TWI336453B - Method for adjusting working frequency of chip - Google Patents

Method for adjusting working frequency of chip Download PDF

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Publication number
TWI336453B
TWI336453B TW96131830A TW96131830A TWI336453B TW I336453 B TWI336453 B TW I336453B TW 96131830 A TW96131830 A TW 96131830A TW 96131830 A TW96131830 A TW 96131830A TW I336453 B TWI336453 B TW I336453B
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Taiwan
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frequency
wafer
display
adjusting
operating frequency
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TW96131830A
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Chinese (zh)
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TW200828178A (en
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Kao Yi Chiu
Yu Hsuan Lai
Chien Hua Ting
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Asustek Comp Inc
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1336453 0950421 22919twf.doc/n 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種調整晶片工作頻率的方法,且 別是有關於-種於全螢幕晝面之應用程式下 片之工作頻率的方法。 【先前技術】1336453 0950421 22919twf.doc/n IX. Description of the Invention: [Technical Field] The present invention relates to a method for adjusting the operating frequency of a wafer, and is not related to an application under the full screen. The method of working frequency. [Prior Art]

電腦系統除了追求運算性能的提高外,快速的績圖功 能亦是不斷努力的目標,而隨著科技的進步,A 體繪圖graphic)等需要大資料量的緣圖技術已經越來 越廣泛地使用’而市面上3D繪圖軟體或3D遊戲軟體亦快 速地推陳㈣,其繪ffi技術所制的聽量 。、In addition to the pursuit of improved computing performance, the rapid performance of the computer system is also the goal of continuous efforts. With the advancement of technology, A-line graphics, etc., which require large amounts of data, have been used more and more widely. 'The 3D drawing software or 3D game software on the market is also quickly introduced (4), which is based on the ffi technology. ,

因此,在同-套硬體裝置上,對於某些3D軟體很容易有 硬體效料足的情錯生’並造錄體餘齡或軟體執 行時流暢度不佳的問題。當硬體效能不足時,為了節省開 鎖’在不更換硬體裝置條件下’制者魏擇調整硬體的 工作時脈(dock),即一般所謂之超頻(〇verd〇ck), 以提高硬體工作效能。 除了中央處理器(Center Process Unit,cpu)可進行 超頻動作之外,顯示晶片亦能進行超頻。一般而言,當使 用者在進打減量龐大的3D遊戲時,若顯示晶片處理速 度不触,將會在_進行巾導致晝面賴度不佳等情 形。因此’許乡使料在it行3D秘前,會姐動超頻 糕式設定欲超狀數錢’紐動领,使得遊戲在進行 中能夠提高顯示晶;i之卫作效能。而若進人遊戲後想再進 5 1336453 0950421 22919twf.doc/n 行超頻動作,則必需離開遊戲晝面來執行超頻程式再設定 一次,待設定完成再進入遊戲。再度進入遊戲後,若是流 暢度仍然不盡理想欲再進行超頻,則必需再重覆上述步 驟。而如此繁複之動作,在使用上相當不便。 【發明内容】 本發明提供-種調整晶片工作頻率的方法,可於全營 幕晝面之應用程式中,根據使用者需求隨時調整顯示 的工作頻率。 本發明提出-種調整晶片工作頻率的方法,適 行全螢幕晝面之應用程式下,調整顯示晶片之工作頻^, 此調整晶片:η作頻率的方法首先於系統開機κ貞測 晶片之頻率調整範圍。接著,執行全勞幕晝面之㈣程式: 並將控制驗致能。然後,魏控制熱鍵的輪人,以顯干 使用者介面。最後’接收由制者介面輸人之輸率, 而根據所魏之輸人鮮,而麵率調整 整 晶片之工作頻率。 ㈣内調整顯不 在本發明之一實施例中,上述之偵 接首著先自二工作頻率開始逐心: ^之工作料。接f,偵測顯示晶片是否出現 :顯:晶片出現異常時’停止調整顯示之、’ 調整後之顯示—頻率即為頻率調之 現異常之步驟首先:調整:之顯示晶片是否出 顒不日日片之工作頻率運作顯 6 1336453 0950421 22919twf.doc/n 不晶片’並偵測顯不晶片運作時之溫度。接著,判斷顯不 晶片運作時之溫度是否高於預設溫度。最後,當顯示晶片 運作時之溫度高於預設溫度時,即表示顯示晶片出現異常。 在本發明之一實施例中,上述之開啟該全螢幕晝面之 應用程式之步驟更包括載入動態連結程式庫。而在載入動 態連結程式庫之後更包括呼叫此動態連結程式庫,根據輸 入頻率調整顯不晶片之工作頻率。Therefore, on the same-set hardware device, it is easy for some 3D software to have a hard-working effect and a problem of poor fluency in the execution of the body or software. When the hardware performance is insufficient, in order to save the unlocking 'without replacing the hardware device', the makers adjust the hard working clock (dock), which is generally called overclocking (〇verd〇ck) to improve the hard Physical work efficiency. In addition to the central processing unit (cpu) for overclocking, the display chip can also be overclocked. In general, when the user is in a 3D game with a large amount of reduction, if the display processing speed is not touched, the situation will be poor in the _ the towel. Therefore, Xu Xiang is expected to improve the display crystal in the process of the 3D secret before the 3D secret, the sister will move over the frequency of the cake, so that the game can improve the display crystal in progress; If you want to enter the game again after entering the game 5 1336453 0950421 22919twf.doc / n line overclocking action, you must leave the game to perform the overclocking program and then set it again, and then enter the game after the setting is completed. After entering the game again, if the fluency is still not ideal and you want to overclock again, you must repeat the above steps. Such complicated actions are quite inconvenient to use. SUMMARY OF THE INVENTION The present invention provides a method for adjusting the operating frequency of a wafer, which can adjust the operating frequency of the display at any time according to the needs of the user in the application of the entire camp. The invention proposes a method for adjusting the working frequency of the wafer, and adjusts the working frequency of the display chip under the application of the full screen surface. The method for adjusting the wafer: η is the frequency firstly, the frequency of the wafer is measured by the system. Adjustment range. Then, execute the (4) program of the full face of the work: and control the test. Then, Wei controls the wheel of the hotkey to reveal the user interface. Finally, the rate of input by the maker interface is accepted, and the operating frequency of the whole chip is adjusted according to the rate of the input. (4) Internal adjustment is not shown in an embodiment of the present invention, the above-mentioned detection first starts from the second working frequency: Connect f to detect whether the display chip appears: Display: When the chip is abnormal, 'stop adjusting the display,' the adjusted display - the frequency is the step of the frequency adjustment. First of all: adjustment: whether the display wafer is out of date The operating frequency of the film operates 6 1336453 0950421 22919twf.doc/n without the chip' and detects the temperature at which the wafer is not operating. Next, it is judged whether or not the temperature at which the wafer is operated is higher than the preset temperature. Finally, when the temperature at which the display wafer operates is higher than the preset temperature, it indicates that the display wafer is abnormal. In an embodiment of the invention, the step of opening the application of the full screen includes loading the dynamic link library. After loading the dynamic link library, the call to the dynamic link library is further included, and the operating frequency of the display chip is adjusted according to the input frequency.

在本發明之一實施例中,上述之顯示使用者介面之步 驟為將使用者介面嵌入全螢幕晝面之應用程式下一個欲顯 不之晝面中。 在本發明之-實施例中,上述之債測顯示晶片之頻率 調整範圍之後更包括記賴率觀範圍於基本輸入輸出系 ^BK)S) ο而之後更包括自基本輪入輪出系統載入頻率 調整乾圍。In one embodiment of the invention, the step of displaying the user interface is to embed the user interface in the next screen of the application that is to be displayed on the full screen. In the embodiment of the present invention, the above-mentioned debt measurement display chip after the frequency adjustment range further includes the tracking rate range from the basic input/output system (BK)S), and then includes the self-basic wheel-in and out system. Enter the frequency to adjust the dry circumference.

圍 本發明於系統開機時,便偵測 以在全螢幕畫面之應用程式中 顯 示晶片的頻率調整範 ’據以調整顯示晶片的 工作頻率。因此能夠根據使用者需求, 曰 工作頻率的調整,無論在祕在任何狀思時進仃顯不曰曰片 整晶片的工作頻率,相當方便。 為讓本發明之上述特徵和優點 舉較佳實施例,並配合所附圖式 ^ ’下文特 【實施方式】 作砰'冲說明如下。 般在執行全螢幕畫面之應用 時’若發覺速度太慢、效鮮佳,式(例如遊戲程式) 態下’皆可隨時調 而欲調整晶片的工作 頻 7 1336453 0950421 22919twf. doc/n =,必财_全鋒晝面後,·才能藉 ,調整’本發明則是在執行全螢幕晝面之應 精由控制賊來啟動-個㈣者介面 ^ :整顯示晶片之工作頻率。為了使本發== 瞭’以下特^施例作為本發财實能夠據以實施的更範^ r r以h下貝施例所提之顯示晶片例如是圖形處理器The present invention detects when the system is powered on, and displays the frequency adjustment of the wafer in the application of the full screen to adjust the operating frequency of the display wafer. Therefore, according to the user's needs, 曰 the adjustment of the working frequency, no matter when it is in any situation, it is quite convenient to enter the operating frequency of the whole wafer. The above-described features and advantages of the present invention are set forth in the accompanying drawings. Generally, when performing a full-screen application, if you find that the speed is too slow and the effect is good, you can adjust the working frequency of the chip at any time (for example, the game program). 7 1336453 0950421 22919twf. doc/n =, After the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ In order to make the present invention == the following special embodiment as a more practical implementation of the present invention, the display wafer, such as a graphics processor

=_cIwssUnit,GPU),全榮幕晝面之應用程式例 如疋遊戲程式,舰領域具有通常知識者亦可視其需求而 將本發明實施於各種類型。=_cIwssUnit, GPU), for example, a game program, such as a game program, the general knowledge of the ship field can also be implemented in various types depending on the needs thereof.

圖1是依照本發明-實施例之調整晶片工作頻率的方 ^流程圖。請參照圖卜首先,步驟811()是在系統開機的 時候,便動態去偵測顯示晶片的頻率調整範圍,即是偵測 顯不晶片可進行超頻(0vercl0ck)的最大極限值,以避免 在調整晶片工作頻率時,不小心將工作頻率調整過高而造 成顯示晶片毀損的狀況發生。當偵測完畢時,系統便會將 偵測到的頻率調整範圍記錄至記憶體中的基本輸入輸出系 統(Basic Input/Output System,以下簡稱為 Bios )。 另外’在偵測顯示晶片的頻率調整範圍前’亦可先判 斷系統的硬體裝置與外在環境因素是否有變更,來決定是 否延用上次開機所偵測的頻率調整範圍。若無變更,則可 延用上次開機所偵測的頻率調整範圍,以加速系統開機速 度’可視使用者情況而決定,本實施例並不限制。 而偵測顯示晶片之頻率調整範圍可細分為多個子步 驟’圖2是依照本發明之一實施例之偵測顯示晶片之頻率BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a flow diagram of adjusting the operating frequency of a wafer in accordance with an embodiment of the present invention. Please refer to FIG. 1 first, step 811 () is to dynamically detect the frequency adjustment range of the display chip when the system is powered on, that is, to detect the maximum limit value of the overclocking (0 vercl0ck) of the display chip to avoid When the operating frequency of the wafer is adjusted, the operating frequency is adjusted too high and the display wafer is damaged. When the detection is completed, the system will record the detected frequency adjustment range to the basic input/output system (Basic Input/Output System, hereinafter referred to as Bios) in the memory. In addition, before the frequency adjustment range of the display chip is detected, it is also possible to determine whether the hardware device of the system and the external environmental factors have changed to determine whether to extend the frequency adjustment range detected by the last power-on. If there is no change, the frequency adjustment range detected by the last power-on can be extended to speed up the system startup speed, which can be determined by the user's situation. This embodiment is not limited. The frequency adjustment range of the detection display chip can be subdivided into a plurality of sub-steps. FIG. 2 is a diagram for detecting the frequency of the display chip according to an embodiment of the present invention.

S 0950421 22919twf.doc/n 調整範圍方法的流程圖。嗜失y 參、圖2,步驟S210為自動從 ^又工,料開料步調整顯示W之工作頻率。換言 之’即疋糸統於開機時,以一 始往上逐步調整顯示晶“工=工作頻率為基準,? 值。而上敎比,亦或是慢慢增加一個定 定之初始工作料,在^例=是顯示晶片祕時,所設 穩定之狀態。 作解下’為系統運作時最 驟』Γϊΐ照圖2 ’當調整顯示晶片之工作頻率後,步 _為债測顯不晶片是否出現異t,來判斷是否繼續 W貝’顯不晶>1的頻率調整範圍。舉例來說,可利用運作溫 又來判斷顯示晶K否出現異常。以調整後之顯示晶片之 工作頻率來運作,並去偵測顯示晶片運作時之溫度,以判 斷顯不日曰片運作時之溫度是否高於預設溫度。若顯示晶片 運作時之/JDL度向於預設溫度時,即表示顯示晶片出現異常。 一步驟S230為當顯示晶片出現異常時,便停止調整顯 不晶片之工作頻率,並以目前調整後之顯示晶片之工作頻 率作為頻率調整範圍之極限值。意即若繼續調整顯示晶片 ^工作頻率’則系統之運作亦越不穩定’例如電壓的不穩 等因素。因此,便玎將目前調整後之顯示晶片之工作頻率 设為頻率調整範圍的最大值。 舉例來說,若顯示晶片之預設工作頻率為500MHz 500百萬赫茲,即每秒的運算速率是5億次),則在進 行頻率調整範圍之偵測時’便自500MHz開始調整,每次 1336453 0950421 22919twf.doc/n 在上調整一個範圍,例如一次調丝5MHz,逐次調整顯示 晶片之工作頻率為505MHz、510 MHz、515 MHz......,直 到偵測出現異常為止。若於600MHz偵測出顯示晶片運作 時的溫度過高,則600MHz便為頻率調整範圍之極限值, 換言之’即是頻率調整範圍最高可調整至600MHz。 接著’請繼續參照圖1 ’步驟S120為執行全營幕書面 之應用程式,並且在執行的同時控制熱鍵(Hotkey)將被 系統致能。而在全螢幕畫面之應用程式被執行後,系統會 將調整晶片工作頻率的動態連結程式庫(Dynamically Linked Library, DLL)載入至記憶體中,以供後續動作呼 叫使用。 然後,步驟S130為於全螢幕晝面之應用程式中,接 收控制熱鍵的輸入,以顯示使用者介面。換言之,即是當 系統偵測到使用者按下控制熱鍵後,便會顯示出使用者^ 面。而顯示使用者介面之動作是將使用者介面嵌入到全螢 幕晝面之應用程式下一個欲顯示之晝面中。 舉例來說’圖3是依照本發明之—實施例之顯示使用 者介面的示賴。請參照圖3,當系統接收到控制熱鍵的 輸入時’便會利用-些指令來顯示使用者介面,將使用者 介面加人在下-個欲顯示的晝面。例如,在下一個欲 晝面中增加座標齡’作為制者介面在全t幕畫面中顯 示的位置,以顯示使用者介面。 請繼續參照圖1’步驟Sl3〇顯示之使用者介面包括頻 率調整範圍。也就是說,㈣錢帛者介㈣,則系統會 1336453 0950421 22919twf.doc/n 自BI〇s中載入步驟SU0所偵測到的顯示晶片之頻率調整 範^,並將頻率調整範圍顯示於使用者介面中,而亦可將 目前顯示“之王作頻率顯示於制者介面中。因此,使 用者便可減鮮調整範圍設定欲婦之卫作鮮。然在 此例僅為方便說明,本實施並不限定使用者介面中之^訊 種類。 、β 接下來’步驟S140為根據所接收之輸入頻率,而在 φ 頻率調整範圍内調整顯示晶片之工作頻率。意即使用者可 依據需求來設定輸入頻率(即欲調整之工作頻率),而系 統便根據此輸入頻率來調整顯示晶片之工作頻率,若輸入 頻,不在頻率調整範圍内,系統則例如是以頻率調整範圍 的最大值來調整顯示晶片之工作頻率,而不會強行調整工 作頻率為使用者輸入之輸入頻率,以確保系統的穩定度。 此外’當接收輸入頻率之後,系統便會自計憶體中啤叫調 整晶片工作頻率的動態連結程式庫,以根據輸入頻率來調 整顯示晶片之工作頻率。 _ «後,當調整完顯示晶片的工作鮮後,便將使用者 介面關閉。而關閉使用者介面的方法,例如,再按下控制 熱鍵以關閉使用者介面’或是在使用者介面上使用游 點選關閉鍵等。 值得一提的疋,當調整完顯示晶片的工作頻率後,在 全蝥幕畫面之應用程式中,若工作頻率調整過高時,使得 系統負擔過大’而可能使圖案出現破圖的情形。另一方面, 亦或是工作頻率調整不足,而使得晝面流暢度並不佳。因 11 1336453 0950421 229I9twf.doc/n 此,可再次按下控制熱鍵,以顯示使用者介面來增加或降 低顯示晶片的工作頻率。然調整顯示晶片的工作頻率之次 數’可由使用者根據系統運作情形來調整。 為了清楚地表達上述概念,以下再舉一實施例說明。 圖4A〜圖4C是依照本發明之一實施例之利用使用者介面 來調整晶片工作頻率的示意圖。請參照圖4A,當在作業系 統410中執行全螢幕晝面之應用程式42〇之下,若作業系S 0950421 22919twf.doc/n Flow chart of the adjustment range method. Lost y parameter, Fig. 2, step S210 is to automatically adjust the operating frequency of W from the work process. In other words, when the system is turned on, the display crystal is gradually adjusted from the beginning to the top, and the work frequency is used as the reference. The value is compared with the upper and lower ratios, or a fixed initial work material is slowly added. Example = is the state of the display of the secret time of the wafer, set the state of stability. Under the solution, the most important step is when the system is operating. Figure 2 t, to determine whether to continue the frequency adjustment range of W's 'crystallized' 1. For example, the operating temperature can be used to judge whether the display crystal K is abnormal. It operates with the adjusted operating frequency of the display chip, And detecting the temperature of the display wafer during operation to determine whether the temperature of the display is higher than the preset temperature. If the /JDL degree of the wafer operation is preset to a preset temperature, the display wafer appears In step S230, when an abnormality occurs in the display wafer, the operating frequency of the display wafer is stopped, and the operating frequency of the currently adjusted display chip is used as the limit value of the frequency adjustment range. The whole display of the chip's operating frequency' is the more unstable the operation of the system, such as voltage instability. Therefore, the operating frequency of the currently adjusted display chip is set to the maximum value of the frequency adjustment range. If the preset operating frequency of the display chip is 500MHz 500 megahertz, that is, the calculation rate per second is 500 million times, then when the frequency adjustment range is detected, the adjustment starts from 500MHz, each time 1364453 0950421 22919twf .doc/n adjusts a range above, for example, 5MHz once, and adjusts the operating frequency of the display chip to 505MHz, 510MHz, 515MHz... until the detection is abnormal. If it is detected at 600MHz When the temperature of the display wafer is too high, 600MHz is the limit value of the frequency adjustment range. In other words, the frequency adjustment range can be adjusted up to 600MHz. Then, please continue to refer to Figure 1 'Step S120 for the full-screen writing The application, and the hotkey (Hotkey) will be enabled by the system while it is being executed. After the full screen image application is executed, the system will adjust The dynamic operating link library (DLL) of the chip operating frequency is loaded into the memory for use in subsequent action calls. Then, in step S130, the input of the control hotkey is received in the application of the full screen. To display the user interface. In other words, when the system detects that the user presses the control hotkey, the user's face is displayed. The action of displaying the user interface is to embed the user interface into the full screen. The next application is to be displayed in the next page. For example, 'Figure 3 is a display of the user interface according to the embodiment of the present invention. Please refer to Figure 3, when the system receives the control hotkey When you type it, you will use some commands to display the user interface and add the user interface to the next page to be displayed. For example, the seat age is added to the next desired face as the position displayed by the maker interface in the full t-screen to display the user interface. Please continue to refer to Figure 1'. Step S13. The user interface displayed includes the frequency adjustment range. That is to say, if the (4) money is introduced (4), the system will 1364453 0950421 22919twf.doc/n load the frequency adjustment range of the display chip detected by step SU0 from BI〇s, and display the frequency adjustment range. In the user interface, the currently displayed "King's frequency is displayed in the maker interface. Therefore, the user can set the adjustment range to set the desire for the woman's health. In this case, for convenience only, This embodiment does not limit the type of information in the user interface. [beta] Next, step S140 is to adjust the operating frequency of the display chip within the φ frequency adjustment range according to the received input frequency, that is, the user can according to the demand. To set the input frequency (ie, the operating frequency to be adjusted), and the system adjusts the operating frequency of the display chip according to the input frequency. If the input frequency is not within the frequency adjustment range, the system is, for example, the maximum value of the frequency adjustment range. Adjust the operating frequency of the display chip without forcibly adjusting the operating frequency to the input frequency of the user input to ensure the stability of the system. After that, the system will automatically update the dynamic link library of the wafer to adjust the working frequency of the display chip according to the input frequency. _ «After adjusting the display chip, the work will be The user interface is closed. The method of closing the user interface, for example, pressing the control hotkey to close the user interface or using the cursor to select the close button on the user interface is worth mentioning. After the display of the operating frequency of the chip, if the operating frequency is adjusted too high in the application of the full screen, the system is overburdened, and the pattern may be broken. On the other hand, it is also the operating frequency. Inadequate adjustment, which makes the smoothness of the face is not good. Because 11 1336453 0950421 229I9twf.doc/n, you can press the control hotkey again to display the user interface to increase or decrease the operating frequency of the display chip. The number of times the operating frequency of the wafer ' can be adjusted by the user according to the operating conditions of the system. In order to clearly express the above concept, another embodiment will be given below. 4A-4C are schematic diagrams of adjusting a wafer operating frequency by using a user interface according to an embodiment of the present invention. Referring to FIG. 4A, when the full screen interface application 42 is executed in the operating system 410, Next, if the operating system

統410接收到使用者對控制熱鍵43〇的輸入,則控制熱鍵 430便會去呼叫驅動程式44〇。接著,請參照圖4B,驅動 知式440便會在作業系統41〇中開啟使用者介面45〇,並 將使用者介面450嵌入到全螢幕晝面之應用程式42〇中(如 圖3所示)。When the system 410 receives the user's input to the control hotkey 43〇, the control hotkey 430 will go to the call driver 44〇. Next, referring to FIG. 4B, the driver 440 will open the user interface 45 in the operating system 41 and embed the user interface 450 into the application 42 of the full screen (as shown in FIG. 3). ).

之後,凊參照圖4C,在使用者介面45〇被開啟後, 使用者便可在使用者介面45〇上設定輸人頻率。設定完成 後’使用者介面45G便會將接㈣的輸人鮮傳送至動態 連結程式庫460。而動態連結程式庫_根據輸入頻率以 ” BIOS 470中之頻率調整範圍,去調整顯示晶片 的^鮮(即是進行超頻動作),並由顯示卡動態連結 = 繼續顯示晝面。顯示卡動態連結程式庫48〇例 t疋顯Ϊ卡的驅動程式,是根據動態連結程式庫權調整 =作頻率來驅動顯示卡’以繼續顯示全螢幕晝面之應 综上所述,本發明所提出之調整 至少具有下列優點:Thereafter, referring to FIG. 4C, after the user interface 45 is turned on, the user can set the input frequency on the user interface 45A. After the setting is completed, the user interface 45G will transfer the incoming (4) input to the dynamic link library 460. The dynamic link library _ adjusts the range according to the frequency of the input frequency in the BIOS 470 to adjust the display chip (that is, the overclocking action), and the dynamic connection of the display card = continue to display the picture. The display card dynamic link The library 48 example shows the driver of the Leica card, which is based on the dynamic link library weight adjustment = frequency to drive the display card to continue to display the full screen surface. The adjustment proposed by the present invention At least have the following advantages:

片工作頻率的方法 ί 12 1336453 0950421 22919twf.d〇c/n 1.於系統開機時g卩制頻率_整範圍 整範圍内顯示晶片的工作頻率,因此^此頻率調 因超頻而受損。 t龙顯示晶片 啟動使用者介面,並選擇調整顯示W的熱鍵來 使用的方便性。 作頸率’提高 雖然本發明已以較佳實施例揭露如上,Method of working frequency of chip ί 12 1336453 0950421 22919twf.d〇c/n 1. When the system is turned on, the frequency of the chip is set to the whole range. The operating frequency of the chip is displayed in the whole range, so this frequency is damaged due to overclocking. The t-long display chip starts the user interface and selects the convenience of adjusting the hot key of the display W for use. Neck rate' improvement, although the invention has been disclosed above in the preferred embodiment,

限定本發明’任何所屬技術領域中具有通常:識;, =本發明之保護範圍當視後附之申請專 【圖式簡單說明】 圖1是依照本發明一實施例之調整晶 法流程圖。 W丰的方</ RTI> </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; W Feng's side

圖2是依照本發明之一實施例之债測顯示晶片之頻率 調整範圍方法的流程圖。 九圖3是依照本發明之一實施例之顯示使用者介面的示 思圖。 圖4A〜圖4C是依照本發明之一實施例之利用使用者 J面來調整晶片工作頻率的示意圖。 【主要元件符號說明】 S110〜S150 :本發明之調整晶片工作頻率的方法之各 步驟 S210〜S230 :本發明之偵測顯示晶片之頻率調整範圍 方法之各步驟2 is a flow chart of a method for determining the frequency adjustment range of a debt display wafer in accordance with an embodiment of the present invention. Figure 3 is a diagram showing a user interface in accordance with an embodiment of the present invention. 4A-4C are schematic diagrams of adjusting the operating frequency of a wafer using a user's J surface in accordance with an embodiment of the present invention. [Description of main component symbols] S110~S150: steps of the method for adjusting the operating frequency of the wafer of the present invention S210 to S230: steps of detecting the frequency adjustment range of the display chip of the present invention

Claims (1)

1336453 0950421 22919twf.doc/n 十、申請專利範圍: h —種調整晶片工作頻率的方法,適於在執行一全螢 面之應用程式下,調整一顯示晶片之工作頻率,該調 整晶片工作頻率的方法包括下列步驟:1336453 0950421 22919twf.doc/n X. Patent Application Range: h—A method for adjusting the operating frequency of a wafer, which is suitable for adjusting the operating frequency of a display chip under the application of a full-surface application, which adjusts the operating frequency of the wafer. The method includes the following steps: 於系統開機時,偵測該顯示晶片之一頻率調整範圍; 執行該全螢幕晝面之應用程式,並致能一控制熱鍵; =收該控制熱鍵的輸人’以顯示—使用者介面;以及 收之由該制者介面輸人之―輪人鮮,祕據所接 工於此、:續率,在該料鋪軸内難鋪示晶片之 方法,範圍第1項所述之調整晶片工作頻率的 自、―中^貞測該顯示晶片之該鮮調整範圍之步驟包括: 頻率; 作頻率開始,逐步難鋪示晶片之工作Detecting a frequency adjustment range of the display chip when the system is powered on; executing the application of the full screen and enabling a control hotkey; = receiving the input of the control hotkey to display - the user interface And the recipient of the system-input-in-the-wheel input, the secret data is received here, the renewal rate, the method of displaying the wafer in the material axis, and the adjustment mentioned in the first item The steps of the chip operating frequency, the process of measuring the fresh adjustment range of the display chip include: frequency; starting with frequency, step by step to display the work of the wafer 丨只閃琢顯示晶片是否 當該顯示晶片出現以及 :頻率’而目前調整後整=晶片之工 率調整範圍之極限值。孩顯不日日片之工作頻率即為該頻 方法,其中=以„項所述之調整晶片工作頻率的 以調整後常之步驟包括: 片測該顯示晶片運;二;頻率運作該顯示晶 度;^顧7作時之溫度是否高於-預設溫 1336453 0950421 22919twf.doc/n 當該顯示晶片運作時之溫度鬲於該預設溫度時,即表 示該顯不晶片出現異常。 4.如申請專利範圍第2項所述之調整晶片工作頻率的 方法,其中該預設工作頻率為該顯示晶片出廠時,所設定 之初始工作頻率。 5·如申請專利範圍第1項所述之調整晶片工作頻率的 方法’其中開啟該全螢幕畫面之應用程式之步驟更包括: 載入一動態連結程式庫。 6. 如申請專利範圍第5項所述之調整晶片工作頻率的 方法,其中在載入該動態連結程式庫的步驟之後更包括: a片:Η:動,連結私式庫’根據該輪入頻率調整該顯示 曰日乃之工作頻率。 7. 如申請專利範圍第i項所 方法’其中顯示該使用者介面之步驟:片工作頻率的 個欲以面嵌入該全螢幕晝面之應用程式下- 方法US::第1項所述之調整晶片工作頻率的 括·· 貞測該顯示晶片之該頻率調整範圍之後更包 記錄該頻率調整範圍於—基 之 土本輪入輪K域人該頻率調整範 後更包括: 域域基本輸人輪出系统 圍 15 1336453 0950421 22919twf.doc/n 10. 如申請專利範圍第8項埒述之調整晶片工作頻率 的方法’其中該基本輸入輸出系統存放於一記憶體中。 11. 如申請專利範圍第1項所述之調整晶片工作頻率 的方法,其中該使用者介面中包括該頻率調整範圍。 12. 如申請專利範圍第1項所述之調整晶片工作頻率 的方法,更包括: 關閉該使用者介面。 13. 如申請專利範圍第1項所述之調整晶片工作頻率 的方法,其中該顯示晶片包括圖形處理器。 14. 如申請專利範圍第1項所述之調整晶片工作頻率 的方法,其中該全螢幕晝面之應用程式包括遊戲程式。丨 only flashes to show whether the wafer is present when the display wafer appears and the frequency is 'the current adjustment' = the limit value of the wafer's power adjustment range. The frequency of the working frequency of the child is the frequency method, wherein the step of adjusting the working frequency of the wafer as described in the item to adjust the usual steps includes: measuring the display wafer; and operating the display crystal at a frequency Whether the temperature of the test is higher than - the preset temperature of 1364453 0950421 22919twf.doc / n When the temperature of the display wafer is below the preset temperature, it indicates that the display wafer is abnormal. The method for adjusting a working frequency of a wafer according to claim 2, wherein the preset operating frequency is an initial operating frequency set when the display wafer is shipped from the factory. 5. Adjusting as described in claim 1 The method for operating the frequency of the chip, wherein the step of opening the application of the full screen image further comprises: loading a dynamic link library. 6. The method for adjusting the operating frequency of the chip according to claim 5 of the patent application, wherein After the step of entering the dynamic link library, the method further includes: a slice: Η: move, link private library 'Adjust the display frequency according to the rounding frequency according to the rounding frequency. The method of the range i is the step of displaying the user interface: the application of the slice operating frequency is embedded in the application of the full screen surface - Method US:: Adjusting the operating frequency of the wafer as described in Item 1 After the frequency adjustment range of the display chip is measured, the frequency adjustment range is further recorded. The frequency adjustment range of the base wheel is further included: the domain basic input wheeling system surrounds 15 1336453 0950421 22919twf.doc/n 10. The method of adjusting the operating frequency of the wafer as described in item 8 of the patent application' wherein the basic input/output system is stored in a memory. 11. As claimed in claim 1 The method for adjusting the operating frequency of the chip, wherein the frequency adjustment range is included in the user interface. 12. The method for adjusting the operating frequency of the wafer according to claim 1 of the patent application further includes: closing the user interface. The method of adjusting the operating frequency of a wafer as described in claim 1, wherein the display chip comprises a graphics processor. 14. Said method of adjusting the operating frequency of the wafer, wherein the full-screen application comprises a game program of the day surface. 1616
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