TWI391670B - - Google Patents
Info
- Publication number
- TWI391670B TWI391670B TW97112719A TW97112719A TWI391670B TW I391670 B TWI391670 B TW I391670B TW 97112719 A TW97112719 A TW 97112719A TW 97112719 A TW97112719 A TW 97112719A TW I391670 B TWI391670 B TW I391670B
- Authority
- TW
- Taiwan
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97112719A TW200942827A (en) | 2008-04-08 | 2008-04-08 | Multi-layer probe group and its manufacturing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW97112719A TW200942827A (en) | 2008-04-08 | 2008-04-08 | Multi-layer probe group and its manufacturing method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200942827A TW200942827A (en) | 2009-10-16 |
TWI391670B true TWI391670B (en) | 2013-04-01 |
Family
ID=44868824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW97112719A TW200942827A (en) | 2008-04-08 | 2008-04-08 | Multi-layer probe group and its manufacturing method |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200942827A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI572867B (en) * | 2015-06-05 | 2017-03-01 | Mpi Corp | Probe module with feedback test function (2) |
US11959941B2 (en) | 2021-12-27 | 2024-04-16 | Industrial Technology Research Institute | Probe card |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102088205B1 (en) * | 2019-08-30 | 2020-03-16 | 주식회사 프로이천 | Probe pin for testing display panel |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030222668A1 (en) * | 2002-03-13 | 2003-12-04 | Scs Hightech, Inc. | Method for producing micro probe tips |
US20050223543A1 (en) * | 2003-12-31 | 2005-10-13 | Microfabrica Inc. | Electrochemical fabrication method for fabricating space transformers or co-fabricating probes and space transformers |
US20070103177A1 (en) * | 2005-11-10 | 2007-05-10 | Mjc Probe Incorporation | Probes of probe card and the method of making the same |
-
2008
- 2008-04-08 TW TW97112719A patent/TW200942827A/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030222668A1 (en) * | 2002-03-13 | 2003-12-04 | Scs Hightech, Inc. | Method for producing micro probe tips |
US20050223543A1 (en) * | 2003-12-31 | 2005-10-13 | Microfabrica Inc. | Electrochemical fabrication method for fabricating space transformers or co-fabricating probes and space transformers |
US20070103177A1 (en) * | 2005-11-10 | 2007-05-10 | Mjc Probe Incorporation | Probes of probe card and the method of making the same |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI572867B (en) * | 2015-06-05 | 2017-03-01 | Mpi Corp | Probe module with feedback test function (2) |
US11959941B2 (en) | 2021-12-27 | 2024-04-16 | Industrial Technology Research Institute | Probe card |
Also Published As
Publication number | Publication date |
---|---|
TW200942827A (en) | 2009-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |