TWI404947B - Measurement apparatus - Google Patents
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Abstract
Description
本發明係與一種檢測裝置有關，特別是與一種檢測天線之反射係數的檢測裝置有關。The invention relates to a detection device, in particular to a detection device for detecting the reflection coefficient of an antenna.
於微波探測系統中，天線係用來作為一個接收及發射系統的重要組成部分，其之性能的優劣，將直接影響到全系統的檢測能力和探測精度。其中，在天線的所有量測參數中，例如天線的匹配特性、天線阻抗、微波裝置的反射特性和傳輸特性等參數以及其之反射係數，於分析與驗證當中是最為重要的參考指標。藉由反射係數可得知待測天線的共振頻率和頻寬，以讓設計者在模擬或量測時得以用來判斷是否符合設計的目標，並作為調整尺寸或結構的依據。In the microwave detection system, the antenna is used as an important part of a receiving and transmitting system, and its performance will directly affect the detection capability and detection accuracy of the whole system. Among them, all the measurement parameters of the antenna, such as the matching characteristics of the antenna, the antenna impedance, the reflection characteristics and the transmission characteristics of the microwave device, and the reflection coefficient thereof are the most important reference indicators in the analysis and verification. The reflection coefficient and the bandwidth of the antenna to be tested can be known by the reflection coefficient, so that the designer can use it to judge whether it meets the design goal during simulation or measurement, and as a basis for adjusting the size or structure.
在目前習知的天線檢測裝置中，以網路分析儀的運用最為廣泛。網路分析儀是一個雙埠的微波接收器，其利用內部的參考訊號來比較待測天線的入射、反射及穿透波大小與相位。在系統運作時對待測天線所欲量測的微波頻段進行掃描，以取得其之入射、反射與穿透的射頻訊號，之後利用降頻器將射頻訊號轉換為數位訊號，以方便電腦作處理運算，進而顯示出反射係數的大小和相位，或計算諸如駐波比(standing wave ratio,SWR)、群速度延遲(Group Delay)、反射損耗(Return Loss)、阻抗等與反射係數相關的其他物理量之參數資訊。Among the conventional antenna detecting devices, the network analyzer is most widely used. The network analyzer is a dual-turn microwave receiver that uses internal reference signals to compare the incident, reflected, and transmitted wave magnitudes and phases of the antenna under test. During the operation of the system, the microwave frequency band to be measured by the antenna is scanned to obtain the incident, reflected and transmitted RF signals, and then the frequency converter is converted into a digital signal by using a down-converter to facilitate the computer to perform processing operations. , in turn, showing the magnitude and phase of the reflection coefficient, or calculating other physical quantities related to the reflection coefficient such as standing wave ratio (SWR), group velocity delay (Group Delay), reflection loss (Return Loss), impedance, and the like. Parameter information.
然而，網路分析儀本身的價格十分昂貴且其之裝置不易攜帶，無法提供使用者可隨時隨地進行天線檢測之便利性。因此，如何提供一成本低廉且攜帶方便的天線檢測裝置，是本技術領域亟欲解決之問題。However, the network analyzer itself is very expensive and its device is not easy to carry, and it is not convenient for the user to perform antenna detection anytime and anywhere. Therefore, how to provide an antenna detecting device which is low in cost and convenient to carry is a problem to be solved in the technical field.
本發明之一目的在於提供一檢測裝置，其係適用於量測天線之反射係數，以得知天線之阻抗匹配資訊。It is an object of the present invention to provide a detection device that is adapted to measure the reflection coefficient of an antenna to know the impedance matching information of the antenna.
本發明的其他目的和優點可以從本發明所揭露的技術特徵中得到進一步的了解。Other objects and advantages of the present invention will become apparent from the technical features disclosed herein.
為達上述之一或部份或全部目的或是其他目的，本發明之一實施例的一種檢測裝置，係適用於檢測一天線之一反射係數，其包括一射頻導引器、一壓控震盪器、一偵測器及一處理器。射頻導引器具有一第一通道及一第二通道。壓控震盪器連接於射頻導引器之第一通道，並且提供一射頻訊號，其中射頻訊號具有一頻率，並且係適於通過第一通道而傳送至天線。偵測器係連接於射頻導引器之第二通道，當天線接收射頻訊號而產生一反射訊號時，反射訊號係適於通過第二通道而傳送至偵測器，其中反射訊號具有一反射能量，偵測器會量測反射能量之大小，而產生一直流電訊號，其中直流電訊號具有一電壓值。處理器訊號係連接至偵測器及壓控震盪器，以供接收直流電訊號及射頻訊號，並根據直流電訊號的電壓值及射頻訊號之頻率，來進行運算而得到反射係數。其中，射頻導引器具有一第一埠、一第二埠及一第三埠，第一通道係連接於第一埠與第二埠之間，而第二通道係連接於第二埠及第三埠之間，其中第一埠訊號係連接至壓控震盪器，第二埠訊號係連接至天線，同時第三埠訊號係連接至偵測器。射頻導引器可以例如為一方向耦合器或一環行器。In order to achieve one or a part or all of the above or other purposes, a detecting apparatus according to an embodiment of the present invention is suitable for detecting a reflection coefficient of an antenna, which includes a radio frequency guide and a voltage controlled oscillation. , a detector and a processor. The RF guide has a first channel and a second channel. The voltage controlled oscillator is coupled to the first channel of the RF guide and provides an RF signal, wherein the RF signal has a frequency and is adapted to be transmitted to the antenna through the first channel. The detector is connected to the second channel of the RF guide. When the antenna receives the RF signal and generates a reflected signal, the reflected signal is adapted to be transmitted to the detector through the second channel, where the reflected signal has a reflected energy. The detector measures the amount of reflected energy to generate a constant current signal, wherein the direct current signal has a voltage value. The processor signal is connected to the detector and the voltage controlled oscillator for receiving the DC signal and the RF signal, and calculating the reflection coefficient according to the voltage value of the DC signal and the frequency of the RF signal. The radio frequency guide has a first port, a second port and a third port. The first channel is connected between the first port and the second port, and the second channel is connected to the second port and the third port. Between the two, the first signal is connected to the voltage controlled oscillator, the second signal is connected to the antenna, and the third signal is connected to the detector. The RF director can be, for example, a directional coupler or a circulator.
在一實施例中，本發明之檢測裝置更包括：一電源供應器及一電壓計。電源供應器係電性連接於壓控震盪器及處理器之間，並將一直流偏壓提供給壓控震盪器，以控制射頻訊號之該頻率。其中，處理器會將一控制訊號提供給電源供應器，以調整直流偏壓的大小。電壓計訊號會連接於偵測器及處理器之間，以將直流電訊號轉換為一數位訊號。In an embodiment, the detecting device of the present invention further comprises: a power supply and a voltmeter. The power supply is electrically connected between the voltage controlled oscillator and the processor, and provides a constant current bias to the voltage controlled oscillator to control the frequency of the RF signal. The processor provides a control signal to the power supply to adjust the DC bias voltage. The voltmeter signal is connected between the detector and the processor to convert the DC signal into a digital signal.
有關本發明之前述及其他技術內容、特點與功效，將可在以下配合參考圖式之一較佳實施例的詳細說明下清楚的呈現。以下於實施例中所提到的例如：上、下、左、右、前或後等方向用語，僅是參考附加圖式的方向。因此，該等方向用語是用來說明並非用來限制本發明。The above and other technical contents, features and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments. The following terms, such as: up, down, left, right, front or back, are referred to in the embodiments, and are merely directions referring to the additional drawings. Therefore, the directional terms are used to describe the invention and are not intended to limit the invention.
本發明提出一可自動化量測天線之阻抗匹配效能的檢測裝置，將檢測裝置藉由通訊埠與電腦連接以進行整合，即可達到資料處理及使用之便利性，並直接由電腦之一顯示螢幕來顯示天線之量測結果，而達到自動化的目的。本發明的實施例之檢測裝置，係適用於量測天線之反射係數，並進一步進行計算以得到天線的阻抗匹配效能。The invention provides a detecting device capable of automatically measuring the impedance matching performance of the antenna, and the detecting device is connected with the computer through the communication port for integration, thereby achieving the convenience of data processing and use, and directly displaying the screen by one of the computers. To display the measurement results of the antenna, and achieve the purpose of automation. The detecting device of the embodiment of the present invention is suitable for measuring the reflection coefficient of the antenna, and further calculating to obtain the impedance matching performance of the antenna.
請參照第一圖，係為本發明實施例之檢測裝置的示意圖。一種檢測裝置10，其係應用於檢測一天線A之一反射係數，其包括一壓控震盪器100(Voltage Control Oscillator)、一電源供應器110、一射頻導引器200、一偵測器300(Power Detector)、一電壓計400(Multimeter)及一處理器500。Please refer to the first figure, which is a schematic diagram of a detecting device according to an embodiment of the present invention. A detecting device 10 is used for detecting a reflection coefficient of an antenna A, which includes a voltage controlled oscillator 100 (Voltage Control Oscillator), a power supply 110, a radio frequency guide 200, and a detector 300. (Power Detector), a voltmeter 400 (Multimeter) and a processor 500.
由於天線檢測裝置10主要係由射頻電路及控制電路所組成，因此，以下將把天線檢測裝置10中之元件分為射頻電路部份以及控制電路部份來詳細說明。其中，電源供應器110、射頻導引器200及偵測器300係屬於天線檢測裝置10中之射頻電路部份，而電源供應器110、電壓計400及處理器500則屬於天線檢測裝置10中之控制電路部份。Since the antenna detecting device 10 is mainly composed of a radio frequency circuit and a control circuit, the components in the antenna detecting device 10 will be divided into a radio frequency circuit portion and a control circuit portion to be described in detail below. The power supply 110, the RF guide 200, and the detector 300 belong to the RF circuit portion of the antenna detecting device 10, and the power supply 110, the voltmeter 400, and the processor 500 belong to the antenna detecting device 10. The control circuit part.
在射頻電路部份中，壓控震盪器100可以提供一射頻訊號R1，並且射頻訊號R1係具有一頻率f。射頻導引器200，係用以連接至待測天線A，藉此於壓控震盪器100與天線A之間形成訊號連接，並且將由壓控震盪器100發射之射頻訊號R1導引至天線A，然後由天線A擷取因阻抗不匹配所彈回的反射訊號R2，其中反射訊號R2具有一反射能量E。此外，射頻導引器200具有一第一通道D1及一第二通道D2，並且壓控震盪器100係連接於射頻導引器200之第一通道D1，射頻訊號R1係適於通過第一通道D1而傳送至天線A。在一實施例中，射頻導引器200係為一個三埠的微波元件，其具有一第一埠201、一第二埠202及一第三埠203，第一通道D1係連接於第一埠201及第二埠202之間，而第二通道D2則係連接於第二埠202及第三埠203之間。第一埠201係訊號連接至壓控震盪器100，第二埠202則係訊號連接至天線A，並且第三埠203係訊號連接至偵測器300。其中，射頻導引器200係為一方向耦合器(Directional Coupler)或一環行器(Circulator)。In the RF circuit portion, the voltage controlled oscillator 100 can provide an RF signal R1, and the RF signal R1 has a frequency f. The RF guide 200 is connected to the antenna A to be tested, thereby forming a signal connection between the voltage controlled oscillator 100 and the antenna A, and guiding the RF signal R1 transmitted by the voltage controlled oscillator 100 to the antenna A. Then, the reflected signal R2 rebounded by the impedance mismatch is taken by the antenna A, wherein the reflected signal R2 has a reflected energy E. In addition, the RF guide 200 has a first channel D1 and a second channel D2, and the voltage controlled oscillator 100 is connected to the first channel D1 of the RF guide 200, and the RF signal R1 is adapted to pass through the first channel. D1 is transmitted to antenna A. In one embodiment, the RF guide 200 is a three-turn microwave component having a first port 201, a second port 202, and a third port 203. The first channel D1 is coupled to the first port. The second channel D2 is connected between the second port 202 and the third port 202. The first 201 signal is connected to the voltage controlled oscillator 100, the second signal 202 is connected to the antenna A, and the third signal 203 is connected to the detector 300. The RF guide 200 is a Directional Coupler or a Circulator.
偵測器300係訊號連接至射頻導引器200之第二通道D2，以接收由射頻導引器200之第三埠203所發射之反射訊號R2，反射訊號R2係適於通過射頻導引器200之第二通道D2而傳送至偵測器300。偵測器300會量測反射訊號R2之反射能量E，並根據反射能量E之大小，來產生一直流電訊號R3，其中直流電訊號係具有一電壓值V。也就是偵測器300會依據反射能量E的大小來提供一電壓值V，其中天線A之反射能量E的大小與偵測器所產生之直流電訊號R3的電壓值的大小具有一線性關係。The detector 300 is connected to the second channel D2 of the RF guide 200 to receive the reflected signal R2 emitted by the third port 203 of the RF director 200. The reflected signal R2 is adapted to pass the RF guide. The second channel D2 of 200 is transmitted to the detector 300. The detector 300 measures the reflected energy E of the reflected signal R2 and generates a constant current signal R3 according to the magnitude of the reflected energy E, wherein the direct current signal has a voltage value V. That is, the detector 300 provides a voltage value V according to the magnitude of the reflected energy E. The magnitude of the reflected energy E of the antenna A has a linear relationship with the magnitude of the voltage value of the direct current signal R3 generated by the detector.
在控制電路部份中，電壓計400係於偵測器300及處理器500之間形成訊號連接，以量測在經由偵測器300所轉換的直流電訊號R3中所夾帶的電壓值V，並且電壓計400會將直流電訊號R3轉換為一數位訊號R4，以將數位訊號R4傳送至處理器500。其中，電壓計400包括一類比數位轉換介面。In the control circuit portion, the voltmeter 400 forms a signal connection between the detector 300 and the processor 500 to measure the voltage value V entrained in the DC signal R3 converted by the detector 300, and The voltmeter 400 converts the DC signal R3 into a digital signal R4 to transmit the digital signal R4 to the processor 500. Among them, the voltmeter 400 includes an analog-to-digital conversion interface.
處理器500可以例如為一電腦，其係於偵測器400以及壓控震盪器100之間形成訊號連接，以接收來自偵測器400所發送之數位訊號R4，以及壓控震盪器100之射頻訊號R1，並根據數位訊號R4所提供之電壓值V及射頻訊號R1之頻率f，以進行計算而得到天線A之一反射係數。The processor 500 can be, for example, a computer that forms a signal connection between the detector 400 and the voltage controlled oscillator 100 to receive the digital signal R4 sent from the detector 400 and the RF of the voltage controlled oscillator 100. The signal R1 is obtained according to the voltage value V provided by the digital signal R4 and the frequency f of the RF signal R1 to obtain a reflection coefficient of the antenna A.
在一實施例中，電源供應器110可以例如為一可程式直流電源供應器(Programmable D.C.Power Supply)，其係電性連接於壓控震盪器100及處理器500之間，以將一直流偏壓C提供給壓控震盪器100，並藉由處理器500來執行一使用者所撰寫之程式，而電源供應器110所提供的直流偏壓C之量值，係根據處理器500發送至壓控震盪器100之一控制訊號S來調變。藉由調變直流偏壓C，壓控震盪器100可調整射頻訊號R1之頻率f，以利用夾帶有頻率f之射頻訊號R1來掃描天線A。In an embodiment, the power supply 110 can be, for example, a programmable DC power supply, which is electrically connected between the voltage controlled oscillator 100 and the processor 500. The pressure C is supplied to the voltage controlled oscillator 100, and the program written by the user is executed by the processor 500, and the magnitude of the DC bias C provided by the power supply 110 is sent to the voltage according to the processor 500. One of the control oscillators 100 controls the signal S to be modulated. By adjusting the DC bias voltage C, the voltage controlled oscillator 100 can adjust the frequency f of the RF signal R1 to scan the antenna A by using the RF signal R1 with the frequency f.
以下將上述元件之間的互動關係作詳細說明。The interaction between the above components will be described in detail below.
壓控震盪器100會接收來自電源供應器110之直流偏壓C，並根據直流偏壓C之大小以提供射頻訊號R1，其中射頻訊號R1所具有之頻率f大小係由直流偏壓C之大小來決定。壓控震盪器100會將射頻訊號R1提供至射頻導引器200之第一埠201以使其可被接收。The voltage controlled oscillator 100 receives the DC bias C from the power supply 110 and provides an RF signal R1 according to the DC bias C. The frequency f of the RF signal R1 is determined by the DC bias C. To decide. The voltage controlled oscillator 100 provides an RF signal R1 to the first port 201 of the RF director 200 to be received.
射頻導引器200會將來自壓控震盪器100之射頻訊號R1由第一埠201輸入後，沿著射頻導引器200之第一通道D1而自第二埠202傳送至天線A，天線A在接收到射頻訊號R1後，天線A將因阻抗不匹配而將一反射訊號R2反彈回至射頻導引器200，再由射頻導引器200之第二埠202接收天線A所反彈之一反射訊號R2後，沿著第二通道D2以由第三埠203傳送至偵測器300。The RF controller 200 transmits the RF signal R1 from the voltage controlled oscillator 100 from the first port 201, and then from the second port 202 to the antenna A along the first channel D1 of the RF director 200. The antenna A After receiving the RF signal R1, the antenna A will bounce a reflected signal R2 back to the RF guide 200 due to the impedance mismatch, and then the second antenna 202 of the RF guide 200 receives a reflection from the antenna A. After the signal R2, it is transmitted to the detector 300 along the second channel D2 by the third port 203.
偵測器300會接收來自天線A所反彈的反射能量E，並量測反射能量E的功率，再依其之功率大小而將反射訊號R2線性轉換為一直流電訊號R3，直流電訊號R3所夾帶之電壓值V會輸出至電壓計400。電壓計400會將直流電訊號R3轉換為數位訊號R4，並經由通訊介面將代表電壓大小的數位訊號R4傳遞給處理器500。處理器500則會依掃描頻率f與所量測到的反射能量E之大小，來計算天線A之反射係數，並進一步由處理器500來執行程式並進行資料整合運算，以獲取天線A之阻抗匹配特性。The detector 300 receives the reflected energy E rebounded from the antenna A, and measures the power of the reflected energy E, and then linearly converts the reflected signal R2 into a constant current signal R3 according to the power level thereof, and the DC signal R3 is entrained. The voltage value V is output to the voltmeter 400. The voltmeter 400 converts the DC signal R3 into a digital signal R4 and transmits the digital signal R4 representing the magnitude of the voltage to the processor 500 via the communication interface. The processor 500 calculates the reflection coefficient of the antenna A according to the scanning frequency f and the measured reflected energy E, and further executes the program by the processor 500 and performs data integration operation to obtain the impedance of the antenna A. Matching characteristics.
處理器500藉由發送控制訊號S，來調變電源供應器110之直流偏壓C，使得壓控震盪器100可調整射頻訊號R1之頻率f，以利用夾帶有頻率f之射頻訊號R1來掃描天線A，並擷取所回傳的反射能量E之功率大小，而將量測的結果繪圖輸出至顯示單元，如第二圖所示。其中，橫軸代表射頻訊號R1之頻率f，其之單位為千兆赫茲(gigahertz,GHz)，縱軸代表由處理器500根據頻率f及反射能量E來進行運算，而得到反射係數，其之單位為dB，其所操作之頻率f為2.0至2.8 GHz，可量測到的最小反射係數約為-20 dB，在操作頻段範圍中共掃描65個點，所需的時間約為30秒鐘。曲線L表示在不同的頻率f下，反射係數的數值大小，根據反射係數的數值大小可判斷天線A是否達成阻抗匹配，當反射係數越小，則天線A之阻抗匹配越佳。也就是當頻率f落在2.5 GHz至2.6 GHz之間時，可得到最佳的阻抗匹配。The processor 500 modulates the DC bias C of the power supply 110 by transmitting the control signal S, so that the voltage controlled oscillator 100 can adjust the frequency f of the RF signal R1 to scan using the RF signal R1 with the frequency f. Antenna A, and draws the power of the reflected energy E returned, and outputs the measured result to the display unit, as shown in the second figure. Wherein, the horizontal axis represents the frequency f of the radio frequency signal R1, and the unit thereof is gigahertz (GHz), and the vertical axis represents that the processor 500 performs the operation according to the frequency f and the reflected energy E to obtain a reflection coefficient. The unit is dB, which operates at a frequency f of 2.0 to 2.8 GHz. The measurable minimum reflection coefficient is approximately -20 dB. A total of 65 points are scanned over the operating frequency range. The time required is approximately 30 seconds. The curve L indicates the magnitude of the reflection coefficient at different frequencies f. According to the magnitude of the reflection coefficient, it can be determined whether the antenna A achieves impedance matching. When the reflection coefficient is smaller, the impedance matching of the antenna A is better. That is, when the frequency f falls between 2.5 GHz and 2.6 GHz, the best impedance matching can be obtained.
相較於習知的用於量測天線阻抗之網路分析儀，本發明之檢測裝置具有裝置簡單以及價格較低之優勢，並且可提供與網路分析儀量測結果相近之阻抗匹配分析。藉由壓控震盪器、電源供應器、環行器或方向耦合器、能量偵測器、電壓計以及電腦等等價格平實的元件，即可架構出本發明之檢測裝置，進而使得其之成本降低。Compared with the conventional network analyzer for measuring antenna impedance, the detection device of the present invention has the advantages of simple device and low price, and can provide impedance matching analysis similar to the network analyzer measurement result. By means of a price-controlled component such as a voltage controlled oscillator, a power supply, a circulator or a directional coupler, an energy detector, a voltmeter, and a computer, the detection device of the present invention can be constructed, thereby making the cost thereof reduce.
惟以上所述者，僅為本發明之較佳實施例而已，當不能以此限定本發明實施之範圍，即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾，皆仍屬本發明專利所涵蓋之範圍內。另外本發明的任一實施例或申請專利範圍皆不須達成本發明所揭露之全部目的或優點或特點。此外，本發明之摘要部分和標題僅是用來輔助專利文件搜尋之用，並非用來限制本發明之權利範圍。The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the present invention. In addition, it is not necessary to achieve all of the objects or advantages or features disclosed in the present invention. In addition, the abstract and headings of the present invention are only used to assist in the search of patent documents, and are not intended to limit the scope of the invention.
10．．．檢測裝置10. . . Testing device
100．．．壓控震盪器100. . . Voltage controlled oscillator
110．．．電源供應器110. . . Power Supplier
200．．．射頻導引器200. . . RF guide
201．．．第一埠201. . . First
202．．．第二埠202. . . Second
203．．．第三埠203. . . Third
300．．．偵測器300. . . Detector
400．．．電壓計400. . . Voltmeter
500．．．處理器500. . . processor
A．．．天線A. . . antenna
C．．．直流偏壓C. . . DC bias
D1．．．第一通道D1. . . First channel
D2．．．第二通道D2. . . Second channel
E．．．反射能量E. . . Reflected energy
f．．．頻率f. . . frequency
S．．．控制訊號S. . . Control signal
V．．．電壓值V. . . Voltage value
R1．．．射頻訊號R1. . . RF signal
R2．．．反射訊號R2. . . Reflection signal
R3．．．直流電訊號R3. . . DC signal
R4．．．數位訊號R4. . . Digital signal
L．．．曲線L. . . curve
第一圖，係為本發明實施例之檢測裝置的示意圖。The first figure is a schematic diagram of a detecting device according to an embodiment of the present invention.
第二圖，係為本發明實施例之檢測裝置所量測到反射係數與頻率之曲線圖。The second figure is a graph of the measured reflection coefficient and frequency measured by the detecting device of the embodiment of the present invention.
10．．．檢測裝置10. . . Testing device
100．．．壓控震盪器100. . . Voltage controlled oscillator
110．．．電源供應器110. . . Power Supplier
200．．．射頻導引器200. . . RF guide
201．．．第一埠201. . . First
202．．．第二埠202. . . Second
203．．．第三埠203. . . Third
300．．．偵測器300. . . Detector
400．．．電壓計400. . . Voltmeter
500．．．處理器500. . . processor
A．．．天線A. . . antenna
C．．．直流偏壓C. . . DC bias
D1．．．第一通道D1. . . First channel
D2．．．第二通道D2. . . Second channel
E．．．反射能量E. . . Reflected energy
f．．．頻率f. . . frequency
S．．．控制訊號S. . . Control signal
R1．．．射頻訊號R1. . . RF signal
R2．．．反射訊號R2. . . Reflection signal
R3．．．直流電訊號R3. . . DC signal
R4．．．數位訊號R4. . . Digital signal
Claims (7)
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| TW100101578A TWI404947B (en) | 2011-01-17 | 2011-01-17 | Measurement apparatus |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6366254B1 (en) * | 2000-03-15 | 2002-04-02 | Hrl Laboratories, Llc | Planar antenna with switched beam diversity for interference reduction in a mobile environment |
| US20050057394A1 (en) * | 2003-09-15 | 2005-03-17 | Lg Telecom, Ltd. | Beam switching antenna system and method and apparatus for controlling the same |
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2011
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6366254B1 (en) * | 2000-03-15 | 2002-04-02 | Hrl Laboratories, Llc | Planar antenna with switched beam diversity for interference reduction in a mobile environment |
| US20050057394A1 (en) * | 2003-09-15 | 2005-03-17 | Lg Telecom, Ltd. | Beam switching antenna system and method and apparatus for controlling the same |
Non-Patent Citations (1)
| Title |
|---|
| Shao-En Hsu，"A Beam Switching Planar Yagi-patch Array for Automotive Applications"，PIERS Online，2010。 * |
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