TWI384236B - Tested machine capable of reloading test programs, machine testing system and testing method - Google Patents
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本案係關於一種機器檢測系統與檢測方法,尤指一種可重新載入檢測程式之待測機器、機器檢測系統及檢測方法。The present invention relates to a machine detection system and detection method, and more particularly to a machine to be tested, a machine detection system and a detection method that can be reloaded into a detection program.
隨著科技的進步與提昇,各式電子產品或機器遂而不斷的推陳出新,且其設計更趨於複雜且多功能化。然而為因應市場的快速變遷及大量需求,製造商莫不努力於以最高效率及最低的成本產製各式電子產品或機器以供市場需求。其中,對於電子產品或機器在出廠前的檢測更是各家製造商所努力改善的重點之一。一般而言,由於這類電子產品或機器之檢測系統相當複雜且需時常更換,因此在整個檢測作業的相關檢測程式之擴充與檢測程序之維護工作上,必需面對相當之困難度與不便性。產品製造商在進行檢測工作之擴充及維護時,往往需耗費極大之時間與人力。再者,加以無法預知各式電子產品或機器之檢測作業於未來可能之發展,遂而在進行檢測作業之系統架構及功能性模組之相關設計時,無法對該檢測作業之擴充性多加著墨考量。With the advancement and advancement of technology, various electronic products or machines are constantly evolving, and their designs are more complex and multi-functional. However, in response to the rapid changes in the market and the large demand, manufacturers are not striving to produce various electronic products or machines for market demand with the highest efficiency and lowest cost. Among them, the detection of electronic products or machines before leaving the factory is one of the focuses of improvement by various manufacturers. In general, since the detection system of such electronic products or machines is quite complicated and needs to be replaced frequently, it is necessary to face considerable difficulty and inconvenience in the maintenance of the relevant detection programs and the maintenance of the inspection procedures. . Product manufacturers often spend a lot of time and manpower on the expansion and maintenance of inspection work. Furthermore, it is impossible to predict the possible future development of various electronic products or machines, and in the process of designing the system architecture and functional modules of the inspection operation, it is impossible to add ink to the scalability of the inspection operation. Consideration.
然而現行電子產品或機器,例如多功能事務機、影印機、傳真機、列表機,之檢測作業為增加其便利性,已知有一種預先在製造工序中將檢測程式儲存於電子產品或機 器之微控器內裝ROM(可程式唯讀記憶體)或檢查用ROM內,而於電源開啟以及外部檢測系統輸入檢測命令時,即由電子產品或機器之中央處理單元(CPU)執行該檢測程式來檢測電子產品或機器各部元件或功能正常與否之方法。However, in the current electronic products or machines, such as multi-function machines, photocopiers, facsimile machines, and list machines, the detection operation is to increase the convenience, and it is known to store the detection program in the electronic product or machine in advance in the manufacturing process. The microcontroller has a built-in ROM (programmable read-only memory) or an inspection ROM, and is executed by the central processing unit (CPU) of the electronic product or the machine when the power is turned on and the external detection system inputs a detection command. A method of detecting a program to detect the normality of components or functions of an electronic product or machine.
第一圖A與B分別簡易地顯示使用於傳統機器檢測系統之待測機器以及內含於該待測機器之可執行程式之架構示意圖。如第一圖A與B所示,使用於傳統機器檢測系統之待測機器1(或稱待測機板1)係將可執行程式110儲存於待測機器1內之一非揮發性記憶體(ROM)11中。當待測機板1啟動電源且接收到外部之機器檢測系統所輸入的檢測命令後,可執行程式110可於該非揮發性記憶體11內直接執行,或者是透過中央處理單元12被搭載至隨機存取記憶體單元13中執行。其中該非揮發性記憶體11內之可執行程式110係由『一般目的程式碼』111與『檢測程式碼』112所共同編譯/組譯(compiler or assembler)與連結(Linker)而得。該可執行程式110在一般的使用環境下,係由『一般目的程式碼』111部份所構成之一般目的程式運作與執行;而在測試環境下,則係由『檢測程式碼』112部份所構成之檢測程式運作與執行。其中該檢測程式部份只有在生產測試時才會用到,其他階段,例如出貨到客戶或顧客端時,此檢測程式部份便永遠不會被執行且恆儲存於非揮發性記憶體11中,因此此種作法會造成非揮發性記憶體11與隨機存取記憶體單元13使用空間的浪費與負擔。The first figures A and B respectively show a schematic diagram of the architecture of the machine to be tested used in the conventional machine inspection system and the executable program contained in the machine to be tested. As shown in the first figures A and B, the machine to be tested 1 (or the board to be tested 1) used in the conventional machine inspection system stores the executable program 110 in a non-volatile memory in the machine 1 to be tested. (ROM) 11 in. After the test board 1 is powered on and receives the detection command input by the external machine detection system, the executable program 110 can be directly executed in the non-volatile memory 11 or can be carried to the random through the central processing unit 12. It is executed in the access memory unit 13. The executable program 110 in the non-volatile memory 11 is obtained by "compiler or assembler" and "linker" by "general purpose code" 111 and "detection code" 112. The executable program 110 is operated and executed by a general purpose program consisting of the "general purpose code" portion 111 in a normal use environment; and in the test environment, the "detection code" portion 112 is used. The test program is constructed to operate and execute. The part of the test program is only used during the production test. In other stages, such as shipping to the customer or the client, the part of the test program will never be executed and stored in the non-volatile memory 11 Therefore, this practice causes waste and burden of the use space of the non-volatile memory 11 and the random access memory unit 13.
另一方面,當研發人員或檢測人員想要修改原先之檢測程式以檢測待測機器1的其他元件及功能時,必須重新燒錄更新後之可執行程式110再重新檢測,如此不只過程繁複且有損壞待測機器1之元件與功能的風險。況且當自動生產測試所需要的檢測程式與一般目的程式並存或同時包含於可執行程式110時,所有檢測程序所需的修改就必須重新釋出更新版本,如此將會增加再次產品驗證的成本。通常,電子產品或機器製造商多應客戶之要求而進行電子產品或機器之製造,然而對客戶而言,欲對其已承認或驗證的韌體(Firmware)進行修改的可能性是很低的。當電子產品或機器製造商在測試過程中發現檢測程式出現問題而需要修改時,必須取得客戶的同意,但通常客戶同意的機會不高,這是因為客戶多不願意承擔再次驗證及損壞機器元件與功能之風險,所以要修正檢測程式的機會是非常低的,而且,即使客戶同意修改,但往復的溝通、修改與驗證時間常常會造成產品出貨時程之延誤與成本的增加。更甚者,習知技術將一般目的程式與測試程式一起包含於可執行程式110的作法,不僅會增加機器韌體(Firmware)的大小,對於非揮發性記憶體11與隨機存取記憶體單元13的使用也會增加,進而造成資源上的浪費與負擔。On the other hand, when the developer or the inspector wants to modify the original detection program to detect other components and functions of the device 1 to be tested, the updated executable program 110 must be re-burned and re-detected, so that the process is complicated and There is a risk of damaging the components and functions of the machine 1 to be tested. Moreover, when the test program required for the automatic production test is coexisting with the general purpose program or included in the executable program 110, all the modifications required for the test program must be released again, which will increase the cost of re-product verification. Usually, electronic products or machine manufacturers make electronic products or machines at the request of customers. However, for customers, the possibility of modifying their approved or verified firmware is very low. . When an electronic product or machine manufacturer finds that there is a problem with the test program during the test and needs to be modified, the customer's consent must be obtained, but usually the customer's chance of consent is not high, because the customer is unwilling to undertake re-verification and damage to the machine component. With the risk of function, the chances of correcting the test program are very low, and even if the customer agrees to modify, the reciprocal communication, modification and verification time often leads to delays in product shipment time and cost increase. Moreover, the prior art includes the general purpose program and the test program in the executable program 110, which not only increases the size of the firmware, but also the non-volatile memory 11 and the random access memory unit. The use of 13 will also increase, resulting in waste and burden on resources.
由此可知,傳統技藝預先在製造工序中將檢測程式儲存於電子產品或機器之微控器內裝ROM(可程式唯讀記憶體)或檢查用ROM內之檢測方法,由於該檢測程式已包含於機 器之韌體(Firmware),當研發人員或檢測人員想要修改檢測程式來變更檢測待測機器之其他元件與功能時,必須對韌體(Firmware)內之可執行程式重新燒錄再重新檢測,過程繁複且有損壞機器元件與功能的風險。再則,欲客戶同意將其已承認的韌體(Firmware)再行修改,也常常會因客戶不願承擔再次認證及損壞機器元件與功能之風險而使同意修改的可能性降低,且可能造成出貨時程之延誤以及成本之增加。當然,在傳統技術上,將檢測程式結合一般目的程式而一起內含於機器韌體(Firmware)之作法,不僅會造成修改變更的困難性外,更會佔用機器韧體(Firmware)的容量,對於其內非揮發性記憶體與隨機存取記憶體單元的使用也會增加,進而造成資源上的負擔。Therefore, it is known that the conventional technique stores the detection program in the manufacturing process in the ROM of the electronic device or the device in the ROM (programmable read-only memory) or the inspection ROM, since the detection program already contains Machine Firmware, when the developer or inspector wants to modify the detection program to change the other components and functions of the machine under test, the executable program in the firmware must be re-burned and re-detected. The process is cumbersome and carries the risk of damaging the machine components and functions. Furthermore, if the customer agrees to modify the approved firmware, it is often the case that the customer is unwilling to bear the risk of recertification and damage to the machine components and functions, and the possibility of agreeing to modify is reduced, and may result in Delays in shipping schedules and increased costs. Of course, in the conventional technology, the detection program is integrated into the firmware of the machine together with the general purpose program, which not only causes difficulty in modifying the change, but also occupies the capacity of the firmware. The use of non-volatile memory and random access memory cells also increases, which in turn creates a burden on resources.
因此,如何發展一種可改善上述習知技術缺失之可重新載入檢測程式之待測機器、機器檢測系統及檢測方法,實為目前迫切需要解決之問題。Therefore, how to develop a machine to be tested, a machine detection system and a detection method which can improve the reloading detection program of the above-mentioned conventional technology is an urgent problem to be solved.
本案之主要目的在於提供一種可重新載入檢測程式之待測機器、機器檢測系統以及檢測方法,藉由將檢測程式儲存於機器檢測系統中以取代傳統技術將檢測程式包含於待測機器內之作法,俾增加修改以及管理檢測程式之靈活度以及便利性。The main purpose of the present invention is to provide a device to be tested, a machine detection system and a detection method capable of reloading the detection program, and storing the detection program in the machine detection system by replacing the detection program in the machine to be tested. Practice, add flexibility and manage the flexibility and convenience of the test program.
本案之另一目的在於提供一種可重新載入檢測程式之待測機器、機器檢測系統以及檢測方法,藉此當生產製造 商在生產檢測過程中發現檢測程式出現問題時,可逕自修改,毋須經過客戶同意,而且任何對於檢測程式之變更動作均無需重新燒錄待測機器內之執行程式或進行重新驗證之過程,且可避免這些重新燒錄與驗證的過程可能造成待測機器之元件與功能損壞的風險。Another object of the present invention is to provide a machine to be tested, a machine detection system and a detection method capable of reloading a detection program, thereby manufacturing When the manufacturer finds that there is a problem with the detection program during the production inspection process, it can be modified by itself without any consent from the customer, and any change of the detection program does not need to re-program the execution program or re-verify the machine under test. The process of re-burning and verifying may be avoided, which may result in damage to the components and functions of the machine under test.
本案之另一目的在於提供一種可重新載入檢測程式之待測機器、機器檢測系統以及檢測方法,可利用機器檢測系統之檢測程式提供裝置,例如電腦、伺服器、外接式儲存裝置,將待測機器所需之檢測程式甚或其他執行程式,載入到待測機器的記憶體單元,且於執行檢測程式以及完成檢測後,檢測程式可隨待測機器之電源關閉而消除,不會永久保留於待測機器中,如此不只不會佔據儲存單元以及記憶體單元之可利用空間且不會造成負擔,甚至於可以使用相對較低容量之儲存單元或記憶體單元以降低成本。Another object of the present invention is to provide a device to be tested, a machine detection system and a detection method capable of reloading a detection program, which can be provided by a detection program providing device of a machine detection system, such as a computer, a server, an external storage device, and the like. The test program or even other execution program required by the test machine is loaded into the memory unit of the machine to be tested, and after executing the test program and completing the test, the test program can be eliminated with the power of the machine to be tested turned off, and will not be permanently retained. In the machine to be tested, this does not only occupy the available space of the storage unit and the memory unit without burden, and even a relatively low capacity storage unit or memory unit can be used to reduce the cost.
為達上述目的,本案之一較廣義實施態樣為提供一種待測機器之檢測方法,其中待測機器包括中央處理單元、儲存單元、記憶體單元以及連接介面,該中央處理單元連接於儲存單元、記憶體單元以及連接介面,以及儲存單元儲存至少一個一般目的程式。本案之檢測方法至少包含步驟:(a)提供機器檢測系統,以及將待測機器與機器檢測系統連接,其中機器檢測系統包含檢測程式提供裝置以及檢測命令提供裝置,該檢測程式提供裝置儲存至少一個檢測程式;(b)啟動待測機器且待測機器接收機器檢測系統之檢測命令提供裝置所提供之檢測命令;(c)待測機器因應檢測 命令發出要求至機器檢測系統,該機器檢測系統之檢測程式提供裝置因應該要求提供待測機器所需之檢測程式且經由連接介面載入待測機器之記憶體單元;以及(d)待測機器執行一般目的程式以及檢測程式,以進行待測機器之檢測。In order to achieve the above object, a broader aspect of the present invention provides a method for detecting a machine to be tested, wherein the device to be tested includes a central processing unit, a storage unit, a memory unit, and a connection interface, and the central processing unit is connected to the storage unit. The memory unit and the connection interface, and the storage unit store at least one general purpose program. The detection method of the present invention comprises at least the steps of: (a) providing a machine detection system, and connecting the machine to be tested to the machine detection system, wherein the machine detection system comprises a detection program providing device and a detection command providing device, the detection program providing device storing at least one a test program; (b) a test command provided by the test command providing device that starts the machine to be tested and the machine receiver detection system to be tested; (c) the machine to be tested is tested Command issuing a request to the machine detection system, the detection program providing device of the machine detection system is required to provide the detection program required by the machine to be tested and loaded into the memory unit of the machine to be tested via the connection interface; and (d) the machine to be tested Execute the general purpose program and the test program to perform the test of the machine to be tested.
為達上述目的,本案之另一較廣義實施態樣為提供一種可重新載入檢測程式之待測機器,用於以機器檢測系統進行檢測,其中機器檢測系統包含檢測程式提供裝置以及檢測命令提供裝置,該檢測程式提供裝置儲存至少一個檢測程式,該檢測命令提供裝置提供檢測命令。本案之可重新載入檢測程式之待測機器至少包括:記憶體單元;儲存單元,儲存至少一個一般目的程式;連接介面,連接於機器檢測系統,且使待測機器與機器檢測系統彼此溝通;檢測命令接收介面,接收檢測命令;以及中央處理單元,連接記憶體單元、儲存單元、連接介面以及檢測命令接收介面,用以處理、控制與執行待測機器之運作,以及因應檢測命令接收介面所接收之檢測命令而提供要求至機器檢測系統,藉此以由機器檢測系統之檢測程式提供裝置將檢測程式載入至記憶體單元並執行檢測程式以及一般目的程式,俾進行待測機器之檢測。In order to achieve the above object, another broad aspect of the present invention provides a device to be tested that can be reloaded into a test program for detecting by a machine detection system, wherein the machine detection system includes a detection program providing device and a detection command providing And the detection program providing device stores at least one detection program, and the detection command providing device provides a detection command. The device to be tested for reloading the detection program of the present invention comprises at least: a memory unit; a storage unit storing at least one general purpose program; a connection interface connected to the machine detection system, and allowing the machine to be tested and the machine detection system to communicate with each other; Detecting a command receiving interface, receiving a detection command; and a central processing unit, connecting the memory unit, the storage unit, the connection interface, and the detection command receiving interface for processing, controlling, and executing the operation of the device to be tested, and receiving the interface according to the detection command The detection command is received to provide a request to the machine detection system, whereby the detection program providing device of the machine detection system loads the detection program into the memory unit and executes the detection program and the general purpose program to perform the detection of the machine to be tested.
為達上述目的,本案之又一較廣義實施態樣為提供一種機器檢測系統,用於檢測可重新載入檢測程式之待測機器,其中可重新載入檢測程式之待測機器包括中央處理單元、儲存單元、記憶體單元、連接介面以及檢測命令接收介面,該中央處理單元連接於儲存單元、記憶體單元、連 接介面以及檢測命令接收介面,以及儲存單元儲存至少一個一般目的程式。本案之機器檢測系統至少包括:檢測程式提供裝置,儲存至少一個檢測程式,用於與待測機器之連接介面連接,以因應待測機器之一要求而提供待測機器所需之檢測程式至待測機器之記憶體單元;以及檢測命令提供裝置,與待測機器之檢測命令接收介面連接,用以提供檢測命令,俾使待測機器之中央處理單元執行檢測程式以及一般目的程式。In order to achieve the above object, another broad aspect of the present invention provides a machine detection system for detecting a machine to be tested that can be reloaded into a test program, wherein the machine to be tested that can reload the test program includes a central processing unit. a storage unit, a memory unit, a connection interface, and a detection command receiving interface, the central processing unit being connected to the storage unit, the memory unit, and the connection The interface and the detection command receiving interface, and the storage unit store at least one general purpose program. The machine detection system of the present invention comprises at least: a detection program providing device, and storing at least one detection program for connecting with a connection interface of the machine to be tested, so as to provide a detection program required by the machine to be tested according to one of the requirements of the machine to be tested. The memory unit of the measuring machine; and the detecting command providing device are connected with the detecting command receiving interface of the machine to be tested for providing a detecting command, so that the central processing unit of the machine to be tested executes the detecting program and the general purpose program.
體現本案特徵與優點的一些典型實施例將在後段的說明中詳細敘述。應理解的是本案能夠在不同的態樣上具有各種的變化,其皆不脫離本案的範圍,且其中的說明及圖示在本質上係當作說明之用,而非用以限制本案。Some exemplary embodiments embodying the features and advantages of the present invention are described in detail in the following description. It is to be understood that the present invention is capable of various modifications in the various aspects of the present invention, and the description and illustration are in the nature of
第二圖A係顯示本案較佳實施例之可重新載入檢測程式之待測機器以及機器檢測系統架構示意圖。第二圖B係顯示第二圖A所示架構中之檢測程式與一般目的程式之關係圖。如第二圖A與B所示,本案之待測機器2(或稱待測機板2)可為例如多功能事務機、影印機、傳真機、印表機,但不以此為限。本案之機器檢測系統3可提供待測機器2所需之檢測程式以及提供一檢測命令,用於快速地檢測待測機器2之元件與功能是否正常,並可提供檢測結果,俾利修復或更換。FIG. 2A is a schematic diagram showing the architecture of the device to be tested and the machine detection system of the reloadable detection program of the preferred embodiment of the present invention. The second figure B shows the relationship between the detection program and the general purpose program in the architecture shown in the second figure A. As shown in the second diagrams A and B, the machine 2 to be tested (or the board 2 to be tested) in the present case may be, for example, a multifunction printer, a photocopier, a fax machine, or a printer, but is not limited thereto. The machine detection system 3 of the present invention can provide the detection program required by the machine 2 to be tested and provide a detection command for quickly detecting whether the components and functions of the machine 2 to be tested are normal, and can provide detection results for profit repair or replacement. .
於此實施例中,待測機器2包含記憶體單元21、儲存 單元22、連接介面23以及中央處理單元24。其中,記憶體單元21可為例如隨機存取記憶體單元,以用於暫時性地儲存程式與資料。儲存單元22可為例如非揮發性記憶體,以用於儲存一般目的程式220。連接介面23包含連接介面處理單元231以及連接器232,用以使待測機器2與機器檢測系統3相互連接與溝通。中央處理單元24則連接記憶體單元21、儲存單元22以及連接介面23,用以處理、控制與執行待測機器2之各元件的運作與功能以及因應一檢測命令而將檢測程式210由機器檢測系統3載入至記憶體單元21並執行該檢測程式210,俾進行待測機器2之元件與功能檢測程序。於此實施例中,機器檢測系統3包含檢測程式提供裝置31以及檢測命令提供裝置32,該檢測程式提供單元31可儲存一個或複數個版本之檢測程式210,用以因應待測機器2之要求將待測機器2所需之檢測程式210透過連接介面23載入記憶體單元21。In this embodiment, the device under test 2 includes a memory unit 21 and stores Unit 22, connection interface 23, and central processing unit 24. The memory unit 21 can be, for example, a random access memory unit for temporarily storing programs and data. The storage unit 22 can be, for example, a non-volatile memory for storing the general purpose program 220. The connection interface 23 includes a connection interface processing unit 231 and a connector 232 for interconnecting and communicating with the machine under test 2 and the machine detection system 3. The central processing unit 24 is connected to the memory unit 21, the storage unit 22, and the connection interface 23 for processing, controlling, and executing the operations and functions of the components of the device 2 to be tested, and detecting the detection program 210 by the machine in response to a detection command. The system 3 is loaded into the memory unit 21 and executes the detection program 210, and performs the component and function detection procedure of the device 2 to be tested. In this embodiment, the machine detection system 3 includes a detection program providing unit 31 and a detection command providing unit 32. The detection program providing unit 31 can store one or more versions of the detection program 210 for responding to the requirements of the machine 2 to be tested. The detection program 210 required for the device 2 to be tested is loaded into the memory unit 21 through the connection interface 23.
請參閱第二圖B,本案之一般目的程式220與檢測程式210均係為自各獨立之可執行程式,其中一般且的程式220僅係由一般目的程式碼2201所編譯/組譯(compiler or assembler)與連結(Linker)而得,且儲存於待測機板22之儲存單元22內;而檢測程式210則由檢測程式碼2101所編譯/組譯(compiler or assembler)與連結(Linker)而得,並儲存於機器檢測系統3之檢測程式提供裝置31。Referring to FIG. 2B, the general purpose program 220 and the detection program 210 of the present invention are all independent executable programs, and the general program 220 is only compiled/assembled by the general purpose code 2201 (compiler or assembler). And the linker is stored in the storage unit 22 of the board 22 to be tested; and the detection program 210 is obtained by the compiler or assembler and the linker. And stored in the detection program providing device 31 of the machine detecting system 3.
於一些實施例中,如第二圖A所示,待測機器2更具有一檢測命令接收介面25,該檢測命令接收介面25可於 待測機器2進行檢測程序時與機器檢測系統3之檢測命令提供裝置32連接,以接收該檢測命令提供裝置32所提供之檢測命令並提供至中央處理單元24,使中央處理單元24可於待測機器2電源開啟以及接收到檢測命令時,向機器檢測系統3發出一要求,以要求機器檢測系統3之檢測程式提供裝置31提供待測機器2所需之檢測程式,並經由連接介面23載入記憶體單元21。於一些實施例中,該檢測命令接收介面25可為例如通用輸入輸出接腳(General Purpose Input/0utput Pin)或開關元件,但不以此為限。此外,於一些實施例中,待測機器2之連接介面處理單元231可為例如專用集成電路(Application Specific Integrated Circuit,ASIC),而連接器232可為例如通用序列匯流排連接器(USB)或雙絞線網路接頭(RJ45),但不以此為限。In some embodiments, as shown in FIG. 2A, the device 2 to be tested further has a detection command receiving interface 25, and the detection command receiving interface 25 is When the device 2 under test performs the detection process, it is connected to the detection command providing device 32 of the machine detecting system 3 to receive the detection command provided by the detection command providing device 32 and provide it to the central processing unit 24, so that the central processing unit 24 can wait When the test machine 2 is powered on and receives the detection command, a request is issued to the machine detection system 3 to request the test program providing device 31 of the machine detection system 3 to provide the detection program required by the device 2 to be tested, and is carried via the connection interface 23 Into the memory unit 21. In some embodiments, the detection command receiving interface 25 can be, for example, a general purpose input/output pin or a switching element, but is not limited thereto. In addition, in some embodiments, the connection interface processing unit 231 of the device under test 2 may be, for example, an Application Specific Integrated Circuit (ASIC), and the connector 232 may be, for example, a universal serial bus connector (USB) or Twisted pair network connector (RJ45), but not limited to this.
於一些實施例中,機器檢測系統3之檢測程式提供裝置31可為例如電腦311,該電腦311可儲存一個或多個版本之檢測程式210,並可藉由本身的連接介面與待測機器2之連接介面23連接與溝通。電腦311可於接收到待測機器2之要求後,判斷與提供待測機器2所需版本之待測程式210,且經由連接介面23載入記憶體單元21。當然,於一些實施例中,機器檢測系統3之檢測程式提供裝置31亦可為具有FPT傳輸功能之伺服器,且不以此為限。此外,機器檢測系統3之檢測程式提供裝置31更可包含一顯示裝置312,該顯示裝置312可提供待測機器2與機器檢測系統3 間的檢測狀態資訊以及提供待測機器2之檢測結果,俾利修復與更換。此外,於一些實施例中,機器檢測系統3之檢測命令提供裝置32可為具有一個或複數個頂針之檢測製具(未圖示),藉由將待測機器2放置於該檢測製具時,檢測製具之頂針可與待測機器2之檢測命令接收介面25連接,因此待測機器2之檢測命令接收介面25便可接收檢測命令提供裝置32所提供之檢測命令。當然,於一些實施例中,機器檢測系統3之檢測程式提供裝置31與檢測命令提供裝置32亦可整合為單一裝置或設備。In some embodiments, the detection program providing device 31 of the machine detecting system 3 can be, for example, a computer 311, which can store one or more versions of the detecting program 210, and can be connected to the machine to be tested by its own connection interface. The connection interface 23 is connected and communicated. After receiving the request of the device 2 to be tested, the computer 311 can determine the program to be tested 210 that provides the required version of the device 2 to be tested, and load the memory unit 21 via the connection interface 23. Of course, in some embodiments, the detection program providing device 31 of the machine detecting system 3 may also be a server having an FPT transmission function, and is not limited thereto. In addition, the detection program providing device 31 of the machine detecting system 3 further includes a display device 312, which can provide the machine 2 to be tested and the machine detecting system 3 The information of the detection status and the detection result of the machine 2 to be tested are repaired and replaced. In addition, in some embodiments, the detection command providing device 32 of the machine detecting system 3 may be a detecting tool (not shown) having one or a plurality of thimbles, by placing the device 2 to be tested on the detecting device. The ejector pin of the detecting tool can be connected to the detecting command receiving interface 25 of the machine 2 to be tested. Therefore, the detecting command receiving interface 25 of the machine 2 to be tested can receive the detecting command provided by the detecting command providing device 32. Of course, in some embodiments, the detection program providing device 31 and the detection command providing device 32 of the machine detecting system 3 may also be integrated into a single device or device.
第三圖顯示使用第二圖A所示架構進行檢測程序之一示範性步驟流程圖。如第二圖A、第二圖B以及第三圖所示,首先,如步驟S30所示,將待測機器2與機器檢測系統3連接,其中待測機器2之連接介面23以及檢測命令接收介面25會分別與機器檢測系統3之檢測程式提供裝置31與檢測命令提供裝置32連接。接著,如步驟S31所示,開啟待測機器2之電源,以啟動待測機器2,以及待測機器2等待與接收來自於機器檢測系統3之檢測命令提供裝置31所提供之檢測命令。接著,如步驟S32所示,待測機器2之中央處理單元24判斷是否接收到該檢測命令。然後,如步驟S33所示,若待測機器2之中央處理單元24接收到該檢測命令,則進入檢測模式。此外,如步驟S34所示,若待測機器2之中央處理單元24未接收到該檢測命令,則進入一般使用模式。The third figure shows a flow chart of one of the exemplary steps of the detection procedure using the architecture shown in Figure 2A. As shown in FIG. 2A, FIG. 2B and the third figure, first, as shown in step S30, the machine 2 to be tested is connected to the machine detecting system 3, wherein the connection interface 23 of the machine 2 to be tested and the detection command are received. The interface 25 is connected to the detection program providing device 31 and the detection command providing device 32 of the machine detecting system 3, respectively. Next, as shown in step S31, the power of the machine 2 to be tested is turned on to start the machine 2 to be tested, and the machine 2 to be tested waits for and receives the detection command supplied from the detection command providing means 31 from the machine detecting system 3. Next, as shown in step S32, the central processing unit 24 of the machine 2 under test determines whether or not the detection command is received. Then, as shown in step S33, if the central processing unit 24 of the machine under test 2 receives the detection command, it enters the detection mode. Further, as shown in step S34, if the central processing unit 24 of the machine under test 2 does not receive the detection command, it enters the normal use mode.
請參閱第四圖,其係為第三圖所示步驟中待測機器進 入檢測模式之步驟流程圖。如第四圖所示,當待測機器2進入檢測模式時,如步驟S331所示,待測機器2之中央處理單元24發出一要求至機器檢測系統3。接著,如步驟S332所示,機器檢測系統3因應中央處理單元24之要求,由檢測程式提供裝置31判斷與提供待測機器2所需之檢測程式,並藉由連接介面23載入待測機器2之記憶體單元21。之後,如步驟S333所示,待測機器2之中央處理單元24將儲存於儲存單元22之一般目的程式220載入記憶體單元21並執行,且中央處理單元24執行自機器檢測系統3之檢測程式提供裝置31所載入於記憶體單元21之檢測程式210,以開始檢測待測機器2之各元件與功能正常與否。然後,如步驟S334所示,待測機器2之中央處理單元24將檢測結果傳送至機器檢測系統3,以藉由機器檢測系統3顯示檢測結果,俾利修復與更換。Please refer to the fourth figure, which is the machine to be tested in the step shown in the third figure. Flow chart of the steps into the detection mode. As shown in the fourth figure, when the machine 2 to be tested enters the detection mode, as shown in step S331, the central processing unit 24 of the machine 2 to be tested issues a request to the machine detection system 3. Then, as shown in step S332, the machine detecting system 3 determines, according to the request of the central processing unit 24, the detection program providing device 31 determines the detection program required for providing the device 2 to be tested, and loads the device to be tested through the connection interface 23. 2 memory unit 21. Thereafter, as shown in step S333, the central processing unit 24 of the device under test 2 loads the general purpose program 220 stored in the storage unit 22 into the memory unit 21 and executes it, and the central processing unit 24 performs the detection from the machine detection system 3. The program providing device 31 is loaded into the detecting program 210 of the memory unit 21 to start detecting whether the components and functions of the device 2 to be tested are normal or not. Then, as shown in step S334, the central processing unit 24 of the machine 2 to be tested transmits the detection result to the machine detecting system 3 to display the detection result by the machine detecting system 3, thereby facilitating repair and replacement.
請參閱第五圖,其係為第三圖所示步驟中待測機器進入一般使用模式之步驟流程圖。如第五圖所示,當待測機器2進入一般使用模式時,如步驟S341所示,待測機器2之中央處理單元24會自儲存單元22讀取一般目的程式220並載入記憶體單元21。之後,中央處理單元24執行該一般目的程式220,亦即使待測機器2進入一般使用狀態。Please refer to the fifth figure, which is a flow chart of the steps of the machine to be tested entering the general use mode in the step shown in the third figure. As shown in the fifth figure, when the device 2 to be tested enters the normal use mode, as shown in step S341, the central processing unit 24 of the device under test 2 reads the general purpose program 220 from the storage unit 22 and loads the memory unit. twenty one. Thereafter, the central processing unit 24 executes the general purpose program 220, even if the machine 2 to be tested enters a general use state.
最後,於完成該待測機器2之檢測程序與取得檢測結果後,可關閉待測機器2之電源並將待測機器2與機器檢測系統3分離,此時,載入待測機器2之記憶體單元21中之檢測程式210會自動消除,之後,便可進行後續之修復、 更換或組裝程序。當然,於完成該待測機器2之檢測程序後,可繼續進行下一個待測機器2之檢測,藉此便可以快速地完成所有待測機器2之檢測與修復程序。Finally, after completing the detection procedure of the machine 2 to be tested and obtaining the detection result, the power of the machine 2 to be tested can be turned off and the machine 2 to be tested is separated from the machine detection system 3, at this time, the memory of the machine 2 to be tested is loaded. The detection program 210 in the body unit 21 is automatically eliminated, and then the subsequent repair can be performed. Replace or assemble the program. Of course, after the detection process of the machine 2 to be tested is completed, the detection of the next machine 2 to be tested can be continued, whereby the detection and repair procedures of all the machines 2 to be tested can be quickly completed.
當然,不同待測機器2規格所需要的檢測程式版本亦會不同,由於機器檢測系統3之檢測程式提供裝置31可儲存一個或多個版本之檢測程式,且可以由檢測人員自行修改與調整檢測程式或增刪檢測程式之版本數,因此,當待測機器2與機器檢測系統3連接後,機器檢測系統3之檢測程式提供裝置31可依據不同待測機器2所傳送之要求,判斷與提供該待測機器2所需之檢測程式,俾利待測機器2檢測程序之進行。此外,由於待測機器2之檢測程式係由機器檢測系統3所管理與提供,因此,檢測程式可易於管理與修改,增加檢測程序的靈活性與便利性。更甚者,由於待測機器2之檢測程式並非永久包含於待測機器2之儲存單元22中,因此,不會佔據記憶體單元21以及儲存單元22之使用空間,而且當欲更改或修正檢測程式時,便無須如傳統技術般進行重新燒錄程式以及重新驗證等程序,可以節省許多成本與避免出貨時程的延宕。Of course, the version of the test program required for the different specifications of the machine 2 to be tested may also be different, because the test program providing device 31 of the machine detecting system 3 can store one or more versions of the test program, and can be modified and adjusted by the tester. The number of versions of the program or the addition and deletion detection program. Therefore, when the device 2 to be tested is connected to the machine detection system 3, the detection program providing device 31 of the machine detection system 3 can judge and provide the device according to the requirements transmitted by the different devices 2 to be tested. The test program required for the machine 2 to be tested is carried out for the test procedure of the machine 2 to be tested. In addition, since the detection program of the machine 2 to be tested is managed and provided by the machine detection system 3, the detection program can be easily managed and modified, and the flexibility and convenience of the detection program are increased. Moreover, since the detection program of the machine 2 to be tested is not permanently included in the storage unit 22 of the machine 2 to be tested, it does not occupy the use space of the memory unit 21 and the storage unit 22, and when it is desired to change or correct the detection. When the program is used, there is no need to reprogram the program and re-verify the program as in the conventional technology, which can save a lot of cost and avoid the delay of the shipping schedule.
第六圖係顯示本案另一較佳實施例之可重新載入檢測程式之待測機器以及機器檢測系統架構示意圖。如第六圖所示,待測機器2以及機器檢測系統3之架構、原理以及檢測方式與第二圖A所示架構相似,於此不再贅述,惟機器檢測系統3之檢測程式提供裝置31可由一外接式儲存裝置313替代,該外接式儲存裝置313可為例如可攜式硬碟、 隨身碟等,且不以此為限。相似地,該外接式儲存裝置313可儲存一個或多個版本之檢測程式210,並可藉由本身的連接介面與待測機器2之連接介面23連接與溝通。外接式儲存裝置313可於接收到待測機器2之要求後,提供待測機器2所需版本之待測程式210,且經由連接介面23載入記憶體單元21。機器檢測系統3之檢測程式提供裝置31更可包含一顯示裝置314,該顯示裝置314可嵌設於外接式儲存裝置313或與外接式儲存裝置313分離,用以提供待測機器2與機器檢測系統3間的檢測狀態資訊以及提供待測機器2之檢測結果,俾利修復與更換。使用第六圖所示架構之檢測方式與第三圖、第四圖以及第五圖所示檢測流程相似,於此不再贅述。Figure 6 is a schematic diagram showing the architecture of the machine to be tested and the machine detection system of the reloadable detection program of another preferred embodiment of the present invention. As shown in the sixth figure, the architecture, principle and detection mode of the machine 2 to be tested and the machine detection system 3 are similar to those shown in the second diagram A, and will not be described again here, but the detection program providing device 31 of the machine detection system 3 is omitted. The external storage device 313 can be replaced by an external storage device 313, for example, a portable hard disk, A flash drive, etc., and not limited to this. Similarly, the external storage device 313 can store one or more versions of the detection program 210, and can be connected and communicated with the connection interface 23 of the device 2 to be tested through its own connection interface. The external storage device 313 can provide the test program 210 of the required version of the machine 2 to be tested after receiving the request of the device 2 to be tested, and load the memory unit 21 via the connection interface 23. The detection program providing device 31 of the machine detecting system 3 further includes a display device 314, which can be embedded in the external storage device 313 or separated from the external storage device 313 for providing the device 2 and the machine to be tested. The detection status information between the system 3 and the detection result of the machine 2 to be tested are repaired and replaced. The detection method using the architecture shown in FIG. 6 is similar to the detection processes shown in the third, fourth, and fifth figures, and will not be described again.
綜上所述,本案係提供一種可重新載入檢測程式之待測機器、機器檢測系統以及檢測方法,藉由將檢測程式儲存於機器檢測系統中以取代傳統技術將檢測程式包含於待測機器內之作法,俾增加修改以及管理檢測程式之靈活度以及便利性。此外,當生產製造商在生產檢測過程中發現檢測程式出現問題時,可逕自修改,毋須經過客戶同意,而且任何對於檢測程式之變更動作均無需進行重新燒錄待測機器內之執行程式或重新驗證之過程,且可避免這些重新燒錄與驗證過程可能造成待測機器元件與功能損壞的風險。更甚者,本案可利用機器檢測系統之檢測程式提供裝置,例如電腦、伺服器、外接式儲存裝置,將待測機器所需之檢測程式甚或其他執行程式,載入到待測機器的記憶 體單元,且於執行檢測程式以及完成檢測後,檢測程式可隨待測機器之電源關閉而自動消除,不會永久保留於待測機器中,如此不只不會佔據儲存單元以及記憶體單元之可利用空間且不會造成負擔,甚至可以使用相對較低容量之儲存單元或記憶體單元以降低成本。In summary, the present invention provides a device to be tested, a machine detection system, and a detection method that can be reloaded into a detection program, and the detection program is included in the machine to be tested by storing the detection program in the machine detection system instead of the conventional technology. Internal practices, increase the flexibility and ease of management and testing programs. In addition, when the manufacturer finds that there is a problem with the inspection program during the production inspection process, it can be modified without the customer's consent, and any change of the inspection program does not need to re-execute the execution program in the machine under test or re-run. The process of verification and the risk of damage to the components and functions of the machine under test may be avoided by these re-burning and verification processes. What's more, in this case, the detection program of the machine detection system can be used, such as a computer, a server, an external storage device, and the test program or even other execution programs required for the machine to be tested can be loaded into the memory of the machine to be tested. The body unit, and after executing the detection program and completing the detection, the detection program can be automatically eliminated when the power of the machine to be tested is turned off, and will not be permanently retained in the machine to be tested, so that it does not occupy the storage unit and the memory unit. Space is used without burden, and even relatively low capacity storage units or memory units can be used to reduce costs.
本案得由熟習此技術之人士任施匠思而為諸般修飾,然皆不脫如附申請專利範圍所欲保護者。This case has been modified by people who are familiar with the technology, but it is not intended to be protected by the scope of the patent application.
1‧‧‧待測機器1‧‧‧Machine to be tested
11‧‧‧非揮發性記憶體11‧‧‧ Non-volatile memory
110‧‧‧可執行程式110‧‧‧Executable program
111‧‧‧一般目的程式碼111‧‧‧General purpose code
112‧‧‧檢測程式碼112‧‧‧Detection code
12‧‧‧中央處理單元12‧‧‧Central Processing Unit
13‧‧‧隨機存取記憶體單元13‧‧‧ Random access memory unit
2‧‧‧待測機器2‧‧‧Machine to be tested
21‧‧‧記憶體單元21‧‧‧ memory unit
22‧‧‧儲存單元22‧‧‧ storage unit
23‧‧‧連接介面23‧‧‧Connection interface
24‧‧‧中央處理單元24‧‧‧Central Processing Unit
25‧‧‧檢測命令接收介面25‧‧‧Detection command receiving interface
210‧‧‧檢測程式210‧‧‧Detection program
2101‧‧‧檢測程式碼2101‧‧‧Detection code
220‧‧‧一般目的程式220‧‧‧General purpose program
2201‧‧‧一般目的程式碼2201‧‧‧General purpose code
231‧‧‧連接介面處理單元231‧‧‧Connection interface processing unit
232‧‧‧連接器232‧‧‧Connector
31‧‧‧檢測程式提供裝置31‧‧‧Detection program providing device
32‧‧‧檢測命令提供裝置32‧‧‧Detection command providing device
311‧‧‧電腦311‧‧‧ computer
312‧‧‧顯示裝置312‧‧‧ display device
313‧‧‧外接式儲存裝置313‧‧‧External storage device
314‧‧‧顯示裝置314‧‧‧ display device
S30~S34、S331~S334、S341~S342‧‧‧待測機器之檢測方法流程步驟S30~S34, S331~S334, S341~S342‧‧‧ Test procedure of the machine to be tested
第一圖A:其係簡易地顯示使用於傳統機器檢測系統之待測機器之架構示意圖。First Figure A: A schematic diagram showing the architecture of a machine to be tested used in a conventional machine inspection system.
第一圖B:其係顯示第一圖A所示架構中內含於待測機器之可執行程式關係圖。First figure B: It shows the executable program relationship diagram of the machine to be tested in the architecture shown in the first figure A.
第二圖A:係顯示本案較佳實施例之可重新載入檢測程式之待測機器以及機器檢測系統架構示意圖。FIG. 2A is a schematic diagram showing the architecture of the device to be tested and the machine detection system of the reloadable detection program of the preferred embodiment of the present invention.
第二圖B:係顯示第二圖A所示架構中之檢測程式與一般目的程式之關係圖。Figure B is a diagram showing the relationship between the detection program in the architecture shown in Figure 2A and the general purpose program.
第三圖:係顯示使用第二圖A所示架構進行檢測程序之一示範性步驟流程圖。Third Diagram: A flowchart showing exemplary steps of a test procedure using the architecture shown in Figure 2A.
第四圖:其係為第三圖所示步驟中待測機器進入檢測模式之步驟流程圖。The fourth figure is a flow chart of the steps of the machine to be tested entering the detection mode in the step shown in the third figure.
第五圖:其係為第三圖所示步驟中待測機器進入一般使用模式之步驟流程圖。Figure 5: It is a flow chart of the steps of the machine to be tested entering the general use mode in the step shown in the third figure.
第六圖:係顯示本案另一較佳實施例之可重新載入檢測程式之待測機器以及機器檢測系統架構示意圖。Figure 6 is a schematic diagram showing the architecture of the device to be tested and the machine detection system of the reloadable detection program of another preferred embodiment of the present invention.
2‧‧‧待測機器2‧‧‧Machine to be tested
21‧‧‧記憶體單元21‧‧‧ memory unit
22‧‧‧儲存單元22‧‧‧ storage unit
23‧‧‧連接介面23‧‧‧Connection interface
24‧‧‧中央處理單元24‧‧‧Central Processing Unit
25‧‧‧檢測命令接收介面25‧‧‧Detection command receiving interface
210‧‧‧檢測程式210‧‧‧Detection program
220‧‧‧一般目的程式220‧‧‧General purpose program
231‧‧‧連接介面處理單元231‧‧‧Connection interface processing unit
232‧‧‧連接器232‧‧‧Connector
31‧‧‧檢測程式提供裝置31‧‧‧Detection program providing device
32‧‧‧檢測命令提供裝置32‧‧‧Detection command providing device
311‧‧‧電腦311‧‧‧ computer
312‧‧‧顯示裝置312‧‧‧ display device
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TWI227396B (en) * | 2003-12-12 | 2005-02-01 | Inventec Appliances Corp | Inspection method of portable computer |
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US4689740A (en) * | 1980-10-31 | 1987-08-25 | U.S. Philips Corporation | Two-wire bus-system comprising a clock wire and a data wire for interconnecting a number of stations |
TWI227396B (en) * | 2003-12-12 | 2005-02-01 | Inventec Appliances Corp | Inspection method of portable computer |
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