TWI349769B - Polari-meter for quantitative stress/strain measurement - Google Patents
Polari-meter for quantitative stress/strain measurementInfo
- Publication number
- TWI349769B TWI349769B TW096148224A TW96148224A TWI349769B TW I349769 B TWI349769 B TW I349769B TW 096148224 A TW096148224 A TW 096148224A TW 96148224 A TW96148224 A TW 96148224A TW I349769 B TWI349769 B TW I349769B
- Authority
- TW
- Taiwan
- Prior art keywords
- polari
- meter
- strain measurement
- quantitative stress
- quantitative
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096148224A TWI349769B (en) | 2007-12-17 | 2007-12-17 | Polari-meter for quantitative stress/strain measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096148224A TWI349769B (en) | 2007-12-17 | 2007-12-17 | Polari-meter for quantitative stress/strain measurement |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200928331A TW200928331A (en) | 2009-07-01 |
TWI349769B true TWI349769B (en) | 2011-10-01 |
Family
ID=44864001
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096148224A TWI349769B (en) | 2007-12-17 | 2007-12-17 | Polari-meter for quantitative stress/strain measurement |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI349769B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308224A (en) * | 2013-05-23 | 2013-09-18 | 中国科学院半导体研究所 | Semiconductor material micro-area stress test system |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI457550B (en) * | 2012-03-16 | 2014-10-21 | Nat Univ Tsing Hua | An apparatus for quantifying unknown stress and residual stress of a material and a method thereof |
US11408730B2 (en) | 2018-11-20 | 2022-08-09 | Industrial Technology Research Institute | Stress measuring device and stress measuring method |
TWI716183B (en) * | 2018-11-20 | 2021-01-11 | 財團法人工業技術研究院 | Stress measuring device and stress measuring method |
-
2007
- 2007-12-17 TW TW096148224A patent/TWI349769B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103308224A (en) * | 2013-05-23 | 2013-09-18 | 中国科学院半导体研究所 | Semiconductor material micro-area stress test system |
Also Published As
Publication number | Publication date |
---|---|
TW200928331A (en) | 2009-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |