TWI381160B - Device for setting filter media sample for gas-absorption - Google Patents

Device for setting filter media sample for gas-absorption Download PDF

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TWI381160B
TWI381160B TW97122688A TW97122688A TWI381160B TW I381160 B TWI381160 B TW I381160B TW 97122688 A TW97122688 A TW 97122688A TW 97122688 A TW97122688 A TW 97122688A TW I381160 B TWI381160 B TW I381160B
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Taiwan
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filter material
flow tube
sample
detecting
material according
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TW97122688A
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Chinese (zh)
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TW201000877A (en
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Ming Lang Hung
Jyi Ching Perng
yu hao Kang
Hsing Ting Chen
Chien Yun Huang
Pen Chang Tseng
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Ind Tech Res Inst
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Description

用於檢測微量污染氣體吸附性濾材之樣品置放裝置Sample placement device for detecting trace pollutant gas adsorption filter material

本發明係為一種用於檢測微量污染氣體吸附性濾材之樣品置放裝置,尤其適用於ppm至ppb等級,之微量氣體污染檢測範圍。The invention relates to a sample placing device for detecting a trace pollution gas adsorption filter material, and is particularly suitable for a micro gas pollution detection range of ppm to ppb level.

目前除去空間中之氣態污染物方式,一般分為濕式與乾式兩種。所謂濕式濾除裝置,如洗滌槽式;係將空間中受污染物氣體,導入洗滌槽中,以水洗方式將其中之污染物予以濾除;達到氣體淨化效果。而乾式濾除裝置,係利用對目標污染氣態分子具有吸附或觸媒反應效果之材質,進行物理或化學吸附;達到氣體淨化效果。而空間中微量污染氣體之產生,一般為產品製造過程中產生或外氣空調箱氣體引入。而空間中氣體污染濃度過高,除影響人體健康外,對部份產業的生產製程亦會產生影響,尤其在奈米製程中影響更巨。At present, the way of removing gaseous pollutants in space is generally divided into wet type and dry type. The so-called wet filter device, such as the washing tank type, is to introduce the pollutant gas in the space into the washing tank, and filter the pollutants in the water washing manner to achieve the gas purifying effect. The dry filtering device utilizes a material having an adsorption or catalytic reaction effect on the target contaminated gaseous molecules to perform physical or chemical adsorption; The generation of trace pollutant gases in the space is generally generated during the production of the product or the introduction of gas into the air conditioner. The concentration of gas pollution in the space is too high, in addition to affecting human health, it will also have an impact on the production process of some industries, especially in the nano-process.

目前乾式吸附裝置,如化學濾網或其他類似產品,應用於半導體廠最多。該型濾網係以外框結構體,內部填充可對目標氣體吸附或反應之濾材介質,如活性碳材質。此類多孔性濾材,以外觀來說,大致可分為顆粒狀與平板狀兩大類。濾網製造廠商,將濾網外部結構體製造完成後,再填入適當之顆粒或平板濾材介質,便完成化學濾網或活性碳濾網之製造;產品之性能則委託專門機構進行性能檢測。Currently, dry adsorption devices, such as chemical filters or other similar products, are used in semiconductor plants at the most. The filter mesh is a frame structure, and is internally filled with a filter medium that adsorbs or reacts with a target gas, such as an activated carbon material. Such a porous filter material can be roughly classified into two types, a granular shape and a flat shape, in terms of appearance. The filter manufacturer completes the manufacture of the chemical filter or activated carbon filter after the filter external structure is completed, and then fills in the appropriate granular or flat filter media. The performance of the product is commissioned by a specialized agency for performance testing.

一般化學濾網開發時所需的濾材性能資料,可分為下列幾項:(1)材質濾除性能部份,包括:濾材壓損、初始效率、吸附容量、濾材釋氣分析等;(2)結構方面則包括:氣體濃度、濾材數量(厚)、面風速與溫濕度條件。將兩者整合後,方能設計出有效之化學濾網產品。The filter material performance data required for general chemical filter development can be divided into the following items: (1) Material filtration performance part, including: filter material pressure loss, initial efficiency, adsorption capacity, filter material outgas analysis, etc.; The structural aspects include: gas concentration, amount of filter material (thickness), surface wind speed and temperature and humidity conditions. Once the two are integrated, an effective chemical filter product can be designed.

而上述之全尺寸性能驗證,對廠商而言,開發成本相當高。而目前市面上亦無標準化之儀器設備,供濾除材質之檢驗,因此市場上之濾網價格高居不下。如能將濾材之性能驗證方法標準化與儀器化,讓濾材性能驗證作業,在產品開發前進行檢測與篩選,對產品的開發成本有絕對的經濟效益。The above-mentioned full-scale performance verification, for the manufacturer, the development cost is quite high. At present, there is no standardized equipment on the market for the inspection of materials, so the price of the filter on the market is high. If the performance verification method of the filter material can be standardized and instrumented, the filter material performance verification operation can be tested and screened before product development, and the product development cost has absolute economic benefits.

緣此,本案之發明人係研究出一種用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其係可對於濾材結構體進行系統化之性能驗證。Accordingly, the inventors of the present invention have developed a sample placement device for detecting a trace amount of contaminating gas adsorbent filter material, which is capable of systematically verifying the performance of the filter material structure.

本發明之主要目的係為提供一種用於微污染氣體吸附材料檢測之濾材樣品置放裝置,其係利用實際氣體流場進行濾材之動態檢測,以達成節省開發時間與成本之目的。The main object of the present invention is to provide a filter material sample placement device for detecting micro-polluted gas adsorbent materials, which utilizes an actual gas flow field for dynamic detection of filter media to achieve development time and cost savings.

為達上述目的,本發明係提供一種用於檢測微量污染氣體吸附性濾材之樣品置放裝置,包含:一框架;一樣品槽,係安裝於該框架上且可容置濾材;一第一流管,係安裝於該框架上且與該樣品槽相連接;以及一第二流管,係安裝於該框架上且與該樣品槽相連接;其中,氣體係依序流經該第一流管、該樣品槽以及該第二流管。In order to achieve the above object, the present invention provides a sample placement device for detecting a trace amount of a contaminating gas adsorbent filter material, comprising: a frame; a sample tank mounted on the frame and accommodating the filter material; a first flow tube Mounted on the frame and connected to the sample tank; and a second flow tube mounted on the frame and connected to the sample tank; wherein the gas system flows through the first flow tube in sequence, a sample tank and the second flow tube.

為使 貴審查委員對於本發明之結構目的和功效有更進一步之了解與認同,茲配合圖示詳細說明如後。In order to enable your review committee to have a better understanding and recognition of the structural purpose and efficacy of the present invention, the detailed description is as follows.

請先參閱圖一至圖三,其中圖一係為本發明濾材樣品置放裝置之立體圖;圖二係為本發明樣品槽、第一流管與第二流管連接時之立體圖;圖三則為本發明樣品槽、第一流管與第二流管連接時之剖面圖。Please refer to FIG. 1 to FIG. 3 , wherein FIG. 1 is a perspective view of the sample material placement device of the present invention; FIG. 2 is a perspective view of the sample tank, the first flow tube and the second flow tube of the present invention; A cross-sectional view of the sample tank, the first flow tube and the second flow tube are connected.

本發明之濾材樣品置放裝置1主要由:框架10、樣品槽12、第一流管(前流道部)14與第二流管(氣體流管)16所組成。樣品槽12係安裝於框架10之上且可容置濾材(圖中未示出);第一流管14係安裝於該框架10且一端連接該樣品槽12;第二流管16亦安裝於該框架10且一端連接該樣品槽12。The filter material sample placement device 1 of the present invention mainly comprises a frame 10, a sample tank 12, a first flow tube (front flow path portion) 14, and a second flow tube (gas flow tube) 16. The sample tank 12 is mounted on the frame 10 and can accommodate a filter material (not shown); the first flow tube 14 is mounted on the frame 10 and connected to the sample tank 12 at one end; the second flow tube 16 is also mounted on the sample tube 12 The frame 10 is connected to the sample tank 12 at one end.

該樣品槽12、第一流管14與第二流管16三者可以作分離動作以便測試濾材之裝填與更換。分離動作是利用一第一驅動部(上氣壓缸)102與一第二驅動部(下氣壓缸)104之上下或前後動作將三者作分離或閉合。其中第一驅動部102係與樣品槽12相連接並據以作動,以使樣品槽12與第一流管14進行接合或分離。第二驅動部104則與第二流管16相連接並據以作動,以使樣品槽12與該第二流管16進行接合或分離之動作。分離後之樣品槽12又可借助一線性移動單元106將其移出,以便進行測試濾材之裝填與更換。The sample tank 12, the first flow tube 14 and the second flow tube 16 can be separated to test the loading and replacement of the filter material. The separating operation is to separate or close the three by using a first driving portion (upper pneumatic cylinder) 102 and a second driving portion (lower pneumatic cylinder) 104 above or below. The first driving portion 102 is connected to the sample tank 12 and actuated to engage or separate the sample tank 12 from the first flow tube 14. The second driving unit 104 is connected to the second flow tube 16 and actuated to engage or disengage the sample tank 12 and the second flow tube 16. The separated sample tank 12 can in turn be removed by means of a linear moving unit 106 for the loading and replacement of the test filter material.

為了在接合時精確定位樣品槽12,該框架10上係設有 一第一定位單元1062以作位移時之定位。同樣地,為了在接合時精確定位樣品槽12,框架10之上亦設有一第二定位單元1064以作位移時之定位。In order to accurately position the sample tank 12 at the time of joining, the frame 10 is provided with A first positioning unit 1062 is positioned for displacement. Similarly, in order to accurately position the sample well 12 during the joining, a second positioning unit 1064 is also provided above the frame 10 for positioning during displacement.

而第一流管14又可分為:一前導流部142、與該前導流部142連接之一整流部144,及分別與該整流部144及樣品槽12連接之一前流道部146(如圖二所示)。The first flow tube 14 can be further divided into a front flow guiding portion 142, a rectifying portion 144 connected to the front guiding portion 142, and a front flow channel portion 146 connected to the rectifying portion 144 and the sample tank 12, respectively. (As shown in Figure 2).

該第一流管14係設有一溫度採樣口1402、一露點採樣口1404、一壓差計採樣口1460以及一前測採樣口1462。於本實施例中該溫度採樣口1402與露點採樣口1404係設於前導流部142,壓差計採樣口1460與前測採樣口1462則設於前流道部146。因此,當氣體經由氣體入口1400(係與受測氣體迴路(圖中未示出)連接)進入第一流管14後,吾人可藉由與溫度測量裝置(圖中未示出)相連接之溫度採樣口1402來測量氣體之初始溫度、藉由與露點測量裝置(圖中未示出)相連接之露點採樣口1404來測量氣體之初始濕度、藉由與壓差測量裝置(圖中未示出)相連接之壓差計採樣口1460來測量氣體之初始壓力,以及藉由與濃度測量裝置(圖中未示出)相連接之前測採樣口1462來測量氣體之初始濃度。The first flow tube 14 is provided with a temperature sampling port 1402, a dew point sampling port 1404, a differential pressure meter sampling port 1460, and a pre-measurement sampling port 1462. In the present embodiment, the temperature sampling port 1402 and the dew point sampling port 1404 are disposed in the front flow guiding portion 142, and the differential pressure meter sampling port 1460 and the front sampling port 1462 are disposed in the front flow path portion 146. Therefore, when the gas enters the first flow tube 14 via the gas inlet 1400 (connected to the gas circuit under test (not shown)), the temperature can be connected to the temperature measuring device (not shown). The sampling port 1402 measures the initial temperature of the gas, and measures the initial humidity of the gas by using the dew point sampling port 1404 connected to the dew point measuring device (not shown) by means of the differential pressure measuring device (not shown in the figure) The connected differential pressure meter sampling port 1460 measures the initial pressure of the gas and measures the initial concentration of the gas by measuring the sampling port 1462 before being connected to a concentration measuring device (not shown).

類似地,該第二流管16亦設有一溫度採樣口1602、一露點採樣口1604、一壓差計採樣口1606以及一後測採樣口1608。如此,吾人可藉由與溫度測量裝置(圖中未示出)相連接之溫度採樣口1602來測量被吸附後之氣體溫度、藉由與露點測量裝置(圖中未示出)相連接之露點採樣口1604來測量被吸附後之氣體濕度、藉由與壓差測量裝置(圖中 未示出)相連接之壓差計採樣口1606來測量被吸附後之氣體壓力,以及藉由與濃度測量裝置(圖中未示出)相連接之後測採樣口1608來測量被吸附後之氣體濃度。最後氣體會經由氣體出口1600離開該濾材樣品置放裝置1。Similarly, the second flow tube 16 is also provided with a temperature sampling port 1602, a dew point sampling port 1604, a differential pressure meter sampling port 1606, and a post-measurement sampling port 1608. In this way, the temperature of the adsorbed gas can be measured by a temperature sampling port 1602 connected to a temperature measuring device (not shown), and the dew point connected to the dew point measuring device (not shown) can be measured. Sampling port 1604 to measure the humidity of the adsorbed gas by means of a differential pressure measuring device (in the figure) The differential pressure meter sampling port 1606 is not shown to measure the adsorbed gas pressure, and the adsorbed gas is measured by measuring the sampling port 1608 after being connected to a concentration measuring device (not shown). concentration. Finally, the gas exits the filter material sample placement device 1 via the gas outlet 1600.

如圖三所示,為了疏導受測氣體之氣流場,前導流部142與前流道部146之間連接之整流部144中係設有複數組整流片1440,整流片1440上開設有若干孔洞,因此可將經由氣體入口1400流入之受測氣體進行整流以提高測試之準確性及一致性。前流道部146又與樣品槽12連接,以將受測氣體導入吸附區A做吸附測試。As shown in FIG. 3, in order to guide the airflow field of the gas to be measured, a rectifying portion 144 is connected to the rectifying portion 144 connected between the front flow guiding portion 142 and the front flow portion 146, and the commutator piece 1440 is provided with a plurality of The holes, therefore, can be rectified by the gas being introduced through the gas inlet 1400 to improve the accuracy and consistency of the test. The front flow path portion 146 is in turn connected to the sample tank 12 to introduce the gas to be measured into the adsorption zone A for adsorption test.

為達到氣密效果,樣品槽12與第一流管14連接之第一開口F處係設有一氣密環S1,樣品槽12與第二流管16連接之第二開口B處則設有另一氣密環S2。In order to achieve the airtight effect, an airtight ring S1 is disposed at the first opening F of the sample tank 12 and the first flow tube 14 is connected, and another gas is disposed at the second opening B of the sample tank 12 and the second flow tube 16 Closed ring S2.

為針對不同結構型式之濾材,樣品槽12可作不同結構變化以配合不同吸附材質之需求。請參見圖四,該圖所示之樣品槽係用於置放顆粒狀濾材(未示出)。其中樣品槽12係設有兩片可活動之濾網120與濾網122(該濾網120與濾網122可自行調整高低間距),濾網120上開設有複數孔洞1200,濾網122上開設有複數孔洞1220,因此吾人可將待測之顆粒狀濾材(圖中未示出)置放於濾網120與濾網122之間。In order to filter media of different structure types, the sample tank 12 can be changed in different structures to meet the requirements of different adsorbent materials. Referring to Figure 4, the sample cell shown in the figure is used to place a particulate filter (not shown). The sample tank 12 is provided with two movable filter screens 120 and a filter screen 122 (the filter screen 120 and the filter screen 122 can adjust the height and the low spacing independently), and the filter screen 120 is provided with a plurality of holes 1200, and the filter screen 122 is opened. There are a plurality of holes 1220, so that the granular filter material (not shown) to be tested can be placed between the screen 120 and the screen 122.

若待測之濾材為片狀時,則樣品槽又有著不同之設計。請參見圖五,於該實施例中,樣品槽12之中係設有複數個相互堆疊之中空碟片124。待測之片狀濾材126可藉由相鄰之中空碟片124進行夾持而固定。在此種配置下, 吾人可視需量測濾材之數目來相對應增減中空碟片124之數量。If the filter material to be tested is in the form of a sheet, the sample tank has a different design. Referring to FIG. 5, in the embodiment, a plurality of hollow discs 124 stacked on each other are disposed in the sample tank 12. The sheet-shaped filter material 126 to be tested can be fixed by being sandwiched by the adjacent hollow discs 124. In this configuration, We can increase or decrease the number of hollow discs 124 by measuring the number of filter media.

倘若待測之濾材為可撓曲之片狀濾材(例如應用於袋式集塵器中之纖維布或紙狀濾材),為實施固定並撓曲之功效,可於樣品槽12中設置複數個彼此間相鄰之錐形片狀體128,且相鄰兩錐形片狀體128之間係保持可供氣體通過之間距,和圖六所示。如此便可將待測濾材(圖中未示出)夾入兩錐形片狀體128之間隙,以進行波浪或瓦楞狀之性能測試。If the filter material to be tested is a flexible sheet-like filter material (for example, a fiber cloth or a paper filter material used in a bag type dust collector), a plurality of sample grooves 12 may be provided for the purpose of fixing and flexing. The tapered sheet-like body 128 adjacent to each other, and the distance between the adjacent two tapered sheet-like bodies 128 is maintained for gas passage, and is shown in FIG. In this way, the filter material to be tested (not shown) can be sandwiched between the two tapered sheet-like bodies 128 for performance testing in the form of waves or corrugations.

經由上述說明可知,本發明之用於檢測微量污染氣體吸附性濾材之樣品置放裝置可提供持測濾材對於特定氣體吸附功效之必要性能數據(溫度、露點、壓力及濃度等),可節省其開發時間與成本,合應獲得專利以使相關產業之從業人員能據以利用來促進產業發展。It can be seen from the above description that the sample placing device for detecting the trace pollutant gas adsorbing filter material of the present invention can provide the necessary performance data (temperature, dew point, pressure, concentration, etc.) for holding the filter material for the specific gas adsorption efficiency, thereby saving the same. Development time and cost should be patented so that practitioners in related industries can use it to promote industrial development.

唯以上所述者,僅為本發明之最佳實施態樣爾,當不能以之限定本發明所實施之範圍。即大凡依本發明申請專利範圍所作之均等變化與修飾,皆應仍屬於本發明專利涵蓋之範圍內,謹請 貴審查委員明鑑,並祈惠准,是所至禱。The above is only the best mode for carrying out the invention, and the scope of the invention is not limited thereto. That is to say, the equivalent changes and modifications made by the applicant in accordance with the scope of the patent application of the present invention should still fall within the scope of the patent of the present invention. I would like to ask your review committee to give a clear explanation and pray for it.

1‧‧‧濾材樣品置放裝置1‧‧‧Filter material sample placement device

10‧‧‧框架10‧‧‧Frame

12‧‧‧樣品槽12‧‧‧ sample slot

14‧‧‧第一流管(前流道部)14‧‧‧First flow tube (front flow section)

16‧‧‧第二流管(氣體流管)16‧‧‧Second flow tube (gas flow tube)

102‧‧‧第一驅動部(上氣壓缸)102‧‧‧First drive (upper pneumatic cylinder)

104‧‧‧第二驅動部(下氣壓缸)104‧‧‧Second drive (lower air cylinder)

106‧‧‧線性移動單元106‧‧‧Linear mobile unit

120‧‧‧濾網120‧‧‧Filter

122‧‧‧濾網122‧‧‧Filter

124‧‧‧中空碟片124‧‧‧ hollow disc

126‧‧‧片狀濾材126‧‧‧Flake filter

128‧‧‧錐形片狀體128‧‧‧Cone flakes

142‧‧‧前導流部142‧‧‧ Front diversion

144‧‧‧整流部144‧‧‧Rectifier

146‧‧‧前流道部146‧‧‧ Front Runner Department

1062‧‧‧第一定位單元1062‧‧‧First positioning unit

1064‧‧‧第二定位單元1064‧‧‧Second positioning unit

1200‧‧‧孔洞1200‧‧‧ hole

1220‧‧‧孔洞1220‧‧‧ hole

1400‧‧‧氣體入口1400‧‧‧ gas inlet

1402‧‧‧溫度採樣口1402‧‧‧ Temperature sampling port

1404‧‧‧露點採樣口1404‧‧‧ Dew point sampling port

1440‧‧‧整流片1440‧‧‧Rectifier

1460‧‧‧壓差計採樣口1460‧‧‧ Differential pressure meter sampling port

1462‧‧‧前測採樣口1462‧‧‧Pre-test sampling port

1600‧‧‧氣體出口1600‧‧‧ gas export

1602‧‧‧溫度採樣口1602‧‧‧Temperature sampling port

1604‧‧‧露點採樣口1604‧‧‧ Dew point sampling port

1606‧‧‧壓差計採樣口1606‧‧‧ Differential pressure meter sampling port

1608‧‧‧後測採樣口1608‧‧‧Sampling sampling port

A‧‧‧吸附區A‧‧‧Adsorption zone

F‧‧‧第一開口F‧‧‧first opening

B‧‧‧第二開口B‧‧‧second opening

S1‧‧‧氣密環S1‧‧‧ airtight ring

S2‧‧‧氣密環S2‧‧‧ airtight ring

圖一係為本發明用於檢測微量污染氣體吸附性濾材之樣品置放裝置之立體圖;圖二係為本發明樣品槽、第一流管與第二流管連接時之立體圖;圖三係為本發明樣品槽、第一流管與第二流管連接時之立體剖面圖;圖四係為本發明使用樣品槽之立體剖面圖;圖五係為本發明使用樣品槽之立體剖面圖,其係顯示一變化例;以及圖六係為本發明使用樣品槽之立體剖面圖,其係顯示另一變化例。Figure 1 is a perspective view of a sample placement device for detecting a micro-polluted gas adsorption filter material according to the present invention; Figure 2 is a perspective view of the sample tank, the first flow tube and the second flow tube of the present invention; FIG. 4 is a perspective sectional view showing a sample tank according to the present invention; FIG. 5 is a perspective sectional view showing a sample tank according to the present invention; A variation; and FIG. 6 is a perspective cross-sectional view of a sample tank used in the present invention, which shows another variation.

12‧‧‧樣品槽12‧‧‧ sample slot

144‧‧‧整流部144‧‧‧Rectifier

1400‧‧‧氣體入口1400‧‧‧ gas inlet

1402‧‧‧溫度採樣口1402‧‧‧ Temperature sampling port

1404‧‧‧露點採樣口1404‧‧‧ Dew point sampling port

1440‧‧‧整流片1440‧‧‧Rectifier

1460‧‧‧壓差計採樣口1460‧‧‧ Differential pressure meter sampling port

1462‧‧‧前測採樣口1462‧‧‧Pre-test sampling port

1600‧‧‧氣體出口1600‧‧‧ gas export

1602‧‧‧溫度採樣口1602‧‧‧Temperature sampling port

1604‧‧‧露點採樣口1604‧‧‧ Dew point sampling port

1606‧‧‧壓差計採樣口1606‧‧‧ Differential pressure meter sampling port

1608‧‧‧後測採樣口1608‧‧‧Sampling sampling port

A‧‧‧吸附區A‧‧‧Adsorption zone

F‧‧‧第一開口F‧‧‧first opening

B‧‧‧第二開口B‧‧‧second opening

S1‧‧‧氣密環S1‧‧‧ airtight ring

S2‧‧‧氣密環S2‧‧‧ airtight ring

Claims (19)

一種用於檢測微量污染氣體吸附性濾材之樣品置放裝置,包含:一框架;一樣品槽,係安裝於該框架上且可容置濾材;一第一流管,係安裝於該框架上且與該樣品槽相連接;以及一第二流管,係安裝於該框架上且與該樣品槽相連接;其中,氣體係依序流經該第一流管、該樣品槽以及該第二流管,該第一流管包含一前導流部,該前導流部中係設有一露點採樣口,該前導流部可藉由該露點採樣口與露點測量裝置相連接,該第一流管包含一前流導部,該前流導部中,設有一前測採樣口,該前流道部可藉由該前測採樣口與濃度測量裝置相連接;其中該第二流管中係設有一露點採樣口,該第二流管可藉由該露點採樣口與露點測量裝置相連接,該第二流管中設有一後測採樣口,該第二流管可藉由該後測採樣口與濃度測量裝置相連接;其中該樣品槽係設有一第一開口與一第二開口,該第一開口與第二開口之間係設有複數個相互堆疊之中空碟片。 A sample placement device for detecting a micro-polluted gas adsorption filter material, comprising: a frame; a sample tank mounted on the frame and accommodating the filter material; a first flow tube mounted on the frame and The sample tanks are connected to each other; and a second flow tube is mounted on the frame and connected to the sample tank; wherein the gas system sequentially flows through the first flow tube, the sample tank and the second flow tube, The first flow tube includes a front flow guiding portion, and the front flow guiding portion is provided with a dew point sampling port. The front flow guiding portion can be connected to the dew point measuring device by the dew point sampling port, and the first flow tube includes a front a flow guiding portion, the front flow guiding portion is provided with a pre-measuring sampling port, wherein the front flow channel portion can be connected to the concentration measuring device by the pre-measuring sampling port; wherein the second flow tube is provided with a dew point sampling The second flow tube can be connected to the dew point measuring device by the dew point sampling port, and the second flow tube is provided with a post-measurement sampling port, and the second flow tube can be measured by the post-measurement sampling port and concentration The device is connected; wherein the sample slot is provided with a first Port and a second opening, provided between the first line and second openings among the plurality of mutually stacked empty disc. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該框架上更設有:一第一驅動部,係與該樣品槽相連接並據以作動之,以使該樣品槽與該第一流管進行接合或分離之動作;以 及一第二驅動部,係與該第二流管相連接並據以作動之,以使該樣品槽與該第二流管進行接合或分離之動作。 The sample placing device for detecting a micro-polluted gas adsorbing filter material according to the first aspect of the patent application, wherein the frame further comprises: a first driving portion connected to the sample tank and actuated accordingly; Acting to engage or separate the sample tank from the first flow tube; And a second driving portion connected to the second flow tube and actuated to engage or separate the sample tank and the second flow tube. 如申請專利範圍第2項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第一驅動部更包含一線性移動單元,且該該第一驅動部係使該樣品槽沿著該線性移動單元進行線性移動。 The sample placement device for detecting a trace pollutant gas adsorbent filter material according to the second aspect of the patent application, wherein the first driving portion further comprises a linear moving unit, and the first driving portion causes the sample slot to follow The linear moving unit performs a linear movement. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該框架上更設有用於定位該樣品槽之一第一定位單元。 The sample placement device for detecting a trace pollutant gas adsorbent filter material according to claim 1, wherein the frame is further provided with a first positioning unit for positioning the sample tank. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該框架上更設有用於定位該第二流管之一第二定位單元。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to claim 1, wherein the frame is further provided with a second positioning unit for positioning the second flow tube. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第一流管包含:該前導流部、與該前導流部連接之一整流部,及分別與該整流部及樣品槽連接之該前流道部。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to the first aspect of the invention, wherein the first flow tube comprises: the front flow guiding portion, a rectifying portion connected to the front flow guiding portion, and respectively The front flow path portion connected to the rectifying portion and the sample tank. 如申請專利範圍第6項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該前導流部中係設有一溫度採樣口,該前導流部可藉由該溫度採樣口與溫度測量裝置相連接。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to the sixth aspect of the patent application, wherein the front flow guiding portion is provided with a temperature sampling port, and the front flow guiding portion can be connected with the temperature sampling port The temperature measuring devices are connected. 如申請專利範圍第6項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該前流道部中係設有一壓差計採樣口,該前流道部可藉由該壓差計採樣口與壓差測量裝置相連接。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to the sixth aspect of the patent application, wherein the front flow channel portion is provided with a differential pressure meter sampling port, and the front flow channel portion can be separated by the pressure difference The metering port is connected to the differential pressure measuring device. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該樣品槽與該第一流管之連接處係設有至少一氣密環。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to claim 1, wherein at least one airtight ring is disposed at a junction of the sample tank and the first flow tube. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該樣品槽與該第二流管之連接處係設有至少一氣密環。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to claim 1, wherein at least one airtight ring is disposed at a junction of the sample tank and the second flow tube. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第二流管中係設有一溫度採樣口,該第二流管可藉由該溫度採樣口與溫度測量裝置相連接。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to the first aspect of the patent application, wherein the second flow tube is provided with a temperature sampling port, and the second flow tube can be connected with the temperature sampling port The temperature measuring devices are connected. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第二流管中係設有一壓差計採樣口,該第二流管可藉由該壓差計採樣口與壓差測量裝置相連接。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to the first aspect of the patent application, wherein the second flow tube is provided with a differential pressure meter sampling port, and the second flow tube can be separated by the pressure difference The metering port is connected to the differential pressure measuring device. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,該第一開口係用於與第一流管連接,該第二開口係用於與第二流管連接。 The sample placement device for detecting a micro-polluted gas adsorbent filter material according to the first aspect of the patent application, wherein the first opening is for connecting with the first flow tube, and the second opening is for connecting with the second flow tube. 如申請專利範圍第13項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第一開口與第二開口之間係設有至少一濾網,該濾網係具有複數孔洞。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to claim 13 , wherein at least one filter is disposed between the first opening and the second opening, the filter mesh having a plurality of holes. 如申請專利範圍第14項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該樣品槽係用於置放顆粒狀濾材。 A sample placement device for detecting a trace amount of a contaminating gas adsorbent filter material according to claim 14 of the patent application, wherein the sample tank is used for placing a granular filter medium. 如申請專利範圍第15項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該等孔洞之尺寸係小於顆 粒狀濾材之尺寸。 The sample placement device for detecting a trace pollution gas adsorption filter material according to the fifteenth item of the patent application, wherein the size of the holes is smaller than The size of the granular filter material. 如申請專利範圍第1項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該樣品槽係用於置放片狀濾材。 A sample placing device for detecting a trace amount of a contaminating gas adsorbing filter material according to the first aspect of the patent application, wherein the sample tank is used for placing a sheet-shaped filter medium. 如申請專利範圍第17項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該片狀濾材係被夾持於相鄰兩中空碟片之間。 A sample placement device for detecting a trace amount of a contaminating gas adsorbent filter material according to claim 17, wherein the sheet-like filter material is sandwiched between adjacent two hollow discs. 如申請專利範圍第13項之用於檢測微量污染氣體吸附性濾材之樣品置放裝置,其中該第一開口與第二開口之間係設有複數個彼此間相鄰之錐形片狀體,且相鄰兩錐形片狀體之間係保持可供氣體通過之間距。 The sample placement device for detecting a micro-polluted gas adsorption filter material according to claim 13 , wherein a plurality of tapered sheet-like bodies adjacent to each other are disposed between the first opening and the second opening, And the distance between the adjacent two tapered sheet bodies is maintained.
TW97122688A 2008-06-18 2008-06-18 Device for setting filter media sample for gas-absorption TWI381160B (en)

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010025640A1 (en) * 2000-04-04 2001-10-04 Siemens Elema Ab Anaesthetic gas filter with an anaesthetic gas detector
TW570835B (en) * 2001-10-31 2004-01-11 Sanyo Aqua Technology Co Ltd Filtration device
US6945036B2 (en) * 2000-09-20 2005-09-20 Toyota Jidosha Kabushiki Kaisha Exhaust emission control filter and method of controlling exhaust emission

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010025640A1 (en) * 2000-04-04 2001-10-04 Siemens Elema Ab Anaesthetic gas filter with an anaesthetic gas detector
US6945036B2 (en) * 2000-09-20 2005-09-20 Toyota Jidosha Kabushiki Kaisha Exhaust emission control filter and method of controlling exhaust emission
TW570835B (en) * 2001-10-31 2004-01-11 Sanyo Aqua Technology Co Ltd Filtration device

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