TWI397005B - Ghost Detection Method for Capacitive Touchpad - Google Patents

Ghost Detection Method for Capacitive Touchpad Download PDF

Info

Publication number
TWI397005B
TWI397005B TW98100351A TW98100351A TWI397005B TW I397005 B TWI397005 B TW I397005B TW 98100351 A TW98100351 A TW 98100351A TW 98100351 A TW98100351 A TW 98100351A TW I397005 B TWI397005 B TW I397005B
Authority
TW
Taiwan
Prior art keywords
capacitance value
trace
ghost
location
capacitance
Prior art date
Application number
TW98100351A
Other languages
Chinese (zh)
Other versions
TW201027410A (en
Inventor
Chia Hsing Lin
Yi Hsin Tao
Original Assignee
Elan Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Priority to TW98100351A priority Critical patent/TWI397005B/en
Priority to US12/649,779 priority patent/US8619056B2/en
Publication of TW201027410A publication Critical patent/TW201027410A/en
Application granted granted Critical
Publication of TWI397005B publication Critical patent/TWI397005B/en

Links

Landscapes

  • Position Input By Displaying (AREA)

Description

電容式觸控板的鬼影偵測方法Ghost detection method for capacitive touch panel

本發明係有關一種電容式觸控板,特別是關於一種電容式觸控板的鬼影偵測方法。The present invention relates to a capacitive touch panel, and more particularly to a ghost detection method for a capacitive touch panel.

以XY方向規劃的電容式觸控板在多指輸入時會產生鬼影現象(ghost phenomenon)。圖1為鬼影現象的示意圖,當使用者的兩根手指在電容式觸控板上的位置為左下右上(如圖1左所示),或左上右下(如圖1右所示)時,電容式觸控板偵測到的X方向電容值變化波形和Y方向電容值變化波形都是一樣的,因此控制電路無法判斷真正的接觸位置。A capacitive touch panel that is programmed in the XY direction produces a ghost phenomenon when multi-finger input is performed. Figure 1 is a schematic diagram of ghosting phenomenon, when the position of the user's two fingers on the capacitive touch panel is left lower right (as shown in the left of Figure 1), or left upper right and lower right (as shown in the right of Figure 1) The X-direction capacitance value change waveform and the Y-direction capacitance value change waveform detected by the capacitive touch panel are the same, so the control circuit cannot determine the true contact position.

在雙指輸入狀態下,發生鬼影現象時可能的座標有兩組,如圖2所示。當鬼影現象發生時,X方向的電容值在跡線x1 和x2 處出現變化,而Y方向的電容值則在跡線y1 和y2 處增加,排除掉具有相同X或Y座標的排列組合後,可能的手指座標有(x1 y1 ,x2 y2 )和(x1 y2 ,x2 y1 )兩組,其中一組為實際座標,另一組則為鬼影座標。在更多手指輸入時,鬼影座標的數量將迅速增加,例如圖3所示,在三指輸入時,可能的手指座標有(x1 y1 ,x2 y2 ,x3 y3 )、(x1 y1 ,x2 y3 ,x3 y2 )、(xl y2 ,x2 y1 ,x3 y3 )、(x1 y2 ,x2 y3 ,x3 y1 )、(x1 y3 ,x2 y2 ,x3 y1 )、(x1 y3 ,x2 y1 ,x3 y2 )六組,其中五組為鬼影座標。In the two-finger input state, there are two possible coordinates when ghosting occurs, as shown in Figure 2. When the ghost phenomenon occurs, the capacitance value in the X direction changes at the traces x 1 and x 2 , and the capacitance value in the Y direction increases at the traces y 1 and y 2 , excluding the same X or Y coordinates. After the permutation and combination, the possible finger coordinates are (x 1 y 1 , x 2 y 2 ) and (x 1 y 2 , x 2 y 1 ), one of which is the actual coordinate and the other is the ghost. coordinate. When more fingers are input, the number of ghost coordinates will increase rapidly, as shown in Figure 3. For three-finger input, the possible finger coordinates are (x 1 y 1 , x 2 y 2 , x 3 y 3 ), (x 1 y 1 , x 2 y 3 , x 3 y 2 ), (x l y 2 , x 2 y 1 , x 3 y 3 ), (x 1 y 2 , x 2 y 3 , x 3 y 1 ) , (x 1 y 3 , x 2 y 2 , x 3 y 1 ), (x 1 y 3 , x 2 y 1 , x 3 y 2 ), six groups, of which five groups are ghost coordinates.

本發明的目的之一,在於提出一種電容式觸控板的鬼影偵測方法。One of the objects of the present invention is to provide a ghost detection method for a capacitive touch panel.

根據本發明,一種電容式觸控板的鬼影偵測方法係在使用者觸碰該電容式觸控板,在第一位置及第二位置造成鬼影現象時進行偵測,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括對該第一位置的第一方向跡線和第二方向跡線同時充電,取得該第一位置的第一或第二方向跡線電容值,對該第二位置的第一方向跡線和第二方向跡線同時充電,取得該第二位置的第一或第二方向跡線電容值,以及根據該第一位置的第一或第二方向跡線電容值及該第二位置的第一或第二方向跡線電容值,判斷使用者實際接觸的位置。According to the present invention, a ghost detection method for a capacitive touch panel is detected when a user touches the capacitive touch panel to cause a ghost phenomenon in the first position and the second position, the first position And the second location has the same first direction coordinate, the detecting method includes simultaneously charging the first direction trace and the second direction trace of the first location to obtain the first or second direction of the first location a trace capacitance value, the first direction trace and the second direction trace of the second position are simultaneously charged, obtaining a first or second direction trace capacitance value of the second position, and according to the first position The one or second direction trace capacitance value and the first or second direction trace capacitance value of the second position determine the position where the user actually touches.

根據本發明,一種電容式觸控板的鬼影偵測方法係在使用者觸碰該電容式觸控板,在第一位置及第二位置造成鬼影現象時進行偵測,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括對該第一位置的第一方向跡線和第二方向跡線同時充電,取得該第一位置的第一及第二方向跡線電容值,加總該第一位置的第一及第二方向跡線電容值,得到第一總合電容值,對該第二位置的第一方向跡線和第二方向跡線同時充電,取得該第二位置的第一及第二方向跡線電容值,加總該第二位置的第一及第二方向跡線電容值,得到第二總合電容值,以及根據該第一總合電容值及該第二總合電容值,判斷使用者實際接觸的位置。According to the present invention, a ghost detection method for a capacitive touch panel is detected when a user touches the capacitive touch panel to cause a ghost phenomenon in the first position and the second position, the first position And the second position has the same first direction coordinate, the detecting method includes simultaneously charging the first direction trace and the second direction trace of the first position, and obtaining the first and second directions of the first position. a trace capacitance value, summing the first and second direction trace capacitance values of the first position to obtain a first total capacitance value, and simultaneously charging the first direction trace and the second direction trace of the second position Obtaining the first and second direction trace capacitance values of the second position, summing the first and second direction trace capacitance values of the second position, obtaining a second total capacitance value, and according to the first total The combined capacitance value and the second total combined capacitance value determine the position where the user actually touches.

根據本發明,一種電容式觸控板的鬼影偵測方法係在使用者觸碰該電容式觸控板,在第一位置及第二位置造成鬼影現象時進行偵測,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括對該第一位置的第一和第二方向跡線充電,偵測該第一位置的第一方向跡線以取得第一電容值,對該第一位置的第一方向跡線充電並將該第一位置的第二方向跡線接地,偵測該第一位置的第一方向跡線以取得第二電容值,將該第一電容值與該第二電容值相減,得到第一電容差值,對該第二位置的第一和第二方向跡線充電,偵測該第二位置的第一方向跡線以取得第三電容值,對該第二位置的第一方向跡線充電並將該第二位置的第二方向跡線接地,偵測該第二位置的第一方向跡線以取得第四電容值,將該第三電容值與該第四電容值相減,得到第二電容差值,以及根據該第一電容差值及該第二電容差值,判斷使用者實際接觸的位置。According to the present invention, a ghost detection method for a capacitive touch panel is detected when a user touches the capacitive touch panel to cause a ghost phenomenon in the first position and the second position, the first position And the second location has the same first direction coordinate, the detecting method includes charging the first and second direction traces of the first location, detecting the first direction trace of the first location to obtain the first a capacitance value, the first direction trace of the first position is charged, and the second direction trace of the first position is grounded, and the first direction trace of the first position is detected to obtain a second capacitance value, The first capacitance value is subtracted from the second capacitance value to obtain a first capacitance difference value, and the first and second direction traces of the second position are charged, and the first direction trace of the second position is detected to obtain a third capacitance value, the first direction trace of the second position is charged, and the second direction trace of the second position is grounded, and the first direction trace of the second position is detected to obtain a fourth capacitance value, Subtracting the third capacitance value from the fourth capacitance value to obtain a second capacitance difference The difference between the first capacitor and the second capacitor and a difference, the user determines the actual contact position.

藉由比較所取得的電容值,本發明之鬼影偵測方法可以在鬼影現象發生時迅速、精準地定位出實際接觸位置,並提供精確定位所需的XY座標。By comparing the obtained capacitance values, the ghost detection method of the present invention can quickly and accurately locate the actual contact position when the ghost phenomenon occurs, and provide the XY coordinates required for precise positioning.

圖4為本發明第一實施例的示意圖,手指12的座標以xm yk 表示,手指14的座標則以xn yl 表示,手指12和手指14造成電容式觸控板上的電容變化值在位置xm yl 、xm yk 、xn yl 以及xn yk 都出現峰值,產生鬼影現象,控制電路端無法分辨手指12是位於xm yl 還是xm yk ,亦無法判斷手指14是位於xn yl 還是xn yk ,此時出現兩組鬼影候選座標(xm yl ,xn yk )和(xm yk ,xn yl ),位置xm yl 、xm yk 、xn yl 以及xn yk 為鬼影候選位置。本發明提出一種鬼影偵測方法,在出現鬼影現象時,逐一對每個出現峰值的位置,即各鬼影候選位置上的X和Y方向跡線同時充電並進行電容值偵測。當對受測位置16(xm yk )進行偵測時,開關S1和S3關上,控制器(圖中未示)同時對跡線xm 和yk 充電,取得跡線xm 和yk 的電容值。跡線xm 上的電容值Cx為Cxm +Cxm yl +dCxm +Cxm yk ,dCxm 表示跡線xm 因手指12接近產生的電容變化,Cxm 表示其他接地跡線與接地和跡線xm 間的電容值總合,Cxm yl 表示跡線xm 與跡線yl 間的電容值,Cxm yk 表示跡線xm 與跡線yk 間的電容值,其中,因為跡線xm 和跡線yk 等電位,Cxm yk 之量測值為零。由於受測位置16是手指12實際接觸的位置,從跡線xm 上量測出之電容值總合Cx 等於實際位置電容值Crx =Cxm +Cxm yl +dCxm 。從跡線yk 測得的Y方向跡線電容值Cy 亦由於手指12的實際接觸位置在xm yk ,其量測出之電容值為實際位置電容值Cry =Cyk +Cxn yk +dCyk4 is a schematic view of a first embodiment of the present invention, the coordinates of the finger 12 are represented by x m y k , the coordinates of the finger 14 are represented by x n y l , and the fingers 12 and 14 cause capacitance changes on the capacitive touch panel. The values appear peak at positions x m y l , x m y k , x n y l , and x n y k , causing ghosting, and the control circuit cannot distinguish whether the finger 12 is located at x m y l or x m y k . It is also impossible to judge whether the finger 14 is located at x n y l or x n y k , at which time two sets of ghost candidate coordinates (x m y l , x n y k ) and (x m y k , x n y l ) appear. The positions x m y l , x m y k , x n y l and x n y k are ghost candidate positions. The present invention proposes a ghost detection method. When a ghost phenomenon occurs, a position where each peak appears one by one, that is, X and Y direction traces at each ghost candidate position are simultaneously charged and capacitance value detection is performed. When the time of (x m y k) for detecting the position 16 under test, the switches S1 and S3 are closed, the controller (not shown) while the traces x m and y k charging traces acquired x m and y k The value of the capacitor. The capacitance value Cx on the trace x m is Cx m + Cx m y l + dCx m + Cx m y k , dCx m represents the change in capacitance of the trace x m due to the proximity of the finger 12, and Cx m represents the other ground trace and The sum of the capacitance values between the ground and the trace x m , Cx m y l represents the capacitance between the trace x m and the trace y l , and Cx m y k represents the capacitance between the trace x m and the trace y k Where, because the trace x m and the trace y k are equipotential, the magnitude of Cx m y k is zero. Since the measured position 16 is the position where the finger 12 actually contacts, the capacitance value C x measured from the trace x m is equal to the actual position capacitance value Cr x = Cx m + Cx m y l + dCx m . Traces in the Y direction y k traces measured capacitance value C y also because the actual contact position of the finger 12 in x m y k, the measured capacitance value of an amount of the actual position value of the capacitance Cr y = Cy k + Cx n y k +dCy k .

圖5繪示當手指12實際接觸位置在xm yl ,受測位置16為鬼影位置時的示意圖,控制器一樣同時對跡線xm 和跡線yk 充電,跡線xm 和yk 等電位,因此Cxm yk 之量測值為零,但位在xm yl 的手指12使得跡線yl 和跡線xm 間產生電容變化dCxm yl ,dCxm yl 為負值,此時跡線xm 上的電容值總合Cx 等於鬼影位置電容值Cgx =Cxm +Cxm yl +dCxm yl +dCxm 。從跡線yk 測得的Y方向電容值Cy 因為手指14位在xn yk ,在跡線xn 和yk 之間造成負的電容變化dCxn yk ,因此測得的電容值Cy 為鬼影位置電容值Cgy =Cyk +Cxn y1 +dCxn yk +dCykFIG. 5 is a schematic diagram showing when the actual contact position of the finger 12 is at x m y l and the measured position 16 is a ghost position, and the controller simultaneously charges the trace x m and the trace y k at the same time, the traces x m and y k is equipotential, so the measured value of Cx m y k is zero, but the finger 12 at x m y l causes a capacitance change dCx m y l between the trace y l and the trace x m , dCx m y l is a negative value, the capacitance value of x at this time traces on C x is equal to the sum of m ghost position capacitance value Cg x = Cx m + Cx m y l + dCx m y l + dCx m. Trace y k from the measured capacitance value C y Y direction as the finger 14 in x n y k, resulting in a negative change in capacitance between the dCx n y k x n traces and y k, and therefore the capacitance value measured C y is the ghost position capacitance value Cg y =Cy k +Cx n y 1 +dCx n y k +dCy k .

將圖4及圖5獲得之X方向電容值和Y方向電容值互相比較,由於dCxm yl 為負值,實際位置測得的X方向電容值Crx =Cxm +Cxm yl +dCxm 大於鬼影位置測得的X方向電容值為Cgx =Cxm +Cxm yl +dCxm yl +dCxm ,相同地,因為dCxn yk 為負值,實際位置測得的Y方向電容值Cry =Cyk +Cxn yk +dCyk 亦大於鬼影位置測得的Y方向電容值Cgy =Cyk +Cxn yk +dCxn yk +dCyk 。簡言之,在完成前述對XY跡線同時充電並取得X及Y方向電容值後,將二點所得的電容值相比較,即可分辨何者為實際接觸位置。The X-direction capacitance value and the Y-direction capacitance value obtained in FIG. 4 and FIG. 5 are compared with each other. Since dCx m y l is a negative value, the X-direction capacitance value measured at the actual position is Cr x = Cx m + Cx m y l + dCx The value of the X-direction capacitance measured by m larger than the ghost position is Cg x = Cx m + Cx m y l + dCx m y l + dCx m , and similarly, since dCx n y k is a negative value, the Y measured at the actual position The direction capacitance value Cr y =Cy k +Cx n y k +dCy k is also larger than the Y-direction capacitance value Cg y =Cy k +Cx n y k +dCx n y k +dCy k measured at the ghost position. In short, after the above-mentioned XY traces are simultaneously charged and the capacitance values in the X and Y directions are obtained, the capacitance values obtained from the two points are compared, and the actual contact position can be distinguished.

圖6及圖7係本發明之鬼影偵測方法的另一實施例,將受測位置的X方向跡線和Y方向跡線連接,以直接取得受測位置的X方向跡線電容值和Y方向跡線電容值的總合。如圖6所示,當受測位置16為手指12實際位置時,測得的電容值Cxy 為實際位置電容值Crxy =Cxm +Cyk +Cxm yl +Cxn yk +dCxm +dCyk ,參照圖7,當受測位置16不是手指實際位置時,測得的電容值Cxy 為鬼影位置電容值Cgxy =Cxm +Cyk +Cxm yl +Cxn yk +dCxm +dCyk +dCxm yl +dCxn yk ,其中dCxm yl 及dCxn yk 為負值。兩指觸控造成之鬼影現象雖共有四個鬼影候選位置,但因為定出第一個實際位置後,與該實際位置具有相同X或Y座標的鬼影候選位置便不可能是第二個實際位置,因此在偵測兩指觸控造成之鬼影現象時,僅需對兩個具相同X或Y座標的鬼影候選位置做一次比較,即可獲知實際位置的座標。6 and FIG. 7 are another embodiment of the ghost detection method of the present invention, connecting the X-direction trace and the Y-direction trace of the measured position to directly obtain the X-direction trace capacitance value of the measured position and The sum of the capacitance values of the Y-direction traces. As shown in FIG. 6, when the measured position 16 is the actual position of the finger 12, the measured capacitance value C xy is the actual position capacitance value Cr xy = Cx m + Cy k + Cx m y l + Cx n y k + dCx m +dCy k , referring to FIG. 7, when the measured position 16 is not the actual position of the finger, the measured capacitance value C xy is the ghost position capacitance value Cg xy = Cx m + Cy k + Cx m y l + Cx n y k +dCx m +dCy k +dCx m y l +dCx n y k , where dCx m y l and dCx n y k are negative values. Although the ghost phenomenon caused by two-finger touch has four ghost candidate positions, since the first actual position is determined, the ghost candidate position with the same X or Y coordinate as the actual position cannot be the second. Actual position, so when detecting the ghost phenomenon caused by two-finger touch, only two ghost candidate positions with the same X or Y coordinates need to be compared once to know the coordinates of the actual position.

以前述偵測方法處理三指觸控造成之鬼影現象時,鬼影候選位置共九點,參照圖3,在該些鬼影候選位置中,具有相同X座標的位置各有三點,以先測試具有相同X座標的兩點(x1 ,y1 )和(x1 ,y2 )為例,若測試得到之電容值相等,表示(x1 ,y1 )和(x1 ,y2 )二點皆為鬼影位置,剩餘與該二點具有相同X座標的(x1 ,y3 )即為實際位置;若測試得到之電容值不相等,電容值較大該點即為實際位置,因此僅需偵測一次即可定出第一個實際位置。在定出第一個實際位置,例如判定(x1 ,y3 )為實際位置後,即可得知其他與(x1 ,y3 )具有相同X座標或Y座標的鬼影候選位置(x1 ,y1 )、(x1 ,y2 )、(x2 ,y3 )和(x3 ,y3 )必然皆為鬼影位置,因此可直接排除該些鬼影位置,接著再對鬼影候選位置(x2 ,y2 )、(x2 ,y1 )做鬼影偵測,判斷出第二個實際位置後,再刪除與該第二實際位置具相同X或Y座標的鬼影候選位置,即可獲得最後一個實際位置,換言之,即使在三指造成之鬼影現象中,本發明提出之偵測方法僅需執行兩次比較,即可定出實際手指座標。在其他實施例中,亦可以逐一偵測每個鬼影候選點,取得每一鬼影候選點的跡線電容值,再由韌體根據該些跡線電容值做判斷,以提昇可靠度。When the ghosting phenomenon caused by the three-finger touch is processed by the foregoing detection method, the ghost candidate positions are nine points. Referring to FIG. 3, among the ghost candidate positions, the positions having the same X coordinate each have three points, first Test two points (x 1 , y 1 ) and (x 1 , y 2 ) with the same X coordinate as an example. If the capacitance values obtained by the test are equal, it means (x 1 , y 1 ) and (x 1 , y 2 ) The two points are all ghost positions, and the remaining X coordinates (x 1 , y 3 ) with the same two points are the actual positions; if the capacitance values obtained by the test are not equal, the capacitance value is larger, the point is the actual position. Therefore, it is only necessary to detect once to determine the first actual position. After determining the first actual position, for example, determining (x 1 , y 3 ) as the actual position, other ghost candidate positions having the same X coordinate or Y coordinate as (x 1 , y 3 ) can be known (x 1 , y 1 ), (x 1 , y 2 ), (x 2 , y 3 ), and (x 3 , y 3 ) are necessarily ghost positions, so the ghost positions can be directly excluded, and then the ghosts are Shadow candidate positions (x 2 , y 2 ), (x 2 , y 1 ) are ghost detected, and after determining the second actual position, ghost candidates having the same X or Y coordinates as the second actual position are deleted. The position can be used to obtain the last actual position. In other words, even in the ghost phenomenon caused by the three fingers, the detection method proposed by the present invention only needs to perform two comparisons to determine the actual finger coordinates. In other embodiments, each ghost candidate point may be detected one by one, and the trace capacitance value of each ghost candidate point is obtained, and then the firmware determines the trace capacitance values to improve the reliability.

圖8係兩相交跡線上電容的示意圖,此處之Cxm 表示跡線xm 對地的電容值,Cyn 表示跡線yn 對地的電容值,Cxm yn 表示跡線xm 和跡線yn 之間的耦合電容值,當手指接觸跡線xm 和yn 交界處時,電容值Cxm yn 將下降,本發明提出一種直接偵測跡線xm 和跡線yn 之間的電容值Cxm yn 的方法,以分辨鬼影位置和實際接觸位置。首先,同時對跡線xm 和yn 充電,並偵測跡線xm 上的電容值,此時跡線xm 和yn 等電位,Cxm yn 之量測值為零,測得的電容值為跡線xm 對地的電容值Cxm ;接著再對跡線xm 充電並將跡線yn 接地,此時跡線xm 和yn 不等電位,因此偵測跡線xm 所得的電容值為Cxm +Cxm yn ,兩者相減即可得到跡線xm 和yn 間的耦合電容值Cxm ynFIG 8 is schematic view showing two intersecting trace capacitance, Cx m herein denotes the trace capacitance value x m of the ground, Cy n y n represents the trace capacitance value of the ground, Cx m y n x m denotes the trace and The value of the coupling capacitance between the traces y n , when the finger touches the junction of the traces x m and y n , the capacitance value Cx m y n will drop, and the present invention proposes a direct detection trace x m and a trace y n A method of capacitance between Cx m y n to distinguish ghost locations from actual contact locations. First, the traces x m and y n are simultaneously charged, and the capacitance value on the trace x m is detected. At this time, the potentials of the traces x m and y n are measured, and the measured value of Cx m y n is zero. The capacitance value is the capacitance value Cx m of the trace x m to ground; then the trace x m is charged and the trace y n is grounded, at which time the traces x m and y n are not equipotential, thus detecting the trace the resulting x m capacitance value Cx m + Cx m y n, can be obtained by subtracting the two values of the coupling capacitance Cx m y n x m between traces and y n.

圖9及圖10為偵測兩跡線間電容值一實施例的示意圖,圖9繪示當受測位置16為手指12實際位置時的狀況,圖10繪示當受測位置16為鬼影位置時的狀況。如圖9所示,當受測位置16為手指12實際位置時,首先在phase 1同時對跡線xm 和yk 充電,此時偵測跡線xm 取得的電容值Cx=Cxm ;接著,於phase 2中對跡線xm 充電並將跡線yk 接地,取得跡線xm 上的電容值Cx=Cxm +Cxm yk +dCxm yk ;將phase 2取得的電容值與phase 1取得的電容值相減得到之電容差值ΔCx 為實際位置電容差值ΔCrx =Cxm yk +dCxm yk 。當受測位置16為鬼影位置時,如圖10所示,對受測位置16進行前述偵測,取得之電容差值ΔCx 為鬼影位置電容差值ΔCgx =Cxm yk ,其中,dCxm yk 小於零,因此實際手指位置的判定可藉由比較電容差值ΔCx 達成。FIG. 9 and FIG. 10 are schematic diagrams showing an embodiment of detecting a capacitance value between two traces, FIG. 9 is a view showing a state when the measured position 16 is the actual position of the finger 12, and FIG. 10 is a diagram showing the measured position 16 as a ghost. The situation at the time of location. As shown in FIG. 9, when the measured position 16 is the actual position of the finger 12, the traces x m and y k are first charged simultaneously in phase 1, and the capacitance value Cx=Cx m obtained by detecting the trace x m is detected; Next, the trace x m is charged in phase 2 and the trace y k is grounded to obtain the capacitance value Cx=Cx m +Cx m y k +dCx m y k on the trace x m ; the capacitance obtained in phase 2 The capacitance difference ΔC x obtained by subtracting the value from the capacitance value obtained by phase 1 is the actual position capacitance difference ΔCr x = Cx m y k + dCx m y k . When the measured position 16 is a ghost position, as shown in FIG. 10, the detected position 16 is detected as described above, and the obtained capacitance difference ΔC x is a ghost position capacitance difference ΔCg x = Cx m y k , wherein , dCx m y k is less than zero, so the determination of the actual finger position can be achieved by comparing the capacitance difference ΔC x .

本發明提出之各實施例以韌體實現前述運算,在其他實施例中,可以將手指及跡線等造成的誤差加入運算。The embodiments of the present invention implement the foregoing operations with firmware, and in other embodiments, errors caused by fingers, traces, and the like can be added to the operation.

圖11係應用本發明之觸控板控制方法一實施例的流程圖,開始200後,先進行X方向跡線偵測201,接著進行Y方向跡線偵測202,判斷是否有鬼影發生203,若否,輸出偵測結果並結束204。在步驟203中,若發現有鬼影發生,則進入鬼影處理程序,首先產生鬼影候選列表205,將所有鬼影候選點加入該鬼影候選列表中,然後於步驟206中從該鬼影候選列表中取一鬼影候選點,並判斷該點是否為該鬼影候選列表的最後一點207,若是,輸出解答列表208,若否,進行鬼影分析感測209。鬼影分析感測209的步驟如前所述,取得受測點的X方向跡線電容值、Y方向跡線電容值、兩者加總後之電容值或受測點的X、Y方向間電容值,再與從其他候選點取得的電容值相比較,以判斷該受測點是否為鬼影點210,若是,便自該鬼影候選列表移除該受測點211,並回到步驟206,繼續對其他候選點做偵測及判斷,若否,表示該受測點為實際位置,便將該受測點加入解答列表212,並從該鬼影候選列表移除該點以及與該點具相同X或Y座標的候選點231,再回到步驟206繼續對鬼影候選列表中的其他候選點進行偵測,最後輸出解答列表208,結束204。在本實施例中,每一鬼影候選點的位置皆以XY座標表示,因此最後輸出的解答列表已包含解答點的XY座標,可以提供精確的接觸點定位能力。11 is a flow chart of an embodiment of a touch panel control method according to the present invention. After starting 200, an X-direction trace detection 201 is performed first, followed by a Y-direction trace detection 202 to determine whether a ghost occurs 203. If not, the detection result is output and ends 204. In step 203, if ghosting is found, the ghost processing program is entered, firstly a ghost candidate list 205 is generated, all ghost candidate points are added to the ghost candidate list, and then the ghost image is extracted from step 206. A ghost candidate point is taken from the candidate list, and it is determined whether the point is the last point 207 of the ghost candidate list, and if so, the answer list 208 is output, and if not, the ghost analysis sensing 209 is performed. The steps of ghost analysis 209 are as described above, and the X-direction trace capacitance value, the Y-direction trace capacitance value, the summed capacitance value or the X and Y directions of the measured point are obtained. The capacitance value is compared with the capacitance value obtained from other candidate points to determine whether the measured point is a ghost point 210, and if so, the measured point 211 is removed from the ghost candidate list, and the step is returned. 206. Continue to detect and determine other candidate points. If no, indicating that the measured point is an actual location, the measured point is added to the answer list 212, and the point is removed from the ghost candidate list and The candidate points 231 with the same X or Y coordinates are clicked, and then back to step 206 to continue to detect other candidate points in the ghost candidate list, and finally the answer list 208 is output, ending 204. In this embodiment, the position of each ghost candidate point is represented by an XY coordinate, so the final output solution list already contains the XY coordinates of the solution point, which can provide accurate contact point positioning capability.

以上對於本發明之較佳實施例所作的敘述係為闡明之目的,而無意限定本發明精確地為所揭露的形式,基於以上的教導或從本發明的實施例學習而作修改或變化是可能的,實施例係為解說本發明的原理以及讓熟習該項技術者以各種實施例利用本發明在實際應用上而選擇及敘述,本發明的技術思想企圖由以下的申請專利範圍及其均等來決定。The above description of the preferred embodiments of the present invention is intended to be illustrative, and is not intended to limit the scope of the invention to the disclosed embodiments. It is possible to make modifications or variations based on the above teachings or learning from the embodiments of the present invention. The embodiments are described and illustrated in the practical application of the present invention in various embodiments, and the technical idea of the present invention is intended to be equivalent to the scope of the following claims. Decide.

12...手指12. . . finger

14...手指14. . . finger

16...受測位置16. . . Tested position

200...開始200. . . Start

201...X方向跡線偵測201. . . X direction trace detection

202...Y方向跡線偵測202. . . Y direction trace detection

203...鬼影發生?203. . . Ghosting happens?

204...結束204. . . End

205...產生鬼影候選列表205. . . Generate ghost candidate list

206...自該鬼影候選列表中取一點206. . . Take a little from the list of ghost candidates

207...該點為鬼影候選列表的最後一點?207. . . Is this the last point in the list of ghost candidates?

208...輸出解答列表208. . . Output answer list

209...鬼影分析感測209. . . Ghost analysis

210...該點為鬼影點210. . . This point is a ghost point

211...自該鬼影候選列表移除該點211. . . Remove the point from the ghost candidate list

212...將該點加入解答列表212. . . Add this point to the answer list

231...自該鬼影候選列表移除與該點具相同X或Y座標的候選點231. . . Remove candidate points with the same X or Y coordinates from the ghost candidate list

圖1為鬼影現象的示意圖;Figure 1 is a schematic diagram of ghosting phenomenon;

圖2為雙指觸控造成之鬼影現象的示意圖;2 is a schematic diagram of a ghost phenomenon caused by two-finger touch;

圖3為三指觸控造成之鬼影現象的示意圖;FIG. 3 is a schematic diagram of a ghost phenomenon caused by three-finger touch;

圖4及圖5為本發明一實施例的示意圖;4 and 5 are schematic views of an embodiment of the present invention;

圖6及圖7為本發明另一實施例的示意圖;6 and 7 are schematic views of another embodiment of the present invention;

圖8係兩相交跡線上電容的示意圖;Figure 8 is a schematic diagram of capacitance on a two-phase intersection trace;

圖9及圖10為偵測兩跡線間電容值一實施例的示意圖;以及9 and 10 are schematic diagrams showing an embodiment of detecting a capacitance value between two traces;

圖11係應用本發明一實施例的流程圖。11 is a flow chart of an embodiment of the present invention.

12...手指12. . . finger

14...手指14. . . finger

16...受測位置16. . . Tested position

Claims (20)

一種電容式觸控板的鬼影偵測方法,在該電容式觸控板上的第一位置及第二位置為鬼影候選位置,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括下列步驟:(A)對該第一位置的第一方向跡線和第二方向跡線同時充電;(B)取得該第一位置的第一或第二方向跡線電容值;(C)對該第二位置的第一方向跡線和第二方向跡線同時充電;(D)取得該第二位置的第一或第二方向跡線電容值;以及(E)比較該第一位置的第一方向跡線電容值及該第二位置的第一方向跡線電容值或比較該第一位置的第二方向跡線電容值及該第二位置的第二方向跡線電容值,判斷實際接觸位置。A ghost detection method for a capacitive touch panel, wherein the first position and the second position on the capacitive touch panel are ghost candidate positions, and the first position and the second position have the same first direction Coordinates, the detecting method includes the following steps: (A) simultaneously charging the first direction trace and the second direction trace of the first position; (B) obtaining the first or second direction trace of the first position a capacitance value; (C) simultaneously charging the first direction trace and the second direction trace of the second position; (D) obtaining a first or second direction trace capacitance value of the second position; and (E) Comparing a first direction trace capacitance value of the first location with a first direction trace capacitance value of the second location or comparing a second direction trace capacitance value of the first location with a second direction trace of the second location The line capacitance value determines the actual contact position. 如請求項1之鬼影偵測方法,其中步驟E包括:若該第一位置的第一或第二方向跡線電容值大於該第二位置的第一或第二方向跡線電容值,判斷該第一位置為實際接觸位置;以及若該第一位置的第一或第二方向跡線電容值小於該第二位置的第一或第二方向跡線電容值,判斷該第二位置為實際接觸位置。The ghost detection method of claim 1, wherein the step E includes: if the first or second direction trace capacitance value of the first location is greater than the first or second direction trace capacitance value of the second location, determining The first position is an actual contact position; and if the first or second direction trace capacitance value of the first position is less than the first or second direction trace capacitance value of the second position, determining the second position is actual Contact location. 如請求項2之鬼影偵測方法,更包括將該第一位置及該第二位置加入鬼影候選列表。The ghost detection method of claim 2, further comprising adding the first location and the second location to the ghost candidate list. 如請求項3之鬼影偵測方法,更包括將判斷完成的位置自該鬼影候選列表移除。The ghost detection method of claim 3, further comprising removing the location of the judgment completion from the ghost candidate list. 如請求項4之鬼影偵測方法,更包括自該鬼影候選列表移除與該實際接觸位置具有相同第一或第二方向座標的位置。The ghost detection method of claim 4, further comprising removing a location having the same first or second direction coordinate from the actual contact location from the ghost candidate list. 如請求項1之鬼影偵測方法,其中步驟E包括: 若該第一位置的第一或第二方向跡線電容值大於該第二位置的第一或第二方向跡線電容值,判斷該第一位置為實際接觸位置;若該第一位置的第一或第二方向跡線電容值小於該第二位置的第一或第二方向跡線電容值,判斷該第二位置為實際接觸位置;以及若該第一位置的第一或第二方向跡線電容值與該第二位置的第一或第二方向跡線電容值相等,判斷該第一位置及該第二位置為鬼影位置。The ghost detection method of claim 1, wherein the step E comprises: If the first or second direction trace capacitance value of the first location is greater than the first or second direction trace capacitance value of the second location, determining that the first location is an actual contact location; if the first location is The first or second direction trace capacitance value is less than the first or second direction trace capacitance value of the second position, determining that the second position is an actual contact position; and if the first position is the first or second direction trace The line capacitance value is equal to the first or second direction trace capacitance value of the second position, and the first position and the second position are determined to be ghost locations. 一種電容式觸控板的鬼影偵測方法,在該電容式觸控板上的第一位置及第二位置為鬼影候選位置,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括下列步驟:(A)對該第一位置的第一方向跡線和第二方向跡線同時充電;(B)取得該第一位置的第一及第二方向跡線電容值;(C)加總該第一位置的第一及第二方向跡線電容值,產生第一總合電容值;(D)對該第二位置的第一方向跡線和第二方向跡線同時充電;(E)取得該第二位置的第一及第二方向跡線電容值;(F)加總該第二位置的第一及第二方向跡線電容值,產生第二總合電容值;以及(G)比較該第一總合電容值及該第二總合電容值,判斷實際接觸位置。A ghost detection method for a capacitive touch panel, wherein the first position and the second position on the capacitive touch panel are ghost candidate positions, and the first position and the second position have the same first direction Coordinates, the detecting method includes the following steps: (A) simultaneously charging the first direction trace and the second direction trace of the first position; (B) obtaining the first and second direction traces of the first position a capacitance value; (C) summing the first and second direction trace capacitance values of the first position to generate a first total capacitance value; (D) a first direction trace and a second direction to the second position The traces are simultaneously charged; (E) the first and second direction trace capacitance values of the second position are obtained; (F) the first and second direction trace capacitance values of the second position are summed to generate a second total And (G) comparing the first total capacitance value and the second total capacitance value to determine an actual contact position. 如請求項7之鬼影偵測方法,其中步驟G包括:若該第一總合電容值大於該第二總合電容值,判斷該第一位置為實際接觸位置;以及 若該第一總合電容值小於該第二總合電容值,判斷該第二位置為實際接觸位置。The ghost detection method of claim 7, wherein the step G includes: if the first total capacitance value is greater than the second total capacitance value, determining that the first position is an actual contact position; If the first total capacitance value is less than the second total capacitance value, it is determined that the second position is an actual contact position. 如請求項8之鬼影偵測方法,更包括將該第一位置及該第二位置加入鬼影候選列表。The ghost detection method of claim 8, further comprising adding the first location and the second location to the ghost candidate list. 如請求項9之鬼影偵測方法,更包括將判斷完成的位置自該鬼影候選列表移除。The ghost detection method of claim 9, further comprising removing the location of the judgment completion from the ghost candidate list. 如請求項10之鬼影偵測方法,更包括自該鬼影候選列表移除與該實際接觸位置具有相同第一或第二方向座標的位置。The ghost detection method of claim 10, further comprising removing a location having the same first or second direction coordinate from the actual contact location from the ghost candidate list. 如請求項7之鬼影偵測方法,其中步驟G包括:若該第一總合電容值大於該第二總合電容值,判斷該第一位置為實際接觸位置;若該第一總合電容值小於該第二總合電容值,判斷該第二位置為實際接觸位置;以及若該第一總合電容值與該第二總合電容值相等,判斷該第一位置及該第二位置為鬼影位置。The ghost detection method of claim 7, wherein the step G includes: if the first total capacitance value is greater than the second total capacitance value, determining that the first position is an actual contact position; if the first total capacitance is The value is less than the second total capacitance value, determining that the second position is an actual contact position; and if the first total capacitance value is equal to the second total capacitance value, determining that the first position and the second position are Ghost location. 一種電容式觸控板的鬼影偵測方法,在該電容式觸控板上的第一位置及第二位置為鬼影候選位置,該第一位置及該第二位置具有相同的第一方向座標,該偵測方法包括下列步驟:(A)對該第一位置的第一和第二方向跡線充電,偵測該第一位置的第一方向跡線以取得第一電容值;(B)對該第一位置的第一方向跡線充電並將該第一位置的第二方向跡線接地,偵測該第一位置的第一方向跡線以取得第二電容值;(C)將該第一電容值與該第二電容值相減,得到第一電容差值; (D)對該第二位置的第一和第二方向跡線充電,偵測該第二位置的第一方向跡線以取得第三電容值;(E)對該第二位置的第一方向跡線充電並將該第二位置的第二方向跡線接地,偵測該第二位置的第一方向跡線以取得第四電容值;(F)將該第三電容值與該第四電容值相減,得到第二電容差值;以及(G)比較該第一電容差值及該第二電容差值,判斷實際接觸位置。A ghost detection method for a capacitive touch panel, wherein the first position and the second position on the capacitive touch panel are ghost candidate positions, and the first position and the second position have the same first direction Coordinates, the detecting method includes the following steps: (A) charging the first and second direction traces of the first position, detecting a first direction trace of the first position to obtain a first capacitance value; (B Charging the first direction trace of the first location and grounding the second direction trace of the first location, detecting a first direction trace of the first location to obtain a second capacitance value; (C) The first capacitance value is subtracted from the second capacitance value to obtain a first capacitance difference value; (D) charging the first and second direction traces of the second location, detecting a first direction trace of the second location to obtain a third capacitance value; (E) a first direction of the second location Charging the trace and grounding the second direction trace of the second location to detect the first direction trace of the second location to obtain a fourth capacitance value; (F) the third capacitor value and the fourth capacitor The values are subtracted to obtain a second capacitance difference; and (G) comparing the first capacitance difference and the second capacitance difference to determine an actual contact position. 如請求項13之鬼影偵測方法,其中步驟G包括:若該第一電容差值小於該第二電容差值,判斷該第一位置為實際接觸位置,該第二位置為鬼影位置;以及若該第一電容差值大於該第二電容差值,判斷該第二位置為實際接觸位置,該第一位置為鬼影位置。The ghost detection method of claim 13, wherein the step G comprises: if the first capacitance difference is smaller than the second capacitance difference, determining that the first position is an actual contact position, and the second position is a ghost position; And if the first capacitance difference is greater than the second capacitance difference, determining that the second position is an actual contact position, the first position being a ghost position. 如請求項14之鬼影偵測方法,更包括將該第一位置及該第二位置加入鬼影候選列表。The ghost detection method of claim 14, further comprising adding the first location and the second location to the ghost candidate list. 如請求項15之鬼影偵測方法,更包括將判斷完成的位置自該鬼影候選列表移除。The ghost detection method of claim 15 further includes removing the location of the judgment completion from the ghost candidate list. 如請求項16之鬼影偵測方法,更包括自該鬼影候選列表移除與該實際接觸位置具有相同第一或第二方向座標的位置。The ghost detection method of claim 16, further comprising removing a location having the same first or second direction coordinate from the actual contact location from the ghost candidate list. 如請求項13之鬼影偵測方法,其中步驟G包括:若該第一電容差值小於該第二電容差值,判斷該第一位置為實際接觸位置,該第二位置為鬼影位置;若該第一電容差值大於該第二電容差值,判斷該第二位置為實 際接觸位置,該第一位置為鬼影位置;以及若該第一電容差值與該第二電容差值相等,判斷該第一位置及該第二位置為鬼影位置。The ghost detection method of claim 13, wherein the step G comprises: if the first capacitance difference is smaller than the second capacitance difference, determining that the first position is an actual contact position, and the second position is a ghost position; If the first capacitance difference is greater than the second capacitance difference, determining that the second position is true The first contact position is a ghost position; and if the first capacitance difference is equal to the second capacitance difference, determining that the first position and the second position are ghost positions. 一種電容式觸控板的偵測方法,包括下列步驟:偵測該電容式觸控板中第一方向上第一跡線與地端之間的第一電容值及第二跡線與地端之間的第二電容值;偵測該電容式觸控板中第二方向上第三跡線與地端之間的第三電容值及第四跡線與地端之間的第四電容值;偵測該第一跡線及第三跡線之間的第五電容值;偵測該第二跡線及第四跡線之間的第六電容值;以及根據該第一、第二、第三、第四、第五及第六電容值,判斷是否有物件觸碰該電容式觸控板。A method for detecting a capacitive touch panel includes the steps of: detecting a first capacitance value and a second trace and a ground end between a first trace and a ground end in a first direction of the capacitive touch panel Between the second capacitance value; detecting a third capacitance value between the third trace and the ground end in the second direction of the capacitive touch panel and a fourth capacitance value between the fourth trace and the ground end Detecting a fifth capacitance value between the first trace and the third trace; detecting a sixth capacitance value between the second trace and the fourth trace; and according to the first, second, The third, fourth, fifth, and sixth capacitance values determine whether an object touches the capacitive touch panel. 如請求項19之偵測方法,更包括根據該第一、第二、第三、第四、第五及第六電容值,判斷觸碰該電容式觸控板的物件的接觸位置。The method of detecting the item 19 further includes determining, according to the first, second, third, fourth, fifth, and sixth capacitance values, a contact position of the object touching the capacitive touch panel.
TW98100351A 2009-01-07 2009-01-07 Ghost Detection Method for Capacitive Touchpad TWI397005B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW98100351A TWI397005B (en) 2009-01-07 2009-01-07 Ghost Detection Method for Capacitive Touchpad
US12/649,779 US8619056B2 (en) 2009-01-07 2009-12-30 Ghost resolution for a capacitive touch panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98100351A TWI397005B (en) 2009-01-07 2009-01-07 Ghost Detection Method for Capacitive Touchpad

Publications (2)

Publication Number Publication Date
TW201027410A TW201027410A (en) 2010-07-16
TWI397005B true TWI397005B (en) 2013-05-21

Family

ID=44853192

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98100351A TWI397005B (en) 2009-01-07 2009-01-07 Ghost Detection Method for Capacitive Touchpad

Country Status (1)

Country Link
TW (1) TWI397005B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI502416B (en) * 2010-08-25 2015-10-01 Himax Tech Ltd Sensing apparatus for touch panel and sensing method thereof
TWI454995B (en) * 2011-08-11 2014-10-01 Wistron Corp Optical touch device and coordinate detection method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08147091A (en) * 1994-11-22 1996-06-07 Fujitsu Ltd Plural-point input touch panel and coordinate calculating method therefor
US5856822A (en) * 1995-10-27 1999-01-05 02 Micro, Inc. Touch-pad digital computer pointing-device
US20080150906A1 (en) * 2006-12-22 2008-06-26 Grivna Edward L Multi-axial touch-sensor device with multi-touch resolution
TW200837622A (en) * 2007-01-03 2008-09-16 Apple Inc Simultaneous sensing arrangement
TW200846996A (en) * 2007-03-29 2008-12-01 Microsoft Corp Touch sensing using shadow and reflective modes

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08147091A (en) * 1994-11-22 1996-06-07 Fujitsu Ltd Plural-point input touch panel and coordinate calculating method therefor
US5856822A (en) * 1995-10-27 1999-01-05 02 Micro, Inc. Touch-pad digital computer pointing-device
US20080150906A1 (en) * 2006-12-22 2008-06-26 Grivna Edward L Multi-axial touch-sensor device with multi-touch resolution
TW200837622A (en) * 2007-01-03 2008-09-16 Apple Inc Simultaneous sensing arrangement
TW200846996A (en) * 2007-03-29 2008-12-01 Microsoft Corp Touch sensing using shadow and reflective modes

Also Published As

Publication number Publication date
TW201027410A (en) 2010-07-16

Similar Documents

Publication Publication Date Title
TWI433004B (en) Method for determining touch points on touch panel and system thereof
US20110310040A1 (en) System and method for finger resolution in touch screens
TWI400645B (en) Touch determining method and touch gesture determining method thereof
TWI400646B (en) Method for detecting pressure of touch sensing element and electronic device using the same
TWI529578B (en) Touch device and its touch judgment method
TWI437480B (en) Method and device for palm ignoring
US9367190B2 (en) Touch recognition method and system for a capacitive touch apparatus
TW201135515A (en) Gesture identification method and apparatus applied in a touchpad
TWI427518B (en) Touch sensing circuit and touch sensing method
TWI428809B (en) Two - dimensional structure of the capacitive touchpad positioning method
TWI452506B (en) Segmentation of Waveform Overlapping in Single Direction of Capacitive Touch
TWI412983B (en) Detecting method of performing multi-touch on a capacitive touch panel
JP6082394B2 (en) High resolution ghost removal gesture
TWI397005B (en) Ghost Detection Method for Capacitive Touchpad
CN109101127B (en) Palm touch detection in a touch screen device with a floating ground or thin touch panel
JP4979608B2 (en) How to measure multiple touches on the touchpad
TWI470496B (en) Method of sampling touch points for touch panel
TW201525799A (en) Touch device and its standard two-dimensional sensing information updating method
CN101788874B (en) Ghost detection method of capacitive touchpad
TWI502416B (en) Sensing apparatus for touch panel and sensing method thereof
JP2018147266A (en) Touch panel controller, touch panel system, and touch position detection method
TW201504876A (en) Palm rejection method
CN110554797B (en) Sensing method and sensing module of touch control identification device
TWI612460B (en) Multitouch tactile device with multifrequency and barycentric capacitive detection
CN104423750B (en) The touch panel and its application method of detectable stylus

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees