TWI349107B - Probe card - Google Patents
Probe cardInfo
- Publication number
- TWI349107B TWI349107B TW096142650A TW96142650A TWI349107B TW I349107 B TWI349107 B TW I349107B TW 096142650 A TW096142650 A TW 096142650A TW 96142650 A TW96142650 A TW 96142650A TW I349107 B TWI349107 B TW I349107B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe card
- probe
- card
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096142650A TWI349107B (en) | 2007-11-12 | 2007-11-12 | Probe card |
US12/043,136 US7459925B1 (en) | 2007-11-12 | 2008-03-06 | Probe card |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW096142650A TWI349107B (en) | 2007-11-12 | 2007-11-12 | Probe card |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200921106A TW200921106A (en) | 2009-05-16 |
TWI349107B true TWI349107B (en) | 2011-09-21 |
Family
ID=40073782
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096142650A TWI349107B (en) | 2007-11-12 | 2007-11-12 | Probe card |
Country Status (2)
Country | Link |
---|---|
US (1) | US7459925B1 (zh) |
TW (1) | TWI349107B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8836363B2 (en) * | 2011-10-14 | 2014-09-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Probe card partition scheme |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7154285B2 (en) * | 2004-09-30 | 2006-12-26 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for providing PCB layout for probe card |
-
2007
- 2007-11-12 TW TW096142650A patent/TWI349107B/zh active
-
2008
- 2008-03-06 US US12/043,136 patent/US7459925B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
US7459925B1 (en) | 2008-12-02 |
TW200921106A (en) | 2009-05-16 |
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