TWI421480B - Stress measurement probe - Google Patents
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本發明是有關於一種應力量測探頭，特別是有關於一種可提高靈敏度的應力量測探頭。The present invention relates to a stress measuring probe, and more particularly to a stress measuring probe capable of improving sensitivity.
習知之應變規技術係將一應變規貼附於一待測物的表面來量測待測物的應變量。然而，此種習知技術需要待測物具有光滑的表面，才能準確地量測出待測物的應變量。另一方面，此種習知技術的準確度容易受到溫度、水氣和潤滑油的影響。The conventional strain gauge technique attaches a strain gauge to the surface of a test object to measure the strain of the test object. However, such a conventional technique requires the object to be tested to have a smooth surface to accurately measure the amount of strain of the object to be tested. On the other hand, the accuracy of such prior art is susceptible to temperature, moisture and lubricating oil.
習知之非破壞性殘留應力量測技術係根據磁伸縮原理。磁滯曲線(B-H curve；磁化-磁場曲線)代表鐵磁性材質在磁場中磁化的特性，其中B為磁通密度或稱為磁感(高斯gauss)，H為磁場(奧斯特oersted)。當鐵磁性材料受到拉伸時，磁滯曲線會逆時針旋轉；當鐵磁性材料受到壓縮時，磁滯曲線會順時針旋轉。藉由量測鐵磁性材料的磁性狀態，便可反推出其所受之應力的變化。然而，由於鐵磁性材料的磁性狀態的變異量太小，直接量測磁滯曲線的變化以反應受力大小的靈敏度有限。The conventional non-destructive residual stress measurement technique is based on the principle of magnetic expansion. The hysteresis curve (B-H curve) represents the magnetic properties of a ferromagnetic material in a magnetic field, where B is the magnetic flux density or magnetic susceptibility (Gauss gauss) and H is the magnetic field (Oersted oersted). When the ferromagnetic material is stretched, the hysteresis curve rotates counterclockwise; when the ferromagnetic material is compressed, the hysteresis curve rotates clockwise. By measuring the magnetic state of the ferromagnetic material, it is possible to reverse the change in the stress it receives. However, since the variation of the magnetic state of the ferromagnetic material is too small, the sensitivity of directly measuring the change of the hysteresis curve to reflect the magnitude of the force is limited.
另一種習知應力量測技術係使用根據磁異方性原理之應力量測探頭，此種習知技術具有不受環境影響、非接觸式等優點。Another conventional stress measurement technique uses a stress measurement probe based on the principle of magnetic anisotropy, which has the advantages of being unaffected by the environment, non-contact, and the like.
以磁異方性探頭做為應力量測的基礎近幾年逐漸被國外採用，如文獻2(“Non-destructive Method of Stress Evaluation in Linepipes Using Magnetic Anisotropy Sensor,”JFE Technical Report,No.3,July 2004,pp. 47~53)；文獻3(“New Technologies on Steel Structures for Social Infrastructures,”NKK技報,No.179,2002,pp.104~113(In Japanese))。因為磁異方性探頭較應變規更具備惡劣環境的抵抗性，在日本即被應用於管材的應力檢測(請參見文獻2)。此外，磁異方性探頭也可應用於建物的結構診斷(請參見文獻2和文獻3)，因此，無論做為常駐型或可攜式的設備，磁異方性探頭均相當具有吸引力。The use of magnetic anisotropy probes as the basis for stress measurement has been gradually adopted abroad in recent years, such as Document 2 ("Non-destructive Method of Stress Evaluation in Linepipes Using Magnetic Anisotropy Sensor," JFE Technical Report, No. 3, July 2004, pp. 47~53); Document 3 ("New Technologies on Steel Structures for Social Infrastructures," NKK Technical Report, No. 179, 2002, pp. 104-113 (In Japanese)). Because the magnetic anisotropy probe is more resistant to harsh environments than the strain gauge, it is applied to the stress detection of pipes in Japan (see Document 2). In addition, magnetic anisotropy probes can also be used for structural diagnostics of buildings (see references 2 and 3), so magnetic anisotropy probes are quite attractive, whether they are resident or portable.
以下簡介習知根據磁異方性原理之應力量測探頭的結構與工作原理。The following is a brief introduction to the structure and working principle of a stress measurement probe based on the principle of magnetic anisotropy.
美國專利前案第3,798,537號提出一量測鐵磁性材料應力之結構，其結構係類似於如第1圖所示之結構，請參照第1圖，其繪示根據磁異方性原理之習知之應力量測探頭的結構示意圖。此習知應力量測探頭具有二個驅動線圈24和28、二個感應線圈22和26、和四支鐵心12、14、16、18，其中驅動線圈24繞設在鐵心14上並具有順時針電流方向；驅動線圈28繞設在鐵心18上並具有逆時針電流方向；感應線圈22繞設在鐵心12上；感應線圈26繞設在鐵心16上。U.S. Patent No. 3,798,537 discloses a structure for measuring the stress of a ferromagnetic material, the structure of which is similar to that shown in Fig. 1. Referring to Fig. 1, it is known from the principle of magnetic anisotropy. The structure of the probe should be measured by force. The conventional stress measuring probe has two driving coils 24 and 28, two induction coils 22 and 26, and four cores 12, 14, 16, 18, wherein the driving coil 24 is wound around the core 14 and has a clockwise direction The current direction; the driving coil 28 is wound around the core 18 and has a counterclockwise current direction; the induction coil 22 is wound around the core 12; and the induction coil 26 is wound around the core 16.
請參照第2A圖至第2C圖，其繪示第1圖之習知應力量測探頭的工作原理，其中第2A圖係繪示當待測物未受力時的狀況；第2B圖係繪示當待測物受到X方向力時的狀況；而第2C圖係繪示當待測物受到Y方向力時的狀況。由於電流方向不同，兩驅動線圈24和28產生方向相反的磁場，感應線圈22和26所感應到的磁場為兩驅動線圈24和28貢獻的總和。如第2A圖所示，當外力為零時，感應線圈22和26的磁場總合為零。如第2B圖和第2C圖所示，當待測物受到X方向力或Y方向力時，兩感應線圈22和26所感應到的磁場大小相等且方向相反。當兩感應線圈22和26串聯在一起時，其所輸出(感應)電壓的便會增為單一感應線圈的兩倍，即靈敏度增為2倍。當將習知應力量測探頭置於一拉伸試驗平台以進行量測一鋼帶，可發現感應電壓會隨著應力增加而變小。Please refer to FIG. 2A to FIG. 2C , which illustrate the working principle of the conventional stress measuring probe of FIG. 1 , wherein FIG. 2A shows the condition when the object to be tested is not stressed; FIG. 2B depicts The condition when the object to be tested is subjected to the X-direction force; and the 2C figure shows the condition when the object to be tested is subjected to the Y-direction force. Due to the different current directions, the two drive coils 24 and 28 produce magnetic fields of opposite directions, and the magnetic fields induced by the induction coils 22 and 26 contribute to the sum of the contributions of the two drive coils 24 and 28. As shown in Fig. 2A, when the external force is zero, the magnetic fields of the induction coils 22 and 26 are summed to zero. As shown in FIGS. 2B and 2C, when the object to be tested is subjected to the X-direction force or the Y-direction force, the magnetic fields induced by the two induction coils 22 and 26 are equal in magnitude and opposite in direction. When the two induction coils 22 and 26 are connected in series, the output (inductive) voltage is increased to twice that of the single induction coil, that is, the sensitivity is increased by a factor of two. When a conventional stress measurement probe is placed on a tensile test platform to measure a steel strip, it is found that the induced voltage becomes smaller as the stress increases.
然而，隨著習知之應力量測探頭已無法滿足高靈敏度應用的需求。例如：長時間處於應力集中的狀態下之工廠設備，發生故障的機率較一般其他設備來得較高，一個處理不當即有可能發生意外傷害或事故。為了解決此問題，除了定期此類機械結構進行檢驗之外，如何提高應力量測探頭之靈敏度亦成為一不可或缺之需求。However, with the conventional stress measurement probes, the demand for high sensitivity applications has not been met. For example, factory equipment that is under stress for a long time has a higher probability of failure than other equipment, and accidental injury or accident may occur if it is not handled properly. In order to solve this problem, in addition to regular inspection of such mechanical structures, how to improve the sensitivity of the stress measurement probe has become an indispensable requirement.
因此，需要提供一種改良的應力量測探頭，以有效地提高量測的靈敏度。Therefore, there is a need to provide an improved stress measurement probe to effectively increase the sensitivity of the measurement.
本發明之一目的就是在提供一種改良的應力量測探頭，藉以提高量測的靈敏度。It is an object of the present invention to provide an improved stress measurement probe for improved sensitivity of measurement.
依據本發明之一實施例，提供一種應力量測探頭，其包含四個感應線圈，分別設置於一正方形的四個角落上且四個感應線圈係串聯在一起，其中通入此些感應線圈的電流具有第一電流方向。二個第一驅動線圈分別設置於前述之正方形的第一側邊的中點和第二側邊的中點上，其中第一側邊係平行於第二側邊，而通入此些第一驅動線圈的電流具有第一電流方向。二個第二驅動線圈分別設置於前述之正方形的第三側邊的中點和第四側邊的中點上，其中第三側邊係平行於第四側邊，而通入此些第二驅動線圈的電流具有第二電流方向，第一電流方向係與第二電流方向相反。此些感應線圈、第一驅動線圈和第二驅動線圈係以一對一的方式分別繞設在鐵心上。According to an embodiment of the present invention, there is provided a stress measuring probe comprising four induction coils respectively disposed on four corners of a square and four induction coils connected in series, wherein the induction coils are connected The current has a first current direction. The two first driving coils are respectively disposed at a midpoint of the first side of the square and a midpoint of the second side, wherein the first side is parallel to the second side, and the first The current driving the coil has a first current direction. Two second driving coils are respectively disposed at a midpoint of the third side of the square and a midpoint of the fourth side, wherein the third side is parallel to the fourth side, and the second side is passed The current of the drive coil has a second current direction that is opposite to the second current direction. The induction coils, the first drive coils and the second drive coils are respectively wound around the core in a one-to-one manner.
本發明之優點為可增加習知應力量測探頭的量測靈敏度。An advantage of the present invention is that the measurement sensitivity of the conventional stress measurement probe can be increased.
以下詳細討論本發明之實施例的製作與使用。然而，應該理解的是，這些實施例提供許多可應用的創新概念，其可在各種特定背景中加以體現。所討論之特定的實施例僅係用以舉例說明，並非用以限制本發明之範圍。The making and using of the embodiments of the present invention are discussed in detail below. However, it should be understood that these embodiments provide many applicable innovative concepts that can be embodied in various specific contexts. The specific embodiments discussed are merely illustrative and are not intended to limit the scope of the invention.
請參照第3A圖及第3B圖，第3A圖係繪示依據本發明之一實施例之應力量測探頭之結構示意圖，而第3B圖係繪示依據本發明之一實施例之應力量測探頭之俯視圖。此應力量測探頭包含四個串聯在一起的感應線圈210、230、250和270；二個第一驅動線圈220和260；二個第二驅動線圈240和280；及八個鐵心110、120、130、140、150、160、170和180。感應線圈210、230、250和270分別設置於一正方形(未標示)的四個角落上。二個第一驅動線圈220、260分別設於此正方形相互平行之第一側邊和第二側邊的中點上，即第一驅動線圈220和260係設置於相對的位置。二個第二驅動線圈240和280分別設置於此正方形相互平行之第三側邊和第四側邊的中點上，即第二驅動線圈240和第二驅動線圈280係設置於相對的位置。此些感應線圈210、230、250和270、第一驅動線圈220和260和第二驅動線圈240和280係以一對一的方式分別繞設在鐵心110、120、130、140、150、160、170和180上。在一實施例中，此應力量測探頭更包含一底座300，此些鐵心係由底座300延伸出，每一個鐵心110、120、130、140、150、160、170和180包含鐵磁性材料，而鐵磁性材料可包含鐵粉心和塊狀鑄鐵。Please refer to FIG. 3A and FIG. 3B . FIG. 3A is a schematic structural view of a stress measuring probe according to an embodiment of the present invention, and FIG. 3B is a diagram showing stress measurement according to an embodiment of the present invention. Top view of the probe. The stress measuring probe comprises four induction coils 210, 230, 250 and 270 connected in series; two first driving coils 220 and 260; two second driving coils 240 and 280; and eight cores 110, 120, 130, 140, 150, 160, 170, and 180. The induction coils 210, 230, 250, and 270 are respectively disposed on four corners of a square (not shown). The two first driving coils 220, 260 are respectively disposed at the midpoints of the first side and the second side of the square parallel to each other, that is, the first driving coils 220 and 260 are disposed at opposite positions. The two second driving coils 240 and 280 are respectively disposed at the midpoints of the third side and the fourth side of the square which are parallel to each other, that is, the second driving coil 240 and the second driving coil 280 are disposed at opposite positions. The induction coils 210, 230, 250 and 270, the first drive coils 220 and 260 and the second drive coils 240 and 280 are respectively wound around the cores 110, 120, 130, 140, 150, 160 in a one-to-one manner. , 170 and 180. In one embodiment, the stress measurement probe further includes a base 300 extending from the base 300, and each of the cores 110, 120, 130, 140, 150, 160, 170, and 180 includes a ferromagnetic material. Ferromagnetic materials may include iron powder core and massive cast iron.
請參照第4圖，其繪示依據本發明之一實施例之應力量測探頭之感應線圈和驅動線圈的電流方向示意圖。通入二個第一驅動線圈220和260的電流具有第一電流方向，而通入第二驅動線圈240和280的電流具有第二電流方向，其中此第一電流方向與第二電流方向係相反。如第4圖所示，此第一電流方向為逆時針方向，而第二電流方向為順時針方向。然而，在另一實施例中，第一電流方向亦可為順時針方向，而第二電流方向亦可為逆時針方向。Referring to FIG. 4, a schematic diagram of current directions of an induction coil and a drive coil of a stress measurement probe according to an embodiment of the present invention is shown. The current flowing into the two first drive coils 220 and 260 has a first current direction, and the current flowing into the second drive coils 240 and 280 has a second current direction, wherein the first current direction is opposite to the second current direction . As shown in FIG. 4, the first current direction is a counterclockwise direction, and the second current direction is a clockwise direction. However, in another embodiment, the first current direction may also be a clockwise direction, and the second current direction may also be a counterclockwise direction.
如第3A圖、第3B圖和第4圖所示，本實施例之應力量測探頭的整個磁路有如四個E形核心(E-Core)圍繞成一正方體。由於此結構中兩磁通方向相反的驅動線圈共用一個感應線圈，因此感應線圈的電壓輸出正比於磁通量的淨值。As shown in FIG. 3A, FIG. 3B and FIG. 4, the entire magnetic circuit of the stress measuring probe of the present embodiment has four E-Cores surrounding a square. Since the driving coils with opposite magnetic flux directions share an induction coil in this structure, the voltage output of the induction coil is proportional to the net value of the magnetic flux.
請參照第5A圖至第5C圖，其繪示根據本發明之一實施例之應力量測探頭之工作原理，其中第一電流方向為逆時針方向，而第二電流方向為順時針方向，如第4圖所示。第一驅動線圈220和260具有一(由圖面)射出的磁場，而第二驅動線圈240和280具有一射入(至圖面)的磁場。如第5A圖所示，當待測物不受力時，四個感應線圈的感應電壓的輸出為零。如第5B圖所示，當待測物受到X方向力時，X方向的磁阻較小，因此射入(至圖面)方向之磁通量大於(由圖面)射出方向之磁通量。如第5C圖所示，當待測物受到Y方向力時，Y方向的磁阻較小，因此射入(至圖面)方向之磁通量小於(由圖面)射出方向之磁通量。Please refer to FIG. 5A to FIG. 5C, which illustrate the working principle of the stress measuring probe according to an embodiment of the present invention, wherein the first current direction is a counterclockwise direction and the second current direction is a clockwise direction, such as Figure 4 shows. The first drive coils 220 and 260 have a magnetic field (from the plane of view), while the second drive coils 240 and 280 have a magnetic field that is incident (to the surface). As shown in Fig. 5A, when the object to be tested is not subjected to force, the output of the induced voltage of the four induction coils is zero. As shown in Fig. 5B, when the object to be tested receives the X-direction force, the magnetic resistance in the X direction is small, so the magnetic flux in the direction of the incident (to the drawing) is larger than the magnetic flux in the outgoing direction (from the drawing). As shown in Fig. 5C, when the object to be tested receives the force in the Y direction, the magnetic resistance in the Y direction is small, so the magnetic flux in the direction of the incident (to the plane of the drawing) is smaller than the magnetic flux in the direction of the emission from the drawing.
值得一提的是，由於根據磁異方性原理之應力量測探頭的詳細原理與結構為熟悉本技藝之人士所習知，故不在此贅述。It is worth mentioning that since the detailed principle and structure of the stress measuring probe according to the principle of magnetic anisotropy are known to those skilled in the art, they will not be described here.
請參照第6A圖至第6C，第6A圖至第6C圖係繪示當待測物的受力為X方向時本發明之應力量測探頭所輸入之驅動電壓、個別感應線圈之感應電壓(V1 、V2 、V3 、V4 )與所輸出之總感應電壓(V1 +V2 +V3 +V4 )的波形示意圖。由第6A圖至第6C圖可知，本發明之應力量測探頭所輸出的感應電壓為單一感應線圈的感應電壓之4倍，且為驅動電壓之2倍。Please refer to FIG. 6A to FIG. 6C. FIG. 6A to FIG. 6C are diagrams showing the driving voltage input by the stress measuring probe of the present invention and the induced voltage of the individual induction coil when the force of the object to be tested is the X direction. A waveform diagram of V 1 , V 2 , V 3 , V 4 ) and the total induced voltage (V 1 +V 2 +V 3 +V 4 ) outputted. It can be seen from FIGS. 6A to 6C that the induced voltage output by the stress measuring probe of the present invention is four times the induced voltage of the single induction coil and is twice the driving voltage.
請參照第7A圖至第7C，第7A圖至第7C圖係繪示當待測物的受力為Y方向時本發明之應力量測探頭所輸入之驅動電壓、個別感應線圈之感應電壓(V1 、V2 、V3 、V4 )與所輸出之總感應電壓(V1 +V2 +V3 +V4 )的波形示意圖。由第7A圖至第7C圖可知，本發明之應力量測探頭所輸出的感應電壓為單一感應線圈的感應電壓之4倍，且為驅動電壓之2倍。Referring to FIGS. 7A to 7C, FIGS. 7A to 7C are diagrams showing driving voltages input by the stress measuring probe of the present invention and induced voltages of individual induction coils when the force of the object to be tested is in the Y direction ( A waveform diagram of V 1 , V 2 , V 3 , V 4 ) and the total induced voltage (V 1 +V 2 +V 3 +V 4 ) outputted. It can be seen from FIGS. 7A to 7C that the induced voltage output by the stress measuring probe of the present invention is four times the induced voltage of the single induction coil and is twice the driving voltage.
由上述本發明之實施方式可知，利用本發明之應力量測探頭大幅地提升量測靈敏度。As is apparent from the above-described embodiments of the present invention, the measurement sensitivity is greatly improved by the stress measurement probe of the present invention.
雖然本發明已以實施方式發明如上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明之精神和範圍內，當可作各種之更動與潤飾，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the present invention has been described above with reference to the embodiments of the present invention, it is not intended to limit the invention, and the invention may be modified and modified without departing from the spirit and scope of the invention. The scope is subject to the definition of the scope of the patent application attached.
10．．．習知應力量測探頭10. . . Conventional stress measurement probe
12．．．鐵心12. . . core
14．．．鐵心14. . . core
16．．．鐵心16. . . core
18．．．鐵心18. . . core
22．．．感應線圈twenty two. . . Induction coil
24．．．驅動線圈twenty four. . . Drive coil
26．．．感應線圈26. . . Induction coil
28．．．驅動線圈28. . . Drive coil
100．．．應力量測探頭100. . . Strength probe
110．．．鐵心110. . . core
120．．．鐵心120. . . core
130．．．鐵心130. . . core
140．．．鐵心140. . . core
150．．．鐵心150. . . core
160．．．鐵心160. . . core
170．．．鐵心170. . . core
180．．．鐵心180. . . core
210．．．感應線圈210. . . Induction coil
220．．．驅動線圈220. . . Drive coil
230．．．感應線圈230. . . Induction coil
240．．．驅動線圈240. . . Drive coil
250．．．感應線圈250. . . Induction coil
260．．．驅動線圈260. . . Drive coil
270．．．感應線圈270. . . Induction coil
280．．．驅動線圈280. . . Drive coil
V1 ．．．感應電壓V 1 . . . inductive voltage
V2 ．．．感應電壓V 2 . . . inductive voltage
V3 ．．．感應電壓V 3 . . . inductive voltage
V4 ．．．感應電壓V 4 . . . inductive voltage
為讓本發明之上述和其他目的、特徵、優點與實施例能更明顯易懂，所附圖式之說明如下：The above and other objects, features, advantages and embodiments of the present invention will become more apparent and understood.
第1圖係繪示依據習知一應力量測探頭之示意圖。Fig. 1 is a schematic view showing a probe according to a conventional stress measurement.
第2A圖係用以說明習知應力量測探頭之工作原理的示意圖，其中待測物未受力。Fig. 2A is a schematic view for explaining the working principle of the conventional stress measuring probe, in which the object to be tested is not subjected to force.
第2B圖係用以說明習知應力量測探頭之工作原理的示意圖，其中待測物受到X方向力。Fig. 2B is a schematic view for explaining the operation principle of the conventional stress measuring probe, in which the object to be tested is subjected to the X-direction force.
第2C圖係用以說明習知應力量測探頭之工作原理的示意圖，其中待測物受到Y方向力。Fig. 2C is a schematic view for explaining the working principle of the conventional stress measuring probe, in which the object to be tested is subjected to the Y direction force.
第3A圖係繪示依據本發明之一實施例之應力量測探頭之結構示意圖。3A is a schematic view showing the structure of a stress measuring probe according to an embodiment of the present invention.
第3B圖係繪示依據本發明之一實施例之應力量測探頭之俯視圖。Figure 3B is a top plan view of a stress measurement probe in accordance with an embodiment of the present invention.
第4圖係繪示依據本發明之一實施例之應力量測探頭之感應線圈和驅動線圈的電流方向示意圖。4 is a schematic view showing current directions of an induction coil and a drive coil of a stress measurement probe according to an embodiment of the present invention.
第5A圖係用以說明依據本發明之一實施例之應力量測探頭之工作原理的示意圖，其中待測物不受力。Fig. 5A is a view for explaining the operation principle of the stress measuring probe according to an embodiment of the present invention, in which the object to be tested is not subjected to force.
第5B圖係用以說明依據本發明之一實施例之應力量測探頭之工作原理的示意圖，其中待測物受到X方向力。Fig. 5B is a view for explaining the operation principle of the stress measuring probe according to an embodiment of the present invention, in which the object to be tested is subjected to the X-direction force.
第5C圖係用以說明依據本發明之一實施例之應力量測探頭之工作原理的示意圖，其中待測物受到Y方向力。Fig. 5C is a view for explaining the operation principle of the stress measuring probe according to an embodiment of the present invention, in which the object to be tested is subjected to the Y direction force.
第6A圖至第6C圖係繪示當待測物的受力為X方向時本發明之應力量測探頭所輸入之驅動電壓、個別感應線圈之感應電壓與所輸出之總感應電壓的波形示意圖。6A to 6C are diagrams showing the waveforms of the driving voltage input by the stress measuring probe of the present invention, the induced voltage of the individual induction coils, and the total induced voltage output when the force of the object to be tested is the X direction. .
第7A圖至第7C圖係繪示當待測物的受力為Y方向時本發明之應力量測探頭所輸入之驅動電壓、個別感應線圈之感應電壓與所輸出之總感應電壓的示意示意圖。7A to 7C are schematic diagrams showing the driving voltage input by the stress measuring probe of the present invention, the induced voltage of the individual induction coils, and the total induced voltage output when the force of the object to be tested is the Y direction. .
100．．．應力量測探頭100. . . Strength probe
110．．．鐵心110. . . core
120．．．鐵心120. . . core
130．．．鐵心130. . . core
140．．．鐵心140. . . core
150．．．鐵心150. . . core
160．．．鐵心160. . . core
170．．．鐵心170. . . core
180．．．鐵心180. . . core
210．．．感應線圈210. . . Induction coil
220．．．驅動線圈220. . . Drive coil
230．．．感應線圈230. . . Induction coil
240．．．驅動線圈240. . . Drive coil
250．．．感應線圈250. . . Induction coil
260．．．驅動線圈260. . . Drive coil
270．．．感應線圈270. . . Induction coil
280．．．驅動線圈280. . . Drive coil
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100110183A TWI421480B (en) | 2011-03-24 | 2011-03-24 | Stress measurement probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW100110183A TWI421480B (en) | 2011-03-24 | 2011-03-24 | Stress measurement probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201239328A TW201239328A (en) | 2012-10-01 |
| TWI421480B true TWI421480B (en) | 2014-01-01 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW100110183A TWI421480B (en) | 2011-03-24 | 2011-03-24 | Stress measurement probe |
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| Country | Link |
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| TW (1) | TWI421480B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4070614A (en) * | 1975-01-24 | 1978-01-24 | Asea Aktiebolag | Magnetoelastic shape meter for cold-rolled strips of ferromagnetic material |
| JPH06273243A (en) * | 1993-03-23 | 1994-09-30 | Osaka Gas Co Ltd | Magnetostrictive stress measuring method and device for pipe |
| JP2003028733A (en) * | 2001-07-10 | 2003-01-29 | Chuden Gijutsu Consultant Kk | Method of measuring stress, and magnetostrictive sensor |
| TW200741186A (en) * | 2006-04-17 | 2007-11-01 | Jing-Long Ceng | Torque sensor |
-
2011
- 2011-03-24 TW TW100110183A patent/TWI421480B/en active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4070614A (en) * | 1975-01-24 | 1978-01-24 | Asea Aktiebolag | Magnetoelastic shape meter for cold-rolled strips of ferromagnetic material |
| JPH06273243A (en) * | 1993-03-23 | 1994-09-30 | Osaka Gas Co Ltd | Magnetostrictive stress measuring method and device for pipe |
| JP2003028733A (en) * | 2001-07-10 | 2003-01-29 | Chuden Gijutsu Consultant Kk | Method of measuring stress, and magnetostrictive sensor |
| TW200741186A (en) * | 2006-04-17 | 2007-11-01 | Jing-Long Ceng | Torque sensor |
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| Publication number | Publication date |
|---|---|
| TW201239328A (en) | 2012-10-01 |
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