TWI323275B - Adhesive composition and adhesive sheet for semiconductor device - Google Patents

Adhesive composition and adhesive sheet for semiconductor device Download PDF

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Publication number
TWI323275B
TWI323275B TW095103025A TW95103025A TWI323275B TW I323275 B TWI323275 B TW I323275B TW 095103025 A TW095103025 A TW 095103025A TW 95103025 A TW95103025 A TW 95103025A TW I323275 B TWI323275 B TW I323275B
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Taiwan
Prior art keywords
adhesive
component
semiconductor device
adhesive composition
mass
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TW095103025A
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Chinese (zh)
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TW200636888A (en
Inventor
Masaharu Kobayashi
Kazuhiro Takayanagi
Yasuhiro Yoshii
Yousuke Momouchi
Tomoaki Kamiya
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Tomoegawa Paper Co Ltd
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Priority claimed from JP2005029858A external-priority patent/JP4691365B2/en
Priority claimed from JP2005181711A external-priority patent/JP4691401B2/en
Application filed by Tomoegawa Paper Co Ltd filed Critical Tomoegawa Paper Co Ltd
Publication of TW200636888A publication Critical patent/TW200636888A/en
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Publication of TWI323275B publication Critical patent/TWI323275B/en

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    • AHUMAN NECESSITIES
    • A47FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
    • A47GHOUSEHOLD OR TABLE EQUIPMENT
    • A47G9/00Bed-covers; Counterpanes; Travelling rugs; Sleeping rugs; Sleeping bags; Pillows
    • A47G9/10Pillows
    • A47G9/1081Pillows comprising a neck support, e.g. a neck roll

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Otolaryngology (AREA)
  • Pulmonology (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Die Bonding (AREA)

Description

• 九、發明說明: ,【發明所屬之技術領域j · 、裝=為著7::導:裝置用黏著劑組成物及半導 乃適用於各種使用半導體之半導沪护詈 本毛明特別為關於一種適於具有s IC ^ .電路所構成之忙用基板上積層IC晶片構造之;導= 置、表面裝配固定型半導體裝置、增層(build,)基板等之 n 片中,作為與1c日日片黏著、或與放熱 ^者3 〃、ic用基板更高密度積層之用,具體言之即 ic晶片與電路基板、電路基板更高密度積層之絕緣層間、 形成電路之FPc(flexible printed circuit ;柔性印刷電路 •板)間、FPC與電路基板、電路基板與保護膜、π晶片與 .放,板、放熱板與電路基板等之黏著用之黏著劑組成物及 黏著片。 【先前技術】 ··目前行動電話、筆記型pc等電子機器隨其小型.輕 量化、高速.高機能化之趨勢,其IC晶片亦趨於高密集二· 高速化,其組裝技術亦由QFp(Quad nat卩扣“以,即將導 線設置於封褒4邊之型),發展至BGA (BaU⑽八叫)、 CSP(Chip Scale package)、Mcp(Multi CMp package)等新的 組裝形態。 因此,隨著即使在搭載IC晶片等半導體方面之基板, 其中之導線框亦須調整為可形成磁帶電路基板、印刷電路 基板之微細化·尚密度化構造。此功能特別在配線積層方 317818 5 1323275 . 式之增層基板方面更為重要。 - 此等基板一般在支撐體上設置配線及與該配線電性絕 '緣之絕緣層。該絕緣層重要的是須保註其電絕緣性,但亦 須要其他各種特性。 般用以製造基板之製造方法中,其方法為將表 -面上形成配線電路之支撐體,及具有主成分為未硬化黏著 劑之黏著劑層的黏著片,與配線及黏著劑層貼合,使黏著 劑層埋没於配線之間,再經加熱等使該黏著劑層硬化。其 籲硬化之黏著劑層具有絕緣層之功能。此時如在黏著劑層 中發泡或在配線間殘留空隙時,其絕緣性將變差,因此^ 著劑層在埋設於配線時須要求具有不發泡或在配線間不產 ‘,空隙之埋設於配線間之埋設特性。且此埋設特性重要的 疋配線為微細化.高密度化之程度。 可用於如上述之黏著劑層中之黏著劑,一般如聚醯亞 胺樹脂、環氧樹脂、驗樹脂、苯乙婦_丁二烯樹脂_苯乙稀 段共聚物等含二烯之共聚物(二稀系樹月旨)等熱硬化性樹 脂。 黏著劑方面又須要具備耐熱性、耐熱溫度循環性、對 應於應力變化之應力鬆弛性(stress relaxati〇n)等。 例如在ic封裝中,於其作用時由於IC的發熱而達到 100C以上之溫度。亦1C封裝係曝於室溫至高溫(1〇〇t>c以 上)之溫度變化中。因此在IC封裝中,須要求其對高溫之 耐熱性,對應溫度變化之耐熱溫度循環性。 另方面,在金屬等配線、形成該配線之支樓體、絕 317818• Nine, invention description: , [Technical field of invention belongs to j · , Pack = 7:: Guide: Adhesive composition and semi-conductor for the device are applicable to various semi-conductive semiconductors used in semiconductors. For n-pieces of a laminated IC wafer suitable for a busy substrate having a s IC ^ circuit, a substrate, a surface mount fixed semiconductor device, a build-up substrate, etc. On the 1c day, the film is adhered to or higher than the heat-dissipating 3 〃, ic substrate, in particular, the ic chip and the circuit substrate, the circuit board, the higher density layer of the insulating layer, the circuit forming FPC (flexible Adhesive composition and adhesive sheet for adhesion between printed circuit and board, FPC and circuit board, circuit board and protective film, π wafer and board, board, heat sink and circuit board. [Prior Art] · At present, electronic devices such as mobile phones and notebook PCs are becoming smaller, lighter, faster, and more highly functional. Their IC chips tend to be high-density and high-speed. The assembly technology is also based on QFp. (Quad nat buckles, in order to set the wire on the side of the seal 4), and developed into a new assembly form such as BGA (BaU (10) eight), CSP (Chip Scale package), McP (Multi CMp package). Even in the case of a substrate on which a semiconductor such as an IC chip is mounted, the lead frame must be adjusted to form a tape circuit substrate or a printed circuit board having a finer and more dense structure. This function is particularly applicable to the wiring layer 317818 5 1323275 . It is more important to add layers to the substrate. - These substrates are generally provided with wiring on the support and an insulating layer that is electrically connected to the wiring. The insulation layer is important to be electrically insulated, but Various other characteristics are required. In the manufacturing method for manufacturing a substrate, the method is a support for forming a wiring circuit on the surface of the surface, and an adhesive sheet having an adhesive layer having a main component of an uncured adhesive. Bonding to the wiring and the adhesive layer, the adhesive layer is buried between the wirings, and the adhesive layer is hardened by heating, etc. The adhesive layer of the hardened layer has the function of an insulating layer. In the case of medium foaming or voids remaining in the wiring, the insulation property is deteriorated. Therefore, when the wiring layer is buried in the wiring, it is required to have no foaming or no production in the wiring, and the voids are buried in the wiring compartment. The characteristics of the 疋 wiring, which is important in the embedding characteristics, are micronized and high in density. It can be used as an adhesive in the above adhesive layer, such as polyimide resin, epoxy resin, resin, benzene. A thermosetting resin such as a diene-containing copolymer such as a butadiene resin or a styrene-containing copolymer, which has a heat resistance and a heat-resistant temperature cycle, and which corresponds to For example, in the ic package, the temperature of the IC is higher than 100C due to the heat generated by the IC during the ic package. The 1C package is exposed to room temperature to high temperature (1〇〇t&gt ; c or more) temperature change Accordingly in the IC package, which is required to be of high-temperature heat resistance, heat corresponding to the temperature cycle of temperature changes. On the other hand, the metal or the like wiring, the wiring formed building body of the support, must 317818

A 6 1 f 緣層荨熱膨脹率 或nMt 會因相黏合,在上述之高溫下 尺皿度鏈化時,因1数 化,相斜从/sa …膨脹革的不同而所產生應力的變 科應力㈣性。制是近年來因㈣之密度 所占之比例大增,其應力: 此外,在積層配線之增層基板時,由於同時設A 6 1 f edge layer 荨 thermal expansion rate or nMt will be due to phase bonding. When the above-mentioned high temperature is chained, the stress caused by the difference of /sa ... expansion leather is different. Stress (four). In recent years, the proportion of density due to (4) has increased greatly, and its stress: In addition, when stacking substrates with laminated wiring,

層之絕緣層,輕㈣㈣化之加熱讀係依㈣片數分 而進饤,此時亦須要求其耐熱性。 因此’如上述之以往黏著劑並無法充分滿足該等特性。 具體言之,此等黏著劑層在流動性不佳,例如將黏著 劑層埋設在配置高密度配線中時,即有明顯的氣泡混入之 情況發生。因此須提高其流動性,且降低黏著劑層之黏度, 但在上述之貼合時,又會造成黏著劑層滲出過多,使1 工性變差等之問題。 ”σ 另一方面,在製成1C晶片等之半導體裴置後,經由在 Φ鲁室溫至高溫(10 0 °c以上)之溫度的反覆變化下所產生之應 力,在絕緣層與1C晶片間,或在該基板之内部會引起源自 於絕緣層之層間剝離或基板翹曲。該等問題在積層複數声 之配線及絕緣層之增層基板等積層基板中尤為顯著。層間 剝離及基板翹曲會減低半導體裝置之電氣穩定性,因此須 要加以改善。 同時’在上述多層型高密度組裝方法中,其基板為達 到薄型目的’即常有使用絕緣膜上隔著黏著劑層再積層銅 箔等金屬層之 TAB(Tape Automated Bonding ;帶自動 7 317818 1323275 ’ _ ) 土板木丨生基板(FPC)等之情形,其中之絕緣膜常用聚 _醯亞胺樹脂等樹脂膜。 但直至目前為止,此等黏著劑會有對此等絕緣膜及金 屬層之黏接力不足,以及在之後之溫度變化等亦易使其黏 接力降低等問題存在。尤其是對聚酿亞胺膜極不易黏接。 —在該黏接力中,支撐體界面之狀態有極大影響,之外, 黏著劑之吸濕性等亦有影響,例如在吸濕性越低時越會傾 向於抑制黏接力之變化,因此須要有低吸濕性之黏著劑。 ❿近年來又因避免用鉛,因而提高IR迴桿(祕㈣㈣ ⑽⑽)溫度。因此,含於黏著劑層中之水分在迴焊時氣The insulating layer of the layer, the light (4) (four) heating reading system depends on the number of (4) sheets, and the heat resistance is required at this time. Therefore, the conventional adhesives as described above do not sufficiently satisfy these characteristics. Specifically, when the adhesive layer is poor in fluidity, for example, when the adhesive layer is buried in the high-density wiring, significant air bubbles are mixed. Therefore, it is necessary to increase the fluidity and lower the viscosity of the adhesive layer. However, when the above-mentioned bonding, the adhesive layer is excessively bleed out, and the workability is deteriorated. On the other hand, after the semiconductor device of the 1C wafer or the like is fabricated, the stress generated under the gradual change of the temperature from Φ to room temperature to a high temperature (above 10 ° C) is applied to the insulating layer and the 1C wafer. Inter-layer peeling or substrate warpage originating from the insulating layer may occur in the inside of the substrate. Such problems are particularly remarkable in a laminated substrate such as a build-up substrate in which a plurality of sound lines and an insulating layer are laminated. Interlayer peeling and substrate Warpage will reduce the electrical stability of the semiconductor device, so it needs to be improved. At the same time, 'in the above-mentioned multi-layer high-density assembly method, the substrate is thin to achieve the purpose of using a layer of adhesive on the insulating film through the adhesive layer. TAB (Tape Automated Bonding; with automatic 7 317818 1323275 ' _ ), such as a metal foil substrate (FPC), etc., in which the insulating film is usually a resin film such as poly-imine resin. Until now, these adhesives have problems such as insufficient adhesion between the insulating film and the metal layer, and subsequent changes in temperature, etc., which tend to cause a decrease in adhesion, and the like. The imide film is extremely difficult to bond. - In the bonding force, the state of the interface of the support has a great influence, and the moisture absorption of the adhesive also has an influence, for example, the lower the hygroscopicity, the more inclined In order to suppress the change of adhesion, it is necessary to have a low hygroscopic adhesive. In recent years, the use of lead has been avoided, thereby increasing the temperature of the IR return rod (secret (4) (4) (10) (10). Therefore, the moisture contained in the adhesive layer is Gas during reflow

化因此易於形成因屋擠黏著劑所產生膨脹(空隙 現象。 / / I 因此,為消除為該膨粒現象之因素的水分 -iZp . 、卜 ^ . 迴焊前之半製品控管在防濕狀態下。 :在防濕狀態下之管理須耗費莫大作業量及成本,因 須㈣而可抑制迴焊時所發生之膨粒現象的耐迴 焊丨生優異之黏著劑組成物。 _之_,在料之料下亦可保 緣性之電氣穩定性雖為重要,但-直以來在溫度 反覆受化下,或長時間加埶情 緣性降低、加凡尼;有易於產生其絕 -力凡尼爲# (Galvanic effect)等不妥之問題。 因此’因應此等須求,由往xt丄 之€氧彳陡 申明人耠出使用如專利文獻! 物Γ本乙稀—丁二稀-笨乙㈣段共聚物之黏著劑紐成 317818 8 丄 JZJZ/:) .[專利文獻1]曰本專利特開2002-241728號公報 【發明内容】 由於已往之黏著劑組成物雖具有各種優良之特性,但 對上述聚酿亞胺膜等之絕緣膜或銅结等金屬層之黏著力不 足。 此外,在其溫度反覆變化或經長時間加熱之情況下, 亦會發生黏著力等之特性劣化、以及时熱劣化性不足之問 題。如耐熱劣化性不足,則絕緣性亦降低。 •本發明鑑於上述情形,目的在提供一種具有各種優良 之特性,尤其是一種黏接力及耐熱劣化性優良之半導體裝 .置用黏著劑組成物及半導體裝置用黏著片。 • 本發明之另外目的,係在使用於BGA(ball grid _y ; 、球柵陣列)、CSP(chip scale package ;晶片尺寸封裝)、 CM(multi chip module,多晶模組)等新組裝形態之半導 體裝置中,具有以往之黏著劑之在溫度反複變化下,發生 緣體層與黏著劑層、IC晶片與黏著劑層間所產生層間剝 f之問題’因此可解決㈣及埋設不良等之缺點。亦即, 提供一種具有優良之應力鬆弛性、耐熱溫度循環性優異之 電氣穩定性,且在銅與聚醯亞胺膜等之間具有優異黏著性 之半導體裝置用黏著劑組成物及半導體用黏著片。 本發明又提供一種半導體裝置用黏著劑組成物及半導 體裝置用黏著片’可改善以往黏著劑中所存在之問題,亦 即經由黏著财所含水分在迴焊時氣化發生練現象,且 其耐濕度性優異。 317818 9 1323275 , 本發明中為解決上述問題,提供—種第―半導體裝置 •.用黏著劑組成物,其特徵為··含有環氧樹脂⑷、及紛樹脂 ⑻、以及含有乙烯及具有可與前述環氧樹脂⑷反應之官 $基的不餘和㈣或料生物之乙料、絲物(〇,且硬化 $所測定之動態點彈性φ夕ρ 坪Γ T之最低熔融黏度在400至50000 · s之範圍内。 上述之半導體裝置用黏著劑組成物, 籲癱内為佳。 上述之半導體裝置用黏著劑組成物,硬化後之拉伸率 以30%以上為佳。 • 上述之半導體裝置用黏著劑組成物,硬化後之吸濕率 以1%以下為佳。 … 上述之半導體裝置用黏著劑組成物,硬化後在15〇它 之環境下放置24小時後,在:⑻^至28〇ΐ下之動態黏彈 籲遍p率以在5〇〇pa至5〇〇MPa之範圍内為佳。 上述之半導體裝置用黏著劑組成物中,前述之乙烯系 共聚物(C)之含量為總固形量之20至8〇質量%者為佳。 上述之半導體裝置用黏著劑組成物中,前述之乙烯系 共聚物(C)之官能基當量以100至2,500為佳。 為解決上述課題,本發明中再提供一種第二半導體裝 置用黏著劑組成物,其特徵為:其中含有環氧樹脂(A)、及 酚樹脂(B)、及含有乙烯及具有可與前述環氧樹脂(a)或環 氧硬化劑反應之官能基的不飽和缓酸衍生物之乙烯系乓聚 10 317818 V ^ J323275 物(c’)、以及矽氧烷化合物(D)。 上述半導體裝置用黏著劑組成物,其 聚物(C,)之含量為總固形量之2G至8。質量^、’〔乙場系共 上述半導體裝置用黏著劑組成物中,复:’佳 聚物(C)中之不飽和羧酸衍生物之含有則述乙烯系共 %為佳。 乂 0.1至40質量 上述半導體裝置用黏著劑組成物中, 聚物(c,)中之官能基當量以100至2,5〇〇為佳則广乙烯系共 ,上述半導體裝置用黏著劑組成物中, ⑷與前㈣樹脂(B)之比例係官 厂述環氧樹脂 Μ之範圍内為佳。 《里比以1:。.6至1: 人上述半導體裝置用黏著劑組成物中,其前述石夕氧烧化 ::=。如式⑴或式⑺所示之兩末端含胺基之彻Therefore, it is easy to form the expansion due to the adhesive agent of the house (void phenomenon. / / I Therefore, in order to eliminate the moisture-iZp of the factor of the granulation phenomenon, 卜 ^. The semi-product control tube before reflow is in the moisture proof Under the condition: The management under the moisture-proof state requires a large amount of work and cost, and it is necessary to suppress the granulation phenomenon occurring during reflow, and it is excellent in the reflow-resistant squeezing of the adhesive composition. In the material of the material, the electrical stability of the edge can be important, but it is directly under the temperature, or the sensation of the sensation is reduced for a long time, and the gamma is easy to produce. Fanny is # (Galvanic effect) and so on. Therefore, 'in response to these needs, from the xt丄 彳 彳 申 申 申 申 申 申 申 申 使用 使用 使用 使用 使用 使用 使用 使用 如 如 如 如 如 如 如 如 如 如 如 如 如 如 如 如 如 - Adhesive agent of a stupid (four)-stage copolymer, NZ 317818 8 丄JZJZ/:). [Patent Document 1] Japanese Patent Laid-Open Publication No. 2002-241728 (Summary of the Invention) Since the adhesive composition of the past has various excellent properties Characteristics, but an insulating film such as the above-mentioned polyimine film or a metal layer such as a copper junction Insufficient adhesion. Further, in the case where the temperature is changed repeatedly or heated for a long period of time, the deterioration of characteristics such as adhesion and the like, and the insufficient thermal deterioration property occur. If the heat deterioration resistance is insufficient, the insulation properties are also lowered. The present invention has been made in view of the above circumstances, and an object thereof is to provide an adhesive composition for a semiconductor device and an adhesive sheet for a semiconductor device which are excellent in various adhesive properties and heat deterioration resistance. • Another object of the present invention is to use a new assembled form such as BGA (ball grid _y, ball grid array), CSP (chip scale package), CM (multi chip module), and the like. In the semiconductor device, the conventional adhesive has a problem of peeling between the edge layer and the adhesive layer and between the IC wafer and the adhesive layer due to repeated changes in temperature. Therefore, the disadvantages of (4) and poor embedding can be solved. In other words, an adhesive composition for a semiconductor device and an adhesive for a semiconductor having excellent electrical stress stability and excellent thermal cycle resistance, and excellent adhesion between copper and a polyimide film are provided. sheet. Further, the present invention provides an adhesive composition for a semiconductor device and an adhesive sheet for a semiconductor device, which can improve the problem existing in the conventional adhesive, that is, gasification occurs at the time of reflow by the moisture content of the adhesive, and Excellent humidity resistance. 317818 9 1323275, in order to solve the above problems, the present invention provides a first-semiconductor device. The adhesive composition is characterized in that it contains an epoxy resin (4), a resin (8), and contains ethylene and has an The epoxy resin (4) reacts with the official base and (4) or the biological material of the material, the silk material (〇, and the hardened value of the measured dynamic point elasticity φ ρ ping Γ T of the lowest melt viscosity of 400 to 50000 In the range of s, the above-mentioned adhesive composition for a semiconductor device is preferable. The above-mentioned adhesive composition for a semiconductor device preferably has an elongation ratio after curing of 30% or more. With the adhesive composition, the moisture absorption rate after hardening is preferably 1% or less. The above-mentioned adhesive composition for a semiconductor device is hardened and left in an environment of 15 Torr for 24 hours, at: (8) to 28 The dynamic viscoelasticity of the underarm is preferably in the range of 5 〇〇pa to 5 MPa. The above-mentioned adhesive composition for a semiconductor device, the content of the aforementioned ethylene-based copolymer (C) 20 to 8 〇 mass% of the total solid amount In the above-mentioned adhesive composition for a semiconductor device, the functional group equivalent of the ethylene-based copolymer (C) is preferably from 100 to 2,500. In order to solve the above problems, the present invention further provides a second semiconductor device for adhesion. a composition comprising an epoxy resin (A), a phenol resin (B), and an unsaturated group containing ethylene and having a functional group reactive with the epoxy resin (a) or an epoxy hardener The ethylene-based phalloids 10 317818 V ^ J323275 (c') and the siloxane compound (D) of the acid-lowering derivative. The above-mentioned adhesive composition for a semiconductor device, the content of the polymer (C,) is the total solid form The amount of 2G to 8. The mass ^, '[A total of the above-mentioned adhesive composition for a semiconductor device, the complex: the content of the unsaturated carboxylic acid derivative in the good polymer (C) is described as a total of ethylene In the above-mentioned adhesive composition for a semiconductor device, the functional group equivalent weight of the polymer (c,) is preferably from 100 to 2,5 Å, and the above-mentioned semiconductor device adhesive is used. In the composition, the ratio of (4) to the former (four) resin (B) It is preferred that the company is in the range of epoxy resin 。. "Ribi 1:6 to 1: The above-mentioned adhesive composition for a semiconductor device, the above-mentioned gas igniting::=. As in the formula (1) or The end of the formula (7) contains an amine group

ψ CHs Μ-ft丨-Si--0CHa ck CHe0¾ ⑴ψ CHs Μ-ft丨-Si--0CHa ck CHe03⁄4 (1)

(2)(2)

Cf3 M 〒 H2N-R4)i—0访宁—。巧—βϊ〜ΝΗβ Q) CH3 至之伸貌基,m及η表示0 (式中之R表示碳原子數 至10之整數) 317818 11 合物導it置用勒著劑組成物申’其前述石夕氧燒化 , 3置為〜、固形量之0.05至10質量%為佳。 本發明中為解決上述問題,提供一種第一半 2著片:其特徵為:在支撐體之至少】面上,積層G U —半導體褒置用黏著劑組成物所成之黏著劑 置用題’又m第二半導體裝 " /、特徵為··在金屬層之至少1面上,依序 參籲層者以上述第—戎坌_主 序積 +¥體裝置用黏㈣組成物所成之 -者J層,及絕緣性膜或剝離性膜。 本發明中為解決上述問題,又提供—種第 置用黏著片,1夺篮裝 '上述第」Μ 緣性膜之兩面上,依序積層 .二置用㈣劑組成物所成之黏著 d層及絕緣性膜或剝離性膜。 本發明中可提供之黏著劑組成物及黏著片,具 fT、耐熱性、耐熱溫度循環性、應力鬆弛性、電氣 =性著性、耐迴烊性等,及低吸濕性等各種優良之 具有優良之黏著性及耐熱劣化性。本發明亦提 ^者❹成物及黏著片,具有優良之應力鬆弛性、财埶 =循環性、電氣穩定性、且在銅與聚❹胺膜等之間具 有優良之黏著性。 因此’如依本發明中之黏著劑組成物及黏著片,即可 Γ例!:經由溫度的反覆變化下所產生層與層間剝離及翹 及里π不良等之缺點。因此’如依本發明之黏著劑組成 317818 12Cf3 M 〒 H2N-R4) i—0 visit Ning—.巧—βϊ~ΝΗβ Q) CH3 to the appearance base, m and η represent 0 (wherein R represents an integer number of carbon atoms to 10) 317818 11 The composition of the composition is used to form a carrier composition Oxygen is burned, 3 is set to ~, and the solid amount is preferably 0.05 to 10% by mass. In order to solve the above problems, the present invention provides a first half 2 sheet: it is characterized in that at least on the surface of the support body, the adhesive layer is formed by the adhesive composition of the GU-semiconductor device. Further, the second semiconductor package " /, is characterized in that, on at least one side of the metal layer, the layer is sequentially applied to the layer by the first 戎坌_main sequence product + body device with the viscous (four) composition. - the J layer, and the insulating film or peeling film. In the present invention, in order to solve the above problems, a first type of adhesive sheet is provided, and the two sides of the first film of the above-mentioned first edge are laminated on the two sides of the film, and the two layers are formed by the composition of the (four) agent. Layer and insulating film or peeling film. The adhesive composition and the adhesive sheet which can be provided by the present invention have various excellent properties such as fT, heat resistance, heat-resistant temperature cycle property, stress relaxation property, electrical=sexuality, resistance to repellency, and the like, and low hygroscopicity. It has excellent adhesion and heat deterioration resistance. The present invention also provides an excellent adhesive relaxation property, a good economy, a cyclical property, an electrical stability, and an excellent adhesion between copper and a polyimide film. Therefore, the adhesive composition and the adhesive sheet according to the present invention can be exemplified by the fact that the layer and the interlayer peeling and the π defect are caused by the change in temperature. Therefore, as in the adhesive composition according to the invention 317818 12

IJ ,物及黏著片,即可提高其半導體農置之穩定性。 . 此外,由於其耐濕性亦 .所含之水分在迴焊時氣化 因此可改善如在黏著劑中 之耐迴焊性。因此可減少管 匕、有優良 所耗費之功夫。 U之+1。口之防濕狀態 因::本發明提供一種可供工業使用之黏著片,且有 之電氣特性及黏著力’且優異之耐PCT⑯、耐迴 性、及加工性。 干 鲁_【實施方式】 以下詳細說明本發明。 〈第一半導體裝置用黏著劑組成物〉 •、本?明之第一半導體裝置用黏著劑組成物(以下亦可 '單稱為第黏著劑組成物)為一種熱硬化型黏著劑組成 物’其含有作為必要成分之:環氧樹脂⑷(以下稱之為⑷ 成分)、及酚樹脂(B)(以下稱之為(B)成分)、以及至少含2 特定之單體成分之乙烯系共聚物(c)(以下稱之為(c)成 分)。 本發明之第一半導體裝置用黏著劑組成物,硬化前所 測疋之動,恕黏彈性中之最低熔融黏度必須在至IJ, the object and the adhesive sheet can improve the stability of the semiconductor farm. In addition, due to its moisture resistance, the moisture contained therein is vaporized during reflow, thereby improving the reflow resistance as in the adhesive. Therefore, it is possible to reduce the management and the cost of doing it. U +1. Moisture-proof state of the mouth:: The present invention provides an adhesive sheet which can be used industrially, and which has electrical characteristics and adhesive strength and is excellent in resistance to PCT 16, resistance to back, and workability.干鲁_[Embodiment] The present invention will be described in detail below. <Adhesive Composition for First Semiconductor Device> •, Ben? The first adhesive composition for a semiconductor device (hereinafter also referred to as a "adhesive composition") is a thermosetting adhesive composition which contains as an essential component: an epoxy resin (4) (hereinafter referred to as (4) Component), a phenol resin (B) (hereinafter referred to as component (B)), and an ethylene-based copolymer (c) containing at least two specific monomer components (hereinafter referred to as component (c)). In the adhesive composition of the first semiconductor device of the present invention, the movement of the crucible before hardening is performed, and the lowest melt viscosity in the viscoelasticity must be

Pa · s 〇 硬化前所測定之動態黏彈性中之最低熔融黏度在4 〇 〇 pa · s以上時,其加工時之樹脂流動小,在5〇,〇〇〇Pa · s 以下時,其配線易於埋設,因此不易受貼合面之凹凸所影 響。即最低熔融黏度在400至50,000 Pa · s之範圍時,本 /、. 13 317818 1323275 發明之黏著劑組成物之配線,特別是高密度設置之配線之 — 埋設性佳。且極易於加工。 ' 上述最低熔融黏度可經由調整(A)成分、(B)成分、(C) 成分等之種類及調配量而調整。例如如後述之經由調整組 成物中之(C)成分之調配量在總固形分之20至80質量%範 圍内等,即可調整該最低熔融黏度。 本發明中硬化前之動態黏彈性所測定之最低熔融黏 度,可依以下之條件測定其黏度變化時黏度之最低值。 ··[測定最低熔融黏度之條件] •裝置:切變模量測定裝置(HAAKE公司製造之Rheo Stress RS75(製品名稱))When the lowest melt viscosity of the dynamic viscoelasticity measured before the hardening of Pa · s is above 4 〇〇pa · s, the resin flow during processing is small, and when it is below 5 〇, 〇〇〇Pa · s, the wiring Easy to bury, so it is not easily affected by the unevenness of the bonding surface. That is, when the minimum melt viscosity is in the range of 400 to 50,000 Pa·s, the wiring of the adhesive composition of the invention of the present invention, especially the high-density wiring, is excellent in embedding. And extremely easy to process. The minimum melt viscosity can be adjusted by adjusting the types (A), (B), and (C) components and the blending amount. For example, the minimum melt viscosity can be adjusted by, for example, adjusting the amount of the component (C) in the conditioning composition as described later in the range of 20 to 80% by mass of the total solid content. In the present invention, the lowest melt viscosity measured by the dynamic viscoelasticity before hardening can be determined by the following conditions to determine the lowest viscosity of the viscosity change. ··[Conditions for measuring the lowest melt viscosity] • Device: Shear modulus measuring device (Rheo Stress RS75 (product name) manufactured by HAAKE)

.•測定溫度範圍:-10°C-300°C •昇溫速度:3°C/min •測定頻率數:1Hz •負載:15N 失真度(distortion) : 0.01%±0.0025% 本發明之黏著劑組成物,硬化後於200°C至280°C下之 動態黏彈性以在500Pa至200Mpa之範圍内為佳,IMPa至 lOOMpa之範圍内更佳。 亦即,使用本發明之第一黏著劑組成物可在支撐體上 形成黏著劑層之黏著片,經貼合(暫時黏接)於被黏接體 後,進行加熱使黏著劑組成物經由硬化而黏著於被黏著體 上。因此,當硬化之第一黏著劑組成物介著錫球組裝在 BGA、積層基板等主基板上時之迴焊步驟(附焊接之步驟) 14 317818 1323275 時’須加熱2 Ο 0至2 8 0 °C。因此,如硬化後2 Ο 0至2 8 0 °C中 之動態黏彈率在500Pa至200MPa之範圍内時,即抑制迴 焊步驟時發生空隙,而提高其耐迴焊性。其應力鬆弛性亦 變佳。 上述動態黏彈率為在剝離性膜上以該第一黏著劑組成 物製成其硬化後厚度為ΙΟΟμπι之黏著劑層之黏著片,在黏 著劑組成物硬化後去除其中之剝離性膜,使用〇rientech Co.製造之Rheovibron DDV-II,以頻率ιΐΗζ、昇溫速度 丨3°C/min測定之值。 本發明之第一黏著劑組成物,在迴焊步驟等之中產生 空隙,而由於引起膨粒現象之主要原因為水分,因此為提 高其耐迴焊性,其硬化後之吸濕率以1%以下為佳。 吸濕率之下限並無特別之限定,吸濕率越小,上述效 果越優異’因而為佳。 々上述之吸濕率,可由調整(A)成分、(B)成分、(C)成分 之種類及5周配量而調整。例如如後述之,調整組成物中 之(C)成刀之s周配量在總固形分之2〇至質量。乂之範圍 内°周整⑷成分與⑻成分之比例為官能基當量比在1: 0.6至1 : M之範圍内,即可調整其吸濕率。 '本發明之第一黏著劑組成物,硬化後之拉伸率以3〇% 為佳:iMt率在3()%以上時,即可增加其應力鬆弛性, # Μ Μ、占:不同材料之時,可緩和高溫時或溫度變化時各 曲^之…膨脹之差’而抑制熱膨脹之差所導致之基板麵 曲及層間剝離。• Measurement temperature range: -10 ° C - 300 ° C • Temperature increase rate: 3 ° C / min • Measurement frequency: 1 Hz • Load: 15 N Distortion: 0.01% ± 0.0025% Adhesive composition of the present invention The dynamic viscoelasticity at 200 ° C to 280 ° C after hardening is preferably in the range of 500 Pa to 200 MPa, more preferably in the range of IMPa to 100 MPa. That is, the adhesive sheet of the adhesive layer can be formed on the support by using the first adhesive composition of the present invention, and after being bonded (temporarily bonded) to the adhered body, heating is performed to harden the adhesive composition. Adhered to the adherent body. Therefore, when the hardened first adhesive composition is placed on the main substrate such as a BGA or a laminated substrate via a solder ball (step of soldering) 14 317818 1323275, 'heating 2 Ο 0 to 2 0 0 °C. Therefore, if the dynamic viscoelasticity at 2 Ο 0 to 280 °C after hardening is in the range of 500 Pa to 200 MPa, voids are suppressed at the reflow step, and the reflow resistance is improved. Its stress relaxation is also improved. The dynamic viscoelasticity is an adhesive sheet on the release film which is made of the first adhesive composition and has a thickness of ΙΟΟμπι after curing, and the peeling film is removed after the adhesive composition is hardened. Rheovibron DDV-II manufactured by 〇rientech Co., measured at a frequency ΐΗζ, a heating rate of °3 ° C / min. The first adhesive composition of the present invention generates voids in the reflow step or the like, and since the main cause of the granulation phenomenon is moisture, the moisture absorption rate after hardening is 1 in order to improve the reflow resistance. % below is better. The lower limit of the moisture absorption rate is not particularly limited, and the smaller the moisture absorption rate, the more excellent the above effect is. The moisture absorption rate described above can be adjusted by adjusting the types of components (A), (B), (C), and the amount of 5 weeks. For example, as will be described later, the (C) sizing amount of the knives in the composition is adjusted to 2 〇 to the mass of the total solid content. In the range of 乂, the ratio of (4) component to (8) component is adjusted to be in the range of 1:0.6 to 1: M, and the moisture absorption rate can be adjusted. The first adhesive composition of the present invention preferably has a stretching ratio of 3% by weight after hardening: when the iMt ratio is 3 (%) or more, the stress relaxation property is increased, # Μ Μ, occupies: different materials In this case, it is possible to alleviate the difference in the expansion between the high temperature and the temperature change, and to suppress the surface curvature and the interlayer peeling caused by the difference in thermal expansion.

317818 15 1323275 • 上述之拉伸率,可由調整(A)成分、(B)成分、(C)成分 專之種類及調配量等而調整。例如如後述之,經由調整組 成物中之(C)成分之調配量在總固形分之20至80質量%之 fe圍内、調整(A)成分與(B)成分之比例為官能基當量比在 1 : 0.6至1 : 1.4之範圍内、調整(〇成分中之不飽和羧酸 或其衍生物之比例為0.1至40質量%之範圍内、調整 成分中之官能基當量在1〇〇至2,5〇〇之範圍内等,即可調 整其拉伸率。 鲁鲁本發明之第一黏著劑組成物,又以硬化後在150°C之 環境下放置24小時後,200。(:至28CTC中之動態黏彈率以 500pa至5〇〇MPa之範圍内為佳,而以3MPa至2〇〇MPa之 . 範圍内更佳。 . 例如在以增層工法製成基板之時,因為其中設置複數 層之黏著劑層,而為了使黏著劑硬化而須施加與積層牧數 相同-人數於硬化溫度中的曝曬。因此對反覆曝曬於硬化溫 鲁|之耐熱劣化性變得極為重要。因此,硬化後即使在 :放置24小時之加速測驗後,而其2〇〇。(::至28〇。〇中之動 也黏彈性仍在5〇〇pa至5〇〇MPa之範圍内時,其耐熱劣化 性可謂極佳。 此處之動悲黏彈性之測定,在黏著劑組成物硬化後, 除再於150。(:之環境下放置24小時以外,可如前述硬化後 於200 C至280°C下測定動態黏彈率之同樣測定。 、^述之動態黏彈率,可由調整(A)成分、(B)成分、(c) 成女等之種類及調配量而調整。例如如後述之,調整組成 16 317818^ ^ 1323275 ..物中之(c)成分之官能基當量在100至2,5〇〇之範圍内,即 可調整其動態黏彈率。 ’ 纟發明ϋ著劑組祕’又硬化後與聚醯亞胺膜 (商品名:UPilex5〇S,日本宇部興產公司製造)間之黏著 力在1叩。方向剝離時以45N/ema上為佳,且其硬化後, 在121。〇、濕度100%之環境下放置3〇〇小時後,其前述與 聚酿亞胺膜間之黏著力在18〇。方向剝離時以肩⑽以上為 佳。如此可提高其應力鬆弛性、耐熱溫度循環性、黏著力 籲•等,亦可減低其吸濕性。因此,可提高其對物理性衝擊, 特別是迴焊步驟時之物理性衝擊等之耐性,此外可提高對 於在製造BGA、積層基板等基板製造時因水分等所產生之 空隙等的耐性。 、Μ下對本發明之第—黏著劑組成物之組成更加以詳細 說明。 ν本發明之黏著劑組成物中,(Α)成分經加熱則與(Β)成 #φ分及/或(C)成分反應形成3 :欠元網狀構造。經由以此等成 分:上述最低熔融黏度組合,即可得到本發明之效果。⑷ 成分與W成分特別對於耐熱溫度循環性、電氣穩定性、在 銅與聚酿亞胺膜等間之黏著力、耐迴焊性等有極大助力。 且(C)成分特別對於應力鬆祕、耐熱溫度循環性、電氣穩 定性、在鋼與聚酿亞胺膜等間之黏著力、耐難等有減 助力。317818 15 1323275 • The above-mentioned elongation ratio can be adjusted by adjusting the components (A), (B), (C), and the amount of blending. For example, as described later, by adjusting the amount of the component (C) in the composition to be within the range of 20 to 80% by mass of the total solid content, the ratio of the component (A) to the component (B) is adjusted to be the functional group equivalent ratio. In the range of 1:0.6 to 1:1.4, the ratio of the unsaturated carboxylic acid or its derivative in the cerium component is in the range of 0.1 to 40% by mass, and the functional group equivalent in the adjusting component is 1 Torr to The elongation ratio can be adjusted within the range of 2,5, etc. The first adhesive composition of the invention of Lulu is placed in an environment of 150 ° C for 24 hours after hardening, 200. (: The dynamic viscoelasticity to 28CTC is preferably in the range of 500pa to 5〇〇MPa, and more preferably in the range of 3MPa to 2〇〇MPa. For example, when the substrate is formed by the build-up method, because In this case, a plurality of layers of the adhesive layer are provided, and in order to harden the adhesive, it is necessary to apply the same number of layers as the number of layers of the number of layers to be exposed to the hardening temperature. Therefore, the heat deterioration resistance of the repeated exposure to the hardening temperature becomes extremely important. Therefore, even after hardening, it is placed after 24 hours of accelerated test, and it is 2 〇〇. (:: to 28〇. When the viscoelasticity of the 〇 is still in the range of 5〇〇pa to 5〇〇MPa, the heat deterioration resistance is excellent. The measurement of the turbulent viscoelasticity here is adhesive. After the composition of the agent is hardened, the dynamic viscoelasticity can be measured at 200 C to 280 ° C as described above, except that it is left in an environment of 150 ° for 24 hours. The rate can be adjusted by adjusting the type of the component (A), the component (B), the component (c), and the amount of the compound. For example, as described later, the component (c) of the composition 16 317818 ^ ^ 1323275 is adjusted. The functional group equivalent weight can be adjusted within the range of 100 to 2,5 。, and the dynamic viscoelasticity can be adjusted. ' 纟Inventive sputum group secret' and hardened with polyimide film (trade name: UPilex5〇S, The adhesion between Japan's Ube Industries Co., Ltd. is 1叩. It is preferably 45N/ema when it is peeled off, and after it is hardened, it is placed in an environment of 121. 〇 and humidity 100% for 3 hours. The adhesion between the above and the polyimide film is 18 〇. When the direction is peeled off, it is better to use the shoulder (10) or more. This can improve the stress relaxation. , heat-resistant temperature cycle, adhesion force, etc., can also reduce its hygroscopicity. Therefore, it can improve its physical impact, especially the physical impact of the reflow step, and can also improve the manufacturing Resistance to voids generated by moisture or the like during production of a substrate such as a BGA or a laminated substrate. The composition of the first adhesive composition of the present invention is further described in detail. νIn the adhesive composition of the present invention, When the component is heated, it reacts with (φ) into #φ分 and/or (C) component to form a 3: undone network structure. The effect of the present invention can be obtained by combining the above components with the lowest melt viscosity. (4) The composition and the W component are particularly useful for heat-resistant temperature cycling, electrical stability, adhesion between copper and a polyimide film, and reflow resistance. Further, the component (C) is particularly effective for stress relaxation, heat cycle resistance, electrical stability, adhesion between steel and a polyimide film, and durability.

[(A)成分J %氧樹脂為分子内含2個以上環氧基之樹脂。 317818 17 ㈧成分可使隸意含例如縮水甘油驗、 編水甘油胺、線狀脂族環氧化物 三甘油酉曰、 之物。此等可單獨使用…二_氧酸_造 早獨便用或以其2種以上併用。 其具體例如雙酚A型環氧澈炉、德^ 雙酚8刑^ ⑽树月曰雙酚F型環氧樹脂、 酌S型壤氧樹脂、萘型環 縮水甘味-取思^ 官能環氧樹脂,三 甘油二1異鼠酸酯型環氧樹脂、三 紛型環轰谢fl匕 、 ’由基對胺基 r Γ、油基二胺基二苯基r型環氧樹[(A) Component J% oxygen resin is a resin containing two or more epoxy groups in its molecule. 317818 17 (VIII) Ingredients such as glycidol, glycosylamine, linear aliphatic epoxide, triglyceride, can be used. These can be used alone... Two oxyacids can be used alone or in combination of two or more. Specifically, for example, bisphenol A type epoxy furnace, de bisphenol 8 punishment ^ (10) tree bismuth bisphenol F type epoxy resin, discriminating S type soil oxygen resin, naphthalene type ring shrinking sweet taste - thinking ^ functional epoxy Resin, triglycerin diiso-sodium acrylate type epoxy resin, three-ring type ringing fl匕, 'from base-amino-r-fluorene, oleyl-diaminodiphenyl-r-type epoxy tree

月曰、四縮水甘油基間二甲苯二胺型 衣虱樹 其 文玉衣乳树月曰、四縮水甘油 土,--胺基甲基環己燒型環氧樹月旨等多 :型環氧樹脂’四苯基縮水甘油驗乙烧型環氧樹脂= 2水甘油趟甲烧型環氧樹脂等多宫能縮水甘油鍵型環氧 1曰’齡型壤氧樹脂、烧基紛型環氧樹脂等多官能可溶酚 路型環氧樹脂,環戊一烯型罗 衣戍一佈孓%、乳树脂、雙酚型環氧樹脂、 環氧樹脂、甲紛型環氧樹脂等多官能漆用祕型環氧 樹脂等。 鲁鲁 /、中又龄型環氧樹脂因價廉,而適於本發明中使用。 夕吕旎%氧樹脂之絕緣性及耐熱性均佳,亦適於本發明中 使用。 風適於本發明中使用之(A)成分之具體例可舉如石油化 于eU ΕροχΥ co·製造之商品名:埃皮科特(epik〇te)806、 828 834、1001 等之雙酚型,商品名:γχ_4000、γχ_4000ϋ 等之雙酚型等之2官能環氧樹脂,石油化學Shell Ep0Xy Co 製造之商品名:埃皮科特152、154、180S65、1032 H60、 157S70等之多官能漆用酚醛型,商品名:6〇4等之四縮水 ..· 3178^8^ 18 1323275 甘油基二苯基曱烷型,商品名:HP-7200、HP-7200H等之 '二環型等之多官能環氧樹脂,日本化學製藥公司製造之商 •品名:EOCN102S、103S、104S、1020等之鄰曱酚漆用酚 醛型,商品名:EPPN501H、502H等之三苯基曱烷型等之 多官能環氧樹脂等。 (A) 成分中之鹵化環氧樹脂,特別是使用溴化環氧樹脂 時,可有效使黏著劑組成物具有難燃性,因此較佳。溴化 環氧樹脂之具體例可舉如石油化學Shell Epoxy Co.製造之 ·#商品名:埃皮科特(EPIKOTE :商標)5045、5046、5050, 曰本化學製藥公司製造之商品名:BREN-S、BREN-105、 BREN-301等。即使以磷化環氧樹脂取代鹵化環氧樹脂等 . 亦不會有任何問題。 ' (A)成分係以環氧當量(相當每1個環氧基之分子量)為 100至4,000者為佳,100至2,000更佳,100至1,000特 佳。如環氧當量為100以上,如使其硬化時則不易殘留未 $ g更化之(A)成分,因此不易產生氣泡。環氧當量如為4,000 以下,則易溶於溶劑中,與其他樹脂之相溶性佳。 本發明之第一黏著劑組成物中(A)成分之含量以為該 黏著劑組成物之總固形量之3至45質量%為佳,5至25 質量%更佳。 [(B)成分] 酚樹脂為酚類與醛經加成.縮合製成之樹脂。 (B) 成分之具體例如可溶酚醛型酚樹脂、酚漆用酚醛樹 脂、曱酚漆用酚醛樹脂、間笨二酚樹脂、二甲苯樹脂等酚 19 317818、 &gt; 丄奶275 .何生物。其中以酚漆用酚醛樹脂之反應性佳’在半導體裝 置之用途上具有優良之耐濕性及耐熱性,因此較佳。 (B)成分以羥基當量(相當每1個羥基之分子量)為5〇 至4,000為佳,1〇〇至2,〇00更佳,ι〇〇至1〇〇〇特佳。如 經基當量為50以上’其硬化後黏著劑不易變脆,如為4,〇〇〇 以下,因易溶於有機溶劑中,因此適於製造。 本發明之第一黏著劑組成物中,(B)成分之含量為該黏 著劑組成物總固形量之2至30質量%為佳,5至25質量〇/〇 響魯更佳。 本發明之第一黏著劑組成物中,(A)成分與成分之 比例以官能基當量比在1:0.6至1:1.4之範圍内為佳,ι: ' 〇[7至1 . I.1之範圍内更佳。亦即,如(A)成分為1且(B) '成分之含量為〇.6以上時,其硬化後之黏著劑組成物不易 變脆,因此有較佳之強度,其應力鬆弛性較佳。⑷成分為 1且(B)成分之含量為1&gt;4以下時,可抑制其黏著力劣化, 鲁g抑制如曝露在高溫後其黏著力的降低。 (A)成分與(B)成分之比例在上述範圍内時,可提高其 硬化後黏著劑組成物之拉伸率。且硬化後再於i5(rc之環 境中放置24小時後,其200至28〇ΐ中之動_彈率亦在 適於半導體裝置上使用之範圍。 中,(A)成分與(B)成分之官能基當量比為(A)成分中 之裱虱基((A)成分之官能基)之數與(B)成分中之羥基 成分之官能基)之數之比例。 [(C)成分] 20 317818、’ 丄如275 - (c)成分係含有作為單體成份之至少含乙婦與可與前 •述(A)成分反應之官能基之不飽和羧酸或其衍生物(以下亦 可單稱之為不飽和羧酸或其衍生物)之乙烯系共聚物。藉由 含該(C)成分可使本發明之第一黏著劑組成物具有撓性,因 此提高其應力鬆弛性。同時亦可提高其耐濕性。且如上述 之經由(A)成分與(B)成分之組合,可提高其耐高溫循環 性、電氣穩定性、及對銅與聚醯亞胺膜等間之黏著力。 其中之「單體成分」指在由聚合反應聚合形成聚合體 ♦鲁時,形成該聚合體之反複單元之化合物。例如單體成分為 乙稀之聚合體係含有由乙婦雙鍵斷裂形成如式[CH2_ _ 所示之反複單元。 - (C)成分中之乙烯及不飽和羧酸或其衍生物之總量以 為對總單體成分之40至98質量%為佳。 (c)成分中乙烯之比例為總單體成分之4〇質量%以上 為佳,50至98質量%更佳。 •籲$飽和㈣或其衍生物中所含可與前述⑷成分反庫 之官能基之例可舉如胺基、異1酸醋基、縮水甘油基、竣 基(包括其酸酐基)、石夕烧醇基、經基、乙婦基、經甲基、 氫硫基、酿基等。其中以胺基、致基、縮水甘油基、二基 =反應性高,因此較佳。官能基特別以縮水甘油基及“ :此等基之不飽㈣酸或其料物之具體例可舉如以 基之例如丙烯酸、甲基丙稀酸'順丁稀 -西夂酐、含祕之丙料烯煙類。含縮水甘油基之例 317818 21 1323275 稀酸縮水甘油醋、甲基丙稀酸縮水甘油酷等。含經基之例 如丙烯酸經甲醋、甲基丙歸酸經甲酿、丙烯酸經乙醋、甲 基丙烯酸羥乙酯等。 (c)成刀中不飽和緩酸或其衍生物之比例為總單體成 分之0.1至40質量%為佳’ 0.8至2〇質量%更佳。Luna, tetraglycidyl-m-xylylenediamine-type eucalyptus, its jasper, milkwood, quaternary glutinous, quaternary glycoside, aminomethylcyclohexene-fired epoxy tree, etc. Oxygen resin 'tetraphenyl glycidol test ethyl bromide type epoxy resin = 2 glycerin 趟 趟 型 type epoxy resin and other polyglycoglycan bond type epoxy 1 曰 'age type lytic resin, burning base ring Multifunctional soluble phenolic epoxy resin such as oxygen resin, cyclopentene type linoleum 孓 孓%, latex resin, bisphenol epoxy resin, epoxy resin, and epoxy resin The secret epoxy resin is used for the paint. Lulu/, medium-aged epoxy resins are suitable for use in the present invention because of their low cost. The oxime oxime oxygen resin is excellent in both insulation and heat resistance and is also suitable for use in the present invention. Specific examples of the component (A) which is suitable for use in the present invention include bisphenol type which is commercially available under the trade name of eU ΕροχΥ co.: epik〇te 806, 828 834, 1001, and the like. , trade name: γχ_4000, γχ_4000ϋ, etc. Bi-phenol type epoxy resin, etc., manufactured by Petrochemical Shell Ep0Xy Co. Trade name: Epicot 152, 154, 180S65, 1032 H60, 157S70, etc. Phenolic type, trade name: 6〇4, etc. Four shrinkage..·3178^8^ 18 1323275 Glyceryl diphenyl decane type, trade name: HP-7200, HP-7200H, etc. Functional epoxy resin, manufactured by Nippon Chemical Co., Ltd. • Product name: phenolic type of o-nonphenol paint for EOCN102S, 103S, 104S, 1020, etc., trade name: triphenyl decane type such as EPPN501H, 502H, etc. Epoxy resin, etc. The halogenated epoxy resin in the component (A), particularly when a brominated epoxy resin is used, is effective in making the adhesive composition flame retardant, and therefore is preferable. Specific examples of the brominated epoxy resin include those manufactured by Petrochemical Shell Epoxy Co., Ltd., and the product name: BREN, which is manufactured by Sakamoto Chemical Co., Ltd., and is sold under the trade name: EPIKOTE (trademark) 5045, 5046, 5050. -S, BREN-105, BREN-301, etc. Even if a halogenated epoxy resin is substituted for a halogenated epoxy resin, etc., there will be no problem. The component (A) is preferably an epoxy equivalent (equivalent to a molecular weight per one epoxy group) of from 100 to 4,000, more preferably from 100 to 2,000, particularly preferably from 100 to 1,000. If the epoxy equivalent is 100 or more, if it is hardened, it is difficult to leave the component (A) which is not changed, so that bubbles are less likely to be generated. When the epoxy equivalent is 4,000 or less, it is easily dissolved in a solvent and has good compatibility with other resins. The content of the component (A) in the first adhesive composition of the present invention is preferably from 3 to 45% by mass based on the total solid content of the adhesive composition, more preferably from 5 to 25% by mass. [Component (B)] The phenol resin is a resin obtained by addition and condensation of a phenol and an aldehyde. (B) Specific examples of the component include a novolak type phenol resin, a phenolic resin phenol resin, a phenol resin for phenol paint, a phenol resin such as a bisphenol resin, and a xylene resin, etc. 19 317818, &gt; Among them, the phenol resin for phenol paint has good reactivity, and it is excellent in moisture resistance and heat resistance in the use of a semiconductor device. The component (B) preferably has a hydroxyl group equivalent (molecular weight per one hydroxyl group) of from 5 Å to 4,000, preferably from 1 Å to 2, more preferably 〇 00, and particularly preferably from 1 〇〇〇 to 1 。. If the basis weight is 50 or more, the adhesive is less likely to become brittle after curing, and if it is 4 or less, it is easily dissolved in an organic solvent and is therefore suitable for production. In the first adhesive composition of the present invention, the content of the component (B) is preferably from 2 to 30% by mass based on the total solid content of the adhesive composition, and more preferably from 5 to 25 % by mass. In the first adhesive composition of the present invention, the ratio of the component (A) to the component is preferably in the range of the functional group equivalent ratio of from 1:0.6 to 1:1.4, and ι: ' 〇 [7 to 1. I.1 Better in the range. That is, when the component (A) is 1 and the content of the component (B) is 〇.6 or more, the adhesive composition after curing is less likely to become brittle, so that it has better strength and better stress relaxation property. (4) When the content of the component (1) is 1 or less and the content of the component (B) is 1 or less, deterioration of the adhesive strength can be suppressed, and the adhesion of the adhesive force can be suppressed after exposure to a high temperature. When the ratio of the component (A) to the component (B) is within the above range, the elongation of the adhesive composition after curing can be improved. After hardening and then placed in the environment of i5 (rc) for 24 hours, the dynamic rate of 200 to 28 亦 is also suitable for use on a semiconductor device. Medium, (A) component and (B) component The functional group equivalent ratio is a ratio of the number of the mercapto group (the functional group of the component (A)) in the component (A) to the number of the functional group of the hydroxyl component in the component (B). [(C) component] 20 317818, ', for example, 275 - (c) component contains an unsaturated carboxylic acid containing at least a functional group of a compound which can react with the component (A) as a monomer component or A vinyl-based copolymer of a derivative (hereinafter also referred to simply as an unsaturated carboxylic acid or a derivative thereof). By containing the component (C), the first adhesive composition of the present invention can be made flexible, thereby improving the stress relaxation property. At the same time, it can also improve its moisture resistance. Further, as described above, the combination of the component (A) and the component (B) improves the cycle resistance, electrical stability, and adhesion between copper and a polyimide film. The "monomer component" herein refers to a compound which forms a repeating unit of the polymer when it is polymerized by polymerization to form a polymer. For example, a polymerization system in which the monomer component is ethylene contains a repeating unit represented by the formula [CH2_ _] by a double bond break. - The total amount of ethylene and unsaturated carboxylic acid or a derivative thereof in the component (C) is preferably 40 to 98% by mass based on the total monomer component. The proportion of ethylene in the component (c) is preferably 4% by mass or more based on the total monomer component, more preferably 50 to 98% by mass. • An example of a functional group contained in the above-mentioned (4) component which is contained in the saturated (d) or its derivative may be an amine group, an iso- 1 vine group, a glycidyl group, a thiol group (including an acid anhydride group thereof), and a stone. An alcoholic group, a thiol group, a methyl group, a methyl group, a thiol group, a brewing group, and the like. Among them, an amine group, a carboxyl group, a glycidyl group, and a diyl group have high reactivity, and therefore are preferred. Specific examples of the functional group, such as glycidyl group and ": such unsaturated group (tetra) acid or a material thereof, may be exemplified by acrylic acid, methyl acrylic acid, cis-butyl sulphate, and sulphuric acid. Examples of acrylonitrile-containing cigarettes. Examples of glycidyl-containing groups 317818 21 1323275 dilute acid glycidol vinegar, methyl acrylate cold glycidol, etc., containing a base such as acrylic acid, methyl acetonate, methyl propyl acid Acrylic acid, ethyl acetoacetate, hydroxyethyl methacrylate, etc. (c) The proportion of unsaturated acid or its derivative in the knives is from 0.1 to 40% by mass of the total monomer component is preferably '0.8 to 2 〇 mass% Better.

(c)成分中不飽和㈣或其衍生物之比例為q i質量% 以上時,可提高其與⑷成分之反應性,亦可提高其硬化後 之拉伸率及硬化後與基材間之黏著力。對有機溶劑之溶解 度亦可提^因此適於作為塗料。其比例為4()質量%以下 時,在塗料狀態下之安定性佳。 (C)成分中在無損及本發明之範圍之條件下,除了乙烯 及不飽和羧酸或其衍生物之單體成分以外’亦可再含立他 單體。 其他之單體者,只要為可與上述乙埽及不飽和敌酸或 其衍生物共聚合者即可,例如丙婦酸甲醋、丙稀酸乙醋、 i基丙稀酸甲酯、甲基丙浠酸乙醋等(甲基)丙稀酸之烧基 酯或芳基酯、乙酸乙烯酯等。 (C)成分中如含其他之單體,其含量為總單體成分之 40質量%以下為佳,3〇質量%以下更佳。 本發明中之(C)成分,其單體成分特別以含乙烯及(甲 基)丙稀酸醋之乙稀系共聚物為佳。由於該乙婦系共聚物中 之主鏈上無二烯鍵結,因此在置於高溫時幾乎盔埶 失其彈性),而可長期保持其應力鬆㈣。且因,其、中含醋(鍵 結之側鏈,對有機溶劑之溶解性較高,加之不易水解,因 22 317818 1323275 •此可抑制黏著劑組成物在高溫高濕環境下腐韻電極,使 氣穩定性提高。 s乙烯與(甲基)丙烯酸酯之單體成分之乙烯系共聚物 之具體例舉如乙烯_( T基)丙烯酸酯-順丁烯二酸酐共聚 ,、乙婦1甲基)丙稀酸院基醋_(f基)丙婦酸縮水甘油醋共 聚物、乙烯-(曱基)丙烯酸縮水甘油酯共聚物、乙烯_(曱基) 丙婦I共聚物、乙婦_(甲基)丙婦酸縮水甘油醋-乙酸乙稀酯 =水物。其中以乙烯_(甲基)丙烯酸烷基酯-順丁稀二酸酐共 •聚物 '乙婦_(甲基)丙稀酸烧基醋(甲基)丙婦酸縮水甘油酯 共聚物、乙烯-(甲基)丙烯酸縮水甘油酯共聚物較佳。 此等乙烯系共聚物均可單獨使用,或以其2種以上併 •用。本發明之第一黏著劑組成物中,宜使用併用2種以上 .之上述乙烯系共聚物。 ^含乙烯與(甲基)丙烯酸酯之單體成分之共聚物中,丙 烯酸酯之比例為總單體成分之5至4〇莫耳%為佳。如為5 #^耳%以上時,其對有機溶劑之溶解度佳,因此適於作為 塗布用溶液(塗料)。如在40莫耳%以下時,對於因水解而 使電氣特性降低之抑制效果高。 (C)成分之質量平均分子量以M〇〇至2,〇〇〇,〇〇〇之範 圍内為佳,100,000至1,000,000更佳。質量平均分子量作 以膠體滲透層析(GPC)測定以苯乙烯為標準之值。 尤其(C)成分之官能基當量(即每1個官能基相當之分 :量(質量平均分子量除以官能基數之值))在100至2,5^ 範圍内時,其硬化後之拉伸率及硬化後與基材間之黏著力 317818 / 23 1323275 佳。 其中之(c)成分之官能基指含前述不飽和羧酸或其衍 生物中所含之可與前述(A)成分反應之官能基。 本發明中(C)成分之含1為該黏著劑組成物之總固形 量之20至80質量%為佳,30至70質量%更佳。(〇成分 之含量在上述範圍内時’具有本發明之優良效果,特別是 其應力鬆他性、耐熱溫度循環性、在銅與聚醯亞胺膜等間 之黏著力、耐濕性等優良。 •籲(C)成分之含量對100質量份之(A)成分以2〇至200質 量份之範圍内為佳,50至150質量份更佳。其含量在2〇〇 質量份以下時,其黏著劑層之成膜性佳,20質量份以上 . 時’其黏著劑層之強度高。 [矽氧烷化合物(D)] 本發明之黏㈣組成㈣Μ再含石夕1院化合物 (D)(以下亦稱之為(D)成分)者為佳。由此,可使上述(A)_(c) 成分溶於有機溶劑中製成塗料時,而提高各成分之相溶 性。此外,亦具有降低硬化後之吸濕率等之優點。 ⑼成分以其中含對環氧基具反應性之反應基為佳。 可舉如減1氧基、胺基、甲基丙婦基、 壤乳I等。 成分 ,、网禾墒上含胺基之矽氧烷化合物較 別是如下述式(1)或十_ a 观杈仫,扣 次式(2)所不之矽氧烷化合 擇之至少1種更佳。 砰中所選 31781^^ 24 CHe CHs CHg 丨一 Si—〇七1卜〇七+一记一 NH2 ⑴ CHa CHa CH3When the ratio of unsaturated (d) or its derivative in the component (c) is qi mass% or more, the reactivity with the component (4) can be improved, and the elongation after hardening and the adhesion to the substrate after hardening can be improved. force. The solubility in organic solvents can also be improved and is therefore suitable as a coating. When the ratio is 4 (% by mass or less), the stability in the coating state is good. The component (C) may contain, in addition to the monomer components of ethylene and an unsaturated carboxylic acid or a derivative thereof, under the conditions of non-destructiveness and the scope of the present invention. Other monomers may be copolymerized with the above-mentioned ethyl hydrazine and an unsaturated acid or a derivative thereof, for example, methyl acetoacetate, ethyl acetoacetate, methyl i-propyl acrylate, A mercapto or aryl ester of (meth)acrylic acid such as ethyl acetoacetate or a vinyl acetate. The content of the monomer (C) is preferably 40% by mass or less based on the total monomer component, more preferably 3% by mass or less. In the component (C) of the present invention, the monomer component is particularly preferably an ethylene-containing copolymer of ethylene and (meth)acrylic acid vinegar. Since the main chain of the ethylene-based copolymer has no diene bond, it almost loses its elasticity when placed at a high temperature, and can maintain its stress relaxation for a long period of time (4). And because it contains vinegar (the side chain of the bond, the solubility in the organic solvent is high, and it is not easy to hydrolyze, because 22 317818 1323275 • This can inhibit the adhesive composition in the high temperature and high humidity environment, The gas stability is improved. Specific examples of the ethylene-based copolymer of the monomer component of ethylene and (meth) acrylate are ethylene-(T-based) acrylate-maleic anhydride copolymerization, and Acrylic acid based vinegar _(f-based) propylene glycol glycan vinegar copolymer, ethylene-(mercapto)acrylic acid glycidyl ester copolymer, ethylene _(mercapto) propylene-wolf I copolymer, 乙妇_ (Methyl) propyl benzoic acid glycidyl vinegar - ethyl acetate = water. Among them, ethylene-(meth)acrylic acid alkyl ester-cis-succinic anhydride copolymer, 'Women's-(meth)acrylic acid-based vinegar (methyl) propylene glycol glycan ester copolymer, ethylene A glycidyl (meth)acrylate copolymer is preferred. These ethylene-based copolymers may be used singly or in combination of two or more kinds thereof. In the first adhesive composition of the present invention, it is preferred to use two or more of the above ethylene-based copolymers. In the copolymer of the monomer component containing ethylene and (meth) acrylate, the ratio of the acrylate is preferably 5 to 4 mol% of the total monomer component. When it is 5 #^耳% or more, since it has a good solubility in an organic solvent, it is suitable as a coating solution (coating). When it is 40 mol% or less, the effect of suppressing electrical characteristics by hydrolysis is high. The mass average molecular weight of the component (C) is preferably in the range of M 〇〇 to 2, 〇〇〇, 〇〇〇, more preferably 100,000 to 1,000,000. The mass average molecular weight is determined by colloidal permeation chromatography (GPC) using styrene as a standard value. In particular, the functional group equivalent of the component (C) (i.e., the amount per unit functional group: the amount (mass average molecular weight divided by the number of functional groups)) is in the range of 100 to 2,5^, and the stretching after hardening Rate and adhesion between the substrate and the substrate 317818 / 23 1323275. The functional group of the component (c) is a functional group which is contained in the unsaturated carboxylic acid or a derivative thereof and which is reactive with the above component (A). The content of the component (C) in the present invention is preferably from 20 to 80% by mass based on the total solid content of the adhesive composition, more preferably from 30 to 70% by mass. (When the content of the bismuth component is within the above range', it has excellent effects of the present invention, in particular, it is excellent in stress relaxation, heat-resistant temperature cycle property, adhesion between copper and a polyimide film, and moisture resistance. The content of the component (C) is preferably in the range of 2 to 200 parts by mass, more preferably 50 to 150 parts by mass, per 100 parts by mass of the component (A), and when the content is 2 parts by mass or less, The adhesive layer has a good film forming property of 20 parts by mass or more. The strength of the adhesive layer is high. [矽 oxane compound (D)] The viscous (four) composition of the present invention (4) Μ 含 石 1 1 compound (D (hereinafter also referred to as component (D)). Therefore, when the component (A)-(c) is dissolved in an organic solvent to form a coating material, the compatibility of each component is improved. It also has the advantage of reducing the moisture absorption rate after hardening, etc. (9) The component is preferably a reactive group having reactivity with an epoxy group. It can be exemplified by a minus 1 oxy group, an amine group, a methyl propyl group, and a lobe. I, etc. The composition, the alkane-containing oxane compound on the net and the sputum is not the following formula (1) or ten _ a 杈仫 杈仫, deduction At least one of the compounds of formula (2) is preferably selected from the group. 31781^^ 24 CHe CHs CHg 丨一 Si-〇七1卜〇七+一记一 NH2 (1) CHa CHa CH3

HgN&quot;-- 0¾HgN&quot;-- 03⁄4

CHa 〇#S/-0⑵ CHa 〇 CHs 之R各為獨立,表示碳原子數1至l〇之伸烧基,m 及n各為獨立,表示0至10之整數。) 式(1)中作為R1之伸烷基可為直鏈或支鏈,尤其以碳 •原子數2至5之直鏈狀伸烷基為佳。 • m以3至8之整數為佳。 n以〇至8之整數為佳。 式(1)及式(2)中所示兩末端上含胺基之矽氧烷化合物 #€^例可舉如東芝矽酮公司製造之商品名:tsl93〇6(二胺基 一矽氧烷)' 商品名:TSL9886(二胺基聚矽氧烷)、商品名: TSF4706(二胺基二矽氧烷)、商品名:XF42_a2645(二胺基 聚矽氧烷)等。 1 (D)成分在本發明之第一黏著劑組成物甲之含量,對該 黎著劑組成物總固形量,係以0.05幻〇質量〇/〇為佳,^ 至5質量%更佳。如為〇〇5質量%以上時,本發明之黏著 劑組成物製成之塗料中(A)_(C)成分之相溶性優良,且其石 化後之吸濕率亦低。在ϊ〇質量%以下時,可抑制其勸著| 25 篇 317818 1323275 的降低。 &lt; [其他之任意成分] . 本發明之黏著劑組成物中,為提高與被黏著物間之&amp; 密性,最好再加入偶合劑。 _CHa 〇#S/-0(2) CHa 〇 CHs R are each independently, and represent a stretching group having a carbon number of 1 to 10, and m and n are each independently, representing an integer of 0 to 10. The alkylene group as R1 in the formula (1) may be a straight chain or a branched chain, and particularly preferably a linear alkyl group having 2 to 5 carbon atoms. • m is preferably an integer from 3 to 8. n is preferably an integer from 〇 to 8. Examples of the oxirane compound containing an amine group at both terminals of the formula (1) and the formula (2) are exemplified by Toshiba Ketone Co., Ltd., trade name: tsl93〇6 (diamine-oxymethane) ) 'Trade name: TSL9886 (diaminopolyoxyalkylene), trade name: TSF4706 (diaminobisoxane), trade name: XF42_a2645 (diamine polyoxyalkylene), and the like. The content of the (1) component in the first adhesive composition A of the present invention is preferably 0.05 〇 mass 〇/〇, more preferably 5% by mass, based on the total solid content of the lining agent composition. In the case of 5% by mass or more, the (A)-(C) component of the coating composition of the adhesive composition of the present invention is excellent in compatibility, and the moisture absorption rate after stone formation is also low. When the mass is below ϊ〇%, it can be suppressed by the persuasion | 25 317818 1323275. &lt;Other optional components. In the adhesive composition of the present invention, it is preferable to further add a coupling agent in order to improve the adhesion to the adherend. _

偶合劑以使用如有機石夕燒偶合劑、鈦偶合劑或銘偶合 劑較佳。 D 本發明之第一黏著劑組成物中,在上述之(入)成分中同 時再含環氧硬化劑更佳。如此可促進本發明之第一黏著劑 • #組成物之硬化反應並提高其耐熱性。 片 環氧硬化劑可使用一般所使用之物’其具體之例如咪 唑類、1,8-二氮雜雙環(5,4,〇)十一碳稀等胺 .基膦等磷系催化劑等。 隹化d —本 树明之第-黏著劑組成物中,環氧硬化劑之含量, 對該黏著劑組成物總固形量為〇1至1〇質量%為佳’ 至3質量%更佳。 」 之黏著劑組成物中’在達成調整熱膨脹係數、 傳0或控制其作業性等目的方面,以其中 物及有機填充物等填充物為佳。 機真充 :機填充物之例可舉如二氧化石夕、氧化銘、氧化鈦、 =鈹、減鎂、碳_、氮化鈦、氮切、氮化蝴 化鎢、碳切、碳化鈦、碳化錯、碳㈣目、雲母、 三氧化:=:箄碳黑、氫氧化銘、氫氧化飼、氫氧化鎂、 有機之表面經三甲基矽烷氧基等處理之物等。 有機真充物之例可舉如聚醯亞胺、聚酿胺酿亞 317818f:&gt; 26 1323275 .醚醚酮、聚醚醯亞胺、聚酯醯亞胺、尼龍、矽酮等。 . 本發明之第一黏著劑組成物中填充物之含量,對總量 為100質量份之前述(A)成分、(B)成分及(c)成分及為任意 成分之(D)成分,以2至95質量份之範圍内為佳,5至50 質量份更佳。 本發明之第一黏著劑組成物可將其必要成分即上述 (A)至(C)成分溶於有機溶劑中,再加入任意成分之⑴)成分 等製成塗料,以形成黏著劑層。 ··其中使用之有機溶劑可自N-曱基-2-吼洛炫酮、N,N_ 二f基乙醯胺、Ν,Ν·二曱基甲醯胺、吡啶、曱基乙基酮、 甲基異丁基酮、曱苯、二甲苯、^心二口惡烧、四氯π夫喃、 -乙醇、甲醇、甲基溶纖素等中選擇適當種類及量使用。 • 塗料以調為固形物濃度5質量%以上為佳,1〇至5〇 質量%更佳。固形物濃度5質量%以上時,可易於製造其 黏著劑層厚度均勻之黏著片。 _鲁〈第二半導體裝置用黏著劑組成物〉 本發明之第二半導體裝置用黏著劑組成物係一種必要 成分含有:環氧樹脂(A)(以下稱之為(A)成分)、及紛樹脂 (,)(以下稱之為⑻成分)、及其中含可與環氧樹脂⑷或環 氧硬化劑反應之官能基之不飽和敌酸或其衍生物及乙稀之 乙烯系共聚物(C·)(以下稱之為(Ci)成分)、以及石夕氧燒化合 物(D)(以下稱之為(D)成分)之硬化型黏著劑組成物。 '以下再說明本發明之第二黏著劑組成物中所使用之各 317818 Ί 27 1323275The coupling agent is preferably used, for example, an organic stone coupling agent, a titanium coupling agent or an inductive coupling agent. D In the first adhesive composition of the present invention, it is more preferable to further contain an epoxy hardener in the above-mentioned (in) component. This promotes the hardening reaction of the first adhesive of the present invention and the heat resistance of the composition. As the sheet epoxy curing agent, a generally used one can be used, and specific examples thereof include a phosphorus-based catalyst such as imidazole or 1,8-diazabicyclo(5,4,fluorene)undecene. In the first-adhesive composition of the present invention, the content of the epoxy hardener is preferably from 〇1 to 1% by mass to 3% by mass to 3% by mass. In the adhesive composition, it is preferable to use a filler such as a substance or an organic filler for the purpose of adjusting the coefficient of thermal expansion, transmitting zero, or controlling the workability. Machine charging: examples of machine fillings can be exemplified by dioxide dioxide, oxidation, titanium oxide, = yttrium, magnesium reduction, carbon _, titanium nitride, nitrogen cutting, tungsten nitride, carbon cutting, titanium carbide , carbonization error, carbon (tetra) mesh, mica, trioxide: =: 箄 carbon black, hydrazine, hydroxide feed, magnesium hydroxide, organic surface treated with trimethyl decyloxy and the like. Examples of the organic succinimide include polyethylenimine, polystyrene 317818f: &gt; 26 1323275. Ether ether ketone, polyether quinone imine, polyester quinone imine, nylon, fluorenone and the like. The content of the filler in the first adhesive composition of the present invention is 100 parts by mass of the above-mentioned (A) component, (B) component, and (c) component, and the component (D) which is an optional component. It is preferably in the range of 2 to 95 parts by mass, more preferably 5 to 50 parts by mass. The first adhesive composition of the present invention can be prepared by dissolving the essential components, i.e., the above components (A) to (C), in an organic solvent, and then adding the component (1)) of any component to form a coating layer. · The organic solvent used therein can be derived from N-mercapto-2-indanthrone, N,N-di-p-acetamide, hydrazine, hydrazine, dimethyl carbamide, pyridine, mercaptoethyl ketone, Methyl isobutyl ketone, terpene benzene, xylene, bismuth acetonide, tetrachloro π pentane, -ethanol, methanol, methyl cellosolve, and the like are selected and used in appropriate amounts and amounts. • It is preferable that the coating is adjusted to have a solid content of 5% by mass or more, preferably 1 to 5 Å by mass. When the solid content concentration is 5% by mass or more, the adhesive sheet having a uniform thickness of the adhesive layer can be easily produced. _Lu <Adhesive Composition for Second Semiconductor Device> The adhesive composition for the second semiconductor device of the present invention contains an essential component: epoxy resin (A) (hereinafter referred to as (A) component), and Resin (,) (hereinafter referred to as component (8)), and an unsaturated host acid or derivative thereof having a functional group reactive with an epoxy resin (4) or an epoxy hardener, and an ethylene copolymer of ethylene (C) () (hereinafter referred to as (Ci) component), and a hardening type adhesive composition of the compound (D) (hereinafter referred to as (D) component). 'The 317818 Ί 27 1323275 used in the second adhesive composition of the present invention will be described below.

f(A)成分J 第二黏著劑組成物中 物中之環氧樹腊⑷相同之環氧樹:與上述第-黏著劑組成 上述環氧樹脂中特別以雙 官能環氧樹脂之絕緣性及耐:軋:脂較價廉’且多 使用。 丁…性均佳,因此適於本發明辛 此4環氧樹脂之環氣合晉 至2 00Γ)审灶,衣虱田里以10〇至4,000為佳,100 至,000更么,100至M〇 應濰B主,甘r* J比艰乳田里為100以上 • •卞’、硬化時不易殘留未硬化之成八% 氧當量為4,_以下時,則易易產生氣泡。環 相溶性佳。了f則易各於浴劑中,並與其他樹脂 - %氧樹脂(A)之含量為樹脂總固形量之3至40質量 _ % ’以5至25質量%為佳。 里 為促進本發明之第二黏著劑組成物之硬化反應,宜使 用味唾類、1,8·二氮雜雙環(5,4,〇)十—碳烯等胺系催化劑, j苯基膦等磷系催化劑等環氧硬化劑。 罾Tb)成分] (B)成分可與環氧樹脂(A)反應形成3次元網狀構造。 第二黏著劑組成物中中亦可使用與上述第一黏著劑組 成物中之盼樹脂(B)相同之盼樹脂。其中以紛漆用紛搭型樹 脂之反應性佳,在用於半導體裝置方面因有優良之而牙濕性 及财熱性,因此較佳。 上述環氧樹脂(A)與酚樹脂(B)之比例,官能基當量比 以1 : 0.6至1 : 1 _4為佳,1 : 〇·7至1 : 1.1更佳。當環氧 28 317818 V、v :脂㈧與紛樹脂(B)之比例在官能基當量比為1: ο 之比例較小時,其硬化物易於變脆。而上述比例為 ..之騎脂(Β)比例較大時,其黏著力㈣低。·' [(C1)成分] 構成本發明之乙㈣共聚物(e)為其中含有主要 成=至少含乙料可與前述環氧樹脂或環氧硬化劑反應 之B能基之不飽和羧酸或其衍生物者。 、 可與上述環氧樹脂或環氧硬化劑反應之官能基可舉如 •則述第-黏著劑組成物中之(c)成分中可與(A)成分反庫之 宫能基+所舉之相同官能基。其具體之例如胺基、異說酸 .醋基、縮水甘油基、缓基(包括其酸軒基)、石夕烧醇基、經 -基、乙烯基、规甲基、氫硫基、醋基等。其中以胺基、缓 •基、縮水甘油基、羥基之反應性高,因此較佳。官能基特 別以縮水甘油基及敌基為佳。含此等基之不飽和竣酸或其 衍生物之具體例如以下所舉之例。含絲者如丙稀酸/甲 籲鲁基丙烯酸、順丁烯二酸(酐)、含羧基之丙烯等烯烴類,含 縮水甘油基如丙烯酸縮水甘油酯、曱基丙烯酸縮水甘油酯 等,含羥基者係如丙烯酸羥曱酯、曱基丙烯酸羥甲酯、丙 烯酸經乙酯、曱基丙烯酸經乙酯等。 (C)成义中除上述之主要單體成分外,亦可再含少量 之第三單體。可與上述乙烯及含官能基之不飽和羧酸或其 衍生物共聚合之第三單體可舉如:丙烯酸曱酯、丙烯酸乙 酯、曱基丙烯酸曱酯、曱基丙烯酸乙酯等(曱基)丙烯酸之 烷基酯或芳基酯、乙酸乙烯酯等。 317818 29 1323275 上述乙晞系共聚物中不飽和缓酸衍生 至™為佳,。…質量%更佳。上:;二; 衍生物成分在共聚物中之含量為〇.丨質量%以上時,可提 高其與成分(A)或成分(B)之反應性,亦可提高其在有機溶 劑中之溶解度。如含量為40質量%以下時,在塗料 保持其安定性。如有第三單體成分存在時,其含量以 質量〇/〇以下為佳,3 〇質量%以下更佳。f(A) component J. The epoxy resin of the same epoxy ray wax (4) in the second adhesive composition: in combination with the above-mentioned first-adhesive agent, especially the insulating property of the above-mentioned epoxy resin with a bifunctional epoxy resin Resistance: Rolling: The fat is cheaper and more used. Ding...they are all good, so it is suitable for the invention. The ring of the 4 epoxy resin is promoted to 200 Γ), the clothing is preferably 10〇 to 4,000, 100 to 10,000, 100 to M〇 should be B main, Gan r* J is more than 100 in the difficult field. • • 卞 ', hard to leave unhardened 8%, oxygen equivalent is 4, _ or less, it is easy to produce bubbles. The compatibility of the ring is good. The amount of f is preferably in the bath, and the content of the other resin - % oxygen resin (A) is preferably from 3 to 40% by mass of the total solid content of the resin of from 5 to 25% by mass. In order to promote the hardening reaction of the second adhesive composition of the present invention, an amine-based catalyst such as saliva, 1,8-diazabicyclo(5,4,anthracene)-carbene, j-phenylphosphine is preferably used. An epoxy curing agent such as a phosphorus catalyst.罾Tb) Component] The component (B) can react with the epoxy resin (A) to form a three-dimensional network structure. The same resin as the desired resin (B) in the above first adhesive composition can also be used in the second adhesive composition. Among them, the lacquer-like resin has good reactivity, and is excellent in tooth wettability and heat-preservation in semiconductor devices. The ratio of the above epoxy resin (A) to the phenol resin (B) is preferably from 1:0.6 to 1:1, and more preferably from 1:7 to 1:1.1. When the ratio of the epoxy 28 317818 V, v: fat (eight) to the resin (B) is small at a functional group equivalent ratio of 1: ο, the hardened material is liable to become brittle. When the ratio of the above is a large proportion of riding fat (Β), the adhesion (four) is low. - [(C1) component] The (B) copolymer (e) constituting the present invention is an unsaturated carboxylic acid containing a B group capable of reacting mainly with at least an ethylene resin or an epoxy hardener. Or its derivatives. The functional group reactive with the above epoxy resin or epoxy hardener may be as described in the component (c) of the first-adhesive composition and the anti-accumulation of the component (A) The same functional group. Specifically, for example, an amine group, a different acid, a vinegar group, a glycidyl group, a slow group (including an acid group thereof), a sulphur group, a thiol group, a vinyl group, a methyl group, a thiol group, and a vinegar group. Base. Among them, an amine group, a buffer group, a glycidyl group, and a hydroxyl group have high reactivity, and therefore are preferred. The functional group is particularly preferably a glycidyl group or an ester group. Specific examples of the unsaturated citric acid or a derivative thereof containing such a group are as follows. An olefin such as acrylic acid/methyl ruthenium acrylate, maleic acid (anhydride) or carboxyl group-containing propylene, containing a glycidyl group such as glycidyl acrylate, glycidyl methacrylate, etc., The hydroxy group is hydroxy hydroxy acrylate, hydroxymethyl methacrylate, ethyl acrylate, methacrylic acid by ethyl ester or the like. (C) In addition to the above-mentioned main monomer component, it may further contain a small amount of a third monomer. The third monomer copolymerizable with the above ethylene and the functional group-containing unsaturated carboxylic acid or a derivative thereof may, for example, be decyl acrylate, ethyl acrylate, decyl methacrylate or ethyl methacrylate. An alkyl or aryl ester of acrylic acid, vinyl acetate or the like. 317818 29 1323275 It is preferred that the above-mentioned ethyl ketone copolymer is derived from unsaturated acid to TM. ...% by mass is better. When the content of the derivative component in the copolymer is 〇.丨% by mass or more, the reactivity with the component (A) or the component (B) can be improved, and the solubility in the organic solvent can also be improved. . When the content is 40% by mass or less, the stability of the coating is maintained. When the third monomer component is present, the content is preferably 〇/〇 or less, more preferably 3% by mass or less.

本發明中上述乙烯系共聚物之較佳例可舉如乙烯 (曱基)丙烯酸酯-順丁烯二酸酐共聚物、乙烤_(曱基)丙烯 酸烷基酯-(曱基)丙烯酸縮水甘油酯共聚物、乙烯甲基)丙 烯酸縮水甘油醋共聚物、乙烯_(甲基)丙烯酸共聚物、土乙烯 -(曱基)丙烯酸縮水甘油酯-乙酸乙烯酯共聚物。其中以乙烯 -(甲基)丙烯酸酯-順丁烯二酸酐共聚物、乙烯甲基)丙烯 酸烧基醋-(曱基)丙_縮水甘油酉旨共聚物、及乙稀_(甲其) 丙烯酸縮水甘油S旨共聚物較佳。本發明之第二黏著㈤ f中亦宜使用合併2種以上之上述乙烯系共聚物(c,;: 乙烯系共聚物(C,)加入之目的在使黏著劑組成物 撓性,最好是加入上述之乙烯甲基)丙烤酸醋。含乙婦_(甲 基)丙烯酸自旨之共聚物,因其主鏈上無二烯鍵結,在放置古 溫時乎不發生熱劣化(變成無彈性),在長期間後仍可保: :應力鬆純。又因其中之側鏈含錯鍵結,對有機溶劑之 &gt;谷,性較高’且因不易水解,而可抑制在高溫高濕環境 黏者劑組成物黏接電極之錢,高其電氣穩定性。 之丙婦酸S旨單體之比例以5至4()莫耳%較佳。在5莫耳。/。 317818 30 1323275 -.,可提高其對有機溶劑之溶解度,因此適於作為塗 ·. 即塗料)。在4〇莫耳%以下時,因不易水解因 此不易降低其電齑转极 ^ 因 以1,000至2 _ 〇〇〇 糸共來物之重夏平均分子量 2,_,_ 為佳 ’!〇〇,〇〇0 S !,_,_ 更佳。 心I:分:量為以膠體滲透層析(GPC)測定以苯乙婦為 2:。為:。咖稀系共聚物(C,)之嶋^ ••上為t之上述乙烯系共聚物(c,)之拉伸率以5〇〇%以 ' 0/〇以上更佳。本發明中之拉伸率係對於厚度為 随者依ns K676〇所測定之值。拉伸率遍%以上時, :膜形成性佳’可提高樹脂硬化後黏著劑組成物層之撓 ’上述乙埽系共聚物(CI)對有機溶劑之溶解性以以上 .眭,制=以上更佳’ 6〇%以上又更佳。溶解度為5%以上 —衣膜知之無法使厚度變得極薄。溶解度為對1 〇〇g之甲 f溶液中加入100g之試樣’再於8(rc下擾掉12小時溶解 &lt;再=至室溫,溶液再經尼龍製之_網目之遽膜過遽 後’叶异殘留之不溶性成分之量⑻g,再以下述式算出。 溶解度(%)=[( l〇〇g-(x)g)/l〇〇g]xl〇〇 曰本I月中之上述乙稀系共聚物(C')之範圍以對1 〇〇重 1 =之環氧樹脂(A)與環氧硬化劑總量為2〇至2⑼重量份 為仫,50至15〇重量份更佳。如含量為2〇〇重量份時,較 易於維持良好之製膜性。如為2G重量份以上時,則膜不易 變脆。 [(D)成分] 317818 31 第二黏著劑組成物中 成物中可含之成分⑼為相同之成分。(I、第黏者劑組 美二成刀⑼以含反應基者為佳,反應基可舉如羥 二=、:基、甲基丙稀基、環氧基等。其中又二 物更^。*又亦1式(2)所示之兩末端上含胺基之矽氧烷化合 A之石夕氧如下述式⑴或式(2)所示之兩末端上含胺 夕减化合物切氧院化合物。 〒CHa (1) I〗一卜 nh2 CH3 CHa CHa 〒 Ύ CHa H,N-RHSH〇^^〇VsL^Nfla (2)Preferred examples of the above ethylene-based copolymer in the present invention include ethylene (mercapto) acrylate-maleic anhydride copolymer, and ethyl bromide (alkyl) acrylate-(mercapto)acrylic acid glycidol. Ester copolymer, ethylene methyl acrylate glycidic vinegar copolymer, ethylene _ (meth) acrylate copolymer, terephthalic acid - (mercapto) styrene glycidyl ester - vinyl acetate copolymer. Among them, ethylene-(meth)acrylate-maleic anhydride copolymer, vinyl methyl)acrylic acid acetonitrile-(mercapto)propyl-glycidyl hydrazine copolymer, and ethylene _(meth) acrylate A glycidyl S-based copolymer is preferred. In the second adhesive (f) f of the present invention, it is also preferred to use two or more kinds of the above ethylene-based copolymers (c,;: the ethylene-based copolymer (C,) is added for the purpose of making the adhesive composition flexible, preferably Add the above vinyl methyl) propylene vinegar. The copolymer containing 乙-(meth)acrylic acid has no thermal degradation (becoming inelastic) when it is placed at an ancient temperature because it has no diene bond in the main chain, and can be protected after a long period of time: : Stress is pure. In addition, because the side chain contains a misbonded bond, the organic solvent has a high degree of 'the valley', and because it is not easily hydrolyzed, it can suppress the sticking electrode of the adhesive composition in a high-temperature and high-humidity environment, Gao Qi Electric stability. The ratio of the bupropion S monomer to the monomer is preferably 5 to 4 (mol%). At 5 m. /. 317818 30 1323275 -., can improve its solubility in organic solvents, so it is suitable as a coating. When it is less than or equal to 4% by mole, it is not easy to reduce its electrophoresis due to hydrolysis, and it is better to use the summer average molecular weight of 2, _, _ of 1,000 to 2 _ 〇〇〇 糸 ’! 〇〇, 〇〇0 S !, _, _ better. Heart I: points: The amount is determined by colloidal permeation chromatography (GPC) with benzophenone as 2:. for:. The elongation ratio of the above-mentioned ethylene-based copolymer (c,) of the comon-based copolymer (C,) is preferably 5% or more by more than 5%. The elongation in the present invention is a value determined by the thickness of ns K676. When the stretching ratio is 5% or more, the film formability is good, and the viscosity of the adhesive composition layer after curing of the resin can be increased. The solubility of the above-mentioned acetylated copolymer (CI) in an organic solvent is more than or equal to that. Better' 6〇% or better. The solubility is 5% or more - the film does not know how to make the thickness extremely thin. The solubility is 100 g of the sample added to the solution of 1 〇〇g of the solution f. Then 8 (dissolved for 12 hours under rc to dissolve &lt; again = to room temperature, the solution is then made of nylon. The amount of the insoluble component (8) g after the 'leaf residue' was calculated by the following formula. Solubility (%) = [( l〇〇g - (x) g) / l〇〇g] xl 〇〇曰 in the first month The above ethylene copolymer (C') is in the range of 2 to 2 (9) parts by weight of the epoxy resin (A) and the epoxy hardener for 1 〇〇, and 50 to 15 parts by weight. More preferably, when the content is 2 parts by weight, it is easier to maintain good film formability. If it is 2 parts by weight or more, the film is not easily brittle. [(D) component] 317818 31 Second adhesive composition The component (9) which can be contained in the medium-sized product is the same component. (I. The first adhesive agent group is preferably a medicinal base, and the reactive group is preferably a hydroxy group, a base group, a methyl group C. a dilute group, an epoxy group, etc., wherein the two substances are further reduced by a formula (1) or a formula (2) or a formula (2) ) shown on both ends of the amine-containing compound Oxygen compound. 〒CHa (1) I〗 卜 nh2 CH3 CHa CHa 〒 Ύ CHa H,N-RHSH〇^^〇VsL^Nfla (2)

CflsCfls

CH3 Q • ^式中之R1各為獨立,表示碳原子數i至i〇之伸烧基,以 及11各為獨立,表示〇至ι〇之整數。) 上述式(1)或式(2)所示之兩末端上含胺基之矽氧烷化 5物之例可舉如東芝矽酮公司製造之商品名:(二 胺基二矽氧烷)、商品名:TSL9886(二胺基聚矽氧烷)、商 σ口名.TSF4706(二胺基二矽氧烷)、商品名:XF42 A2645(二 胺基聚矽氧烷)等。 上述之石夕氧燒化合物(D)成分在第二黏著劑組成物中 之比例,係總固形量之〇.〇5至10質量。/。,以〇.3至5質量 32 317818^ ^ 片第一半導體裝置用黏著片(以下稱之為 之第—十结 又㈣之至^一面上’積層前述本發明 或第二黏著劑組成物所形成之黏著劑層。 金屬ΐ黏:::1)上之支撐體,可使用銅或鋁等金屬製成之 屬^層:離性膜、絕緣性膜、剝離紙等,尤其以使用金 膜及絕緣性膜之群中選擇之至少1種為佳。 取 一甲-夂乙二酯(以下簡稱之為 )心曰類,聚乙稀等聚婦類,聚醒亞胺、聚酿胺、 …、來伸苯硫化物、聚醚酮、三乙醯纖維素等為佳, “曰類、聚烯類及聚醯亞胺等材質之膜更佳。 剝離性膜可舉如在上述絕緣性膜中所列舉之相 膜’以使用㈣膠等脫模劑脫模處理者較佳。 、 2明之黏者片⑴之製造,如可在支樓體之至少—面 含前述第―或第二黏著劑組成物之塗料,再經乾 燥等形成黏著劑層。 _著劑層以經加熱處理成半硬化狀態為佳。特 用條件,例如縮短硬化時間、埋設導體圖樣等時抑 t動性及發泡▲,因此以適當地控制在半硬化狀態為佳。 控制在半硬化狀態之方法並盔特別&gt; 時控制為佳。 L特別之限疋,在老化(aging) 钻著d層乾燥後之厚度以3至4〇〇μιη之範圍内為佳, 5至ΙΟΟμιη更佳。 在支撐體之至少一面上形成黏著劑層之本發明之黏著 片⑴’在其保管時,在該黏著劑層上再黏接剝離性膜,可 .作 ^. * 317818 34 1W/:) 防止黏著制不致受到㈣,因此較佳。該 剝離性膜後即可使用。 片剝離該 在半導體裝置中單使用黏著劑層之時, :上之剝離性膜,在使用時只要剝離黏著侧之= 性膜即可使用。 1則之剝離 接著,本發明之第二半導體裝置_著 為黏著片⑺。)之特徵為在金屬層之至少一面上下=之 層前述本發明之第一或第二半導體裝置用 依序積 1形成之黏著劑層,及絕緣性膜或剝離性膜〔心、且成物所 如上==二之說明,均 層、輯性臈及制離性膜之相同說明。 黏者刻 黏著片(2)因為具有該組成,可以 、其次,本發明之第三半導體裝置用黏接著作片 片(3)。)之特徵為在絕緣性膜之兩面上,依序二 %之黏著劑層,及體裝置用黏著劑組成物所形 曰及%緣性臈或剝離性膜。 著片=層支=緣性㈣ 性膜之相同說明牙。上所例舉之黏著劑層、絕緣性膜及剝離 性。黏者片(3)因為具有該組成,而具有優良之電氣穩定 裝置,特別適之人1^1組成物及黏著片,適用於各種半導體 Ί&quot;緣體層及導體電路構造之IC基板中 317818 35 之電路面板’或底面積岸IC曰y十^^首触壯 裝置之具體例可4之Μ體裝置。該半導體 例了舉如利用TAB技術之T-BGA、使 或玻璃環氧基板之掸屏I此斗、4 攸層基板或板面封裝型csp半導體等。 本發明之黏著劑組成物及黏著片更具體之用途,係適 於作為在如上述半導體裝置中,與其IC晶片及ic用基板 之絕緣體層及/或與導體電路黏著或形成電路之黏著劑、電 路基板間互相黏著,或其與保護之保護膜之黏著劑。 實施例 丨 以下即以實施例更詳細說明本發明,但本發明並不限 疋於此尊貫施例。 實施例1-28、比較例1-7[由黏著劑組成物調製塗料] 由如表1中之簡寫所示之成分(A)、成分(b)、成分(c) 及(C')成分、(D)成分、矽烷偶合劑、環氧硬化劑、填充物 及含二烯之共聚物’依表1中之各調配量(對總固形分之質 量%),於常溫至80°C左右溶於甲苯中,即製成含黏著劑組 成物之塗料(固形分濃度為35質量%)。 I 填充物之含量為對總量100質量份之(A)成分、(B)成 分、(C)成分或(C')成分、及(D)成分之份數(質量份)。 表1中實施例1 -28及比較例1 -7中所使用之各成分種 類之簡寫如表2所示。 36 3J7818 -1】1323275 表 噠骟w者嗜琪一#:砌接w喊鉍-B-ZTwli^i§鉍I丨一術 (質量份) 填充物 CO 丄 er» c〇 o I (14%) 费無 ΊΦ ♦钱 硬化劑 eja I er&gt; C3 1 C9 0¾ C9 0¾ C3 en C3 er&gt; o er&gt; C3 cr&gt; 〇 矽烷偶合劑 « cL oa Cz3 〇&gt; cn c〇 〇&gt; e^3 « &lt;7&gt; 09 en ΰϋ CQ (D)成分 Λ \n CO ό m era· CM Λ 卜 卜 ^- U9 卜 卜 (C)或(C’)成分 ra ώ ϊ〇 c〇 甘 to 1/9 «£» «〇 c〇 %t9 «Ο ς-&gt; o 6 \n CO &lt;〇 (B)成分 ΙΑ 1A 一 U9 卜 60 cc 00 βτ» σ&gt; e^i lA ΙΛ ΙΑ : (A)成分 U7 4; N Ξ5 寸 Jc to σ&gt; c*^ CO Λ e&lt; 04 5 rg e&lt;Q CSJ e»a o I ύ • cs ri Cs&gt; CO c〇 t-- «0 O o βΝ)CH3 Q • The R1 in the formula is independent, indicating the number of carbon atoms i to i〇, and 11 are independent, representing the integer from 〇 to ι〇. An example of the oxoalkylating compound having an amine group at both terminals represented by the above formula (1) or (2) is exemplified by Toshiba Ketone Co., Ltd., trade name: (diaminodioxane) , trade name: TSL9886 (diaminopolyoxyalkylene), sigma name. TSF4706 (diaminodioxane), trade name: XF42 A2645 (diamine polyoxyalkylene) and so on. The ratio of the above-mentioned component of the cerium oxide compound (D) in the second adhesive composition is 〇 5 to 10 by mass of the total solid content. /. 〇.3 to 5 mass 32 317818 ^ ^ sheet of the first semiconductor device with an adhesive sheet (hereinafter referred to as the tenth knot and then (four) to ^ one side 'layered the foregoing invention or the second adhesive composition Adhesive layer formed. Metal support:::1) The support can be made of metal such as copper or aluminum: an exfoliating film, an insulating film, a release paper, etc., especially using a gold film. At least one selected from the group consisting of insulating films is preferred. Take one-methyl ethanediester (hereinafter referred to as palpitations), polythene and other polyglycans, polyamidamine, polyamine, ..., benzene sulfide, polyether ketone, triethylene sulfonate For example, cellulose or the like is preferable, and a film of a material such as an anthracene, a polyene or a polyimine is preferable. The release film may be a phase film as exemplified in the above-mentioned insulating film, and may be released by using a (four) rubber or the like. Preferably, the release agent is used for the manufacture of the adhesive sheet (1), such as at least the surface of the support body containing the coating of the first or second adhesive composition, and then forming an adhesive layer by drying or the like. _ The agent layer is preferably semi-hardened by heat treatment. Special conditions, such as shortening the hardening time, embedding the conductor pattern, etc., inhibiting the mobility and foaming ▲, so it is better to properly control the semi-hardened state. It is better to control the method in the semi-hardened state and the helmet is particularly controlled. L is particularly limited, and the thickness after aging d-drying is preferably in the range of 3 to 4 μm. 5 to ΙΟΟμιη. The adhesive sheet of the present invention which forms an adhesive layer on at least one side of the support (1) 'When it is stored, the releasable film is adhered to the adhesive layer, and it can be made. * 317818 34 1W/:) It is better to prevent the adhesive from being subjected to (4). Therefore, the peelable film can be used. When the sheet is peeled off and the adhesive layer is used alone in the semiconductor device, the peelable film on the upper side can be used as long as it is peeled off from the adhesive side. 1) Peeling Next, the second semiconductor of the present invention The device is characterized in that the adhesive sheet (7) is characterized in that the first or second semiconductor device of the present invention has an adhesive layer formed by the sequential product 1 and an insulating film or stripping layer on at least one side of the metal layer. The film (the heart, and the object is as above == two, the same description of the homogenous layer, the synthetic 臈 and the detachable film. The viscous adhesive sheet (2) has this composition, and secondly, the present invention The third semiconductor device adhesive bonding sheet (3) is characterized in that two layers of the adhesive layer on both sides of the insulating film, and the adhesive composition of the body device are shaped and the % edge Sexual or peeling film. Sheet = layer branch = edge (four) the same description of the film The adhesive layer, the insulating film and the peeling property exemplified above. The adhesive sheet (3) has an excellent electrical stability device because of the composition, and is particularly suitable for a human composition and an adhesive sheet. The circuit board of the 317818 35 or the bottom area of the IC substrate of the various semiconductor Ί&quot;edge layer and conductor circuit structure, or the specific example of the first haptic device can be 4. The semiconductor example For example, a T-BGA using a TAB technology, a screen of a glass epoxy substrate, a 4-layer substrate, a chip-on-package type csp semiconductor, etc. The adhesive composition and the adhesive sheet of the present invention are more specifically used. It is suitable as a protective film between the insulator layer of the IC chip and the ic substrate and/or the adhesive or circuit board which adheres to or forms a circuit, and the protective film of the protection of the semiconductor device as described above. Adhesive. EXAMPLES Hereinafter, the present invention will be described in more detail by way of examples, but the invention should not be construed as limited. Examples 1-28 and Comparative Examples 1-7 [Preparation of Coating Material from Adhesive Composition] The components (A), (b), (c) and (C') were represented by the abbreviations shown in Table 1. , (D) component, decane coupling agent, epoxy hardener, filler, and copolymer containing diene. According to the respective amounts in Table 1 (% by mass of total solids), at room temperature to about 80 ° C Dissolved in toluene to form a coating containing an adhesive composition (solid content concentration: 35 mass%). I The content of the filler is the parts (parts by mass) of the component (A), the component (B), the component (C) or the component (C'), and the component (D) in a total amount of 100 parts by mass. Abbreviations of the respective component classes used in Examples 1 to 28 and Comparative Examples 1 to 7 in Table 1 are shown in Table 2. 36 3J7818 -1】1323275 表哒骟w者爱琪一#: 砌接w叫铋-B-ZTwli^i§铋I丨一术(质量份) Filling CO 丄er» c〇o I (14%费 Ί Φ ♦ money hardener eja I er> C3 1 C9 03⁄4 C9 03⁄4 C3 en C3 er&gt; o er&gt; C3 cr&gt; decane coupling agent « cL oa Cz3 〇&gt; cn c〇〇&gt; e^3 « &lt;7&gt; 09 en ΰϋ CQ (D) component Λ \n CO ό m era· CM 卜 Bub ^- U9 Bub (C) or (C') ingredient ra ώ ϊ〇c〇甘to 1/9 « « £» «〇c〇%t9 «Ο ς-&gt; o 6 \n CO &lt;〇(B)componentΙΑ 1A 一U9 卜60 cc 00 βτ» σ&gt; e^i lA ΙΛ ΙΑ : (A) Component U7 4; N Ξ 5 inch Jc to σ&gt; c*^ CO Λ e&lt; 04 5 rg e&lt;Q CSJ e»ao I ύ • cs ri Cs&gt; CO c〇t-- «0 O o βΝ)

317818V 1323275 【表1-2】317818V 1323275 [Table 1-2]

够瑰噠逋蘅砌?噶鹖-fi-ezWHcoif在辑駟ζ —1:術 (質量份) 填充物 CO ώ ώ era PQ 5 U5 (質量%) 含二烯 聚合體 i 硬化劑 Pu 0.19 0.19 0.19 0.19 X 一 0.1S j 0.19 矽烷偶合劑 eo CX2 e*〇 ύ σ&gt; e&gt;g ·&lt;* Φ% «*« Z cs c〇 Ρΐ (D)成分 令 ά LA 竹 ά CjS Ο 卜 ca » * 才 麵 eo M (C)或(C’)成分 ?〇 o ώ s 56.4 56.5 56.4 : 56.5 56.5 —H 47.1 58.3 (Β)成分 C«3 £β ,丨― ή 仍 en i£&gt; 卜 oo : 寸 卜 OO u» CO 〇%S (Α)成分 U7 c— ui 寸 i 26.3 CM 24.2 i: U3 (A CN 0¾ CO CQ t— irt »_ * 20.1 u&gt; to 〇0 〇3 C^S ca 38 317818 -3】1323275 表Enough to build?噶鹖-fi-ezWHcoif in the series 1-1: surgery (mass parts) Filling material CO ώ ώ era PQ 5 U5 (% by mass) Diene-containing polymer i Hardener Pu 0.19 0.19 0.19 0.19 X A 0.1S j 0.19 Decane coupling agent eo CX2 e*〇ύ σ&gt;e&gt;g·&lt;* Φ% «*« Z cs c〇Ρΐ (D) component order ά LA ά ά CjS Ο ca ca » * 面 face eo M (C) Or (C') ingredient?〇o ώ s 56.4 56.5 56.4 : 56.5 56.5 —H 47.1 58.3 (Β)Component C«3 £β ,丨― ή still en i£&gt; oo: 寸卜OO u» CO 〇 %S (Α) component U7 c— ui inch i 26.3 CM 24.2 i: U3 (A CN 03⁄4 CO CQ t- irt »_ * 20.1 u&gt; to 〇0 〇3 C^S ca 38 317818 -3]1323275

(質量份) 填充物 ec oa 占 eo c〇 (質量%) 含二烯 聚合體 BIS in σ» 硬化劑 esi 丄 0.19 0. L9 1 CV3 o «V9 C3 0.42 0.38 0.19 矽烷偶合劑 ra ώ e«9 cv 丄 C〇 0¾ c*5 kA CO m n (D)成分 工 Λ 03 Λ e— ή 寸 • «£&gt; CT5 (c)或(σ)成分 c〇 Λ 〇 芑 ώ ry^ 47.1 5 〇 CO U3 o 34.3 IA (〇 (Β)成分 CN GQ σ&gt; O) O〇 id 1/3 9 i «0 X cs 26.7 12.4 14.5 en a 44-4 (Α)成分 I______ X LA «0 ea r·* CO 4: 57.3 f· 24.2 c*〇 26.5 t—· «〇 &lt;〇 28.7 c— lA 38.8 〇0 一 GO CQ LT3 CO C~ 丑« S 39 317818θ 丄 【表2】(parts by mass) Filler ec oa oc eo c〇 (% by mass) Diene-containing polymer BIS in σ» Hardener esi 丄0.19 0. L9 1 CV3 o «V9 C3 0.42 0.38 0.19 decane coupling agent ra ώ e«9 Cv 丄C〇03⁄4 c*5 kA CO mn (D) component work 03 Λ e— ή inch • «£&gt; CT5 (c) or (σ) component c〇Λ 〇芑ώ ry^ 47.1 5 〇CO U3 o 34.3 IA (〇(Β) component CN GQ σ&gt; O) O〇id 1/3 9 i «0 X cs 26.7 12.4 14.5 en a 44-4 (Α)Component I______ X LA «0 ea r·* CO 4 : 57.3 f· 24.2 c*〇26.5 t—· «〇&lt;〇28.7 c—lA 38.8 〇0 One GO CQ LT3 CO C~ ugly « S 39 317818θ 丄 [Table 2]

-------------------- 乙稀-甲基丙烯酸縮水甘油酯共聚物(商品名:B〇NDFAST 7^住友化 學工業公司製造)-------------------- Ethylene-glycidyl methacrylate copolymer (trade name: B〇NDFAST 7^Sumitomo Chemical Co., Ltd.)

**'V 40 317818 1323275 接著,使用所得之塗料進行以下之評估。 &quot;(1)硬化前評估 5 [最低熔融黏度] 製成之黏著劑組成物之塗料,再依下列順序測定其硬 化前所測定之動態黏彈性中之最低熔融黏度。其結果如表 3所示。 將上述實施例1-15及比較例〗·6之黏著劑組成物製成 之塗料,以乾燥後厚度成為25μπι之方式而塗布於經剝離 •處理之厚38μιη之聚酯膜上,再於熱風循環型乾燥機中以 130 C乾燥5分鐘,形成黏著劑層。其次,再自聚酯膜上剝 離该製成之黏著劑層單層,該單層之黏著劑層積層複數層 之後’再於積層體之兩面,疊上聚酯膜上之黏著劑層,以 層壓機貼合使全體之黏著劑層成為厚度〇 8mm之層。層墨 機溫度在貼合聚醯亞胺膜(商品名:Upilex 50S,曰本宇部 興產公司製造)時,為+3t-+13°C以内,係觀察反面之熔化 變色之溫度。黏著速度為1 m/min。其次再剝離兩面之聚醋 籲膜’即製成積層複數層黏著劑層之未硬化膜。 製成之未硬化膜再以動態黏彈測定機(HAAKE公司製 造,RS75)測定其最低熔融黏度。 由表3可知’由實施例1-15之結果,未硬化膜在4〇〇 Pa · s至50,000 pa.s之範圍内,為最適之最低炫融黏度。 另一方面,比較例1、3、5及6中之結果,未硬化膜之最 低熔融黏度在400 Pa · s至50,000 Pa . s之範圍外。 [相容性] 317818 41 將上述實施例1-28及比較例1-7之黏著劑組成物之塗 料’使其乾燥後之厚度為25 μιη之方式,塗布於經剝離處 理之厚度38μιη之聚酯膜,再經熱風循環型乾燥機以13〇 °C乾燥5分鐘後.,再黏接於經剝離處理之厚度5〇μιη之聚 乙烯膜上。之後’以顯微鏡觀.察乾燥之黏著劑層,確定(Α) 成分、(Β)成分及(C)成分或(C’)成分之相容狀態。該結果中 並未觀察到分離成線狀紋或網狀纹,因此判斷其相容性 佳’在分離成線狀紋或網狀紋時可判斷其相容性不佳。其 結果在表3中呈示相容性佳者記為〇,相容性不佳者記為 X 0 . 由表3可知’依實施例1-28之結果,本發明之黏著劑 ,組成物之相容狀態佳。相對地,比較例4、6者之相容狀離 不佳》 ^ [埋設性(發泡及填充狀態)] 將上述實施例1 -28及比較例1 -7之黏著劑組成物之塗 料’使其乾燥後之厚度為25μιη之方式,塗布於經剥離處 理之厚度38μπι之聚酯膜上,再經熱風循環型乾燥機以13〇 C乾燥5分鐘後,再黏接於經剝離處理之厚度之聚 乙烯膜上,製成黏著片。 另於撓性基板(商品名:Espanex,新日鐵化學公司製 造)上熱壓接光罩膜,經老化、剝離光罩膜,製成導體/導 體間距離為25μιη/25μιη之梯型電路,在電路上一面剝離聚 乙烯膜一面熱壓接所製作之黏著片。其次剝離其聚酯膜後 於16〇°C下加熱1小時使黏著劑層硬化,作為評估其發泡 317818 42 1323275 &lt;及埋认性之试樣。熱壓接溫度為貼合聚醯亞胺膜(商品名: ,Upilex50s’日本宇部興產公司製造)時,觀察反面之溶化' '變色之溫度。 之後,以顯微鏡觀察其發泡及填充狀態,以下列基準 判別’其結果如表3所示。在發泡方面,未發泡者者記為 〇,發泡者記為填充狀態方面,電路可完全充填者記為 〇,無法完全填充者記為x。表3中與電路黏著性差之有問 題試料者記為「_」。 • 由表3可知,在實施例1-28中,本發明之黏著片未發 泡、對電路之充填亦佳,因此其埋設性佳。相對地,在比 較例1、2、4-7中之結果,在發泡及充填狀態中至少有一 方不佳,實用上在半導體裝置用方面有埋設性方面之問題。 (2)硬化後之評估 * [與聚醢亞胺膜之黏著力(PI黏著力)] (初期狀態之PI黏著力) 將實施例1-28及比較例1-7之黏著劑組成物之塗料, 鲁使其乾燥後之厚度為25 μιη之方式,塗布於經剝離處理之 厚度38μιη之聚酯膜上,再經熱風循環型乾燥機以i3〇〇c 乾燥5分鐘後,再貼合於經剝離處理之厚度5〇gm之聚乙 烯膜上,製成黏著片。 之後’一面剝離聚乙稀膜一面熱壓接該黏著片成為厚 度5〇μπι之聚醯亞胺膜(商品名:Upilex 50S,曰本宇部興 產公司製造)上。熱黏接溫度係在貼合於聚醯亞胺膜(商品 名:Upilex 50S,日本宇部興產公司製造)之時,為觀察反 317818 43 1323275 面發生熔化、變色之以上之溫度。 &quot; 其次,剝離該聚酯膜並熱壓接厚度5〇μπι之聚醯亞胺 ’膜(商品名·· UPilex 50S,日本宇部興產公司製造),再於 160 C下加熱1小時使黏著劑層硬化。黏著力之測定係聚醯 亞胺膜面再固定於檯上,由聚醯亞胺膜另一端以**'V 40 317818 1323275 Next, the following evaluation was carried out using the obtained coating. &quot;(1) Pre-hardening evaluation 5 [Minimum melt viscosity] The coating of the adhesive composition prepared, and the lowest melt viscosity of the dynamic viscoelasticity measured before hardening is measured in the following order. The results are shown in Table 3. The coating materials prepared by the adhesive compositions of the above Examples 1-15 and Comparative Example 6 were applied to a peeled and treated 38 μm thick polyester film to a hot air after drying to a thickness of 25 μm. The adhesive was dried in a circulating dryer at 130 C for 5 minutes to form an adhesive layer. Next, the single layer of the adhesive layer is peeled off from the polyester film, and the adhesive layer of the single layer is laminated, and then the adhesive layer on the polyester film is laminated on both sides of the laminated body to The laminator was bonded so that the entire adhesive layer became a layer having a thickness of 8 mm. When the temperature of the layered ink was applied to a polyimide film (trade name: Upilex 50S, manufactured by Sakamoto Ube Industries Co., Ltd.), it was within +3t to +13 °C, and the temperature at which the reverse side was melted was observed. The adhesion speed is 1 m/min. Next, the two sides of the vinegar are peeled off, and the uncured film of the plurality of layers of the adhesive layer is formed. The resulting uncured film was measured for its minimum melt viscosity by a dynamic viscoelasticity measuring machine (manufactured by HAAKE Co., Ltd., RS75). It can be seen from Table 3 that, as a result of Examples 1-15, the uncured film is in the range of 4 〇〇 Pa · s to 50,000 pa.s, which is the optimum minimum viscous viscosity. On the other hand, as a result of Comparative Examples 1, 3, 5 and 6, the lowest melt viscosity of the uncured film was outside the range of 400 Pa · s to 50,000 Pa · s. [Compatibility] 317818 41 The coating of the adhesive composition of the above Examples 1-28 and Comparative Examples 1-7 was dried to a thickness of 25 μm, and applied to a thickness of 38 μm of the peeled treatment. The ester film was dried by a hot air circulation type dryer at 13 ° C for 5 minutes, and then adhered to a peeled polyethylene film having a thickness of 5 μm. Thereafter, the dry adhesive layer was observed by a microscope to determine the compatibility state of the (Α) component, the (Β) component, and the (C) component or the (C') component. In the results, no separation into a linear pattern or a reticular pattern was observed, so that it was judged that the compatibility was good. When the separation into a linear pattern or a reticular pattern, it was judged that the compatibility was poor. The results are shown in Table 3 as those with good compatibility as 〇, and those with poor compatibility are recorded as X 0 . It can be seen from Table 3 that, according to the results of Examples 1-28, the adhesive of the present invention, the composition Good compatibility. In contrast, Comparative Examples 4 and 6 have poor compatibility. [Embedded (foamed and filled state)] The coatings of the adhesive compositions of the above Examples 1-28 and Comparative Examples 1-7' After drying to a thickness of 25 μm, it was applied to a polyester film having a thickness of 38 μm which was peeled off, and then dried at 13 ° C for 5 minutes in a hot air circulation type dryer, and then bonded to the thickness of the peeled treatment. On the polyethylene film, an adhesive sheet is formed. In addition, a photomask film is thermocompression-bonded on a flexible substrate (trade name: Espanex, manufactured by Nippon Steel Chemical Co., Ltd.), and the mask film is aged and peeled off to form a ladder-type circuit having a conductor/conductor distance of 25 μm/25 μm. The adhesive sheet produced by thermocompression bonding is peeled off on the circuit while peeling off the polyethylene film. Next, the polyester film was peeled off and then heated at 16 ° C for 1 hour to harden the adhesive layer as a sample for evaluation of foaming 317818 42 1323275 &lt;RTIgt; When the thermocompression bonding temperature was applied to a polyimide film (trade name:, Upilex 50s' manufactured by Ube Industries, Japan), the melting temperature of the reverse side was observed. Thereafter, the foaming and filling state were observed under a microscope, and the results were judged by the following criteria. The results are shown in Table 3. In terms of foaming, the unfoamed person is referred to as 〇, and the foaming person is referred to as the filling state, and the circuit can be fully filled as 〇, and the incompletely filled person is recorded as x. The problem with the poor adhesion of the circuit in Table 3 is recorded as "_". • As is apparent from Table 3, in Example 1-28, the adhesive sheet of the present invention is not foamed and filled with a circuit, and therefore has excellent embedding property. On the other hand, in the results of Comparative Examples 1, 2, and 4-7, at least one of the foaming and filling states is not preferable, and there is a problem in terms of embedding in practical use of the semiconductor device. (2) Evaluation after hardening * [Adhesion to polyimine film (PI adhesion)] (PI adhesion in an initial state) The adhesive compositions of Examples 1-28 and Comparative Examples 1-7 were used. The coating is applied to a polyester film having a thickness of 38 μm after being dried, and then dried by a hot air circulation type dryer at i3〇〇c for 5 minutes, and then attached thereto. Adhesive sheets were prepared by peeling off a polyethylene film having a thickness of 5 〇gm. Then, the adhesive sheet was heat-bonded to a polyimine film having a thickness of 5 μm (trade name: Upilex 50S, manufactured by Sakamoto Ube Industries Co., Ltd.) while peeling off the polyethylene film. The heat bonding temperature was measured at the temperature above the melting and discoloration of the surface of the anti-317818 43 1323275 when it was bonded to a polyimide film (trade name: Upilex 50S, manufactured by Ube Industries, Japan). &quot; Next, the polyester film was peeled off and thermobonded to a polyimide film of 5 μm μm thickness (trade name · UPilex 50S, manufactured by Ube Industries, Japan), and heated at 160 C for 1 hour to adhere The layer is hardened. The adhesion is determined by the polyimine film surface and then fixed on the table, from the other end of the polyimide film.

Tensilon(島津製作所製造)向18〇。方向拉剝測定其結果如 表3所示。 (恆溫恆濕試驗(PCT)後之PI黏著力) 鲁 再使用如上述相同之評估用試樣,測定如下之PCT後 之黏著力。 〇PCT係使用恒溫恒濕槽’以如下之條件操作。溫度·· 121°C、濕度:l〇0%RH、時間:3〇〇小時。黏著力之測定 為將聚醯亞胺膜面固定於檯上,由聚酿亞胺膜另一端以 .Tensilon(島津製作所製造)向180。方向拉剝測定,其結果如 表3所示。 由表3.可知,在實施例1-28中,本發明之黏著片在初 φ期狀態及PCT後之黏著力$ 2 2㈣⑷以上因此對聚酿 亞胺膜有充分之黏著力。特別是在實施例中,本發明 之黏著片之黏著力為4.2 (N/Cm)以上,特別優1。 相對地,在比較例U7中之結果,在pCT後之黏著力 為〇,因此在半導體裝置用上不堪使用。 [與銅箔之黏著力(Cu黏著力)] (初期狀態之Cu黏著力) 將實施例⑽及比較例Μ之黏著劑組成物之塗料, 317818 44Tensilon (made by Shimadzu Corporation) is 18 baht. The results of the direction peeling measurement are shown in Table 3. (PI adhesion after constant temperature and humidity test (PCT)) Lu The same evaluation sample as above was used, and the following adhesion after PCT was measured. The PCT system was operated under the following conditions using a constant temperature and humidity chamber. Temperature · 121 ° C, humidity: l 〇 0% RH, time: 3 〇〇 hours. The adhesion was measured by fixing the polyimide film surface to the stage, and the other end of the polyimide film was 180 in a Tensilon (manufactured by Shimadzu Corporation). The direction was measured by peeling and the results are shown in Table 3. As is apparent from Table 3, in Examples 1 to 28, the adhesive sheet of the present invention had an adhesive force of $2 2 (four) (4) or more in the initial stage of φ and after PCT, and thus had sufficient adhesion to the polyimide film. Particularly in the examples, the adhesive sheet of the present invention has an adhesive force of 4.2 (N/cm or more), particularly preferably 1. In contrast, in the case of Comparative Example U7, the adhesive force after pCT was 〇, and thus it was unusable for use in a semiconductor device. [Adhesion to Copper Foil (Cu Adhesion)] (Cu Adhesion in Initial State) Coating of Adhesive Composition of Example (10) and Comparative Example, 317818 44

1JZJZ/J t乾無後之厚度為25μιη之方式,塗布於經剝離處理之 子度3_之聚醋膜上,再經熱風循環型乾操機以⑽。c 乾燥5分鐘並形成黏著劑層後,再於該黏著劑層上貼合嗤 剝離處理之厚度5,之聚乙軸,製成黏著片。 之後’-面剝離聚乙烯膜—面熱壓接該黏著 1㈣之銅落(商品名··沉-A,Japan Ε膽gy c〇製 : 熱歷接溫度與前述評估中之聚醯亞胺膜(商品名:Upilex 50S,日本宇部興產公司製造)之時相同,為觀察反面發生 熔化、變色之以上之溫度。 其次’剝離該聚醋膜並轨壓接 胰U接在厚18_之銅箔(商品 名.JTC-A’ JapanEnergy c〇.製造)上,再於⑽亡下加敎 =、時使黏著劑層硬化。黏著力之敎為將㈣面固定二 :,由銅箱另一端以—(島津製作所製造)向⑽。 方向拉剝測定,其結果如表3所示。 (PCT後之Cu黏著力) 之後再以相同之評估用試樣測定pct後之Cu黏著力。 恒溫恒濕試驗係使用恒溫恒濕槽,以如下之條件操 ,。溫度:urc、濕度:聰RH、時間:3〇〇小時。黏 者力之測定為將銅箱面固定於檯上,由㈣另一端以 島津製作所製造)向180°方向拉剝測定,其結果如 衣3所示。 期狀t:可知’在貫施例1-28中’本發明之黏著片在初 Γ右Γ ί ί之Cu黏著力為2.6(N/cm)以上,因此對銅 刀之黏著力。特別是在實施例i七中,本發明之黏 317818 45 1323275 著片在初期狀態及恒溫恒濕試驗後之黏接力為5 1(N/cm) 以上,尤其有充分之黏著力。 相對地,在比較例1 _7中之結果,在pct後之黏著力 為2.5(N/cm)以下’尤其比較例1 _3、比較例6、及比較例 7中,在PCT後之黏著力為2(N/cm)以下,因此在半導體 裝置用上不堪使用。 [耐迴焊性] 將實施例1 -28及比較例1 -7之黏著劑組成物之塗料, 鲁使其乾無後之厚度為25 μιη之方式,塗布於經剝離處理之 厚度38μιη之聚酯膜上’再經熱風循環型乾燥機以ι3〇&lt;5(: 乾燥5分鐘製成黏著片後’再貼合經剝離處理之厚度50μιη 之聚乙烯膜。 • 之後’一面剝離聚乙烯膜一面將該黏著片熱壓接在厚 200μιη、大小2.5cmx2.5cm之銅部份經蝕刻之玻璃環氧基 板(商品名:CCL-EL170,日本三菱瓦斯化學公司製造)上。 熱壓接溫度係貼合於玻璃環氧基板(商品名: φ CCL-EL170’曰本三菱瓦斯化學公司製造)之時為觀察反面 發生熔化、變色之以上之溫度。 其次,剝離該聚酯膜,並將0.9cmx〇·7cm之玻璃晶片 以熱壓接溫度、加熱3分鐘、O.IMPa壓力進行熱壓接,再 以90°C加熱1小時,再160°C下加熱1小時,使黏著劑層 硬化,製成共5個使用於各實施例及比較例中之耐迴焊性 評估用試樣。 以85°C、85%RH條件將該評估用試樣曝於恒溫恒濕 46 317818 丄 。槽中48小時’之後再通過設定為26〇t&gt;c之ir迴禪爐,並 •觀察有無層間剝離、產生氣泡,其其結果如表3所示。表 3中記錄5個試樣中無層間剝離及產生氣泡之數 之値數/5個)〇 由表3可知,在實施例卜28中,本發明之黏著片無層 間剝離及產生氣泡,5個均為良好。 相對地,比較例丨-7中之黏著片並非5個均為良好, 其令至少有2個以上發生層間剝離或產生氣泡。 # [耐熱溫度循環性(TCT性)] 將實施例1-28及比較例1_7之黏著劑組成物之塗料, f其乾燥後之厚度為25μπι之方式,塗布於經剝離處理之 •厚度38μιη之聚酯膜上,再經熱風循環型乾燥機以13〇它 乾燥5分鐘製成黏著片後’再貼合經剝離處理之厚度$叫瓜 之聚乙烯膜。 之後,一面剝離聚乙烯膜一面將該黏著片熱壓接在厚 200μιη、大小2.5cmx2.5cm之鋼部份經蝕刻之玻璃環氧基 籲板(商品名:CCL-EL170,日本三菱瓦斯化學公司製造)上。 熱壓接溫度係貼合於玻璃環氧基板(商品名: CCL-EL170,日本三菱瓦斯化學公司製造)時,為觀察反面 發生熔化、變色之以上之溫度。 其次,剝離該聚酯膜,並以熱壓接溫度、〇 1MPa壓力 將〇.9cmx0.7Cin之玻璃晶片熱壓接3分鐘,再以9〇&lt;t加熱 1小時,及16CTC下加熱1小時,使黏著劑層硬化,製成共 5個使用於各實施例及比較例中之耐溫度循環性評估用試 317818 47 13232751JZJZ/J t is not applied to a thickness of 25 μm, and is applied to a polyester film having a peeling treatment of 3 mm, and then subjected to a hot air circulation type dry machine (10). c After drying for 5 minutes and forming an adhesive layer, the thickness of the bismuth peeling treatment is applied to the adhesive layer to form an adhesive sheet. After the '-face peeling polyethylene film-face thermocompression bonding the adhesion 1 (four) of the copper drop (trade name · Shen-A, Japan Ε gy gy c〇 system: heat calendar temperature and the above evaluation of the polyimide film (The product name: Upilex 50S, manufactured by Japan Ube Industries Co., Ltd.) is the same as the temperature above the melting and discoloration of the reverse side. Next, 'Peeling the polyester film and bonding the U-tube to the thickness of the copper On the foil (trade name. JTC-A' Japan Energy c〇. manufactured), and then (10) smashed down, the adhesive layer is hardened. The adhesion force is the (four) surface fixed two: from the other end of the copper box The results were as shown in Table 3 (manufactured by Shimadzu Corporation). The results are shown in Table 3. (Cu adhesion after PCT) The Cu adhesion after pct was measured using the same evaluation sample. The wet test system uses a constant temperature and humidity chamber and operates under the following conditions: temperature: urc, humidity: Satoshi RH, time: 3 hrs. The adhesion is determined by fixing the copper box surface on the table, and (4) One end was produced by Shimadzu Corporation, and the measurement was performed in the 180° direction. The result is shown in the clothes 3. The period t: It is understood that the adhesive sheet of the present invention in the first embodiment of the present invention has an adhesion of 2.6 (N/cm) or more to the Cu, and thus the adhesion to the copper knife. Particularly in the case of the seventh embodiment, the adhesive of the present invention has an adhesive strength of 5 1 (N/cm) or more in the initial state and after the constant temperature and humidity test, and particularly has sufficient adhesion. In contrast, in the results of Comparative Example 1-7, the adhesion after pct was 2.5 (N/cm) or less. In particular, in Comparative Example 1_3, Comparative Example 6, and Comparative Example 7, the adhesion after PCT was 2 (N/cm) or less, so it is unusable for use in a semiconductor device. [Reflow resistance] The coatings of the adhesive compositions of Examples 1 to 28 and Comparative Examples 1 to 7 were applied to a thickness of 25 μm, which was subjected to a peeling treatment, and a thickness of 38 μm. On the ester film, the film was then passed through a hot air circulation type dryer at ι 3 〇 &lt; 5 (: after drying for 5 minutes to form an adhesive sheet, and then attached to a polyethylene film having a thickness of 50 μm which was peeled off.) The adhesive sheet was thermocompression bonded to a copper-etched glass epoxy substrate (trade name: CCL-EL170, manufactured by Mitsubishi Gas Chemical Co., Ltd.) having a thickness of 200 μm and a size of 2.5 cm x 2.5 cm. When it is bonded to a glass epoxy substrate (trade name: φ CCL-EL170' 曰Mitsubishi Gas Chemical Co., Ltd.), the temperature at which the reverse side is melted or discolored is observed. Next, the polyester film is peeled off and 0.9 cmx is applied. 7·7cm glass wafer is thermocompression bonded at a thermocompression bonding temperature, heating for 3 minutes, O.IMPa pressure, and then heated at 90 ° C for 1 hour, and then heated at 160 ° C for 1 hour to harden the adhesive layer. A total of 5 are used in each of the examples and comparative examples. Sample for evaluation of reflow resistance. The sample for evaluation was exposed to a constant temperature and humidity of 46 317818 85 at 85 ° C and 85% RH. After 48 hours in the tank, the ir was set to 26 〇t&gt; Return to the Zen furnace, and observe whether there is delamination between the layers and the generation of air bubbles. The results are shown in Table 3. In Table 3, the number of defects in the number of layers without peeling and the number of bubbles generated in the five samples is recorded. 3 In the example 28, the adhesive sheet of the present invention has no interlayer peeling and bubble generation, and all of the adhesive sheets are good. In contrast, not all of the adhesive sheets in Comparative Example-7 were good, and at least two or more of them were peeled off or bubbles were generated. # [heat-resistant temperature cycle property (TCT property)] The coating composition of the adhesive compositions of Examples 1-28 and Comparative Example 1-7 was applied to the thickness of the coating after peeling treatment to a thickness of 25 μm. On the polyester film, it was dried by a hot air circulation type dryer for 13 minutes, and then dried to form an adhesive sheet. Then, while peeling off the polyethylene film, the adhesive sheet was thermocompression bonded to a steel portion having a thickness of 200 μm and a size of 2.5 cm x 2.5 cm. The etched glass epoxy-based plate (trade name: CCL-EL170, Mitsubishi Gas Chemical Co., Ltd., Japan) Made). When the thermocompression bonding temperature was applied to a glass epoxy substrate (trade name: CCL-EL170, manufactured by Mitsubishi Gas Chemical Co., Ltd.), the temperature at which the reverse side was melted or discolored was observed. Next, the polyester film was peeled off, and a glass film of 〇.9 cm x 0.7 Cin was thermocompression-bonded at a thermocompression bonding temperature of 〇1 MPa for 3 minutes, heated at 9 Torr &lt;t for 1 hour, and heated at 16 CTC for 1 hour. To harden the adhesive layer, and make a total of 5 samples for temperature cycle resistance evaluation in each of the examples and comparative examples 317818 47 1323275

再以該評估用試樣進行 驗。 -65°C至150〇C之溫度循 環試 :清況下’各須經15吖及-6汴各3。分鐘 Γ ΤΓ:^ 1,000循裱之條件下操作。 溫度循環試驗操作後,觀察有無制卿、產 =…所示。表3中記錄5個試樣中並無層間剝離 5 轧/包之優良者數目(即良好之個數/5個)。 由表3可知,在貫施例j_28中,本發明之黏著片未益 層間剝離或產线泡,5個均為良好。相對地,比較例/二 中之黏著片均發生層間剝離或產生氣泡,5個均非為良好 者。 [動態黏彈性] 將實施Ϊ列1-15及比較例之黏著劑、组成物之塗料, ^其乾燥後之厚度為25μηι之方式,塗布於經剝離處理之 %度38Mm之聚酯膜上,再經熱風循環型乾燥機以13〇艺 乾燥5分鐘製成黏著劑層。再自聚酯膜上剝離所得之黏著 劓層並作為單層,積層複數單層之黏著劑層後,再於積層 體之兩面上再積層黏著劑層,以層壓機加以貼合使總黏著 劑層成為厚度〇.lmm之層。層壓機溫度係貼合於聚醯亞胺 臈(商品名:Upilex 50S,日本宇部興產公司製造)之時,為 觀察反面發生熔化之溫度,在+3。(:至+13。〇以内。貼合速 度為lm/min。其次再剝離兩面之聚酯膜,即製成積層複數 48 317818 〇’ 1323275 ^ 層黏著劑層之未硬化膜。 . 未硬化膜再於160°C下加熱1小時’使黏著劑層硬化, .製成4mmx5mm之動態黏彈率評估用試樣,評估硬化後於 200°C-280°C下之動態黏彈率(為硬化後動態黏彈率)。 測定條件為以 Orientech Co.製造之Rheovibron DDV-II以頻數11Hz、升溫速度3。。/分鐘測定之值。 再以同樣之評估用試樣測定硬化後再於l5〇t:環境下 放置24小時後於20〇1_280。(:下之動態黏彈率(為==歷 ·· (thermal history)後之動態黏彈率)。 加熱相之溫度.150 C、時間:24小時(η)後,再以 Orientech Co.製造之 Rheovibron DDV-Π 以頻數 UHz、升 溫速度3t/分鐘測定。 各結果如表3所示。 由表3可知,在實施例1 _i 5中,如比較本發明之黏著 片之硬化後動態黏彈率及熱經歷後動態黏彈率時,其變化 φ少。由此結果可知,其耐熱劣化性良好。 另方面比較例I-4中之黏者片之硬化後動態黏彈 率及熱經歷後動態黏彈率變化大,其耐熱劣化性不佳。 [吸濕率] 將上述實施例1_28及比較例丨-7之黏著劑組成物之塗 料,使其乾燥後之厚度為60μιη之方式,塗布於經剝離處 理之厚度38μιη之聚酯膜上’再經熱風循環型乾燥機以13〇 °C乾燥5分鐘製成黏著劑層,製成黏著片後,再貼人 5〇μηι經剝離處理之聚乙烯膜。 〇予 317818 / 49 I323275The test sample is then tested. Temperature cycling from -65 ° C to 150 ° C: Under conditions, each must be 15 吖 and -6 汴 each. Minutes Γ ΤΓ: ^ 1,000 cycles of operation. After the temperature cycle test operation, observe whether there is no control, production = .... In Table 3, the number of excellent peelings/rollings in 5 samples was not recorded (i.e., the number of good ones was 5). As is apparent from Table 3, in the example j_28, the adhesive sheet of the present invention was not peeled off from the interlayer or line-forming, and all of the adhesive sheets were good. In contrast, in the adhesive sheets of Comparative Example/Second, interlayer peeling or bubble generation occurred, and none of the five were good. [Dynamic viscoelasticity] The coatings of the adhesives and compositions of the first and second comparative examples and the comparative examples were applied, and the thickness of the dried coatings was 25 μm, and applied to a polyester film having a peeling treatment of 38 Mm. The adhesive layer was further dried by a hot air circulation type dryer at 13 minutes for 5 minutes. Then, the obtained adhesive layer is peeled off from the polyester film and used as a single layer. After laminating a plurality of single-layer adhesive layers, an adhesive layer is further laminated on both sides of the laminated body, and the laminate is laminated to make the total adhesion. The layer of the agent becomes a layer having a thickness of 〇.lmm. When the temperature of the laminator was applied to the polyimide (trade name: Upilex 50S, manufactured by Ube Industries, Japan), the temperature at which the opposite side melted was observed at +3. (: to +13. Within the crucible. The laminating speed is lm/min. Secondly, the polyester film on both sides is peeled off to form an uncured film of a layer of adhesive layer of 48 317818 〇 '1323275 ^ layer. After heating at 160 ° C for 1 hour to harden the adhesive layer, a dynamic viscoelasticity evaluation sample of 4 mm x 5 mm was prepared to evaluate the dynamic viscoelasticity at 200 ° C to 280 ° C after hardening (for hardening) Post-dynamic viscoelasticity rate. The measurement conditions were the values of Rheviibron DDV-II manufactured by Orientech Co. at a frequency of 11 Hz and a temperature increase rate of 3.8%, and then the same evaluation sample was used to measure the hardening and then at 15 °. t: After standing for 24 hours in the environment, at 20〇1_280. (: Dynamic viscoelasticity rate (dynamic viscoelasticity rate after == thermal history). Temperature of heating phase. 150 C, time: After 24 hours (η), Rheviibron DDV-Π manufactured by Orientech Co. was measured at a frequency UHz and a temperature increase rate of 3 t/min. The results are shown in Table 3. As is apparent from Table 3, in Example 1 - i 5 For example, when comparing the dynamic viscoelasticity rate of the adhesive sheet of the present invention after hardening and the dynamic viscoelasticity rate after thermal experience, As a result, it was found that the heat deterioration resistance was good. On the other hand, the dynamic viscoelasticity of the adhesive sheet in Comparative Example I-4 and the dynamic viscoelasticity after the thermal history were large, and the heat deterioration resistance was not [Moisture absorption rate] The coating materials of the adhesive compositions of the above Examples 1 to 28 and Comparative Example 丨-7 were applied to a polyester film having a thickness of 38 μm which was subjected to release treatment after being dried to a thickness of 60 μm. 'The adhesive layer was made by drying in a hot air circulation type dryer at 13 ° C for 5 minutes to form an adhesive sheet, and then peeled off the polyethylene film by 5 〇 μηι. 〇 317818 / 49 I323275

之後再剝離聚乙烯膜及聚酯膜,更於160°C下加熱1 、小時,使黏著劑層硬化’製成5cmx5cm之吸濕率評估用試 k樣,並測定吸濕率。吸濕之條件係使用恒溫恒濕槽,以如 下所示之條件操作。溫度:121°C、濕度·· l〇〇%RH、時間: 24小時。之後以下式計算其吸濕率,其結果如表3所示。 吸濕率(%)=(吸濕後之試樣重量-吸濕前之試樣重量)/吸濕 前之試樣重量xlOO 由表3可知,在實施例1 -28中,本發明之黏著片之吸 鲁濕率為0.7%以下,該結果在實用上並無問題。 相對地,在比較例1、3、5、及7中之吸濕率為1 3 % 以上,此結果在半導體裝置用上有實用上之問題。 [拉伸率] 將上述實施例卜28及比較例1-7之黏著劑組成物之塗 • 料’使其乾燥後之厚度為60μιη之方式,塗布於經剝離處 理之厚度38μπι之聚酯膜上,再經熱風循環型乾燥機以13〇 °C乾燥5分鐘製成黏著劑層,製成黏著片後,再貼合厚 φ 5〇μιη經剝離處理之聚乙烯膜。 之後再剝離聚乙烯膜及聚酯膜’更於16〇它下加熱^ 小時’使黏著劑層硬化,製成lcmxl2cm之拉伸率評估用 試樣,並評估該拉伸率。 拉伸率之測定方法係以Tensil〇n(島津製作所 定’再以下式計算其拉伸率,其結果如表3所示。 '、 拉伸率(%)=(拉伸後之試樣長度_拉伸前之試樣長度)/拉伸Thereafter, the polyethylene film and the polyester film were peeled off, and the adhesive layer was further cured by heating at 160 ° C for 1 hour to make a moisture absorption rate evaluation sample of 5 cm x 5 cm, and the moisture absorption rate was measured. The moisture absorption conditions were carried out using a constant temperature and humidity chamber under the conditions shown below. Temperature: 121 ° C, humidity · · l〇〇% RH, time: 24 hours. The moisture absorption rate was calculated by the following formula, and the results are shown in Table 3. Moisture absorption rate (%) = (weight of sample after moisture absorption - weight of sample before moisture absorption) / weight of sample before moisture absorption xlOO As can be seen from Table 3, in Example 1-28, the adhesion of the present invention The film has a moisture absorption rate of 0.7% or less, and the result is practically no problem. On the other hand, in the comparative examples 1, 3, 5, and 7, the moisture absorption rate was 13% or more, and this result has practical problems in semiconductor devices. [Elongation ratio] The coating material of the above-mentioned Example 28 and the adhesive composition of Comparative Example 1-7 was dried to a thickness of 60 μm, and applied to a peel-treated polyester film having a thickness of 38 μm. Then, the adhesive layer was dried by a hot air circulation type dryer at 13 ° C for 5 minutes to form an adhesive sheet, and then a polyethylene film having a thickness of φ 5 〇 μηη was attached. Thereafter, the polyethylene film and the polyester film were peeled off, and the adhesive layer was cured by heating under the pressure of 16 Å to prepare a tensile strength evaluation sample of 1 cm x 12 cm, and the elongation was evaluated. The elongation rate was measured by Tensil(R) (Shimadzu Corporation) and the elongation was calculated by the following formula. The results are shown in Table 3. ', elongation (%) = (length of the sample after stretching) _ length of sample before stretching) / stretching

前之試樣長度xlOO 317838 50 1323275 由表3可知’在實施例U中’本發明之黏著片之拉 伸率為30%以上,可確定其應力鬆弛性優良。相對地,在 =及3中,其吸濕率一下,可確定其應力鬆 [電氣特性] 將上述貫施命J 1-28及比較mu之黏著劑組成物之塗 担’,其乾燥後之厚度為25,之方式,塗布於經剝離處 ,厚度38μπι之聚醋膜上,再經熱風循環型乾燥機以m /乾燥5分鐘製成黏著劑層,製成黏著片後,再貼合厚 5〇μιη之經剝離處理之聚乙烯膜,製成黏著片。 &quot;予 、另於撓性基板(商品名:Espanex,新曰鐵化學公司製 ί)門H接^罩膜,經老化、剝離光罩膜,製成導體/導 乙㈣ 5_之梳型電路’在電路上一面剥離聚 -面熱屢接其製作之黏著片。其次剥離其聚醋膜後 特性之試^熱1小時使黏著劑層硬化,作為評估其電氣 =樣再於溫度:峨、濕度:_Η之恒溫恒濕 ' 5V電麗之直流電並使之曝於其中300小時。 „恒溫恒濕槽令取出後,觀察梳型電路上之導體(銅 =份)上有無電氣腐钱,在梯型電路上之導體㈤落部份) “、加凡尼腐財記為〇,有加凡尼賴者 ;^路黏著性差之有問題試料者記為「_」。其結果如表 由表3可知,在實施例K28中,本發明之黎著片在梳 317818 51 1323275 型電路上之導體(銅箔部份)上無加凡尼腐餘,因此實用上 -並無問題。相對地,在比較例2-7中,發生加凡尼腐姓, *此結果在實際用於半導體裝置時係問題者。 [趣曲] 將上述實施例16-28及比較例1 -7之黏著劑組成物之 塗料’使其乾餘後之厚度為6 Ο μιη之方式,塗布於經剝離 處理之厚38μηι之聚酯膜上,再經熱風循環型乾燥機以13〇 C乾燥製成黏著劑層’製成黏著片後,再貼合厚5〇μπι之 φ經剝離處理之聚乙烯膜。 之後,一面剝離聚乙烯膜及聚酯膜一面將厚75μιη之 聚醯亞胺膜(商品名:Upilex75S,日本宇部興產公司製造) 熱壓接於黏著劑層之兩面。再裁切成寬7〇mm大小後,於 160 C下加熱1小時使黏著劑層硬化,製成聚醯亞胺膜積層 體。該硬化之聚酿亞胺膜積層體再裁切成7〇mmx5mm後, 作為評估翹曲特性之試樣。該評估試樣再置於水平平檯上 成凸出狀之形態,以數位測定顯微鏡(商品名: # STM-UM,〇lympus公司製造)測定凸出之高度。其結果如表 3所示。 由表3可知,在實施例16·28中,本發明之黏著片之 翹曲為1.5nm以下’此結果在實用上並無問題。相對地, 在比較例2、3及6中,輕曲為3mm以上,此結果在實際 用於半導體裝置時係有問題者。比較例i及7中,因試樣 卷曲而無法測定其翹曲。 317818 52 1323275 【表3-1】 測定結果 最低熔融黏度(Pa . s) 動態黏彈, 硬化餐 卜生(Mpa)* 1 熱經歷後 實 施 例 1 4,000 5至1〇 6至11 2 5,000 6至11 7至12 3 3,000 4至8 5至9 4 4,000 10 至 15 12 至 18 5 1,000 20至1可 30 至 300 6 500 |3〇 ^ 180~ 30 至 350 7 10,000 30 至 50 40 至 60 8 4,000 3至6 4至8 9 5,000 4至8 5至10 10 6,000 5至10 7至14 11 15,000 〇·8 至 2 1至4 12 40,000 30 至 50 30 至 60 13 30,000 0.6 至 2 0.8 至 4 14 15,000 5至20 10 至 30 15 8,000 5至20 10 至 30 *1 : 200至280°C下之最小值至最大值(MPa) 【表3-2】 1 最低熔融黏度(Pa . s) 動態黏彈性(Mpa)* 1 硬化後 硬化後 比 較 例 .1 100 20 至 60 5至10 2 1,500 50 至 80 5至10 3 100 30 至 60 5至10 4 3,000 30 至 60 5至10 5 90,000 10 至 15 5至10 6 200 5至10 5至10 *1 ·· 200至280C下之最小值至最大值(]y[pa) 53 317818 1323275The length of the sample before it is xlOO 317838 50 1323275 It can be seen from Table 3 that in the embodiment U, the stretched sheet of the present invention has a tensile elongation of 30% or more, and it is confirmed that the stress relaxation property is excellent. In contrast, in the = and 3, the moisture absorption rate can be determined, and the stress relaxation can be determined. [Electrical characteristics] The above-mentioned application of the adhesive composition of J 1-28 and the comparison of mu is carried out, and after drying, The thickness is 25, and it is applied on a polylactic acid film having a thickness of 38 μm on a peeling place, and then an adhesive layer is formed by m/drying for 5 minutes through a hot air circulation type dryer to form an adhesive sheet, and then attached to a thick layer. 5 〇 μηη of the peeled polyethylene film to make an adhesive sheet. &quot;Previously, the flexible substrate (trade name: Espanex, manufactured by Xinyi Iron Chemical Co., Ltd.) is connected with the cover film, and after aging and peeling off the mask film, it is made into a conductor/guide B (4). The circuit's one side of the circuit is stripped of the poly-face heat and the adhesive sheet produced by it is repeatedly connected. Secondly, peeling off the characteristics of the polyester film after the test, heat 1 hour to harden the adhesive layer, as an evaluation of its electrical = sample and then temperature: 峨, humidity: _ Η 恒温 constant temperature and humidity ' 5V electric 之 DC and expose it to 300 hours of it. „After the constant temperature and humidity chamber is taken out, observe whether there is electrical decay on the conductor (copper=part) on the comb circuit, and the conductor (five) on the ladder circuit) “, Gaffney’s rot is 〇, There are people who have Gavigny; if there is a problem with the poor adhesion of the road, the sample is recorded as "_". As a result, as shown in Table 3, in the embodiment K28, the Lilass piece of the present invention has no Gaffani rot on the conductor (copper foil portion) of the comb type 317818 51 1323275 type circuit, so practically - no problem. In contrast, in Comparative Example 2-7, the Gaffini rot was generated, and this result was a problem when actually used for a semiconductor device. [Interesting] The coating of the adhesive composition of the above Examples 16-28 and Comparative Examples 1-7 was applied to the peeled and treated 38 μηι thick polyester in such a manner that the thickness of the coating of the adhesive composition was 6 Ο μηη after drying. On the film, an adhesive layer was prepared by drying at 13 ° C in a hot air circulation type dryer, and then a polyethylene film having a thickness of 5 μm μm was peeled off. Then, a polyethylene film and a polyester film were peeled off, and a polyimide film (trade name: Upilex 75S, manufactured by Ube Industries, Ltd., Japan) having a thickness of 75 μm was thermocompression bonded to both surfaces of the adhesive layer. After cutting into a width of 7 mm, the film was heated at 160 C for 1 hour to harden the adhesive layer to form a polyimide film. The hardened polyimide film laminate was further cut into 7 mm x 5 mm and used as a sample for evaluating warpage characteristics. The evaluation sample was placed on a horizontal platform to have a convex shape, and the height of the projection was measured by a digital measuring microscope (trade name: #STM-UM, manufactured by 〇lympus Co., Ltd.). The results are shown in Table 3. As is clear from Table 3, in Example 16·28, the warpage of the adhesive sheet of the present invention was 1.5 nm or less. This result is practically not problematic. In contrast, in Comparative Examples 2, 3, and 6, the light curvature was 3 mm or more, and this result was a problem when it was actually used for a semiconductor device. In Comparative Examples i and 7, the warpage could not be measured because the sample was curled. 317818 52 1323275 [Table 3-1] Determination of the lowest melt viscosity (Pa. s) Dynamic viscoelastic, hardened meal (Mpa)* 1 Thermal experience after Example 1 4,000 5 to 1〇6 to 11 2 5,000 6 to 11 7 to 12 3 3,000 4 to 8 5 to 9 4 4,000 10 to 15 12 to 18 5 1,000 20 to 1 to 30 to 300 6 500 |3〇^ 180 to 30 to 350 7 10,000 30 to 50 40 to 60 8 4,000 3 to 6 4 to 8 9 5,000 4 to 8 5 to 10 10 6,000 5 to 10 7 to 14 11 15,000 〇·8 to 2 1 to 4 12 40,000 30 to 50 30 to 60 13 30,000 0.6 to 2 0.8 to 4 14 15,000 5 to 20 10 to 30 15 8,000 5 to 20 10 to 30 *1 : Minimum to maximum value (MPa) at 200 to 280 ° C [Table 3-2] 1 Minimum melt viscosity (Pa . s) Dynamic viscoelasticity (Mpa)* 1 Comparative example after hardening. 1 100 20 to 60 5 to 10 2 1,500 50 to 80 5 to 10 3 100 30 to 60 5 to 10 4 3,000 30 to 60 5 to 10 5 90,000 10 to 15 5 To 10 6 200 5 to 10 5 to 10 *1 ·· 200 to 280C minimum to maximum (]y[pa) 53 317818 1323275

&lt;垅鉍莨S丨Mti&lt;垅铋莨S丨Mti

埋設性 充填狀態 〇 〇 〇 〇 〇 o 〇 o 〇 〇 O O 〇 〇 〇 發泡 〇 〇 〇 〇 O 〇 〇 o 〇 〇 〇 〇 〇 〇 〇 電氣 i * 〇 〇 Ο 〇 〇 〇 O 〇 〇 〇 o O 〇 〇 O 拉伸率 S S Lf) g E s c〇 S CQ 吸濕率 〇 cO 〇 cO 〇 σ〇 CP t— C=9 UC3 〇 Lf3 CtS «=&gt; CO CO CO LO CO — LO C3 TCT ΙΛ UT9 L/3 LT3 LT3 LT3 LA U3 LT9 ITS l» LA LT3 ITS ΙΑ LT9 LfS LT3 ΙΛ Ln LA UQ ΙΛ IA Ln LA m l〇 LO 对迴焊性 lA Lf3 αΰ ua Lit! LTO LT3 U3 ΙΛ Ln LO LT7 ΙΛ U9 &amp;A LT7 LA m L» tra ΙΛ LO LO LT2 L〇 LT3 L〇 ΙΛ LA Cu黏著力(Ν/αη) PCT後 ua LC3 卜 «SI 9S) r-^ ★ OO CO 寸 t*^ to 卜 DO LA cn 09 «0 初期狀態 〇〇 (0 Γ— Cn3 » oo OO • c^· oc » e» 卜 oa 〇d cn c»a «5 (O σί oo : PI黏著力(N/cra) PCT後 CO CO OO oo oo σι ίΡ «σ -«ί e&gt;a tTd Lf3 卜 ui 卜 u? 初期狀態 LT3 LC9 tra UP U9 Ln ΙΟ U9 CQ ΙΛ CD U3 οό 03 CO OQ UO CO CO a% 相溶性 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 0 〇 〇 CO CO U5 LO 卜 OO σν = CO 寸 LA 54 317818 1323275 4 - 3 表 埋設性 充填狀態 〇 〇 〇 〇 o 〇 o 〇 〇 〇 〇 〇 〇 發泡 〇 〇 〇 〇 〇 〇 〇 〇 〇 0 〇 〇 O 電氣 特性. 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 魅曲 (mm) 1.5以下 1·5以下 1.5以下 1.5以下 i_5以下 1.5以下 1.5以下 1.5以下 1.5以下 1.5以下 1.5以下 1.5以下 y- 3 in 拉伸率 〇 c*a Ο csi S S r-^t ? C3 C^l o CO 1^-· 5 !··» » « &lt; o ς£&gt; g C&gt;5 吸濕率 ΙΛ e &lt;=&gt; L0 〇 un a LA b— C? LA o LfS CD Lfd o L/9 o LA c? c〇 C? CO o TCT ΙΛ kT3 US LT3 的 uO u5 lA U9 uz&gt; Cf5 ςΑ LT5 la «-〇 ιΤΰ fcA iA to lA LC? LT3 m ΙΛ u? lA bTd u? 必 iSP bA U9 k(9 l.{^ Cu黏著力(N/cm) PCT後 c— 一 C〇 ΟΊ Γ— CO cc CO os CO oo e·^ oo LA 0*3 初期狀態 寸 LT9 oo LT9 CO σΟ oo eo to eo oo oo to CO CO CO to cr&gt; to — PI黏著力(Ν/απ) PCT後 却 c-^ e^a eo C^Q 卜 «»« oo oo CO CO CQ C^J oo un o 卜 oo 初期狀態 CO CO 〇〇 c〇 CO LTD 寸 LTD CO eo CC OO CO oo — oo 相溶性 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 PO 2 c3 C&lt;l CO c&gt;a CO c^» 〇o 55 317818Buried filling state 〇〇〇〇〇o 〇o 〇〇OO 〇〇〇 foaming 〇〇〇〇O 〇〇o 〇〇〇〇〇〇〇electric i * 〇〇Ο 〇〇〇O 〇〇〇o O 〇〇O stretch ratio SS Lf) g E sc〇S CQ moisture absorption rate 〇cO 〇cO 〇σ〇CP t— C=9 UC3 〇Lf3 CtS «=> CO CO CO LO CO — LO C3 TCT ΙΛ UT9 LT3 LTS LT3 ITS LT9 LfS LT3 ΙΛ Ln LA UQ ΙΛ ;A LT7 LA m L» tra ΙΛ LO LO LT2 L〇LT3 L〇ΙΛ LA Cu adhesion (Ν/αη) PCT after ua LC3 卜«SI 9S) r-^ ★ OO CO inch t*^ to 卜 DO LA Cn 09 «0 Initial status〇〇(0 Γ—Cn3 » oo OO • c^· oc » e» 卜oa 〇d cn c»a «5 (O σί oo : PI adhesion (N/cra) PCT after CO CO OO oo oo σι ίΡ «σ -«ί e&gt;a tTd Lf3 ui ui u? Initial state LT3 LC9 tra UP U9 Ln ΙΟ U9 CQ ΙΛ CD U3 οό 03 CO OQ UO CO CO a% compatible 〇〇〇〇 〇 〇〇〇〇〇〇0 〇〇CO CO U5 LO Bu OO σν = CO Inch LA 54 317818 1323275 4 - 3 Table buried filling state 〇〇〇〇o 〇o 〇〇〇〇〇〇 foaming 〇〇〇〇 〇〇〇〇〇0 〇〇O Electrical characteristics. 〇〇〇〇〇〇〇〇〇〇〇〇〇 曲 ( (mm) 1.5 or less 1. 5 or less 1.5 or less 1.5 or less i_5 or less 1.5 or less 1.5 or less 1.5 or less 1.5 or less 1.5 or less 1.5 or less 1.5 or less y- 3 in stretch ratio 〇c*a Ο csi SS r-^t ? C3 C^lo CO 1^-· 5 !··» » « &lt; o ς£&gt; g C&gt ;5 Moisture absorption rate & e &lt;=&gt; L0 〇un a LA b- C? LA o LfS CD Lfd o L/9 o LA c? c〇C? CO o TCT ΙΛ kT3 US LT3 uO u5 lA U9 Uz&gt; Cf5 ςΑ LT5 la «-〇ιΤΰ fcA iA to lA LC? LT3 m ΙΛ u? lA bTd u? must iSP bA U9 k(9 l.{^ Cu adhesion (N/cm) PCT after c--C 〇ΟΊ Γ — CO cc CO os CO oo e·^ oo LA 0*3 Initial state inch LT9 oo LT9 CO σΟ oo eo to eo oo oo to CO CO CO to cr&gt; to — PI adhesion (Ν/απ) PCT After c-^ e^a Eo C^Q 卜«»« oo oo CO CO CQ C^J oo un o oo initial state CO CO 〇〇c〇CO LTD inch LTD CO eo CC OO CO oo — oo compatible 〇〇〇〇〇〇〇 〇〇〇〇〇〇PO 2 c3 C&lt;l CO c&gt;a CO c^» 〇o 55 317818

- 'V 1323275 【表3-5】- 'V 1323275 【Table 3-5】

埋設性 充填狀態 X 〇 〇 1 1 〇 X 發泡 X X 〇 1 X X 電氣 特性 〇 X X 1 1 X X 勉曲 (mm) 1 CC3 CO oO ixi 1.5以下 1.5以下 1 拉伸率 (%) ο •r Ή CD oo u? o s 吸濕率 (%) e&lt;a c*i t— o -CO cn CO 1 〇Q 〇 «〇 cO TCT 性 ΙΛ LO oo LA C^a in Μ 1X9 LA LC9 CSI IA CO IT9 e^a Cu黏著力(Μ/cm) PCT後 ca o o. 二 Lft C^a 〇〇 初期狀態 Ο〇 ο CO c£ oo 〇 oo C^3 CO c〇 — PI黏著力(N/cm) 1 pct 後 Ca o CD o O 〇 初期狀態 CO ο CNI 1 CO CO o css » 互溶性 〇 O o X 〇 X O 一 C&gt;a cry 寸 LT3 us t- 56 317818Buried filling state X 〇〇1 1 〇X Foaming XX 〇1 XX Electrical characteristics 〇XX 1 1 XX 勉曲(mm) 1 CC3 CO oO ixi 1.5 or less 1.5 or less 1 Stretch rate (%) ο •r Ή CD Oo u? os Moisture absorption rate (%) e&lt;ac*it_ o -CO cn CO 1 〇Q 〇«〇cO TCT ΙΛ LO oo LA C^a in Μ 1X9 LA LC9 CSI IA CO IT9 e^a Cu Adhesion (Μ/cm) PCT post ca o o. Two Lft C^a 〇〇 initial state Ο〇ο CO c£ oo 〇oo C^3 CO c〇—PI adhesion (N/cm) 1 pct after Ca o CD o O 〇 initial state CO ο CNI 1 CO CO o css » miscibility 〇O o X 〇XO a C&gt;a cry inch LT3 us t- 56 317818

!J 罝右知’本發明之黏著劍組成物及黏著片, 八有優良之埋設性、電氣特性、黏著力、 性’吸濕性低、拉伸率大、魔六护 c 優声!^ ,心力氣、他性佳,且耐熱劣化性 優良。因此,本發明之黏著劑組 , 4、'且成物及黏著片,可抑制在 +導體裝置中發生層間剝離、產 座生軋泡、翹曲等不良之情 ,兄,其加工性亦佳,因此可提高半導體裝置之穩定性。!J 罝右知' The adhesive sword composition and adhesive sheet of the present invention have excellent embedding property, electrical characteristics, adhesion, and property, 'low hygroscopicity, large stretch ratio, and the magic six protector c sound! ^, good strength, good quality, and excellent heat deterioration. Therefore, the adhesive group of the present invention, 4, and the adhesive and the adhesive sheet can suppress the occurrence of interlayer peeling, generation of blistering, warpage, etc. in the +conductor device, and the processing property is also good. Therefore, the stability of the semiconductor device can be improved.

317818 57317818 57

Claims (1)

13232 $95103025號專利申請案 * (98年8月6曰) ^月U修正本 種半導,裝置用黏著劑組成物,其特徵為含有: r族甘油趟、縮水甘油醋、縮水甘油胺、線狀 吨氧化物、脂環族環氧動旨之任-構造之至少β 以上之環氧樹脂(A)、 選自可溶酚醛型酚樹脂、酚漆用酚醛樹脂、甲酚漆 用i«樹脂' fa1苯二⑽脂、二甲苯樹脂之賴脂⑻: 含有乙烯及具有可與前述環氧樹脂(A)或環氧硬化 劑(該環氧硬化劑係選自胺系催化劑及磷系催化劑)反 應之官能基的不飽和羧酸或其衍生物之選自乙烯_(甲基) 丙烯酸酯-順丁烯二酸酐共聚物、乙烯_(甲基)丙烯酸烷 基酯-(曱基)丙烯酸縮水甘油酯共聚物、乙稀·(甲基)丙婦 酸縮水甘油酯共聚物、乙烯-(曱基)丙烯酸共聚物、乙埽 -(曱基)丙烯酸縮水甘油酯-乙酸乙烯酯共聚物之至少1 種以上之乙烯系共聚物(C')、 以及如下述式(1)或式(2)所示之兩末端含胺基之石夕 鲁氧院化合物(D) ’ (¾ CBs Cp &amp;N—R1 —Si—Ο-fSi —·— it1 一 ΝΗβ (1) I . I I CHa 0¾ CBa ψ -Ο ^ H2N—Si-0 # Si — 一 Ei N &amp; ⑵ (¾ CHs 58 317818(修正版) (式中之R1表示碳原子數1至10之伸燒基 示0至1 〇之整數); ,且 相對於總固形量, (A) 成分之含量為3至40質量〇/〇, (B) 成分之含量為0.5至50質量0/〇, (C )成分之含量為20至80質量%, (D)成分之含量為0.05至10質量%, φ環氧硬化劑之含量為0至10質量%,。 2. 如申請專利範圍第1項之半導體震置用黏著劑致成物, 其中,硬化前所測定之動態黏彈性中之最低熔融黏度在 400至50000 pa · s之範圍内。 3. 如申請專利範圍第1項之半導體裝置用黏著劑組成物, 其中,硬化後於200。(:至280Ϊ下之動態黏彈性率為 500Pa至200MPa之範圍内。 4. 如申請專利範圍第丨項之半導體裝置用黏著劑組成物, 鲁其中’硬化後之拉伸率為30〇/〇以上。 5. 如申請專利範圍第1項之半導體裝置用黏著劑組成物, 其中’硬化後之吸濕率為1%以下。 6. 如申請專利範圍第1項之半導體裝置用黏著劑組成物,其 中’硬化後在150°C之環境下放置24小時後,在2〇0。(:至 280°C下之動態黏彈性率為5〇〇pa至50〇MPa之範圍。 7. 如申請專利範圍第1項之半導體裝置用黏著劑組成物, 其中’前述乙烯系共聚物(C’)中之不飽和羧酸衍生物之 59 M7818(修正版) 含有率為0.1至40質量%。 . 8.如申請專利範圍第1項之半 其中,前述乙缔系共聚物(c,)中:用黏二::^ 2,500。 吕月匕基备罝為100至 I:請^Γ1項之半導體裝置用黏著劑咖 能…=㈧與前述酶樹脂(Β)之比例,以官 月匕基田里比叶,在1:〇 6至1:1 爪一種半導體裝置用黏著片,其特徵^圍内⑼ -面上積層如申請專利 、在支撐體之至少 剜έ日占铷圍第1項之半導體裝置用黏著 d、、且成物所成之黏著劑層。 11. 一種半導體裝置用黏荽 + - 其特徵為:在金屬層之至少 一面依序積層如申請專刹餘 ..^ ^ 寻利耗圍第1項之半導體裝置用黏 η '者J層,及絕緣性膜或剝離性膜。 η.-種+導體裝置用黏著片,其特徵為:在其絕緣性膜之 兩面,依序積層如申譜直斗丨# 甲》月專利乾圍苐i項之半導體裝置用 黏著劑組成物所成之勒莫制 風之黏者劑層,及絕緣性膜或剝離性 膜。 3178】8(修正版) 6013232 $95103025 Patent Application* (August 6th, 1998) ^Month U amends this kind of semi-conducting, device adhesive composition, which is characterized by: r group glycerol hydrazine, glycidol vinegar, glycidylamine, line An epoxy resin (A) having at least β or more, a resole type phenol resin, a phenol resin for phenol paint, and a resin for cresol paint 'fa1 benzene di(10) ester, xylene resin lanolin (8): contains ethylene and has the above epoxy resin (A) or epoxy hardener (the epoxy hardener is selected from the group consisting of an amine catalyst and a phosphorus catalyst) The reactive functional carboxylic acid of the reaction or a derivative thereof is selected from the group consisting of ethylene-(meth) acrylate-maleic anhydride copolymer, ethylene-alkyl (meth) acrylate-(mercapto) acrylate a glyceride copolymer, an ethylene (meth) propyl glycosyl glycidyl ester copolymer, an ethylene-(mercapto)acrylic acid copolymer, an acetamidine-(mercapto)acrylic acid glycidyl ester-vinyl acetate copolymer One or more kinds of ethylene-based copolymers (C'), and the following formula (1) or (2) The amine-based compound of the amine group (D) ' (3⁄4 CBs Cp &amp; N-R1 - Si - Ο - fSi - · - it1 - ΝΗ β (1) I. II CHa 03⁄4 CBa ψ -Ο ^ H2N—Si-0 # Si — An Ei N &amp; (2) (3⁄4 CHs 58 317818 (Revised) (wherein R1 represents a carbon atom number of 1 to 10 and the stretching base is 0 to 1 〇 (Integer); and, relative to the total solid content, the content of (A) component is 3 to 40 mass 〇 / 〇, the content of (B) component is 0.5 to 50 mass 0 / 〇, and the content of (C) component is 20 To 80% by mass, the content of the component (D) is 0.05 to 10% by mass, and the content of the φ epoxy hardener is 0 to 10% by mass. 2. The adhesive for the semiconductor device according to the first application of the patent scope is The composition, wherein the lowest melt viscosity in the dynamic viscoelasticity measured before hardening is in the range of 400 to 50,000 pa · s. 3. The adhesive composition for a semiconductor device according to the first aspect of the patent application, wherein the hardening After 200. (: to 280 之, the dynamic viscoelasticity is in the range of 500Pa to 200MPa. 4. The viscosity of the semiconductor device according to the scope of the patent application The composition of the coating agent, wherein the tensile ratio after hardening is 30 〇 / 。 or more. 5. The adhesive composition for a semiconductor device according to claim 1, wherein the moisture absorption rate after hardening is 1%. 6. The adhesive composition for a semiconductor device according to the first aspect of the patent application, wherein 'hardened and placed in an environment of 150 ° C for 24 hours, at 2 〇 0. (The dynamic viscoelasticity at a temperature of 280 ° C is in the range of 5 〇〇 to 50 MPa. 7. The adhesive composition for a semiconductor device according to claim 1, wherein the 'the aforementioned ethylene copolymer ( 59 M7818 (Revised Edition) of the unsaturated carboxylic acid derivative in C') is contained in an amount of 0.1 to 40% by mass. 8. As described in the first half of the patent application, the aforementioned ethylene-based copolymer (c, In the middle: use sticky two::^ 2,500. Lu Yueji prepared for 100 to I: please ^Γ1 of the semiconductor device adhesive agent can be used == (eight) and the aforementioned enzyme resin (Β) ratio, to the official base Tian Li Biye, at 1:6 to 1:1 claws, an adhesive sheet for a semiconductor device, characterized in that it is covered in the inner layer (9) - the surface is coated as claimed, and at least the next day in the support is occupied. The semiconductor device is an adhesive layer formed by adhering d and forming a substance. 11. A bonding device for a semiconductor device + - characterized by: sequentially laminating at least one side of the metal layer, such as applying for a special brake.. ^ ^ For the purpose of profit-seeking, the first layer of the semiconductor device is viscous η 'J layer, and insulating film or peeling film. η.- species + lead The adhesive sheet for the device is characterized in that: on both sides of the insulating film, the laminated layer is formed by the adhesive composition of the semiconductor device such as Shen Bao Zhidou丨# Adhesive layer of wind, and insulating film or peeling film. 3178] 8 (revision) 60
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