TWI341636B - Circuit for protecting nmos device from voltage stress - Google Patents

Circuit for protecting nmos device from voltage stress

Info

Publication number
TWI341636B
TWI341636B TW096138799A TW96138799A TWI341636B TW I341636 B TWI341636 B TW I341636B TW 096138799 A TW096138799 A TW 096138799A TW 96138799 A TW96138799 A TW 96138799A TW I341636 B TWI341636 B TW I341636B
Authority
TW
Taiwan
Prior art keywords
circuit
nmos device
voltage stress
protecting nmos
protecting
Prior art date
Application number
TW096138799A
Other languages
English (en)
Other versions
TW200919892A (en
Inventor
Chun Wen Yeh
Original Assignee
Mstar Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mstar Semiconductor Inc filed Critical Mstar Semiconductor Inc
Priority to TW096138799A priority Critical patent/TWI341636B/zh
Priority to US12/155,613 priority patent/US7894171B2/en
Publication of TW200919892A publication Critical patent/TW200919892A/zh
Application granted granted Critical
Publication of TWI341636B publication Critical patent/TWI341636B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003—Modifications for increasing the reliability for protection
    • H03K19/00315—Modifications for increasing the reliability for protection in field-effect transistor circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
TW096138799A 2007-10-17 2007-10-17 Circuit for protecting nmos device from voltage stress TWI341636B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW096138799A TWI341636B (en) 2007-10-17 2007-10-17 Circuit for protecting nmos device from voltage stress
US12/155,613 US7894171B2 (en) 2007-10-17 2008-06-06 Circuit for protecting NMOS device from voltage stress

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096138799A TWI341636B (en) 2007-10-17 2007-10-17 Circuit for protecting nmos device from voltage stress

Publications (2)

Publication Number Publication Date
TW200919892A TW200919892A (en) 2009-05-01
TWI341636B true TWI341636B (en) 2011-05-01

Family

ID=40563250

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096138799A TWI341636B (en) 2007-10-17 2007-10-17 Circuit for protecting nmos device from voltage stress

Country Status (2)

Country Link
US (1) US7894171B2 (zh)
TW (1) TWI341636B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9831764B2 (en) * 2014-11-20 2017-11-28 Stmicroelectronics International N.V. Scalable protection voltage generator

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4835487A (en) * 1988-04-14 1989-05-30 Motorola, Inc. MOS voltage to current converter
US5930094A (en) * 1997-08-29 1999-07-27 Texas Instruments Incorporated Cascoded-MOS ESD protection circuits for mixed voltage chips
TW410502B (en) 1998-11-23 2000-11-01 Taiwan Semiconductor Mfg I/O protection device with capacitance coupling
US6212050B1 (en) * 1999-04-05 2001-04-03 Intel Corporation Circuit and method for protecting input/output stage of a low voltage integrated circuit device from a failure of the internal power supply or in the power-up sequencing of power supplies
US6327126B1 (en) * 2000-01-28 2001-12-04 Motorola, Inc. Electrostatic discharge circuit
US7291887B2 (en) 2002-06-19 2007-11-06 Windbond Electronics Corp. Protection circuit for electrostatic discharge
US7027276B2 (en) * 2004-04-21 2006-04-11 Taiwan Semiconductor Manufacturing Co., Ltd. High voltage ESD protection circuit with low voltage transistors
US7385793B1 (en) * 2006-01-24 2008-06-10 Cypress Semiconductor Corporation Cascode active shunt gate oxide project during electrostatic discharge event
US7348855B2 (en) * 2006-03-30 2008-03-25 Texas Instruments Incorporated Bias circuitry for cascode transistor circuit

Also Published As

Publication number Publication date
US7894171B2 (en) 2011-02-22
TW200919892A (en) 2009-05-01
US20090103220A1 (en) 2009-04-23

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