九、發明說明： 【發明所屬之技術領域】 本發明是有關於-種發光元件的測試 關於-種電路板發光元件的測試系統及其測試t法特別疋有 【先前技術】 =二極離卿具有壽命長、耗 外’ LED更具有下述優點：—是 ，』?此之 線、面各獅式的輕薄短小產品成：、 有紫外線和紅外線，既沒有熱量^ίΐ射Ϊ ，型的綠色照明光源，而且廢棄物可回收也·’屬 端只，就可以隨意“光，二； 利用時序控制電路’更能達到豐富多彩 隨著計算機技術的發展，led 件’對計算機產品的功能 又備的一個凡 如：在純轉接性小卡上設置有重要的作用。例 燈的發，Pm置有夕個LED燈，通過觀察LED 二，Tbit况’即可得知計算機產品的特 一 σ技術在測試小卡時需要使用模擬主 70 作 ;;嫁動率低，且需要作業員觀察LED是否發光=: 業複雜，秘成生產成本高昂。 巧U或暗淡， 【發明内容】 法，紐其測試方 包括電路 本發明提出—種電路板發光元件_試系統， ，和測試裝置。電路扳包括發光元件。測試褒 板’且測試農置包括電源供應單元、感光單元、 电 電源供應單元提供一工作電壓至電路板， 發先兀件發光。感光單元制發光元件的亮度 = 信號。抟制罝；垃兩π,.,#。》_ & 供感測 本發明另提出-種電路板發光元件_試方法 發光70件’測試方法包括下列步驟：提供—工作電燃 以 元產生警 ^該電路板’使得發光元件發光；感測發光元件的亮度， $供一感測信號；以及依據感測信號來控制警示 不訊息0 本發_電職發光元件的職系統及方輯用 ^來測搞測電路板的發光元件的亮度，可簡單地判^ 過，具有成本低、卫時短、維修和測試簡單、產能高 寻優點。 j 為讓本發明的上述和其他目的、特徵和優點能更明 ，下文特舉較佳實施例，並配合附圖，作詳細說明如下。 【實施方式】 ，1為根據本發明一實施例的一測試系統的示意圖。圖 2所示為根據本發明一實施例的一測試裝置的示意圖。 ▲請同時參考圖1和圖2。測試系統1〇包括電路板丨、測 忒裝置2、電壓偵測卡3、主機4、資料庫5以及掃瞄單元 6。電路板1包括連接器η和發光元件12。測試裝置2包括 連接器211，212、電源供應單元22、感光單元23、罄示單 兀24以及控制單元25。 器2ΐΪ接且透】連H連f器11。電,應單元22耦接連接 件發光。在本實施例中發光元件 马發先一極體，但本發明並不以此為限。 仵 信號二=5感^元件12的亮度’以提供感娜 敏電阻或^!^25。在本實謝，感光單元23為一光 邀亍電源供應單元22、感光單元a、 制警示單元2、4=^=可依據感測信號νι的狀態來控 頭，連,器U為一通用串列匯流排卿)接 限。 為—咖插孔，然而，本發明並不以此為 3包置2還包括連接器26 °電壓偵測卡 2广Siiiin32。連接器31電性連接連接器 機4通過連接裔32耦接電壓偵測卡3。 在本實施例中，每一待測的電路板丨皆且有一 二=二本;:㈣例二產品型號、站臺號、 元《中或細存在於主機4的儲存單 懕上^電壓偵測卡3用以價測測試裝置2是否有一預設電 坠，以提供一偵測結果，其中這個預設 VM.5V，較佳為5V。 H紐位於4·8 .1377359 域4包細触接11 41，42 _存單元43，— 連接益4卜42的其尹之一電性連接連接器％。 、- 行夺ίίΐ施例中，測試裝置2包括測試部2ia，21b，以進 同ίίίϊ 測試部-與測試部抓用以分別放置不 且測試部加，训分別包括連接器犯與連接 斋212，連接器211，212用以輕接不同的電路板。 連接 板進^2 Μ置多個電路板’且能對該些電路 個電路i 在本實施财，職裝置2可同時放置兩 個電路板放置在測試部2ia中進行測試時， 三電路板放置在測試部2t s式，如此，父替測試可以增加測試的速度。 圖。請同 時參發明一實施例的測試方法的流程 你雷dGi/’職裝置2的供應單元22提供工 作電座C至電路板i ’使得發光元件12發光。 23元件12發出的光 二電壓，“ί測Jfu V1 ’本實施例中感測信號νι為 與第-“。二、太ί測V1具有兩個狀態’即第一狀態 施例中，感光私23例如為光敏元件， 其用感狀以件12的亮度。感光單元23在光線越強 k，阻值就會越小，所能提供的電壓越大。 例如：當電路板1接收到的工作電壓Vc處於48〜5 5V f間時，發光元件12會正常發光，且發光元件12的光線強 又達到預5又值時，感光單元23(光敏元件)發出一預設強度 ^感測信號(電壓信號)VI，例如：接近5V的較高電壓信號。 光單元23感測到發光元件12沒有發光或光線強度低於 士，預設值時，感光單元23提供例如為接近〇v的較低電壓 在步驟S310中’控制單元25接收到感測信號V1之 ，，控制單元25可以依據感測信號V1來控制警示單元％ —警示訊息。在本實施例中，警示單元可為LED燈或蜂 墊如.當感須彳信號V1為第一狀態時，控制單元25控制 早兀24顯示綠色，代表測試通過，表明電路板丨的發光 Ϊ奸，。當感測信號V1為第二狀態時，控制單元25 發光色’代表測試失敗’表明電路板1的 在，驟S315中’上述電壓侧卡3偵測測試裝置2是否 成盘壓卩提供—伽彳結果’其中這個預設電壓的生 :主上逑感測信號vi相關。亦即，若感測信號V1為第一狀 預設，會生成’電壓债測卡3便能偵測到，而 為第-、^自^所提供的積測結果例如為5V。若感測信號V1 =狀㈣’上述預設電壓便不會生成’電壓侧卡3益 去價測到’而領偵測卡3所提供的偵測結果例如為〇v。 輪伯ί Σϊ S32l中，上述電壓偵測卡3透過連接線()傳 』偵測、.，。果至主機4，主機4會對偵測結果進行處理，並依 偵測結果產生一偵測資料，且將偵測資料儲存在主機4的儲 存單元43 _。此外，在這個步驟中，主機4亦可判斷電壓偵 測卡3所提供的偵測資料相對應的電壓值是否在預設範圍 内，例如：4.8V〜5.5V ’若電壓偵測卡3所提供的偵測資 =應的·值沒有在預設範圍内，則判斷電路板 在其他實施例中，主機4亦可耦接一資料庫5，主機4 可將偵測資料透過傳送模組（圖未示）將偵測資料傳送至 料庫5，使得偵測資料可儲存在資料庫5中，且偵測資料會 與先前利用掃瞄單元6所獲得的電路板的基本資料結合，如 =，便能確認每一個電路板的測試情況。如此，若待檢測的 電路板沒有完成檢測或漏了檢測，即使在後續的工作站中 遺漏檢測或沒有完成檢測的電路板進行處理時，可透過資 =5 j祕查詢的反餽而即時作械應的處理，例如：遺漏檢 測的電路板便不能做下一步的處理。 這樣便可讓日後相關人員在做_檢查確認時，可 得知每—織路板的侧結果，其巾侧結果可包括 作業貝工號、站臺號、測試時間以及測試結果。 另外，在測試的過程中，上述主機4與電壓 ，的連接器42可能會因為插拔次數而、 主 電=卡3可能持續傳送_結=主= =貞測結果。或者，使用者改將電壓偵 ^卡，iiS 值而此時，主機4可能還會認定電壓 g 傳送資料，而沒有由連接器42接收IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a test for a kind of light-emitting element, and a test system for a light-emitting element of a circuit board and a test t method thereof, particularly [previous technique] = two poles The LED has the advantages of long life and low consumption. The LED has the following advantages: - Yes, 』 This line and face lion-style light and short products are:, there are ultraviolet rays and infrared rays, neither heat nor ^ ΐ Ϊ, type green Illumination light source, and waste can be recycled. 'On the end, you can freely "light, two; use the timing control circuit" to achieve more colorful with the development of computer technology, led pieces 'ready for computer products One of the following: set up an important role in the pure transfer small card. The light of the example, Pm is equipped with an LED light, by observing the LED two, Tbit condition can know the special σ of the computer product The technology needs to use the simulation master 70 when testing the small card; the marriage rate is low, and the operator needs to observe whether the LED is illuminated =: the industry is complicated, the secret production cost is high. Q or U, faint, [invention] The tester includes the circuit proposed by the present invention, a circuit board illuminating element _ test system, and a test device. The circuit board includes a illuminating element. The test slab 'and the test farm includes a power supply unit, a photosensitive unit, and an electric power supply unit. A working voltage is applied to the circuit board, and the light is emitted from the first component. The brightness of the light-emitting element of the photosensitive unit is = signal. 抟 罝; 两 two π, ., #. _ & for sensing the invention further proposed - a circuit board Light-emitting element _ test method illuminating 70 pieces 'test method includes the following steps: providing - working electric combustion to generate alarms ^ the circuit board 'to make the light-emitting elements emit light; sensing the brightness of the light-emitting elements, $ for a sensing signal; The sensing signal is used to control the warning message. The system and the program of the electric illuminating component are used to measure the brightness of the light-emitting component of the circuit board, which can be easily judged, and has low cost and short service time. The above and other objects, features, and advantages of the present invention will become more apparent from the aspects of the invention. 1 is a schematic diagram of a test system according to an embodiment of the present invention. Fig. 2 is a schematic diagram of a test apparatus according to an embodiment of the present invention. ▲ Please refer to FIG. 1 and FIG. 2 at the same time. The test system 1 includes a circuit board, a test device 2, a voltage detection card 3, a host 4, a database 5, and a scan unit 6. The circuit board 1 includes a connector η and a light-emitting element 12. The test device 2 includes a connection The device 211, 212, the power supply unit 22, the photosensitive unit 23, the display unit 24, and the control unit 25. The device 2 is connected to and connected to the H-connector 11. The unit 22 is coupled to the connector to emit light. In the embodiment, the light-emitting element is first-polar, but the invention is not limited thereto. The signal 2 = 5 senses the brightness of the element 12 to provide a sense sensitive resistance or ^! In this embodiment, the photosensitive unit 23 is a light-inviting power supply unit 22, a light-sensing unit a, a warning unit 2, and 4=^= can be controlled according to the state of the sensing signal νι, and the device U is a universal The serial bus is limited. For the coffee jack, however, the present invention does not use this as a package 2 and also includes a connector 26 ° voltage detection card 2 wide Siiiin32. The connector 31 is electrically connected to the connector 4 and coupled to the voltage detecting card 3 via the connecting person 32. In this embodiment, each circuit board to be tested has one or two = two; (4) the second product model, the station number, the medium or the medium is stored in the storage unit of the host 4 ^ voltage detection The test card 3 is used to test whether the test device 2 has a preset power drop to provide a detection result, wherein the preset VM.5V, preferably 5V. H button is located in 4·8 .1377359 domain 4 packs fine contact 11 41, 42 _ memory unit 43, - one of the connections of Yi 4 4 42 is electrically connected to the connector %. In the embodiment, the test device 2 includes the test portions 2ia, 21b for the same as the ίίίϊ test portion - the test portion is used to separate and the test portion is added separately, and the training includes the connector and the connection. The connectors 211, 212 are used to lightly connect different boards. The connecting board enters a plurality of boards and can be used for the circuit i. In the present implementation, the device 2 can simultaneously place two boards placed in the test part 2ia for testing, and the three boards are placed. In the test part 2t s, so, the parent test can increase the speed of the test. Figure. At the same time, the flow of the test method of an embodiment of the invention is applied. The supply unit 22 of the mine dGi/'s device 2 provides the working battery C to the circuit board i' such that the light-emitting element 12 emits light. 23 The light voltage emitted by the component 12, "Measure Jfu V1" In the present embodiment, the sensing signal νι is the same as the first -. 2. The V1 has two states, i.e., the first state. In the embodiment, the photosensitive member 23 is, for example, a photosensitive member, which is characterized by the brightness of the member 12. The stronger the light is, the smaller the resistance value of the photosensitive unit 23 is, and the larger the voltage that can be supplied. For example, when the operating voltage Vc received by the circuit board 1 is between 48 and 5 5 V f, the light-emitting element 12 will normally emit light, and when the light intensity of the light-emitting element 12 reaches a pre-value of 5, the photosensitive unit 23 (photosensitive element) A predetermined intensity ^ sensing signal (voltage signal) VI is emitted, for example, a higher voltage signal close to 5V. The light unit 23 senses that the light-emitting element 12 does not emit light or the light intensity is lower than a predetermined value, the photosensitive unit 23 provides a lower voltage, for example, close to 〇v. In step S310, the control unit 25 receives the sensing signal V1. The control unit 25 can control the warning unit %-alert message according to the sensing signal V1. In this embodiment, the warning unit may be an LED lamp or a bee pad. For example, when the sensation signal V1 is in the first state, the control unit 25 controls the early 兀 24 to display green, indicating that the test passes, indicating that the 电路 of the circuit board Ϊ evil,. When the sensing signal V1 is in the second state, the control unit 25 emits a color 'representing a test failure' indicating that the circuit board 1 is in step S315, and the voltage side card 3 detects whether the test device 2 is in a disk pressure supply.彳 The result 'The birth of this preset voltage: the main upper sensing signal vi is related. That is, if the sensing signal V1 is in the first state, the voltage debt card 3 can be detected, and the integrated measurement result provided for the first and the second is, for example, 5V. If the sensing signal V1 = (4)', the predetermined voltage does not generate 'voltage side card 3 profit depreciation', and the detection result provided by the detecting card 3 is, for example, 〇v. In the S32l, the voltage detection card 3 is transmitted through the connection line (), detecting, . If the host 4 is the host 4, the host 4 processes the detection result, and generates a detection data according to the detection result, and stores the detection data in the storage unit 43_ of the host 4. In addition, in this step, the host 4 can also determine whether the voltage value corresponding to the detection data provided by the voltage detecting card 3 is within a preset range, for example: 4.8V~5.5V 'if the voltage detecting card 3 In the other embodiments, the host 4 can also be coupled to a database 5, and the host 4 can transmit the detected data through the transmitting module ( The detection data is transmitted to the magazine 5 so that the detection data can be stored in the database 5, and the detection data is combined with the basic data of the board previously obtained by the scanning unit 6, such as = , you can confirm the test of each board. In this way, if the circuit board to be tested is not completed or leaked, even if the board that is missing or not completed in the subsequent workstation is processed, the feedback can be made immediately through the feedback of the secret query. The processing, for example, the missing detection board can not be processed in the next step. In this way, the relevant personnel in the future can know the side results of each of the weaving boards when the _ check is confirmed, and the result of the side of the towel can include the work number, the station number, the test time and the test result. In addition, during the test, the above-mentioned host 4 and voltage connector 42 may be continuously transmitted due to the number of plug-ins, and the main card = card 3 may continue to transmit _ knot = master = = guess result. Alternatively, the user may change the voltage detection card, iiS value, and at this time, the host 4 may also recognize the voltage g to transmit the data without being received by the connector 42.
因此，本實施例所提供的主機 主機4會持續偵測與電壓偵測卡 4還具有一自動偵測功 3之連接器32連接的連 接盗41或連接器42 a A , 能會伯測連接器或自動制功 3, t 壓，因此，主;^ 4 Μ ι至主機4㈠，連接器41合在# Φ 的。機4的自動_功能便判斷出連接器4; ίί; 若連接器41已損壞，逵 則卡3傳送 二=電_測卡3， 壓，因此，主媳4从」 機4守’連接器41不存在雷 的。 、自動偵測功能便判斷出連接器Μ是損壞 接器32 ·接^使用者將物貞測卡3之連 主機4時，連接t 壓伽1汁3 _貞測資料至 因此，主機4的自叙扁、、，存f電塵’而連接器42存在電屢， 至電壓侧卡3，功能=判，目前連接器42耦接 料的路徑，由舰j的自動制功能可自動切換接收資 . 由連接态41切換至連接器42。 的測ϊίΐί方ir月較佳實施例所提供的電路板發光元件 否通i。狀’通過細感測信號的電塵，即可判斷測試是 發明的保觀㈣視申料= 定本&本^已讀佳實補揭露如上，然其並非用以限 路關内’當可作些許的更動與潤飾，因此本Therefore, the host host 4 provided in this embodiment continuously detects the connection thief 41 or the connector 42 a A connected to the voltage detecting card 4 and the connector 32 of the automatic detection function 3, which can connect to the connector. Or automatic work 3, t pressure, therefore, main; ^ 4 Μ ι to host 4 (one), connector 41 is combined with # Φ. The automatic_ function of the machine 4 determines the connector 4; ίί; If the connector 41 is damaged, then the card 3 transmits two = electricity _ test card 3, pressure, therefore, the main 媳 4 from the "machine 4 defensive" connector 41 There is no thunder. The auto-detection function judges that the connector Μ is the damaged connector 32. When the user connects the host 4 of the object test card 3, the connection t pressure gamma juice 3 _ test data to the host 4 Self-study, and save the electric dust 'and the connector 42 has electricity repeatedly, to the voltage side card 3, function = judgment, the current connector 42 is coupled to the material path, and the automatic function of the ship j can automatically switch the receiving capital. Switching from the connected state 41 to the connector 42.测 ϊ ϊ 方 方 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳The shape of the electric shock through the fine sensing signal can be judged that the test is the invention of the protection (four) depending on the application = the book & the original ^ has read the best of the above, but it is not used to limit the road Make a little change and retouch, so this
12 S •1377359 【圖式簡單說明】 圖1為根據本發明一實施例的一測試系統的示意圖。 圖2為根據本發明一實施例的一測試裝置的示意圖。 圖3為根據本發明一實施例的測試方法的流程圖。 【主要元件符號說明】 丨10 測試糸統 1 電路板 11 連接器 12 發光元件 2 測試裝置 21a ' 21b 測試部 S卜S2 控制部 22 電源供應單元 23 感光單元 24 4tV 口口 —" 警不早7U 25 控制單元 VI 感測信號 3 電壓偵測卡 4 主機 43 儲存單元 5 資料庫 2U、212、26、3卜 32、4卜 42 連接器 6 掃描早元 S301-S320 步驟 1312 S • 1377359 BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a test system in accordance with an embodiment of the present invention. 2 is a schematic diagram of a test apparatus in accordance with an embodiment of the present invention. 3 is a flow chart of a test method in accordance with an embodiment of the present invention. [Main component symbol description] 丨10 Test system 1 Circuit board 11 Connector 12 Light-emitting element 2 Test device 21a ' 21b Test unit Sb S2 Control unit 22 Power supply unit 23 Photosensitive unit 24 4tV Port-" 7U 25 Control Unit VI Sensing Signal 3 Voltage Detection Card 4 Host 43 Storage Unit 5 Database 2U, 212, 26, 3 Bu 32, 4 Bu 42 Connector 6 Scanning Early S301-S320 Step 13