TWI393895B - Detecting device for measuring currents flowing through multiple loads under a supply voltage - Google Patents

Description

Detection device capable of detecting each load current under a power source

The invention relates to a detecting device, in particular to a detecting device capable of measuring each load current under a power source.

Please refer to FIG. 1A. FIG. 1A is a schematic diagram of the measuring device 10 of the prior art measuring the device under test 12. Traditionally, the measurement unit 10, which has an analog to digital converter (ADC) interface, can only be used to limit voltage changes. If it is necessary to measure the current change of the Device Under Test (DUT) 12, the series resistor R3 is required to convert the current input to the device under test 12 into the voltage across the resistor R3 at the input power terminal of the device under test 12. . When the switch SW reads the reference voltage or the voltage of the device under test 12 according to the I/O pin switching control, the input voltage Vdin=VDC-I3 (R1+R3) supplied to the device under test 12, and the input voltage Vdin is greater than the source power voltage. The VDC is small. A small input voltage Vdin may cause the device under test 12 to fail to meet the standard voltage value required for normal input. Therefore, it is necessary to relatively increase the source power supply voltage VDC to approximate the voltage required by the device under test 12, but the source voltage VDC is generally fixed in the circuit design, so the design of adding the source power voltage VDC will be more difficult and costly. In addition, since the device under test 12 that consumes a large amount of power must consume a larger current, the resistor R3 causes a larger voltage difference due to an increase in power consumption of the device under test 12 itself. Since the resistor R3 has a limited current relationship, it is not possible to use a small resistor to generate a small voltage drop and a resistor having a large resistance value, which further causes a larger voltage drop in both the current and the resistance value. In this way, the input voltage specification defined by the device under test 12 itself poses a greater challenge, and the unnecessary power consumption generated by the resistor R3 is also an unnecessary waste for the entire system.

Please refer to FIG. 1B . FIG. 1B is a schematic diagram showing another analog-to-digital converter measuring unit 10 for measuring the device under test 12 . In contrast to FIG. 1A, in the first FIG. BB, the voltage stabilizing element 14 is used instead of the resistor R3. The voltage stabilizing element 14 limits the maximum reference voltage value of the analog digital converter to less than the withstand voltage Vz of the voltage stabilizing element 14. Because the maximum measurable voltage of the general analog-to-digital converter measuring unit 10 is greatly different from the source power supply voltage VDC, and the voltage-carrying component 14 withstand voltage/current characteristics can only withstand small rated current, so it is easy to cause the voltage stabilizing component. 14 crashed and the reference voltage could not be measured correctly. If a higher voltage/flow resistant voltage stabilizing element 14 is selected, it is subject to higher costs.

Please refer to FIG. 2, which is a schematic diagram of another measuring unit 20 for measuring a plurality of devices 24a, 22b, 22c, and 22d. The analog-to-digital converter measurement unit 20 has, for example, four sets of ADC measurements 埠ADCP1, ADCP2, ADCP3, ADCP4. However, each of the measured ADCP1, ADCP2, ADCP3, and ADCP4 must correspond to each of the devices 22a, 22b, 22c, and 22d, respectively, to a voltage stabilizing element 24a, 24b, 24c, and 24d that first measures the reference voltage value thereof. The measuring circuits 26a, 26b, 26c, 26d can simultaneously measure the current changes of the different devices under test 22a, 22b, 22c, 22d. However, in addition to the problem that the aforementioned VDC and Vdin are inconsistent, each device under test must be configured with a corresponding set of voltage regulator components and detection circuits, and each measurement of ADCP1, ADCP2, ADCP3, and ADCP4 is measured. The reference voltage values are all different, so the resistance values of the resistors included in the detection circuits 26a, 26b, 26c, and 26d are different. For example, the device under test 22a corresponds to the voltage stabilizing element 24a and the detecting circuit 26a, the device under test 22b corresponds to the voltage stabilizing element 24b and the detecting circuit 26b, and the device under test 22c corresponds to the voltage stabilizing element 24c and the detecting circuit. 26c, the device under test 22d corresponds to the voltage stabilizing element 24d and the detecting circuit 26d, and the resistance ratio of the detecting circuit 26a is R11/R12, the resistance ratio of the detecting circuit 26b is R21/R22, and the detecting circuit 26c is resistant. The resistance ratio of R31/R32 and the detection circuit 26d is different from that of R41/R42. Therefore, for each measurement ADCP1, ADCP2, ADCP3, ADCP4 must correspond to the design of one voltage regulator component 24a, 24b, 24c, 24d and detection circuit 26a, 26b, 26c, 26d, respectively, which will add additional cost.

The object of the present invention is to provide a detecting device capable of detecting current of at least one device under test, comprising a measuring unit and a detecting circuit, the measuring unit comprising an analog digital converter (Analog) To Digital Converter, ADC) measures the 埠, which corresponds to a device under test. Each detecting circuit corresponds to the measuring device and the device under test for measuring a current flowing through the corresponding device under test, and includes a common circuit, a branch circuit and a switch. The common circuit includes a first resistor and a second resistor. One end of the first resistor is coupled to one of the voltage terminals of the power source, and the other end is coupled to the corresponding one. The second resistor is coupled to the corresponding one of the measuring electrodes, and the other end is coupled to one of the ground terminals of the power source. The branch circuit includes a third resistor and a fourth resistor. One end of the third resistor is coupled to the corresponding measuring port, and the other end is coupled to the corresponding device under test. One end of the fourth resistor is coupled to the ground end of the power source, and the other end is coupled to the corresponding device under test. One end of the switch is coupled to the voltage end of the power source, and the other end is coupled to the corresponding device under test for turning on or off according to a first control signal. The measurement of the input voltage value of each ADC is not only achieved by the firmware switching circuit, but also a switch is designed inside the measuring unit, and the input voltage value of each ADC is measured by hardware switching. Multiple sets of devices under test can be connected at the same time and their individual current changes can be measured, and the design of some shared circuits can be matched to save the overall cost.

According to the present invention, the detection circuit of the present invention further includes at least one voltage stabilizing circuit, each voltage stabilizing circuit corresponding to an analog-to-digital converter and a detecting circuit, one end of which is coupled to the grounding end, and the other end of which is coupled to This corresponds to an analog digital converter. The voltage stabilizing circuit is, for example, a Zener diode.

According to the invention, the resistance of the third resistor is between 100 and 1000 times the resistance of the fourth resistor. And each switch is, for example, a transistor.

The invention has the advantages that the design does not cause the input device of the device under test to be unstable due to the change of the current to the measurable voltage of the ADC, thereby causing the device under test to be unstable and generating unnecessary power consumption problems. Multiple sets of devices can be detected through the firmware control or internal switch without designing multiple sets of detection circuits or multiple independent input power sources (for example, one-to-many winding transformers), resulting in a large increase in hardware cost. Avoid adding unnecessary noise due to the winding transformer.

In order to make the above-mentioned contents of the present invention more comprehensible, the preferred embodiments are described below, and the detailed description is as follows:

Please refer to FIG. 3, which is a schematic diagram of the detecting device 100 and the device under test 110 according to the first embodiment of the present invention. The detecting device 100 includes a measuring unit 120 and a detecting circuit 140. The measurement unit 120 includes an analog to digital converter (ADC) measurement 埠 ADCP. The ADC measurement 埠ADCP corresponds to a device under test 110 for measuring the current change of the corresponding device under test 110. The detecting circuit 140 corresponds to the ADC measuring 埠ADCP, and the detecting circuit 140 includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4 and a switch SW. One end of the first resistor R1 is coupled to the voltage terminal VDC, and the other end is coupled to the corresponding ADC measurement 埠ADCP. One end of the second resistor R2 is coupled to the corresponding ADC measurement 埠ADCP, and the other end is coupled to the ground. One end of the third resistor R3 is coupled to the corresponding ADC measurement 埠 ADCP, and the other end is coupled to the ground of the corresponding device under test 110. One end of the fourth resistor R4 is coupled to the ground end, and the other end is coupled to the ground end of the corresponding device under test 110. One end of the switch SW is coupled to the voltage terminal VDC, and the other end is coupled to the corresponding power supply end of the device under test 110 for determining whether to turn on or off according to a control signal from an I/O port. The resistance value of the third resistor R3 is, for example, 100 times to 1000 times the resistance value of the fourth resistor R4.

When the control signal of the input/output output turns off the switch SW to make it non-conductive, the device under test 110 cannot be turned off by the power supply voltage VDC. At this time, the measurement 埠ADCP will generate a voltage according to R1/R2, that is, 1/ (1+(R1/R2))×VDC, as the reference voltage value. Since each ADC also has an upper threshold for its voltage measurement, the initial voltage divided by R1/R2 cannot exceed this upper limit. The purpose of the voltage stabilizing circuit 150 is to limit the upper limit value to a preset optimum value. Generally, the voltage stabilizing circuit 150 can be a Zener diode. The third resistor R3 acts as a current limiting and measuring resistor to prevent the current input to the measuring 埠ADCP1 from being too large, causing the analog digital converter to burn out and to generate a voltage change. The fourth resistor R4 is a small resistance (ohm level) for causing an approximately common function between the device under test 110 and the detecting device 100 to prevent the voltage supplied to the device under test 110 from being caused by the voltage without common ground. Unstable.

When the control signal of the input/output output turns off the switch SW to make it non-conductive, the device under test 110 cannot be turned off by the power supply voltage VDC. At this time, VADC=I3R3+I3R4, where I3 represents the current flowing through the resistor R3. And because the resistance of R4 is much smaller than the resistance of R3, . When the control signal of the input/output output turns on the switch SW to be turned on, the device under test 110 receives the power supply voltage VDC, so the input voltage of the device under test 110a, 110b is Vdin=VDC, and VADC=(I3-Id)× R3. Because the ADC is determined by the grounding end of the device under test 110 to change the current, the voltage input level of the device under test 110 is not affected by the voltage difference, that is, the input voltage Vdin of the input device under test 110 is always equal to the voltage terminal. VDC. In addition, the third resistor R3 changes the voltage due to the current change of each device under test 110, so that the voltage divider value VADC obtained by the ADC changes.

Please refer to FIG. 4, which is a schematic diagram of a detecting device 200 and a device under test 110a, 110b according to a second embodiment of the present invention. The detecting device 200 includes a measuring unit 220 and at least one detecting circuit 140. Unlike the measurement unit 120 of FIG. 3, the measurement unit 220 includes two or more ADC measurement units ADCP1, ADCP2. Each ADC measurement 埠ADCP1, ADCP2 corresponds to a device under test 110a, 110b, respectively, for measuring the current change of the corresponding device under test 110a, 110b. The operation principle of the detecting device 200 is the same as that of the detecting device 100 of FIG. 3, and details are not described herein again.

Please refer to FIG. 5, which is a schematic diagram showing the time variation of the current Id flowing through the measuring device when the lithium battery is charged in the general device under test. Since the Id changes with the load of the device under test 110a, 110b, when the voltage of the device under test 110a, 110b is insufficient, after the voltage is input, a large current Imax is consumed to accelerate the charging. Once the voltage is stabilized, the current consumption will gradually decrease. It becomes smaller, and after a full charge, a small fixed current Imin is maintained. Therefore, the measurement 埠ADCP1, ADCP2 can determine whether the device under test 110a, 110b is fully charged by the amount of voltage change caused by the Id becoming large and small.

For example, the device under test 110a, 110b is a chargeable device. When the control signal of the I/O port causes the switch SW to be turned off, the reference voltage value VADC1 of the ADC at this time is recorded. Then, when the control signal of the I/O埠 causes the switch SW to be turned on and the power is connected, the device under test 110a, 110b initially consumes a large current, so that the measured voltage values of the ADCP1 and ADCP2 are measured. A big change has occurred. After a period of time, when the power of the devices under test 110a, 110b is gradually filled, the current consumption will gradually decrease. At this time, the measured voltage values of ADCP1 and ADCP2 will gradually increase. When the devices under test 110a, 110b are fully charged, the current consumption will become a fixed small current value due to the charging characteristics. After a period of time, it can be determined that the devices under test 110a, 110b have been charged and the supplied power is turned off. Conversely, during a long period of charging, it is found that the measured voltages of ADCP1 and ADCP2 are still low. After a period of time, a fault or dangerous situation can be identified and a power-off protection mechanism is added to protect the charging device. And the devices under test 110a, 110b are protected from overheating and are in danger.

Please refer to FIG. 6. FIG. 6 is a schematic diagram of the detecting device 300 and the device under test 110 according to the third embodiment of the present invention. The detecting device 300 includes a measuring unit 320 and a detecting circuit 340. The measurement unit 320 includes analog-to-digital converter measurements 埠ADCP1, ADCP2, and a switch 322. The ADC measurement 埠ADCP1 and ADCP2 are respectively used as reference voltages according to different input voltage values to measure the current variation of the flow through the measuring device 110. The switch 322 determines to enable the ADC measurement 埠ADCP1 or ADCP2 according to the second control signal SEL. The detection circuit 340 includes a common circuit 342, branch circuits 344a, 344b, and a voltage stabilization circuit 150. The common circuit 342 includes a first resistor R1 and a second resistor R2. One end of the first resistor R1 is coupled to the voltage terminal VDC, and the other end is coupled to the ADC measurement signals ADCP1, ADCP2. One end of the second resistor R2 is coupled to the corresponding ADC measurement 埠 ADCP1, ADCP2, and the other end is coupled to the ground. The branch circuit 344a includes a third resistor R31, a fourth resistor R41, and a changeover switch SW2. One end of the third resistor R31 is coupled to the corresponding ADC measurement 埠ADCP1, and the other end is coupled to the ground of the corresponding device under test 110. The branch circuit 344b includes a third resistor R32, a fourth resistor R42, and a changeover switch SW3. One end of the third resistor R32 is coupled to the ADC measurement 埠ADCP2, and the other end is coupled to the ground of the corresponding device under test 110. One end of the power switch SW1 is coupled to the voltage terminal VDC, and the other end is coupled to the power terminal Vdin of the corresponding device under test 110 for determining whether to turn on or off according to the first control signal from the input/output I/O.

When the third control signal SEL=0, the switch 322 starts the measurement 埠ADCP1, and the device under test is simultaneously turned off and the measurement 埠ADCP2 is turned on. When the third control signal SEL=1, the switch 322 starts the measurement 埠ADCP2, and the device under test is simultaneously turned off and the measurement 埠ADCP1 is turned on. For ease of explanation, the following embodiment will be described with the start-up measurement 埠ADCP1. When the first control signal of the input/output I/O output turns on the power switch SW1 to be turned on, the device under test 110a receives the power supply voltage VDC, and at the same time, the second control signal outputted to the output of the I/O1 will switch. SW2 is turned on, but the switch SW3 is turned off. Therefore, the input voltage Vdin=VDC of the device under test 110a is input, and VADC=(I3-Id)×R31. Since the ADC is determined by the grounding end of the device under test 110a, the voltage input level of the device under test 110a is not affected by the voltage difference, that is, the input voltage Vdin of the input device under test 110a is always equal to the voltage terminal. VDC.

When the first control signal outputted to the I/O output turns off the power switch SW1 to make it non-conducting, at the same time, the second control signal outputted to the I/O1 output will switch the switch SW2 off, but the switch SW3 will be switched. Turn on the conduction. At this time, the device under test 110a cannot be turned off by the power supply voltage VDC, and the device under test 110b is activated by the voltage Vdin. The measurement 埠ADCP1 is based on the voltage generated by R1/R2 of the common circuit 340, that is, 1/(1+(R1/R2))×VDC, as the reference voltage value. Since each ADC also has an upper threshold for its voltage measurement, the initial voltage divided by R1/R2 cannot exceed this upper limit. The purpose of the voltage stabilizing circuit 150 is to limit the upper limit value to a preset optimum value. The third resistor R31 acts as a current limiting and measuring resistor to prevent the current input to the measuring 埠ADCP1 from being too large, causing the analog digital converter to burn out and used to generate a voltage change. The fourth resistor R41 is a small resistor (ohm level) for causing an approximately common function between the device under test 110a and the detecting device 300 to prevent the voltage supplied to the device under test 110a from being caused by the voltage. Unstable.

Since the on/off times of the changeover switches SW2 and SW3 do not overlap, the current values of the device under test 110a and the device under test 110b can be measured at different times. In other words, the branch circuits 342a and 342b share the same common circuit 320 and the voltage stabilization circuit 150. Therefore, the cost of setting the additional shared circuit 320 and the voltage stabilizing circuit 150 can be reduced. In addition, the switch 322 in the measuring unit 320 can be implemented by a software code in addition to being implemented by a hardware circuit.

Please refer to FIG. 7. FIG. 7 is a schematic diagram of the detecting device 400 and the device under test 110 according to the fourth embodiment of the present invention. The detecting device 400 includes a measuring unit 420 and a detecting circuit 440. Measurement unit 420 includes analog-to-digital converter measurements 埠ADCP1-ADCP4 and switch 422. Each ADC measurement 埠ADCP1-ADCP4 is used as a reference voltage according to different input voltage values to measure the current variation of the flow through the measuring device 110. The function of the switch 422 is to decide to start one of the ADC measurements according to a third control signal SEL1, SEL0. Switch 422 can be implemented using a plurality of switching circuits, or decoders, or multiplexers, or software code. The detection circuit 440 includes a common circuit 442, branch circuits 444a-444d, and a voltage stabilization circuit 150. The common circuit 442 includes a first resistor R1 and a second resistor R2. One end of the first resistor R1 is coupled to the voltage terminal VDC, and the other end is coupled to the ADC measurement 埠ADCP1-ADCP4. One end of the second resistor R2 is coupled to the corresponding ADC measurement 埠ADCP1-ADCP4, and the other end is coupled to the ground. The branch circuits 444a, 444b, 444c, 444d include third resistors R31, R32, R33, R34 and fourth resistors R41, R42, R43, R44. One end of the power switch SW1 is coupled to the voltage terminal VDC, and the other end is coupled to the power terminal Vdin of the corresponding device under test 110 for determining whether to turn on or off according to the first control signal from the input/output I/O. In addition, the detecting device 400 of FIG. 7 is different from the detecting 300 of FIG. 6 in that the detecting circuit 440 further includes a multiplexer 446 coupled to the common circuit 442 and each branch circuit 444a. The third resistor R31-R34 of the -444d is configured to select one of the branch circuits and the common circuit 442 to be turned on according to a fourth control signal I/O1, I/O2. In other words, the multiplexer 446 switches the common circuit 442 and one of the branch circuits 444a-444d according to the fourth control signal I/O1, I/O2, and can measure the plurality of devices under test 110 at different times. Current value. In other words, the branch circuits 442a-442d share the same common circuit 420 and the voltage stabilizing circuit 150. Therefore, the cost of setting the additional shared circuit 420 and the voltage stabilizing circuit 150 can be reduced.

Please refer to FIG. 8. FIG. 8 is a schematic diagram of the detecting device 500 and the device under test 110 according to the fifth embodiment of the present invention. The detecting device 500 includes a measuring unit 520 and a detecting circuit 540. Measurement unit 520 includes analog-to-digital converter measurements 埠ADCP1-ADCP4 and switch 522. Each ADC measurement 埠ADCP1-ADCP4 is used as a reference voltage according to different input voltage values to measure the current variation of the flow through the measuring device 110. The function of the switch 522 is to decide to start one of the ADC measurements according to a third control signal SEL1, SEL0. Switch 522 can be implemented using a plurality of switching circuits, or decoders, or multiplexers, or software code. The detection circuit 540 includes a common circuit 542, branch circuits 544a-544d, and a voltage stabilization circuit 150. The common circuit 542 includes a first resistor R1, a second resistor R2, and a fourth resistor R4. One end of the first resistor R1 is coupled to the voltage terminal VDC, and the other end is coupled to the ADC measurement 埠ADCP1-ADCP4. The second resistor R2 is coupled to the corresponding ADC measurement 埠ADCP1-ADCP4, and the other end is coupled to the ground terminal. The fourth resistor R4 is coupled to the power terminal Vdin and the ground terminal of the corresponding device under test 110. The branch circuits 544a, 544b, 544c, 544d respectively include third resistors R31, R32, R33, R34. In other words, the detecting device 500 of the present embodiment sets the fourth resistor R4 to the sharing circuit 542 as compared with the design of the branching device 400 of FIG. One end of the power switch SW1 is coupled to the voltage terminal VDC, and the other end is coupled to the power terminal Vdin of the corresponding device under test 110 for determining whether to turn on or off according to the first control signal from the input/output I/O. The multiplexer 546 is coupled to the common circuit 542 and the third resistors R31-R34 of each of the branch circuits 544a-544d for determining a branch circuit according to a fourth control signal I/O1, I/O2. The shared circuit 542 is turned on. The multiplexer 546 switches the common circuit 542 and one of the branch circuits 544a-544d according to the fourth control signal I/O1, I/O2, and can measure the current values of the plurality of devices under test 110 at different times. .

Please refer to FIG. 9. FIG. 9 is a schematic diagram of a detecting device 600 and a device under test 110 according to a sixth embodiment of the present invention. The detecting device 600 includes a measuring unit 220 and a detecting circuit 540. The measurement unit 220 includes an analog to digital converter measurement 埠 ADCP1. The ADC measurement 埠ADCP1 is used as a reference voltage according to different input voltage values to measure the current variation of the flow through the measuring device 110. The detection circuit 540 includes a common circuit 542, branch circuits 544a-544d, and a voltage stabilization circuit 150. The common circuit 542 includes a first resistor R1, a second resistor R2, and a fourth resistor R4. One end of the first resistor R1 is coupled to the voltage terminal VDC, and the other end is coupled to the ADC measurement 埠ADCP1. The second resistor R2 is coupled to the corresponding ADC measurement 埠 ADCP1, and the other end is coupled to the ground terminal. The fourth resistor R4 is coupled to the power terminal Vdin and the ground terminal of the corresponding device under test 110. The branch circuits 544a, 544b, 544c, 544d respectively include third resistors R31, R32, R33, R34. Compared with the detecting device 500 of FIG. 8, the measuring unit 220 of the detecting device 600 of the embodiment has only one ADC measuring 埠ADCP1. One end of the power switch SW1 is coupled to the voltage terminal VDC, and the other end is coupled to the power terminal Vdin of the corresponding device under test 110 for determining whether to turn on or off according to the first control signal from the input/output I/O. The multiplexer 546 is coupled to the common circuit 542 and the third resistors R31-R34 of each of the branch circuits 544a-544d for determining a branch circuit according to a fourth control signal I/O1, I/O2. The shared circuit 542 is turned on. The multiplexer 546 switches the common circuit 542 and one of the branch circuits 544a-544d according to the fourth control signal I/O1, I/O2, and can measure the current values of the plurality of devices under test 110 at different times. .

Compared with the prior art, the present invention utilizes a hardware circuit design method to achieve measurement of one or more groups of test device loads by using only one set of input power sources and one input port to uniformly control power on or off of all devices under test. Variety. In practical applications, the input of the charging device is not affected by the input voltage of the device under test. When the power supply is applied to one or more groups of devices under test, each group of ADCs is informed by the current change of the device. Whether the device has been fully charged, and by knowing the change, the program further controls the corresponding signal and the subsequent related actions such as turning off the power. It is also possible to prevent a corresponding protection mechanism from being maintained when the current consumed by the device under test does not change continuously over a long period of time.

While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the invention may be variously modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.

10. . . Measuring unit

12. . . Device under test

20. . . Measuring unit

22a-22d. . . Device under test

24a-24d. . . Voltage regulator component

26a-26d. . . Detection circuit

R1-R3. . . resistance

ADCP1-ADCP4. . . Measurement

100, 200. . . Detection device

110a, 110b. . . Device under test

120, 220. . . Measuring unit

140. . . Detection circuit

150. . . Regulator circuit

R11-R42. . . resistance

300, 400. . . Detection device

110. . . Device under test

320, 420. . . Measuring unit

340, 440, 540. . . Detection circuit

SW1-SW4. . . switch

322, 422. . . Switcher

446. . . Multiplexer

342, 442. . . Shared circuit

344, 444. . . Branch circuit

Figure 1A is a schematic diagram of a prior art analog-to-digital converter measurement unit for measuring a device under test.

FIG. 1B is a schematic diagram showing another analog-to-digital converter measuring unit for measuring the device under test.

Figure 2 is a schematic diagram of another analog-to-digital converter measuring unit for measuring a plurality of devices under test.

Fig. 3 is a schematic view showing a detecting device and a device under test according to the first embodiment of the present invention.

Fig. 4 is a schematic view showing a detecting device and a device under test according to a second embodiment of the present invention.

Fig. 5 is a schematic diagram showing the time variation of the current flowing through the measuring device when the lithium battery is built in the general device under test.

Figure 6 is a schematic view of a detecting device and a device under test according to a third embodiment of the present invention.

Figure 7 is a schematic view of a detecting device and a device under test according to a fourth embodiment of the present invention.

Figure 8 is a schematic view showing a detecting device and a device under test according to a fifth embodiment of the present invention.

Figure 9 is a schematic view of a detecting device and a device under test according to a sixth embodiment of the present invention.

ADC1-ADCP2‧‧‧ Measure

100‧‧‧Detection device

110‧‧‧Device under test

120‧‧‧Measurement unit

140‧‧‧Common circuit

150‧‧‧Variable circuit

R1-R3‧‧‧ resistance

Claims (31)

A detecting device capable of detecting current of at least one device under test by a power source, comprising: a measuring unit comprising at least one analog to digital converter (ADC) measuring quantity, the quantity Detecting a device to be tested; and at least one detecting circuit, each detecting circuit corresponding to the measuring device and the device under test for measuring a current flowing through the corresponding device under test, comprising: a first resistor, one end of which is coupled to one of the voltage terminals of the power source, and the other end of which is coupled to the corresponding one of the measuring electrodes; a second resistor having one end coupled to the corresponding measuring pole and the other end coupled a third resistor, one end of which is coupled to the corresponding measurement port, and the other end is coupled to the corresponding device under test; a fourth resistor having one end coupled to the power source a grounding end, the other end is coupled to the corresponding device under test; and a power switch having one end coupled to the voltage end of the power source and the other end coupled to the corresponding device under test for The control signal is turned on or off. The detecting device of claim 1, wherein each detecting circuit further comprises: a voltage stabilizing circuit, one end of which is coupled to the grounding end, and the other end of which is coupled to the corresponding measuring unit. The detecting device of claim 3, wherein the voltage stabilizing circuit is a Zener diode. The detecting device of claim 1, wherein the resistance value of the third resistor is 100 times to 1000 times the resistance value of the fourth resistor. The detecting device of claim 1, wherein each of the open contacts has a transistor. The detecting device of claim 1, wherein the measuring unit further comprises a switch coupled to the at least one measuring unit for determining to enable the second control signal according to a second control signal. A measure of sputum. The detecting device of claim 6, wherein the switch is a decoder. The detecting device of claim 6, wherein the switch is a software code. A detecting device capable of detecting currents of a plurality of devices under test under a power source, comprising: a measuring unit comprising a plurality of analog-digital converters, each of which corresponds to one of And a detecting circuit for measuring a current flowing through the devices to be tested, comprising: a common circuit, comprising: a first resistor, one end of which is coupled to one of the voltage ends of the power source, The other end is coupled to the equal measuring pole; a second resistor having one end coupled to the equal measuring pole and the other end coupled to one of the power grounds; and a power switch having one end coupled to the a voltage end of the power source, the other end is coupled to the corresponding device under test for turning on or off according to a first control signal; and a plurality of branch circuits each comprising: a third resistor coupled at one end thereof The other end is coupled to the corresponding device under test; a fourth resistor having one end coupled to the ground end of the power source and the other end coupled to the corresponding device under test; a switch, one end of which is coupled to the common Circuit, and the other end coupled to the third resistor, to open or close according to a second control signal. The detecting device of claim 9, wherein the detecting circuit further comprises a voltage stabilizing circuit, one end of which is coupled to the grounding end and the other end of which is coupled to the corresponding measuring unit. The detecting device of claim 10, wherein the voltage stabilizing circuit is a Zener diode. The detecting device of claim 9, wherein the resistance value of the third resistor is 100 times to 1000 times the resistance value of the fourth resistor. The detecting device of claim 9, wherein each of the open contacts is a transistor. The detecting device of claim 9, wherein the measuring unit further comprises a switch coupled to the equal measuring device for enabling one of the third control signals to be enabled. Measuring 埠. The detecting device of claim 14, wherein the switch is a decoder. The detecting device of claim 14, wherein the switch is a software code. The detecting device of claim 9, wherein the detecting circuit further comprises a multiplexer coupled to the common circuit and each branch circuit, wherein the multiplexer includes each branch circuit The switch is configured to select one of the branch circuits to be turned on according to the third control signal and the fourth control signal. A detecting device capable of detecting currents of a plurality of devices under test under a power source, comprising: a measuring unit comprising a plurality of analog-digital converters, each of which corresponds to one of And a detecting circuit for measuring a current flowing through the devices to be tested, comprising: a common circuit, comprising: a first resistor, one end of which is coupled to one of the voltage ends of the power source, The other end of the power supply is coupled to the power supply, and the other end is coupled to the power supply. The other end is coupled to the ground. a voltage terminal, the other end of which is coupled to the corresponding device under test for turning on or off according to a first control signal; a fourth resistor having one end coupled to the ground end of the power source and the other end coupled to the ground end Each of the devices to be tested; and a plurality of branch circuits, each of the branch circuits includes: a third resistor having one end coupled to the corresponding measurement port and the other end coupled to the corresponding device under test; and a a switch having one end coupled to the shared circuit The other end coupled to the third resistor, according to a second control signal for opening or closing. The detecting device of claim 18, wherein the detecting circuit further comprises a voltage stabilizing circuit, one end of which is coupled to the grounding end and the other end of which is coupled to the corresponding measuring unit. The detecting device of claim 19, wherein the voltage stabilizing circuit is a Zener diode. The detecting device of claim 18, wherein the resistance value of the third resistor is 100 times to 1000 times the resistance value of the fourth resistor. The detecting device of claim 18, wherein each of the open contacts has a transistor. The detecting device of claim 18, wherein the measuring unit further comprises a switch coupled to the equal measuring device for enabling one of the third control signals to be enabled. Measuring 埠. The detecting device of claim 23, wherein the switch is a decoder. The detecting device of claim 23, wherein the switch is a software code. The detecting device of claim 18, wherein the detecting circuit further comprises a multiplexer coupled to the common circuit and each branch circuit, wherein the multiplexer includes each branch circuit The switch is configured to select one of the branch circuits to be turned on according to the third control signal and the fourth control signal. A detecting device capable of detecting currents of a plurality of devices under test under a power source, comprising: a measuring unit comprising a plurality of analog-digital converters, each of which corresponds to one of And a detecting circuit for measuring a current flowing through the devices to be tested, comprising: a common circuit, comprising: a first resistor, one end of which is coupled to one of the voltage ends of the power source, The other end of the power supply is coupled to the power supply, and the other end is coupled to the power supply. The other end is coupled to the ground. a voltage terminal, the other end of which is coupled to the corresponding device under test for turning on or off according to a first control signal; and a fourth resistor having one end coupled to the ground end of the power source and the other end coupled Each of the devices to be tested; a plurality of branch circuits, each of the branch circuits includes a third resistor, one end of which is coupled to the corresponding measurement port, the other end of which is coupled to the corresponding device under test; and a switch a device, one end of which is coupled to the shared circuit, One end being coupled to the branch circuit, according to a second control signal for selecting one of the plurality of branch circuit connected to the common circuit. The detecting device of claim 27, wherein the detecting circuit further comprises a voltage stabilizing circuit, one end of which is coupled to the grounding end and the other end of which is coupled to the corresponding measuring unit. The detecting device of claim 28, wherein the voltage stabilizing circuit is a Zener diode. The detecting device of claim 27, wherein the resistance value of the third resistor is 100 times to 1000 times the resistance value of the fourth resistor. The detecting device of claim 27, wherein each of the open contacts has a transistor.