TWI368208B - - Google Patents

Info

Publication number
TWI368208B
TWI368208B TW096100033A TW96100033A TWI368208B TW I368208 B TWI368208 B TW I368208B TW 096100033 A TW096100033 A TW 096100033A TW 96100033 A TW96100033 A TW 96100033A TW I368208 B TWI368208 B TW I368208B
Authority
TW
Taiwan
Application number
TW096100033A
Other languages
Chinese (zh)
Other versions
TW200735028A (en
Inventor
Masato Ikeda
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200735028A publication Critical patent/TW200735028A/en
Application granted granted Critical
Publication of TWI368208B publication Critical patent/TWI368208B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
TW096100033A 2006-03-15 2007-01-02 Sensor substrate for display panel inspection, and method for inspecting display panel using the sensor substrate TW200735028A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006070829A JP2007248202A (en) 2006-03-15 2006-03-15 Sensor substrate used for inspection of display substrate, and inspection method of display substrate using it

Publications (2)

Publication Number Publication Date
TW200735028A TW200735028A (en) 2007-09-16
TWI368208B true TWI368208B (en) 2012-07-11

Family

ID=38592684

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096100033A TW200735028A (en) 2006-03-15 2007-01-02 Sensor substrate for display panel inspection, and method for inspecting display panel using the sensor substrate

Country Status (3)

Country Link
JP (1) JP2007248202A (en)
KR (1) KR100832140B1 (en)
TW (1) TW200735028A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI643180B (en) * 2016-04-27 2018-12-01 德商Ｅ．解決有限責任公司 Technique for testing a display unit

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5269482B2 (en) * 2008-05-28 2013-08-21 株式会社日本マイクロニクス Sensor substrate and inspection device
JP2009290490A (en) 2008-05-28 2009-12-10 Micronics Japan Co Ltd Amplifier circuit
JP5191321B2 (en) * 2008-09-02 2013-05-08 株式会社ジャパンディスプレイウェスト Information input device, information input method, information input / output device, and information input program
JP5486715B2 (en) * 2013-04-10 2014-05-07 株式会社日本マイクロニクス Sensor substrate and inspection device
TWI771105B (en) * 2021-07-15 2022-07-11 大陸商集創北方（珠海）科技有限公司 Detection method and circuit of OLED display panel

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3439038B2 (en) * 1996-08-23 2003-08-25 三菱重工業株式会社 Inspection method and apparatus for liquid crystal display substrate
JP3510490B2 (en) * 1998-08-10 2004-03-29 三菱重工業株式会社 Inspection apparatus for electrode structure for thin display device and its inspection method
JP2004264348A (en) * 2003-02-07 2004-09-24 Agilent Technol Inc Inspection apparatus and method for thin film transistor active matrix substrate
KR100401931B1 (en) * 2003-03-13 2003-10-17 주식회사 테스트이엔지 Non-contact quality test method of TFT cell array for flat board display using a working principle of capacitor
JP2006194786A (en) * 2005-01-14 2006-07-27 Oht Inc Sensor, inspection device, and inspection method
KR20070035317A (en) * 2005-09-27 2007-03-30 엘지전자 주식회사 Sensor for Sensing Electric Field

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI643180B (en) * 2016-04-27 2018-12-01 德商Ｅ．解決有限責任公司 Technique for testing a display unit

Also Published As

Publication number Publication date
KR100832140B1 (en) 2008-05-27
KR20070093800A (en) 2007-09-19
JP2007248202A (en) 2007-09-27
TW200735028A (en) 2007-09-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees