九、發明說明： 【發明所屬之技術領域】 本發明係關於驗電腦主機板_試設備，特別是不佔 用BIOS額外空間資源的測試設備。 【先前技術】 第-圖顯示用於電腦主機板㈣知測試設備的結構圖， 以及第二圖顯示第-圖電腦主機板的圓的記憶體映射圖 (Memory map)。習知測試設備丨乃是用來測試電腦主 當電腦主敵2進人於DGS作㈣統的操作魏之後，儲存 於硬碟機3的各酬試翻程式3a乃被闕地讀取且載入至 主記憶體而被執行。執行巾的測試應用程式3&乃呼叫位於 BIOS的中介程式2a，被呼叫執行的中介程式^乃將對應於 測試應用程式3a的測試值參數2b贿於⑽s 2d。當測試應 用程式3a完成測試時’中介程式2a再次被呼叫，執行的枝 程式2a乃將原先的預設值參數2c恢復儲存於c廳纪。然而， 中介程式2a、測試值參數2b、預設值參數&乃會佔用應 的儲存空間，尤其當職值參數2b、預設值參數&日益變多 時，此種耗用BIOS儲存空間的情形更形嚴重。 __試軟體是由DiagS〇ft公司開發的測試軟體，例 如在⑽4年推出QAPLUS/FE 05.15版測試軟體，它能夠全面 進行系統關試，測試項目騎括電歡機板、記憶體、顯 1334980 不卡/顯示器、硬碟、軟碟、鍵盤、串列埠、並行埠...等等。 同時，QAPLUS/FE 05. 15版測試軟體亦提供對電腦主機板的 CMOS進行修改的功能，可以取代進入Bi〇s後才能夠編輯⑶的 内容的麻煩。 台灣發明專利申請案號第〇87116903號「CM〇s資料載入 方法」，乃揭露一種CMOS資料載入方法，首先，讀取第一待 測單元(Unit-under-test)的CMOS資料，並且建立CM〇s檔 案。主機接收該CMOS齡。主機向第二待測單元傳送該⑽s 標案。第二制單元將該⑽s _之内容設定於本身的 CMOS。在輔針，第—待測單元與第二制單元必須是同 一類型的電齡機板。細，在該前針，第二待測單元如 何將》玄CMOS標案之内容設定於本身❾CM〇s，其設定手段如 何’則並無任何說明。 本么明的發明人有鑑於上述習知技藝的缺失與不足，乃 ** 4月而提出-種用於電腦主機板的測試設備，可應用在 内建有愈來愈多樣性功能的電腦主機板，同時，克服了上述 習知技藝_隨的儲存空間之缺失。 【發明内容】 本1月之目的係提供—觀於電齡機板賴試設備， 且不佔用_S額外空間資源的測試設備。 :達成本H逑目的’本發明提供-種用於電腦主機 板的測試設備，乃包括：外部儲存裝置係電氣性連接電腦主 機板’以及仙來儲存至少—個以上的測試應用程式、中介 程式、至少-個以上的職值參數、至少_個以上的預設值 參數。其中每個測試翻程式係各自對應於所對應的測試值 參數’以及每伽j試應雜式魏騎對應_試值參數， 在DOS作業緣下’絲對電駐機板進行職。中介程式 係用來被該些測試應用程式呼叫。當測試進行時，中介程式 係用來將呼叫中介程式的測試應用程式其所_的測試值參 數’將其儲存於電腦主機板的CM〇s。當測試完成時，中介 程式係用來將呼叫巾介程式的測試應用程式其所對應的預設 值參數，將其儲存於該電腦主機板的CMOS。 為使熟悉該項技藝人士瞭解本發明之目的、特徵及功 效，茲藉由下述具體實施例，並配合所附之圖式，對本發明 詳加說明，說明如後： 【實施方式】 第三圖顯示本發明用於電腦主機板的測試設備的結構 圖。本發明係一種用於電腦主機板的測試設備1〇，乃主要用 來測試電腦主機板30。由於内建在電腦主機板3〇本身的功能 愈來愈多樣化’例如内建顯示卡、内建音效卡、内建USB介 面、内建網路卡、峽SATA介面料’因此，電腦主機板^ 在出廠前所要進行的測試項目亦是愈來愈繁雜，其所需要的 測試程式碼其所佔用的儲存空間亦是愈來愈大 ’同樣地，作 為測試用途繼編崎嫩卩椒嫩大。在本 發明中，對於電腦主機板3G的各侧_，乃是由對應的 測試應用程式1G1來進行，喊些測試顧程式101、測試值 參數103、預設值參數1G5等皆係儲存於外部儲存褒置洲。 外4儲存裝置20係電紐連接電駐機板w。兹舉以硬 碟機作為外部儲键置2〇的範例，硬碟機2〇可以經由電雙 線連接於電腦主機板30。至少一個以上的測試應用程式ι〇ι、 中介程式贿、至少—個以上的測試值參數1〇3、以及至少一 個以上的預設值參數1G5等皆是齡於硬碟機2〇。 每個測試應用程式101係各自對應於所對應的測試值參 數1〇3 ’例如：用於内建顯示卡的測試應用財ι〇ι乃擁有一 組屬於其專用且用於内建顯示卡的測試值參數1〇3。 中介程式107係用來被該些測試應用程式101呼叫。中 介程式107能夠將該些測試值參數103與該些預設值參數105 儲存至電腦主機板3〇的CMOS 301。 第四圖顯示本發明的測試設備對電腦主機板進行測試的 狀態圖。當測試進行時，外部儲存裝置2〇、顯示器4、鍵盤(圖 未顯示)以及電源供應器(圖未顯示)乃連接於電腦主機板30， 接著啟動電源，此時的電腦主機板3〇載入D〇s作業系統 而進入DOS操作環境。接著，測試人員便能夠進行各項測試 1334980 項目。茲舉以用於内建顯示卡的測試應用程式1〇1作為範例 °兒月。/貝彳试人貝利用鍵盤輸入用於内建顯示卡的測試應用程 式101的檔案名稱（例如：VGA_TEST.EXE) 後，’’VGA—TEST.EXF，101從硬碟機20被載入而被執行。 在’’VGA—TEST.EXF’ 101的執行之間，中介程式1〇7乃被呼 叫’被呼叫執行的中介程式107乃將，，ν〇Α_ΤΕ8ΤΕχΕ„ 1Q1 所專屬的用於内建顯示卡的測試值參數1〇3，從硬碟機2〇讀 取該組測試值參數1〇3，然後，中介程式1〇7再將該組測試值 參數103儲存至CMOS 301，此時的電腦主機板3〇其有關於 内建顯示卡的測試值參數已被完成設定。 接著’，，VGA_TEST.EXE” 1〇1便對内建顯示卡進行各項 相關測試，例如GPU(圖形處理理器)的超頻測試。當完成測試 時，中介程式107再次被呼叫，被呼叫執行的中介程式1〇7 乃將用於内_科的微值參數1Q5 ’從硬韻2()讀取該 組預設值參數H)5，然後’中介程式1()7再將該組預設值參數 105儲存至CMOS 301，此時的電腦主機板3〇其有關於内建 顯示卡的預設值參數已被恢復設定。 再者’凡熟悉該項技藝人士乃可料—個測試主程式， 其可以儲存在硬碟機20，測試域式乃用來自純行所有測 試應用程式101，如此則便利於測試人員的測試工作的易於進 行0 i 第五圖顯示本發明用於電腦主機板的測試設備的變化實 施例的結構圖。中介程幻07乃增設一個型f虎識継式咖， 能夠用來識別各種不同型號的電腦主機板3〇。在BI〇s習知技 藝中，BIOS乃儲存有全域唯一識別元碼（GUID_G1〇bally Unique Identifier，有時也稱為通用唯一識別碼 [UUID-Universally Unique Identifier])，據此，型號識別 程式107a可利用讀取GUID，來識別出各種不同型號的電腦主 機板30。除此外，應用在多種不同型號的電腦主機板3〇的各 組測試值參數103、各組預設值參數105皆是儲存於硬碟機 20。據此，測s式设備1〇便能夠用來測試各種不同型號的電腦 主機板30。在第五圖中，專用於特定型號的電腦主機板3〇其 對應的測試值參數103與預設值參數105乃採以參數1〇9來 標示。 承續上例說明，在”VGA_TEST.EXF，1〇1的執行之間， 中介程式107乃被呼叫，接著，中介程式1〇7先執行型號識 別程式107a，執行之後，中介程式107便知道目前測試中的 電腦主機板30其型號為何。接著，呼叫執行的中介程式 乃將” VGA_TEST.EXE” 101所專屬的用於内建顯示卡的測試 值參數103，並且這組測試值參數103乃是專用於此型號的電 腦主機板30，從硬碟機20讀取該組測試值參數1〇3，然後， 中介程式107再將該組測試值參數1〇3儲存至CMOS 301，此 時的電腦主機板30其有關於内建顯示卡的測試值參數已被完 成設定。 當完成測試時’中介程式1〇7再次被呼叫’接著，中介 程式107先執行型號識別程式1〇7a，執行之後，中介程式1〇7 便知道目前測試中的電腦主機板3〇其型號為何。被呼叫執行 的中介程式107乃將用於内建顯示卡的預設值參數1〇5,從硬 碟機20讀取該組預設值參數1〇5，並且這組預設值參數1〇5 乃是專用於此型號的電腦主機板3〇，然後，中介程式1〇7再 將該組預設值參數105儲存至CM〇s 3〇1，此時的電腦主機板 3〇其有關於内建顯示卡的預設值參數已被恢復設定。 上述外部儲存装置2〇乃可以改採用軟碟機、光碟機、記 憶卡、隨身碟等等，或是其它儲存裝置。 本發明用於電腦主機板的測試設備能夠將佔用儲存空間 的中介程式、該些峨值參數、該些預設值參數等皆是儲存 於硬碟機’能夠節省BI0S的空間，此為本發日月的有益效果與 優點所在。啊’變化實施例的賴設備乃能崎多種不同 型號的電腦主機板的進行測試，此又為本發明的另項的有兴 效果與優點所在》 風 〜雖然本發明已峨佳實施觸露如上，然其並非用以限 任何熟悉此項技藝者，在硕離本發明之精神和 乾圍内，當可做些許更動與潤飾，所作更動與潤飾仍屬於本 1334980 發明後附之申請專利範圍之内。 【圖式簡單說明】 第一圖顯示用於電腦主機板的習知測試設備的結構圖。 第二圖顯示第一圖電腦主機板的BIOS的# J 5己憶體映射 (Memory map)圖。 第三圖顯示本發明用於電腦主機板的測試敦備的結構圖IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a computer-based motherboard-testing device, particularly a test device that does not occupy additional space resources of the BIOS. [Prior Art] The first figure shows a structural diagram for the computer motherboard (four) to know the test equipment, and the second diagram shows the memory map of the circle of the first computer motherboard. The conventional test equipment is used to test the computer main when the computer main enemy 2 enters the DGS for the operation of the four (four) system, the various trials stored in the hard disk machine 3 3a is read and loaded It is executed by entering the main memory. The test application 3& of the execution towel calls the intermediary program 2a located in the BIOS, and the intermediate program to be executed by the caller will bribe the test value parameter 2b corresponding to the test application 3a to (10) s 2d. When the test application 3a completes the test, the mediation program 2a is called again, and the executed program 2a restores the original preset value parameter 2c to the c hall. However, the mediation program 2a, the test value parameter 2b, and the preset value parameter & will occupy the storage space, especially when the job value parameter 2b, the preset value parameter & The situation is even more serious. The __test software is a test software developed by DiagS〇ft. For example, the QAPLUS/FE 05.15 test software was launched in (10) 4 years. It can fully perform the system test, and the test project is equipped with a flash memory board, memory, and display 1334980. No cards/displays, hard drives, floppy disks, keyboards, serials, parallels, etc. At the same time, QAPLUS/FE 05. 15 test software also provides the ability to modify the CMOS of the computer motherboard, which can replace the trouble of editing the content of (3) after entering Bi〇s. Taiwan Invention Patent Application No. 87116903 "CM〇s Data Loading Method" discloses a CMOS data loading method. First, the CMOS data of the first unit-under-test is read, and Create a CM〇s file. The host receives the CMOS age. The host transmits the (10)s standard to the second unit under test. The second system sets the content of (10)s_ in its own CMOS. In the auxiliary needle, the first unit to be tested and the second unit must be the same type of electrical age board. Fine, in the front hand, the second unit to be tested sets the content of the "Xuan CMOS standard" to its own ❾CM〇s, and there is no explanation as to how it is set. The inventor of the present invention has in view of the above-mentioned shortcomings and shortcomings of the prior art, and has proposed a test device for a computer motherboard in April, which can be applied to a computer host having an increasingly diverse function. The board, at the same time, overcomes the above-mentioned conventional skills _ with the lack of storage space. SUMMARY OF THE INVENTION The purpose of this January is to provide a test device that looks at the equipment of the electric age board and does not occupy _S additional space resources. The invention provides a test device for a computer motherboard, which includes: an external storage device electrically connected to a computer motherboard and a storage device for storing at least one or more test applications and mediators. At least one or more job value parameters, at least _ or more preset value parameters. Each of the test traversing programs corresponds to the corresponding test value parameter ’ and each gamma test should be mixed with the Wei _ corresponding _ test value parameter, and the wire is placed on the electric board in the DOS operation. The intermediary program is used to be called by the test applications. When the test is in progress, the mediation program is used to store the caller's test application's test value parameter' stored in the CM〇s of the computer's motherboard. When the test is completed, the intermediaries are used to store the preset parameters of the calling application's test application in the CMOS of the computer's motherboard. The present invention will be described in detail by way of the following specific embodiments and the accompanying drawings, and the following description The figure shows a structural diagram of a test apparatus for a computer motherboard of the present invention. The present invention is a test apparatus for a computer motherboard, and is mainly used for testing a computer motherboard 30. Because the built-in function of the computer motherboard 3 is more and more diversified, such as built-in display card, built-in sound card, built-in USB interface, built-in network card, xia SATA fabric, therefore, computer motherboard ^ The test items to be carried out before leaving the factory are also getting more and more complicated. The required test code is used for the storage space. [Similarly, as a test, I will continue to edit the skin. . In the present invention, each side of the computer motherboard 3G is performed by the corresponding test application 1G1, and some test programs 101, test value parameters 103, and preset value parameters 1G5 are stored externally. Store in the country. The external 4 storage device 20 is connected to the electric docking plate w. A hard disk drive is used as an example of an external storage button, and the hard disk drive 2 can be connected to the computer motherboard 30 via an electric double wire. At least one of the test applications ι〇ι, the intermediary bribe, at least one or more of the test value parameters 1〇3, and at least one of the preset value parameters 1G5 are all older than the hard disk drive. Each test application 101 corresponds to the corresponding test value parameter 1〇3 ' For example, the test application for the built-in display card has a set of dedicated and built-in display cards. The test value parameter is 1〇3. The intermediary program 107 is used to be called by the test applications 101. The intermediate program 107 can store the test value parameters 103 and the preset value parameters 105 to the CMOS 301 of the computer motherboard 3〇. The fourth figure shows a state diagram of the test equipment of the present invention for testing a computer motherboard. When the test is in progress, the external storage device 2, the display 4, the keyboard (not shown), and the power supply (not shown) are connected to the computer motherboard 30, and then the power is turned on. At this time, the computer motherboard 3 is loaded. Enter the D〇s operating system and enter the DOS operating environment. The tester is then able to perform various tests on the 1334980 project. Let's take the test application 1〇1 for the built-in display card as an example. /Beizhu tester uses the keyboard to input the file name of the test application 101 for the built-in display card (for example: VGA_TEST.EXE), and ''VGA-TEST.EXF, 101 is loaded from the hard disk drive 20 Executed. Between the execution of ''VGA-TEST.EXF' 101, the intermediary program 1〇7 is called 'the intermediary program 107 that is called to execute, ν〇Α_ΤΕ8ΤΕχΕ„ 1Q1 is dedicated to the built-in display card. The test value parameter 1〇3, the set test value parameter 1〇3 is read from the hard disk drive 2〇, and then the mediation program 1〇7 stores the set test value parameter 103 to the CMOS 301, at this time, the computer motherboard 3. The test value parameter of the built-in display card has been set. Then ',, VGA_TEST.EXE” 1〇1 will perform various related tests on the built-in display card, such as GPU (graphic processing processor) Overclocking test. When the test is completed, the intermediary program 107 is called again, and the intermediary program 1〇7 that is called to execute reads the set of preset parameter H from the micro-value parameter 1Q5 of the internal _ section. 5, then the 'intermediary program 1 () 7 then stores the set of preset value parameters 105 to the CMOS 301, at this time the computer motherboard 3 has its preset parameter for the built-in display card has been restored. Furthermore, anyone who is familiar with the art is expected to test the main program, which can be stored on the hard disk drive 20, and the test domain is used by all test applications 101 from the pure line, so that the test work of the tester is facilitated. Easily exemplified 0 i The fifth figure shows a structural diagram of a modified embodiment of the test apparatus for a computer motherboard of the present invention. The intermediary program Magic 07 is a new type of computer-based coffee maker that can be used to identify various types of computer motherboards. In the BI〇s prior art, the BIOS stores a globally unique identifier (GUID_G1〇bally Unique Identifier, sometimes referred to as a Universal Unique Identifier), according to which the model recognition program 107a The read GUID can be used to identify various types of computer motherboards 30 of different models. In addition, each set of test value parameters 103 and each set of preset value parameters 105 applied to a plurality of different types of computer motherboards are stored in the hard disk drive 20. Accordingly, the s-type device 1 can be used to test various types of computer motherboards 30. In the fifth figure, the computer motherboard 3 dedicated to a particular model has its corresponding test value parameter 103 and preset value parameter 105 indicated by parameter 1〇9. Continuing from the above example, the intermediary program 107 is called between the execution of "VGA_TEST.EXF,1〇1. Then, the mediation program 1〇7 executes the model recognition program 107a first. After execution, the mediation program 107 knows the current What is the model number of the computer motherboard 30 under test. Next, the mediation program for call execution is the test value parameter 103 for the built-in display card exclusive to "VGA_TEST.EXE" 101, and the set of test value parameters 103 is The computer motherboard 30 dedicated to this model reads the set of test value parameters 1〇3 from the hard disk drive 20, and then the intermediary program 107 stores the set of test value parameters 1〇3 to the CMOS 301, at this time, the computer The test board parameter of the motherboard 30 with respect to the built-in display card has been set. When the test is completed, the 'intermediary program 1〇7 is called again'. Then, the intermediaries 107 first execute the model identification program 1〇7a, after execution, The intermediary program 1〇7 knows the model of the computer motherboard 3 currently under test. The intermediary program 107 that is called to execute will use the preset value parameter 1〇5 for the built-in display card to read from the hard disk drive 20. Take this group Set the value parameter 1〇5, and the set of preset parameter 1〇5 is dedicated to the computer motherboard of this model. Then, the mediation program 1〇7 stores the set of preset parameter 105 to the CM〇. s 3〇1, at this time, the computer motherboard 3 has its preset parameter for the built-in display card has been restored. The above external storage device 2 can be changed to a floppy disk drive, a CD player, a memory card, a portable device, or the like, or a storage device. The test device for a computer motherboard can store an intermediary program occupying a storage space, the threshold parameters, and the preset parameter parameters on the hard disk drive. 'It can save the space of BI0S, which is the beneficial effect and advantage of the day and month. ah' The device of the change embodiment is tested by a variety of different types of computer motherboards, which is another item of the invention. The prosperous effect and advantages are in the wind. Although the present invention has been implemented as above, it is not intended to limit anyone who is familiar with the art, and can make some changes in the spirit and scope of the present invention. Change and retouch, made The movement and retouching are still within the scope of the patent application disclosed in the 1334980 invention. [Simple description of the drawing] The first figure shows the structural diagram of the conventional test equipment for the computer motherboard. The second figure shows the first computer host. The # J 5 memory map of the BIOS of the board. The third figure shows the structure diagram of the test for the computer motherboard of the present invention.
第四圖顯示本發明的測試設備對電腦主機板進a '、,广式的狀 態圖。 、 第五圖顯示本發明用於電腦主機板的測試設備的變化實施 例的結構圖。 【主要元件符號說明】 1 習知測試設備The fourth figure shows a state diagram of the test apparatus of the present invention for a computer motherboard. Fig. 5 is a block diagram showing a modified embodiment of the test apparatus for a computer motherboard of the present invention. [Main component symbol description] 1 Conventional test equipment
2 電腦主機板 2a.中介程式 2b 測試值參數 2c 預設值參數2 Computer motherboard 2a. Intermediary program 2b Test value parameter 2c Preset value parameter
2d CMOS 3 硬碟機 3a測試應用程式 4 顯示器 10測試設備 13349802d CMOS 3 hard drive 3a test application 4 display 10 test equipment 1334980
20外部儲存裝置 30電腦主機板 101測試應用程式 103測試值參數 105預設值參數 107中介程式 l〇7a型號識別程式 109參數 301 CMOS20 External storage device 30 computer motherboard 101 test application 103 test value parameter 105 preset value parameter 107 intermediary program l〇7a model identification program 109 parameter 301 CMOS