、發明說明： 【發明所屬之技術領域】 本發明係有關於一種多功能之待測物測試裝置及其測試之方法 尤其是有關於-種無需選擇開關而能具有自動判斷待測物 = 裝置及其測試之方法’例如-種自動判斷待測物種類之萬用電表 【先前技術】 目前各種自動測試之多功能萬用電表（Automatic ^細s細ing muUMneteO皆能_量_結果域财式顯示量離，例如顯示直 流值或交驗，電阻值絲容值、二極體錢顧路職結果等。雖 然也已經有些萬用電表宣稱已具有智慧型之自動測試功能，缺其所稱 之智慧型自_試功能是在“調整萬用電表上之功能選擇開關至一 待測物之位置，例如制物為—電㈣，則在進行量測前，需要先將 萬用電表上之功能選擇關調整（或是稱為切換）至量測電阻之位置 (或稱為槽位）’織使用輸人端的探針對所要戦之電阻進行量測， ，時的智慧型自動測試功能之萬用電表會自動選擇適當的電阻值進行 量測，而不需要測試者自己要從最高阻值處（例如：i〇〇m歐姆）逐步 地進行測試-直到有適當的電阻值；由例如#要對待測物進行開路判 試時，也只魏萬㈣表上之魏選擇_塌路職輯位，然後 萬用電表會自動測試及顯示待測物是開路或短路。 上述之先前技術之萬用電表已經在美國專利號第4,55娜、 4,58_、5742221以及祕泌，其令美國專利號第的侧令就 =確揭露其萬用電表可以在量測電屡時，無需手動選擇直流或交流 電屢功能，也不需手動選擇適當之範圍；又例如量測電阻時，盆不需 1326361 要先將待測電路除能；又例如有外加存在於制細無法量測時， 則會自動跳離段姆功能，並適當的選擇及顯示電壓值，同時是直流或 交流皆可自動進行測試。[Technical Field] The present invention relates to a multifunctional test device for testing objects and a method for testing the same, and more particularly to a device capable of automatically determining a test object = device without a selection switch The method of testing 'for example, a type of electric meter that automatically judges the type of the object to be tested [prior art] At present, various automatic test multi-function universal meters (Automatic ^ fine s fine ing muUMneteO can _ quantity _ results domain The display shows the amount of separation, for example, the display of DC value or inspection, the resistance value of the wire value, the results of the diodes, etc. Although some multimeters have claimed to have intelligent automatic test functions, lack of The smart self-test function is called “adjusting the function selection switch on the universal meter to a position of the object to be tested, for example, the material is—electricity (4), before the measurement, the universal power needs to be used first. The function on the table selects the adjustment (or called switching) to the position of the measuring resistor (or the slot). The weaving using the probe of the input end measures the resistance of the desired one. Functional The multimeter will automatically select the appropriate resistance value for measurement, without the tester having to gradually test from the highest resistance (for example: i〇〇m ohms) until the appropriate resistance value is obtained; for example #When the test object is to be tested for open circuit, only Wei Wei (4) on the table selects the _ collapse road position, and then the universal meter will automatically test and display the object to be tested is open or short. The multimeter has been used in U.S. Patent Nos. 4, 55, 4, 58, and 5,722,221, and secretly, which makes the U.S. Patent No. 1 order to reveal that its multimeter can be used to measure electricity. There is no need to manually select the DC or AC power function, and there is no need to manually select the appropriate range. For example, when measuring the resistance, the basin does not need to be 1326661 to first disable the circuit to be tested; for example, it may be added to the system and cannot be measured. At the same time, it will automatically jump off the segment function and properly select and display the voltage value. At the same time, it can be tested automatically by DC or AC.
雖然目前的萬用電表已經可以簡單地操作’但對實際要對-個複 雜的電路進行檢測時’其健需要先觸出制物為健類別，然後 經由手動職用電表上之魏選__整至適當馳位後，方可藉 由萬用電表上之自動測試功能量測到所要的結果。如此的過程會降低 工作的效益及不方便’尤其當獅錯誤時，產生的疑慮_ ;或是使 用完_，未將萬用電表上之魏選擇_調整離開電阻量測槽位， 而使得萬用電表上的電池耗盡等。 有鑑於習知技術之萬用電表在操作 電性能上，仍有改善的空間。 方便性上以及在電池消耗的省 【發明内容】 赛於上述之發明背景中，為了解決上述萬用電表在操作方便性七 也雜的钱性紅的_，本㈣提供了—健__ 在50ms以内偵測出常用的電路元件種類。者給人娌#=會象糊鴨，‘mm 執仃偵測流程，而量測裝置則處在不工作的狀態，故可 因此，本發明之-主要目的在提供—種具有自糊斷制鲍 以解决上捕狀萬帛電表雜作時，錢婦 測物之種類後，方能進行適t之量測。 擇讀切換待*，:==;::=_待測物種_測裝 種類，因財恢崎1^=：=編肖軸測物之 以及 能 本發明之還一主要目 〖擇開關 的在提供-種具有自動觸制物_之量測裝 置 程序，、因::::偵:出輸入端是否有待測物並據以決定是否要進入測試 私序因此本發明之調裝置可以_省電之要求。 π目2 ’本發明找提出—種自動w#__u L i路所纟提供紐轉觀息_糾；，概個測試 行切換動作/、=’狀蝴單元連接銳魏數瓣_息依序執 I 伽m電路触輸人端連接―侧貞測單元， 、早（並藉由—個比較電路依序對輸人端之電壓進行比較，並 果送回至控制單元’以使控制單元依據該比較結果來判斷待測 本發月接著提丨種具有自動判斷待測物種類之量測裝置，包括：一 單元；-個由減個戦電路所組 ί的切換衫，其與控解元連賤錄複數轉舰級序執行切換動 ，用以依序將該複數個測試電路與職人端連接；—個細單元，其與 切換早几連接並藉由-佩㈣路依稍輸人端之電驗行啸，並將比 較之結果送回至㈣單元，崎控辟被_比憾絲靖待測物之 麵，及-個㈣早兀’係與域單元雜並赠控财元之觸結果選 擇-相應之量測電路對铜物進行量測，並將制之結細示於一顯示裝 置0 本發明接著再提出-種智慧型的多功能萬用電表，設有—顯示裝置， 用以顯示複數個量_式及量測之數值，以及—個墟_裝置，用以提 供複數個切換選職式’以進㈣定健或蚊制物之制，以及一對 輸入端子，其職在於魏個量職式至少包括—自動掃關斷模式 (SCAN)，可自動觸無賴μ子連狀該制狀酬，並於完成 該待測物之_觸後，可简雜地自鑛崎測驗行數值量測。 —本發明接著再提出-種種智慧魏多魏萬用電表之量财法包括： 執行掃猫程序，係-控制單序提供複數個掃晦訊息；執行切換程序， 係由複數個峨電路組態触狀切料元綠據減崎_息依序執 订切換動作，肋依序將複數個職電馳態與—輸人端相連之待測物連 接—執行tt較程序’係經由—侧單元中的比較電路依賴制物之電壓 進订比較’以產生-比較結果；執行判斷程序，係由控制單元依據比較結 果來判斷該酬物之義；及當觸輸人端為開_，即_執行該掃描 程序否則即執行量測程序，係依據控制單元之判斷結果選擇一相應之量 測電路對待測物進行量測，並將制之結果顯示於—顯示裝置。 【實施方式】 一本發明在此所探討的方向為一種自動判斷待測物義之裝置，特別是 一種具有自動判斷制物麵之量測裝I為了能徹底地瞭解本發明，將 在下列的贿巾提岭盡的觸步職其觸電路的喊。顯舰，本發 明的=行並未限定於自動_待測物義之制裝置之技藝者所熟習的特 殊細即。另—方面，眾所周知的自動判斷待測物種類之量測裝置或量測步 驟等’並未描述於細節中，以避免造成本發明不必要之限制。本發明的較 t施例會詳細描述如τ，然而除了這鱗細描述之外，本發明還可以廣 在其料實_巾，且本發_請林蚊，其狀後的 範圍為準。 &凊參考第1圖’係本發明的自動判斷待測物種類之量測裝置之電路功 能方，圖，包括控鮮元（CONTROLLER) 1Q、切換單元（肅㈤20、 偵測單7G(TYPE DETECTOR)3G、類tt/數轉換電路(M CC)NVERTER) 4〇、資料處理電路(dataprocessing⑽⑽加、顯示裝置⑺祖奶 6〇、短關測單元（SHORT DETECT〇R)、7〇、蜂鳴器（職哪）8〇及 (RANGE CONTROL CIRCUIT) 90 e '先’如第1圖所示，本發明之自動判斷待測物種類之裝置係由-個 控制ΜΗ)來依序提供複數個掃贿息；然後將此複數個掃職息傳送至 切換單兀20 婦單元2G齡_控解元⑴峨供之複數個掃猫訊 1326361 息依序執行切換動作，用以依序將複數伽m電路與輸人端連接；例如當 控制單元ίο提H極體讀賴_，其會先提供—個二纖之正偏 壓掃猫訊號（P_DI〇_CHK)，接著，則再提供—個二極體之負偏壓掃猫訊 號（N DIO CHK) 〇 當切換單元20接收到控制單元1〇所傳送之p—DI〇-CHK訊號時，切 換單元20會執行一個切換動作，以使輸入端與第3圖中的電路組態連接。 此時’電路組態中的端點T2被接至正偏壓vdD，例如：vdd^sv，而端 點T3則被接至接地點（GND) ’同時端點T2還可與偵測單元3〇中的比較 器（未顯示於圖中）連接，用以偵測輸入端之電位，其中R1為一個大電阻， RpTC為一個分壓電阻，並且R1»RPTC，在一較佳實施例中，氏沉可是一熱 敏電阻，可以用來保護電路。當輸入端與第3A圖連接後，此時，若輸入端' 連接一個順向（forwardconnection)之二極體時，如第3A圖所示，端點T2 之電位（即VT2)將被箝制（damping)在二極體的導通電位，例如：VT2=〇 7V。 此時VT2的電位將是落在，，0V”與”+Vr”的範圍之内，其中為一個小於正 偏壓VDD之電位。此時’若輸入端之二極體被接成反向（謙咖c〇nnecti〇n) 時，如第3B圖所示，由於二極體不會被導通，此時的VT2電位為與 R1分壓後的結果，因此當分壓電阻被設計成R1>>RpTc時，則VT2之電位 將均近於正偏壓VDD。 此一掃瞄結果如圖10Α的Diode列中所示，而圖10Β係相應圖1〇Α轉 換後的數位表。因此，由圖1〇Β可以明確看出，控制單元1〇所提供之 P-DI0-CHK正偏壓掃瞄訊號之掃瞄結果為”01”（二極體被接成順向）及，，1 〇，， (二極體被接成反向）。 然後，控制單元10會接著提供一個二極體之負偏屋掃瞒訊號 (N_DIO_CHK)，此時，切換單元2〇會執行一個切換動作，以使輸入端與 第4圖中的電路組態連接。因此，當輸入端與第4八圖連接時，則依第3圖 之結果可以得知VT2之電位將接近於負偏壓vss ;而當輸入端與第4B圖 1326361 連接後，則VT2之電位將落在〇v至_Vr之間。此一掃瞄結果，由圖1〇B可 以明確看出’控制單元1〇所提供之N—DI〇_CHK貞偏壓掃猫訊號之掃晦結 果為”01”及”10”。 此時，經過了 P—DIO—CHK與N_DIO_CHK兩個掃瞄訊號之综合的結 果為·當二極體被接成順向時的掃瞄結果為”〇1〇1 ”；當二極體被接成反向時 的掃猫結果為”1010”。很明顯地，圖1〇Β所列之，，0101，，(f〇rwardc〇nnecti〇n) 與”1010’’(reverse connection)為 P一DIO—CHK 與 N_DIO_CHK 兩個掃瞄訊號 結束後之綜合的結果。在此要強調的是，本發明對二極體的量測之所以要 • 使用上述之電路，是因為對使用者而言，很可能在量測時不知道二極體之 極性，因此，本發明在判斷過程中，係將判斷二極體的電路分成：⑻待測 物被接成順向狀態以及(b)若待測物被接成反向狀態。經由上述之過程，很 明顯地’本發明可以忽略待測物是被接成順向或反向，其最後之掃瞄結果 皆可由圖10之數位邏輯判定其為二極體。 此外’圖10A上的P_DIO_CHK與N_DIO_CHK訊號所量測到的VT2 電位的範圍，經過比較器之比較後，比較器的輸出結果將在p_DI〇_CHK 與1^_010_0：1®：訊號結束時被鎖住(latching)，並轉成數位邏輯(digital logic)， 其中圖10B即為圖l〇A轉成數位邏輯的結果。在此要強調，本發明之數位 • 邏輯是内建於控制單元10之中，當债測單元30將待測物之數位邏輯傳送 回控制單元10後，經過查表動作（Look-upTable)後，例如，當數位邏輯 為”0101”或”1010”，則立即可判斷出待測物為二極體。在此要更要強調，查 表動作是在所有掃瞄過程結束以後才會方進行，在此先說查表動作是為說 明掃瞄結果與數位邏輯表的關係。 經由前述之P_DIO_CHK與N_DIO一CHK這兩個掃瞄訊號後，圖i〇B 中的小電容與大電阻之數位邏輯相同，同時大電容與小電阻之數位邏輯也 相同，因此，在目前狀態下，查表只能確定其是不是二極體，而電阻與電 容仍須以下之掃瞄動作來判別。 9 1326361 接著’控制單元10會送出一個電容之量測訊號其中包括一個充電之訊 號（CAP—CHK1)以及一個放電之訊號（CAp_CHK2)。當切換單元20接 收到控制單元10所傳送之CAP_CHK1或CAP__CHK2訊號時，切換單元20 會執行一個切換動作’以使輸入端與第5圖及第6圖中的電路組態連接。 第5圖為一個電容之充電電路組態，當控制單元10所傳送之 CAP—CHK1經過切換單元2〇將輸入端與第5圖連接，此時，端點T2被接 至負電壓VSS，而端點Τ1與偵測單元30中的比較器連接，以偵測輸入端 之電位，另外，端點丁3為浮接（fl〇ating)。而當控制單元1〇所傳送之 CAP_CHK2經過切換單元2〇將輸入端與第6圖連接，此時，端點τι被接 至GND’端黑i T2則與侧單元3〇中的比較器連接，以偵測輸入端之電位， 端點T3為floating。很明顯地，在CAp—CHK1訊號期間，位於輸入端的待 測物藉由rptg及貞電壓vss進行充電（eharge);巾在訊號期 間’位於輸入端的待測物會透過幻朝GND放電（此_也吨e)。 接者，請參考第8圖’係依據本發明第5圖及第6圖的電路組態所顯 示之不同大小的電谷與電阻之電壓及時間變化情形，其中第圖之待測物 為小電容，第8B圖之待測物為大電容，第8C圖之待測物為大電阻，而第 8D圖之待測物為小電阻。在本實施例中，μ之電阻值遠大於。 清參考第8A圖及第8B圖所示，係本發明之電容判斷波形圖，其縱轴 為輸入電壓（V^p)，而橫轴為時間軸，其中第8A圖為一個判斷小電容之 波形示意圖’而第8B圖則為一個判斷大電容之波形示意圖。當輸入端之電 位符合以下兩個基準（eriteria)時，則判定其為電容，即第—：在⑽—c肥 訊號結束之L端之驗的絕對值，H丨駄於陶丨，並且第: CAP_CHK2 訊號開始到—個設定之_ (prc determinedtime) 間内，丨^丨須一直大於丨Vr2|e很明顯地，由第8A圖及第8b圖 論輸入端之制鱗大電錢小電容，皆可符合上述兩個基準。 ' 若當待測物鱗畴’財經由第$圖料S _電馳絲量測待 1326361 測物之電阻值，此時待測物之電阻值將由待測物與Rptc之分壓所決定。因 此，如第8C圖所示，在CAP一CHK1訊號期間，VlNp之電位將迅速達到一 個很接近vss之位準，故能符合”輸入端電位的絕對值|VjNp丨須大於丨Vri丨，， 的第一基準；而當進入CAP_CHK2訊號時，Vxnp也會迅速達到GND之位 準’此時，在一個設定之時間（pre-determined time)之前，IVW便小於|Vr2卜 所以其未能符合，’ CAP_CHK2訊號開始到一個設定之時間（pre_determined time)的這整段期間内之丨V[Np丨須一直大於|Vr2|”的第二基準。另外，由第8d 圖所示，當輸入為小電阻時，在CAP_CHK1訊號結束之前，丨乂聊丨沒有大於 φ 丨Vrl丨’所以未能符合第一基準，而當進入CAP一CHK2訊號時，又迅速 達到GND之位準，所以也未能符合第二基準。所以，當輸入為電阻時，不 能同時符合以上兩個基準。 最後，當完成電容判斷的掃瞄後，控制單元10會再傳送一個開路掃瞄 訊號（OPEN—CHK)，此時切換單元20將輸入端與第7圖連接，其中第7 圖為OPEN—CHK之電路組態，其端點T3被接至一參考電位（Vref)，端點 T1則與偵測單元30中的比較器連接，以偵測輸入端之電位，而端點丁2為 floating’其中，ri為一個大電阻。當輸入端為〇pen時，端點τι之電壓(ντι) 將等於參考電位（Vref)。此外，若當輸入為一個大到超過量測範圍的電阻 時此種情況亦歸類為開路狀態（〇pen circuit)，此時端點τι之電壓（VT1) 也會非㊉接近參考電位（Vref)，因此，可經由第7圖之電路組態中的VT1 與Verf之關係，將開路狀態與電阻判別出來。 經由上述在偵測模式（detect m〇de)中，控制單元1〇會在每一個彳貞測 週期（cycle)中依序產生 p_DI〇 CHK、N—DI〇—CHK、CAP_CHia、 eAP—CHK2、OPEN一CHK等的五個掃瞄訊號後’待這五個掃瞄訊號都結束 後’此時進行一個查表動作，以便將待測物為二極體、電容、電阻或open 分辨出來。此判斷方式如下： 1.先將P一DIO CHK及N_DIO_CHK之掃瞄結果，經由查表先將Diode 挑出來; 2. 若待測物不是Diode時，接著由⑽㈣】與⑽ 結果’再將電容挑出來； — 之知猫 3. 姚職不是DiGde也不是電棒最後由⑽n哪判定是否 輸入端開路’否舰人電阻量測，並藉此判斷制物為電阻。 而上述的-個eyde的掃龜號可以控制在I以内，也就 ，日月之量測裝置可以在5Gms以内自動判斷出待測物之種類，因此可達到快 速且=電的目的。若當偵測模式之判斷結果為〇簡時，即表示輸入端無 ^何待測物’此時控鮮元㈣會反覆進行侧模式的_，也就是一直 處在侧模式’當有待測物被接上輸入端時，將迅速被判斷出來，而後進 入量測模式。在進制赋找，類崎_換電路4g可以餘持在未啟 動⑻WERDOWN)賴式。因此，當沒有輸人都無待測物時，可 一個省電模式。 此外在本實施例中，當偵測模式在進行的同時，短路债測單元7〇 (SHORT DETECTOR)也會同時被啟動，當短路偵測單元7〇侧到輸入 端的電錄W ’敍此時輸人端為低眺，鱗聽侧料％會送訊 號中斷（interrupt)控制單元10，同時讓蜂鳴器8〇 (buzzer)鳴叫，並進 入連續性（continuity)的量測模式。例如，在進行電阻量測時，當短路備 測單元70侧義糾，就會直接·偵繼錢，私制模式，然 後輸出電阻值並經由顯示單元6〇顯示電阻值。 當镇測模式已經判斷出待測物為何種元件時，隨即進入量測模式 (measure mode)，然後將量測之結果顯示於顯示裝置6〇。在此要強調，'本 發明之特徵點係在現有萬用電表之功能中，再加上—個待測物之判斷電路， 並藉由此判斷電路自動判斷出待測物之類別後，例如分辨出二極體、電容、 電阻或open，隨即利用習知之量測電路對待測物進行量測，其中用習知之 量測電路可以是細專利號第4 556 986、4,588 983以及祕你泥上所揭露 1326361 之1測電路，對此本發明並不加以限制。 田偵測模式已經觸it{待嶋為何種元件後，隨即經由—個量測單元， 對待測物進行制，其巾本㈣之量測單域由/數轉換電路4〇、資 50 9〇 (RANGE CONTROL CIRCUIT)所 進入量測模式時’類比/數位轉換電路4G開始將輸入端之類比訊號 ，魏_料__5_絲做，將量測結果輸 ° ㈣路9G則在下—錢人綱赋之前，根據 著偵測與量測it奐之數值來騎要不要切換量獅細旧後—直重複 产程圖“如坌 目係本發明之自動判斷待測物種類之量測裝置的Although the current multimeter has been able to operate simply 'but when it comes to actually detecting a complicated circuit', its health needs to first touch the object as a health category, and then select it via a manual meter. After the __ is properly mobilized, the desired result can be measured by the automatic test function on the multimeter. Such a process will reduce the efficiency and inconvenience of the work, especially when the lion is wrong, or the use of _, does not adjust the Wei option on the multimeter to leave the resistance measurement slot, The battery on the multimeter is exhausted. In view of the electrical performance of the conventional electric meter, there is still room for improvement. Convenience and in the province of battery consumption [Invention] In the context of the above-mentioned invention, in order to solve the above-mentioned multimeter, the convenience of the operation is seven, the money red, _, this (four) provides - health __ The commonly used circuit component types are detected within 50ms. The person who gives the person =#=will be like a duck, the 'mm handles the detection process, and the measuring device is in a non-working state, so the main purpose of the present invention is to provide a self-adhesive system. When Bao Bao solves the miscellaneous work of the above-mentioned trapped meter, the amount of money measured by the woman can be measured. Selective switching to wait for *,:==;::=_species to be tested_measuring type, due to Caishenqi 1^=:= editing axis and measuring object can also be the main target of the invention Providing a measuring device program with an automatic touch object, because:::: detecting: whether there is a test object at the input end and determining whether to enter the test private sequence, the adjusting device of the present invention can be _ Power saving requirements. π目2' The present invention finds a kind of automatic w#__u L i road provides a turn-around view _ correction;, a test line switching action /, = '-like unit connected sharp Wei number of petals _ order The I gamma circuit touches the human terminal connection-side detection unit, and early (and compares the voltage of the input terminal by a comparison circuit and returns it to the control unit in order to make the control unit The comparison result is used to determine that the test month to be tested further has a measuring device that automatically determines the type of the object to be tested, and includes: a unit; a switching shirt that is set by the subtracting circuit, and the control solution element The 贱 贱 复 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转 转The electric test whistle, and the result of the comparison is sent back to the (4) unit, and the Saki control is _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Touch result selection - the corresponding measuring circuit measures the copper material, and the system is shown in a display device 0. A multi-purpose multi-purpose multimeter is also proposed, which is provided with a display device for displaying a plurality of _-type and measurement values, and a ___ device for providing a plurality of switching options. 'Into (4) fixed or mosquito-made system, and a pair of input terminals, its role is to include at least the automatic cleaning mode (SCAN), which can automatically touch the rogue mu Remuneration, and after the completion of the test object, can be easily measured from the mines test line. - The present invention is further proposed - various wisdom Weiduwei million meters of electricity accounting methods include: The sweeping cat program, the system-control single-sequence provides a plurality of broom messages; the switching program is executed, and the switching device is configured by a plurality of 峨 circuit configurations, and the switching action is sequentially performed, and the ribs are sequentially A plurality of occupational electrical states are connected to the object to be tested connected to the input end-execution tt. The program is compared with the voltage of the comparison circuit in the side unit by the comparison of the voltages of the preparations to generate a comparison result; , the control unit determines the meaning of the reward based on the comparison result; When the touch terminal is open, that is, the scan program is executed, otherwise the measurement program is executed, and a corresponding measurement circuit is selected according to the judgment result of the control unit, and the measurement result is displayed. - Display device. [Embodiment] The direction of the invention discussed herein is a device for automatically determining the meaning of the object to be tested, in particular, a measuring device having an automatic judgment surface, in order to thoroughly understand the present invention, In the following bribes, the slap in the touch of the door is called the shouting of the circuit. The ship, the line of the invention is not limited to the special details familiar to the craftsman of the automatic device. In the aspect, the well-known measuring device or measuring step for automatically determining the type of the object to be tested is not described in detail to avoid unnecessary limitation of the present invention. The t-th embodiment of the present invention will be described in detail as τ, however In addition to this scale description, the present invention can also be widely used in its material, and the present invention is based on the scope of the present invention. &凊Refer to Fig. 1 ' is the circuit function of the measuring device for automatically determining the type of the object to be tested according to the present invention, including the control unit (CONTROLLER) 1Q, the switching unit (Su (5) 20, the detection list 7G (TYPE DETECTOR) 3G, tt/digital conversion circuit (M CC) NVERTER) 4〇, data processing circuit (dataprocessing (10) (10) plus, display device (7) ancestral milk 6 〇, short shut-off unit (SHORT DETECT 〇 R), 7 〇, buzzer RANGE CONTROL CIRCUIT 90 e 'First' As shown in Fig. 1, the device for automatically determining the type of the object to be tested of the present invention is provided with a plurality of sweeps in sequence. Bribes; then transfer the plurals to the switch order 兀20 women's unit 2G age _ control solution (1) 峨 之 扫 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 132 The circuit is connected to the input terminal; for example, when the control unit ίο raises the H pole reading _, it will first provide a two-fiber positive bias sweeping cat signal (P_DI〇_CHK), and then provide two The negative body bias voltage sweeping cat signal (N DIO CHK) is received by the switching unit 20 after receiving the control unit 1 In the case of the p-DI〇-CHK signal, the switching unit 20 performs a switching action to connect the input to the circuit configuration in FIG. At this time, the end point T2 in the circuit configuration is connected to the positive bias voltage vdD, for example: vdd^sv, and the end point T3 is connected to the ground point (GND) 'at the same time, the end point T2 can also be connected to the detecting unit 3 A comparator (not shown) is connected to detect the potential of the input terminal, wherein R1 is a large resistor, RpTC is a voltage dividing resistor, and R1»RPTC, in a preferred embodiment, The sink is a thermistor that can be used to protect the circuit. When the input is connected to Figure 3A, at this time, if the input terminal 'connects a forward connection diode, as shown in Figure 3A, the potential of the terminal T2 (ie VT2) will be clamped ( Damping) The on-potential at the diode, for example: VT2 = 〇7V. At this time, the potential of VT2 will fall within the range of 0V" and "+Vr", where is a potential less than the positive bias VDD. At this time, if the input terminal is connected in reverse ( When Qianba c〇nnecti〇n), as shown in Fig. 3B, since the diode is not turned on, the VT2 potential at this time is the result of dividing with R1, so when the voltage dividing resistor is designed as R1>>RpTc, then the potential of VT2 will be close to the positive bias VDD. This scan result is shown in the Diode column of Figure 10, and Figure 10 is the corresponding digital table after the conversion of Figure 1. Therefore, It can be clearly seen from Fig. 1 that the scan result of the P-DI0-CHK positive bias scan signal provided by the control unit 1 is "01" (the diode is connected in the forward direction) and, 1 〇 , (the diode is connected in reverse). Then, the control unit 10 will then provide a diode negative negative sweep signal (N_DIO_CHK), at this time, the switching unit 2 执行 will perform a switching action, Make the input connection to the circuit configuration in Figure 4. Therefore, when the input is connected to Figure 4, the VT2 power can be known from the result of Figure 3. It will be close to the negative bias vss; and when the input is connected to the 4B Figure 1323661, the potential of VT2 will fall between 〇v and _Vr. This scan result can be clearly seen from Figure 1〇B. The result of the sweep of the N-DI〇_CHK贞 bias sweeping cat signal provided by the control unit 1 is “01” and “10”. At this time, two scanning signals of P-DIO-CHK and N_DIO_CHK have passed. The combined result is that the scan result when the diode is connected in the forward direction is "〇1〇1"; when the diode is connected in the reverse direction, the result of the sweeping cat is "1010". Obviously, As shown in FIG. 1A, 0101, (f〇rwardc〇nnecti〇n) and "1010" (reverse connection) are the combined results of the P-DIO-CHK and N_DIO_CHK scan signals. It should be emphasized here that the measurement of the diode of the present invention is necessary to use the above circuit because it is very likely that the polarity of the diode is not known to the user during measurement. In the judging process, the circuit for judging the diode is divided into: (8) the object to be tested is connected to the forward state and (b) if the object to be tested is connected to the reverse state. Through the above process, it is apparent that the present invention can neglect that the object to be tested is connected in the forward or reverse direction, and the final scan result can be determined by the digital logic of Fig. 10 as a diode. In addition, the range of the VT2 potential measured by the P_DIO_CHK and N_DIO_CHK signals on Figure 10A, after comparison by the comparator, the output of the comparator will be at the end of the p_DI〇_CHK and 1^_010_0:1®: signals. It is latched and converted into digital logic, where Figure 10B is the result of converting Figure 〇A into digital logic. It should be emphasized here that the digital logic of the present invention is built in the control unit 10, and after the debt measurement unit 30 transmits the digital logic of the object to be tested back to the control unit 10, after the lookup operation (Look-upTable) For example, when the digit logic is "0101" or "1010", it is immediately determined that the object to be tested is a diode. It should be emphasized here that the look-up action is performed after all the scanning processes have ended. Here, the table-checking action is to explain the relationship between the scan result and the digital logic table. After the two scanning signals of P_DIO_CHK and N_DIO-CHK described above, the small capacitance in the figure i〇B is the same as the digital logic of the large resistance, and the digital logic of the large capacitance and the small resistance is also the same, so in the current state The look-up table can only determine whether it is a diode or not, and the resistance and capacitance still need to be determined by the following scanning action. 9 1326361 Next, the control unit 10 sends a capacitance measurement signal including a charging signal (CAP-CHK1) and a discharging signal (CAp_CHK2). When the switching unit 20 receives the CAP_CHK1 or CAP__CHK2 signal transmitted by the control unit 10, the switching unit 20 performs a switching action ' to make the input terminal connected to the circuit configurations in Figs. 5 and 6. Figure 5 is a charging circuit configuration of a capacitor. When the CAP-CHK1 transmitted by the control unit 10 passes through the switching unit 2, the input terminal is connected to the fifth figure. At this time, the terminal T2 is connected to the negative voltage VSS. The endpoint Τ1 is connected to the comparator in the detecting unit 30 to detect the potential of the input terminal, and in addition, the endpoint 3 is floated. When the control unit 1〇 transmits the CAP_CHK2 through the switching unit 2〇, the input terminal is connected to the sixth figure. At this time, the end point τι is connected to the GND' terminal black i T2 and is connected with the comparator in the side unit 3〇. To detect the potential at the input, the endpoint T3 is floating. Obviously, during the CAp-CHK1 signal, the object under test at the input end is charged by rptg and 贞 voltage vss; during the signal period, the object to be tested at the input end will discharge through the phantom GND (this _ Also tons e). Please refer to Figure 8 for the voltage and time changes of the electric grid and resistor of different sizes according to the circuit configuration of Figures 5 and 6 of the present invention, wherein the object to be tested is small. Capacitance, the object to be tested in Fig. 8B is a large capacitance, the object to be tested in Fig. 8C is a large resistance, and the object to be tested in Fig. 8D is a small resistance. In this embodiment, the resistance value of μ is much larger than that. Referring to FIGS. 8A and 8B, the capacitance judgment waveform diagram of the present invention has a vertical axis of an input voltage (V^p) and a horizontal axis of a time axis, wherein FIG. 8A is a judgment small capacitor. The waveform diagram 'and the 8B diagram is a waveform diagram for judging the large capacitance. When the potential of the input terminal meets the following two eriteria, it is judged to be the capacitance, that is, the absolute value of the test at the L end of the end of the (10)-c fat signal, H is in the pottery, and the : CAP_CHK2 signal starts to - _ (prc determinedtime), 丨^丨 must always be greater than 丨Vr2|e Obviously, the scaled large money small capacitor from the input of the 8A and 8b graphs , can meet the above two benchmarks. If the resistance of the object to be tested is measured by the S_ _ electric wire, the resistance value of the object to be tested will be determined by the partial pressure of the object to be tested and Rptc. Therefore, as shown in Fig. 8C, during the CAP-CHK1 signal, the potential of VlNp will quickly reach a level close to vss, so it can meet the "absolute value of the input potential |VjNp must be greater than 丨Vri丨, The first reference; when entering the CAP_CHK2 signal, Vxnp will quickly reach the level of GND'. At this time, before a pre-determined time, IVW is less than |Vr2, so it fails to match. ' The CAP_CHK2 signal starts at a set time (pre_determined time) during the entire period of time 丨V[Np丨 must always be greater than |Vr2|". In addition, as shown in Fig. 8d, when the input is a small resistance, before the end of the CAP_CHK1 signal, the chatter is not larger than φ 丨Vrl丨', so the first reference is not met, and when the CAP-CHK2 signal is entered, It quickly reached the level of GND, so it failed to meet the second benchmark. Therefore, when the input is a resistor, the above two benchmarks cannot be met at the same time. Finally, after the scan of the capacitance judgment is completed, the control unit 10 transmits an open scan signal (OPEN_CHK), and the switching unit 20 connects the input end to the seventh picture, wherein the seventh picture is OPEN-CHK. In the circuit configuration, the terminal T3 is connected to a reference potential (Vref), and the terminal T1 is connected to the comparator in the detecting unit 30 to detect the potential of the input terminal, and the endpoint 2 is floating' Among them, ri is a large resistance. When the input is 〇pen, the voltage at the terminal τι (ντι) will be equal to the reference potential (Vref). In addition, if the input is a resistor that is large enough to exceed the measurement range, this condition is also classified as an open circuit state. At this time, the voltage of the terminal τ1 (VT1) is also not close to the reference potential (Vref). Therefore, the open state and the resistance can be discriminated by the relationship between VT1 and Verf in the circuit configuration of FIG. Through the above detection mode (detect m〇de), the control unit 1 will sequentially generate p_DI〇CHK, N-DI〇-CHK, CAP_CHia, eAP-CHK2 in each detection cycle. After the five scan signals of OPEN-CHK, etc., after the five scan signals are finished, a look-up operation is performed to distinguish the object to be tested as a diode, a capacitor, a resistor or an open. The judgment method is as follows: 1. Firstly, the scan results of P-DIO CHK and N_DIO_CHK are first picked out by the look-up table; 2. If the object to be tested is not a Diode, then (10) (four)] and (10) result 're-capacitance Pick out; — Zhichi 3. 3. Yao is not DiGde or electric bar. Finally, (10)n decides whether the input is open or not, and the shipman resistance is measured, and the material is judged as resistance. The above-mentioned eyde's sweeping turtle number can be controlled within I. In other words, the measuring device of the sun and the moon can automatically determine the type of the object to be tested within 5 Gms, so that the purpose of fast and = electric can be achieved. If the judgment result of the detection mode is 〇 ,, it means that there is no input object at the input end. At this time, the control element (4) will repeatedly perform the side mode _, that is, it is always in the side mode. When the object is connected to the input, it will be quickly judged and then enter the measurement mode. In the hexadecimal assignment, the class _ _ change circuit 4g can remain in the unstarted (8) WERDOWN) Lai. Therefore, when there is no input, there is no object to be tested, and a power saving mode is available. In addition, in this embodiment, when the detection mode is being performed, the short-circuit debt detecting unit 7 (SHORT DETECTOR) is also activated at the same time, when the short-circuit detecting unit 7 is turned to the input terminal, the electric record W ' The input end is low, and the slanting side material sends a signal interrupt control unit 10, and the buzzer sounds buzzer and enters the continuity measurement mode. For example, when the resistance measurement is performed, when the short-circuit preparation unit 70 side corrects, the money is directly detected, the private mode is output, and then the resistance value is output and the resistance value is displayed via the display unit 6〇. When the town measurement mode has judged which component the object to be tested is, it enters the measurement mode, and then displays the result of the measurement on the display device 6〇. It should be emphasized here that 'the feature point of the present invention is in the function of the existing multimeter, plus a judgment circuit of the object to be tested, and by which the judgment circuit automatically judges the category of the object to be tested, For example, the diode, capacitor, resistor or open is distinguished, and the measuring object is measured by a conventional measuring circuit. The conventional measuring circuit can be fine patent number 4 556 986, 4, 588 983 and secret mud. The measurement circuit of 1326361 is disclosed above, and the present invention is not limited thereto. After the field detection mode has touched it, it will be processed by the measuring unit, and the measurement object will be processed. The measurement of the towel (4) will be measured by the single-digit conversion circuit 4〇, capital 50 9〇 (RANGE CONTROL CIRCUIT) When entering the measurement mode, 'analog/digital conversion circuit 4G starts to analog signal with input, Wei _ material __5_ silk, and the measurement result is lost. (4) Road 9G is under - Qian Rengang Before the assignment, according to the value of the detection and measurement it奂, do you want to switch the lion to the old one------ repeat the production process diagram.
箱Γ Γ示’在進行量測之前，會先進入债測模式，以判別待 種類。此時控制單元1Q依序產生P—⑽咖、N D CAP CHK 卜 CAP—CHK2、OPEN「敗堃 / 一 — 至娜，然後切換單元20根據這蝴訊如掃贼序⑽ 電路組離、至於入迪，妙S丄 '一換程序’以切換不同的 此程序係比較不同的電馳態==中的比較器來執行一比較程序， 偵測單元3Q將制物之數位 序，此判斷程序是依序執行二極體之判斷 斷判斷程 判斷_，當開路之判斷結果 ^之靖_、或開路之 此外，本發明之會祐心， 則判斷待測物為一電阻。 極體、電容、電阻或。pen。若在時’其判斷的順序依序為：二 若判斷_為_時，則測模式。 偵測。同樣的，在本發明之量測方^果式’而繼續執行了一個週期的 執行-短路偵測程序_，當短路偵測程序其 =執行切換程序時，也可同時 接進行電阻_4職料敬結 _^_絲紐路時’即直 序可以判斷出待測物為大電容/大電阻^ U不裝置60。此外，因判斷程 大電阻或小電容/小電阻，因此可以自動選擇 13 1326361 適當之量測範圍進行量測，因此可達到快速且省電的目的。 接著請繼續參考第9 s ’係本發明之智慧型多功能萬用電表之外觀示 意圖。如第9 ®所示’本發明之具有自動掃猫功能之萬用電表操作說明如 下’萬用電表1設有顯示裝置2，可顯示目前的所屬量測功能及其量測數值， 其中SCAN 目祕於自轉岭慧觸赋，而ΑυΐΌ代表目前處於 一般自動職量順式’至於MANU職表目前處於—般手細定標位量 測，式；電表1並配置有—個切換_ 3用來切換主動信號，例如電 壓量測模Α3Α或是被動元件(例如電阻/電容/二極體/開短路)之量測模式犯， 或是-個電流量測模式3C ;另外萬用電表丨上還配置有複數個附加功能鍵 4，包括量測模式功能鍵（SEL)、特定量繼值功能鍵（range)及頻率 量測功能鍵（VAHz);此外萬用電表丨並設有一對輸入端子5，其上可進一 步配置有測試探針難或轉(未顯示糊巾），其巾量賴式魏鍵(虹） 亦可作為關閉開關，檔使用者按住SEL鍵達2秒以上時，則會將電表關閉。 本發明之具有自動掃猫功能之萬用電表丨所具有的複數個量測模式中， 至少包括-個内定之自動掃晦判斷模式（SCAN)，其可隨時自動判斷輸入 端是否有制物並且可以自動觸皱輸人端子5連接之待測物之類別， 胁完成侧物之_峨後，可輯擇⑽自峨制物進行數值量測， 其詳細之電路及判斷過程已於前述中說明，在此不再贅述。接下來將說明 萬用電表1的其他操作功能。 當萬用電表1切換至主動信號量測模式3A下時，也就是進行電壓⑺ 或電碌)之1測权式’冑用電表i可自動掃瞎判斷輸入信號特性並自動切 換至交流(AC)或直流(DC)量測模式，量測過程並可保持輸入阻抗為ι〇·， 以保持量測過㈣安全性。料，在絲信號量賴式下，其也可使用附 加功能鍵4中的SEL鍵’則可由内定之自動掃_量測模式(SCA_換至自 動跳槽量繼雄ΙΙΊΌ)α自動妨交流制或錢制赋。#切換至交 直流模式後可_附加魏鍵讀证再切換至手_錢位量測模式 1326361 例如’當—個直流電壓上有小的交流電壓時，若我們選擇在自動 掃瞒里測模式(SCAN)或是自動跳檔量測模式(AUT〇)下進行量測時，很明顯 地萬用電表i會在顯不裝置2上顯示直流電壓的讀值。若想要量測的是 直流電壓上的小父流電壓訊號時，則可由附加功能鍵4中的sel鍵直接選 擇乂:量測模式(AC)，此時，萬用電表i就會將小的交流電壓訊號的讀值 在顯不裝置2上顯不。此外，在主動量測模式下可用vaHz的附加功能鍵 選擇切換成頻率量測模式。 當萬用電表1切換至被動元件量測模式犯下，萬用電表i會在内定之 •自動掃猫判斷模式（SCAN)下’自動掃晦判斷輸入元件特性，自動選擇進 入電阻/電合/一極體/連續性量測模式，以節省操控動作與時間。當然，在被 動轉量測模式下’也可使用附加功能鍵SEL，將萬用電表丨由内定之自 動掃晦量測模式(SCAN)依序切換至一般電阻、電容、二極體或連續性量測 模式。同樣的’也可以用附加功能鍵range再切換至手動固定標位量測 模式(MANU)。 在此要強調的是，本發明之萬用電表丨在操作時，即内定進入自動掃 瞄量測模式(SCAN)，用以自動判斷待測物之種類，因此不需要待測物之選 擇開關；而切換開關3及附加功能鍵4㈣由使用者以手動選擇，其僅能 選擇對特定魏進行職’因此私影響萬用電表丨之自動掃關斷功能 =達成。此外，本發明之細電表i還可靖加上具有讀值齡保持(h〇ld)、 最大最小讀值(MAX/ΜΙΝ)運算或背光啟動(bLT)等功能鍵，但也可完全取消 $些功能鍵讓量㈣電表丨盡量操作簡單化，只訪—婦關做為主動 信號量測或被動元件量測切換即可，如第9圖所示。 顯然地’依照上面實施例中的描述，本發明可能有許多的修正與差異。 因此需要在其附加的權利要求項之範_加以理解，除了上述詳細的描述 外，本發明還可以廣泛地在其他的實施射施行。上频為本發明之較佳 實施例而已，並非用以限定本發明之申請專利範圍；凡其它未脫離本發明 15 1326361 述申請專利範圍 所揭示之精神下所完成的等效改變或修飾，均應包含在下 内 【圖式簡單說明】 第1圖係本發明之電路的功能方塊示意圖； 第2圖係本發明之偵測與量測的流程示意圖； 圖 第3A圖至第3B ffi係、本發明判斷二極體之正偏壓電路組態之示意 圖 第仏圖至第姐圖係本發明判斷二極體之負偏壓電路組態 之示意 第5圖係本發明之判斷電容器之充電電路組態之示意圖； 第6圖係本發明之判斷電容器之放電電路組態之示意圖； 第7圖係本發明之判斷開路電性電路組態之示意圖； 第8A圖至第8D目係本發明之判斷電容器及電阻之波形示意圖； 第9圖係本發明之具有自動判斷待測物種類之量測裝置； 圖10A及圖i〇B係本發明之不同待測物分別在輸入端的電壓值區間 以及其相應之數位判斷表。 【主要元件符號說明】 1萬用電表 2顯示裝置 3切換開關 3A 主動訊號量測模式 3B 3C 4 5 被動訊號量測模式 關機模式 附加功能鍵 輸入端子 1326361Box Γ ’ 'Before taking the measurement, the debt test mode will be entered first to determine the type of the pending. At this time, the control unit 1Q sequentially generates P-(10) coffee, ND CAP CHK CAP-CHK2, OPEN "defect/one-to-na", and then the switching unit 20 according to this flash, such as the thief sequence (10) circuit group away, as far as Di, Miao S丄 'one change program' to switch different programs, compare the different comparators in the electric state == to execute a comparison program, the detection unit 3Q will order the digits of the workpiece, this judgment program is The judgment of the judgment of the diode is performed in sequence, and when the judgment result of the open circuit is _, or the open circuit is further, the object of the present invention is judged to be a resistance. The polar body, the capacitor, Resistor or .pen. If at the time of 'the order of its judgment is: two if the judgment _ is _, then the mode is tested. Detect. Similarly, in the measurement method of the present invention' and continue to execute One cycle of execution-short-circuit detection procedure_, when the short-circuit detection program=executes the switching procedure, it can also be connected to the resistor _4 job material _^_丝纽路', that is, the direct sequence can be judged The measured object is a large capacitor / a large resistor ^ U is not installed 60. In addition, because of the judgment of the large resistance or small electric Capacitance / small resistance, so you can automatically select 13 1326361 appropriate measurement range for measurement, so you can achieve fast and power-saving purposes. Continue to refer to the 9th s 'the smart multi-function multimeter of the present invention Schematic diagram of the appearance. As shown in the 9th ®, the operation description of the universal electric meter with automatic sweeping function of the present invention is as follows. The universal electric meter 1 is provided with a display device 2, which can display the current measurement function and its quantity. The measured value, in which SCAN is secretive in the rotation of Ling Hui touch, and the representative is currently in the general automatic position cis 'as for the MANU job is currently in the hands of the fine calibration, the type; the meter 1 is configured with - Switch _ 3 is used to switch active signals, such as voltage measurement mode Α 3 Α or passive components (such as resistor / capacitor / diode / open short circuit) measurement mode, or - a current measurement mode 3C; The multimeter is also equipped with a plurality of additional function keys 4, including a measurement mode function key (SEL), a specific amount of a function key (range), and a frequency measurement function key (VAHz);丨 and has a pair of input terminals 5, The test probe can be further configured to be difficult or to turn (not showing the paste towel), and the towel amount of the Wei Wei (Xin) can also be used as a close switch. When the user presses the SEL button for more than 2 seconds, the user will The electric meter is turned off. The plurality of measurement modes of the universal electric meter having the automatic sweeping function include at least one default automatic broom judgment mode (SCAN), which can automatically determine whether the input end is available at any time. There is a product and can automatically wrinkle the type of the object to be tested connected to the terminal 5, and after the threat is completed, the value can be selected (10) for the measurement of the self-tanning material. The detailed circuit and the judgment process have been The foregoing description will not be repeated here. Next, other operational functions of the multimeter 1 will be explained. When the multimeter 1 is switched to the active signal measurement mode 3A, that is, the voltage (7) or the electric power is measured. The meter i can automatically detect the input signal characteristics and automatically switch to the AC. (AC) or direct current (DC) measurement mode, the measurement process can maintain the input impedance to ι〇· to maintain the measured (four) safety. In the wire sizing, it can also use the SEL button in the additional function key 4, then the default automatic sweep _ measurement mode (SCA_ switch to automatic job hopping capacity) α automatic communication system Or money making. #Switch to AC/DC mode. _Add Wei key to read and then switch to hand _ money measurement mode 1326361 For example, 'When there is a small AC voltage on DC voltage, if we choose to test mode in automatic broom ( When measuring in SCAN) or in the automatic skip measurement mode (AUT〇), it is obvious that the multimeter i will display the reading of the DC voltage on the display device 2. If you want to measure the small parent voltage signal on the DC voltage, you can directly select the measurement mode (AC) by the sel key in the additional function key 4. At this time, the multimeter i will The reading of the small AC voltage signal is not displayed on the display device 2. In addition, in the active measurement mode, the additional function key of vaHz can be used to switch to the frequency measurement mode. When the multimeter 1 is switched to the passive component measurement mode, the multimeter i will be in the default. • Auto-sweep judgment mode (SCAN), the 'automatic broom judges the input component characteristics, and automatically selects the resistance/electricity. Combined / one pole / continuous measurement mode to save control action and time. Of course, in the passive transfer measurement mode, the additional function key SEL can also be used to sequentially switch the multimeter from the default automatic sweep measurement mode (SCAN) to general resistance, capacitance, diode or continuous. Sex measurement mode. The same 'can also be switched to the manual fixed position measurement mode (MANU) with the additional function key range. It should be emphasized here that the universal meter of the present invention is automatically set to enter the automatic scanning measurement mode (SCAN) during operation to automatically determine the type of the object to be tested, so that the selection of the object to be tested is not required. The switch 3 and the additional function key 4 (4) are manually selected by the user, and can only be selected for the specific Wei's job. Therefore, the automatic sweeping and shutting down function of the universal meter is achieved. In addition, the fine meter i of the present invention can also add function keys such as read value retention (h〇ld), maximum and minimum read value (MAX/ΜΙΝ) operation or backlight start (bLT), but can also completely cancel $ These function keys allow the quantity (4) meter to be as simple as possible to operate, and only visit - women's off as active signal measurement or passive component measurement switching, as shown in Figure 9. Obviously, the present invention may have many modifications and differences in accordance with the description in the above embodiments. Therefore, it is to be understood that the scope of the appended claims is intended to be The upper frequency is a preferred embodiment of the present invention, and is not intended to limit the scope of the invention as defined by the present invention; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a functional block diagram of the circuit of the present invention; FIG. 2 is a schematic flow chart of the detection and measurement of the present invention; FIG. 3A to FIG. 3B ffi, this BRIEF DESCRIPTION OF THE DRAWINGS FIG. 5 is a schematic diagram showing the configuration of a positive bias circuit of a diode. FIG. 5 is a schematic diagram of a configuration of a negative bias circuit for determining a diode of the present invention. FIG. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 6 is a schematic diagram showing the configuration of a discharge circuit of the judgment capacitor of the present invention; FIG. 7 is a schematic diagram of the configuration of the open circuit electrical circuit of the present invention; FIGS. 8A to 8D are the present invention. The waveform diagram of the capacitor and the resistor is judged; FIG. 9 is a measuring device with the type of the object to be tested automatically; FIG. 10A and FIG. 2B are the voltage values of the different objects to be tested at the input end of the present invention. The interval and its corresponding digit judgment table. [Main component symbol description] 1 million meter 2 display device 3 switch 3A active signal measurement mode 3B 3C 4 5 passive signal measurement mode shutdown mode additional function key input terminal 1326361
10 控制單元 20 切換單元 30 偵測單元 40 類比/數位轉換電路 50 資料處理電路 60 顯示裝置 70 短路偵測單元 80 蜂鳴器 90 電阻/電容量測電路 VDD 正電壓 VSS 負電壓10 Control unit 20 Switching unit 30 Detection unit 40 Analog/digital conversion circuit 50 Data processing circuit 60 Display device 70 Short-circuit detection unit 80 Buzzer 90 Resistance/capacitance measurement circuit VDD Positive voltage VSS Negative voltage
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