TWI411763B - Micrometer caliper - Google Patents

Abstract

A micrometer caliper includes two gauge heads opposite to each other and an assistant device. The assistant device includes a fixing cap and a contact portion. The fixing cap is capped on one of the gauge heads. The fixing cap has a end surface opposite to the other gauge head. The contact portion is fixed on the end surface. The contact is configured for a thinner part of a pre-measured component. A first distance is defined between a contact surface where the contact portion contacts the pre-measured component and the end surface of the fixing cap. A second distance is defined between an end portion of a thicker part of the pre-measured component and the contact surface. The first distance is larger than the second distance.

Description

Fractional card

The invention relates to a measuring device of linear size such as length and thickness, in particular to a centring card.

At present, the centimeter card is widely used for accurately measuring the linear dimensions such as the length and thickness of the component (see "The second Sucker Technique", Journal of Bone and Joint Surgery, Vol 86-B, Issue SUPP_I, 100, 2004). The conventional centimeter card has two opposite probes, and the centimeter card reads the distance between the two probes. When measuring the thickness of the component, the two probes respectively contact the component to be tested, and the reading of the centimeter card is the thickness of the component to be tested.

However, the area of the end of the probe of the same centimeter is the same, if the component with uneven thickness and small contact surface is measured, such as the outer skirt of a small lens, or the bottom surface is smaller than the end surface size of the centimeter card. When the thickness of the bottom of the trough body is equal, such a centimeter card cannot be measured. In this case, it is necessary to replace the card of other specifications, which is inconvenient for measurement.

In view of the above, it is necessary to provide a card which can measure the thickness of a thin portion of a thickness unevenness element.

A centimeter card for measuring the thickness of a thin portion of an element having an uneven thickness, the card comprising two opposing probes and an auxiliary fixture. The auxiliary fixture includes a fixing sleeve and a contact portion, and the fixing sleeve is disposed on one of the measuring heads, and the fixing sleeve has an end surface opposite to the other measuring head. The contact portion is fixed to the end surface, and the contact portion is configured to be in contact with a thin portion of the component to be tested, and a distance between a contact surface of the contact portion and the component to be tested is a first distance from an end surface of the fixing sleeve, and the The portion of the thicker portion of the measuring member on the opposite side of the fixing sleeve is at a second distance from the contact surface of the contact portion with the element to be tested, and the first distance is greater than the second distance.

Compared with the prior art, the PCT card adopts an auxiliary fixture because the distance between the contact surface and the end surface of the fixing sleeve is greater than the distance from the thick portion of the component to be tested relative to the contact surface, so that the thickness unevenness component can be measured. The thickness of the thinner part, without the need to replace the other specifications of the centimeter card, the measurement is more convenient.

The invention will be further described in detail below with reference to the accompanying drawings.

Referring to FIG. 1 and FIG. 2, a first embodiment of the present invention provides a centimeter card 100. The object to be tested is a lenticular lens 30. The lenticular lens 30 includes a main body portion 302 and a skirt 304 disposed around the periphery of the main body portion 302. The centring card 100 of the present embodiment is used to measure the thickness of the skirt 304. The centimeter card 100 includes an arcuate ruler 10, a measuring portion 12, and a first probe 14. The measuring portion 12 is mounted to one end of the arcuate frame 10, and the first probe 14 is fixed to the other end of the arcuate frame 10.

The measuring portion 12 includes a fixing sleeve 16, a differential cylinder 18 and a second probe 20. The fixing sleeve 16 is fixed to one end of the arcuate ruler 10. One end of the second probe 20 is screwed to the inner diameter surface of the fixing sleeve 16, and is fixed through the fixing sleeve 16 and the inner bottom of the differential cylinder 18. The other end of the second probe 20 is opposite to the first probe 14 fixed to the other end of the arcuate frame 10, and the differential cylinder 18 is sleeved on the surface of the fixed sleeve 16. The surface of the fixed sleeve 16 is provided with a scale 22 along its axial direction, and the differential cylinder 18 is provided with a scale 24 along its outer circumference near one end of the arched frame 10.

The PCT card 100 further includes a first auxiliary fixture 26 and a second auxiliary fixture 28, and the first auxiliary fixture 26 and the second auxiliary fixture 28 are respectively sleeved on the first probe 14 and the second probe. End of 20, and detachable. The first auxiliary fixture 26 includes a first fixing sleeve 32 and a first contact portion 34. The first fixing sleeve 32 is a cup-shaped body having a bottom portion 322 and an annular side wall 324 disposed perpendicular to the bottom portion 322. The bottom portion 322 and the annular side wall 324 are respectively shaped to the first probe 14 The end surface is matched to the side shape and sleeved over the first probe 14, and the first fixing sleeve 32 has a surface 36 opposite to the second probe 20. The first contact portion 34 is a hollow annular cylinder. One end of the first contact portion 34 is fixed to the surface 36 of the first fixing sleeve 32. The axial direction of the first contact portion 34 and the first probe 14 are The first contact portion 34 and the first fixing sleeve 32 can be fixed in a manner of being bonded or integrally formed. The inner diameter of the first contact portion 34 is larger than the outer diameter of the main body portion 302 of the lenticular lens 30, and is smaller than the outer diameter of the skirt 304, and the end surface of the first contact portion 34 contacting the lens 30 to the surface of the first fixing sleeve 32. The height of 36 is greater than the height of one side of the body portion 302 of the lenticular lens 30 opposite the surface 36 with respect to the skirt 304. The structure of the second auxiliary jig 28 is the same as that of the first auxiliary jig 26 and is opposite in position.

The second auxiliary fixture 28 includes a second fixing sleeve 54 and a second contact portion 42. The second fixing sleeve 54 has the same shape and structure as the first fixing sleeve 32, and is matched with the shape of the second measuring head 20 and sleeved on the second measuring head 20. The second fixing sleeve 54 has a first contact portion. 34 opposite surface 56. The second contact portion 42 is a hollow annular cylinder. One end of the second contact portion 42 is fixed to the surface 56 of the second fixing sleeve 54. The axial direction of the second contact portion 42 and the second probe 20 are The second contact portion 42 and the second fixing sleeve 54 may be fixed or integrally formed by being axially overlapped or parallel. The inner diameter of the second contact portion 42 is larger than the outer diameter of the main body portion 302 of the lenticular lens 30, and is smaller than the outer diameter of the skirt 304, and the end surface of the contact portion of the second contact portion 42 with the lens 30 reaches the second fixing sleeve 54. The height of the surface 36 is greater than the height of the body portion 302 of the lens 30 opposite the surface 56 relative to the skirt 304.

The method for measuring the thickness of the skirt 304 of the lenticular lens 30 by using the centimeter card 100 is as follows: 1) Referring to FIG. 1, the rotating differential cylinder 18 drives the second probe 20 to move in the direction of the first probe 14, so that An auxiliary jig 26 is in contact with the second auxiliary jig 28, and a first value is read through the scales 22 and 24.

2) Referring to FIG. 2, the lenticular lens 30 is placed between the first auxiliary jig 26 and the second auxiliary jig 28, and the first contact portion 34 of the first auxiliary jig 26 and the second auxiliary jig are placed. The contact portions 42 of 28 are respectively in contact with the two surfaces of the skirt 304. At this time, a second value is read by the scales 22 and 24, and the difference between the second value and the first value is the skirt of the lenticular lens 30. The thickness of the edge 304.

It will be appreciated that the centimeter card 100 can also measure the thickness of the skirt of a lens having only one convex surface, or the thickness of the periphery of other components having a central thickness greater than the peripheral thickness. In addition, when measuring the thickness of the skirt of the lens having only one convex surface, the centring card may mount only one of the first auxiliary jig 26 and the second auxiliary jig 28, and is not limited to the embodiment.

Referring to FIG. 3, a second embodiment of the present invention provides a centring card 200. The device under test 44 of the present embodiment is a slot body, and the component includes a bottom portion 442 and a sidewall 444 extending perpendicularly from the periphery of the bottom portion to form a pillar. The centring structure 200 is used to measure the thickness of the bottom portion 442, wherein the bottom surface area of the bottom portion 442 is smaller than the area of the end surface of the first probe 14 and the second probe 20. The structure of the card 200 is substantially the same as that of the card 100 of the first embodiment, except that the card 200 includes a third auxiliary fixture 46, and the third auxiliary fixture 46 has a first The third fixing sleeve 48 and the third fixing portion 50 are identical in structure to the first fixing sleeve 32 of the first auxiliary fixture 46 and are sleeved on the second probe 20 . The third contact portion 50 is a solid cylinder whose axial direction coincides or is parallel with the axial direction of the second probe 20, and the cross-sectional shape of the third contact portion 50 is the same as the shape of the bottom portion 442 of the element to be tested 44. The area is smaller than the area of the portion of the bottom portion 442 between the side walls 444, and the height of the contact surface of the third contact portion 50 with the device under test 44 relative to the surface 52 is greater than the height of the side wall 444 of the element under test 44 that protrudes from the bottom portion 442. The outer side of the third fixing sleeve 48 has a surface 52 opposite to the first measuring head 14. One end of the third connecting portion 50 is fixed to the surface 52 of the third fixing sleeve 48, and the fixing manner thereof can be adhesive or integral molding. . The other end surface of the contact portion 50 is a flat surface for contacting the bottom portion 442 of the device under test 44. The principle of measuring the device under test 44 by using the centimeter card 200 is basically the same as that of the card 100 of the first embodiment, and details are not described herein again.

It can be understood that the cross-sectional shape of the contact portion 50 can also be other shapes as long as the third contact portion 50 can protrude into the groove body to contact the bottom portion 442. Generally, the cross-sectional area of the third contact portion 50 is smaller than the area of the end surface of the second probe 20 to measure an element having a size smaller than the end portion of the second probe 20. Further, the third contact portion 50 may also be a probe or the like, and is not limited to the embodiment.

In addition, the centimeter card 200 can also measure the thickness of the bottom of the trough body having the trough of the trough (the truncated cone of the head) as long as the third contact portion 50 can completely contact the portion to be tested. The third auxiliary fixture 46 can also be sleeved on the first probe 14, or the first probe 14 and the second probe 20 are sleeved with a third auxiliary fixture 46 to measure the bottom of the "H" shaped trough body. The thickness. In addition, the third auxiliary jig 46 may also be a probe, and is not limited to the embodiment.

Compared with the prior art, the centimeter card 100 can measure the peripheral thickness of the component whose center thickness is greater than the peripheral thickness by using the first auxiliary fixture 26 and the second auxiliary fixture 28, and the centimeter card 200 can be measured by using the third auxiliary fixture 46. The center thickness of the component whose center thickness is smaller than the peripheral thickness does not need to be replaced with other gauges. It is only necessary to install an auxiliary fixture on the previous centimeter card to make the measurement more convenient.

In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.

Bow ruler. . . 10

Measurement department. . . 12

The first probe. . . 14

Fix the sleeve. . . 16

Differential tube. . . 18

The second probe. . . 20

Scale. . . 22,24

The first auxiliary fixture. . . 26

Second auxiliary fixture. . . 28

lens. . . 30

The first fixed set. . . 32

First contact. . . 34

surface. . . 36,52,56

Contact part. . . 42,50

The component to be tested. . . 44

Auxiliary fixture. . . 46

The third fixed set. . . 48

Second fixed set. . . 54

Centimeter card. . . 100,200

Main body. . . 302

Skirt. . . 304

bottom. . . 322,442

Annular side wall. . . 324

Side wall. . . 444

1 is a schematic view of a centimeter card of a first embodiment of the present invention.

FIG. 2 is a schematic diagram of the cooperation between the centring card and the device to be tested according to the first embodiment of the present invention.

3 is a schematic view showing the cooperation of the centring card of the second embodiment of the present invention with another component to be tested.

Bow ruler. . . 10

Contact part. . . 50

Measurement department. . . 12

The component to be tested. . . 44

The first probe. . . 14

Auxiliary fixture. . . 46

Fix the sleeve. . . 16

The third fixed set. . . 48

Differential tube. . . 18

Centimeter card. . . 200

The second probe. . . 20

bottom. . . 442

Scale. . . 22,24

Side wall. . . 444

surface. . . 52

Claims (9)

A PCT card for measuring the thickness of a thin portion of an element having an uneven thickness, the PCT card comprising two opposing probes, the improvement comprising: further comprising a first auxiliary jig, the first auxiliary jig comprising a first fixing sleeve and a first contact portion, the first fixing sleeve is disposed on one of the probes, the first fixing sleeve has an end surface opposite to the other probe, and the first contact portion is fixed to the end surface The first contact portion is configured to be in contact with the thinner portion of the device to be tested, and the distance between the contact surface of the first contact portion and the device to be tested is opposite to the end surface of the first fixed sleeve, and the distance is to be measured. The portion of the thicker portion of the component on the opposite side of the first fixing sleeve is at a second distance from the contact surface of the first contact portion and the element to be tested, and the first distance is greater than the second distance. The PCT card of claim 1, further comprising a second auxiliary fixture, the second auxiliary fixture comprising a second fixing sleeve and a second contact portion, the second fixing sleeve being sleeved on the second fixing fixture The second contact portion is fixed to an end surface of the second fixing sleeve opposite to the first contact portion, and the contact surface of the second contact portion with the device to be tested is opposite to the second fixing portion. The distance between the end faces of the sleeve is a third distance, and the portion of the thicker portion of the device to be tested on the opposite side of the second fixing sleeve is the fourth distance from the contact surface of the second contact portion and the element to be tested. The distance is greater than the fourth distance. The PCT card of claim 1, wherein the first contact portion is an annular cylinder, and an axial direction of the annular cylinder is coincident or parallel with an axial direction of the probe. The PCT card of claim 2, wherein the first contact portion and the second contact portion are respectively an annular cylinder, and the first contact portion and the second contact portion respectively correspond to the probe The axial direction of the other probe is coincident or parallel, and the first contact portion and the second contact portion are opposite to each other. The PCT card of claim 1, wherein the first contact portion is a solid cylinder, and the axial direction of the cylinder coincides with or is parallel to the axial direction of the probe. The PCT card of claim 5, wherein the probe has an end surface, the cross section of the cylinder is the same as the cross-sectional shape of the thin portion to be tested of the device to be tested, and the cylinder is cut The area is smaller than the cross-sectional area of the thin portion to be tested of the device to be tested. The PCT card of claim 2, wherein the first contact portion and the second contact portion are respectively a cylinder, and the first contact portion and the second contact portion are respectively associated with the probe and the probe The other probe is axially coincident or parallel, and the first contact portion and the second contact portion are opposite each other. The PCT card of claim 1, wherein the first contact portion is a probe. The PCT card of claim 1, wherein the fixing sleeve and the first contact portion are fixed by being bonded or integrally formed.