TWI391670B - - Google Patents

Info

Publication number
TWI391670B
TWI391670B TW97112719A TW97112719A TWI391670B TW I391670 B TWI391670 B TW I391670B TW 97112719 A TW97112719 A TW 97112719A TW 97112719 A TW97112719 A TW 97112719A TW I391670 B TWI391670 B TW I391670B
Authority
TW
Taiwan
Application number
TW97112719A
Other languages
Chinese (zh)
Other versions
TW200942827A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW97112719A priority Critical patent/TW200942827A/en
Publication of TW200942827A publication Critical patent/TW200942827A/en
Application granted granted Critical
Publication of TWI391670B publication Critical patent/TWI391670B/zh

Links

TW97112719A 2008-04-08 2008-04-08 Multi-layer probe group and its manufacturing method TW200942827A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97112719A TW200942827A (en) 2008-04-08 2008-04-08 Multi-layer probe group and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97112719A TW200942827A (en) 2008-04-08 2008-04-08 Multi-layer probe group and its manufacturing method

Publications (2)

Publication Number Publication Date
TW200942827A TW200942827A (en) 2009-10-16
TWI391670B true TWI391670B (en) 2013-04-01

Family

ID=44868824

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97112719A TW200942827A (en) 2008-04-08 2008-04-08 Multi-layer probe group and its manufacturing method

Country Status (1)

Country Link
TW (1) TW200942827A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI572867B (en) * 2015-06-05 2017-03-01 Mpi Corp Probe module with feedback test function (2)
US11959941B2 (en) 2021-12-27 2024-04-16 Industrial Technology Research Institute Probe card

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102088205B1 (en) * 2019-08-30 2020-03-16 주식회사 프로이천 Probe pin for testing display panel

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030222668A1 (en) * 2002-03-13 2003-12-04 Scs Hightech, Inc. Method for producing micro probe tips
US20050223543A1 (en) * 2003-12-31 2005-10-13 Microfabrica Inc. Electrochemical fabrication method for fabricating space transformers or co-fabricating probes and space transformers
US20070103177A1 (en) * 2005-11-10 2007-05-10 Mjc Probe Incorporation Probes of probe card and the method of making the same

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030222668A1 (en) * 2002-03-13 2003-12-04 Scs Hightech, Inc. Method for producing micro probe tips
US20050223543A1 (en) * 2003-12-31 2005-10-13 Microfabrica Inc. Electrochemical fabrication method for fabricating space transformers or co-fabricating probes and space transformers
US20070103177A1 (en) * 2005-11-10 2007-05-10 Mjc Probe Incorporation Probes of probe card and the method of making the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI572867B (en) * 2015-06-05 2017-03-01 Mpi Corp Probe module with feedback test function (2)
US11959941B2 (en) 2021-12-27 2024-04-16 Industrial Technology Research Institute Probe card

Also Published As

Publication number Publication date
TW200942827A (en) 2009-10-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees