TWI417529B - Goniophotometry testing apparatus - Google Patents

Goniophotometry testing apparatus Download PDF

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TWI417529B
TWI417529B TW099105562A TW99105562A TWI417529B TW I417529 B TWI417529 B TW I417529B TW 099105562 A TW099105562 A TW 099105562A TW 99105562 A TW99105562 A TW 99105562A TW I417529 B TWI417529 B TW I417529B
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light source
holding portion
light
source holding
distributed
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TW099105562A
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TW201129789A (en
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Teng Chun Wu
Hsiao Cheng Lin
Chan Hsiao Ho
Si Xian Li
Chi Long Chen
wei yun Liang
Yu Yu Lin
Ming Cheng Lai
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Ind Tech Res Inst
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Description

分佈光度測試裝置Distributed photometric test device

本發明是有關於一種光源量測裝置尤其是指一種分佈光度測試裝置。The invention relates to a light source measuring device, in particular to a distributed photometric testing device.

燈具全光通量(Lumen,lm)的測試方式可採用積分球測試法(Integrating Sphere Testing)或測角光度計測試法(Goniophotometry Testing),通常小尺寸發光源模組或燈具的全光通量以積分球量測之,其中積分球內徑須為發光源模組最大尺寸的3倍以上。積分球測試法是將發光源模組至於積分球邊緣,只允許光源發光面在積分球內外露,其餘不發光面的面積或電子元件一律以一白色擴散板遮住。待發光源系統滿足熱平衡與光特性穩定條件後,利用與標準光源的比較進行全光通量量測。Lumen, lm can be tested by Integrating Sphere Testing or Goniophotometry Testing. The total luminous flux of a small-sized illuminating source module or luminaire is usually integrated. In the measurement, the inner diameter of the integrating sphere must be more than three times the maximum size of the light source module. The integrating sphere test method is to place the light source module on the edge of the integrating sphere, and only allow the light emitting surface of the light source to be exposed in the integrating sphere, and the area or electronic components of the other non-lighting surface are uniformly covered by a white diffusing plate. After the illumination source system satisfies the conditions of thermal equilibrium and optical characteristics, the total luminous flux measurement is performed by comparison with a standard light source.

大尺寸發光源模組則因積分球尺寸限制無法量測,改以測角光度計測試法取得配光曲線後,再以積分方法計算全光通量。量測配光曲線之量測配置上,在滿足遠場(far field)條件下,量測距離至少要大於發光源模組發光平面最大尺寸的10倍以上,以將發光源模組視為一點光源。進行量測時,使用分佈光度計(Goniophotometer)來量測。The large-size illumination source module cannot be measured due to the integration sphere size limitation. After the light distribution curve is obtained by the goniophotometer test method, the total luminous flux is calculated by the integration method. In the measurement configuration of the measurement light distribution curve, under the condition of far field, the measurement distance is at least 10 times larger than the maximum size of the illumination plane of the illumination source module, so that the illumination source module is regarded as a point. light source. When measuring, a Goniophotometer was used for measurement.

傳統分佈光度計,如圖一A所示之旋轉鏡面式分布光度計,在此光度測試系統100中有三個旋轉軸,主軸108驅動反光鏡102為繞中心光軸線旋轉,將燈具104的光反射到光感測器106上。此時,燈臂調整軸110同步旋轉,始終保持燈架處於垂直位置,確保測試燈具在測量過程中處於正常的點量位置。燈架軸(C軸)112旋轉實際等效於光感測器圍繞以燈具為中心的垂直球面旋轉,實現燈具在C方向的測量,它的運動軌跡相當於地球的緯線方向。主軸旋轉實現燈具在γ方向的測量,它的運動軌跡相當於地球的經線方向。A conventional distributed photometer, such as the rotating mirror-type distribution photometer shown in FIG. A, has three rotation axes in the photometric test system 100. The main shaft 108 drives the mirror 102 to rotate around the central optical axis to reflect the light of the lamp 104. To the photo sensor 106. At this time, the lamp arm adjustment shaft 110 rotates synchronously, and the lamp holder is always in the vertical position, ensuring that the test lamp is in a normal point position during the measurement. The rotation of the lamp holder shaft (C-axis) 112 is actually equivalent to the vertical spherical rotation of the light sensor around the luminaire, and the measurement of the luminaire in the C direction is achieved, and its trajectory is equivalent to the latitude of the earth. The rotation of the main shaft realizes the measurement of the luminaire in the γ direction, and its trajectory is equivalent to the warp direction of the earth.

此外,如圖一B所示之旋轉鏡面式分布光度計200,其光感測器206固定於光線軸線208上,燈具204繞垂直軸線210旋轉,反光鏡202繞著燈具旋轉,並將光信號反射到光感測器206上。在此系統中,測量以和光感測器的法線成一定圓錐角入射,光感測器的角度響應一致性要求高。在光源與感測器之間必須使用檔板,使光源的光線不直接入射至光感測器。In addition, as shown in FIG. 1B, the rotating mirror-type distribution photometer 200 has its photo sensor 206 fixed on the ray axis 208, the luminaire 204 rotates about the vertical axis 210, and the mirror 202 rotates around the luminaire and the optical signal Reflected onto the photo sensor 206. In this system, the measurement is incident at a certain conical angle with the normal of the photosensor, and the angular response of the photosensor is highly demanded. A baffle must be used between the light source and the sensor so that the light from the source is not directly incident on the photo sensor.

另外,如遠方公司的分佈光度計產品(美國公開號碼US.Pub.No.20080304049),其方式為利用雙面鏡量測光強,因此轉速慢而且及需要相當大場地,及另外如歐斯朗(OSRAM)公司的分佈光度計產品(美國公開號碼US.Pat.No.20060023222),其方式為利用雙轉臂量測待側光源之光強。In addition, such as the remote company's distributed photometer product (US public number US. Pub. No. 20080304049), the way is to use the double-sided mirror to measure the light intensity, so the speed is slow and requires a considerable venue, and another such as Oss OSRAM's distributed photometer product (US public number US Pat. No. 20060223222) is a method of measuring the light intensity of a side light source by using a double boom.

在一實施例中,本發明提供一種分佈光度測試裝置,其係包括有:一光源挾持部;一第一轉動部,其係與該光源挾持部相耦接,該第一轉動部係提供一第一轉動動力使該光源挾持部產生關於一第一軸之轉動運動;一第二轉動部,其係與該第一轉動部相耦接,該第二轉動部係提供一第二轉動動力使該光源挾持部產生關於一第二軸之轉動運動;以及一光感測器,其係設置於該光源挾持部之一側。In one embodiment, the present invention provides a distributed photometric test apparatus, comprising: a light source holding portion; a first rotating portion coupled to the light source holding portion, wherein the first rotating portion provides a The first rotational power causes the light source holding portion to generate a rotational motion about a first axis; a second rotational portion coupled to the first rotational portion, the second rotational portion provides a second rotational power The light source holding portion generates a rotational motion about a second axis; and a light sensor is disposed on one side of the light source holding portion.

在另一實施例中,本發明更提供一種分佈光度測試裝置,其係包括有:一光源挾持部;一第一轉動部,其係與該光源挾持部相耦接,該第一轉動部係提供一第一轉動動力使該光源挾持部產生關於一第一軸之轉動運動;一第二轉動部,其係與該第一轉動部相耦接,該第二轉動部係提供一第二轉動動力使該光源挾持部產生關於一第二軸之轉動運動;一光感測器,其係設置於該光源挾持部之一側;以及一光學鏡組,其係於該光源挾持部與該光學鏡組間之該光學鏡組之焦點上以產生一虛像。In another embodiment, the present invention further provides a distributed photometric test apparatus, comprising: a light source holding portion; a first rotating portion coupled to the light source holding portion, the first rotating portion Providing a first rotational power to cause the light source holding portion to generate a rotational motion about a first axis; a second rotating portion coupled to the first rotating portion, the second rotating portion providing a second rotation The light source causes the light source holding portion to generate a rotational motion about a second axis; a light sensor disposed on one side of the light source holding portion; and an optical lens group attached to the light source holding portion and the optical The focus of the optical lens between the mirror sets produces a virtual image.

為使 貴審查委員能對本發明之特徵、目的及功能有更進一步的認知與瞭解,下文特將本發明之裝置的相關細部結構以及設計的理念原由進行說明,以使得 審查委員可以了解本發明之特點,詳細說明陳述如下:本發明提供一種分佈光度測試裝置,其係利用兩個旋轉機構與光感測器,來完成實現燈具在C方向與γ方向的測量,進而實現配光曲線之量測,不但可以簡化機構設計,可以縮減測試場地所需空間及縮減測試所須時間。In order to enable the reviewing committee to have a further understanding and understanding of the features, objects and functions of the present invention, the related detailed structure of the device of the present invention and the concept of the design are explained below so that the reviewing committee can understand the present invention. The detailed description is as follows: The present invention provides a distributed photometric test device which utilizes two rotating mechanisms and a photo sensor to complete the measurement of the lamp in the C direction and the γ direction, thereby realizing the measurement of the light distribution curve. It not only simplifies the design of the mechanism, but also reduces the space required for the test site and reduces the time required for testing.

本發明提供一種分佈光度測試裝置,其係在待測光源與光感測器間設置光學鏡組,並且將該待測光源置於光學鏡組焦距(F)之數倍距離遠時,其待測光源之光將產生虛像於焦點(F)之位置以形成點光源,進而縮減測試場地所需之空間。The invention provides a distributed photometric test device, which is arranged with an optical lens set between a light source to be tested and a light sensor, and the light source to be tested is placed at a distance of a multiple of the focal length (F) of the optical lens group, and is to be The light from the source will produce a virtual image at the focus (F) to form a point source, which reduces the space required for the test site.

請參閱圖二A與圖二B所示,該圖係為本發明之分佈光度測試裝置第一實施例示意圖。該分佈光度測試裝置3包括有一光源挾持部30、一第一轉動部31、一第二轉動部32以及一光感測器33。該光源挾持部30,其係提供挾持一待測光源90。該待測光源90係可以為發光二極體或者是冷陰極燈管所形成的光源,亦或者是燈泡等會發光的元件。待測光源90之外形並無特定限制,本實施例係為平面光源。至於挾持光源的機制可以利用吸、夾爪或者是習用技術中任何可以挾持光源的機制來實施,其係屬於熟悉此項技術之人所熟知技術,在此不做贅述。Please refer to FIG. 2A and FIG. 2B, which are schematic diagrams of the first embodiment of the distributed photometric testing device of the present invention. The distributed photometric testing device 3 includes a light source holding portion 30, a first rotating portion 31, a second rotating portion 32, and a light sensor 33. The light source holding portion 30 provides a light source 90 to be tested. The light source to be tested 90 may be a light source formed by a light emitting diode or a cold cathode fluorescent tube, or an element that emits light such as a light bulb. There is no particular limitation on the shape of the light source to be tested 90. This embodiment is a planar light source. The mechanism for holding the light source can be implemented by suction, jaw or any mechanism that can hold the light source in the prior art, which is a technique well known to those skilled in the art and will not be described herein.

該第一轉動部31,其係與該光源挾持部30相耦接。該第一轉動部31係由一馬達310達搭配角度感測之轉檯311予以實現,其係可以提供一第一轉動動力使該光源挾持部產30生關於一第一軸(C軸)向之轉動運動。該轉動運動係為360度旋轉,以實現待測光源90在C軸方向的測量,它的轉動運動軌跡相當於地球的緯線方向。該第二轉動部32,其係與該第一轉動部31相耦接,該第二轉動部32係提供一第二轉動動力使該光源挾持部30產生關於一第二軸(γ軸)方向之轉動運動,實現待測光源90在γ軸方向的測量,它的轉動運動軌跡相當於地球的經線方向。同樣地,該第二轉動部32係由一馬達320達搭配角度感測之轉檯321予以實現。本發明中的第二軸(γ軸)係為垂直水平面(或地面)91之軸,本實施例中,該第二軸322之中心係與該待測光源90之發光面相切齊。而該第一軸(C軸)係與該待測光源90之發光面900的發光面機械軸901同軸。The first rotating portion 31 is coupled to the light source holding portion 30. The first rotating portion 31 is realized by a motor 310 reaching the angle sensing turret 311, which can provide a first rotational power to cause the light source holding portion to produce a first axis (C axis) Rotate the movement. The rotational motion is a 360-degree rotation to measure the direction of the light source 90 to be measured in the C-axis direction, and its rotational motion trajectory corresponds to the latitudinal direction of the earth. The second rotating portion 32 is coupled to the first rotating portion 31. The second rotating portion 32 provides a second rotational power to cause the light source holding portion 30 to generate a second axis (γ axis) direction. The rotational motion realizes the measurement of the light source 90 to be measured in the γ-axis direction, and its rotational motion trajectory corresponds to the warp direction of the earth. Similarly, the second rotating portion 32 is realized by a motor 320 that is coupled to the angle sensing 321 of the angle. The second axis (γ axis) in the present invention is the axis of the vertical horizontal plane (or the ground) 91. In this embodiment, the center of the second axis 322 is aligned with the light emitting surface of the light source to be tested 90. The first axis (C axis) is coaxial with the light emitting surface mechanical axis 901 of the light emitting surface 900 of the light source to be tested 90.

該光感測器33(如照度計),係置於該光源挾持部30之一側,與該待測光源90保持一特定距離。本實施例中,該光感測器33係藉由支撐座34的支撐而距離地面有一高度。為了讓待測光源90相對於光感測器33為一點光源,因此待測光源90與該光感測器33之距離係為該待測光源90尺寸十倍距離長以上之位置。然後,當該待測光源90發出光線時,將光感測器33讀取之值搭配第一轉動部31與第二轉動部32之轉動位置數據,共同連接至可以進行運算的電子運算單元35(例如:電腦),經由I=Er2 及光通量為光強度積分立體角之公式,可得到光強分佈值及光通量值。由於本實施例藉由第一轉動部31以及第二轉動部32的高速旋轉,因此可以縮減待測光源90在C方向的測量與在γ方向的測量時間。The light sensor 33 (such as an illuminometer) is placed on one side of the light source holding portion 30 to maintain a specific distance from the light source to be tested 90. In this embodiment, the photo sensor 33 has a height from the ground by the support of the support base 34. In order to make the light source 90 to be tested a point light source with respect to the light sensor 33, the distance between the light source 90 to be tested and the light sensor 33 is a position ten times longer than the size of the light source to be tested 90. Then, when the light source to be tested 90 emits light, the value read by the photo sensor 33 is matched with the rotational position data of the first rotating portion 31 and the second rotating portion 32, and is commonly connected to the electronic operation unit 35 that can perform the operation. (For example, a computer), the light intensity distribution value and the luminous flux value can be obtained by the formula that I=Er 2 and the luminous flux are integrated solid angles of light intensity. Since the present embodiment is rotated at a high speed by the first rotating portion 31 and the second rotating portion 32, the measurement of the light source 90 to be measured in the C direction and the measurement time in the γ direction can be reduced.

請參閱圖三A與圖三B所示,該圖係為本發明之分佈光度測試裝置第二實施例側視與俯視示意圖。由於在第一實施例中待測光源90距離光感測器33需要比較長的距離,因此利用一反射元件36(例如:反射鏡)將待測光源90所產生之光線反射至光感測器33。該光感測器33置於與待測光源90之發光面機械軸901垂直之方向上,亦即該光感測器33之感測軸330方向係與該第一軸C垂直。藉由反射元件36的設置,縮短光感測器33與該待測光源90間的距離。此外,在本實施例中,該光感測器33與該光源挾持部30之間更可以設置一檔板37,該檔板37上開設有一開口370,該光感測器33設置於該開口370之一側,而該開口370之另一側與該光源挾持部90相對應之位置上具有該反射元件36。該反射元件36係將該待測光源90所產生之光經由該開口370反射至該光感測器33上。該檔板37係可以加強防止雜散光進入光感測器33中以增加量測的準確度。此外,如圖三C所示,該圖係為本發明之第二實施例中反射鏡與光感測器之不同配置方式示意圖。圖三C之擺設方式與圖三A與三B之方式並不相同,差異的是,該光感測器33係設置於光源狹持部30的下方,而該反射元件36則將該待測光源90的光反射至該光感測器上。Referring to FIG. 3A and FIG. 3B, the figure is a side view and a top view of a second embodiment of the distributed photometric testing device of the present invention. Since the light source 90 to be tested needs a relatively long distance from the photo sensor 33 in the first embodiment, the light generated by the light source 90 to be tested is reflected to the photo sensor by a reflective element 36 (for example, a mirror). 33. The photo sensor 33 is placed in a direction perpendicular to the illumination surface mechanical axis 901 of the light source 90 to be tested, that is, the direction of the sensing axis 330 of the photo sensor 33 is perpendicular to the first axis C. By the arrangement of the reflective element 36, the distance between the photo sensor 33 and the light source to be tested 90 is shortened. In addition, in the embodiment, a light barrier 37 is disposed between the light sensor 33 and the light source holding portion 30. The shutter 37 defines an opening 370, and the light sensor 33 is disposed at the opening. One side of the 370, and the other side of the opening 370 has the reflective element 36 at a position corresponding to the light source holding portion 90. The reflective element 36 reflects the light generated by the light source to be tested 90 to the photo sensor 33 via the opening 370. The baffle 37 can enhance the prevention of stray light entering the photo sensor 33 to increase the accuracy of the measurement. In addition, as shown in FIG. 3C, the figure is a schematic diagram of different configurations of the mirror and the photo sensor in the second embodiment of the present invention. The arrangement of FIG. 3C is different from the manner of FIG. 3A and FIG. 3B. The difference is that the photo sensor 33 is disposed under the light source narrowing portion 30, and the reflective element 36 is to be tested. Light from source 90 is reflected onto the photo sensor.

請參閱圖四A與圖四B所示,該圖係為本發明之分佈光度測試裝置第三實施例俯視與側視示意圖。在本實施例中,該分佈光度測試裝置基本上與圖三A與圖三B之實施例類似,差異的是,本實施例具有一第一反射元件380以及一第二反射元件381,其中,該第一反射元件380之反射面係與該光源挾持部30以及該第二反射元件381之反射面相對應,而該第二反射元件381之反射面係與該光感測器33以及該第一反射元件380之反射面相對應。該光源挾持部30所挾持的待測光源90所產生之光可以經由第一反射元件380反射至該第二反射元件381,再經由該第二反射元件381反射至該光接收器33。同樣地,為了避免雜散光進入光感測器中,如圖四C所示,在該光感測器33與該光源挾持部30間更設置有一擋板39。Please refer to FIG. 4A and FIG. 4B, which are schematic top and side views of a third embodiment of the distributed photometric testing device of the present invention. In this embodiment, the distributed photometric test device is substantially similar to the embodiment of FIG. 3A and FIG. 3B. The difference is that the embodiment has a first reflective component 380 and a second reflective component 381. The reflective surface of the first reflective element 380 corresponds to the reflective surface of the light source holding portion 30 and the second reflective element 381, and the reflective surface of the second reflective element 381 is coupled to the photo sensor 33 and the first The reflective surface of the reflective element 380 corresponds. The light generated by the light source 90 to be tested held by the light source holding portion 30 can be reflected to the second reflective element 381 via the first reflective element 380 and reflected to the light receiver 33 via the second reflective element 381. Similarly, in order to prevent stray light from entering the photo sensor, as shown in FIG. 4C, a baffle 39 is further disposed between the photo sensor 33 and the light source holding portion 30.

請參閱圖五所示,該圖係為本發明之分佈光度測試裝置第四實施例示意圖。在本實施例中,在該光感測器33與該待測光源90之間更具有一光學鏡組5,其係於該光源挾持部30與該光學鏡組5間之該光學鏡組5之焦點上以產生一虛像。在本實施例中,該光學鏡組5係可以為單一之凹透鏡或者是由至少一凹透鏡所構成之光學鏡組。如圖六所示,該圖係為光學路徑示意圖。將該待測光源90置於光學鏡組5之焦距(F)之數倍距離遠時,其光將產生虛像聚焦於焦點(F)之位置。此時,該待測光源90即可視為由該焦點F所產生之點光源。將光感測器33讀取之值搭配第一轉動部與第二轉動部之角度數據共同連接至電子運算單元,經由I=Er2 及光通量為光強度積分立體角之公式,可得到光強分佈值及光通量值。要說明的是,雖然圖五所示之光學鏡組5係與圖二A之實施例結合,但是並不以此為限,該光學鏡組5亦可以跟本發明之第二與第三之實施例相結合。藉由該光學鏡組的虛像聚焦的特性,可以縮短待測光源與光感測器間的距離,對於大尺寸的待測光源而言,是一種可以減少檢測所需距離與空間的設計。Referring to FIG. 5, the figure is a schematic diagram of a fourth embodiment of the distributed photometric testing device of the present invention. In the embodiment, an optical lens group 5 is disposed between the light sensor 33 and the light source to be tested 90, and the optical lens group 5 is disposed between the light source holding portion 30 and the optical lens group 5. Focus on creating a virtual image. In this embodiment, the optical lens assembly 5 can be a single concave lens or an optical lens group composed of at least one concave lens. As shown in Figure 6, the figure is a schematic diagram of the optical path. When the light source 90 to be measured is placed at a multiple of the focal length (F) of the optical lens group 5, its light will cause the virtual image to be focused on the focus (F). At this time, the light source to be tested 90 can be regarded as a point light source generated by the focus F. The value read by the photo sensor 33 is connected to the electronic operation unit together with the angle data of the first rotating portion and the second rotating portion, and the light intensity can be obtained by using the formula of I=Er 2 and the luminous flux as the integrated solid angle of the light intensity. Distribution value and luminous flux value. It should be noted that although the optical lens assembly 5 shown in FIG. 5 is combined with the embodiment of FIG. 2A, it is not limited thereto, and the optical lens assembly 5 can also be in accordance with the second and third embodiments of the present invention. The examples are combined. By the virtual image focusing characteristic of the optical lens group, the distance between the light source to be tested and the light sensor can be shortened, and for a large-sized light source to be tested, it is a design that can reduce the distance and space required for detection.

經由第一旋轉部與第二旋轉部的高速旋轉,實現待測光源在C方向的測量與在γ方向的測量,將可於10分鐘內得到關於該待測光源之光通量,相較於傳統之配光曲線需要2~4小時,或者是如(美國公開號碼US.Pub.No.20080304049)之遠方之改良型分佈光度計之30分鐘~1小時,有相當程度之改進。Through the high-speed rotation of the first rotating portion and the second rotating portion, the measurement of the light source to be measured in the C direction and the measurement in the γ direction are performed, and the luminous flux with respect to the light source to be tested can be obtained within 10 minutes, compared with the conventional one. The light distribution curve takes 2 to 4 hours, or is 30 minutes to 1 hour in the far-reaching modified distribution photometer (US public number US. Pub. No. 20080304049), with a considerable degree of improvement.

惟以上所述者,僅為本發明之實施例,當不能以之限制本發明範圍。即大凡依本發明申請專利範圍所做之均等變化及修飾,仍將不失本發明之要義所在,亦不脫離本發明之精神和範圍,故都應視為本發明的進一步實施狀況。However, the above is only an embodiment of the present invention, and the scope of the present invention is not limited thereto. It is to be understood that the scope of the present invention is not limited by the spirit and scope of the present invention, and should be considered as a further embodiment of the present invention.

100...光度測試系統100. . . Photometric test system

102...反光鏡102. . . reflector

104...燈具104. . . Lamp

106...光感測器106. . . Light sensor

108...主軸108. . . Spindle

110...燈臂調整軸110. . . Lamp arm adjustment shaft

112...燈架軸112. . . Light shaft

200...鏡面式分布光度計200. . . Mirror-type distribution photometer

204‧‧‧燈具 204‧‧‧Lights

206‧‧‧光感測器 206‧‧‧Light sensor

208‧‧‧光線軸線 208‧‧‧ray axis

210‧‧‧垂直軸線 210‧‧‧vertical axis

3‧‧‧分佈光度測試裝置 3‧‧‧Distribution photometric test device

30‧‧‧光源挾持部 30‧‧‧Light source maintenance department

31‧‧‧第一轉動部 31‧‧‧First rotation

32‧‧‧第二轉動部 32‧‧‧Second rotation

322‧‧‧第二軸 322‧‧‧second axis

33‧‧‧光感測器 33‧‧‧Light sensor

330‧‧‧感測軸 330‧‧‧Sensing axis

34‧‧‧支撐座 34‧‧‧ support

35‧‧‧電子運算單元 35‧‧‧Electronic Computing Unit

36‧‧‧反射元件 36‧‧‧reflecting elements

37‧‧‧檔板 37‧‧‧Baffle

370‧‧‧開口 370‧‧‧ openings

380、381‧‧‧反射元件 380, 381‧‧‧reflecting elements

39‧‧‧檔板 39‧‧‧Baffle

5‧‧‧光學鏡組 5‧‧‧Optical mirror

90‧‧‧待測光源 90‧‧‧Light source to be tested

900‧‧‧發光面 900‧‧‧Lighting surface

901‧‧‧發光面機械軸901‧‧‧Lighting surface mechanical axis

圖一A與圖一B係為習用之分佈光度測試裝置示意圖。Figure 1A and Figure 1B are schematic diagrams of conventional distributed photometric testing devices.

圖二A與圖二B係為本發明之分佈光度測試裝置第一實施例示意圖。2A and 2B are schematic views showing a first embodiment of the distributed photometric test apparatus of the present invention.

圖三A與圖三B係為本發明之分佈光度測試裝置第二實施例側視與俯視示意圖。FIG. 3A and FIG. 3B are schematic side and top plan views of a second embodiment of the distributed photometric testing device of the present invention.

圖三C係為本發明之第二實施例中反射元件與光感測器之不同配置方式示意圖。FIG. 3C is a schematic diagram showing different configurations of the reflective element and the photo sensor in the second embodiment of the present invention.

圖四A與圖四B係為本發明之分佈光度測試裝置第三實施例俯視與側視示意圖。4A and 4B are top and side views of a third embodiment of the distributed photometric testing device of the present invention.

圖四C係為第三實施例增加隔板示意圖。Figure 4C is a schematic view showing the addition of a spacer for the third embodiment.

請參閱圖五係為本發明之分佈光度測試裝置第四實施例示意圖。Please refer to FIG. 5 , which is a schematic diagram of a fourth embodiment of the distributed photometric testing device of the present invention.

圖六係為光學路徑示意圖。Figure 6 is a schematic diagram of the optical path.

3...分佈光度測試裝置3. . . Distributed photometric test device

30...光源挾持部30. . . Light source holding unit

31...第一轉動部31. . . First turning part

32...第二轉動部32. . . Second rotating part

322...第二軸322. . . Second axis

33...光感測器33. . . Light sensor

34...支撐座34. . . Support base

35...電子運算單元35. . . Electronic computing unit

90...待測光源90. . . Light source to be tested

900...發光面900. . . Luminous surface

901...發光面機械軸901. . . Luminous surface mechanical axis

Claims (7)

一種分佈光度測試裝置,其係包括有:一光源挾持部;一第一轉動部,其係與該光源挾持部相耦接,該第一轉動部係提供一第一轉動動力使該光源挾持部產生關於一第一軸之轉動運動;一第二轉動部,其係與該第一轉動部相耦接,該第二轉動部係提供一第二轉動動力使該光源挾持部產生關於一第二軸之轉動運動;一光感測器,其係設置於該光源挾持部之一側;以及一光學鏡組,其係於該光源挾持部與該光學鏡組間之該光學鏡組之焦點上以產生一虛像,其中該光學鏡組係為包含有至少一凹透鏡之光學鏡組。 A distributed photometric testing device includes: a light source holding portion; a first rotating portion coupled to the light source holding portion, the first rotating portion providing a first rotational power to the light source holding portion Generating a rotational motion about a first axis; a second rotating portion coupled to the first rotating portion, the second rotating portion providing a second rotational power to cause the light source holding portion to generate a second a rotational movement of the shaft; a light sensor disposed on one side of the light source holding portion; and an optical lens set at a focus of the optical lens group between the light source holding portion and the optical lens group To create a virtual image, wherein the optical lens assembly is an optical lens group including at least one concave lens. 如申請專利範圍第1項所述之分佈光度測試裝置,其係更具有一反射元件。 The distributed photometric test device of claim 1, further comprising a reflective element. 如申請專利範圍第2項所述之分佈光度測試裝置,其係更具有一檔板,其係設置於該光感測器與該光源挾持部之間,該檔板上開設有一開口,該光感測器設置於該開口之一側,而該開口之另一側與該光源挾持部相對應之位置上具有該反射元件,其中該光感測器之感測軸向係與該第一軸垂直。 The distributed photometric test device of claim 2, further comprising a baffle disposed between the photo sensor and the light source holding portion, the baffle having an opening, the light The sensor is disposed on one side of the opening, and the other side of the opening has the reflective element at a position corresponding to the light source holding portion, wherein the sensing axial direction of the photo sensor is coupled to the first axis vertical. 如申請專利範圍第2項所述之分佈光度測試裝置,其中光感測器係設置於該光源挾持部之下側。 The distributed photometric test device of claim 2, wherein the photo sensor is disposed on a lower side of the light source holding portion. 如申請專利範圍第1項所述之分佈光度測試裝置,其係 更具有一第一反射元件以及一第二反射元件,該第一反射元件之反射面係與該光源挾持部以及該第二反射元件之反射面相對應,而該第二反射元件之反射面係與該光感測器以及該第一反射元件之反射面相對應,其中該光感測器之感測軸向係與該第一軸平行。 For example, the distributed photometric test device described in claim 1 is Further having a first reflective element and a second reflective element, the reflective surface of the first reflective element is corresponding to the light source holding portion and the reflective surface of the second reflective element, and the reflective surface of the second reflective element is The light sensor and the reflective surface of the first reflective element correspond to each other, wherein the sensing axial direction of the light sensor is parallel to the first axis. 如申請專利範圍第5項所述之分佈光度測試裝置,其中該光感測器與該光源挾持部間更具有一檔板。 The distributed photometric test device of claim 5, wherein the light sensor and the light source holding portion further have a baffle. 如申請專利範圍第1項所述之分佈光度測試裝置,其中該第一軸係通過該光源挾持部所挾持之一待測光源之發光面機械軸,該第二軸係垂直於一水平面。The distributed photometric test apparatus of claim 1, wherein the first shaft is held by the light source holding portion and the light emitting surface mechanical axis of the light source to be tested is perpendicular to a horizontal plane.
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