TWI404907B - - Google Patents

Info

Publication number
TWI404907B
TWI404907B TW98131629A TW98131629A TWI404907B TW I404907 B TWI404907 B TW I404907B TW 98131629 A TW98131629 A TW 98131629A TW 98131629 A TW98131629 A TW 98131629A TW I404907 B TWI404907 B TW I404907B
Authority
TW
Taiwan
Prior art keywords
laser
sensor unit
laser light
under test
unit
Prior art date
Application number
TW98131629A
Other languages
English (en)
Chinese (zh)
Other versions
TW201111739A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98131629A priority Critical patent/TW201111739A/zh
Publication of TW201111739A publication Critical patent/TW201111739A/zh
Application granted granted Critical
Publication of TWI404907B publication Critical patent/TWI404907B/zh

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
TW98131629A 2009-09-18 2009-09-18 Lens mount for use in measurement device TW201111739A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98131629A TW201111739A (en) 2009-09-18 2009-09-18 Lens mount for use in measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98131629A TW201111739A (en) 2009-09-18 2009-09-18 Lens mount for use in measurement device

Publications (2)

Publication Number Publication Date
TW201111739A TW201111739A (en) 2011-04-01
TWI404907B true TWI404907B (en, 2012) 2013-08-11

Family

ID=44908986

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98131629A TW201111739A (en) 2009-09-18 2009-09-18 Lens mount for use in measurement device

Country Status (1)

Country Link
TW (1) TW201111739A (en, 2012)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI490077B (zh) * 2012-11-30 2015-07-01 Ind Tech Res Inst 校準裝置及多軸機械之補償方法
TWI622846B (zh) * 2016-12-30 2018-05-01 宏碁股份有限公司 攝像裝置以及其補光方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0094835B1 (en) * 1982-05-17 1988-03-30 National Research Development Corporation Apparatus for investigation of a surface
EP0297254A1 (en) * 1987-05-12 1989-01-04 Olympus Optical Co., Ltd. Fine surface profile measuring apparatus
US4930896A (en) * 1985-03-27 1990-06-05 Olympus Optical Co., Ltd. Surface structure measuring apparatus
TW436608B (en) * 1998-11-30 2001-05-28 Olympus Optical Co Measuring device
US20070262232A1 (en) * 2006-05-15 2007-11-15 Leica Microsystems (Schweiz) Ag Autofocus system and method for autofocusing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0094835B1 (en) * 1982-05-17 1988-03-30 National Research Development Corporation Apparatus for investigation of a surface
US4930896A (en) * 1985-03-27 1990-06-05 Olympus Optical Co., Ltd. Surface structure measuring apparatus
EP0297254A1 (en) * 1987-05-12 1989-01-04 Olympus Optical Co., Ltd. Fine surface profile measuring apparatus
TW436608B (en) * 1998-11-30 2001-05-28 Olympus Optical Co Measuring device
US20070262232A1 (en) * 2006-05-15 2007-11-15 Leica Microsystems (Schweiz) Ag Autofocus system and method for autofocusing

Also Published As

Publication number Publication date
TW201111739A (en) 2011-04-01

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