TWI414915B - - Google Patents

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Publication number
TWI414915B
TWI414915B TW99102329A TW99102329A TWI414915B TW I414915 B TWI414915 B TW I414915B TW 99102329 A TW99102329 A TW 99102329A TW 99102329 A TW99102329 A TW 99102329A TW I414915 B TWI414915 B TW I414915B
Authority
TW
Taiwan
Prior art keywords
control signal
sensing
generate
unit receiving
signal
Prior art date
Application number
TW99102329A
Other languages
Chinese (zh)
Other versions
TW201126292A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW99102329A priority Critical patent/TW201126292A/en
Publication of TW201126292A publication Critical patent/TW201126292A/en
Application granted granted Critical
Publication of TWI414915B publication Critical patent/TWI414915B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A control method for an inspection system is disclosed, which comprises: a single object sensing unit sensing an object on a carrier tray so as to generate a sensing signal; a control unit receiving the sensing signal, so as to generate a first control signal and a second control signal accordingly; an inspection unit receiving the first control signal and inspecting the object at a first time according to the first control signal, so as to generate an inspection result; and a classification unit receiving the second control signal and classifying the object to a specific location at a second time according to the second control signal and the inspection result.
TW99102329A 2010-01-28 2010-01-28 Control method for inspection system TW201126292A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99102329A TW201126292A (en) 2010-01-28 2010-01-28 Control method for inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99102329A TW201126292A (en) 2010-01-28 2010-01-28 Control method for inspection system

Publications (2)

Publication Number Publication Date
TW201126292A TW201126292A (en) 2011-08-01
TWI414915B true TWI414915B (en) 2013-11-11

Family

ID=45024462

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99102329A TW201126292A (en) 2010-01-28 2010-01-28 Control method for inspection system

Country Status (1)

Country Link
TW (1) TW201126292A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200928642A (en) * 2007-12-31 2009-07-01 Ind Tech Res Inst Reliability detecting and feeding back system and method thereof for manufacturing equipment
TW200944458A (en) * 2008-04-29 2009-11-01 Century Display Shenxhen Co Conveyance and inspection system of liquid crystal panel
WO2009132403A1 (en) * 2008-04-30 2009-11-05 Thomson Multimídia Ltda Automated method for controlling and testing products

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200928642A (en) * 2007-12-31 2009-07-01 Ind Tech Res Inst Reliability detecting and feeding back system and method thereof for manufacturing equipment
TW200944458A (en) * 2008-04-29 2009-11-01 Century Display Shenxhen Co Conveyance and inspection system of liquid crystal panel
WO2009132403A1 (en) * 2008-04-30 2009-11-05 Thomson Multimídia Ltda Automated method for controlling and testing products

Also Published As

Publication number Publication date
TW201126292A (en) 2011-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees