TWI412679B - Circuit board test bracket - Google Patents

Abstract

A circuit board test bracket includes a base, two supporting pieces, and a supporting member for supporting a circuit board. The base includes a plate and two holding posts vertically positioned on opposite sides of the plate. The supporting member is pivotably installed between the holding posts. The first ends of the supporting pieces respectively slidably connect to the holding posts, and the second ends of the supporting pieces opposite to the first ends respectively pivotably connect to opposite sides of the supporting member.

Description

Motherboard test stand

The invention relates to a motherboard test stand.

During the development process, it is often necessary to perform tests on both sides of a circuit board (such as a computer motherboard). The usual test method is to support the board with a support such as a stud or insulating foam to test one side of the board, then turn off the power of the board, remove the board from the support and flip it to test the other side. This not only causes inconvenience to the test, but also makes the test inefficient, and it is also easy to damage components on the circuit board during operation, causing unnecessary loss.

In view of the above, it is necessary to provide a motherboard test stand for conveniently and safely testing both sides of the motherboard.

A motherboard test bracket for testing a motherboard includes a base, two support columns, and a carrier for fixing the motherboard. The base includes a bottom plate and two holding posts extending perpendicularly from opposite sides of the bottom plate. The carrier is rotatably coupled between the two holding posts, one end of the two supporting columns is slidably connected to the holding post of the base, and the other end is rotatably connected to both sides of the carrying frame.

Compared with the prior art, the motherboard test bracket fixes the motherboard through the carrier, so that the motherboard can be flipped relative to the two clamping posts, and the operation is simple and safe.

10‧‧‧Base

12‧‧‧floor

14‧‧‧Card column

140‧‧ ‧ chute

142, 32‧‧‧ perforation

30‧‧‧Support column

40‧‧‧ Carrier

42‧‧‧Support bars

44‧‧‧ Ribs

420, 440‧‧ ‧ keyhole

422‧‧‧Lock column

50, 52‧‧‧ studs

60‧‧‧ nuts

1 is a perspective exploded view of a preferred embodiment of a motherboard test stand of the present invention.

2 is a perspective assembled view of FIG. 1.

Figure 3 is a diagram showing the state of use of Figure 2.

Referring to FIG. 1 , a preferred embodiment of the motherboard test stand of the present invention includes a base 10 , two support columns 30 , and a carrier 40 .

The base 10 includes a square bottom plate 12 and two retaining posts 14 extending from the sides of the bottom plate 12, respectively. The two clamping posts 14 are all elongated, and respectively have a sliding slot 140 extending through the two sides in the longitudinal direction, and a through hole 142 extending through the two sides is formed adjacent to the top end.

The two support columns 30 are all elongated, and each of them has a through hole 32 at each end.

The carrier 40 is made of a hard material made of insulating material, such as wood material or hard plastic. The carrier 40 includes two mutually parallel supporting strips 42 and a plurality of ribs 44 respectively perpendicularly connecting the two supporting strips 42, wherein the two ribs 44 are perpendicularly connected to the two ends of the two supporting strips 42, respectively. The two supporting strips 42 respectively define a locking hole 420 in a middle portion away from one side, and a locking post 422 is protruded from the same end. The top surface of the ribs 44 is spaced apart by a plurality of keyholes 440, and the two support bars 42 A locking hole 440 is defined in each of the ribs 44 on the top surface.

Referring to FIG. 2 and FIG. 3, when the assembly is assembled, the carrier 40 is sandwiched between the two holding posts 14 of the base 10, so that the locking holes 420 on both sides of the two supporting strips 42 are respectively facing the two holdings. The perforations 142 of the column 14. The two studs 50 respectively pass through the through holes 142 of the two holding posts 14 and lock into the locking holes 420 of the carrier 40, and the carrier 40 is rotatably fixed to the base 10.

The two support columns 30 are respectively sleeved on the locking posts 422 of the carrier 40 by the through holes 32 at one end thereof. The two studs 52 respectively pass through the through holes 32 at the other end of the two supporting columns 30 and the sliding slots 140 of the two holding posts 14 , and lock a nut 60 correspondingly, and respectively position the two supporting columns 30 to the corresponding latches Outside the column 14.

In use, the plurality of studs are locked into the corresponding locking holes 440 of the carrier 40 through the motherboard (not shown) to fix the motherboard to the carrier 40. Loosen the two nuts 60, slide the two support columns 30 along the sliding slots 140 of the two holding posts 14, change the inclination of the carrier 40, or flip the carrier 40 by 180 degrees, and then tighten the two nuts 60. By fixing the two support columns 30, the two sides of the motherboard can be tested from multiple angles without the need to reassemble the motherboard. At this time, the two support columns 30 are located at corresponding positions of the corresponding holding posts 14 by frictional force.

In other embodiments, the two support columns 30 can also be respectively disposed inside the two holding posts 14 .

In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above is only a preferred embodiment of the present invention, and This can limit the scope of patent application in this case. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

12‧‧‧floor

14‧‧‧Card column

30‧‧‧Support column

40‧‧‧ Carrier

60‧‧‧ nuts

Claims (6)

A motherboard test bracket for testing a motherboard includes a base, two support columns, and a carrier for fixing the motherboard. The base includes a bottom plate and two holding posts extending perpendicularly from opposite sides of the bottom plate. The carrier is rotatably coupled between the two holding posts, one end of the two supporting columns is slidably connected to the holding post of the base, and the other end is rotatably connected to both sides of the carrying frame. The motherboard test stand of the first aspect of the invention, wherein the two card holders respectively have a through hole at the top end, and the carrier has a screw hole on each side, and the two studs respectively pass through the two cards. The column is perforated and locked into the screw holes on both sides of the carrier, and the carrier is rotatably mounted between the two clamping posts. The main board test stand of the first aspect of the invention, wherein the two holding columns respectively open a sliding slot in the longitudinal direction, the two supporting columns respectively forming a perforation at one end, and the two studs respectively pass through the two supporting columns The through hole and the sliding groove of the two holding columns are correspondingly locked with a nut, and the two supporting columns are respectively positioned on the two holding columns. The motherboard test support of the first aspect of the invention, wherein the two support columns respectively have a perforation at one end, and the carrier is respectively provided with a lock column at a position adjacent to the same end of the two sides, the lock of the carrier The column corresponds to a perforation received in the two support columns. The motherboard test support of claim 1, wherein the carrier comprises two support bars and a plurality of ribs vertically connecting the two support bars, the carrier A plurality of keyholes are arranged on the two support bars and the ribs to fix the motherboard. The motherboard test stand of claim 1, wherein the carrier is made of an insulating material.