TWI348551B - Testing device and testing method - Google Patents

Testing device and testing method

Info

Publication number
TWI348551B
TWI348551B TW096111558A TW96111558A TWI348551B TW I348551 B TWI348551 B TW I348551B TW 096111558 A TW096111558 A TW 096111558A TW 96111558 A TW96111558 A TW 96111558A TW I348551 B TWI348551 B TW I348551B
Authority
TW
Taiwan
Prior art keywords
testing
testing device
testing method
Prior art date
Application number
TW096111558A
Other languages
Chinese (zh)
Other versions
TW200839246A (en
Inventor
Chun Hsien Lee
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW096111558A priority Critical patent/TWI348551B/en
Publication of TW200839246A publication Critical patent/TW200839246A/en
Application granted granted Critical
Publication of TWI348551B publication Critical patent/TWI348551B/en

Links

TW096111558A 2007-03-30 2007-03-30 Testing device and testing method TWI348551B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096111558A TWI348551B (en) 2007-03-30 2007-03-30 Testing device and testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096111558A TWI348551B (en) 2007-03-30 2007-03-30 Testing device and testing method

Publications (2)

Publication Number Publication Date
TW200839246A TW200839246A (en) 2008-10-01
TWI348551B true TWI348551B (en) 2011-09-11

Family

ID=44820788

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111558A TWI348551B (en) 2007-03-30 2007-03-30 Testing device and testing method

Country Status (1)

Country Link
TW (1) TWI348551B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109765409B (en) * 2019-01-08 2022-03-18 Oppo（重庆）智能科技有限公司 Test fixture and test method

Also Published As

Publication number Publication date
TW200839246A (en) 2008-10-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees