TWI385394B - Method of capacitance measurement for capacitive touch panel - Google Patents

Method of capacitance measurement for capacitive touch panel

Info

Publication number
TWI385394B
TWI385394B TW98131515A TW98131515A TWI385394B TW I385394 B TWI385394 B TW I385394B TW 98131515 A TW98131515 A TW 98131515A TW 98131515 A TW98131515 A TW 98131515A TW I385394 B TWI385394 B TW I385394B
Authority
TW
Taiwan
Prior art keywords
touch panel
capacitive touch
capacitance measurement
capacitance
measurement
Prior art date
Application number
TW98131515A
Other languages
Chinese (zh)
Other versions
TW201111808A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW98131515A priority Critical patent/TWI385394B/en
Publication of TW201111808A publication Critical patent/TW201111808A/en
Application granted granted Critical
Publication of TWI385394B publication Critical patent/TWI385394B/en

Links

TW98131515A 2009-09-18 2009-09-18 Method of capacitance measurement for capacitive touch panel TWI385394B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW98131515A TWI385394B (en) 2009-09-18 2009-09-18 Method of capacitance measurement for capacitive touch panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW98131515A TWI385394B (en) 2009-09-18 2009-09-18 Method of capacitance measurement for capacitive touch panel

Publications (2)

Publication Number Publication Date
TW201111808A TW201111808A (en) 2011-04-01
TWI385394B true TWI385394B (en) 2013-02-11

Family

ID=44909017

Family Applications (1)

Application Number Title Priority Date Filing Date
TW98131515A TWI385394B (en) 2009-09-18 2009-09-18 Method of capacitance measurement for capacitive touch panel

Country Status (1)

Country Link
TW (1) TWI385394B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8816232B2 (en) 2012-09-19 2014-08-26 Htc Corporation Touch panel
CN103677367B (en) * 2012-09-19 2016-08-24 宏达国际电子股份有限公司 Contact panel

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW247350B (en) * 1993-09-17 1995-05-11 Penberthy Inc
TW200608029A (en) * 2004-08-19 2006-03-01 United Microelectronics Corp Method and circuit for measuring capacitance and capacitance dismatch
US20060095229A1 (en) * 2004-11-02 2006-05-04 Valery Kanevsky Method for comparing a value to a threshold in the presence of uncertainty
TW200813797A (en) * 2006-05-31 2008-03-16 Harald Philipp Two-dimensional position sensor
TW200938861A (en) * 2008-03-10 2009-09-16 Winbond Electronics Corp Time interval measurement for capacitive detection

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW247350B (en) * 1993-09-17 1995-05-11 Penberthy Inc
TW200608029A (en) * 2004-08-19 2006-03-01 United Microelectronics Corp Method and circuit for measuring capacitance and capacitance dismatch
US20060095229A1 (en) * 2004-11-02 2006-05-04 Valery Kanevsky Method for comparing a value to a threshold in the presence of uncertainty
TW200813797A (en) * 2006-05-31 2008-03-16 Harald Philipp Two-dimensional position sensor
TW200938861A (en) * 2008-03-10 2009-09-16 Winbond Electronics Corp Time interval measurement for capacitive detection

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
李德治，以算數平均數應用在門檻值制定之研究，科學與工程技術期刊，第一卷第一期，2005年，第47~59頁 *

Also Published As

Publication number Publication date
TW201111808A (en) 2011-04-01

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees