situation of each illumination source can be accurately determined, and the main flicker frequency of the stroboscopic light is analyzed, thereby determining the influence degree of the stroboscopic effect. Therefore, by using the illumination source detection machine and the detection method of the present invention, the automatic detection operation can be achieved, the detection efficiency can be effectively improved, and the more accurate detection operation can be achieved, and the omission of the detection can be reduced, thereby achieving the above items.

The foregoing and other objects, features, and advantages of the invention are set forth in the <RTIgt;

The preferred embodiment of the illumination source detecting machine of the present invention, as shown in FIG. 4, FIG. 5 and FIG. 6, mainly includes a base 41, a wide-area dynamic light detecting device 42, a processing device 43, an enabling conveyor 44, and a sorting device. 45. The wide-area dynamic light detecting device 42 includes a plurality of solar cells 421, and the enabling conveyor 44 is disposed on the base 41 and includes a feeding arm 441 and a conveying belt 443, and the sorting device 45 further includes There is a sorting arm 451 through which the loading arm 441 and the sorting arm 451 can be used for loading and unloading operations, wherein the illumination source to be tested can be an LED, a cold cathode tube or other light-emitting elements. As shown in FIG. 7, initially, as shown in step 701, the illumination source to be tested is captured and transferred by the loading arm 441 and placed on the conveyor belt 443. The illumination source to be tested in this example is an example. The LED 51 to be tested is conveyed by the conveyor belt 443 to the detection position shown in FIG. 8 on the base 41.

Next, as step 702, as shown in FIG. 9, the power supply is enabled to the LED 51 to be tested at the detection position to be electrically illuminated, and then, as in step 703, received by the solar cell 421 of the wide-area dynamic light detecting device 42. The illuminating condition of the LED 51 to be tested is immediately converted into an electrical signal, and then output to the processing device 43 according to the timing. Next, as shown in step 704, the processing device 43 extracts the electrical signal through a data acquisition card at a high speed. According to the frequency data of the time series, the extracted frequency data is converted into a curve as shown in FIG. 10, and then, as in step 705, the frequency data is subjected to a Fourier transform process by the processing device 43, and the Fourier transform signal as shown in FIG. 11 is extracted. Curve 11, in this example, the noise filtering above two kilohertz is required first, so a frequency demarcation function 12 can be additionally defined for the predetermined deletion of more than two kilohertz as the frequency signal is selected. The dividing line in the high frequency range filters out unwanted components of the currently measured signal and retains the remaining components below two kilohertz.

Therefore, the frequency boundary function 12 is multiplied by the original Fourier transform signal curve 11, that is, the signal curve 13 as shown in FIG. 12 is formed, and then, as step 706, the data obtained by the multiplication calculation is performed again. By inverse Fourier transform, a component of the high frequency range in which the scintillation frequency is higher than the two kilohertz region as shown in Fig. 13 is obtained, and an effective signal curve 104 of the main flicker frequency is defined.

In another step 707, the ratio of the average luminous intensity of the effective signal to the total luminous intensity is calculated. When the waveform of the LED 51 to be measured has a stroboscopic phenomenon and the waveform is as shown in FIG. The highest brightness A and the lowest brightness B of the measured waveform are calculated by the formula: 100×(AB)/(A+B), and the stroboscopic ratio generated by the currently detected LED 51 to be tested can be obtained; Calculate the stroboscopic ratio, and calculate the ratio of the maximum luminous intensity to the minimum luminous intensity of the effective signal. Calculate the highest luminance area C and the lowest luminance area D by the formula: 100×(C/C+D). The data of the intensity ratio generated by the LED 51 to be tested is detected, and the data of each LED 51 to be tested is separately stored in the memory.

Finally, as shown in step 708, referring to FIG. 6 and FIG. 15, the processing device 43 drives the sorting arm 451 of the sorting device 45 according to the different stroboscopic lighting conditions corresponding to the detected LEDs 52 that have been detected. The illumination status of the LED 52 is measured and transferred to the corresponding sorting material, and the detection operation is completed after the transfer is completed, and the detection operation of the next group of LEDs to be tested is continued.

The illumination source detecting machine and the detecting method disclosed in the present invention receive the optical signal generated by the LED after being received by the solar cell, and then converted into the electrical signal data receivable by the processing device, so that the stroboscopic condition of the illumination source can be Automated detection, and the processing device processes the signal for the telecommunication data, for example, Fourier transform, so that the noise in the received telecommunication data is eliminated, and then the signal after the noise is removed and then inverse Fourier transform is performed. The range of valid signals can be obtained to further analyze the frequency of the main strobe, and then calculate, for example, the ratio of the maximum illuminance to the minimum illuminance of the effective signal, and/or calculate the average illuminance of the effective signal. The ratio of luminous intensity is determined by computer automatic detection to determine the intensity of the stroboscopic effect of each illumination source, so that the overall inspection process can be fully automated, and the detection speed can be effectively improved, especially when batch detection is required. More obvious rise and more accurate inspection Measure efficiency, thereby reducing the occurrence of omissions during testing, achieving all of the above objectives.

However, the above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited thereto, that is, the simple equivalent changes and modifications according to the scope of the present invention and the description of the invention are still It is within the scope of the patent of the present invention.

11, 13, 104. . . Signal curve

12. . . Frequency demarcation function

41. . . Pedestal

42. . . Wide-area dynamic light detecting device

421. . . Solar battery

43. . . Processing device

44. . . Enable conveyor

441. . . Feed arm

443. . . conveyor

45. . . Sorting device

451. . . Classification arm

51. . . LED to be tested

52. . . Measured LED

Figure 1 is a graph showing the sensation characteristics of the human eye to the stroboscopic light source;

2 is a schematic diagram of optically detecting a stroboscopic light source stroboscopic display and displaying a stable halo pattern and a color phenomenon, which illustrates that the currently detected source strobe is in a normal range;

3 is a schematic diagram of a conventional method for detecting a stroboscopic light source stroboscopic light and displaying a plurality of patterns with different colors, which indicates that the currently detected source strobe is in an abnormal range;

Figure 4 is a plan view of the illumination source detecting machine of the present invention;

Figure 5 is a side view of the illumination source detecting machine of Figure 4;

Figure 6 is a block diagram of the illumination source detecting machine of Figure 4;

Figure 7 is a flow chart of detecting the illumination source detecting machine of the present invention;

Figure 8 is a plan view showing the conveyor belt of the illumination source detecting machine of Figure 4 transferring the LED to be tested to the detecting position;

9 is a side view of the illumination source of the illumination source detecting device of FIG. 8 to the LED to be tested at the detection position, which is electrically illuminated, and receives the illumination condition from the LED to be tested by the solar power;

10 is a signal diagram of the processing device of the illumination source detecting machine of FIG. 9 extracting the electrical signal from the frequency data according to the time series distribution;

Figure 11 is a signal diagram of the frequency data of Figure 10 subjected to Fourier transform, and additionally defining a frequency demarcation function;

12 is a signal diagram of data data obtained by multiplying the frequency boundary function of FIG. 11 by an original Fourier transform signal curve;

FIG. 13 is a signal diagram of the data of FIG. 12 subjected to Fourier inverse conversion to obtain valid signal data; FIG.

Figure 14 is a signal diagram of the signal data of the waveform measured by the amount of Figure 12 having a stroboscopic phenomenon; and

Fig. 15 is a plan view showing that the processing device of the illumination source detecting device of Fig. 9 drives the sorting arm to be respectively transferred to the corresponding sorting stock according to the lighting state of the LED.

41. . . Pedestal

42. . . Wide-area dynamic light detecting device

421. . . Solar battery

44. . . Enable conveyor

441. . . Feed arm

443. . . conveyor

45. . . Sorting device

451. . . Classification arm

51. . . LED to be tested

Claims (10)

An illumination source detecting method for detecting a lighting condition of at least one illumination source to be tested by a detecting machine, wherein the detecting machine comprises a base for placing and enabling the illumination source to be tested; and a wide-area dynamic light detecting device And a processing device; the method comprising the steps of: a) enabling the at least one illumination source to be tested to emit light; b) detecting the illumination state of the at least one illumination source to be tested by the wide-area dynamic light detecting device, and converting immediately Outputting to the processing device for the timing of the electrical signal; c) performing a time domain frequency domain conversion on the aforementioned timing signal to obtain a frequency data, and filtering out a component of the frequency data that meets the predetermined deletion range to obtain a filter The valid signal after the deletion of the range component; and d) determining whether the illumination state of the at least one illumination source to be tested is qualified according to the valid signal. The detection method of claim 1, wherein the deletion range includes an area in which the blinking frequency of the light-emitting state is higher than two kilohertz. The detection method of claim 1 or 2, wherein the step c) further comprises performing the time domain frequency domain conversion in a sub-step c1) of the Fourier transform; and after the time domain frequency domain conversion is completed, at the frequency In the data, the sub-step c2) of the above-mentioned components meeting the predetermined deletion range is deleted. The detection method of claim 3, wherein the step c) further comprises a sub-step c3) of obtaining a valid signal after filtering the deletion range component by Fourier inverse conversion. The detection method of claim 4 of the patent scope further includes a sub-step c4) of defining a main flicker frequency from the above-mentioned effective signals. For example, the detection method of claim 4 of the patent scope further includes calculating the maximum illumination by the above effective signal. The ratio of the intensity to the minimum luminous intensity; and/or the sub-step c5) of the ratio of the average luminous intensity to the total luminous intensity. An illumination light source detecting machine for detecting a lighting condition of an illumination source to be tested, comprising: a base for placing and enabling the illumination source to be tested; and detecting a lighting condition of the illumination source to be tested, and immediately converting into a telecommunication And a wide-area dynamic light detecting device according to the time series output; and receiving a signal from the wide-area dynamic light detecting device, performing a time domain frequency domain conversion on the time-dependent electrical signal to obtain a frequency data, and obtaining the frequency data A processing device that filters out the component that meets the predetermined deletion range and obtains a valid signal after the signal measured by the wide-area dynamic light detecting device filters out the deletion range component. The illumination source detecting machine of claim 7, wherein the wide-area dynamic detecting device comprises at least one solar cell. An illumination source detecting machine according to claim 7 or 8, wherein said base comprises a set of enabling conveyors disposed thereon. The illumination source detecting machine of claim 7 or 8 further comprises a group of sorting devices driven by the processing device.