TWI400763B - - Google Patents

Info

Publication number
TWI400763B
TWI400763B TW99100406A TW99100406A TWI400763B TW I400763 B TWI400763 B TW I400763B TW 99100406 A TW99100406 A TW 99100406A TW 99100406 A TW99100406 A TW 99100406A TW I400763 B TWI400763 B TW I400763B
Authority
TW
Taiwan
Application number
TW99100406A
Other languages
Chinese (zh)
Other versions
TW201125056A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW99100406A priority Critical patent/TW201125056A/en
Publication of TW201125056A publication Critical patent/TW201125056A/en
Application granted granted Critical
Publication of TWI400763B publication Critical patent/TWI400763B/zh

Links

TW99100406A 2010-01-08 2010-01-08 Thermal efficiency measurement system of solar cell components and its method thereof. TW201125056A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99100406A TW201125056A (en) 2010-01-08 2010-01-08 Thermal efficiency measurement system of solar cell components and its method thereof.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99100406A TW201125056A (en) 2010-01-08 2010-01-08 Thermal efficiency measurement system of solar cell components and its method thereof.

Publications (2)

Publication Number Publication Date
TW201125056A TW201125056A (en) 2011-07-16
TWI400763B true TWI400763B (en) 2013-07-01

Family

ID=45047322

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99100406A TW201125056A (en) 2010-01-08 2010-01-08 Thermal efficiency measurement system of solar cell components and its method thereof.

Country Status (1)

Country Link
TW (1) TW201125056A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109926341A (en) * 2019-03-26 2019-06-25 武汉大学 Silicon photrouics scanning vortex thermal imaging detection platform and defect classification method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050252545A1 (en) * 2004-05-12 2005-11-17 Spire Corporation Infrared detection of solar cell defects under forward bias
US20090179651A1 (en) * 2008-01-10 2009-07-16 Applied Materials, Inc. Photovoltaic cell solar simulator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050252545A1 (en) * 2004-05-12 2005-11-17 Spire Corporation Infrared detection of solar cell defects under forward bias
US20090179651A1 (en) * 2008-01-10 2009-07-16 Applied Materials, Inc. Photovoltaic cell solar simulator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109926341A (en) * 2019-03-26 2019-06-25 武汉大学 Silicon photrouics scanning vortex thermal imaging detection platform and defect classification method

Also Published As

Publication number Publication date
TW201125056A (en) 2011-07-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees