TWI400763B - - Google Patents
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- Publication number
- TWI400763B TWI400763B TW99100406A TW99100406A TWI400763B TW I400763 B TWI400763 B TW I400763B TW 99100406 A TW99100406 A TW 99100406A TW 99100406 A TW99100406 A TW 99100406A TW I400763 B TWI400763 B TW I400763B
- Authority
- TW
- Taiwan
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW99100406A TW201125056A (en) | 2010-01-08 | 2010-01-08 | Thermal efficiency measurement system of solar cell components and its method thereof. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW99100406A TW201125056A (en) | 2010-01-08 | 2010-01-08 | Thermal efficiency measurement system of solar cell components and its method thereof. |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201125056A TW201125056A (en) | 2011-07-16 |
TWI400763B true TWI400763B (en) | 2013-07-01 |
Family
ID=45047322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW99100406A TW201125056A (en) | 2010-01-08 | 2010-01-08 | Thermal efficiency measurement system of solar cell components and its method thereof. |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201125056A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109926341A (en) * | 2019-03-26 | 2019-06-25 | 武汉大学 | Silicon photrouics scanning vortex thermal imaging detection platform and defect classification method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050252545A1 (en) * | 2004-05-12 | 2005-11-17 | Spire Corporation | Infrared detection of solar cell defects under forward bias |
US20090179651A1 (en) * | 2008-01-10 | 2009-07-16 | Applied Materials, Inc. | Photovoltaic cell solar simulator |
-
2010
- 2010-01-08 TW TW99100406A patent/TW201125056A/en not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050252545A1 (en) * | 2004-05-12 | 2005-11-17 | Spire Corporation | Infrared detection of solar cell defects under forward bias |
US20090179651A1 (en) * | 2008-01-10 | 2009-07-16 | Applied Materials, Inc. | Photovoltaic cell solar simulator |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109926341A (en) * | 2019-03-26 | 2019-06-25 | 武汉大学 | Silicon photrouics scanning vortex thermal imaging detection platform and defect classification method |
Also Published As
Publication number | Publication date |
---|---|
TW201125056A (en) | 2011-07-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |