TWI365708B - A fixing for emi prevention and testing method thereof - Google Patents

A fixing for emi prevention and testing method thereof

Info

Publication number
TWI365708B
TWI365708B TW096129113A TW96129113A TWI365708B TW I365708 B TWI365708 B TW I365708B TW 096129113 A TW096129113 A TW 096129113A TW 96129113 A TW96129113 A TW 96129113A TW I365708 B TWI365708 B TW I365708B
Authority
TW
Taiwan
Prior art keywords
fixing
testing method
emi prevention
emi
prevention
Prior art date
Application number
TW096129113A
Other languages
Chinese (zh)
Other versions
TW200908868A (en
Inventor
Chia Hua Chan
Kuo Chung Hsiao
Chun Ta Liao
chun yuan Huang
Original Assignee
Advanced Semiconductor Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW096129113A priority Critical patent/TWI365708B/en
Publication of TW200908868A publication Critical patent/TW200908868A/en
Application granted granted Critical
Publication of TWI365708B publication Critical patent/TWI365708B/en

Links

TW096129113A 2007-08-07 2007-08-07 A fixing for emi prevention and testing method thereof TWI365708B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096129113A TWI365708B (en) 2007-08-07 2007-08-07 A fixing for emi prevention and testing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096129113A TWI365708B (en) 2007-08-07 2007-08-07 A fixing for emi prevention and testing method thereof

Publications (2)

Publication Number Publication Date
TW200908868A TW200908868A (en) 2009-02-16
TWI365708B true TWI365708B (en) 2012-06-01

Family

ID=44723789

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096129113A TWI365708B (en) 2007-08-07 2007-08-07 A fixing for emi prevention and testing method thereof

Country Status (1)

Country Link
TW (1) TWI365708B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10718805B2 (en) 2016-06-14 2020-07-21 Micron Technology, Inc. Apparatus and methods for testing devices

Also Published As

Publication number Publication date
TW200908868A (en) 2009-02-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees