TWI408352B - Optical characteristic measurement apparatus - Google Patents

Abstract

An optical characteristic measurement apparatus is disclosed, which comprises: an integrating sphere, configured with a sampling hole facing toward a tested object; a plurality of swing arms, provided for a detectors and light source to be disposed thereat, each being pivotally coupled to a rotary shaft by an end thereof while allowing the extending of the axis of the rotary shaft to align with the center of the sampling hole; wherein the plural swing arms are enable to rotate centering around their corresponding rotary shafts while allowing the plural swing arms to move close or away from each other according to their respective fan-like rotation.

Description

Optical characteristic measuring device

The invention relates to an optical characteristic measuring device, in particular to a measuring device which can be applied to different display bright room comparison international specifications and can realize automatic measurement of the display room contrast (Ambient Contrast).

Whether indoors or outdoors, the contrast requirements for liquid crystal displays are getting higher and higher. Since the traditional darkroom contrast measurement method cannot reflect the contrast degree of the display under diffused light, the display contrast under the bright room is one for the display. Important performance indicators.

There are various specifications and methods for comparison and measurement of bright rooms in the world, such as NIST, VESA, ISO, IEC, MIL, JEITA, TCO, etc., and different specifications are used for different requirements.

For example, the National Institute of Standards and Technology (NIST) published a paper on comparative measurement of bright room in ADEAC (Display Engineering and Applications Conference) in 2006. Its structure uses a sampling integrating sphere to provide a uniform light source. The detector measures the reflected light of the display to be tested through the measuring hole of the integrating sphere, and the integrated sphere illuminance can be estimated by measuring the reflected brightness of the Wall Target. Because the measurement method is simple in structure and the experimental conditions are easy to control, the Video Electronic Standards Institute (VESA, Vidieo Electronics Standards Association) and the International Electro-Technical Commission (IEC) use similar structures for comparison of bright rooms. Measure.

Another example is the Military Standard MIL-L-85762A. The structure of the bright room contrast is that the detector is at an angle to the normal of the display to be tested. The direct light source provides direct and diffused light according to the erection angle. The MIL specification was established earlier (established in 1988). For the bright room ambient illumination, only the environment under strong sunlight is considered. However, because the MIL specification is the earliest specification in all the defined room comparison specifications, it is often adopted by manufacturers.

In order to achieve the spatial geometry required for the measurement specification, the user needs to design a variety of different mechanisms to meet the requirements of different specifications, and spend a lot of time to set up and adjust the system by itself.

In view of this, the present invention provides an optical characteristic measuring device, which can be applied to international specifications for comparison of bright rooms of different displays, and can realize automatic comparison measurement of the bright room of the display.

The present invention comprises an integrating sphere, a plurality of swing arms, a measuring instrument and a light source, the integrating sphere having a sampling hole facing the object to be tested; the plurality of swing arms for setting the measuring instrument, One end of each swing arm is pivotally disposed on a rotating shaft, so that the plurality of swing arms can be rotated or rotated to be centered or separated, and the axis extension line of the rotating shaft is consistent with the center point of the sampling hole of the integrating sphere .

In order to enable your review committee to have a better understanding and recognition of the structural purpose and efficacy of the present invention, the detailed description is as follows.

The technical means and efficacy of the present invention for achieving the object will be described below with reference to the accompanying drawings, and the embodiments listed in the following drawings are only for the purpose of explanation, and are to be understood by the reviewing committee, but the technical means of the present invention are not Limited to the listed figures.

As shown in the first figure, the measuring device 100 mainly includes a first swing arm 10, a second swing arm 20 and an integrating sphere 30. One end of the first swing arm 10 and the second swing arm 20 can be The first swing arm 10, the second swing arm 20 and the rotating shaft 40 are disposed on a base 50. The base 50 has a first frame body 51. The first frame body is disposed on the same rotating shaft 40. The pedestal 30 is used to erect the integrating sphere 30. The pedestal 50 has a second frame 52. The second frame 52 is used to erect a sample to be tested 60. The object to be tested 60 can be a liquid crystal display. Or related optoelectronic products such as flat panel displays, flexible displays, and electronic paper.

Please refer to the first figure, the second a picture, and the second b. The two opposite sides of the integrating sphere 30 used in the present invention are provided with a plurality of measuring holes 31 on one side and a sampling on the other side. a hole 32, the integrating sphere 30 is provided with one surface of the plurality of measuring holes 31 facing the first swing arm 10 and the second swing arm 20, and the integrating sphere 30 is provided with one surface of the sampling hole 32 facing the object to be tested 60, A detection switch 33 is disposed under the sampling hole 32. The detection switch 33 can adopt a soft stop switch or a limit switch to prevent the integrating sphere 30 from colliding with the object to be tested 60 to cause the integrating sphere 30 or The object to be tested 60 is damaged. In addition, a tungsten filament source 34 is disposed on the top of the integrating sphere 30. The tungsten filament source 34 can provide a certain brightness inside the integrating sphere 30. The integrating sphere 30 is embedded in a fixing frame 35. The holder 35 and the integrating sphere 30 are stably disposed in the first frame 51 shown in the first figure.

Referring to the first and third figures, the first swing arm 10 and the second swing arm 20 respectively have a first track 11 and a second track 21, and the first swing arm 10 is taken as an example. An extension direction A11 of the first rail 11 is perpendicular to the axial direction B of the rotating shaft 40. A first sliding seat 12 is disposed on the first rail 11 , and a first loading platform 13 is disposed at the top end of the first sliding rail 12 . The first carrier 13 carries a detector 14 , and the detector 14 is slid on the first track 11 by the first slider 12 to adjust the detector 14 and the integrating sphere 30 . The relative distance is used to change the area of the sampling area, and the angle of the detector 14 relative to the integrating sphere 30 can be adjusted by rotating the first swing arm 10 so that the detector 14 can be aligned with different measuring holes. 31. Similarly, the extending direction A21 of the second track 21 of the second swing arm 20 is perpendicular to the axial direction B of the rotating shaft 40, and the second track 21 is provided with a second sliding seat 22 on the sliding seat. A second carrier 23 is disposed at the top end of the 22, and the second carrier 23 carries a permanent light source 24, and the direct light source 24 is slidable by the second slider 22 to the second On the track 21, the relative distance between the direct light source 24 and the integrating sphere 30 is adjusted, and the angle of the direct light source 24 relative to the integrating sphere 30 can be adjusted by rotating the second swing arm 20 to make the direct light source 24 The different measuring holes 31 can be aligned to change the viewing angle of the detector 14 and the direct light source 24. As for the height of the detector 14 and the direct light source 24, the height of the integrating sphere 30 is matched, and the design is The heights of the first carrier 13 and the second carrier 23 are obtained. In fact, the positions of the detector 14 and the direct light source 24 are mutually replaceable without affecting the effect; further, to improve the first swing arm 10 and The second swing arm 20 rotates smoothly. As shown in the first figure, at least one first pulley 15 and at least one second pulley 25 can be disposed at the bottom of the first swing arm 10 and the second swing arm 20; The rotation of the swing arm 10 and the second swing arm 20 can be manually adjusted, but can also be connected to a control unit (not shown), and the first swing arm 10 and the second are automatically controlled by the control unit. The angle of rotation of the swing arm 20, the control unit can be a control software, a control program Motor, lead screw, belt or the like via a gear transmission mechanism drives the first arm 10 and second arm 20.

Referring to the first and third figures, it must be emphasized that the axis extension line 41 of the rotating shaft 40 of the present invention coincides with the center point position of the sampling hole 32 of the integrating sphere 30, and at the same time, the first track 11 The extending directions A11 and A21 of the second track 21 are perpendicular to the axis direction B of the rotating shaft 40. Therefore, the rotation angle of the first swing arm 10 and the second swing arm 20 is adjusted, or the detector is adjusted. 14 and the relative distance between the direct light source 24 and the integrating sphere 30 ensure that the detector 14 and the direct light source 24 accurately intersect at the center point of the sampling hole 32 of the integrating sphere 30 without being deviated.

Referring to the fourth figure, the schematic diagram of the top view of the first embodiment of the present invention applied to the NIST, VESA, and IEC methods and specifications is adopted. The basic structure of the NIST, VESA, ISO, and IEC bright rooms is the integrating sphere. And the detector 14 is therefore only required to rotate the second swing arm 20 to a side that does not hinder the swinging of the first swing arm 10, or the second swing arm 20 can be directly removed, so that the user The object to be tested 60 can be subjected to NIST, VESA, ISO, IEC, etc. specifications for comparison of the bright room through the integrating sphere 30 and the detector 14.

Referring to FIG. 5 , a schematic diagram of a top view of the first embodiment of the present invention applied to the MIL specification, since the basic structure of the MIL bright room comparison international specification is the detector 14 and the direct light source 24 , therefore, the present invention is The integrating sphere 30 (shown in the first figure) can be removed, so that the user can adjust the detector 14 and the direct light source 24 by rotating the first swing arm 10 and the second swing arm 20 The object to be tested 60 is subjected to the MIL specification for comparison of the bright room.

Referring to FIG. 6 and FIG. 7 , the measuring device 100A mainly includes a first swing arm 10 , a second swing arm 20 , and an integrating sphere 30 . The first swing arm 10 and the second swing arm 20 . One end is pivotally disposed on the same rotating shaft 40, and the first swinging arm 10, the second swinging arm 20, and the rotating shaft 40 are disposed on a base 50. The base 50 has a first frame 51, the first frame The body 51 is configured to erect the integrating sphere 30. The first swing arm 10 has a first track 11 , a first sliding seat 12 , a first carrying platform 13 , a detector 14 and a first pulley 15 . The second swing arm 20 has a second track 21, a second slide 22, a second stage 23, a direct light source 24 and a second pulley 25. The embodiment is characterized in that the first stage 13 is A first fine adjustment device 16 and a second fine adjustment device 26 are respectively disposed at the bottom of the second loading platform 23. The first fine adjustment device 16 and the second fine adjustment device 26 finely adjust the first carrier 13 and the second carrier 23 The height of the detector 14 and the direct light source 24 is another feature of the embodiment: the detector 14 and the direct light source 24 are respectively matched with a plurality of first apertures 17 The second aperture 27, the detector 14 and the direct light source 24 can be quickly aligned by the first aperture 17 and the second aperture 27, respectively, by the first fine adjustment device 16, the second fine adjustment device 26, and the first The arrangement of the aperture 17 and the second aperture 27 can improve the accuracy of alignment of the detector 14 and the direct source 24 with the measuring aperture 31 of the integrating sphere 30.

Referring to the sixth and eighth embodiments, another feature of the embodiment is that the object to be tested 60 is disposed on a workpiece setting platform 70 having a three-axis adjustment function, and the object setting platform 70 includes In the embodiment, the fixing base 71 is separated from the base 50, but the base 50 can be extended to form the fixing base 71. The first seat of the fixing base 71 is provided with a first sliding seat. 72, a sliding rail structure 711 is disposed between the first sliding seat 72 and the fixing base 71, so that the first sliding seat 72 can slide in a first direction A71 on the top of the fixing base 71. Secondly, the first A second sliding seat 73 is disposed on the top of the sliding block 72. A sliding rail structure 721 is disposed between the second sliding seat 73 and the first sliding seat 72, so that the second sliding seat 73 can be at the top of the first sliding seat 72. Sliding in a second direction A72; secondly, a third sliding seat 74 is disposed on the side of the second sliding seat 73, and a sliding rail structure 731 is disposed between the third sliding seat 74 and the second sliding seat 73, so that the The third sliding seat 74 can slide in the third direction A73 on the side of the second sliding seat 73. The second direction A72 and the first direction A71 are perpendicular to each other. The third direction A73 and the second direction A72 are perpendicular to each other, and the first direction A71, the second direction A72, and the third direction A73 are different from each other. In this embodiment, the first direction A71 is the X-axis direction, and the first direction The two directions A72 are in the Y-axis direction, and the third direction A73 is in the Z-axis direction. Thereby, the three-axis direction of the object to be tested 60 can be adjusted, so that the object to be tested 60 can be accurately aligned with the integrating sphere 30.

Similarly, in the second embodiment of the present invention shown in FIG. 6 , the first swing arm 10 , the second swing arm 20 , and the integrating sphere 30 may be changed according to different specifications of the bright room comparison measurement. The fourth and fifth diagrams are applied in the same way.

In summary, the bright room contrast measuring device provided by the present invention integrates instrument erection and measurement alignment for the design of the mechanism, and overcomes the limitation that a single machine meets a single specification, which not only improves measurement stability and efficiency, but also improves measurement stability and efficiency. At the same time, it can be applied to different display bright room comparison international specifications, and can reduce the cost of erection and the time required for calibration system, and realize the automatic measurement of the display room.

However, the above description is only for the embodiments of the present invention, and the scope of the invention is not limited thereto. That is to say, the equivalent changes and modifications made by the applicant in accordance with the scope of the patent application of the present invention should still fall within the scope of the patent of the present invention. I would like to ask your review committee to give a clear explanation and pray for it.

100, 100A. . . Bright room contrast measuring device

10. . . First swing arm

11. . . First track

12. . . First slide

13. . . First carrier

14. . . Detector

15. . . First pulley

16. . . First fine adjustment device

17. . . First aperture

20. . . Second swing arm

twenty one. . . Second track

twenty two. . . Second slide

twenty three. . . Second carrier

twenty four. . . Direct light source

25. . . Second pulley

26. . . Second fine adjustment device

27. . . Second aperture

30. . . Integrating sphere

31. . . Measuring hole

32. . . Sampling hole

33. . . Detection switch

34. . . Tungsten light source

35. . . Fixing frame

40. . . Rotating shaft

41. . . Axis extension of the shaft

50. . . Pedestal

51. . . First frame

52. . . Second frame

60. . . Analyte

70. . . DUT setting platform

71. . . Fixed seat

72. . . First slide

73. . . Second slide

74. . . Third slide

711, 721, 731. . . Slide structure

A11. . . The direction of extension of the first track

A21. . . Extension direction of the second track

A71. . . First direction

A72. . . Second direction

A73. . . Third direction

B. . . Axis direction of the shaft

The first figure is a schematic perspective view of a first embodiment of the present invention.

The second a diagram and the second b diagram are schematic diagrams of the three-dimensional structure of the integrating sphere of the present invention at different angles.

The third figure is a schematic top view of the relative position of the rotating shaft and the integrating sphere of the present invention.

The fourth figure is a schematic diagram of a top view of the first embodiment of the invention applied to the NIST, VESA, and IEC methods and specifications.

The fifth figure is a schematic plan view of the first embodiment of the invention applied to the MIL specification.

Figure 6 is a schematic perspective view of a second embodiment of the present invention.

Figure 7 is a perspective view showing the structure of a part of the structure of the second embodiment of the present invention.

The eighth figure is a three-dimensional structure diagram of the object setting platform of the second embodiment of the present invention.

100. . . Bright room contrast measuring device

10. . . First swing arm

11. . . First track

12. . . First slide

13. . . First carrier

14. . . Detector

15. . . First pulley

20. . . Second swing arm

twenty one. . . Second track

twenty two. . . Second slide

twenty three. . . Second carrier

twenty four. . . Direct light source

25. . . Second pulley

30. . . Integrating sphere

31. . . Measuring hole

34. . . Tungsten light source

35. . . Fixing frame

40. . . Rotating shaft

41. . . Axis extension of the shaft

50. . . Pedestal

51. . . First frame

52. . . Second frame

60. . . Analyte

A11. . . The direction of extension of the first track

A21. . . Extension direction of the second track

B. . . Axis direction of the shaft

Claims (8)

An optical characteristic measuring device comprising: a photodetector; a first frame; an integrating sphere disposed on the first frame, the integrating sphere having at least one measuring hole and one sampling hole; One of the plurality of swing arms is configured to set the light detectors, and one end of each of the swing arms is pivotally disposed on the same rotating shaft, so that the swing arms can be rotated about the rotating shaft. The optical characteristic measuring device according to claim 1, further comprising a light source disposed on the other end of each of the swing arms. The optical characteristic measuring device according to claim 2, wherein each of the swing arms has a track extending in a direction perpendicular to an axial direction of the rotating shaft, and each of the tracks is provided with a sliding seat. Slide on the track. The optical characteristic measuring device according to claim 3, wherein a top of each of the sliding seats is provided with a carrying platform for carrying the light detector and the light source. The optical characteristic measuring device according to claim 4, wherein the carrying platform has a fine adjustment device for finely adjusting the height of the carrying platform. The optical characteristic measuring device according to claim 2, wherein the light source is a collimated light source. The optical characteristic measuring device of claim 1, further comprising a DUT setting platform for setting the object to be tested, comprising: a first sliding seat is disposed on the fixing base to perform a first direction sliding on the fixing seat; a second sliding seat is disposed on the first sliding seat, The first sliding seat is slid in a second direction; and a third sliding seat is disposed on the second sliding seat to perform a third direction sliding on the second sliding seat, the third The slide is used to set the object to be tested. The optical characteristic measuring device according to claim 1, further comprising a control unit for controlling the rotation of the swing arms.